Testing device

Abstract

The utility model discloses a test device, the test device is used for simulating the test of a battery management system, the test device comprises a battery pack connector, a battery string number configuration module, a main control chip and a charging and discharging module, the battery pack connector is connected with a plurality of single batteries in series, and the battery pack connector is used for supplying power to the main control chip; the main control chip is connected with the battery pack connector through the battery string number configuration module, and the charging and discharging module is respectively connected with the battery string number configuration module and the main control chip; the battery string number configuration module is used for controlling the number of accessed single batteries during testing; and the main control chip is used for acquiring the voltage of the accessed single battery, sending a test instruction to control the work of the charging and discharging module, and receiving and storing test data generated by the charging and discharging module. The main control chip is used for controlling the work of the charging and discharging module and the number of connected single batteries during testing of the battery string number configuration module, the string number is freely changed, and efficient testing is achieved.

Description

Technical Field

[0001] This application relates to the technical field of batteries, and in particular to a testing device. Background Art

[0002] Batteries are widely used in fields such as electric vehicles and energy storage systems. The battery management system plays an important role in the safety monitoring of batteries. The battery management system usually has the function of measuring the battery voltage, which can prevent or avoid abnormal conditions such as over-discharge, over-charge, and over-temperature of the battery. At present, the test of the battery management system for battery safety is generally a direct test of the battery, which is not only unsafe but also takes up a large space and is inconvenient to operate.

[0003] If a battery management system (BMS) is used and a dedicated communication interface and communication protocol are used to communicate with the battery and the charger / load system, the circuit structure of the BMS system architecture is complex, the cost is high, the reliability is low, and the charger / load system needs to be customized / made with corresponding supporting and improvement, and the versatility is poor, and the test efficiency is low. Summary of the Utility Model

[0004] The purpose of this application is to provide a testing device that can freely change the number of battery strings connected, realize the efficient testing of the battery management system, and improve the work efficiency.

[0005] This application discloses a testing device. The testing device is used to simulate the testing of a battery management system. The testing device includes a battery pack connector, a battery string number configuration module, a main control chip, and a charge and discharge module. A plurality of single cells are connected in series on the battery pack connector for supplying power to the main control chip. The main control chip is connected to the battery pack connector through the battery string number configuration module, and the charge and discharge module is connected to the main control chip. Among them, the battery string number configuration module is used to control the number of single cells connected during testing. The main control chip is used to obtain the voltage of the connected single cells, send a test instruction to control the operation of the charge and discharge module, and receive and store the test data generated by the charge and discharge module.

[0006] Optionally, the charge and discharge module includes a charging circuit, a discharging circuit, and a charge and discharge configuration circuit. The control ends of the charging circuit and the discharging circuit are respectively connected to the main control chip, and the charge and discharge configuration circuit is respectively connected through the output end of the charging circuit and the input end of the discharging circuit. Among them, the charge and discharge configuration circuit forms a same-port circuit, a half-port circuit, or a full-port circuit under different test instructions to control the conduction or shutdown of the charging circuit and the discharging circuit.

[0007] Optionally, the test device further includes a first input terminal and a first output terminal. An external power supply voltage or a load is connected between the first input terminal and the first output terminal. The charging circuit includes a first transistor, a second transistor, and a third transistor. The discharging circuit includes a fourth transistor, a fifth transistor, and a sixth transistor. The control terminals of the first transistor, the second transistor, and the third transistor are respectively connected to the main control chip, the input terminals are respectively connected to the first output terminal, and the output terminals are respectively connected to a first node. The control terminals of the fourth transistor, the fifth transistor, and the sixth transistor are respectively connected to the main control chip. The input terminal of the fourth transistor and the input terminal of the sixth transistor are respectively connected to the battery string number configuration module. The output terminal of the fourth transistor is connected to a second node and a second output terminal. The input terminal of the fifth transistor is connected to a third node, and the output terminal is connected to the second output terminal. The output terminal of the sixth transistor is connected to the second output terminal.

[0008] Optionally, the charge and discharge configuration circuit includes at least three jumper caps. The three jumper caps include: a first jumper cap, a second jumper cap, and a third jumper cap. A first jumper cap is connected between the first node and the fourth node. A second jumper cap is connected between the second node and the fourth node. A third jumper cap is connected between the third node and the fourth node. The fourth node is connected to the first node through at least one diode.

[0009] Optionally, a pull-down circuit is provided between the charging circuit and the main control chip. The pull-down circuit is used to pull down the voltage of the control terminal of the charging circuit. The pull-down circuit includes a first triode, a first resistor, a second resistor, a third resistor, and a first diode. The input terminal of the first resistor is connected to the main control chip, the output terminal is connected to the second resistor and the emitter of the first triode. The base of the first triode is connected to the output terminal of the second resistor. The collector of the first triode is connected to the charging circuit through the first diode. One end of the third resistor is connected to both the second resistor and the base of the first triode, and the other end is grounded.

[0010] Optionally, the test device further includes a temperature sampling circuit. The temperature sampling circuit is used to collect the ambient temperature when the test device is tested at a preset high temperature or low temperature. The temperature sampling circuit is connected to the main control chip. The temperature sampling circuit includes a temperature sensor. The temperature sensor is used to collect the ambient temperature and upload it to the main control chip. At the corresponding temperature, the main control chip feeds back the temperature and the test voltage data at the corresponding temperature to the host computer.

