Testing device and testing equipment
By designing a test device that integrates USB interface to Type-c interface, the problem of low testing efficiency of solid-state drives in the prior art is solved, and the functions of multiple interfaces are realized simultaneous testing and fast switching are significantly improved.
Patent Information
- Application Number
- CN202421580166.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-04
- Publication Date
- 2025-06-13
- Estimated Expiration
- 2034-07-04
AI Technical Summary
In the prior art, the test hardware test method of solid-state drives relies on the Type-C interface of the test host, resulting in only one piece of product testing at a time. During large-scale product interface testing, it requires frequent plug-ins and plug-ins, which takes a long test time and low efficiency.
A test device is designed, including a box, a hub and a switch. The hub has multiple USB interfaces. The switch can convert the USB interface into a Type-C interface, and integrate the interface conversion function and pin switching function in the switch. The USB interface is increased through the integrator and the number of interface plug-ins is reduced.
By increasing the number of interfaces to be tested, reducing the number of interface plug-ins, improving the testing efficiency, and switching the front and back test pins of the interface to be tested is realized without plugging the interface to be tested.
Smart Images
Figure CN222980174U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of storage devices, and in particular, to a test device and a test equipment. Background Art
[0002] Regarding the test hardware test method for solid-state drives, the prior art relies on the Type-c interface of the test host for transmission testing. The drawback of the prior art is that the current mainstream test platform can only test 1 product through the built-in Type-c interface at a time. Especially when conducting large-scale product interface tests, it is necessary to repeatedly plug and unplug the products to be tested, which takes a long test time and results in low test efficiency. Utility Model Content
[0003] This application aims to solve at least one of the technical problems existing in the prior art. For this reason, this application proposes a test device and a test equipment that can improve test efficiency.
[0004] The test device according to the first aspect embodiment of this application includes: a box body; a hub, the hub is placed in the box body, the hub has a plurality of first USB interfaces, and one end of the hub is used to connect to a host device; a switch, one end of the switch is a second USB interface, the other end is a Type-c interface component, the second USB interface is plugged into the first USB interface, the Type-c interface component is plugged into the interface to be tested, the switch further includes a switching switch, the switching switch is electrically connected to the second USB interface and the Type-c interface component, and the switching switch is used to switch the test pins of the interface to be tested to positive test pins or negative test pins.
[0005] According to some embodiments of this application, the Type-c interface component includes at least one of the following interfaces: a Type-c male head, a Type-c female head.
[0006] According to some embodiments of this application, a limiting groove is provided at the bottom of the box body, the hub is placed in the limiting groove, and the hub is clamped in the limiting groove.
[0007] According to some embodiments of this application, a limiting member is further included. The two ends of the limiting member are respectively a first fixing portion and a second fixing portion. The first fixing portion and the second fixing portion are fixed to the bottom of the box body. A limiting portion is formed by the middle part of the limiting member protruding. The two ends of the limiting portion are respectively connected to the first fixing portion and the second fixing portion. A first limiting hole is formed between the limiting portion, the first fixing portion, the second fixing portion and the box body. The hub passes through the first limiting hole.
[0008] According to some embodiments of the present application, it further includes a support member, the support member is fixed inside the box body, there are two support members, and both the limiting member and the hub are located between the two support members.
[0009] According to some embodiments of the present application, it further includes a fixing plate, both ends of the fixing plate are fixed on the upper surface of the support member, the fixing plate is provided with a plurality of second limiting holes, and the plurality of second limiting holes correspond to the plurality of Type-c interface components one by one, and part of the Type-c interface components penetrate through the second limiting holes.
[0010] According to some embodiments of the present application, it further includes a lid, one end of the box body has an opening, the lid is detachably connected to the upper surface of the box body, the lid is provided with a third limiting hole, the third limiting hole corresponds to the second limiting hole, and the Type-c interface component passes through the second limiting hole and the third limiting hole in sequence to be connected to the interface to be tested.
[0011] According to some embodiments of the present application, it further includes a power switch, the power switch is installed on the surface of the lid, and the other end of the hub is connected to the power switch.
[0012] According to some embodiments of the present application, a dial is provided on the outer surface of the box body, one end of the dial is connected to the switching switch, and the dial can move relative to the box body to switch the test pins of the interface to be tested.
