Double-sided test probe station

Abstract

The utility model relates to the technical field of test probe stations, in particular to a double-sided test probe station which comprises a workbench and a supporting mechanism, the workbench is provided with a suspension mechanism, the suspension mechanism is used for installing and suspending a workpiece to be detected on the workbench, and the supporting mechanism is used for supporting the workpiece; when the workpiece is installed and suspended on the workbench, the exposed parts, located on the upper surface and the lower surface of the workpiece, of the workbench respectively form an upper testing surface and a lower testing surface. According to the utility model, only one side of the tested circuit board can be tested at a time, the other side is prevented from being turned upwards to continue to be tested after the test is finished, the test efficiency is improved, the supporting mechanism can support the lower surface of a part of a workpiece, and the influence on the test efficiency and precision caused by easy deformation of the circuit board when the size is large is avoided.

Description

Technical Field

[0001] The utility model belongs to the technical field of test probe tables, and particularly relates to a double-sided test probe table. Background Art

[0002] Circuit signal testing is of extremely important significance in the processes of electronic system and device development, manufacturing, maintenance, and fault troubleshooting. The main significance of circuit signal testing is reflected in: 1. Verifying design and function; 2. Improving product performance; 3. Ensuring product quality; 4. Shortening the product development cycle; 5. Fault troubleshooting and diagnosis; 6. Meeting industry standards and certifications; 7. Optimizing system configuration; 8. Providing a basis for product upgrade.

[0003] For circuit signal testing, especially microwave testing, such as but not limited to resistance, impedance, and insertion loss, etc., it is often required to test on both the front and back sides of a circuit board, a carrier board, or other circuits. For example, in the prior art, CN110531161A discloses a non-contact on-line testing device for input impedance at various positions of a printed circuit board, which includes a mechanical scanning table frame, a mechanical control module, a micro-miniature near-field signal sensor, a signal acquisition module, a signal analysis module, a display module, a storage module, and a power supply module. Through the micro-miniature near-field signal sensor and the signal acquisition module, the coupling and acquisition of the near-field magnetic field signals around the input or output signal lines of chips, components, and circuit modules at various positions of the printed circuit board to be tested are respectively realized; through the signal analysis module for processing, the input impedance of chips, components, and circuit modules at various positions of the printed circuit board to be tested is solved, and the corresponding amplitude-frequency and phase-frequency information is output. This invention adopts a non-contact micro-miniature near-field signal sensor, which has little influence on the working state of the printed circuit board and is applicable to the on-line testing of the input impedance of chips, components, and circuit modules at various positions of the printed circuit board.

[0004] In the above non-contact on-line testing device for input impedance, the specific structure of the mechanical scanning table frame is as follows: The platform is physically fixedly connected to the X-axis arm, the X-axis motor is mechanically connected to the X-axis arm, the Y-axis motor is mechanically connected to the Y-axis arm, the Z-axis motor is mechanically connected to the Z-axis arm, the Z-axis arm is mechanically connected to the X-axis arm, the Z-axis arm can move on the X-axis arm under the control of the X-axis motor, the Y-axis arm is mechanically connected to the Z-axis arm, the Y-axis arm can move on the Z-axis arm under the control of the Z-axis motor, the bracket is mechanically connected to the Y-axis arm, and the bracket can move on the Y-axis arm under the control of the Y-axis motor.

[0005] By analyzing the prior art, the circuit to be tested is placed on the upper surface of a platform for support, and the circuit to be tested can only be tested on one side at a time. After testing one side, it is turned over with the other side facing up for continued testing. This method has low testing efficiency. In addition, when testing a circuit board, especially some flexible circuit boards, the probe also needs to be pressed against the circuit board. When the circuit board is large in size, it is prone to deformation, resulting in the influence on testing efficiency and accuracy. Summary of the Utility Model

[0006] Aiming at the deficiencies of the prior art, on the one hand, the present utility model provides a double-sided test probe station, which includes a workbench and a support mechanism. A suspension mechanism is arranged on the workbench, and the suspension mechanism is used to install and suspend a workpiece to be detected on the workbench, and the support mechanism is used to support the workpiece; when the workpiece is installed and suspended on the workbench, the workbench forms an upper test surface and a lower test surface on the exposed parts of the upper and lower surfaces of the workpiece respectively.