[0011] Optionally, the test device further includes a current sampling circuit for collecting the magnitude of the current between the charge and discharge module and the battery pack connector. Two ends of the current sampling circuit are respectively connected to two current detection pins of the main control chip, and are simultaneously connected to the battery pack connector and the charge and discharge module respectively. When the main control chip detects an abnormal current in the current sampling circuit, it controls the charge and discharge module to stop working.

[0012] Optionally, the battery pack connector includes a plurality of output ports. Each output port is connected to the corresponding serial port on the main control chip through a trace. The main control chip includes a charge and discharge configuration table. The battery string number configuration module includes a battery string number configuration table and a string number configuration circuit. The string number configuration circuit includes a plurality of jumper caps. Each jumper cap is connected between the upper and lower ports of the battery pack connector and the traces of the corresponding two serial ports on the main control chip. The corresponding jumper cap in the string number configuration circuit is controlled to be open or shorted according to the battery string number configuration table. The main control chip controls the conduction or cut-off of the charging circuit and the discharging circuit according to the charge and discharge configuration table.

[0013] Optionally, the battery string number configuration module further includes a balancing circuit and a filtering circuit. The balancing circuit is used to control the magnitude of the voltage input to the main control chip. The filtering circuit is used to reduce the interference of the electrical signals output by the single cells in the battery pack connector to other signals in the main control chip. Each filtering circuit is connected between the upper and lower ports of the battery pack connector and the traces of the corresponding two serial ports on the main control chip. The balancing circuit is provided with a plurality of triodes and voltage dividing resistors for adjusting the magnitude of the voltage output by the battery pack connector. The number of triodes is equal to the number of single cells on the battery pack connector. The emitter and collector of each triode are respectively connected between the adjacent upper and lower ports of the battery pack connector and the traces of the corresponding two serial ports on the main control chip.

[0014] Optionally, the test device further includes a test board and a main control chip connector. The main control chip connector is connected to at least three pins of the main control chip. Along the short side direction of the test board, the main control chip connector is arranged at the edge of the test board and above the main control chip. The main control chip further includes a host computer serial port, supports the application of battery pack connectors with 6 to 16 strings, and configures the number of strings of the connected battery through register configuration. The host computer serial port is connected to the host computer for data transmission.

[0015] Compared with the existing battery management system testing device, the present application provides a main control chip and a charge and discharge module. The number of single cells connected during testing is controlled by a battery string number configuration module, allowing the number of strings to be freely changed. The main control chip can generate test signals according to the number of connected strings, send test instructions to control the operation of the charge and discharge module, and the charge and discharge module performs charge and discharge according to the received test instructions. After the charge and discharge are completed, the main control chip obtains the corresponding test data and feeds it back to the host computer for the tester to view and monitor. By using the main control chip and the battery string number configuration module of the present application, the number of strings can be freely changed to achieve efficient battery testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings included herein are used to provide a further understanding of the embodiments of the present application, which form a part of the specification, illustrate the embodiments of the present application, and together with the written description explain the principles of the present application. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts. In the drawings:

[0017] Figure 1 is a schematic structural diagram of the testing device according to the first embodiment of the present application;

[0018] Figure 2 is a schematic structural diagram of the testing device according to the second embodiment of the present application;

[0019] Figure 3 is a partial circuit structural diagram of the testing device according to the second embodiment of the present application;

[0020] Figure 4 is a schematic diagram of a partial structure (including a pull-down circuit) of the testing device according to the second embodiment of the present application;

[0021] Figure 5 is a schematic circuit diagram of the testing device according to the third embodiment of the present application;

[0022] Figure 6 is a partial circuit structural diagram of the battery string number configuration module of the testing device according to the fourth embodiment of the present application;

[0023] Figure 7 is a partial circuit structural diagram of the testing device according to the fourth embodiment of the present application;

[0024] Figure 8 is a schematic structural diagram of the battery system according to the fifth embodiment of the present application.

[0025] Among them, 100 is a test device; 110 is a test board; 120 is a battery pack connector; 130 is a battery string number configuration module; 131 is a balancing circuit; 132 is a filtering circuit; 140 is a main control chip; 150 is a charge and discharge module; 160 is a charging circuit; 161 is a first transistor; 162 is a second transistor; 163 is a third transistor; 170 is a discharging circuit; 171 is a fourth transistor; 172 is a fifth transistor; 173 is a sixth transistor; 180 is a charge and discharge configuration circuit; 190 is a jumper cap; 200 is a first input terminal; 210 is a first output terminal; 220 is a second output terminal; 230 is a pull-down circuit; 231 is a first triode; 232 is a first resistor; 233 is a second resistor; 234 is a third resistor; 235 is a first diode; 240 is a temperature sampling circuit; 250 is a current sampling circuit; 260 is a main control chip connector; 300 is a battery system; 310 is a load; Q1 - the first node; Q2 - the second node; Q3 - the third node; Q4 - the fourth node; D - diode. Detailed implementation manners

[0026] It should be understood that the terms, specific structures and functional details disclosed here are only for describing specific embodiments, which are representative. However, the present application can be specifically implemented in many alternative forms and should not be construed as being limited only to the embodiments set forth herein.

