Butt joint assembly for interface board of tested piece of semiconductor chip testing machine

Abstract

The utility model relates to a butt joint assembly of a tested piece interface board of a semiconductor chip testing machine. The two groups of template assemblies are arranged at the two ends of the two sides of the top surface of the testing machine and can stretch out and draw back; the two groups of buckling assemblies are arranged on the top surfaces of the two groups of template assemblies in a sliding mode and used for buckling external butt joint pieces in the length directions of the two groups of template assemblies; the linkage assemblies are arranged at the telescopic ends of the same ends of the two formwork assemblies, used for driving the two buckle assemblies to move horizontally and adjustable in length, and the two quick connecting assemblies are arranged at the bottoms of the telescopic ends of the two ends and the bottoms of the middles of the two formwork assemblies correspondingly. According to the utility model, through the arrangement of the rapid connection assembly, the template assembly can be conveniently and rapidly disassembled and assembled, the installation efficiency is improved, and through the telescopic template assembly and the linkage assembly, the device can effectively adapt to test machines with different sizes, and the applicability is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, and particularly refers to a docking component for a workpiece interface board of a semiconductor chip tester. Background Art

[0002] In the current semiconductor industry, many semiconductor products need to be tested for performance by a tester; in order to achieve automated testing, the tester is usually used in cooperation with a manipulator; however, since the tester is a large-scale precision testing instrument, it not only has a large volume and heavy weight, but also has a narrow space on the manipulator, which makes it difficult for the tester to be aligned, resulting in low work efficiency.

[0003] The prior art 202210378613.3 discloses a quick docking mechanism applicable to different types of test hosts. Although it solves the above problems, it is fixed to the tester by bolts, which is inconvenient to disassemble and assemble, affects the efficiency, and cannot adapt to testers of different sizes, with low adaptability. Summary of the Utility Model

[0004] The purpose of the utility model is to provide a docking component for a workpiece interface board of a semiconductor chip tester to overcome the deficiencies of the prior art.

[0005] To achieve the above purpose, the technical solution adopted by the utility model is: a docking component for a workpiece interface board of a semiconductor chip tester, which includes two sets of template components that are retractable and placed at both ends on the top surface of the tester, two sets of buckle components that are slidably arranged on the top surfaces of the two sets of template components and are used to buckle external docking parts along the length direction of the two sets of template components, a linkage component that is arranged on the telescopic ends of the same ends of the two template components and is used to drive the two sets of buckle components to translate and can adjust the length, and two sets of quick connection components that are respectively arranged at the bottom of the telescopic ends and the middle bottom of the two ends of the two sets of template components.

[0006] Preferably, each of the two sets of template components includes a fixed template placed on the top surface of the tester, two telescopic plates whose one ends are respectively telescopically arranged inside the two ends of the fixed template, and two telescopic templates arranged on the other ends of the two telescopic plates.

[0007] Preferably, each of the two sets of quick connection components includes two first fixing plates and two second fixing plates that are respectively arranged at the bottom of the outer sides in the width direction and the bottom of the outer sides in the length direction of the two telescopic templates and are perpendicular to each other, four limiting plates that are respectively telescoped on the outer surfaces of the two first fixing plates and the two second fixing plates, a number of limiting insertion rods that are respectively arranged on the surfaces of the four limiting plates that are in contact with the four first fixing plates and are used to be inserted into a number of holes of the testing machine, two extension plates that are respectively arranged at the perpendicular ends of the two first fixing plates and the two second fixing plates, a number of insertion pin rods whose one ends are respectively telescopically arranged at the perpendicular ends of the two second fixing plates and the two first fixing plates and whose one ends are used to penetrate the extension plates, two dial plates that are respectively arranged at the ends where the number of insertion pin rods of the two second fixing plates penetrate the extension plates, a number of springs that are sleeved on the number of insertion pin rods between the two dial plates and the two second fixing plates and are used to always push the two dial plates towards the two extension plates, and two third fixing plates that are arranged at the bottom of the outer side in the length direction of the fixed template; a number of limiting insertion rods are also arranged on the two third fixing plates.