[0007] Preferably, the workbench includes a support column, an installation cross beam and a base. The lower end of the support column is connected to the base, and the upper end of the support column is connected to the installation cross beam. The support column is used to support the installation cross beam; the suspension mechanism is a clamping groove, which extends along the length direction of the installation cross beam, and the opening of the clamping groove faces inward. The clamping groove is used to clamp the workpiece.

[0008] Preferably, the double-sided test probe station further includes an installation cross beam and a clamping strip. The installation cross beam extends in the front-back direction, and the clamping strip extends in the left-right direction. The clamping strip is arranged between the installation cross beams, and the left and right ends of the clamping strip are respectively installed on the left and right installation cross beams. The interval between the clamping strips in the front-back direction is less than 5 cm, and the interval distance between the installation cross beams is greater than 30 cm; the suspension mechanism is a clamping groove, which extends along the length direction of the installation cross beam, and the clamping groove penetrates through the clamping strip in the front-back direction.

[0009] Preferably, the support mechanism includes a movable support member, and the support member is located on the lower test surface of the workbench and can move on the lower test surface. The support member is used to support the lower surface of the workpiece.

[0010] Preferably, the workbench includes a base, the support mechanism includes a support member and a movable support seat. The lower end of the movable support seat is installed on the base, and the lower end of the support member is movably connected to the movable support seat. The support member can move relative to the plane where the lower test surface is located, and the upper end of the support member supports the lower surface of the workpiece.

[0011] Preferably, the workbench includes a base, the support mechanism includes a support member, the lower end of the support member is movably arranged on the base, and a magnetic part is arranged at the upper end of the support member. The magnetic part supports and clamps the workpiece.

[0012] Preferably, the double-sided test probe station further includes a clamping strip, and the support mechanism includes a support member. The support member can movably support on the lower surface of the clamping strip. Description of the Drawings

[0013] The present utility model will become clearer with more specific descriptions of the preferred embodiments shown in the accompanying drawings. The above and other objects, features, and advantages of the present utility model will become more apparent. In all the drawings, the same reference numerals indicate the same parts, and the drawings are not deliberately drawn to scale in actual size, with the focus on showing the gist of the present utility model.

[0014] Figure 1 Schematic structural diagram of the double-sided test probe station provided for the embodiment for large-sized workpieces;

[0015] Figure 2 Schematic structural diagram of the double-sided test probe station provided for the embodiment for small-sized workpieces;

[0016] Figure 3 For Figure 2 Top view;

[0017] Figure 4 For Figure 3 Schematic structural diagram of the A-A cross-sectional view in;

[0018] Figure 5 For Figure 3 Schematic structural diagram of the B-B cross-sectional view in;

[0019] Figure 6 For Figure 5 Schematic diagram of the partial structure;

[0020] Figure 7 Schematic structural diagram of the embodiment of the movable support base.

[0021] Reference numerals in the drawings: workbench 101, support column 102, mounting crossbeam 103, suspension mechanism 104, base 105, support mechanism 106, clamping strip 107, support member 108, magnetic part 109, movable support base 110, slide rail 111, microscope 112, probe 113, workpiece 114, upper test surface 115, lower test surface 116. Detailed implementation manners

[0022] To facilitate the understanding of the present utility model, the present utility model will be described more comprehensively below with reference to the relevant accompanying drawings.

[0023] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element and integrated with it, or there may be an intermediate element present at the same time. The terms "installation", "one end", "the other end", and similar expressions used in this article are only for the purpose of illustration.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this technology belongs. The terms used in the description herein are for the purpose of describing specific embodiments only and are not intended to limit the present utility model. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0025] On the one hand, a double-sided test probe 113 platform is provided. The double-sided test probe 113 platform includes a workbench 101 and a support mechanism 106. A suspension mechanism 104 is provided on the workbench 101. The suspension mechanism 104 is used to install and suspend a workpiece 114 to be detected on the workbench 101, and the support mechanism 106 is used to support the workpiece 114. When the workpiece 114 is installed and suspended on the workbench 101, upper test surfaces 115 and lower test surfaces 116 are respectively formed on the exposed parts of the upper and lower surfaces of the workpiece 114.