[0027] The present application will be described in detail below with reference to the accompanying drawings and optional embodiments.

[0028] As Figure 1 shown, as an embodiment of the present application, a test device 100 is disclosed. The test device 100 is used to simulate the test of a battery management system. The test device 100 includes a battery pack connector 120, a battery string number configuration module 130, a main control chip 140, and a charge and discharge module 150. A plurality of single cells are connected in series on the battery pack connector 120 to form a battery pack for supplying power to the main control chip 140. The main control chip 140 is connected to the battery pack connector 120 through the battery string number configuration module 130. The charge and discharge module 150 is respectively connected to the battery string number configuration module 130 and the main control chip 140. Among them, the battery string number configuration module 130 is used to control the number of single cells connected during the test. The main control chip 140 is used to obtain the voltage of the connected single cells, send a test instruction to control the operation of the charge and discharge module 150, and receive and store the test data generated by the charge and discharge module 150. The main control chip 140 will directly upload the test data to the host computer.

[0029] In this embodiment, the number of single cells connected during the test is controlled by the battery string number configuration module 130, and the number of strings can be freely changed. The main control chip 140 can generate test signals according to the number of connected strings, send test instructions to control the operation of the charge and discharge module 150. The charge and discharge module 150 performs charge and discharge according to the received test instructions. After the charge and discharge are completed, the main control chip 140 obtains the corresponding test data and feeds it back to the host computer for the tester to view and monitor. With the main control chip 140 and the battery string number configuration module 130 of this application, the number of strings can be freely changed without modifying the existing charger / load, and without complex auxiliary circuits, dedicated communication interfaces, and communication protocols, the number of strings of the connected battery can be freely changed to achieve automatic detection and improve the test efficiency.

[0030] As Figure 2 shown, as the second embodiment of this application, it is a further refinement and improvement of the above first embodiment. This embodiment also discloses a test device 100. The battery pack connector 120, the battery string number configuration module 130, the main control chip 140, and the charge and discharge module 150 are generally integrated on the test board 110. In this embodiment, referring to Figures 2 to 4 shown, the charge and discharge module 150 includes a charging circuit 160, a discharging circuit 170, and a charge and discharge configuration circuit 180. The charge and discharge configuration circuit 180 is respectively connected to the main control chip 140 through the charging circuit 160 and the discharging circuit 170; specifically, the control ends of the charging circuit 160 and the discharging circuit 170 are respectively connected to the main control chip 140, and the charge and discharge configuration circuit 180 is respectively connected through the output end of the charging circuit 160 and the input end of the discharging circuit 170; wherein, the charge and discharge configuration circuit 180 forms a same-port circuit, or a half-port circuit, or a full-port circuit under different test instructions of the main control chip 140 to control the conduction or shutdown of the charging circuit 160 and the discharging circuit 170.

[0031] Generally, the charge and discharge configuration circuit 180 includes at least three jumper caps 190. By controlling the access states of the three jumper caps 190, the working circuits of the same-port, half-port, and full-port are respectively connected to the charging circuit 160 and the discharging circuit 170, so as to generate different test voltages to be stored in the main control chip 140; wherein, the three jumper caps 190 are respectively JP21, JP22, and JP24; the main control chip 140 also includes a host computer serial port, supports the application of the battery pack connector 120 with 6 to 16 strings, configures and connects the number of strings of the connected battery through registers, the host computer serial port is connected to the host computer for data transmission, and the main control chip 140 is an SH3676016B chip.

[0032] Further, the test device 100 further includes a first input terminal 200 and a first output terminal 210. Here, the input terminal does not only represent that the input terminal can only input voltage signals, but can also be used as an output terminal to output voltage signals. Similarly, the output terminal is the same; an external power supply voltage or a load 310 is connected between the first input terminal 200 and the first output terminal 210. The charging circuit 160 includes a first transistor 161, a second transistor 162, and a third transistor 163. The discharging circuit 170 includes a fourth transistor 171, a fifth transistor 172, and a sixth transistor 173. The control terminals of the first transistor 161, the second transistor 162, and the third transistor 163 are respectively connected to the main control chip 140, the input terminals are respectively connected to the first output terminal 210, and the output terminals are respectively connected to a first node Q1; the control terminals of the fourth transistor 171, the fifth transistor 172, and the sixth transistor 173 are respectively connected to the main control chip 140. The input terminal of the fourth transistor 171 and the input terminal of the sixth transistor 173 are respectively connected to the battery string number configuration module 130. The output terminal of the fourth transistor 171 is connected to a second node Q2 and a second output terminal. The input terminal of the fifth transistor 172 is connected to a third node Q3, and the output terminal is connected to the second output terminal. The output terminal of the sixth transistor 173 is connected to the second output terminal; the jumper cap 190 includes a first jumper cap 190, a second jumper cap 190, and a third jumper cap 190. A first jumper cap 190 is connected between the first node Q1 and the fourth node Q4. A second jumper cap 190 is connected between the second node Q2 and the fourth node Q4. A third jumper cap 190 is connected between the third node Q3 and the fourth node Q4. The fourth node Q4 is connected to the first node Q1 through a diode, and of course, it can also be two diodes; in addition, in the specific preparation of the product, in addition to selecting basic components, other auxiliary components will be added. For example, a body diode is connected under each transistor, and a resistor is connected to the control terminal of the transistor, etc. Since it is not the main inventive point of this application, no specific description is made, and the connection relationship can be known without meaning in the figure, so it will not be elaborated further.

