Test system

Abstract

The utility model discloses a test system, which comprises a test device and an assembly to be tested, and is characterized in that the test device is used for testing the assembly to be tested; the test device comprises an aging test assembly and a photoelectric test assembly. The aging test assembly comprises a base and an experiment box, the base is provided with a plurality of first wire clamping slots distributed at intervals, and the size of the base is matched with that of the experiment box; the photoelectric test assembly comprises a test clamp and a detection mechanism, the test clamp comprises a first platform part and a second platform part, and the first platform part is matched with the detection mechanism in size; the to-be-tested assembly comprises a plurality of substrates and LED lamp beads welded to the substrates, connecting cables are arranged below the substrates, and the substrates are electrically connected with the first wire clamping grooves through the connecting cables; the substrate is electrically connected with the second wire clamping slot through a connecting cable; according to the utility model, the substrate is supported by the connecting cable, the heat dissipation path is single, and photoelectric data is more stable and accurate after the LED lamp beads are subjected to aging test.

Description

Technical Field

[0001] The utility model relates to the technical field of LED testing processes, and particularly to a testing system. Background Art

[0002] LED products are a type of lighting solution based on light-emitting diode technology, and they are known for high efficiency, energy conservation, long lifespan, and environmental friendliness.

[0003] LED products have become leaders in modern lighting technology with their unique advantages. They are widely used not only in the fields of home and commercial lighting but also play important roles in special fields such as medical equipment and stage lighting. With the continuous emergence of new technologies, it is expected that the performance of LED products will continue to improve and the application scope will further expand.

[0004] When conducting aging tests during the factory inspection of LED products, it is necessary to control the junction temperature of the LED within a set temperature range. Under the combined action of multiple factors such as heat generated inside the LED when it is powered on, the ambient temperature provided by the experimental chamber, and the heat dissipation of accessories such as the substrate and base in contact with the LED, the comprehensive conditions for the lifespan test of LED products are formed.

[0005] However, in existing aging methods, there are multiple heat dissipation factors, such as aging substrates, conductive clips, heat dissipation bases, constant temperature devices, etc. When one of these factors changes or there are differences, it will increase the difficulty of controlling the junction temperature of the LED, ultimately resulting in inaccurate lifespan test data for LED products. Summary of the Utility Model

[0006] In view of the above situation, it is necessary to provide a testing system for the problem of large deviation in the lifespan test data of LED products in the prior art.

[0007] A testing system, the testing system includes a testing device and a component to be tested, and the testing device is used to test the component to be tested;

[0008] The testing device includes an aging test component and an optoelectronic test component;

[0009] The aging test component includes a base and an experimental chamber. The base is provided with a plurality of first wire clamping slots distributed at intervals, and the base is adapted in size to the experimental chamber. The experimental chamber is used to perform aging detection on the component to be tested connected to the base;

[0010] The optoelectronic test assembly includes a test fixture and a detection mechanism. The test fixture includes a first platform portion and a second platform portion. The first platform portion is fixedly connected above the second platform portion. A second wire clamping groove is provided on the first platform portion. The first platform portion is adapted in size to the detection mechanism. The detection mechanism is used to perform optoelectronic detection on the component under test connected to the test fixture after aging detection;

[0011] The component under test includes a plurality of substrates and LED lamp beads soldered on each substrate. A connection cable is provided below the substrate. The substrate is electrically connected to the first wire clamping groove through the connection cable. A gap is formed between the substrate and the base based on the connection cable;

[0012] The substrate is electrically connected to the second wire clamping groove through the connection cable. A gap is formed between the substrate and the test fixture based on the connection cable:

[0013] The base and the test fixture are respectively electrically connected to an external power supply.

[0014] In the present utility model, during testing, it is connected to the first wire clamping groove through the connection cable, thereby connecting the substrate to the base and forming a gap. The substrate and the base are placed in an experimental chamber, and the experimental chamber is started for aging testing; after the aging testing is completed, the connection cable is connected to the second wire clamping groove, thereby connecting the substrate to the test fixture. The substrate is extended into the detection mechanism, and then the detection mechanism is started to perform optoelectronic performance detection on the LED lamp beads on the substrate;

[0015] During the aging testing process, except for contacting with air, the substrate only contacts the connection cable (because the length of the rigid wire is short and the wire diameter is small, the heat dissipation is extremely small). The heat dissipation path is single and not affected by the base, the experimental chamber, and the contact thermal resistance, etc., reducing interference factors. After the LED lamp beads are subjected to aging testing, the optoelectronic data is more stable and accurate, and the data consistency is high; at the same time, there is no mutual interference between the LED lamp beads, and there is no heat dissipation from the base, only heat dissipation through air. When testing the life of the LED lamp beads at a higher junction temperature, because the heat loss is small, by slightly increasing the drive current, a higher temperature can be obtained, thereby reducing energy consumption; in addition, during the aging testing, there is no need to configure a constant temperature device, saving production costs.

