Probe pen for improving test accuracy of crystalline silicon solar cell
By designing a probe pen with a Z-shaped three-stage structure, the inaccurate measurement problems caused by the tilt and grip of the probe pen are solved, and a more stable and accurate solar cell testing is achieved.
Patent Information
- Application Number
- CN202421412082.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-20
- Publication Date
- 2025-06-27
- Estimated Expiration
- 2034-06-20
AI Technical Summary
During the solar cell testing process, the tilt and grip of the probe pen result in the nib sliding and the hand obstruction, affecting the accuracy of the measurement results.
Design a probe pen with a Z-shaped three-stage structure. The contact section is perpendicular to the battery cell. The pen holder is located outside the battery cell. The transition section and the connection section are wrapped with protective layers to ensure contact stability and light transparency.
Through the Z-shaped structure design, the pen tip is avoided and the hand is blocked, the contact stability and measurement accuracy are improved, and the light intensity deviation is reduced.
Smart Images
Figure CN223038012U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of solar cell testing devices, in particular to a probe pen for improving the testing accuracy of crystalline silicon solar cells. Background Art
[0002] In the process of manufacturing solar cells, it is an indispensable and important step to measure the performance parameters of solar cells through SunsVoc and timely adjust the preparation process. During the measurement, it is necessary to hold the probe pen and keep the tip in contact with the solar cell stably. After clicking the test button in the software, the flash lamp flashes and measures data of the solar cell including the ideal I-V curve, ideal FF, ideal V oc , J 01 , J 02 and so on. To reduce the occlusion of the hand at the holding end and the probe pen above the solar cell, the probe pen and the tip will be kept inclined during the measurement. However, when the inclination angle of the tip is too large, it is easy to cause the tip to slide on the solar cell, which affects the measurement result. Moreover, during the measurement, even if the probe pen is inclined, when measuring the middle part of the solar cell, the probe pen and the hand at the holding end will inevitably cause shadow occlusion to the solar cell, resulting in a certain deviation between the detected light intensity and the actual test light intensity received by the solar cell, thereby reducing the accuracy of the measurement result.
[0003] Therefore, a probe pen for improving the testing accuracy of crystalline silicon solar cells is proposed. Content of the Utility Model
[0004] The purpose of the utility model is to provide a probe pen for improving the testing accuracy of crystalline silicon solar cells, aiming to solve or improve at least one of the above technical problems.
[0005] To achieve the above purpose, the utility model provides the following scheme: The utility model provides a probe pen for improving the testing accuracy of crystalline silicon solar cells, comprising:
[0006] A pen barrel;
[0007] A probe, which is divided into three sections, namely a contact section, a transition section and a connection section. The two ends of the transition section are respectively fixedly connected to the contact section and the connection section. One end of the connection section far from the transition section is fixedly connected to the pen barrel. The contact section, the transition section and the connection section are integrally in a Z-like shape. During the measurement, the contact section is used to contact the solar cell and is perpendicular to the solar cell, and the pen barrel is located outside the solar cell.
[0008] Preferably, protective layers are wrapped outside both the transition section and the connection section.
[0009] Preferably, during measurement, the connecting section and the pen shaft are inclined with respect to the solar cell, and the transition section is parallel to the solar cell.
[0010] Preferably, during measurement, the angle between the pen shaft and the solar cell is 25°-45°.
[0011] Preferably, the length of the contact section is ≥3 mm, the length of the connecting section is ≥50 mm, and the cross-sectional areas of the contact section, the transition section, and the connecting section are all ≥1 mm 2 。
[0012] Preferably, the protective layer is transparent glass, and the wall thickness of the protective layer is 0.8 mm-1.5 mm.
[0013] The present utility model discloses the following technical effects: By setting the probe into a Z-shaped three-section structure, the contact section and the pen shaft are misaligned. During measurement, the contact section contacts the solar cell, while the pen shaft and the hand for holding are outside the solar cell. When the pulsed light flashes, the pen shaft and the hand do not form a shadow obstruction to the solar cell, reducing the deviation between the detected light intensity and the actual test light intensity; and during measurement, the contact section is perpendicular to the solar cell, which can improve the contact effect with the solar cell, improve the contact stability, and improve the accuracy of the measurement result. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] The drawings forming a part of this application are used to provide a further understanding of this application. The schematic embodiments and descriptions thereof of this application are used to explain this application and do not constitute an improper limitation of this application. In the drawings:
[0015] Figure 1 is a schematic structural diagram of the present utility model;
[0016] Figure 2 is a schematic structural diagram of the probe in the present utility model;
[0017] Figure 3 is a top view of the present utility model during testing on a solar cell.
