Novel probe for improving test stability
By using a new probe made of beryllium copper alloy, the existing spring probes have been solved, and the problem of poor stability of use, poor conduction ability and inconvenient replacement is achieved, and higher testing stability and longer service life are achieved.
Patent Information
- Application Number
- CN202421399701.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-19
- Publication Date
- 2025-06-10
- Estimated Expiration
- 2034-06-19
AI Technical Summary
The spring probes in the electrical characteristics test of existing quartz products have problems such as poor use stability, poor electrical conduction ability and inconvenient replacement, which affect the test stability and efficiency.
A new type of probe formed by beryllium copper alloy material has a structure including long vertical rod, semicircular rod, short vertical rod, horizontal rod and arc rod, which avoids the occurrence of nodes and instead uses a curved arc structure to replace the role of spring.
It improves test stability and electrical characteristics conduction capabilities, reduces impedance losses, extends service life, and performs more stably in high and low temperature environments.
Smart Images
Figure CN222965292U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electrical property testing, in particular to a novel probe for improving test stability. Background Art
[0002] Spring probes are commonly used in the field of quartz product electrical property testing at present. As shown in Figure 2 , the spring probe includes a sleeve 6, a spring 7 and a probe 8. The spring 7 and the probe 8 are installed inside the sleeve 6. The probe 8 relies on the spring 7 to expand and contract for reset. Such a structure mainly has the following problems:
[0003] 1. The stability of probe use. Since its service life completely depends on the stability of the spring 7 in the internal structure of the probe (about 150,000 times of back-and-forth expansion and contraction), the thinner the probe 8, the thinner the spring 7 will be. Therefore, it needs to be replaced about every three days.
[0004] 2. The electrical property conduction ability. During electrical property testing, the more nodes (incomplete and virtual contact places) there are on the test probe 8 and the sleeve 6, the more resistance loss there will be. There are originally two to three nodes on the probe itself of the original probe. In addition, when the probe is used, it needs to be installed in the sleeve 6, and the structure of the sleeve 6 itself will generate two to three nodes. Therefore, the resistance loss will also increase during testing.
[0005] 3. Inconvenient replacement. When replacing the original probe, it is necessary to manually remove the jig and fixture for replacement. With the development of the miniaturization of product size, the position will shift after reinstallation and needs to be readjusted, which affects the operation rate of the entire equipment and the work efficiency of personnel. Summary of the Invention
[0006] The technical problem to be solved by the utility model is to provide a novel probe for improving test stability, which is integrally formed of beryllium copper alloy material, no longer generates nodes, has smaller impedance loss during electrical property testing, and higher test stability.
[0007] The technical solution adopted by the utility model to solve its technical problem is: to provide a novel probe for improving test stability, including a probe body. The probe body is integrally formed. The probe body includes a long vertical rod, a semi-circular rod, a short vertical rod, a horizontal rod and an arc rod. The two ends of the lower part of the semi-circular rod are respectively provided with a long vertical rod and a short vertical rod. The lower end of the short vertical rod is connected to the horizontal rod through an arc rod. The horizontal rod extends towards the opposite side of the long vertical rod.
[0008] As a supplement to the technical solution described in the utility model, the material of the probe body is beryllium copper alloy.
[0009] As a supplement to the technical solution described in the present utility model, the radius of the outer side of the semi-circular rod is 2.65 mm.
[0010] As a supplement to the technical solution described in the present utility model, the radius of the outer side of the arc rod is 2 mm.
[0011] As a supplement to the technical solution described in the present utility model, the length of the long vertical rod is 24.85 mm.
[0012] As a supplement to the technical solution described in the present utility model, the length of the horizontal rod is 2.25 mm.
[0013] As a supplement to the technical solution described in the present utility model, the length of the short vertical rod is 2 mm.
[0014] As a supplement to the technical solution described in the present utility model, the long vertical rod, the semi-circular rod, the short vertical rod, the horizontal rod and the arc rod have the same diameter, and the diameter is 0.3 mm.
[0015] Beneficial effects: The present utility model relates to a new type of probe for improving test stability, which is integrally formed with beryllium copper alloy material, no longer has nodes, has less impedance loss during electrical characteristic testing, and has higher test stability; the original probe's expansion and contraction rely on the action of an internal spring, which is replaced by an integrally formed probe with a curved arc structure, resulting in a longer service life; since the original internal spring material of the probe is mainly SWP or SUS, the test stability in high and low temperature environments is worse, far lower than that of the integrally formed probe made of beryllium copper alloy material. Description of the Drawings
[0016] Figure 1 is a schematic structural diagram of the present utility model;
[0017] Figure 2 is a schematic structural diagram before the improvement of the present utility model;
[0018] Figure 3 is an application schematic diagram of the present utility model.
