Circuit board testing device

Abstract

The utility model discloses a circuit board testing device, which comprises a base, a portal frame, a driving mechanism, a probe assembly and a mounting plate, and is characterized in that the base is mounted on the base; the driving mechanism is installed on the portal frame and located above the base. The probe assembly comprises a pressing plate and multiple probes, the telescopic end of the driving mechanism is connected with the pressing plate, the multiple probes are installed on the pressing plate, and the driving mechanism is used for driving the pressing plate to be close to or away from the base; the mounting plate is mounted on the base, the mounting plate and the pressing plate are oppositely arranged, and the mounting plate is used for mounting a to-be-tested circuit board. According to the invention, the problems of low efficiency and low accuracy existing in manual circuit board detection in the prior art are solved, and the method has the advantages of high test efficiency and high accuracy.

Description

Technical Field

[0001] This application belongs to the technical field of circuit board detection, and particularly relates to a circuit board testing device. Background Art

[0002] Circuit boards are widely used in the electronics industry. Poor quality of incoming circuit boards will increase the waste of resources such as manpower and equipment. At present, manual inspection is used for incoming inspection, lacking performance detection, with low detection efficiency and low detection accuracy, which affects the product yield. Utility Model Content

[0003] The embodiments of this application provide a circuit board testing device to solve the problems of low efficiency and low accuracy in the existing manual circuit board detection.

[0004] The embodiments of this application provide a circuit board testing device, including:

[0005] A base;

[0006] A gantry, installed on the base;

[0007] A driving mechanism, installed on the gantry, and the driving mechanism is located above the base;

[0008] A probe assembly, including a pressing plate and a plurality of probes. The telescopic end of the driving mechanism is connected to the pressing plate, and a plurality of the probes are installed on the pressing plate. The driving mechanism is used to drive the pressing plate to approach or depart from the base;

[0009] A mounting plate, installed on the base, the mounting plate is disposed opposite to the pressing plate, and the mounting plate is used to mount the circuit board to be tested.

[0010] Optionally, a positioning portion and a supporting portion are provided on one side of the mounting plate close to the pressing plate. The positioning portion is used to cooperate with the positioning holes on the circuit board to be tested, and the supporting portion is used to support the circuit board to be tested.

[0011] Optionally, the positioning portion includes a plurality of positioning pins, the supporting portion includes a plurality of supporting columns, and the height of the positioning pins is greater than the height of the supporting columns.

[0012] Optionally, a recessed area is provided on one side of the base close to the pressing plate, the mounting plate is located in the recessed area, and the mounting plate is detachably connected to the base.

[0013] Optionally, a first slotted hole is provided on the mounting plate, the first slotted hole extends along a first direction, and a first pin shaft passes through the first slotted hole to fixedly connect the mounting plate and the base.

[0014] Optionally, the probe assembly further includes an adapter block disposed on a side of the pressing plate facing away from the mounting plate, and a telescopic end of the driving mechanism is fixedly connected to the adapter block.

[0015] Optionally, the adapter block is located in a region near the middle of the pressing plate.

[0016] Optionally, a guiding member is provided on a side of the base close to the driving mechanism, the pressing plate is sleeved on the guiding member, and the pressing plate moves along the guiding member.

[0017] Optionally, the gantry includes a first support column, a second support column, and a fixing plate. The first support column and the second support column are disposed opposite to each other at an interval. One ends of the first support column and the second support column are detachably connected to the base, and the other ends are connected to the fixing plate. The fixing plate is located between the first support column and the second support column, and the driving mechanism is detachably connected to the fixing plate.

[0018] Optionally, second elongated holes are provided on the first support column and the second support column. The second elongated holes extend along a second direction, and a second pin shaft passes through the second elongated holes to fixedly connect the first support column, the second support column, and the base;

[0019] And / or, third elongated holes are provided on the fixing plate. The third elongated holes extend along a third direction, and a third pin shaft passes through the third elongated holes (260) to fixedly connect the fixing plate (230) and the driving mechanism (300).

