Semiconductor testing device

Abstract

The utility model discloses a semiconductor testing device, and relates to the technical field of semiconductor testing, the semiconductor testing device comprises a box body, and a protection mechanism comprises a mounting rack, a rotating shaft, a protection plate, a groove, a fixing plate, a threaded hole and a fixing bolt. The fixing bolt is rotated to drive the fixing plate to enable the fixing plate not to be attached to the protection plate any more, at the moment, the protection plate is rotated downwards to enable the protection plate to be attached to the installation frame, the control panel is not covered by the protection plate any more, a worker can place a record book on the surface of the protection plate at the moment, and after operation is completed, the record book is taken down at the moment. At the moment, the protection plate is rotated upwards to cover the control panel, the fixing bolt is rotated in the opposite direction to push the fixing plate till the fixing plate is attached to the outside of the protection plate, the protection plate does not rotate downwards at the moment, the protection plate provides protection for the control panel, and the probability that the control panel is damaged when being impacted is reduced so that the semiconductor can be normally tested.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing, and particularly relates to a semiconductor testing device. Background Art

[0002] Existing semiconductors refer to materials with electrical conductivity between that of conductors and insulators at room temperature. High-pressure accelerated aging test chambers are applicable to the detection of the sealing performance of products in the fields of national defense, aerospace, automotive parts, electronic components, plastics, magnet industries, pharmaceutical circuit boards, multi-layer circuit boards, ICs, LCDs, magnets, lighting fixtures, lighting products, etc. Relevant products are subjected to accelerated life tests, which are used in the design stage of products to quickly expose product defects and weak links and test the resistance and airtightness of their products.

[0003] Currently, an existing high-pressure accelerated aging test chamber (such as patent number: CN207300828U) discloses a high-pressure accelerated aging test chamber, which includes a chassis and a control panel provided at the front end of the chassis; a cavity and a sealed heating water tank are provided inside the chassis; a heating device is provided inside the sealed heating water tank; the sealed heating water tank is connected to the cavity through a pipeline; a door for sealing the opening of the cavity is provided at the front end of the chassis; the end face of the cavity is higher than the end face of the chassis; a safety valve is connected to the inside of the cavity; a temperature sensor is provided inside the cavity; and a sealing ring is provided on the inner side of the door. Therefore, the material to be detected can be set inside the cavity, and the door can be closed; the water in the sealed heating water tank is heated by the heating device to generate water vapor, and the water vapor is transported into the cavity through the pipeline, which not only increases the temperature and humidity inside the cavity, but also increases the air pressure inside the cavity, so the time of the aging test can be shortened and the test efficiency can be improved.

[0004] However, during the implementation of the above technical solution, it is found that there are at least the following problems: the operator controls the parameters of the chassis through the control panel provided at the front end of the chassis. When the display screen outside the control panel or the display lamp under the control panel is hit by other objects, the display screen or the display lamp is easily damaged. The damage of the display screen or the display lamp causes the operator to be unable to set parameters for the chassis, thereby affecting the normal testing process of the semiconductor. Summary of the Utility Model

[0005] (I) Technical Problems to be Solved

[0006] Aiming at the deficiencies of the prior art, the utility model provides a semiconductor testing device, which solves the technical problem that when the display screen outside the control panel or the display lamp under the control panel is hit by other objects, the display screen or the display lamp is easily damaged, and the damage of the display screen or the display lamp causes the operator to be unable to set parameters for the chassis, thereby affecting the normal testing process of the semiconductor.