[0013] The test device according to the second aspect embodiment of the present application includes the test device as described in the first aspect, and further includes a host device and a power supply device; one end of the hub is connected to the host device, and the other end is connected to the power supply device.
[0014] The test device and the test equipment according to the embodiments of the present application at least have the following beneficial effects: By using an integrator to increase the USB interface, the present application increases the number of interfaces to be tested, reduces the number of interface pluggings and unplugging, and integrates the interface conversion function and the interface pin switching function in the switch, that is, integrates the function of converting the USB interface to the Type-c interface and the function of switching the front and back test pins in the switch, and can switch the front and back test pins of the interface to be tested, further improving the test efficiency.
[0015] The additional aspects and advantages of the present application will be partially given in the following description, partially become obvious from the following description, or be understood through the practice of the present application. Description of the Drawings
[0016] The following will further describe the present application in conjunction with the drawings and embodiments, where:
[0017] Figure 1 It is the first top view of the test device in the embodiment of the present application;
[0018] Figure 2 It is the second top view of the test device in the embodiment of the present application;
[0019] Figure 3 It is the overall structure diagram of the test device in the embodiment of the present application.
[0020] Reference numerals:
[0021] Box body 100, lid 200, hub 300, limiting member 400, support member 500, fixing plate 600,
[0022] Limiting groove 110,
[0023] Third limiting hole 210, power switch 220,
[0024] First USB interface 310,
[0025] First limiting hole 410,
[0026] Second limiting hole 610,
[0027] Type-c interface assembly 710, third through hole 720. Detailed implementation manners
[0028] The embodiments of the present application will be described in detail below. Examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and should not be construed as a limitation to the present application.
[0029] In the description of the present application, it should be understood that for the orientation description, such as the orientation or positional relationship indicated by up, down, front, back, left, right, etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.
[0030] In the description of the present application, the meaning of several is more than one, the meaning of multiple is more than two, greater than, less than, exceeding, etc. are understood as not including the recited number, and above, below, within, etc. are understood as including the recited number. If the first and second are described only for the purpose of distinguishing technical features, they should not be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence of the indicated technical features.
[0031] In the description of this application, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in this application based on the specific content of the technical solution.
[0032] In the description of the present application, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0033] In the traditional interface testing method, the interface to be tested is connected through the interface provided by the host for testing. Only one interface can be tested at a time, and frequent plugging and unplugging are required to complete the testing task of multiple interfaces. On the one hand, for the interface provided by the host, frequent plugging and unplugging will make it more susceptible to damage. On the other hand, when a large number of interfaces need to be tested, the traditional interface testing method has low testing efficiency. Based on this, the present application proposes a testing device that can effectively improve the testing efficiency.
[0034] Reference Figure 1 and Figure 3 The testing device includes a box 100, a hub 300 and a switch. The box 100 and the switch are both placed inside the box. Specifically, the box 100 is usually square in shape. The box 100 has a containing space inside. The hub 300 and the switch are both placed in the containing space.
[0035] The hub 300 has multiple first USB interfaces 310, one end of the switch is the second USB interface, and the other end of the switch is the Type-c interface component 710. The second USB interface is plugged into the first USB interface 310, and the Type-c interface component 710 is plugged into the interface to be tested. The switching switch is electrically connected to the second USB interface and the Type-c interface component 710. Since the hub 300 has multiple first USB interfaces 310, multiple switches can be connected, thereby increasing the number of interfaces that can be tested simultaneously.
[0036] Among them, in order to facilitate the access of the Type-c interface, improve the compatibility of the switch, and at the same time reduce the plugging and unplugging frequency of the switch, the Type-c interface component 710 includes at least one of the following interfaces: Type-c male head, Type-c female head. When the Type-c component includes a Type-c male head and a Type-c female head, the Type-c male head or the Type-c female head can be accessed once. When it is necessary to switch to another interface, there is no need to replace the switch.
[0037] Generally speaking, it is necessary to test the front pins and back pins of the interface to be tested. The switch of the present application further includes a switching switch, which is used to switch the test pins of the product to be tested, that is, to switch the test pins of the interface to be tested to the front test pins or the back test pins. Through the switching switch, the current test pins can be switched to the front pins or the back pins without unplugging the interface to be tested.
[0038] One end of the hub 300 is used to connect to the host device, and the host device can perform various performance tests on the interface to be tested.
[0039] In order to fix the hub 300 inside the box 100, the test device further includes a limiting groove 110 and a limiting member 400.
