Probe dismounting tool
By designing a probe removal tool for IV test probe replacement, the combination of clamping base and fixtures solves the problem of cumbersome and time-consuming probe replacement process in the prior art, and achieves faster, safer and more efficient probe replacement.
Patent Information
- Application Number
- CN202421794302.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-26
- Publication Date
- 2025-06-10
- Estimated Expiration
- 2034-07-26
AI Technical Summary
In the prior art, the replacement process of IV test probes is cumbersome and takes a long time, which can easily lead to manual clamping, increase production costs and reduce production efficiency.
A probe removal tool is designed, including a support mechanism and a clamping mechanism. The clamping mechanism achieves rapid clamping and release of the probe by a combination of clamping base, barrier member, clamp and pressing member.
The tool can quickly replace the IV test probe, reduce manual operation, reduce clamping risk, significantly improve production efficiency and save labor costs.
Smart Images
Figure CN222958535U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of photovoltaics, in particular to a probe disassembly tool. Background Art
[0002] The screen process is used in the battery manufacturing industry. The screen process is carried out by the feeder to transfer the battery cell to the printer. After the front and back electrode printing, oven, curing and other process steps, the battery cell production is completed. Then the feeder is fed to the sorting test machine for efficiency, color, high voltage, low voltage, etc., and then sent to the quality department for testing and storage. The test includes IV testing. In the IV test, the use of IV test probes has a rigid service life. The test probes need to be replaced when they expire or the test data is abnormal. In the prior art, a large number of IV test probes are replaced each time. When replacing the IV test probes, universal diagonal pliers are used to pull out the old probes one by one. The manual operation is troublesome, and if the operation is improper, it is easy to pinch the fingers of the person who is exposed to the heat. When the diagonal pliers are used to pull out the probes manually, only one probe can be pulled out at a time. It takes about 800 probes to replace each time, which is very time-consuming and physically demanding, and consumes a lot of manpower and time costs, increasing the production cost of the production line. In addition, during the replacement of the IV test probes, the test machine is in standby mode and cannot be used. It takes a long time to pull out the probes, which increases the production cost and greatly reduces the production efficiency. Utility Model Content
[0003] Based on this, it is necessary to provide a probe disassembly tool. The probe disassembly tool of the utility model can be used for replacing IV test probes, and the IV test probes can be replaced quickly, saving time and effort, and greatly improving production efficiency.
[0004] An embodiment of the present application provides a probe disassembly tool.
[0005] A probe disassembly tool comprises a supporting mechanism and a clamping mechanism, wherein the clamping mechanism is movably connected to the supporting mechanism and can move up and down relative to the supporting mechanism as a whole; the clamping mechanism comprises a clamping base, a blocking member, a clamp and a pressing member, wherein the clamping base has a clamping chamber, and the bottom of the clamping base has a long strip-shaped clearance opening communicated with the clamping chamber, and at least one pair of the blocking members arranged opposite to each other are respectively connected to the upper edges in the length direction of the clearance opening, and the blocking members extend toward the clamping chamber, and the pressing member is movably connected to the clamping base, and the clamp is located in the clamping chamber and connected to the pressing member, and the clamp can clamp the probe, and when the pressing member is pressed, the clamp can open under the action of the blocking member to release the probe.
[0006] In some embodiments, the clamp includes a first clamp arm, a second clamp arm and a limit block, one end of the first clamp arm and one end of the second clamp arm are both connected to the pressing piece, the other end of the first clamp arm and the other end of the second clamp arm are both connected to the limit block, the first clamp arm and the second clamp arm can move closer to or away from each other, in a reset state, the distance between the limit block on the first clamp arm and the limit block on the second clamp arm is smaller than the size of the probe head, when the pressing piece is pressed, the clamp can move toward the blocking piece to achieve the distance between the limit block on the first clamp arm and the limit block on the second clamp arm.
[0007] In some embodiments, the end of the limit block close to the clearance opening has a chamfer, so that a trumpet shape gradually increases toward the clearance opening is formed between the limit block on the first clamp arm and the limit block on the second clamp arm.
[0008] In some embodiments, the clamp further includes an elastic component, wherein the elastic component is connected between the first clamp arm and the second clamp arm, and the elastic component is used to assist the first clamp arm and the second clamp arm to close and reset after being opened.
[0009] In some embodiments, the elastic component is a spring, and two ends of the elastic component in the length direction are respectively connected to the first clamping arm and the second clamping arm.