[0008] Preferably, the linkage component includes two turntables that are rotatably arranged on the top surfaces of the two telescopic templates at the same end, a handle that is arranged in the middle of the top surface of one of the turntables to drive the turntable to rotate, and three threaded telescopic rod components whose two ends are respectively hinged between the two turntables and between the two turntables and the two sets of buckle components.

[0009] Preferably, the three threaded telescopic rod components include three pipe sleeves that are located between the two turntables and between the two turntables and the two sets of buckle components and have internal threads, three threaded rods whose one ends are respectively threadedly connected to the three pipe sleeves, and six rotating heads that are respectively rotatably arranged at the other ends of the three pipe sleeves and the three threaded rods; the six rotating heads are respectively hinged to the two turntables and the two sets of buckle components.

[0010] Preferably, each of the two sets of buckle components includes a slide rail that is arranged along the length direction in the middle of the top surface of the fixed template, a long strip slider that is slidably arranged on the slide rail, and a clamping groove that is arranged on the inner side of the long strip slider and is used for clamping in an L shape.

[0011] Due to the application of the above technical solutions, the utility model has the following advantages compared with the prior art:

[0012] By setting the quick connection component, the utility model can conveniently and quickly disassemble and assemble the template component, improve the installation efficiency, and through the telescopic template component and the linkage component, it can effectively adapt to testing machines of different sizes and improve the applicability. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The following further illustrates the technical solutions of the utility model with reference to the drawings:

[0014] Appendix Figure 1Schematic diagram of the overall structure of the docking component of the device under test interface board of the semiconductor chip tester described in the present utility model;

[0015] Appendix Figure 2 For the docking component of the device under test interface board of the semiconductor chip tester described in the present utility model Figure 1 Schematic diagram of the partial enlarged structure at location A;

[0016] Appendix Figure 3 For the docking component of the device under test interface board of the semiconductor chip tester described in the present utility model Figure 1 Schematic diagram of the partial enlarged structure at location B;

[0017] Appendix Figure 4 Schematic diagram of the inner side structure of the docking component of the device under test interface board of the semiconductor chip tester described in the present utility model;

[0018] Appendix Figure 5 Schematic diagram of the outer side structure of the docking component of the device under test interface board of the semiconductor chip tester described in the present utility model.

[0019] Wherein: 1. Template component; 11. Fixed template; 12. Telescopic plate; 13. Telescopic template; 2. Buckle component; 21. Slide rail; 22. Long strip slider; 23. Card slot; 3. Linkage component; 31. Turntable; 32. Handle; 33. Threaded telescopic rod component; 331. Sleeve; 332. Threaded rod; 333. Rotating head; 4. Quick connection component; 41. First fixing plate; 42. Second fixing plate; 43. Limiting plate; 44. Limiting insertion rod; 45. Extension plate; 46. Insertion pin rod; 47. Pusher; 48. Spring; 49. Third fixing plate. Specific embodiments