[0016] Further, a positive electrode pad and a negative electrode pad are respectively provided at the lower edge of the substrate. The positive electrode pad is electrically connected to the positive electrode of the LED lamp bead, and the negative electrode pad is electrically connected to the negative electrode of the LED lamp bead. Both the positive electrode pad and the negative electrode pad are soldered to the connection cable.

[0017] Further, the distance between adjacent first wire clamping grooves in the horizontal direction is the same as the distance between the positive electrode pad and the negative electrode pad in the horizontal direction, and a gap is formed between adjacent substrates.

[0018] Further, the width of the first platform portion is smaller than the width of the second platform portion, and a reflective coating is provided on the first platform portion.

[0019] In the present utility model, by providing a reflective coating on the first platform portion, light absorption does not occur during testing, ensuring the accuracy of the optoelectronic test data of the LED lamp beads.

[0020] Further, the detection mechanism includes an integrating sphere and a testing instrument. The integrating sphere is electrically connected to the testing instrument. The integrating sphere is provided with an opening, and the height of the opening provided on the integrating sphere is less than or equal to the height of the first platform portion, and the width of the opening is the same as the width of the first platform portion.

[0021] In the present utility model, during testing, the connection cable is connected to the second wire clamping groove, and then the test fixture connected with the test component is inserted into the opening of the integrating sphere. The height of the opening refers to the distance between the uppermost end and the lowermost end of the opening, and the height of the opening is less than or equal to the height of the first platform portion, so that the substrate and the LED lamp beads on the substrate are completely placed inside the integrating sphere.

[0022] Further, the experimental chamber and the testing instrument are respectively electrically connected to an external power supply.

[0023] Further, the connection cable is a rigid wire, the diameter of the rigid wire is 0.5 mm to 1 mm, and the length of the rigid wire is 3 cm to 5 cm.

[0024] Based on the above-mentioned testing system, the testing system includes a testing device, a component to be tested, and an all-in-one computer. The specific testing of the present utility model includes an aging test and a performance detection. The steps of the aging test are as follows:

[0025] S1: Install the connection cable of the component to be tested in the first wire clamping groove;

[0026] S2: Place the base connected with the component to be tested into the experimental chamber;

[0027] S3: Set the magnitude of the input current of the external power supply, the temperature and humidity of the experimental chamber, and the aging time;

[0028] S4: After the aging test is completed, take out the base connected with the component to be tested from the experimental chamber, and release the connection between the component to be tested and the base;

[0029] The performance detection is as follows:

[0030] S11: Install the connection cable of the component to be tested in the second cable clamping slot;

[0031] S12: Set the output current, output voltage, integration time, and test mode of the test instrument;

[0032] S13: Insert the test fixture connected to the component to be tested into the integrating sphere through the opening;

[0033] S14: Start the test instrument. The integrating sphere collects the optical signal, and the computer all-in-one analyzes and saves the detection data;

[0034] S15: Disconnect the connection cable of the component to be tested from the test fixture. Description of the Drawings

[0035] Figure 1 Schematic diagram of the aging test for the first embodiment of the present invention;

[0036] Figure 2 Schematic diagram of the performance detection for the first embodiment of the present invention;

[0037] Figure 3 Schematic diagram of the connection between the second cable clamping slot and the substrate for the first embodiment of the present invention;

[0038] Figure 4 Flow chart of the aging test for the first embodiment of the present invention;

[0039] Figure 5 Flow chart of the performance detection for the first embodiment of the present invention.

[0040] Description of the Drawings: 1. Test system; 10. Test device; 100. Aging test component; 101. Base; 102. First cable clamping slot; 103. Experiment box; 200. Photoelectric test component; 201. Test fixture; 202. First platform part; 203. Second cable clamping slot; 204. Reflective coating; 205. Second platform part; 210. Detection mechanism; 211. Integrating sphere; 212. Opening; 213. Test instrument; 20. Component to be tested; 21. Substrate; 22. LED lamp bead; 23. Positive electrode pad; 24. Negative electrode pad; 3. Connection cable; 4. Computer all-in-one; 5. External power supply. Detailed Embodiment

[0041] To facilitate the understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. Embodiments of the present invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0042] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or there can also be an intermediate element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0043] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this utility model belongs. The terms used herein in the specification of this utility model are only for the purpose of describing specific embodiments and are not intended to limit this utility model. The term "and / or" used herein includes any and all combinations of one or more of the related listed items. Moreover, the embodiments of this utility model, the features between embodiments, and the features of embodiments and embodiments can be freely combined on the premise of no obvious conflict or contradiction.