[0010] In some embodiments, in the reset state, the maximum distance L1 between the limit block on the first clamp arm and the limit block on the second clamp arm is greater than the maximum width W1 between each pair of the relatively set blocking members, and the minimum distance L2 between the limit block on the first clamp arm and the limit block on the second clamp arm is less than or equal to the maximum width W1 between each pair of the relatively set blocking members.
[0011] In some embodiments, the clamping base is a rectangular columnar structure, the clamping chamber extends along the length direction of the clamping base, the clearance opening extends along the length direction of the clamping base, and the blocking member extends along the length direction of the clamping base.
[0012] In some embodiments, there are multiple clamps, and the multiple clamps are arranged at intervals. The distance between adjacent clamps is adapted to the distance between adjacent probes. Each clamp is connected to the pressing member through a connecting strip, and when the pressing member is pressed, each clamp can be driven to move.
[0013] In some of these embodiments, the probe disassembly tool further includes a lifting mechanism, the lifting mechanism including a ratchet wheel, a driven gear, a synchronous chain, and a lifting rack. The ratchet wheel is rotatably connected to the middle position of the clamping base. The two ends of the clamping base are respectively rotatably connected with the driven gears. The driven gears are connected to the ratchet wheel through the synchronous chain. The lifting rack is connected to the support mechanism and extends along the vertical direction. Each driven gear is provided with a lifting rack, and the lifting rack is meshed and connected with the corresponding driven gear. One of the lifting racks is located outside the corresponding driven gear, and the other lifting rack is located inside the corresponding driven gear.
[0014] In some of these embodiments, the lifting mechanism further includes a rotating handle. One end of the rotating handle is connected to the ratchet wheel. The clamping base is provided with a first gear position and a second gear position. The first gear position and the second gear position are distributed at a 90° angle in the circumferential direction. The rotating handle can reciprocally rotate between the first gear position and the second gear position. When the rotating handle rotates from the first gear position to the second gear position, the ratchet wheel moves counterclockwise to drive the driven gear to rotate counterclockwise and realize the lowering of the clamping base relative to the support mechanism. When the rotating handle rotates from the second gear position to the first gear position, the ratchet wheel moves clockwise to drive the driven gear to rotate clockwise and realize the raising of the clamping base relative to the support mechanism.
[0015] In some of these embodiments, the support mechanism includes a first bracket and a second bracket. The first bracket and the second bracket are oppositely arranged, and the lifting racks are respectively connected to the first bracket and the second bracket.
[0016] The above-mentioned probe disassembly tool can be used for the replacement of IV test probes. The replacement speed of the IV test probes is fast, time-saving and labor-saving, and the production efficiency is greatly improved. Description of the Drawings
[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative efforts.
[0018] In order to more comprehensively understand the present application and its beneficial effects, the following will be described in conjunction with the drawings. Among them, the same reference numerals in the following description represent the same parts.
[0019] Figure 1 Schematic diagram of the probe disassembly tool according to an embodiment of the present utility model;
[0020] Figure 2 This is a schematic diagram of the cross-sectional structure of a clamping base of a probe removal tool according to an embodiment of the utility model;
[0021] Figure 3 It is a schematic diagram of the first clamping arm and the second clamping arm in the cross-sectional structure of the clamping base of the probe removal tool according to one embodiment of the utility model after being opened;
[0022] Figure 4 The figure is a schematic diagram of the cooperation between the probe disassembly tool and the probe according to one embodiment of the utility model.
[0023] Description of Reference Numerals
[0024] 10. Probe disassembly tool; 100. Support mechanism; 101. First bracket; 120. Second bracket; 200. Clamping mechanism; 210. Clamping base; 211. Make way opening; 212. First gear position; 213. Second gear position; 220. Blocking member; 230. Clamp; 231. First clamp arm; 232. Second clamp arm; 233. Limiting block; 234. Elastic member; 240. Pressing member; 300. Lifting mechanism; 310. Ratchet; 320. Driven gear; 330. Synchronous chain; 340. Lifting rack; 350. Rotating handle; 20. Probe row; 21. Probe. DETAILED DESCRIPTION
[0025] In order to make the above-mentioned purposes, features and advantages of the utility model more obvious and easy to understand, the specific implementation methods of the utility model are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the utility model. However, the utility model can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the utility model, so the utility model is not limited by the specific embodiments disclosed below.
[0026] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.