[0007] (II) Technical Solutions

[0008] To achieve the above object, the utility model is realized by the following technical solutions:

[0009] A semiconductor testing device includes a box body. A control panel is fixedly installed on the outside of the box body. A protection mechanism is arranged at one end of the box body close to the control panel. The protection mechanism includes a mounting frame, a rotating shaft, a protection plate, a groove, a fixing plate, a threaded hole and a fixing bolt. The mounting frame is arranged on the outside of the box body. The rotating shaft is rotatably connected to the inside of the mounting frame. The protection plate is arranged on the outside of the rotating shaft. The groove is opened on the inside of the mounting frame. The fixing plate is slidably connected to the inside of the groove. The fixing plate is attached to the outside of the protection plate. The threaded hole is opened on the outside of the mounting frame. The threaded hole communicates with the groove. The fixing bolt is threadedly connected to the inside of the threaded hole. The fixing bolt is rotatably connected to the outside of the fixing plate. Two mounting holes are opened on the lower surface of the mounting frame. Threaded rods are fixedly installed on the surface of the box body close to the two mounting holes. A threaded cap is threadedly connected to the outside of each threaded rod. The mounting frame is slidably connected to the outside of the threaded rod through the mounting hole. The lower surface of the mounting frame is located between the threaded cap and the box body. Rotating holes are opened at both ends of the mounting frame. A mounting ring is fixedly installed on the outside of the protection plate. Both ends of the rotating shaft are respectively rotatably connected to the inside of the two rotating holes. The mounting ring is sleeved on the outside of the rotating shaft. A fixing block is arranged at one end of the rotating shaft close to the fixing bolt. External threads are opened on the outside of the rotating shaft. The fixing block is threadedly connected to the outside of the external threads. A limiting plate is fixedly installed on the inside of the mounting frame. The limiting plate is attached to the protection plate. The protection plate is located between the fixing plate and the limiting plate. A circular hole is opened on the outside of the fixing plate. A mounting shaft is rotatably connected to the inside of the circular hole. The mounting shaft is fixedly installed on the outside of the fixing bolt.

[0010] Preferably: A placement groove is opened on the outside of the protection plate. The placement groove is located on the side of the protection plate close to the control panel.

[0011] Preferably: A pulling plate is fixedly installed on the outside of the protection plate. The pulling plate is located on the upper surface of the mounting frame.

[0012] (III) Beneficial effects

[0013] 1. By arranging the protection plate and cooperating with the fixing plate, when the staff uses the control panel, at this time, rotate the fixing bolt to drive the fixing plate so that the fixing plate no longer fits with the protection plate. At this time, rotate the protection plate downward so that the protection plate fits with the mounting frame. At this time, the control panel is no longer covered by the protection plate. At this time, the staff can place the record book on the surface of the protection plate. After the operation is completed, at this time, take down the record book. At this time, rotate the protection plate upward to cover the control panel. At this time, rotate the fixing bolt in the reverse direction to push the fixing plate until the fixing plate fits with the outside of the protection plate. At this time, the protection plate will not rotate downward. The protection plate provides protection for the control panel, reducing the probability of damage to the control panel when it is impacted so that the semiconductor can be tested normally.

[0014] 2. By setting up the installation ring and cooperating with the fixing block, when the protection plate is damaged, rotate the fixing block at this time to release the connection between the fixing block and the external thread. Then pull the rotating shaft to release the connection between the rotating shaft, the installation ring and the rotating hole. At this time, the protection plate can be detached from the installation frame. Then place the new protection plate on the installation frame. Insert the rotating shaft into the inner side of the installation ring through the rotating hole, and then push the rotating shaft so that the rotating shaft reaches the outside of the installation frame through the rotating hole on the other side. Then thread the fixing block onto the outside of the external thread. At this time, the rotating shaft is installed, which is convenient for replacing the damaged protection plate and improving the protection effect of the protection mechanism on the control panel. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above description is only an overview of the technical solution of the present invention. In order to understand the technical means of the present invention more clearly and be able to implement it according to the content of the specification, the following will describe in detail with reference to the preferred embodiments of the present invention and the accompanying drawings.

[0016] Figure 1 is the structural diagram of the present invention;

[0017] Figure 2 is of the present invention Figure 1 the structural diagram of the box body in;

[0018] Figure 3 is of the present invention Figure 1 the structural diagram of the protection plate in;

[0019] Figure 4 is of the present invention Figure 1 the enlarged structural diagram of A in;

[0020] Figure 5 is of the present invention Figure 3 the enlarged structural diagram of B in;

[0021] Figure 6 is of the present invention Figure 5 the sectional structural diagram of the fixing plate in.