[0020] The circuit board testing device provided by the embodiment of the present application includes a base, a gantry, a driving mechanism, a probe assembly, and a mounting plate. The gantry, the driving mechanism, the probe assembly, and the mounting plate are integrated on the base. The probe assembly includes a pressing plate and a plurality of probes. The circuit board to be tested is mounted on the mounting plate. The driving mechanism drives the pressing plate to approach the mounting plate, and the probes on the pressing plate contact the test points on the circuit board to be tested, so as to test the circuit board to be tested, overcoming the problems of low efficiency and low accuracy in the existing manual detection of circuit boards, and having the advantages of high test efficiency and high accuracy. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without creative efforts.

[0022] In order to more completely understand the present application and its beneficial effects, the following will be described in conjunction with the drawings. Among them, the same reference numerals represent the same parts in the following description.

[0023] Figure 1 This is a perspective view of the circuit board testing device provided by the embodiment of the present application.

[0024] Figure 2 This is a front view of the circuit board testing device provided by the embodiment of the present application.

[0025] Figure 3 This is a rear view of the circuit board testing device provided by the embodiment of the present application.

[0026] Figure 4 It is Figure 2 the sectional view taken along line A-A in

[0027] Figure 5 This is a schematic structural view of the base of the circuit board testing device provided by the embodiment of the present application.

[0028] The reference numerals in the attached drawings are:

[0029] 100, base; 110, recessed area; 120, guiding member;

[0030] 200, gantry; 210, first support column; 220, second support column; 230, fixing plate; 240, second waist-shaped hole; 250, second pin shaft; 260, third waist-shaped hole; 270, third pin shaft;

[0031] 300, driving mechanism; 310, fixed seat; 320, handle; 330, pressing rod; 331, sleeve; 332, connecting rod; 333, clamping block;

[0032] 400, probe assembly; 410, pressing plate; 420, probe; 430, adapter block;

[0033] 500, mounting plate; 510, positioning portion; 520, supporting portion; 530, first waist-shaped hole; 540, first pin shaft. Detailed implementation manners

[0034] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of protection of the present application.

[0035] The embodiment of the present application provides a circuit board testing device for testing a PCB circuit board to solve the problems of low efficiency and low accuracy in the existing manual circuit board detection. The following will be described in conjunction with the drawings.

[0036] Refer to Figure 1 , Figure 2 andFigure 3 , an embodiment of the present application provides a circuit board testing device, including a base 100, a gantry 200, a driving mechanism 300, a probe assembly 400, and a mounting plate 500.

[0037] In this embodiment, the base 100 is a cubic box structure. The material of the base 100 can be stainless steel or a hard plastic plate.

[0038] In this embodiment, the gantry 200 is installed on the base 100, and the gantry 200 straddles both sides of the base 100.

[0039] In this embodiment, the driving mechanism 300 is installed on the gantry 200, and the driving mechanism 300 is located above the base 100. The driving mechanism 300 is an automatic driving mechanism or a manual driving mechanism. The automatic driving mechanism includes a motor and a telescopic rod, and the motor drives the telescopic rod to extend and retract. Using an automatic driving mechanism has a high degree of automation. The manual driving mechanism is an elbow clamp. Using an elbow clamp as the driving mechanism 300, the installation and operation of the elbow clamp are simple, which is convenient for users to operate.

[0040] In this embodiment, the probe assembly 400 includes a pressing plate 410 and a plurality of probes 420. The pressing plate 410 can be a rectangular plate. The telescopic end of the driving mechanism 300 is connected to the pressing plate 410, and the driving mechanism 300 is used to drive the pressing plate 410 to approach or depart from the base 100. The telescopic end of the driving mechanism 300 is connected to the side of the pressing plate 410 facing away from the base 100. The probes 420 are installed on the pressing plate 410. A plurality of through holes are provided on the pressing plate 410, and the through holes are arranged in alignment with the probes 420. The probes 420 are arranged in alignment with the test points on the circuit board to be tested.

[0041] In an embodiment of the present application, the mounting plate 500 is a rectangular plate, and the mounting plate 500 is installed on the base 100. The mounting plate 500 is arranged opposite to the pressing plate 410, and the mounting plate 500 is used to mount the circuit board to be tested.

[0042] In an embodiment of the present application, the gantry 200, the driving mechanism 300, the probe assembly 400, and the mounting plate 500 are integrated on the base 100. The structure of the circuit board testing device is compact, the equipment integration degree is high, and it is convenient to move. Through the contact between the probes 420 on the pressing plate 410 and the test on the circuit board to be tested, the test of the circuit board to be tested is completed, which has the advantages of high test efficiency and high accuracy.