[0040] The hub 300 is placed in the limiting groove 110, and the hub 300 is clamped in the limiting groove 110. The sizes of the limiting groove 110 and the hub 300 match, so that part of the hub 300 can just be stuck in the limiting groove 110 to prevent the hub 300 from sliding randomly inside the box 100.
[0041] In addition, a limiting member 400 is fixed inside the test device. The two ends of the limiting member 400 are respectively a first fixing part and a second fixing part. The first fixing part and the second fixing part are fixed to the bottom of the box 100 to fix the limiting member 400 inside the box 100. A limiting part is formed by the middle part of the limiting member 400 protruding. The two ends of the limiting part are respectively connected to the first fixing part and the second fixing part. The whole shape of the limiting member 400 is in the shape of a "worker". A first limiting hole 410 is formed between the limiting part, the first fixing part, the second fixing part and the box 100. The hub 300 passes through the first limiting hole 410, and the limiting member 400 surrounds part of the hub 300 to further limit the movement of the limiting member 400. In some embodiments, each hub 300 is limited by two limiting members 400. In order to avoid the limiting member 400 hindering the interface of the hub 300 when the hub 300 is used, the two limiting members 400 are respectively arranged near the two ends of the hub 300.
[0042] In some embodiments, the test device further includes a support member 500. The support member 500 is fixed inside the box body 100. There are two support members 500. Both the limiting member 400 and the hub 300 are located between the two support members 500. The support member 500 has an upper surface and a lower surface. The lower surface of the support member 500 is fixed to the bottom of the box body 100, and the upper surface of the support member 500 is used to fix other parts.
[0043] Referring to Figure 2 , a top view of the inside of the box body is shown. The test device further includes a fixing plate 600. The fixing plate 600 is located inside the box body 100. Both ends of the fixing plate 600 are fixed to the upper surface of the support member 500. The fixing plate 600 is provided with a plurality of second limiting holes 610. The plurality of second limiting holes 610 correspond one-to-one to a plurality of Type-c interface components 710, that is, the number of the second limiting holes 610 is the same as the number of interfaces of the Type-c interface components 710. For example, a hub 300 has 3 USB interfaces, and each USB interface can access a switch configured to convert a USB interface to a Type-c male head or a Type-c female head. Then the number of the second limiting holes 610 is set to 6. If a test device includes two hubs 300, the number of the second limiting holes 610 is set to 12. The Type-c interface components 710 are partially inserted into the second limiting holes 610, which has the function of fixing the Type-c interface components 710.
[0044] In some other embodiments, the support member 500 is in an "H" shape. The support member 500 includes a first upper surface and a second upper surface. In the vertical direction, the height of the first upper surface is higher than that of the second upper surface. The fixing plate 600 is fixed to the second upper surface. The support member 500 is an axisymmetric object. The support member 500 further includes a first lower surface and a second lower surface. The first upper surface and the first lower surface correspond to each other, and the second upper surface and the second lower surface correspond to each other. The first lower surface is fixed to the bottom of the box body 100; the second lower surface of one support member 500 and the bottom of the box body 100 form a first through hole, and the second lower surface of the other support member 500 and the bottom of the box body 100 form a second through hole. The first through hole and the second through hole are respectively used for passing the host line and the power line of the hub 300.
[0045] A third through hole 720 is further provided on the side wall of the box body 100. The host line passes through the first through hole, the third through hole 720 in sequence and is connected to the host, and the power line passes through the second through hole and the third through hole 720 in sequence and is connected to an external power supply.
[0046] In some embodiments, a toggle is provided on the outer surface of the box body 100. One end of the toggle is connected to the changeover switch. The toggle can move relative to the box body 100. The operator toggles the toggle to switch the test pins of the interface under test, so as to implement the test of the front pins and the back pins of the interface under test.
[0047] Continue to refer to Figure 1 and Figure 3 , since the parts inside the box body 100 need to be disassembled, replaced or maintained, an opening is provided at one end of the box body 100 for easy operation. In some embodiments, the test device further includes a lid 200. The lid 200 is detachably connected to the upper surface of the box body 100. The lid 200 is provided with a third limiting hole 210. The third limiting hole 210 corresponds to the second limiting hole 610. The third limiting hole 210 can pass through the interface under test and the Type-c interface assembly 710, that is, the Type-c interface assembly 710 passes through the second limiting hole 610 and the third limiting hole 210 in sequence, and a part of the Type-c interface is exposed outside for the interface under test to be connected.