[0026] The upper test surface 115 and the lower test surface 116 can be understood as follows: after the workpiece 114 is installed on the workbench 101 through the suspension mechanism 104, the workpiece 114 is suspended at this time. The exposed part of the workpiece 114 compared with the support mechanism 106 directly allows the test probe 113 to move for testing. The workpiece 114 only hinders the movement of the test probe 113 at the support mechanism 106, and other parts allow the probe 113 to move for testing. Of course, after the test of the area outside the support mechanism 106 on the lower surface of the workpiece 114 is completed, the support mechanism 106 can be moved to other places for support to complete the test of the lower surface of the workpiece 114; in addition, the part of the support mechanism 106 that supports the workpiece 114 can be the part that does not need to be tested.

[0027] The present utility model can avoid the situation that the workpiece 114 (circuit board) to be tested can only be tested on one side at a time, and avoid turning the other side up for continued testing after the test, improving the test efficiency. The support mechanism 106 can partially support the lower surface of the workpiece 114, avoiding the deformation that is likely to occur when the circuit board is large in size, which may affect the test efficiency and accuracy.

[0028] In a preferred embodiment, the workbench 101 includes support columns 102, an installation cross beam 103, and a base 105. The lower ends of the support columns 102 are connected to the base 105, and the upper ends of the support columns 102 are connected to the installation cross beam 103. The support columns 102 are used to support the installation cross beam 103. The suspension mechanism 104 is a clamping groove that extends along the length direction of the installation cross beam 103, and the opening of the clamping groove faces inward. The clamping groove is used to clamp the workpiece 114.

[0029] The inner side refers to the side close to the center of the workbench 101, and the height above and below the clamping groove is adapted to the height of the workpiece 114. The clamping groove is formed by the installation cross beam 103. For example, the installation cross beam 103 includes an upper beam part and a lower beam part. The upper beam part and the lower beam part are provided with grooves near the inner side, and the grooves of the two are combined to form the clamping groove. Further, one end of the upper beam part is hinged to one end of the lower beam part, and the other end of the upper beam part can rotate around the other end of the lower beam part. Rotating to open the two can place the workpiece 114, and rotating to cover the two can complete the installation of the workpiece 114.

[0030] In a preferred embodiment, the double-sided test probe 113 platform further includes an installation cross beam 103 and a clamping strip 107. The installation cross beam 103 extends in the front-back direction, and the clamping strip 107 extends in the left-right direction. The clamping strip 107 is arranged between the installation cross beams 103. The left and right ends of the clamping strip 107 are respectively installed on the left and right installation cross beams 103. The interval between the front and back of the clamping strip 107 is less than 5 cm, and the interval distance between the installation cross beams 103 is greater than 30 cm; the suspension mechanism 104 is a clamping groove, and the clamping groove extends along the length direction of the installation cross beam 103 and penetrates the clamping strip 107 in the front-back direction.

[0031] Figures 1 to 6 It shows an implementation manner in which the installation cross beam 103, the clamping strip 107 and the clamping groove formed by the two are used for supporting and clamping. The clamping strip 107 can be regarded as the support mechanism 106 in some embodiments. Among them Figure 1 It shows an implementation manner of supporting and clamping a large circuit board. Figures 2 to 6 It shows an implementation manner of supporting and clamping a small circuit board. A large circuit board generally refers to a circuit board with a size greater than 30 cm, especially greater than 50 cm, and a small circuit board generally refers to a circuit board with a size less than 5 cm, especially less than 1 cm. The figure shows two installation cross beams 103 and two clamping strips 107. Each installation cross beam 103 includes an upper beam part and a corresponding lower beam part. The installation cross beam 103 can be arranged as in the above embodiment. Each clamping strip 107 is also divided into an upper clamping body part and a corresponding lower clamping body part. The interval distance between the upper beam part and the lower beam part is the same as the interval distance between the upper clamping body part and the lower clamping body part. The above interval distance is adapted to the thickness of the workpiece 114. The left and right ends of the upper clamping body part are respectively fixed on the upper beam parts on the left and right sides, and the left and right ends of the lower clamping body part are respectively fixed on the lower beam parts on the left and right sides. When clamping a large circuit board, the upper clamping body part and the upper beam part clamp the upper surface of the large circuit board, and the lower clamping body part and the lower beam part support the lower surface of the large circuit board, as Figure 1 shown. When clamping a large circuit board, the upper clamping body part clamps the upper surface of the large circuit board, and the lower clamping body part and the lower beam part support the lower surface of the large circuit board, as Figures 2 to 6 shown.

