Multi-station compatible test tool for resistance-capacitance-inductance SMD (Surface Mounted Device) device
By designing the test tooling of adjustable shrapnel modules and replaceable SMD device frame panels, the problem that SMD device test fixtures can only be suitable for a single size in the prior art are solved, and the interchangeability and rapid and stable connection of multiple stations are realized, which improves testing efficiency and compatibility.
Patent Information
- Application Number
- CN202421702381.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-18
- Publication Date
- 2025-06-24
- Estimated Expiration
- 2034-07-18
AI Technical Summary
Existing SMD device test fixtures can only be used for single-size SMD devices and cannot meet the testing needs of multi-size SMD devices, resulting in time-consuming and labor-intensive testing.
A multi-station compatible test tool for resistive capacity-sensitive SMD devices was designed. By setting an adjustable shrapnel module and a replaceable SMD device frame on the test platform, multiple stations can be interchanged and fast and stable.
It realizes the interchange of multiple stations, improves the efficiency and convenience of station testing, strong compatibility, and has stable and excellent test performance indicators of the test base.
Smart Images
Figure CN223022177U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to a multi-station compatible testing tool for resistance, capacitance and inductance SMD devices. Background Art
[0002] At present, SMD component testing usually adopts one-to-one coaxial test fixtures. Such fixtures have strong limitations and can only realize manual pick-up and pressure testing. Due to the various package sizes of SMD devices, the integrated test capability of the fixture is very high, especially in an environment with limited space. However, the current test fixture is only suitable for SMD devices of a single size. With the testing of SMD devices of multiple sizes, test fixtures with multiple stations must be set up. Obviously, such testing is time-consuming and labor-intensive and needs to be improved. Summary of the invention
[0003] In view of the above problems, the purpose of the utility model is to provide a multi-station compatible test tool for RC-SMD components, which is a test tool that achieves multi-station compatibility and fast and stable connection.
[0004] In order to achieve the above purpose, the solution of the utility model is:
[0005] A multi-station compatible test tool for a resistor-capacitor-inductor SMD device comprises a base, a test platform is arranged on the base, a coaxial probe is arranged at the center of the platform according to the SMD device to be tested, four shrapnel modules are evenly distributed around the coaxial probe, a curved and convex gold finger shrapnel is arranged at the front end of the shrapnel module, the gold finger shrapnel is used to connect with the pin of the SMD device, the coaxial probe is connected with an SMA connector arranged under the test platform, an SMD device frame plate is fixedly arranged on the test platform, and an SMD device limit frame is arranged on the frame plate, wherein: the shrapnel module is provided with a long hole, a screw passes through the long hole to position and fix the shrapnel module on the test platform, the long hole is used to adjust the positioning of the four shrapnel modules at different positions according to SMD devices of different sizes to form a four-station test, the SMD device frame plate is replaceably fixed on the test platform by pins, and the SMD device frame plate is provided with an adjustment long hole, and the adjustment long hole corresponds to the long hole on the shrapnel module.
[0006] A further solution is: there are two long holes, and the two long holes are arranged at intervals on both sides of the rear end of the gold finger spring.
[0007] A further solution is that: a plurality of the gold finger springs are arranged side by side and at intervals.
[0008] A further solution is that the length of the gold finger spring is a length that can ensure that the gold finger spring is stably connected to the SMD device pin when the spring module moves outward to the maximum.
[0009] Beneficial effects of the utility model:
[0010] 1) A test platform realizes the interchange of multiple stations by replacing the SMD device frame board and the adjustable shrapnel module, improving the station test efficiency and convenience, and having strong compatibility;
[0011] 2) The electrical performance index test of the test base is stable and excellent;
[0012] 2) The gold finger flexible shrapnel has reliable connection.