[0043] In some embodiments, refer to Figure 5 , a positioning portion 510 is provided on the side of the mounting plate 500 close to the pressing plate 410. The positioning portion 510 is used to cooperate with the positioning holes on the circuit board to be tested.

[0044] In the embodiments of the present application, by providing a positioning portion 510 on the mounting plate 500, the positioning portion 510 cooperates with the positioning holes on the circuit board to be tested. This ensures the precise installation position of the circuit board to be tested on the mounting plate 500, enabling the probe 420 to be accurately aligned with the test points on the circuit board to be tested, thereby improving the installation efficiency and test efficiency of the circuit board to be tested.

[0045] In some embodiments, referring to Figure 5 , the positioning portion 510 includes a plurality of positioning pins. Exemplarily, the positioning pins are provided at the four corners of the mounting plate 500, avoiding the positions of the test points on the circuit board to be tested. The positioning holes on the circuit board to be tested are through holes. The positioning pin has a first section and a second section. The first section is closer to the circuit board to be tested than the second section. The outer diameter of the first section is smaller than the diameter of the positioning hole, and the outer diameter of the second section is larger than the diameter of the positioning hole. The second section is used to support the circuit board to be tested, so that there is a certain gap between the circuit board to be tested and the mounting plate 500, preventing the circuit board to be tested from fitting with the mounting plate 500 and facilitating the installation and disassembly of the circuit board to be tested.

[0046] In some embodiments, referring to Figure 5 , a support portion 520 is provided on one side of the mounting plate 500 close to the pressing plate 410. The support portion 520 is used to support the circuit board to be tested. The support portion 520 is provided avoiding the test points on the circuit board to be tested.

[0047] In the embodiments of the present application, by providing the support portion 520 on the mounting plate 500 to support the circuit board to be tested, there is a certain distance between the circuit board to be tested and the mounting plate 500. When testing the circuit board to be tested, even if the circuit board to be tested is over-pressed by the probe assembly 400, the circuit board to be tested has a certain deformation space, protecting the circuit board to be tested.

[0048] In some embodiments, referring to Figure 5 , the support portion 520 includes a plurality of support columns. The height of the positioning pin is greater than the height of the support column. The support column is a cylindrical structure. The height of the support column is the same as the height of the second section of the positioning pin.

[0049] In some embodiments, referring to Figure 5 , a recessed area 110 is provided on one side of the base 100 close to the pressing plate 410. The mounting plate 500 is located within the recessed area 110, and the mounting plate 500 is detachably connected to the base 100.

[0050] Exemplarily, a recessed area 110 is provided on the base 100. The shape of the recessed area 110 is rectangular. The size of the recessed area 110 is larger than the size of the mounting plate 500, and the depth of the recessed area 110 is smaller than the thickness of the mounting plate 500. The installation position of the mounting plate 500 on the base 100 is positioned through the recessed area 110, facilitating the quick installation and positioning of the mounting plate 500.

[0051] In some embodiments, referring to Figure 5 , a first elongated hole 530 is provided on the mounting plate 500. The first elongated hole 530 is a long strip hole. The first elongated hole 530 is provided on both sides of the mounting plate 500. An avoidance space is also provided at the position of the first elongated hole 530 on the mounting plate 500 to facilitate the machining of the first elongated hole 530. The first elongated hole 530 extends along a first direction, and the first direction is the Y-axis direction. The first pin shaft 540 passes through the first elongated hole 530 to fixedly connect the mounting plate 500 and the base 100.

[0052] In the embodiment of the present application, the first elongated hole 530 extending along the Y-axis direction is provided on the mounting plate 500, and the relative position of the mounting plate 500 and the base 100 in the Y-axis direction is adjusted to realize the fine adjustment of the mounting plate 500.

[0053] In some embodiments, referring to Figure 1 、 Figure 2 and Figure 3 , the probe assembly 400 further includes an adapter block 430. The adapter block 430 is disposed on the side of the pressing plate 410 away from the mounting plate 500, and the telescopic end of the driving mechanism 300 is fixedly connected to the adapter block 430.