[0032] If four brackets are directly used to horizontally place and support the circuit board and clamp it, then the probe 113 is touched and detected from above and below, and the microscope 112 is used to guide the alignment of the probe 113 on both sides. However, it is very difficult to test large circuit boards (larger than 50 cm) and small circuit boards (smaller than 1 cm) in this way. This is because the span of large circuit boards is relatively large, and the circuit board to be tested may be deformed when the probe 113 is loaded, thus affecting the test efficiency and accuracy. For small circuit boards, it is impossible to precisely clamp the edges with brackets, and the too-close distance between the brackets will also cause the inability to insert the needles and the microscope 112 cannot be placed under the circuit board. This embodiment can well solve the above problems.

[0033] In a preferred embodiment, the support mechanism 106 includes a movable support 108. The support 108 is located on the lower test surface 116 of the workbench 101, and the support 108 is movable on the lower test surface 116. The support 108 is used to support the lower surface of the workpiece 114.

[0034] In a preferred embodiment, the workbench 101 includes a base 105. The support mechanism 106 includes a support 108 and a movable support base 110. The lower end of the movable support base 110 is installed on the base 105. The lower end of the support 108 is movably connected to the movable support base 110. The support 108 can move relative to the plane where the lower test surface 116 is located. The upper end of the support 108 supports the lower surface of the workpiece 114.

[0035] Through the above setting of the movable mode, the support range of the support 108 is relatively large and flexible.

[0036] In a preferred embodiment, the workbench 101 includes a base 105. The support mechanism 106 includes a support 108. The lower end of the support 108 is movably arranged on the base 105. The upper end of the support 108 is provided with a magnetic part 109. The magnetic part 109 supports and clamps the workpiece 114.

[0037] The support 108 can be movably placed on the base 105. The upper end of the support 108 and the upper surface of the workpiece 114 are provided with magnetic magnetic parts 109. The magnetic part 109 on the upper surface of the workpiece 114 can move. The workpiece 114 is clamped and fixed by magnetic force, and the clamping and fixing methods are flexible and simple. Please refer to Figure 7 , in some embodiments, the base 105 and the support 108 are movable through the cooperating slide rails 111.

[0038] In a preferred embodiment, the double-sided test probe 113 table further includes a clamping strip 107 and a support 108 of the support mechanism 106. The support 108 is movably supported on the lower surface of the clamping strip 107.

[0039] When testing a small circuit board, the support member 108 can be supported on the lower surface of the clamping bar 107. When testing a large circuit board, the support member 108 can be supported on the lower surface of the clamping bar 107 or the lower surface of the large circuit board. The support member 108 can be in the form of support columns. After clamping and supporting are completed, two sets of microscopes 112 and two sets of probes 113 are used to test the positions on the upper and lower surfaces of the circuit board that need to be tested respectively.

[0040] The present utility model proposes a new structure that can combine the testing of circuit boards of different sizes. The utility model adopts an additional support structure equipped with magnets to reduce the span of the circuit board, and can well resist the deformation of the circuit board when the probe 113 presses on the circuit board during testing, making the operation simple and efficient. No matter where the testing area is located, the support member 108 can be easily moved over.

