ARM test system based on ATE machine V93000
By designing an ARM test system based on ATE machine V93000, the problem of fast and accurate testing of ARM chips is solved, an efficient and accurate testing process is achieved, and powerful expansion functions and rapid development cycles are available.
Patent Information
- Application Number
- CN202421493540.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-27
- Publication Date
- 2025-06-10
- Estimated Expiration
- 2034-06-27
AI Technical Summary
The prior art is difficult to meet the fast and accurate testing needs of ARM chips, especially when the chip complexity and integration are constantly increasing.
A ARM test system based on ATE machine V93000 was designed. The system includes a test board and a memory card. The test code is downloaded through the JTAG interface, the test program is transmitted using the burn interface, and the combination of different test functions is realized through modular design.
It realizes efficient and accurate testing of ARM chips, has high reliability and high stability, powerful expansion functions and network transmission functions, fast computing speed and short development cycle, significantly improving the efficiency and accuracy of ARM testing.
Smart Images
Figure CN222965357U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of ARM test equipment, and particularly relates to an ARM test system based on an ATE machine V93000. Background Art
[0002] With the rapid development of science and technology in our country, the application scope of ARM products has been gradually expanded. It has many advantages, such as high reliability and stability, powerful expansion function and network transmission function, fast operation speed, short development cycle, etc., and has become the mainstream chip of electronic design systems. With the increasing complexity and integration of chips, the requirements for the reliability test and screening of electronic components are also getting higher and higher, which makes the test demand for ARM particularly urgent.
[0003] The high-end ATE machine V93000 has powerful test capabilities. Its supporting software is Smartest, which is a programming software running under the Linux operating system. Its stability is very good. Secondly, the test flow in the form of a Smartest flowchart looks very clear and straightforward.
[0004] In order to better test ARM, it is necessary to develop a dedicated test system that can meet the fast and accurate test requirements of ARM through the ATE machine V93000. Content of the Utility Model
[0005] The utility model provides an ARM test system based on an ATE machine V93000. Since this test system is based on the ATE machine V93000, it has the advantages of high reliability and stability, powerful expansion function and network transmission function, fast operation speed, short development cycle, etc.
[0006] To achieve the above object, the utility model provides the following technical solution: an ARM test system based on an ATE machine V93000, which includes: a test board, the test board is adapted to the ATE machine, and a test interface electrically connected to the ATE machine is provided at the bottom. A chip socket is provided in the center of the top of the test board, and the test interface is electrically connected to the chip socket; a memory card, the memory card is an internal board card adapted to the ATE machine and communicates with the ATE machine through a data interface at the bottom. A memory electrically connected to the data interface is provided at the top of the memory card, and a programming interface electrically connected to the memory; a power interface and a reset interface electrically connected to the chip socket are provided at the top of the test board.
[0007] Preferably, a clock circuit electrically connected to the chip socket is provided at the bottom of the test board.
[0008] Preferably, a JTAG interface electrically connected to the chip socket is provided at the top of the test board.
[0009] Preferably, a transfer socket is provided at the top of the memory card corresponding to the data interface. The transfer socket is electrically connected to the data interface and is adapted to the test interface.
[0010] Preferably, a plurality of copper columns are fixedly provided at the top of the memory card, and through holes are provided in the test board corresponding to the respective copper columns.
[0011] The beneficial effects of the present utility model are as follows: The chip socket is used to install the ARM chip. Taking STM32F429IG as an example, during the test of the ARM, first, the code for testing the ARM function corresponding to STM32F429IG is downloaded into the ARM chip through the JTAG interface, and then the written V93000 test program is transmitted to the memory of the memory card through the programming interface, thus completing the preliminary establishment of the system. During the test, the memory card and the test card are installed into the ATE machine, and the test program in the memory card is called to perform efficient and accurate test tasks on the ARM chip on the test card. When the test is completed, only the ARM chip needs to be replaced to perform a new test. Since the test system is based on the ATE machine V93000, it has the advantages of high reliability, high stability, powerful expansion function and network transmission function, fast operation speed, short development cycle, etc. Therefore, the ARM test system based on the ATE machine V93000 has important application value. The test card and the memory card can be combined through the transfer socket and are fixedly connected by using copper columns, reducing the occupation of the ATE machine interface. And different test functions can be combined and matched through modular design. Description of the Drawings
[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0013] Figure 1 It is a schematic diagram of the top structure of the test board of the present utility model;
[0014] Figure 2 It is a schematic diagram of the top structure of the memory card of the present utility model;
[0015] Figure 3 It is a schematic diagram of the bottom structure of the test board of the present utility model;
[0016] Figure 4 It is a schematic diagram of the bottom structure of the memory card of the present utility model.