[0022] Legend: 1. Box body; 2. Control panel; 3. Installation frame; 4. Rotating shaft; 5. Protection plate; 6. Groove; 7. Fixing plate; 8. Threaded hole; 9. Fixing bolt; 10. Installation hole; 11. Threaded rod; 12. Threaded nut; 13. Rotating hole; 14. Installation ring; 15. Fixing block; 16. External thread; 17. Limiting plate; 18. Installation shaft; 19. Round hole; 20. Placing groove; 21. Pulling plate. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] Embodiments of the present application provide a semiconductor testing device, effectively solving the technical problem that when the display screen outside the control panel 2 or the display lamp under the control panel 2 is hit by other objects, the display screen or the display lamp is easily damaged, and the damage of the display screen or the display lamp causes the operator to be unable to set parameters for the chassis, thus affecting the normal testing process of the semiconductor.

[0024] Such as Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6 , the technical solution in the embodiments of the present application is to effectively solve the technical problem that when the display screen outside the control panel 2 or the display lamp under the control panel 2 is hit by other objects, the display screen or the display lamp is easily damaged, and the damage of the display screen or the display lamp causes the operator to be unable to set parameters for the chassis, thus affecting the normal testing process of the semiconductor. The general idea is as follows:

[0025] In view of the problems existing in the prior art, the present utility model provides a semiconductor testing device. The semiconductor testing device includes a box body 1, a control panel 2 is fixedly installed outside the box body 1, and a protection mechanism is arranged at one end of the box body 1 close to the control panel 2;

[0026] The protection mechanism includes a mounting frame 3, a rotating shaft 4, a protection plate 5, a groove 6, a fixing plate 7, a threaded hole 8 and a fixing bolt 9;

[0027] The mounting frame 3 is arranged outside the box body 1, the rotating shaft 4 is rotatably connected to the inside of the mounting frame 3, the protection plate 5 is arranged outside the rotating shaft 4, the groove 6 is opened on the inside of the mounting frame 3, the fixing plate 7 is slidably connected to the inside of the groove 6, the fixing plate 7 is attached to the outside of the protection plate 5, the threaded hole 8 is opened on the outside of the mounting frame 3, the threaded hole 8 communicates with the groove 6, and the fixing bolt 9 is threadedly connected to the inside of the threaded hole 8, and the fixing bolt 9 is rotatably connected to the outside of the fixing plate 7.

[0028] By setting the protection plate 5 and cooperating with the fixing plate 7, when the staff uses the control panel 2, at this time, rotate the fixing bolt 9 to drive the fixing plate 7 so that the fixing plate 7 no longer fits with the protection plate 5. At this time, rotate the protection plate 5 downward so that the protection plate 5 fits with the mounting frame 3. At this time, the control panel 2 is no longer covered by the protection plate 5. At this time, the staff can place the record book on the surface of the protection plate 5. After the operation is completed, at this time, take down the record book, at this time, rotate the protection plate 5 upward to cover the control panel 2, and at this time, rotate the fixing bolt 9 in the opposite direction to push the fixing plate 7 until the fixing plate 7 fits with the outside of the protection plate 5. At this time, the protection plate 5 will not rotate downward, and the protection plate 5 provides protection for the control panel 2, reducing the probability of damage to the control panel 2 when it is hit so that the semiconductor can be tested normally.

[0029] The lower surface of the mounting bracket 3 is provided with two mounting holes 10, and threaded rods 11 are fixedly installed on one side of the box body 1 close to the two mounting holes 10. A threaded cap 12 is threadedly connected to the outside of each threaded rod 11;

[0030] Among them, the mounting bracket 3 is slidably connected to the outside of the threaded rod 11 through the mounting hole 10, and the lower surface of the mounting bracket 3 is located between the threaded cap 12 and the box body 1, which is convenient for the disassembly and assembly of the mounting bracket 3.