[0020] The present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0021] Appendix Figures 1-5For the docking component of the DUT interface board of the semiconductor chip tester described in this utility model, it includes two sets of template components 1 that are placed at both ends of the top surface of the tester and can be telescoped, two sets of buckle components 2 that are slidably arranged on the top surfaces of the two sets of template components 1 and are used to buckle external docking parts along the length direction of the two sets of template components 1, a linkage component 3 that is arranged on the telescopic ends of the same ends of the two template components 1 and is used to drive the two sets of buckle components 2 to translate and can adjust the length, and two sets of quick connection components 4 that are respectively arranged at the bottom of the telescopic ends and the middle bottom of the two ends of the two sets of template components 1; each of the two sets of template components 1 includes a fixed template 11 placed on the top surface of the tester, two telescopic plates 12 whose one ends are respectively telescopically arranged inside the two ends of the fixed template 11, and two telescopic templates 13 arranged on the other ends of the two telescopic plates 12; each of the two sets of quick connection components 4 includes two first fixing plates 41 and two second fixing plates 42 that are respectively arranged at the bottom on the outer side in the width direction and the bottom on the outer side in the length direction of the two telescopic templates 13 and are perpendicular to each other, four limiting plates 43 that are respectively telescoped on the outer surfaces of the two first fixing plates 41 and the two second fixing plates 42, several limiting insertion rods 44 that are respectively arranged on the surfaces where the four limiting plates 43 are in contact with the four first fixing plates 41 and are used to insert into several holes of the tester, two extension plates 45 that are respectively arranged at the perpendicular ends of the two first fixing plates 41 and the two second fixing plates 42, several insertion rods 46 whose one ends are respectively telescopically arranged at the perpendicular ends of the two second fixing plates 42 and the two first fixing plates 41 and one end is used to penetrate the extension plates 45, two dial plates 47 that are respectively arranged at the ends where several insertion rods 46 penetrate the extension plates 45 of the two second fixing plates 42, several springs 48 that are sleeved on several insertion rods 46 between the two dial plates 47 and the two second fixing plates 42 and are used to always push the two dial plates 47 towards the two extension plates 45, and two third fixing plates 49 that are arranged at the bottom on the outer side in the length direction of the fixed template 11; several limiting insertion rods 44 are also arranged on the two third fixing plates 49; the linkage component 3 includes two turntables 31 that are rotatably arranged on the top surfaces of the two telescopic templates 13 at the same end, a handle 32 arranged in the middle of the top surface of one of the turntables 31 to drive the turntable 31 to rotate, and three threaded telescopic rod components 33 whose two ends are respectively hinged between the two turntables 31 and between the two turntables 31 and the two sets of buckle components 2; each of the three threaded telescopic rod components 33 includes three pipe sleeves 3331 with internal threads between the two turntables 31 and between the two turntables 31 and the two sets of buckle components 2, three threaded rods 332 whose one ends are respectively threadedly connected to the three pipe sleeves 3331, and six rotating heads 333 that are respectively rotatably arranged on the other ends of the three pipe sleeves 3331 and the three threaded rods 332; the six rotating heads 333 are respectively hinged to the two turntables 31 and the two sets of buckle components 2;The two sets of buckle assemblies 2 each include a slide rail 21 disposed along the length direction in the middle of the top surface of the fixed template 11, a long slider 22 slidably disposed on the slide rail 21, and an L-shaped slot 23 for buckling disposed on the inner side of the long slider 22. ;

[0022] When in use: according to the size of the test machine, rotate the threaded rod 332 to adjust the distance between the two fixed templates 11 and the distance between the telescopic template 13 and the two fixed templates. At this time, the distance is larger than the size of the test machine, and then rotate and retract the threaded rod 332, and then the fixed plate and the telescopic template 13 move toward the test machine, and then the first fixed plate 41, the second fixed plate 42, and the third fixed plate 49 move toward the test machine. When the first fixed plate 41 and the second fixed plate 42 just fit on the four corners and two sides of the test machine and the limit rod 44 on the third fixed plate 49 is inserted into the hole of the test machine, stop rotating the threaded rod 33. 2, and then insert the limit plate 43 into the outer surface of the first fixing plate 41 and the second fixing plate 42, and then the limit rod 44 on the limit plate 43 penetrates the first fixing plate 41 and the second fixing plate 42 and is inserted into the hole of the test machine. When the rod is completely inserted into the hole of the test machine, at this time, the latch rod 46 on one of the limit plates 43 is facing the hole of the extension plate 45 on the other limit plate 43 which is perpendicular to each other, and then the spring 48 drives the paddle 47 to move toward the extension plate 45, and the paddle 47 drives the latch rod 46 to move toward the extension plate 45 and penetrate the extension plate 45, and then the limit is completed, and finally the test phase is started.