[0019] Illustration: 1. Long vertical rod, 2. Semi-circular rod, 3. Short vertical rod, 4. Horizontal rod, 5. Arc rod, 6. Sleeve, 7. Spring, 8. Probe. Detailed Embodiments
[0020] The following further elaborates the present utility model in conjunction with specific embodiments. It should be understood that these embodiments are only used to illustrate the present utility model and not to limit the scope of the present utility model. In addition, it should be understood that after reading the content taught by the present utility model, those skilled in the art can make various changes or modifications to the present utility model, and these equivalent forms also fall within the scope defined by the appended claims of this application.
[0021] An embodiment of the present utility model relates to a new type of probe for improving test stability. As Figures 1-3 shown, starting from the structure of the probe itself, the probe structure takes into account both the number of needle body nodes and the stability of test electrical characteristics. In addition, it also takes into account the development of future miniaturized products. The probe structure includes a probe body, and the probe body is integrally formed of beryllium copper alloy. The probe body includes a long vertical rod 1, a semi-circular rod 2, a short vertical rod 3, a horizontal rod 4, and an arc rod 5. At both ends of the lower part of the semi-circular rod 2, a long vertical rod 1 and a short vertical rod 3 are respectively arranged. The lower end of the short vertical rod 3 is connected to the horizontal rod 4 through an arc rod 5. The horizontal rod 4 extends towards the opposite side of the long vertical rod 1.
[0022] The integrated probe of the present utility model has several main features: it is no longer composed of the original probe 8, spring 7, and sleeve 6, but is integrally formed of beryllium copper alloy; due to the integral formation of the new integrated probe, no nodes are generated, the impedance loss is smaller during electrical characteristic testing, and the test stability is higher; the original probe's telescoping relying on the internal spring 7 (the smaller the probe, the thinner the spring) is replaced by the curved arc structure of the integrated probe, with a longer service life; since the material of the original internal spring of the probe is mainly SWP or SUS, the test stability is worse in high and low temperature environments, far lower than that of the integrated probe made of beryllium copper alloy; this new type of probe can be used in various test fields, including electrical characteristic testing, resistance testing, insulation testing, etc.
[0023] The outer radius of the semi-circular rod 2 is 2.65 mm; the outer radius of the arc rod 5 is 2 mm; the length of the long vertical rod 1 is 24.85 mm; the length of the horizontal rod 4 is 2.25 mm; the length of the short vertical rod 3 is 2 mm.
[0024] The long vertical rod 1, semi-circular rod 2, short vertical rod 3, horizontal rod 4, and arc rod 5 have the same diameter, which is 0.3 mm.
[0025] In the description of the present utility model, it should be understood that the orientation or positional relationship indicated by orientation words such as "front, back, up, down, left, right", "horizontal, vertical, perpendicular, horizontal", and "top, bottom" is usually based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description. Without contrary explanations, these orientation words do not indicate and imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the protection scope of the present utility model; the orientation words "inside, outside" refer to the inside and outside relative to the contour of each component itself.
[0026] For ease of description, spatial relative terms such as "above", "over", "on the upper surface", "upper" etc. can be used here to describe the spatial positional relationship of a device or feature shown in the figure with other devices or features. It should be understood that the spatial relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figure. For example, if the device in the attached drawing is inverted, the device described as "above" or "over" other devices or structures will then be positioned "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both the orientations of "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the corresponding explanations are made for the spatial relative descriptions used here.
[0027] In addition, it should be noted that the use of terms such as "first", "second" to limit components is only for the convenience of differentiating the corresponding components. Without additional statements, the above terms have no special meanings, and thus should not be construed as limiting the protection scope of the present utility model.
[0028] The above has introduced in detail a novel probe for improving test stability provided by the present application. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those of ordinary skill in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.
Claims
1. A novel probe for improving test stability, comprising a probe body, characterized in that: The probe body is integrally formed and comprises a long vertical rod (1), a semicircular rod (2), a short vertical rod (3), a horizontal rod (4) and an arc rod (5). The two ends of the lower part of the semicircular rod (2) are respectively provided with a long vertical rod (1) and a short vertical rod (3). The lower end of the short vertical rod (3) is connected to the horizontal rod (4) through the arc rod (5). The horizontal rod (4) extends toward the opposite side of the long vertical rod (1).
2. A novel probe for improving test stability according to claim 1, characterized in that: The material of the probe body is beryllium copper alloy.
3. A novel probe for improving test stability according to claim 1, characterized in that: The radius of the outer side of the semicircular rod (2) is 2.65 mm.
4. A novel probe for improving test stability according to claim 1, characterized in that: The radius of the outer side of the arc rod (5) is 2 mm.
5. The novel probe for improving test stability according to claim 1, characterized in that: The length of the long vertical rod (1) is 24.85 mm.
6. A novel probe for improving test stability according to claim 1, characterized in that: The length of the horizontal rod (4) is 2.25 mm.
7. A novel probe for improving test stability according to claim 1, characterized in that: The length of the short vertical rod (3) is 2 mm.
8. The novel probe for improving test stability according to claim 1, characterized in that: The diameters of the long vertical rod (1), the semicircular rod (2), the short vertical rod (3), the horizontal rod (4) and the arc rod (5) are all the same, which is 0.3 mm.