[0031] Both ends of the mounting bracket 3 are provided with rotation holes 13, and a mounting ring 14 is fixedly installed on the outside of the protection plate 5;

[0032] Among them, both ends of the rotating shaft 4 are respectively rotatably connected to the inside of the two rotation holes 13, and the mounting ring 14 is sleeved on the outside of the rotating shaft 4, which is convenient for the disassembly of the protection plate 5.

[0033] One end of the rotating shaft 4 close to the fixing bolt 9 is provided with a fixing block 15;

[0034] Among them, an external thread 16 is provided on the outside of the rotating shaft 4, and the fixing block 15 is threadedly connected to the outside of the external thread 16, which is convenient for limiting the movement of the rotating shaft 4.

[0035] A limiting plate 17 is fixedly installed on the inner side of the mounting bracket 3, and the limiting plate 17 is attached to the protection plate 5;

[0036] Among them, the protection plate 5 is located between the fixing plate 7 and the limiting plate 17, preventing the protection plates 5 from contacting the control panel 2.

[0037] A circular hole 19 is provided on the outside of the fixing plate 7, and a mounting shaft 18 is rotatably connected to the inside of the circular hole 19;

[0038] Among them, the mounting shaft 18 is fixedly installed on the outside of the fixing bolt 9, which is convenient for the fixing bolt 9 to pull the fixing plate 7.

[0039] A placement groove 20 is provided on the outside of the protection plate 5;

[0040] Among them, the placement groove 20 is located on the side of the protection plate 5 close to the control panel 2, which is convenient for placing items.

[0041] A pulling plate 21 is fixedly installed on the outside of the protection plate 5;

[0042] Among them, the pulling plate 21 is located on the upper surface of the mounting bracket 3, which is convenient for pulling the protection plate 5.

[0043] By setting the mounting ring 14 and cooperating with the fixing block 15, when the protective plate 5 is damaged, rotate the fixing block 15 at this time to release the connection between the fixing block 15 and the external thread 16. Then pull the rotating shaft 4 to release the connection between the rotating shaft 4, the mounting ring 14 and the rotating hole 13. At this time, the protective plate 5 can be detached from the mounting frame 3. Then place a new protective plate 5 on the mounting frame 3. Insert the rotating shaft 4 into the inner side of the mounting ring 14 through the rotating hole 13, and then push the rotating shaft 4 so that the rotating shaft 4 reaches the outside of the mounting frame 3 through the rotating hole 13 on the other side. At this time, thread the fixing block 15 onto the outside of the external thread 16. At this time, the rotating shaft 4 is installed, which is convenient for replacing the damaged protective plate 5 and improving the protection effect of the protection mechanism on the control panel 2.

[0044] Working principle:

[0045] First step, before the device works, slide the mounting frame 3 onto the outside of the threaded rod 11 through the mounting hole 10. Then thread the threaded nut 12 onto the outside of the threaded rod 11 until the threaded nut 12 fits against the mounting frame 3. Place the protective plate 5 on the mounting frame 3. Insert the rotating shaft 4 into the inner side of the mounting ring 14 through the rotating hole 13, and then push the rotating shaft 4 so that the rotating shaft 4 reaches the outside of the mounting frame 3 through the rotating hole 13 on the other side. At this time, thread the fixing block 15 onto the outside of the external thread 16. At this time, the rotating shaft 4 is installed;

[0046] Second step, by setting the protective plate 5 and cooperating with the fixing plate 7, when the staff uses the control panel 2, rotate the fixing bolt 9 to drive the fixing plate 7 so that the fixing plate 7 no longer fits against the protective plate 5. Then rotate the protective plate 5 downward so that the protective plate 5 fits against the mounting frame 3. At this time, the control panel 2 is no longer covered by the protective plate 5. At this time, the staff can place the record book on the surface of the protective plate 5. When the operation is completed, take the record book down. Then rotate the protective plate 5 upward to cover the control panel 2. Then rotate the fixing bolt 9 in the opposite direction to push the fixing plate 7 until the fixing plate 7 fits against the outside of the protective plate 5. At this time, the protective plate 5 will not rotate downward, and the protective plate 5 provides protection for the control panel 2, reducing the probability of damage to the control panel 2 when it is impacted so that the semiconductor can be tested normally.