[0027] In the present utility model, unless otherwise clearly defined or limited, terms such as "installation", "connection", "linkage", "fixation", etc. shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral body; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium, and it may be the communication inside two components or the interaction relationship between two components, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.
[0028] In the present utility model, unless otherwise clearly defined or limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.
[0029] In the description of the present utility model, the meaning of "several" is more than one, the meaning of "multiple" is more than two, and understandings such as "greater than", "less than", "exceeding", etc. do not include the present number, and understandings such as "above", "below", "within", etc. include the present number. If there is a description of "first" and "second", it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence relationship of the indicated technical features.
[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present utility model belongs. The terms used in the description of the present utility model in this specification are only for the purpose of describing specific embodiments, and are not intended to limit the present utility model. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.
[0031] The embodiments of the present application provide a probe disassembly tool to solve at least one of the following problems existing in the replacement of IV test probes in the prior art: (1) Manual operation is troublesome, and improper operation is likely to pinch the fingers of operating personnel; (2) When manually using diagonal pliers to extract the probe, only one probe can be extracted at a time, consuming a large amount of labor costs and time costs, and increasing the production cost of the production line; (3) During the replacement of the IV test probe, the testing machine is in a standby state and cannot be used, and the time-consuming extraction of the probe causes a significant reduction in production efficiency. The probe disassembly tool will be described below with reference to the accompanying drawings.
[0032] The probe disassembly tool 10 provided in the embodiment of the present application is exemplary, see Figure 1 As shown, Figure 1 The schematic diagram of the structure of the probe disassembly tool 10 provided in the embodiment of the present application is as follows. The probe disassembly tool 10 of the present application can be used for replacing IV test probes.
[0033] In order to more clearly illustrate the structure of the probe removal tool 10, the probe removal tool 10 will be introduced below in conjunction with the accompanying drawings. Figure 1 As shown, Figure 1 This is a schematic diagram of the structure of the probe removal tool 10 provided in an embodiment of the present application.
[0034] A probe disassembly tool 10 includes a support mechanism 100 and a clamping mechanism 200. The clamping mechanism 200 is movably connected to the support mechanism 100. The clamping mechanism 200 as a whole can move up and down relative to the support mechanism 100. The clamping mechanism 200 includes a clamping base 210, a blocking member 220, a clamp 230 and a pressing member 240. The clamping base 210 has a clamping chamber. The bottom of the clamping base 210 has a long strip-shaped clearance opening 211 that communicates with the clamping chamber. At least one pair of blocking members 220 arranged opposite to each other are respectively connected to the upper edges in the length direction of the clearance opening 211. The blocking member 220 extends toward the clamping chamber, and the pressing member 240 is movably connected to the clamping base 210.
[0035] The clamp 230 is located in the clamping chamber and connected to the pressing member 240. The clamp 230 can clamp the probe 21, and when the pressing member 240 is pressed, the clamp 230 can be opened under the action of the blocking member 220 to release the probe 21.
[0036] In some embodiments, the clamp 230 includes a first clamp arm 231, a second clamp arm 232 and a limit block 233. One end of the first clamp arm 231 and one end of the second clamp arm 232 are both connected to the pressing member 240. The other end of the first clamp arm 231 and the other end of the second clamp arm 232 are both connected to the limit block 233. The first clamp arm 231 and the second clamp arm 232 can move closer to or away from each other. In the reset state, the distance between the limit block 233 on the first clamp arm 231 and the limit block 233 on the second clamp arm 232 is smaller than the size of the head of the probe 21. When the above-mentioned pressing member 240 is pressed, the clamp 230 can move toward the blocking member 220 to achieve the distance between the limit block 233 on the first clamp arm 231 and the limit block 233 on the second clamp arm 232, so as to release the extracted probe 21.
[0037] The above-mentioned probe removal tool 10 can remove a whole row of probes 21 at one time. It has a simple structure and is easy to operate, which saves a lot of manpower, greatly shortens the time spent on replacing the probes 21, improves work efficiency, saves maintenance time, and reduces production costs.
[0038] In this application, see Figure 2 As shown, Figure 2 The cross-sectional structure diagram of the clamping base of the probe removal tool according to an embodiment of the utility model is shown. The size of the clearance opening 211 is larger than the size of the head of the probe 21, so that the probe 21 can pass through the clearance opening 211 and enter between the first clamping arm 231 and the second clamping arm 232.