[0023] The above are only specific application examples of the utility model, and do not constitute any limitation on the protection scope of the utility model. Any technical solution formed by equivalent transformation or equivalent replacement falls within the protection scope of the utility model.

Claims

1. A semiconductor chip tester DUT interface board docking assembly, characterized in that: The invention comprises two sets of template assemblies which are placed on both sides of the top surface of the testing machine and are retractable at both ends, two sets of snap-in assemblies which are slidably arranged on the top surfaces of the two sets of template assemblies and are used to prevent snap-in of external docking parts along the length direction of the two sets of template assemblies, a linkage assembly which is arranged on the telescopic ends at the same end of the two template assemblies and is used to drive the two sets of snap-in assemblies to translate and can adjust the length, and two sets of quick connection assemblies which are respectively arranged at the bottom of the telescopic ends at both ends and the middle bottom of the two sets of template assemblies.

2. The semiconductor chip tester DUT interface board docking assembly according to claim 1, characterized in that: The two sets of template components include a fixed template placed on the top surface of the test machine, two telescopic plates with one end telescopically arranged at both ends of the fixed template, and two telescopic templates arranged on the other ends of the two telescopic plates.

3. The semiconductor chip tester DUT interface board docking assembly according to claim 1, characterized in that: The two sets of quick connection components include two first fixing plates and two second fixing plates respectively arranged at the bottom of the outer side in the width direction and the bottom of the outer side in the length direction of the two telescopic templates and perpendicular to each other, four limit plates respectively telescopically arranged on the outer surfaces of the two first fixing plates and the two second fixing plates, a plurality of limit plug rods respectively arranged on the surface of the four limit plates and the four first fixing plates that fit together and are used to be inserted into a plurality of holes of the testing machine, and two extension plates respectively arranged on one end of the two first fixing plates and the two second fixing plates that are perpendicular to each other. The plate, a plurality of latch rods one end of which is telescopically arranged on one end of the two second fixed plates and the two first fixed plates which are perpendicular to each other and one end of which is used to penetrate the extension plate, two paddles which are respectively arranged on the two second fixed plates at one end where the plurality of latch rods penetrate the extension plate, a plurality of springs which are sleeved on the plurality of latch rods and located on a section of the two paddles and the two second fixed plates and are used to always push the two sections of the paddles to move toward the two extension plates, and two third fixed plates which are arranged on the bottom of the outer side in the length direction of the fixed template; a plurality of limit rods are also arranged on the two third fixed plates.

4. The semiconductor chip tester DUT interface board docking assembly according to claim 1, characterized in that: The linkage assembly includes two turntables rotatably arranged on the top surfaces of two telescopic templates at the same end, a handle arranged in the middle of the top surface of one of the turntables to drive the turntable to rotate, and three threaded telescopic rod assemblies with two ends respectively hinged between the two turntables and between the two turntables and two sets of buckle assemblies.

5. The semiconductor chip tester DUT interface board docking assembly according to claim 4, characterized in that: The three threaded telescopic rod assemblies include three pipe sleeves with internal threads located between the two turntables and between the two turntables and the two groups of buckle assemblies, three threaded rods with one end threadedly connected to the three pipe sleeves, and six rotating heads rotatably arranged on the other ends of the three pipe sleeves and the three threaded rods; the six rotating heads are respectively hinged to the two turntables and the two groups of buckle assemblies.

6. The semiconductor chip tester DUT interface board docking assembly according to claim 1, characterized in that: The two groups of buckle assemblies both include a slide rail arranged along the length direction in the middle of the top surface of the fixed template, a long slider slidably arranged on the slide rail, and an L-shaped slot for buckling arranged on the inner side of the long slider.

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