[0048] In some embodiments, the material used for the box body 100 is bakelite, and the material used for the lid 200 is fiberglass.
[0049] The test device further includes a power switch 220. The power switch 220 is installed on the surface of the lid 200. The other end of the hub 300 is connected to the power switch 220. The operator controls the opening or closing of the power supply of the hub 300 by pressing the power switch 220. Compared with only using the power supply of the host, providing a separate power supply for each hub 300 can ensure sufficient power supply for the hub 300 and can control each hub 300 separately.
[0050] The test device according to the embodiment of the present application has at least the following beneficial effects: By using an integrator to increase the USB interface, the number of interfaces under test is increased, the number of times of interface plugging and unplugging is reduced, and the interface conversion function and the interface pin switching function are integrated in the switcher, that is, the function of converting the USB interface to the Type-c interface and the function of switching the front and back test pins are integrated in the switcher, so that the front and back test pins of the interface under test can be switched, further improving the test efficiency.
[0051] The present application also proposes a test equipment, including the test device as described above, further including a host device and a power supply device. One end of the hub 300 is connected to the host device, and the other end is connected to the power supply device. The host device can control and display the performance to be tested currently, and the power supply device is used to supply power to the hub 300 and the switcher.
[0052] The embodiments of the present application have been described in detail above in conjunction with the accompanying drawings. However, the present application is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present application within the scope of knowledge possessed by those of ordinary skill in the art. In addition, the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.
Claims
1. A testing device, characterized in that include: Box; A hub, the hub is placed in the box, the hub has a plurality of first USB interfaces, and one end of the hub is used to connect to a host device; A switch, one end of the switch is a second USB interface, and the other end is a Type-c interface component, the second USB interface is plugged into the first USB interface, and the Type-c interface component is plugged into the interface to be tested, the switch also includes a switching switch, the switching switch is electrically connected to the second USB interface and the Type-c interface component, and the switching switch is used to switch the test pin of the interface to be tested to a front test pin or a back test pin.
2. The testing device according to claim 1, characterized in that: The Type-c interface component includes at least one of the following interfaces: a Type-c male connector and a Type-c female connector.
3. The testing device according to claim 1, characterized in that: The bottom of the box body is provided with a limiting groove, the hub is placed in the limiting groove, and the hub is clamped in the limiting groove.
4. The testing device according to claim 1, characterized in that: It also includes a limiting member, the two ends of which are respectively a first fixing portion and a second fixing portion, the first fixing portion and the second fixing portion are fixed to the bottom of the box body, a middle protrusion of the limiting member forms a limiting portion, the two ends of the limiting portion are respectively connected to the first fixing portion and the second fixing portion, a first limiting hole is formed between the limiting portion and the first fixing portion, the second fixing portion and the box body, and the hub is passed through the first limiting hole.
5. The testing device according to claim 4, characterized in that: It also includes a support member, which is fixed inside the box body. Two support members are provided, and the limiting member and the hub are both located between the two support members.
6. The testing device according to claim 5, characterized in that: It also includes a fixing plate, both ends of which are fixed to the upper surface of the support member, and the fixing plate is provided with a plurality of second limiting holes, and the plurality of second limiting holes correspond one-to-one to the plurality of Type-c interface components, and the Type-c interface components are partially passed through the second limiting holes.
7. The testing device according to claim 6, characterized in that: It also includes a cover, one end of the box body has an opening, the cover is detachably connected to the upper surface of the box body, the cover is provided with a third limiting hole, the third limiting hole corresponds to the second limiting hole, and the Type-c interface component passes through the second limiting hole and the third limiting hole in sequence to be connected to the interface to be tested.
8. The testing device according to claim 7, characterized in that: It also includes a power switch, which is installed on the surface of the cover, and the other end of the hub is connected to the power switch.
9. The testing device according to claim 1, characterized in that: The outer surface of the box body is provided with a dial button, one end of which is connected to the switching switch, and the dial button can move relative to the box body to switch the test pin of the interface to be tested.
10. Testing equipment, characterized in that, A test device comprising any one of claims 1 to 9, further comprising a host device and a power supply device; One end of the hub is connected to the host device, and the other end is connected to the power supply device.