High and low temperature test box for electronic components

Abstract

The utility model discloses a high and low temperature test chamber for electronic components, which comprises a thermal insulation layer and a chamber body, the thermal insulation layer is arranged on the inner wall of the chamber body, placing bins are arranged in the chamber body, a guide ring is arranged at the upper end between the placing bins, support plates are arranged at the upper ends of the two sides of the guide ring, and the support plates are arranged on the inner wall of the chamber body. A sliding rod is slidably connected into one end of the supporting plate, a limiting block is fixed to the upper end of the sliding rod, a pressing plate is fixed to the lower end of the sliding rod, a spring is connected between the upper end of the pressing plate and the lower end of the supporting plate, a supporting rod is connected between the upper end and the lower end of the inner wall of the box body, and the supporting rod is slidably connected with a guide ring. A connecting ring is arranged at the lower end between the containing bins, and receding grooves are formed in the positions, corresponding to the connecting ring, of the supporting rod at equal intervals. According to the utility model, electronic components are easy to position, and the arrangement of objects in the box body is convenient to plan.

Description

Technical Field

[0001] The utility model relates to the technical field of high and low temperature test boxes, in particular to a high and low temperature test box for electronic components. Background Art

[0002] The ability of electronic components to complete the specified functions under the conditions and time specified by temperature reliability is the standard for meeting the reliability condition performance. A specially designed reliability test structure is used to evaluate the failure mechanisms related to electronic components and processes. High and low temperature tests mainly simulate high and low temperature changes in natural environments to test the product's heat resistance, cold resistance and drought resistance. After the test, it can be preliminarily determined whether the product's performance can still meet the predetermined requirements. It is mainly used for product design, improvement, identification and factory inspection. Therefore, high and low temperature test chambers for electronic components play an important role.

[0003] Conventional high and low temperature test chambers have some disadvantages. First, it is not easy to position electronic components. When electronic components shake, they are easily damaged. Second, when testing electronic components of different sizes at the same time, the internal storage layout of the chamber cannot be replanned, resulting in small components taking up more space and large components not being able to fit, affecting the placement. Utility Model Content

[0004] The purpose of the utility model is to provide a high and low temperature test box for electronic components to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a high and low temperature test box for electronic components, comprising a thermal insulation layer and a box body, the thermal insulation layer is arranged on the inner wall of the box body, a placement bin is arranged inside the box body, and a guide ring is arranged at the upper end between the placement bins, support plates are arranged at the upper ends of both sides of the guide ring, and a sliding rod is slidably connected to the inside of one end of the support plate, a limiting block is fixed to the upper end of the sliding rod, a pressure plate is fixed to the lower end of the sliding rod, and a spring is connected between the upper end of the pressure plate and the lower end of the support plate.

[0006] Preferably, a support rod is connected between the upper end and the lower end of the inner wall of the box body, and the support rod is slidably connected to the guide ring.

[0007] Preferably, a connecting ring is provided at the lower end between the placement bins, and clearance grooves are equidistantly provided on the support rod corresponding to the connecting ring.

[0008] Preferably, an inserting strip is clamped in the giving way groove, and a sliding block is connected to the upper part of one end of the inserting strip.

[0009] Preferably, a slide rail is provided at one end of the bottom of the storage bin, and the slide rail is slidably connected to the slider.

[0010] Preferably, a protrusion is provided at the lower part of one end of the insert, and the lower end of the one end of the insert is fixedly connected to the protrusion.

[0011] Preferably, a door is hinged on one side of the front portion of the box body, and a sealing strip is provided on the edge of the door.

[0012] Preferably, transparent observation layers are provided at both ends of the door, and a control panel is provided between the transparent observation layers.

[0013] Compared with the prior art, the utility model has the following beneficial effects: it is easy to locate electronic components and to plan the internal storage layout of the box;

[0014] (1) The limit block can be pulled upward to drive the slide bar to slide upward and the spring to compress, thereby driving the pressure plate to move upward to make way for the electronic components. The electronic components to be tested are then placed in the placement bin, and the limit block is released. Under the push of the spring, the pressure plate moves downward to position the electronic components, so that the position of the electronic components is stable, which is conducive to obtaining the test effect and is easy to position the electronic components.