[0033] Specifically, when performing tests, taking the overcharge protection test and the overdischarge protection test as examples, in the overcharge protection test, the main control chip 140 configures CHYS = 0 and EOVR = 1. A DC power supply is connected between B+ / P+ / C+ and P- / C- to charge the battery pack on the battery pack connector 120. An oscilloscope is used to observe the MOSFET in the charging circuit. When the three transistors on the charging circuit 160 are turned off, the voltage value of the cell with the highest voltage at this time is the overcharge protection voltage; the charger is removed. When the three transistors on the charging circuit 160 are turned on again, the voltage value of the cell with the highest voltage at this time is the overcharge recovery voltage.

[0034] Configure CHYS = 1. When the system is in the discharge state, the overcharge recovery voltage threshold is the "overcharge protection voltage", and the exit delay is 0. Configure EOVR = 0. To exit the protection, it is not necessary to remove the charger. It only needs to satisfy that all cell voltages are less than the overcharge recovery voltage and the recovery delay.

[0035] When performing the over-discharge protection test, for the main control chip 140 with EUVR = 1 and the same-port circuit: Connect a load between B+ / P+ / C+ and P- / C- to discharge. Observe the three transistors in the discharge circuit 170 with an oscilloscope until they turn off. At this time, the voltage of the cell with the lowest voltage is the over-discharge protection voltage; then remove the load 310 or connect a DC power supply between B+ / P+ / C+ and P- / C- to charge the battery pack, and wait for the three transistors in the discharge circuit 170 to turn on again. At this time, the voltage of the cell with the lowest voltage is the over-discharge recovery voltage.

[0036] Configure EUVR = 1, for the half-port or full-port circuit: Connect a load between B+ / P+ / C+ and P- to discharge. Observe the three transistors in the discharge circuit 170 with an oscilloscope until they turn off. At this time, the voltage of the cell with the lowest voltage is the over-discharge protection voltage; then remove the load or connect a DC power supply between B+ / P+ / C+ and P- / C- to charge the battery pack, and wait for the three transistors in the discharge circuit 170 to turn on again. At this time, the voltage of the cell with the lowest voltage is the over-discharge recovery voltage.

[0037] Configure EOVR = 0. To exit the protection, it is not necessary to remove the load or connect a charger. It only needs to satisfy that all cell voltages are less than the over-discharge recovery voltage and the recovery delay.

[0038] In addition, when performing the low-voltage charging prohibition protection test, the low-voltage charging prohibition threshold can be first increased to the over-discharge protection threshold. Connect a load and continuously discharge until the transistor in the charging circuit 160 turns off. At this time, the voltage of the cell at the lowest voltage point is the low-voltage charging prohibition protection threshold; the main control chip 140 will obtain the overcharge recovery voltage, over-discharge recovery voltage, and low-voltage charging prohibition protection threshold for storage and feedback to the host computer, and can realize free adjustment and change of the number of strings, the same-port architecture, etc. for the product-level board.

[0039] It should be noted that the connection status of the jumper cap 190 corresponding to the same-port circuit, half-port or full-port circuit is specifically shown in Table 1 below:

[0040] JP24 JP21 JP22 Same port Open circuit Short circuit Short circuit Half port Open circuit Short circuit Short circuit Full port Short circuit Open circuit Open circuit

[0041] Table 1: Jumper Cap 190 Access Status Table

[0042] Further, a pull-down circuit 230 is provided between the charging circuit 160 and the main control chip 140. The pull-down circuit 230 is used to pull down the voltage of the control terminal of the charging circuit 160, that is, the pull-down circuit 230 can control the voltage signal input to the control terminal of the charging circuit 160, so as to control the opening or closing of the transistor in the charging circuit 160 more quickly. The pull-down circuit 230 includes a first triode 231, a first resistor 232, a second resistor 233, a third resistor 234, and a first diode 235. The input end of the first resistor 232 is connected to the main control chip 140, and the output end is connected to the second resistor 233 and the emitter of the first triode 231. The base of the first triode 231 is connected to the output end of the second resistor 233. The collector of the first triode 231 is connected to the charging circuit 160 through the first diode 235. One end of the third resistor 234 is connected to both the second resistor 233 and the base of the first triode 231, and the other end is grounded.

[0043] It should be noted that the models of the components and the magnitudes of the relevant parameters shown in the drawings are those selected during the preparation of this application, but it does not mean that only components of this model and relevant magnitude parameters can be selected. The drawings are only for illustrative purposes and will not be specifically elaborated.