[0044] A test system, such as Figures 1 to 3 shown,

[0045] The test system 1 includes a test device 10 and a component under test 20, and the test device 10 is used to test the component under test 20.

[0046] The test device 10 includes an aging test component 100 and an optoelectronic test component 200.

[0047] The aging test component 100 includes a base 101 and an experimental chamber 103. A plurality of first wire clamping slots 102 are provided on the base 101 at intervals. The distance between adjacent first wire clamping slots 102 in the horizontal direction is the same as the distance between the positive electrode pad 23 and the negative electrode pad 24 in the horizontal direction. The base 101 and the experimental chamber 103 are of suitable sizes, and the experimental chamber 103 is used to perform aging detection on the component under test 20 connected to the base 101.

[0048] The optoelectronic test component 200 includes a test fixture 201 and a detection mechanism 210. The test fixture 200 includes a first platform part 202 and a second platform part 205. The first platform part 202 is fixedly connected above the second platform part 205. The width of the first platform part 202 is smaller than the width of the second platform part 205. A second wire clamping slot 203 is provided on the first platform part 202. A reflective coating 204 is provided on the first platform part 202. The first platform part 202 and the detection mechanism 210 are of suitable sizes, and the detection mechanism 210 is used to perform optoelectronic detection on the component under test 20 connected to the test fixture 201 after aging detection.

[0049] The detection mechanism 210 includes an integrating sphere 211 and a test instrument 213. The integrating sphere 211 is electrically connected to the test instrument 213. The integrating sphere 211 is provided with an opening 212. The height of the opening 212 refers to the distance between the uppermost end and the lowermost end of the opening. The height of the opening 212 is less than or equal to the height of the first platform portion 202, and the width of the opening 212 is the same as the width of the first platform portion 202.

[0050] The component under test 20 includes multiple substrates 21 and LED lamp beads 22 soldered on each substrate 21. The lower edges of the substrates 21 are respectively provided with a positive electrode pad 23 and a negative electrode pad 24. The positive electrode pad 23 is electrically connected to the positive electrode of the LED lamp bead 22, and the negative electrode pad 24 is electrically connected to the negative electrode of the LED lamp bead 22. The positive electrode pad 23 and the negative electrode pad 24 are respectively welded to the connection cable 3. A connection cable 3 is provided below the substrate 21. The substrate 21 is electrically connected to the first wire clamping slot 102 through the connection cable 3. The connection cable 3 is a rigid wire with a diameter of 0.8 mm and a length of 5 cm. A gap is formed between the substrate 21 and the base 101 based on the connection cable 3, and a gap is also formed between adjacent substrates 21 based on the connection cable 3.

[0051] The substrate 21 is electrically connected to the second wire clamping slot 203 through the connection cable 3. The connection cable 3 is a rigid wire with a diameter of 0.8 mm and a length of 5 cm. A gap is formed between the substrate 21 and the test fixture 200 based on the connection cable 3.

[0052] The base 101, the experimental box 103, the test fixture 201, and the test instrument 213 are respectively electrically connected to an external power supply 5.

[0053] Based on the above test system, the test system 1 includes a test device 10, a component under test 20, and an all-in-one computer 4. The specific tests carried out by the present utility model include aging tests and performance detections, such as Figure 4 As shown, the aging test method is as follows:

[0054] S1: Install the connection cable of the component under test in the first wire clamping slot;

[0055] S2: Place the base connected with the component under test into the experimental box;

[0056] S3: Set the input current magnitude of the external power supply, the temperature and humidity of the experimental box, and the aging time;

[0057] S4: After the aging test is completed, take out the base connected with the component under test from the experimental box and disconnect the connection between the component under test and the base;

[0058] As Figure 5 shown, the performance detection method is as follows:

[0059] S11: Install the connection cable of the component to be tested in the second cable clamping slot.

[0060] S12: Set the output current, output voltage, integration time, and test mode of the test instrument.

[0061] S13: Insert the test fixture connected to the component to be tested into the integrating sphere through the opening.

[0062] S14: Start the test instrument. The integrating sphere collects the optical signal, and the computer all-in-one analyzes and saves the test data.

[0063] S15: Disconnect the connection cable of the component to be tested from the test fixture.