[0047] Finally, it should be noted that: Obviously, the above embodiments are only examples for clearly illustrating the present invention, and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or variations can be made based on the above description. It is not necessary and impossible to enumerate all the implementation manners here. The obvious changes or variations derived therefrom are still within the protection scope of the present invention.

Claims

1. A semiconductor testing device, comprising a box (1), a control panel (2) being fixedly mounted on the outside of the box (1), characterized in that: A protective mechanism is provided at one end of the box body (1) close to the control panel (2); The protection mechanism comprises a mounting frame (3), a rotating shaft (4), a protection plate (5), a groove (6), a fixing plate (7), a threaded hole (8) and a fixing bolt (9); The mounting frame (3) is arranged outside the box body (1), the rotating shaft (4) is rotatably connected to the inner side of the mounting frame (3), the protective plate (5) is arranged outside the rotating shaft (4), the groove (6) is opened inside the mounting frame (3), the fixing plate (7) is slidably connected inside the groove (6), the fixing plate (7) is fitted with the outer side of the protective plate (5), the threaded hole (8) is opened outside the mounting frame (3), the threaded hole (8) is communicated with the groove (6), the fixing bolt (9) is threadedly connected inside the threaded hole (8), and the fixing bolt (9) is rotatably connected to the outer side of the fixing plate (7).

2. A semiconductor testing device as claimed in claim 1, characterized in that: The lower surface of the mounting frame (3) is provided with two mounting holes (10); a threaded rod (11) is fixedly mounted on one side of the box body (1) close to the two mounting holes (10); and a threaded cap (12) is threadedly connected to the outside of each threaded rod (11); The mounting frame (3) is slidably connected to the outside of the threaded rod (11) through the mounting hole (10), and the lower surface of the mounting frame (3) is located between the threaded cap (12) and the box body (1).

3. A semiconductor testing device as claimed in claim 1, characterized in that: Both ends of the mounting frame (3) are provided with rotation holes (13), and a mounting ring (14) is fixedly mounted on the outside of the protective plate (5); The two ends of the rotating shaft (4) are rotatably connected to the inside of the two rotating holes (13), and the mounting ring (14) is sleeved on the outside of the rotating shaft (4).

4. A semiconductor testing device as claimed in claim 1, characterized in that: A fixing block (15) is provided at one end of the rotating shaft (4) close to the fixing bolt (9); The rotating shaft (4) is provided with an external thread (16) on its exterior, and the fixing block (15) is threadedly connected to the exterior of the external thread (16).

5. A semiconductor testing device as claimed in claim 1, characterized in that: A limit plate (17) is fixedly mounted on the inner side of the mounting frame (3), and the limit plate (17) is in contact with the protective plate (5); The protection plate (5) is located between the fixing plate (7) and the limiting plate (17).

6. A semiconductor testing device as claimed in claim 1, characterized in that: A circular hole (19) is formed on the outside of the fixing plate (7), and a mounting shaft (18) is rotatably connected to the inside of the circular hole (19); The mounting shaft (18) is fixedly mounted on the outside of the fixing bolt (9).

7. A semiconductor testing device as claimed in claim 1, characterized in that: The protective plate (5) is provided with a placement groove (20) on its exterior; The placement groove (20) is located on a side of the protection plate (5) close to the control panel (2).

8. A semiconductor testing device as claimed in claim 1, characterized in that: A pull plate (21) is fixedly mounted on the outside of the protective plate (5); The pull plate (21) is located on the upper surface of the mounting frame (3).

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