[0015] (2) The guide ring is moved on the support rod to drive the placement bin to move, and the height between the placement bins is adjusted to avoid unreasonable storage space inside the box. Thus, electronic components of different sizes can be placed in the placement bin. Then, the insertion strip can be driven to move by toggling and pushing the protrusion, so that the insertion strip can pass through the connecting ring and then be inserted into the corresponding clearance groove to fix the position of the placement bin, which is convenient for planning the storage layout inside the box. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the main cross-sectional structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the main structure of the utility model;

[0018] Figure 3 This is a schematic diagram of the cross-sectional structure of the support rod and the storage bin of the utility model;

[0019] Figure 4 For the utility model Figure 3 The enlarged structural diagram at A in the middle;

[0020] Figure 5 This is a schematic diagram of the placement bin and the connecting ring structure of the utility model;

[0021] In the figure: 1. support plate; 2. limit block; 3. pressure plate; 4. placement bin; 5. slide rail; 6. clearance groove; 7. box body; 8. insulation layer; 9. support rod; 10. guide ring; 11. control panel; 12. transparent observation layer; 13. box door; 14. sealing strip; 15. slide rod; 16. spring; 17. slider; 18. bump; 19. insert strip; 20. connecting ring. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0023] See also Figures 1-5 , the utility model provides an embodiment: a high and low temperature test box for electronic components, including a heat preservation layer 8 and a box body 7, the heat preservation layer 8 is arranged on the inner wall of the box body 7, a placement bin 4 is arranged inside the box body 7, and a guide ring 10 is arranged at the upper end between the placement bins 4, a support plate 1 is arranged at the upper end of both sides of the guide ring 10, and a slide rod 15 is slidably connected inside one end of the support plate 1, a limit block 2 is fixed at the upper end of the slide rod 15, a pressing plate 3 is fixed at the lower end of the slide rod 15, and a spring 16 is connected between the upper end of the pressing plate 3 and the lower end of the support plate 1;

[0024] When in use, the limit block 2 can be pulled upward to drive the slide bar 15 to slide upward and the spring 16 to compress, thereby driving the pressure plate 3 to move upward to make way for the electronic components, and then the electronic components to be tested are placed in the placement bin 4, the limit block 2 is released, and the pressure plate 3 is moved downward under the push of the spring 16 to position the electronic components, so that the position of the electronic components is stable, which is conducive to obtaining the test effect;

[0025] A support rod 9 is connected between the upper and lower ends of the inner wall of the box body 7, and the support rod 9 is slidably connected to the guide ring 10;

[0026] When in use, the guide ring 10 is moved on the support rod 9 to drive the placement bin 4 to move, and the height between the placement bins 4 is adjusted to avoid unreasonable storage space inside the box 7. Thus, electronic components of different sizes can be placed in the placement bin 4;

[0027] A connecting ring 20 is provided at the lower end between the placement bins 4, and a clearance groove 6 is equidistantly provided on the support rod 9 corresponding to the connecting ring 20, and a convex block 18 is provided at the lower part of one end of the insert 19, and the lower end of one end of the insert 19 is fixedly connected to the convex block 18;

[0028] During use, by toggling and pushing the bump 18, the inserting strip 19 can be driven to move, enabling the inserting strip 19 to pass through the connecting ring 20 and then inserting into the corresponding relief groove 6 to fix the position of the placement bin 4.

[0029] The inserting strip 19 is clamped in the relief groove 6, and a slider 17 is connected to the upper part of one end of the inserting strip 19. One end of the bottom of the placement bin 4 is provided with a slide rail 5, and the slide rail 5 is slidably connected to the slider 17.

[0030] During use, the placement bin 4 limits the slider 17 through the slide rail 5 to prevent the inserting strip 19 from being misaligned during movement, facilitating stable insertion and extraction of the inserting strip 19.

[0031] One side of the front part of the box body 7 is hinged with a box door 13, and a sealing strip 14 is arranged on the edge of the box door 13.