[0054] In the embodiment of the present application, referring to Figure 2 and Figure 4 , the driving mechanism 300 is an elbow clamp. The elbow clamp includes a fixed seat 310, a handle 320 and a pressure rod 330. The fixed seat 310 is installed on the gantry 200. The handle 320 is rotatably connected to the fixed seat 310. One end of the handle 320 is connected to the pressure rod 330, and the other end of the pressure rod 330 is connected to the adapter block 430. The adapter block 430 is fixedly connected to the pressing plate 410. When the handle 320 rotates, the pressure rod 330 is driven to move along the Z-axis direction, and the pressure rod 330 drives the pressing plate 410 to move along the Z-axis direction.

[0055] The pressure rod 330 includes a sleeve 331 and a connecting rod 332. The connecting rod 332 is threadedly connected to the sleeve 331, and the length of the pressure rod 330 can be adjusted as needed to meet different usage scenarios. A clamping block 333 is provided at the end of the connecting rod 332 away from the handle 320. The connecting rod 332 passes through the adapter block 430, and the clamping block 333 abuts against the adapter block 430, and the adapter block 430 is fixedly connected to the connecting rod 332 through the clamping block 333. The structure is simple and convenient for the assembly of the adapter block 430 and the pressure rod 330. The pressing plate 410 is provided with a through hole for accommodating the clamping block 333 to prevent the situation that the clamping block 333 protrudes outside the pressing plate 410 and damages the circuit board to be tested.

[0056] In some embodiments, referring to Figure 1 、 Figure 2 and Figure 3, the adapter block 430 is located in the area near the middle of the pressure plate 410. The size of the adapter block 430 is smaller than that of the pressure plate 410. The adapter block 430 is arranged in the middle area of the pressure plate 410 to ensure uniform force on the pressure plate 410.

[0057] In some embodiments, refer to Figure 1 , on one side of the base 100 close to the driving mechanism 300, a guiding member 120 is provided. The guiding member 120 is a guide rod, and two guide rods are provided. The two guide rods are arranged at intervals along the length direction of the pressure plate 410. The guiding direction of the guiding member 120 is the same as the driving direction of the driving mechanism 300. The pressure plate 410 is sleeved on the guiding member 120. A guiding sleeve is provided on the pressure plate 410. The guiding sleeve is fixedly connected to the pressure plate 410 and is sleeved on the guide rod. The driving mechanism 300 drives the pressure plate 410 to move along the guiding member 120.

[0058] In the embodiment of the present application, by providing the guiding member 120, the pressure plate 410 moves along the guiding member 120, reducing the occurrence of the situation where the probe 420 is misaligned with the test point on the circuit board to be tested due to the misalignment of the pressure plate 410 during movement, and ensuring accurate test results.

[0059] In some embodiments, refer to Figure 1 , the gantry 200 includes a first support column 210, a second support column 220, and a fixing plate 230. The first support column 210 and the second support column 220 are in a strip plate structure. The first support column 210 and the second support column 220 are arranged relatively at intervals. One end of the first support column 210 and the second support column 220 is detachably connected to the side of the base 100, and the other end is connected to the fixing plate 230. The fixing plate 230 is located between the first support column 210 and the second support column 220. The driving mechanism 300 is detachably connected to the fixing plate 230. The first support column 210, the second support column 220, and the fixing plate 230 enclose a U-shaped structure.

[0060] In some embodiments, refer to Figure 1 , the first support column 210 and the second support column 220 are provided with second waist-shaped holes 240. The second waist-shaped holes 240 are long strip holes. The second waist-shaped holes 240 extend along the second direction, and the second direction is the Z-axis direction. The second pin shaft 250 passes through the second waist-shaped holes 240 to fixedly connect the first support column 210, the second support column 220, and the base 100.

[0061] In the embodiment of the present application, by providing the second waist-shaped holes 240 on the first support column 210 and the second support column 220, the installation positions of the first support column 210 and the second support column 220 relative to the base 100 can be adjusted, realizing fine adjustment of the height of the gantry 200. The adjustment operation is simple and has a wide application range.