[0044] As Figure 5 shown, as the third embodiment of this application, for further improvement of the above embodiments, in addition to being able to control overcharge protection testing and overdischarge protection testing, the main control chip 140 can also control current testing, high and low temperature protection testing, etc. Specifically, the testing device 100 further includes a temperature sampling circuit 240. The temperature sampling circuit 240 is used to collect the ambient temperature when the testing device 100 is tested at a preset high temperature or low temperature. The temperature sampling circuit 240 is connected to the main control chip 140. The temperature sampling circuit 240 includes a temperature sensor, and the temperature sensor is used to collect the ambient temperature and upload it to the main control chip 140. At the corresponding temperature, the main control chip 140 feeds back the temperature and the test voltage data at the corresponding temperature to the host computer.

[0045] Further, the testing device 100 further includes a current sampling circuit 250. The current sampling circuit 250 is used to collect the magnitude of the current between the charge and discharge module 150 and the battery pack connector 120. Both ends of the current sampling circuit 250 are respectively connected to two current detection pins of the main control chip 140, and are simultaneously connected to the battery pack connector 120 and the charge and discharge module 150 respectively. When the main control chip 140 detects an abnormal current in the current sampling circuit 250, it controls the charge and discharge module 150 to stop working.

[0046] By adding a temperature sampling circuit 240 and a current sampling circuit 250, the following tests can be achieved in conjunction with the control instructions of the main control chip 140. Among them, the tests that the current sampling circuit 250 can achieve in combination with the charge and discharge circuit 170 are as follows:

[0047] (1) Discharge overcurrent 1 / 2 protection test:

[0048] The test instruction OCRA of the main control chip 140 is set to 0. During the discharge process, make the discharge current greater than or equal to the discharge overcurrent 1 / 2 threshold (discharge overcurrent 1 / 2 protection threshold voltage / sampling resistance). The main control chip 140 outputs the corresponding voltage to control the transistor (MOSFET) in the discharge circuit 170 to turn off; unplug the load 310 or connect the charger, and the MOSFET in the discharge circuit will turn on again.

[0049] OCRA = 1 allows the discharge overcurrent protection timing recovery function. After the discharge overcurrent protection is triggered, if the time exceeds the discharge overcurrent protection self-recovery delay tAUTO, the discharge overcurrent protection will automatically recover; when the discharge overcurrent protection occurs 4 times continuously, and the interval time between two adjacent discharge overcurrent protections is less than 50S, and the load 310 is not unplugged or the charger is not connected during this period, the discharge overcurrent protection state will be locked, and it can only be released by "the load 310 is unplugged for a duration exceeding tLDR" or "the charger is connected for a duration exceeding tCH".

[0050] (2) Short-circuit protection test

[0051] When configured as a same-port circuit: Short-circuit B+ / P+ / C+ and P- / C-. The system responds to the short-circuit protection, and the MOSFETs in the charge and discharge circuits turn off; disconnect B+ / P+ / C+ and P- / C-, and the MOSFETs in the charge and discharge circuits turn on again.

[0052] When configured as a half-port or full-port circuit: Short-circuit B+ / P+ / C+ and P-. The system responds to the short-circuit protection, and the MOSFETs in the charge and discharge circuits turn off; disconnect B+ / P+ / C+ and P-, and the MOSFETs in the charge and discharge circuits turn on again.

[0053] During the charging overcurrent protection test, make the charging current greater than or equal to the charging overcurrent threshold (charging overcurrent protection threshold voltage / sampling resistance) during the charging process. At this time, the MOSFET in the charging circuit turns off; unplug the charger, and the MOSFET in the charging circuit turns on again.

[0054] Furthermore, the tests that the temperature sampling circuit 240 can achieve in combination with the charge and discharge circuit 170 are as follows:

[0055] (1) Charging high-temperature protection test

[0056] The test instruction of the main control chip 140 is configured as CHYS = 0. Put the test board 110 into the temperature chamber, and gradually increase the temperature of the temperature chamber until the MOSFET in the charging circuit is turned off. Record the temperature value at this time, which is the charging high-temperature protection threshold. Then gradually decrease the temperature of the temperature chamber until the MOSFET in the charging circuit is turned on again, and record the temperature value at this time, which is the charging high-temperature protection recovery threshold.

[0057] Configure CHYS = 1. When the system is in the discharge state, it does not respond to the charging high-temperature protection; even if the system has triggered the charging high-temperature protection state and the system detects the discharge state, it will exit the charging high-temperature protection state; when the system is in the charging state, it responds to the charging high-temperature protection, and the protection delay is 3 - 9S; when the system is in the idle state (i.e., neither charging nor discharging), the protection delay is 32S. The above time values are the commonly used values selected in the test of this application and are related to the model of the battery to be tested specifically. There may be some differences in the values selected for different test objects, but it does not affect the test of this application.

[0058] When EOT2 = 1 is configured, the temperature point TS3 does not respond to the charging high-temperature protection.

[0059] (2) Charging low-temperature protection test

[0060] Put the test board 110 into the temperature chamber, and gradually decrease the temperature of the temperature chamber until the MOSFET in the charging circuit is turned off. Record the temperature value at this time, which is the charging low-temperature protection threshold. Then gradually increase the temperature of the temperature chamber until the MOSFET in the charging circuit is turned on again, and record the temperature value at this time, which is the charging low-temperature protection recovery threshold.