[0013] The following makes a detailed description of the utility model in combination with the drawings and embodiments. Description of the Drawings
[0014] Figure 1 It is a schematic diagram of the decomposition structure of the SMD device frame of the utility model;
[0015] Figure 2 It is an overall schematic diagram after the SMD device frame board is buckled on the utility model. Detailed Embodiment
[0016] A multi-station compatible test tool for resistor-capacitor-inductor SMD devices is a multi-station compatible test tool for resistor, capacitor and inductor integrated circuit SMD devices; such as Figure 1 and Figure 2As shown in the figure, the multi-station compatible test fixture includes a base 1. A test platform 2 is arranged on the base 1. The test platform 2 is fixed on the base 1 by inserting bolts into the positioning holes 201. According to the SMD device to be tested, a coaxial probe 3 is arranged at the center of the platform. Four elastic sheet modules 4 are arranged oppositely and evenly distributed around the coaxial probe. A gold finger elastic sheet 401 with a bent protrusion is arranged at the front end of the elastic sheet module 4. The gold finger elastic sheet 401 is used to connect with the pins of the SMD device. The coaxial probe 3 is connected with an SMA connector 5 arranged under the test platform 2. The SMA connector 5 is fixed on the base 1. An SMD device frame plate 6 is fixedly arranged on the test platform 2. An SMD device limiting frame 601 is arranged on the frame plate. In order to realize the testing of SMD devices of various sizes on the test platform 2, long slots 402 are arranged on the elastic sheet module 4. There are two long slots 402. The two long slots 402 are arranged at intervals on both sides of the rear end of the gold finger elastic sheet 401. Screws (only the screw holes are shown in the figure, and the screws are not shown) pass through the long slots to position and fix the elastic sheet module 4 on the test platform 2. The long slots 402 are used to adjust the positioning of the four elastic sheet modules at different positions according to SMD devices of different sizes to form a four-station test. The SMD device frame plate 6 is replaceably fixed on the test platform through pins (the pin holes 202 are shown in the figure). When it is necessary to replace the SMD device frame plate for testing SMD devices of different sizes, take out the pins, replace the corresponding SMD device frame plate, and then insert the pins. An adjusting long hole 602 is arranged on the SMD device frame plate 6. The adjusting long hole 602 corresponds to the long slots 402 on the elastic sheet module.
[0017] A plurality of the gold finger elastic sheets are arranged side by side at intervals. The length of the gold finger elastic sheet is such that when the elastic sheet module moves outwards to the maximum extent, the stable connection between the gold finger elastic sheet and the pins of the SMD device can still be maintained.
[0018] In the above embodiment of the multi-station compatible test fixture for resistor-capacitor-inductor SMD devices, the multi-station interchange is realized by replacing the SMD device frame plate and the adjustable elastic sheet module on a test platform, which improves the station test efficiency and convenience and has strong compatibility.
Claims
1. A multi-station compatible test tool for RC inductor SMD devices, comprising a base, a test platform is arranged on the base, a coaxial probe is arranged at the center of the platform according to the SMD device to be tested, four spring modules are evenly distributed around the coaxial probe, a curved and convex gold finger spring is arranged at the front end of the spring module, the gold finger spring is used to connect with the pin of the SMD device, the coaxial probe is connected with the SMA connector arranged under the test platform, an SMD device frame plate is fixedly arranged on the test platform, and an SMD device limit frame is arranged on the frame plate, characterized in that: The shrapnel module is provided with a long hole, and a screw passes through the long hole to position and fix the shrapnel module on the test platform. The long hole is used to adjust the positioning of four shrapnel modules at different positions according to SMD devices of different sizes to form a four-station test. The SMD device frame plate is replaceably fixed on the test platform by pins, and the SMD device frame plate is provided with an adjustment long hole, which corresponds to the long hole on the shrapnel module.
2. The multi-station compatible test fixture according to claim 1, characterized in that: There are two long holes, which are arranged at intervals on both sides of the rear end of the gold finger shrapnel.
3. The multi-station compatible test fixture according to claim 1, characterized in that: A plurality of the gold finger springs are arranged side by side and at intervals.
4. The multi-station compatible test fixture according to claim 1 or 2, characterized in that: The length of the gold finger spring is a length that can ensure that the gold finger spring is stably connected to the SMD device pin when the spring module moves outward to the maximum.