[0062] In some embodiments, refer to Figure 3, a third waist-shaped hole 260 is provided on the fixing plate 230, and the third waist-shaped hole 260 is an elongated hole. The third waist-shaped hole 260 extends along a third direction, and the third direction is the X-axis direction. The third pin shaft 270 passes through the third waist-shaped hole 260 to fixedly connect the fixing plate 230 and the driving mechanism 300.

[0063] In the embodiment of the present application, the third waist-shaped hole 260 is provided on the fixing plate 230, and the installation position of the driving mechanism 300 and the fixing plate 230 realizes fine adjustment of the position of the driving mechanism 300. The adjustment operation is simple and the applicable range is wide.

[0064] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0065] In the description of the present application, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more features.

[0066] The circuit board testing device provided by the embodiments of the present application has been introduced in detail above. Specific examples are used herein to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the method and its core idea of the present application; at the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A circuit board testing device, characterized in that: include: Base (100); A gantry (200) is installed on the base (100); A driving mechanism (300) is installed on the gantry (200), and the driving mechanism (300) is located above the base (100); The probe assembly (400) comprises a pressing plate (410) and a plurality of probes (420), the telescopic end of the driving mechanism (300) is connected to the pressing plate (410), the plurality of probes (420) are mounted on the pressing plate (410), and the driving mechanism (300) is used to drive the pressing plate (410) to approach or move away from the base (100); The mounting plate (500) is mounted on the base (100), the mounting plate (500) is arranged opposite to the pressing plate (410), and the mounting plate (500) is used to mount a circuit board to be tested.

2. The circuit board testing device according to claim 1, characterized in that: A positioning portion (510) and a supporting portion (520) are provided on one side of the mounting plate (500) close to the pressing plate (410), wherein the positioning portion (510) is used to cooperate with a positioning hole on the circuit board to be tested, and the supporting portion (520) is used to support the circuit board to be tested.

3. The circuit board testing device according to claim 2, characterized in that: The positioning portion (510) includes a plurality of positioning pins, the supporting portion (520) includes a plurality of supporting columns, and the height of the positioning pins is greater than the height of the supporting columns.

4. The circuit board testing device according to claim 2, characterized in that: A recessed area (110) is provided on one side of the base (100) close to the pressing plate (410), the mounting plate (500) is located in the recessed area (110), and the mounting plate (500) is detachably connected to the base (100).

5. The circuit board testing device according to claim 4, characterized in that: The mounting plate (500) is provided with a first waist hole (530), the first waist hole (530) extends along a first direction, and a first pin shaft (540) passes through the first waist hole (530) to fixedly connect the mounting plate (500) and the base (100).

6. The circuit board testing device according to claim 1, characterized in that: The probe assembly (400) further comprises an adapter block (430), wherein the adapter block (430) is arranged on a side of the pressing plate (410) away from the mounting plate (500), and the telescopic end of the driving mechanism (300) is fixedly connected to the adapter block (430).

7. The circuit board testing device according to claim 6, characterized in that: The adapter block (430) is located in a region close to the middle of the pressing plate (410).

8. The circuit board testing device according to claim 1, characterized in that: A guide member (120) is provided on one side of the base (100) close to the driving mechanism (300), the pressing plate (410) is sleeved on the guiding member (120), and the pressing plate (410) moves along the guiding member (120).

9. The circuit board testing device according to claim 1, characterized in that: The gantry (200) comprises a first support column (210), a second support column (220) and a fixing plate (230); the first support column (210) and the second support column (220) are arranged relatively spaced apart; one end of the first support column (210) and the second support column (220) are detachably connected to the base (100), and the other end is connected to the fixing plate (230); the fixing plate (230) is located between the first support column (210) and the second support column (220); and the driving mechanism (300) is detachably connected to the fixing plate (230).

10. The circuit board testing device according to claim 9, characterized in that: The first pillar (210) and the second pillar (220) are provided with a second waist hole (240), the second waist hole (240) extends along a second direction, and a second pin (250) passes through the second waist hole (240) to fixedly connect the first pillar (210), the second pillar (220) and the base (100); And / or, a third waist hole (260) is provided on the fixing plate (230), the third waist hole (260) extends along a third direction, and a third pin shaft (270) passes through the third waist hole (260) to fixedly connect the fixing plate (230) and the driving mechanism (300).

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