[0041] On the basis of the above technical solutions, mechanisms / components / constituents can also be added to achieve better effects; or other mechanisms / components / constituents can be substituted to achieve the same function:

[0042] 1. The object to be tested mentioned in the present utility model is not limited to circuit boards, but can also be various circuit forms such as packaging carriers, etc.;

[0043] 2. The probe 113 mentioned in the present utility model can be various probes 113 such as microwave probes 113, energized probes 113, DC probes 113, etc.;

[0044] 3. There can be multiple support structures with magnets at the top in the figure, including but not limited to 1, two or more;

[0045] 4. The support structure in the figure can be straight or curved;

[0046] 5. The newly added upright posts can be magnetic or reinforced with screws, which is suitable for strengthening the cross beam in the measurement scenario of small devices.

[0047] 6. The present utility model is applied to the probe 113 measurement in various circuit fields, especially double-sided measurement. It takes into account both large and small sizes.

[0048] In this application, unless otherwise clearly specified and limited, the first feature being "on" or "under" the second feature can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on" the second feature can be that the first feature is directly above or obliquely above the second feature, or simply means that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "under" the second feature can be that the first feature is directly below or obliquely below the second feature, or simply means that the first feature has a lower horizontal height than the second feature.

[0049] In the description of this specification, the description with reference to terms such as "preferred embodiment", "another embodiment", "other embodiments" or "specific examples" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, without contradiction, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples.

[0050] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present application. Those of ordinary skill in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present application.

Claims

1. A double-sided test probe station, characterized in that: The double-sided test probe station includes a workbench and a supporting mechanism. The workbench is provided with a suspension mechanism, and the suspension mechanism is used to install and suspend the workpiece to be tested on the workbench, and the supporting mechanism is used to support the workpiece; when the workpiece is installed and suspended on the workbench, the workbench is located at the exposed parts of the upper and lower surfaces of the workpiece to form an upper test surface and a lower test surface respectively.

2. The double-sided test probe station as claimed in claim 1, characterized in that: The workbench includes a supporting column, a mounting beam and a base, the lower end of the supporting column is connected to the base, the upper end of the supporting column is connected to the mounting beam, and the supporting column is used to support the mounting beam; the suspension mechanism is a clamping groove, the clamping groove extends along the length direction of the mounting beam, the opening of the clamping groove faces inward, and the clamping groove is used to clamp a workpiece.

3. The double-sided test probe station as claimed in claim 1, characterized in that: The double-sided test probe station also includes a mounting beam and a clamping strip, wherein the mounting beam extends along the front-to-back direction, the clamping strip extends along the left-to-right direction, the clamping strip is arranged between the mounting beams, and the left and right ends of the clamping strip are respectively installed on the left and right mounting beams, the spacing between the clamping strips in the front-to-back direction is less than 5 cm, and the spacing distance between the mounting beams is greater than 30 cm; the suspension mechanism is a clamping groove, the clamping groove extends along the length direction of the mounting beam, and the clamping groove passes through the clamping strip in the front-to-back direction.

4. The double-sided test probe station as claimed in claim 1, characterized in that: The supporting mechanism comprises a movable supporting member, the supporting member is located on the lower test surface of the workbench, and the supporting member can move on the lower test surface, and the supporting member is used to support the lower surface of the workpiece.

5. The double-sided test probe station as claimed in claim 1, characterized in that: The workbench includes a base, and the supporting mechanism includes a supporting member and a movable supporting seat. The lower end of the movable supporting seat is installed on the base, the lower end of the supporting member is movably connected to the movable supporting seat, the supporting member can move compared to the plane where the lower test surface is located, and the upper end of the supporting member supports the lower surface of the workpiece.

6. The double-sided test probe station as claimed in claim 1, characterized in that: The workbench comprises a base, and the supporting mechanism comprises a supporting member, the lower end of the supporting member is movably arranged on the base, and the upper end of the supporting member is provided with a magnetic part, and the magnetic part supports and clamps the workpiece.

7. The double-sided test probe station according to claim 1, characterized in that: The double-sided test probe station further comprises a clamping bar, the supporting mechanism supports a member, and the support member is movably supported on the lower surface of the clamping bar.

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