[0039] In some embodiments, the end of the stop block 233 close to the clearance opening 211 is chamfered, so that the stop block 233 on the first clamp arm 231 and the stop block 233 on the second clamp arm 232 form a trumpet shape that gradually increases toward the clearance opening 211. The present application provides two stop blocks 233 similar to the trumpet shape, so that after the stop block 233 contacts the blocking member 220, the first clamp arm 231 and the second clamp arm 232 open to release the clamped probe 21. Figure 3 As shown, Figure 2 It is a schematic cross-sectional structure diagram of a clamping base 210 of a probe removal tool 10 according to an embodiment of the present invention.
[0040] In some embodiments, the clamp 230 further includes an elastic component 234. The elastic component 234 is connected between the first clamp arm 231 and the second clamp arm 232, and is used to assist the first clamp arm 231 and the second clamp arm 232 to close and reset after being opened.
[0041] In some embodiments, the elastic component 234 is a spring. Two ends of the elastic component 234 in the length direction are respectively connected to the first clamping arm 231 and the second clamping arm 232 .
[0042] In some of these embodiments, see Figure 3 As shown, Figure 3 This is a schematic diagram of the cross-sectional structure of the clamping base 210 of the probe disassembly tool 10 of an embodiment of the utility model after the first clamping arm 231 and the second clamping arm 232 are opened. In the reset state, the maximum distance L1 between the limit block 233 on the first clamping arm 231 and the limit block 233 on the second clamping arm 232 is greater than the maximum width W1 between each pair of relatively arranged blocking members 220, and the minimum distance L2 between the limit block 233 on the first clamping arm 231 and the limit block 233 on the second clamping arm 232 is less than or equal to the maximum width W1 between each pair of relatively arranged blocking members 220.
[0043] In some embodiments, the clamping base 210 is a rectangular columnar structure. The clamping chamber extends along the length direction of the clamping base 210 , the clearance opening 211 extends along the length direction of the clamping base 210 , and the blocking member 220 extends along the length direction of the clamping base 210 .
[0044] In some embodiments, there are multiple clamps 230, and the multiple clamps 230 are arranged at intervals. The spacing between adjacent clamps 230 is adapted to the spacing between adjacent probes 21. Each clamp 230 is connected to a pressing member 240 through a connecting strip. When the pressing member 240 is pressed, each clamp 230 can be driven to move. The arrangement of multiple clamps 230 can realize the extraction of multiple probes 21 at a time, greatly improving the processing efficiency and saving the time cost of the operator.
[0045] In some of these embodiments, see Figure 1 As shown, the probe disassembly tool 10 also includes a lifting mechanism 300. The lifting mechanism 300 includes a ratchet 310, a driven gear 320, a synchronous chain 330 and a lifting rack 340. The ratchet 310 is rotatably connected to the middle position of the clamping base 210. The two ends of the clamping base 210 are rotatably connected with the driven gear 320, the driven gear 320 and the ratchet 310 are connected by the synchronous chain 330, the lifting rack 340 is connected to the support mechanism 100 and extends along the vertical direction, and each driven gear 320 is respectively provided with a lifting rack 340, and the lifting rack 340 is meshed and connected with the corresponding driven gear 320, one of the lifting racks 340 is located on the outside of the corresponding driven gear 320, and the other lifting rack 340 is located on the inside of the corresponding driven gear 320.
[0046] In some embodiments, the lifting mechanism 300 further includes a rotating handle 350. One end of the rotating handle 350 is connected to the ratchet 310. The clamping base 210 is provided with a first gear 212 and a second gear 213, which are distributed at an angle of 90° on the circumference. The rotating handle 350 can reciprocate between the first gear 212 and the second gear 213. When the rotating handle 350 rotates from the first gear 212 to the second gear 213, the ratchet 310 moves counterclockwise to drive the driven gear 320 to rotate counterclockwise and realize the lowering of the clamping base 210 relative to the support mechanism 100. When the rotating handle 350 rotates from the second gear 213 to the first gear 212, the ratchet 310 moves clockwise to drive the driven gear 320 to rotate clockwise and realize the raising of the clamping base 210 relative to the support mechanism 100.
[0047] In some of these embodiments, the support mechanism 100 includes a first bracket 101 and a second bracket 120. The first bracket 101 and the second bracket 120 are arranged opposite to each other. Lifting racks 340 are respectively connected to the first bracket 101 and the second bracket 120. During use, refer to Figure 4 as shown in Figure 4 FIG. 114 is a schematic diagram of the cooperation between the probe disassembly tool 10 and the probe 21 according to an embodiment of the present invention. The first bracket 101 and the second bracket 120 are used to abut against the probe row 20.