[0032] During use, the sealing strip 14 is a high-temperature resistant silicone sealing strip, which improves the sealing performance of the box door 13 and is also beneficial for high-temperature and low-temperature resistance.

[0033] Both ends of the box door 13 are provided with transparent observation layers 12, and a control panel 11 is arranged between the transparent observation layers 12.

[0034] During use, through the transparent observation layer 12, the condition of the electronic components during the high and low temperature tests can be observed, which is beneficial for observing the situation of the electronic components.

[0035] In the use of the embodiment of the present application: First, move the guiding ring 10 on the support rod 9 to drive the placement bin 4 to move and adjust the height between the placement bins 4 to avoid unreasonable internal storage space in the box body 7. Thus, electronic components of different sizes can be placed in the placement bin 4. Subsequently, by toggling and pushing the bump 18, the inserting strip 19 can be driven to move, enabling the inserting strip 19 to pass through the connecting ring 20 and then inserting into the corresponding relief groove 6 to fix the position of the placement bin 4. Moreover, the placement bin 4 limits the slider 17 through the slide rail 5 to prevent the inserting strip 19 from being misaligned during movement, facilitating stable insertion and extraction of the inserting strip 19. After that, the limiting block 2 can be pulled upward to drive the sliding rod 15 to slide upward and the spring 16 to be compressed, thereby driving the pressing plate 3 to move upward to make way for the electronic components. Then, the electronic components to be tested are placed in the placement bin 4. Release the limiting block 2, and under the push of the spring 16, the pressing plate 3 moves downward to position the electronic components, making the position of the electronic components stable and facilitating obtaining the test effect. In addition, the sealing strip 14 is a high-temperature resistant silicone sealing strip, which improves the sealing performance of the box door 13 and is also beneficial for high-temperature and low-temperature resistance. The condition of the electronic components during the high and low temperature tests can be observed through the transparent observation layer 12, which is beneficial for observing the situation of the electronic components. In summary, the test chamber then.

Claims

1. A high and low temperature test chamber for electronic components, characterized in that: The invention comprises a heat-insulating layer (8) and a box body (7), wherein the heat-insulating layer (8) is arranged on the inner wall of the box body (7), a placement bin (4) is arranged inside the box body (7), and a guide ring (10) is arranged at the upper end between the placement bins (4), support plates (1) are arranged at the upper ends of both sides of the guide ring (10), and a sliding rod (15) is slidably connected inside one end of the support plate (1), a limiting block (2) is fixed at the upper end of the sliding rod (15), a pressing plate (3) is fixed at the lower end of the sliding rod (15), and a spring (16) is connected between the upper end of the pressing plate (3) and the lower end of the support plate (1).

2. The high and low temperature test chamber for electronic components according to claim 1, characterized in that: A support rod (9) is connected between the upper end and the lower end of the inner wall of the box body (7), and the support rod (9) is slidably connected to the guide ring (10).

3. The high and low temperature test chamber for electronic components according to claim 2, characterized in that: A connecting ring (20) is arranged at the lower end between the placement bins (4), and clearance grooves (6) are arranged equidistantly on the support rod (9) corresponding to the connecting ring (20).

4. The high and low temperature test chamber for electronic components according to claim 3, characterized in that: An inserting strip (19) is clamped in the clearance groove (6), and a sliding block (17) is connected to the upper part of one end of the inserting strip (19).

5. The high and low temperature test chamber for electronic components according to claim 3, characterized in that: A slide rail (5) is provided at one end of the bottom of the placement bin (4), and the slide rail (5) is slidably connected to a slider (17).

6. The high and low temperature test chamber for electronic components according to claim 4, characterized in that: A protrusion (18) is provided at the lower part of one end of the inserting strip (19), and the lower end of one end of the inserting strip (19) is fixedly connected to the protrusion (18).

7. The high and low temperature test chamber for electronic components according to claim 2, characterized in that: A box door (13) is hingedly connected to one side of the front of the box body (7), and a sealing strip (14) is arranged on the edge of the box door (13).

8. The high and low temperature test chamber for electronic components according to claim 7, characterized in that: Transparent observation layers (12) are provided at both ends of the box door (13), and a control panel (11) is provided between the transparent observation layers (12).

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