[0061] Configure CHYS = 1. When the system is in the discharge state, it does not respond to the charging low-temperature protection; even if the system has triggered the charging low-temperature protection state and the system detects the discharge state, it will exit the charging low-temperature protection state; when the system is in the charging state, it responds to the charging high-temperature protection, and the protection delay is 3 - 9S; when the system is in the idle state (i.e., neither charging nor discharging), the protection delay is 32S.

[0062] When EOT2 = 1 is configured, the temperature point TS3 does not respond to the charging low-temperature protection.

[0063] (3) Discharge high-temperature protection test

[0064] Put the test board 110 into the temperature chamber, make the device in the discharge state, and gradually increase the temperature of the temperature chamber until the MOSFETs in the charging and discharging circuits are turned off. Record the temperature value at this time, which is the discharge high-temperature protection threshold. Then gradually decrease the temperature of the temperature chamber until the MOSFET in the discharging circuit is turned on again, and record the temperature value at this time, which is the discharge high-temperature protection recovery threshold.

[0065] When EOT2 = 1 is configured, the temperature point TS3 responds to the discharge low-temperature protection.

[0066] (4) Discharge low-temperature protection test

[0067] Place the test board 110 in the temperature chamber, keep the device in the discharge state, gradually lower the temperature of the temperature chamber until the MOSFET in the discharge circuit is turned off, and record the temperature value at this time, which is the discharge high-temperature protection threshold; then gradually raise the temperature of the temperature chamber until the MOSFET in the discharge circuit is turned on again, and record the temperature value at this time, which is the discharge high-temperature protection recovery threshold.

[0068] When EOT2 = 1 is configured, the temperature point TS3 does not respond to the charge low-temperature protection.

[0069] As can be seen from the above, the main control chip 140 is connected to the communication tool through the UART interface and is connected to the upper computer. The upper computer conducts tests through software, specifically including: normal working mode / low power consumption mode, overcharge protection test, overdischarge protection test, low voltage charging prohibition protection test, discharge overcurrent 1 / 2 protection test, short circuit protection test, charge overcurrent protection test, charge high-temperature protection test, charge low-temperature protection test, discharge high-temperature protection test, discharge low-temperature protection test and other comprehensive tests.

[0070] As Figure 6 shown, as the fourth embodiment of the present application, for further refinement and improvement of the battery string number configuration module 130 of the above embodiment, refer to Figure 2 、 Figure 6 and Figure 7 shown, the battery pack connector 120 includes a plurality of output ports, and each output port is connected to the corresponding serial port on the main control chip 140 through a trace. The main control chip 140 includes a charge and discharge configuration table. The battery string number configuration module 130 includes a battery string number configuration table and a string number configuration circuit. The string number configuration circuit includes a plurality of jumper caps 190, and each jumper cap 190 is connected between the upper and lower ports of the battery pack connector 120 and the traces of the corresponding two serial ports on the main control chip 140. The corresponding jumper cap 190 in the string number configuration circuit is controlled to be open or shorted according to the battery string number configuration table; the main control chip 140 controls the conduction or shutdown of the charging circuit 160 and the discharge circuit 170 according to the charge and discharge configuration table.

[0071] Further, the battery string number configuration module 130 further includes a balancing circuit 131 and a filtering circuit 132. The balancing circuit 131 is used to control the magnitude of the voltage input to the main control chip 140, and the filtering circuit 132 is used to reduce the interference of the electrical signals output by the single cells in the battery pack connector 120 on other signals in the main control chip 140. Each filtering circuit 132 is connected between the upper and lower two ports of the battery pack connector 120 and the traces of the corresponding two serial ports on the main control chip 140. The balancing circuit 131 is provided with a plurality of triodes and voltage dividing resistors for adjusting the magnitude of the voltage output by the battery pack connector 120. The number of triodes is equal to the number of single cells on the battery pack connector 120. The emitter and collector of each triode are respectively connected between the adjacent upper and lower two ports of the battery pack connector 120 and the traces of the corresponding two serial ports on the main control chip 140.

[0072] The battery string number configuration module 130 in this application includes 20 jumper caps 190. The first 10 jumper caps 190 (JP1 - JP10) are arranged on the left side of the balancing circuit 131, and the last 10 jumper caps 190 (JP11 - JP20) are arranged on the right side of the balancing circuit 131. One end of the first 10 jumper caps 190 is connected to the positive terminal of the highest cell of the battery pack, and the other ends are respectively connected to the positive terminals of the other cells in the battery pack. For example, one end of JP1 is connected to the positive terminal of the highest cell, and the other end is connected to the positive terminal of the second highest cell; one end of JP2 is connected to the positive terminal of the highest cell, and the other end is connected to the positive terminal of the third highest cell, and so on. The last 10 jumper caps 190 are connected to the positive terminals of adjacent single cells. For example, one end of JP20 is connected to the positive terminal of the highest cell, and the other end is connected to the positive terminal of the second highest cell. The specific test connection situation is implemented through the following

[0073] Table 2:

[0074]

[0075] Table 2: Jumper Cap 190 Access Status Table

[0076] Among them, the battery string number configuration module 130 can implement the following tests:

[0077] (1) Disconnection protection test

[0078] The main control chip 140 sends an instruction EOW = 1, applies a voltage of "VOV + 300mV" to a certain battery cell (except the 16th cell), or makes the voltage of a certain battery cell "< 100mV", and after maintaining for 32S, closes the MOSFET in the charging circuit, that is, triggers the disconnection protection; the battery cell that triggers the disconnection satisfies the voltage "> 200mV" and "< VOV voltage", and the disconnection protection can be exited.