[0018] In the figure: 1, pen shaft; 2, contact section; 3, transition section; 4, connecting section; 5, protective layer; 6, wire. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0019] The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0020] To make the above objects, features, and advantages of the present utility model more obvious and understandable, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0021] Referring to Figures 1 - 3 , the present utility model provides a probe pen for improving the test accuracy of crystalline silicon solar cells, including:
[0022] A pen shaft 1;
[0023] A probe, which is divided into three sections, namely a contact section 2, a transition section 3, and a connection section 4 in sequence. The two ends of the transition section 3 are respectively fixedly connected to the contact section 2 and the connection section 4. One end of the connection section 4 away from the transition section 3 is fixedly connected to the pen shaft 1. There is a bending angle between the transition section 3 and the contact section 2 and the connection section 4, so that the contact section 2, the transition section 3, and the connection section 4 are integrally in a Z-shaped; during measurement, the contact section 2 is used to contact the battery chip and is perpendicular to the battery chip, and the pen shaft 1 is outside the battery chip;
[0024] The probe is a copper metal probe, and the wire 6 on the pen shaft 1 is connected to the measuring device for transmitting the data measured by the contact section 2;
[0025] By setting the probe into a Z-shaped three-section structure, the contact section 2 and the pen shaft 1 are misaligned. During measurement, the contact section 2 contacts the battery chip, while the pen shaft 1 and the held hand are outside the battery chip. When the pulsed light flashes, the pen shaft 1 and the hand do not form a shadow block on the battery chip, reducing the deviation between the detected light intensity and the actual test light intensity; and during measurement, the contact section 2 is perpendicular to the battery chip, which can improve the contact effect with the battery chip, improve the contact stability, and improve the accuracy of the measurement result.
[0026] In a further optimized solution, both the transition section 3 and the connection section 4 are wrapped with a protective layer 5;
[0027] The protective layer 5 is transparent glass, and the wall thickness of the protective layer 5 is 0.8 mm - 1.5 mm;
[0028] By setting the protective layer 5 of transparent glass, it can transmit light and can improve the support strength of the transition section 3 and the connection section 4, preventing the transition section 3 and the connection section 4 from being pressed and deformed; the wall thickness of the protective layer 5 is 0.8 mm - 1.5 mm, and the optimal is 1 mm, which can minimize the blockage of the battery chip while maintaining the corresponding support strength.
[0029] In a further optimized solution, during measurement, the connection section 4 and the pen shaft 1 are inclined to the battery chip, and the transition section 3 is parallel to the battery chip.
[0030] In a further optimized solution, during measurement, the angle between the pen shaft 1 and the battery chip is 25° - 45°;
[0031] According to the holding habit, the optimal included angle is 30°, which can improve the operation comfort of the holder.
[0032] For a further optimized solution, the length of the contact section 2 is ≥ 3 mm, the length of the connecting section 4 is ≥ 50 mm, and the cross-sectional areas of the contact section 2, the transition section 3, and the connecting section 4 are all ≥ 1 mm 2 ;
[0033] The current largest battery cell is 210 mm * 210 mm. The grid lines between the two half-cells are not connected to each other. The width of the half-cell is 105 mm. The half-cell battery has a total of 16 main grids. There are 7 PAD points on each main grid that can be used for probe measurement. The PAD point located in the middle of the half-cell battery is 52.5 mm away from the edge of the battery cell. Therefore, in this embodiment, the length of the contact section 2 is set to 3 mm, the length of the connecting section 4 is set to 50 mm, and the length of the connecting section 4 is set to 3 mm.
[0034] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention.
[0035] The embodiments described above are only descriptions of the preferred modes of the present invention, and do not limit the scope of the present invention. Without departing from the design spirit of the present invention, various deformations and improvements made by those of ordinary skill in the art to the technical solutions of the present invention should all fall within the protection scope determined by the claims of the present invention.
Claims
1. A probe pen for improving the test accuracy of crystalline silicon solar cells, characterized in that: include: Penholder (1); The probe is divided into three sections, namely a contact section (2), a transition section (3) and a connecting section (4), two ends of the transition section (3) are respectively fixedly connected to the contact section (2) and the connecting section (4), one end of the connecting section (4) away from the transition section (3) is fixedly connected to the pen holder (1), and the contact section (2), the transition section (3) and the connecting section (4) are in a Z-shape as a whole; when measuring, the contact section (2) is used to contact a battery cell and is perpendicular to the battery cell, and the pen holder (1) is located outside the battery cell.
2. The probe pen for improving the test accuracy of crystalline silicon solar cells according to claim 1, characterized in that: The transition section (3) and the connecting section (4) are both wrapped with a protective layer (5).
3. The probe pen for improving the test accuracy of crystalline silicon solar cells according to claim 1, characterized in that: During measurement, the connecting section (4) and the pen holder (1) are inclined toward the battery sheet, and the transition section (3) is parallel to the battery sheet.
4. The probe pen for improving the test accuracy of crystalline silicon solar cells according to claim 1, characterized in that: During measurement, the angle between the pen holder (1) and the battery cell is 25°-45°.
5. The probe pen for improving the test accuracy of crystalline silicon solar cells according to claim 1, characterized in that: The length of the contact section (2) is ≥3 mm, the length of the connecting section (4) is ≥50 mm, and the cross-sectional areas of the contact section (2), the transition section (3) and the connecting section (4) are all ≥1 mm 2 .
6. The probe pen for improving the test accuracy of crystalline silicon solar cells according to claim 2, characterized in that: The protective layer (5) is transparent glass, and the wall thickness of the protective layer (5) is 0.8 mm-1.5 mm.