[0064] Specifically, during the test, connect through the connection cable 3 to the first cable clamping slot 102, thereby connecting the substrate 21 to the base 101 and forming a gap. Place the substrate 21 and the base 101 into the experimental chamber 103, set the parameters of the experimental chamber 103 and the external power supply 5, start the experimental chamber 103 and the external power supply 5, and conduct the aging test. After completing the aging test, disconnect the connection cable 3 from the first cable clamping slot 102 and connect it to the second cable clamping slot 203, thereby connecting the substrate 21 to the test fixture 201. The height of the opening 212 is the distance between the uppermost and lowermost ends of the opening. The height of the opening 212 is less than or equal to the height of the first platform portion 202, and the width of the opening 212 is the same as the width of the first platform portion 202, so that the substrate 21 completely extends into the integrating sphere 211 through the opening 212. Then start the test instrument 213, and the integrating sphere collects the optical signal to perform optoelectronic performance detection on the LED lamp beads 22 on the substrate 21. Analyze and save the test data through the computer all-in-one 4.

[0065] In the present utility model, the substrate 21 is supported by a rigid wire. Except for contacting the air, the substrate 21 only contacts the rigid wire (because the length of the rigid wire is short and the wire diameter is small, the heat dissipation is extremely small). The heat dissipation path is single and is not affected by the base 101, the experimental chamber 103, and the contact thermal resistance, etc., reducing interference factors. After the LED lamp beads 22 are subjected to the aging test, in addition, a reflective coating 204 is provided on the first platform portion 31, which does not absorb light during the test, and the optoelectronic test data is more stable and accurate, and the data consistency is high. At the same time, there is no mutual interference between the LED lamp beads 22. Without the heat dissipation of the base 1, only through air cooling, when testing the life of the LED lamp beads 22 at a higher junction temperature, because the heat loss is small, slightly increasing the drive current can obtain a higher temperature, thereby reducing energy consumption. In addition, in the aging test, there is no need to configure a constant temperature device, saving production costs.

[0066] In the description of this specification, the description referring to terms such as "one embodiment", "some embodiments", "examples", "specific examples", or "some examples", etc. means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present utility model. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0067] The above-described embodiments only express the implementation manners of the present utility model, and the description thereof is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent of the present utility model. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several deformations and improvements can still be made, and these all belong to the protection scope of the present utility model. Therefore, the protection scope of the patent of the present utility model shall be subject to the appended claims.

Claims

1. A testing system, characterized in that: The test system comprises a test device and a component to be tested, wherein the test device is used to test the component to be tested; The test device includes an aging test component and a photoelectric test component; The aging test assembly includes a base and a test box, the base is provided with a plurality of first wire clamping slots distributed at intervals, the base is adapted to the size of the test box, and the test box is used to perform aging detection on the component to be tested connected to the base; The photoelectric test assembly includes a test fixture and a detection mechanism. The test fixture includes a first platform portion and a second platform portion. The first platform portion is fixedly connected above the second platform portion. A second wire clamping slot is provided on the first platform portion. The first platform portion is adapted in size to the detection mechanism. The detection mechanism is used to perform photoelectric detection on the component to be tested connected to the test fixture after aging detection. The component to be tested includes a plurality of substrates and LED lamp beads welded on each of the substrates, a connecting cable is provided under the substrate, the substrate is electrically connected to the first clamping slot through the connecting cable, and a gap is formed between the substrate and the base based on the connecting cable; The substrate is electrically connected to the second wire clamping slot via the connecting cable, and a gap is formed between the substrate and the test fixture based on the connecting cable; The base and the test fixture are electrically connected to an external power source respectively.

2. The test system according to claim 1, characterized in that: The lower edge of the substrate is respectively provided with a positive electrode pad and a negative electrode pad, the positive electrode pad is electrically connected to the positive pole of the LED lamp bead, the negative electrode pad is electrically connected to the negative pole of the LED lamp bead, and the positive electrode pad and the negative electrode pad are both welded to the connecting cable.

3. The test system according to claim 2, characterized in that: The distance between adjacent first wire clamping grooves along the horizontal direction is the same as the distance between the positive electrode pad and the negative electrode pad along the horizontal direction, and gaps are formed between adjacent substrates.

4. The test system according to claim 1, characterized in that: The width of the first platform portion is smaller than that of the second platform portion, and a reflective coating is disposed on the first platform portion.

5. The test system according to claim 3, characterized in that: The detection mechanism includes an integrating sphere and a testing instrument. The integrating sphere is electrically connected to the testing instrument. The integrating sphere is provided with an opening. The setting height of the opening at the integrating sphere is less than or equal to the height of the first platform portion, and the width of the opening is the same as the width of the first platform portion.

6. The test system according to claim 2, characterized in that: The connecting cable is a hard wire, the diameter of the hard wire is 0.5 mm to 1 mm, and the length of the hard wire is 3 cm to 5 cm.

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