[0079] Configure EOW = 0 to turn off the disconnection protection function.

[0080] (2) Balancing Test

[0081] When the main control chip 140 BALS = 0, set the balancing voltage difference to 0. The series is in the charging state. Gradually increase the voltage of a certain battery cell until the balancing status bit of the host computer is turned on. Record the voltage at this time, which is the balancing turn-on voltage. Then set the balancing turn-on voltage difference to 20 / 30 / 50 mV. When the voltage of the battery cell with the highest voltage is greater than the balancing turn-on voltage and the voltage difference from the battery cell with the lowest voltage is less than the balancing turn-on voltage, gradually increase the voltage of a certain battery cell until balancing is turned on. Record the voltage at this time. The difference between this voltage and the lowest voltage is the balancing turn-on voltage.

[0082] When BALS = 0 and the series is in the charging or idle state and other above conditions are met, balancing is also turned on.

[0083] (3) Forced Turn-on Test of Transistors in the Charge and Discharge Circuit

[0084] When ENMOS = 1 and the system is in the overcharge / charging low temperature / charging high temperature / open circuit protection state, turn off the MOSFET in the charging circuit. Adjust the series to enter the discharge state, then turn on the MOSFET in the charging circuit. When exiting the discharge state, the MOSFET in the charging circuit is turned off again. When the system is in the over-discharge protection state / CTLD, turn off the MOSFET in the discharge circuit. Adjust the series to enter the charging state, then turn on the MOSFET in the discharge circuit. When exiting the charging state, the MOSFET in the discharge circuit is turned off again.

[0085] In addition, for the layout of each module or circuit on the test board 110 in the present application, along the long side direction of the test board 110, the battery pack connector 120, the battery string number configuration module 130, the main control chip 140, and the charge and discharge module 150 are arranged in sequence. The test device 100 further includes a main control chip connector 260. The main control chip connector 260 is connected to at least three pins of the main control chip 140. Along the short side direction of the test board 110, the main control chip connector 260 is arranged at the edge of the test board 110 and above the main control chip 140. When the main control chip 140 performs UART communication connection, for the convenience of connection, reset the tool interface of UART to be correspondingly connected to the main control chip connector 260 J9, where TXD is connected to the RXD port of the communication tool, and RXD is connected to the TXD port of the communication tool.

[0086] As Figure 8 shown, as the fourth embodiment of the present application, a battery system 300 is disclosed. The battery system 300 includes the test device 100 as described in any of the above embodiments, and a battery pack, a load 310, a charger, and an oscilloscope connected to the test device 100; refer to Figures 1 to 8As shown in the figure, regarding the connection of battery cells: B- is connected to the negative electrode of the battery cell; the battery pack connector 120 is connected to the single battery (B0 is the negative terminal of the lowest section, and B16 is the positive terminal of the highest section); B+ is connected to the positive electrode of the single battery, the main control chip connector 260J9 is connected to the UART(2), the charger / load 310 is connected as follows: P- / C- is connected to the negative terminal of the charger, and B+ / P+ / C+ is connected to the positive terminal of the charger; P- / C- is connected to the negative terminal of the load 310, and B+ / P+ / C+ is connected to the positive terminal of the load 310 (when configured as a common port circuit); P- is connected to the negative terminal of the load 310, and B+ / P+ / C+ is connected to the positive terminal of the load 310 (when configured as a half split port / full split port circuit). The above connections can form a complete battery system 300. By the main control chip 140 and the battery string number configuration module 130, the number of strings can be freely changed without modifying the existing charger / load, and without the need for complex auxiliary circuits, dedicated communication interfaces, and communication protocols, the number of strings of the connected batteries can be freely changed, achieving automatic detection and improving the test efficiency.

[0087] It should be noted that the inventive concept of this application can form a very large number of embodiments. However, due to the limited space of the application documents, it is impossible to list them all. Therefore, on the premise of non-conflict, the above-described embodiments or technical features can be arbitrarily combined to form new embodiments. After the combination of each embodiment or technical feature, the original technical effect will be enhanced.

[0088] The above content is a further detailed description of this application in combination with specific optional implementation manners. It cannot be determined that the specific implementation of this application is only limited to these descriptions. For those of ordinary skill in the technical field to which this application belongs, without departing from the concept of this application, several simple deductions or substitutions can still be made, and all should be regarded as belonging to the protection scope of this application.

Claims

1. A test device for simulating the test of a battery management system, characterized in that: The test device includes a battery pack connector, a battery string number configuration module, a main control chip and a charge and discharge module; The battery pack connector is connected in series with a plurality of single cells for supplying power to the main control chip; The main control chip is connected to the battery pack connector through the battery string number configuration module, and the charging and discharging module is connected to the battery string number configuration module and the main control chip respectively; Among them, the battery string number configuration module is used to control the number of single cells connected during testing; the main control chip is used to obtain the voltage of the connected single cells, send test instructions to control the operation of the charging and discharging module, and receive and store the test data generated by the charging and discharging module.