[0017] In the figure: 1, test board; 2, test interface; 3, chip socket; 4, memory card; 5, data interface; 6, memory; 7, programming interface; 8, power interface; 9, reset interface; 10, clock circuit; 11, JTAG interface; 12, adapter socket; 13, copper pillar. Specific embodiments
[0018] Next, the technical solutions of the present invention will be clearly and completely described in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without making creative efforts belong to the scope of protection of the present invention.
[0019] According to Figure 1 , Figure 2 , Figure 3 , Figure 4 As shown, an ARM test system based on the ATE machine V93000 includes: a test board 1, the test board 1 is adapted to the ATE machine, and a test interface 2 electrically connected to the ATE machine is provided at the bottom. A chip socket 3 is provided in the center of the top of the test board 1, and the test interface 2 is electrically connected to the chip socket 3; a memory card 4, the memory card 4 is an internal board card adapted to the ATE machine and communicates with the ATE machine through a data interface 5 at the bottom. A memory 6 electrically connected to the data interface 5 and a programming interface 7 electrically connected to the memory 6 are provided at the top of the memory card 4; a power interface 8 and a reset interface 9 electrically connected to the chip socket 3 are provided at the top of the test board 1. Among them, preferably, a clock circuit 10 electrically connected to the chip socket 3 is provided at the bottom of the test board 1. And, a JTAG interface 11 electrically connected to the chip socket 3 is provided at the top of the test board 1.
[0020] Through the above components, the chip socket 3 is used to install the ARM chip. Taking STM32F429IG as an example, during the testing process of the ARM, first, the code for the ARM function test corresponding to STM32F429IG is downloaded into the ARM chip through the JTAG interface 11. Then, the written V93000 test program is transmitted to the memory 6 of the memory card 4 through the programming interface 7, thus completing the preliminary establishment of the system. During the testing process, the memory card 4 and the test card are installed into the ATE machine, and the test program in the memory card 4 is called to perform efficient and accurate test tasks on the ARM chip on the test card. After the testing is completed, only the ARM chip needs to be replaced to conduct a new test. Since this test system is based on the ATE machine V93000, it has the advantages of high reliability, high stability, powerful expansion function and network transmission function, fast operation speed, short development cycle, etc. Therefore, the ARM test system based on the ATE machine V93000 has important application value.
[0021] A transfer socket 12 is provided at the top of the memory card 4 corresponding to the data interface 5. The transfer socket 12 is electrically connected to the data interface 5 and is adapted to the test interface 2. A plurality of copper posts 13 are fixedly provided at the top of the memory card 4, and the test board 1 is provided with through holes corresponding to each of the copper posts 13.
[0022] With this setting, the test card and the memory card 4 can be combined through the transfer socket 12 and fixedly connected by using the copper posts 13, reducing the occupation of the ATE machine interface. And different test functions can be combined and matched through modular design.
[0023] As described above, only the specific implementation manners of the present invention are provided, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of changes or substitutions, which should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims
1. An ARM test system based on ATE machine V93000, characterized in that ,include: A test board (1), the test board (1) is adapted to an ATE machine, and a test interface (2) electrically connected to the ATE machine is provided at the bottom, a chip seat (3) is provided at the center of the top of the test board (1), and the test interface (2) is electrically connected to the chip seat (3); A memory card (4), the memory card (4) being an internal board adapted to the ATE machine and communicating with the ATE machine via a data interface (5) at the bottom, the memory card (4) being provided with a memory (6) electrically connected to the data interface (5) and a burning interface (7) electrically connected to the memory (6) at the top; The top of the test board (1) is provided with a power supply interface (8) and a reset interface (9) which are electrically connected to the chip holder (3).
2. The ARM test system based on ATE machine V93000 according to claim 1, characterized in that: A clock circuit (10) electrically connected to the chip holder (3) is provided at the bottom of the test board (1).
3. The ARM test system based on ATE machine V93000 according to claim 1, characterized in that: A JTAG interface (11) electrically connected to the chip holder (3) is provided on the top of the test board (1).
4. The ARM test system based on ATE machine V93000 according to claim 1, characterized in that: A switching socket (12) is provided at the top of the memory card (4) corresponding to the data interface (5); the switching socket (12) is electrically connected to the data interface (5) and is compatible with the test interface (2).
5. The ARM test system based on ATE machine V93000 according to claim 4 is characterized in that: A plurality of copper pillars (13) are fixedly provided on the top of the memory card (4), and the test board (1) is provided with a through hole corresponding to each of the copper pillars (13).