[0048] When the above-mentioned probe disassembly tool 10 is in use, the first bracket 101 and the second bracket 120 are abutted against the probe row 20. Refer to Figure 4 as shown in Figure 2 FIG. 119. The operator holds the rotation handle 350 and rotates the rotation handle 350 from the first gear position 212 to the second gear position 213. The ratchet 310 moves counterclockwise to drive the driven gear 320 to rotate counterclockwise and realize the lowering of the clamping base 210 relative to the support mechanism 100. After the clamp 230 descends and contacts the probe 21, the head of the probe 21 presses the limit blocks 233 on the first clamping arm 231 and the limit blocks 233 on the second clamping arm 232. After the first clamping arm 231 and the second clamping arm 232 are separated and opened, the head of the probe 21 enters between the first clamping arm 231 and the second clamping arm 232. After the head of the probe 21 enters the first clamping arm 231 and the second clamping arm 232, the first clamping arm 231 and the second clamping arm 232 are tightened under the reset action of the elastic member 234, so that the limit blocks 233 on the first clamping arm 231 and the limit blocks 233 on the second clamping arm 232 clamp and limit the head of the probe 21, as Figure 3 shown in
[0049] Subsequently, the rotation handle 350 is rotated from the second gear position 213 to the first gear position 212. The ratchet 310 rotates clockwise. The rotation handle 350 drives the clamping base 210 and the clamp 230 to rise. The clamp 230 can pull out the probe 21 from the probe row 20. After the probe 21 is pulled out, the operator presses the button of the pressing member 240. The pressing member 240 presses the clamp 230 to descend. When the limit blocks 233 on the first clamping arm 231 and the limit blocks 233 on the second clamping arm 232 contact the blocking block, the blocking block can separate the limit blocks 233, realizing the opening of the first clamping arm 231 and the second clamping arm 232, and the probe 21 is released. Refer to Figure 3 shown in
[0049] Then, the above steps are followed to extract the probe 21 on the next probe row 20.
[0049] In summary, the probe disassembly tool 10 of the present application can be used for replacing the IV test probe. The replacement speed of the probe 21 is fast, time-saving and labor-saving, and the production efficiency is greatly improved.
[0050] In the above embodiments, the descriptions of the various embodiments have their own focuses. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0051] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.
[0052] The above-described embodiments only express several implementation manners of the present utility model, and the description thereof is relatively specific and detailed, but it should not be construed as a limitation to the scope of the patent of the present utility model. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several modifications and improvements can still be made, and these all belong to the protection scope of the present utility model. Therefore, the protection scope of the patent of the present utility model shall be subject to the appended claims.
Claims
1. A probe disassembly tool (10), characterized in that: The invention comprises a supporting mechanism (100) and a clamping mechanism (200), wherein the clamping mechanism (200) is movably connected to the supporting mechanism (100), and the clamping mechanism (200) as a whole can move up and down relative to the supporting mechanism (100); the clamping mechanism (200) comprises a clamping base (210), a blocking member (220), a clamp (230) and a pressing member (240); the clamping base (210) has a clamping chamber, and the bottom of the clamping base (210) has a long strip-shaped opening (211) communicating with the clamping chamber. At least one pair of blocking members (220) arranged opposite to each other are respectively connected to the edges of the clearance opening (211) in the length direction, the blocking members (220) extend toward the clamping chamber, the pressing member (240) is movably connected to the clamping base (210), the clamp (230) is located in the clamping chamber and connected to the pressing member (240), the clamp (230) can clamp the probe (21), and when the pressing member (240) is pressed, the clamp (230) can open under the action of the blocking member (220) to release the probe (21).
2. The probe removal tool (10) according to claim 1, characterized in that: The clamp (230) comprises a first clamp arm (231), a second clamp arm (232) and a limit block (233); one end of the first clamp arm (231) and one end of the second clamp arm (232) are both connected to the pressing member (240); the other end of the first clamp arm (231) and the other end of the second clamp arm (232) are both connected to the limit block (233); the first clamp arm (231) and the second clamp arm (232) can move towards or away from each other. In the reset state, the distance between the limit block (233) on the first clamp arm (231) and the limit block (233) on the second clamp arm (232) is smaller than the size of the probe (21) head; when the pressing member (240) is pressed, the clamp (230) can move toward the blocking member (220) to achieve the distance between the limit block (233) on the first clamp arm (231) and the limit block (233) on the second clamp arm (232).