2. The testing device according to claim 1, characterized in that: The charging and discharging module includes a charging circuit, a discharging circuit and a charging and discharging configuration circuit, wherein the control end of the charging circuit and the control end of the discharging circuit are respectively connected to the main control chip, and the charging and discharging configuration circuit is respectively connected through the output end of the charging circuit and the input end of the discharging circuit; Wherein, the charge and discharge configuration circuit forms a same-port circuit, a half-split-port circuit or a full-split-port circuit under different test instructions to control the on or off of the charging circuit and the discharging circuit.

3. The testing device according to claim 2, characterized in that: The test device further includes a first input terminal and a first output terminal, an external power supply voltage or a load is connected between the first input terminal and the first output terminal, the charging circuit includes a first transistor, a second transistor and a third transistor, the discharging circuit includes a fourth transistor, a fifth transistor and a sixth transistor, the control terminals of the first transistor, the second transistor and the third transistor are respectively connected to the main control chip, the input terminals are respectively connected to the first output terminal, and the output terminals are respectively connected to the first node; The control ends of the fourth transistor, the fifth transistor and the sixth transistor are respectively connected to the main control chip, the input end of the fourth transistor and the input end of the sixth transistor are respectively connected to the battery string number configuration module, the output end of the fourth transistor is connected to the second node and the second output end, the input end of the fifth transistor is connected to the third node, the output end is connected to the second output end, and the output end of the sixth transistor is connected to the second output end.

4. The testing device according to claim 3, characterized in that: The charge and discharge configuration circuit includes at least three jumper caps; The three jumper caps include: a first jumper cap, a second jumper cap and a third jumper cap, the first jumper cap is connected between the first node and the fourth node, the second jumper cap is connected between the second node and the fourth node, the third jumper cap is connected between the third node and the fourth node, and the fourth node is connected to the first node via at least one diode.

5. The testing device according to claim 4, characterized in that: A pull-down circuit is provided between the charging circuit and the main control chip, and the pull-down circuit is used to pull down the voltage of the control end of the charging circuit. The pull-down circuit includes a first transistor, a first resistor, a second resistor, a third resistor and a first diode. The input end of the first resistor is connected to the main control chip, the output end is connected to the second resistor and the emitter of the first transistor, the base of the first transistor is connected to the output end of the second resistor, and the collector of the first transistor is connected to the charging circuit through the first diode; one end of the third resistor is respectively connected to the second resistor and the base of the first transistor, and the other end is grounded.

6. The testing device according to any one of claims 1 to 5, characterized in that: The test device also includes a temperature sampling circuit, which is used to collect the ambient temperature when the test device is tested at a preset high temperature or low temperature. The temperature sampling circuit is connected to the main control chip, and the temperature sampling circuit includes a temperature sensor. The temperature sensor is used to collect the ambient temperature and upload it to the main control chip. At the corresponding temperature, the main control chip feeds back the temperature and the test voltage data at the corresponding temperature to the host computer.

7. The testing device according to claim 6, characterized in that: The testing device also includes a current sampling circuit, which is used to collect the current between the charging and discharging module and the battery pack connector. The two ends of the current sampling circuit are respectively connected to the two current detection pins of the main control chip, and are also respectively connected to the battery pack connector and the charging and discharging module. When the main control chip detects that the current in the current sampling circuit is abnormal, it controls the charging and discharging module to stop working.

8. The testing device according to claim 3, characterized in that: The battery pack connector includes a plurality of output ports, each of which is connected to a corresponding serial port on the main control chip through a wiring, the main control chip includes a charge and discharge configuration table, the battery string number configuration module includes a battery string number configuration table and a string number configuration circuit, the string number configuration circuit includes a plurality of jumper caps, each of which is connected between the upper and lower ports of the battery pack connector and the wiring of the corresponding two serial ports on the main control chip, and the corresponding jumper cap in the string number configuration circuit is controlled to be open or short-circuited according to the battery string number configuration table; The main control chip controls the on or off of the charging circuit and the discharging circuit according to the charging and discharging configuration table.

9. The testing device according to claim 8, characterized in that: The battery string number configuration module also includes a balancing circuit and a filtering circuit. The balancing circuit is used to control the voltage input to the main control chip, and the filtering circuit is used to reduce the interference of the electrical signal output by the single battery in the battery pack connector on other signals in the main control chip. Each of the filtering circuits is connected between the upper and lower ports of the battery pack connector and the corresponding two serial ports on the main control chip. The balancing circuit is provided with a plurality of transistors and voltage-dividing resistors for adjusting the voltage output by the battery pack connector. The number of the transistors is equal to the number of single batteries on the battery pack connector. The emitter and collector of each transistor are respectively connected between the adjacent upper and lower ports of the battery pack connector and the corresponding two serial ports on the main control chip.

10. The testing device according to claim 1, characterized in that: The test device further comprises a test board and a main control chip connector, wherein the main control chip connector is connected to at least three pins of the main control chip, and along the short side direction of the test board, the main control chip connector is arranged at the edge of the test board and is located above the main control chip; The main control chip also includes a host computer serial port, which supports the application of 6 to 16 battery pack connectors. The number of battery strings connected is configured through a register, and the host computer serial port realizes data transmission connection with the host computer.

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