3. The probe removal tool (10) according to claim 2, characterized in that: The end of the limit block (233) close to the clearance opening (211) has a chamfer, so that a trumpet shape gradually increases in the direction of the clearance opening (211) is formed between the limit block (233) on the first clamping arm (231) and the limit block (233) on the second clamping arm (232).
4. The probe removal tool (10) according to claim 2, characterized in that: The clamp (230) further comprises an elastic component (234), wherein the elastic component (234) is connected between the first clamp arm (231) and the second clamp arm (232), and the elastic component (234) is used to assist the first clamp arm (231) and the second clamp arm (232) to close and reset after being opened.
5. The probe removal tool (10) according to claim 4, characterized in that: The elastic component (234) is a spring, and both ends of the elastic component (234) in the length direction are respectively connected to the first clamping arm (231) and the second clamping arm (232).
6. The probe removal tool (10) according to any one of claims 2 to 5, characterized in that: In the reset state, a maximum distance L1 between the limit block (233) on the first clamp arm (231) and the limit block (233) on the second clamp arm (232) is greater than a maximum width W1 between the blocking members (220) arranged opposite to each other, and a minimum distance L2 between the limit block (233) on the first clamp arm (231) and the limit block (233) on the second clamp arm (232) is less than or equal to the maximum width W1 between the blocking members (220) arranged opposite to each other.
7. The probe removal tool (10) according to any one of claims 1 to 5, characterized in that: The clamping base (210) is in a rectangular columnar structure, the clamping chamber extends along the length direction of the clamping base (210), the clearance opening (211) extends along the length direction of the clamping base (210), and the blocking member (220) extends along the length direction of the clamping base (210).
8. The probe removal tool (10) according to any one of claims 1 to 5, characterized in that: There are a plurality of the clamps (230), and the plurality of the clamps (230) are arranged at intervals, and the spacing between adjacent clamps (230) is adapted to the spacing between adjacent probes (21). Each of the clamps (230) is connected to the pressing member (240) via a connecting strip, and when the pressing member (240) is pressed, each of the clamps (230) can be driven to move.
9. The probe removal tool (10) according to any one of claims 1 to 5, characterized in that: The probe disassembly tool (10) further comprises a lifting mechanism (300), wherein the lifting mechanism (300) comprises a ratchet (310), a driven gear (320), a synchronous chain (330) and a lifting rack (340), wherein the ratchet (310) is rotatably connected to the middle position of the clamping base (210), and the two end positions of the clamping base (210) are rotatably connected to the driven gear (320), and the driven gear (320) and the ratchet (310) are connected by the synchronous chain (330). The lifting rack (340) is connected to the supporting mechanism (100) and extends in a vertical direction. The lifting rack (340) is respectively arranged at each of the driven gears (320). The lifting rack (340) is meshedly connected with the corresponding driven gear (320). One of the lifting racks (340) is located on the outside of the corresponding driven gear (320), and the other lifting rack (340) is located on the inside of the corresponding driven gear (320).
10. The probe removal tool (10) according to claim 9, characterized in that: The lifting mechanism (300) further comprises a rotating handle (350), one end of which is connected to the ratchet (310), the clamping base (210) is provided with a first gear position (212) and a second gear position (213), the first gear position (212) and the second gear position (213) being distributed at an angle of 90° on the circumference, the rotating handle (350) being capable of reciprocating between the first gear position (212) and the second gear position (213), and when the rotating handle (350) is moved from the first gear position (212) to the second gear position (213), the first gear position (212) and the second gear position (213) are reciprocated. 12) when the handle (350) is rotated from the second gear position (213), the ratchet wheel (310) moves counterclockwise to drive the driven gear (320) to rotate counterclockwise and realize the clamping base (210) to descend relative to the support mechanism (100); when the rotating handle (350) is rotated from the second gear position (213) to the first gear position (212), the ratchet wheel (310) moves clockwise to drive the driven gear (320) to rotate clockwise and realize the clamping base (210) to ascend relative to the support mechanism (100); And / or, the support mechanism (100) comprises a first bracket (101) and a second bracket (120), the first bracket (101) and the second bracket (120) are arranged opposite to each other, and the first bracket (101) and the second bracket (120) are respectively connected to the lifting rack (340).