Test cabinet for testing solid state disk

Abstract

The utility model relates to a test cabinet for testing a solid state disk in the field of test cabinets, which comprises a cabinet and a controller arranged on the cabinet, an accommodating cavity is arranged in the cabinet, a support frame is arranged in the accommodating cavity, the support frame is connected with a support plate through a mounting hole, and the support plate is provided with a plurality of through holes. A detection assembly used for detecting the solid state disk is arranged on the supporting plate, a mounting back plate is arranged in the containing cavity, a PCIE interface plate is detachably connected to the side face of the mounting back plate, power output interfaces electrically connected with the detection assembly are formed in the PCIE interface plate, and connecting holes matched with the power output interfaces in position and number are formed in the mounting back plate; according to the test cabinet, through the supporting frame and the supporting plate which are adjustable in position, the installation flexibility and expandability of the supporting frame are enhanced, the PCIE interface board on the installation back plate is detachably designed, the PCIE interface board can be conveniently detached and replaced according to different test requirements, the universality and adaptability of the test cabinet are improved, and the test cabinet is convenient to install, test and use.

Description

Technical Field

[0001] The utility model relates to the field of test cabinets, and particularly to a test cabinet for solid-state drive testing. Background Art

[0002] A solid-state drive (SSD), also known as a solid-state drive, is a hard disk made of a solid-state electronic storage chip array. Before leaving the factory, the manufacturer inserts the SSD into a computer or server and provides a stable DC5V voltage to perform read and write tests on the SSD. Through this high-temperature environment and stable voltage, the SSD solid-state drive is tested to screen out products with potential hazards and instability, so as to ensure that the performance and parameters of the products leaving the factory meet the industry usage requirements. Therefore, it is usually necessary to use a testing agency for testing.

[0003] In the existing aging test method for solid-state drive BIT (a random read and write data aging test software), during the testing process of the solid-state drive, the test cabinet is an indispensable device. The existing solid-state drive test cabinets usually have a hard disk slot for inserting the solid-state drive to be tested, a controller for managing and controlling the read and write operations of the hard disk. The controller simultaneously monitors various parameters during the testing process to ensure the accuracy and reliability of the test results, a power supply module for providing stable power support for all components in the test cabinet, and an interface module for connecting the test cabinet to external devices (such as a computer or a test system) to achieve data transmission and the sending of control instructions. The interface module includes multiple interfaces such as USB, eSATA, and SAS.

[0004] However, although the existing solid-state drive test cabinets are relatively perfect in terms of function and structure, there are still some obvious defects in actual applications. The connection convenience of the test interfaces in the existing test cabinets is poor, and they cannot be adaptively adjusted and replaced according to the specific configuration and requirements of the solid-state drive to be tested, making them inconvenient to use. In addition, the installation structure of the existing test installation structure for inserting the solid-state drive to be tested is not easy to install, and after the test installation structure fails and is damaged, it is not easy to disassemble and replace, which is not conducive to the use of the test cabinet. Summary of the Utility Model

[0005] The purpose of the utility model is to solve the above defects and provide a test cabinet for solid-state drive testing to solve the technical problems in the above background art that the test interfaces in the existing test cabinets are not easy to be flexibly replaced according to requirements, and the test installation structure is not easy to be disassembled and replaced, affecting the use.

[0006] The purpose of the utility model is achieved in the following way:

[0007] A test cabinet for solid-state drive testing, comprising a cabinet and a controller arranged on the cabinet. An accommodation cavity is provided inside the cabinet, and a support frame is arranged in the accommodation cavity. A support plate is connected to the support frame through mounting holes. A detection component for detecting a solid-state drive is arranged on the support plate. The detection component includes a computer motherboard, a cooling fan, a PCIE connection port, a CPU, and a power supply. The computer motherboard and the power supply are both mounted on the support plate, the CPU is mounted on the computer motherboard, the cooling fan is mounted on the computer motherboard through a PCIE card, the cooling fan is mounted on the side of the PCIE card, and the PCIE connection port is arranged on the PCIE card. An installation backplane is arranged in the accommodation cavity. A plurality of PCIE interface boards are detachably connected to the side of the installation backplane. A plurality of power output interfaces electrically connected to the detection component are arranged on the PCIE interface boards. A plurality of connection holes paired with the positions and quantities of the power output interfaces are formed on the installation backplane.

[0008] Further in the above description, the support frame is connected to the inner wall of the accommodation cavity, and the mounting holes are arranged in an array along the length direction of the support frame, so that the support plate can be adjustably connected to the mounting holes.

[0009] Further in the above description, a protection seat for protecting the power output interface is arranged on the PCIE interface board, and through holes for connecting to the installation backplane are formed on the PCIE interface board. The PCIE interface board is connected to the installation backplane through bolts passing through the through holes. One end of the installation backplane extends towards the top of the cabinet to form a connection end, and the installation backplane is in an inverted "L" shape.

[0010] Further in the above description, three support plates are provided, and four groups of detection components are connected to each support plate. The number of PCIE interface boards is paired with the number of detection components, and eight power output interfaces are distributed on each PCIE interface board.

[0011] Further in the above description, air inlets and air outlets are respectively formed on both sides of the cabinet, and both the air inlets and the air outlets are communicated with the accommodation cavity to form a heat dissipation channel.

[0012] Further in the above description, a first cabinet door and a second cabinet door that can be opened and closed are respectively connected to both sides of the cabinet, and a transparent window for observing the accommodation cavity is connected to the first cabinet door.

[0013] Further in the above description, a plurality of support feet are connected to the bottom of the cabinet, and rotatable universal wheels are connected to the bottom of the cabinet.

[0014] Advantages of the present utility model: By means of the support frame and the support plate with adjustable positions, the flexibility and expandability of the installation of the support plate are enhanced, facilitating the rapid adjustment of the test environment according to different specifications and test requirements of the solid-state drive, improving the test efficiency in use. The PCIE interface board on the installation backplane adopts a detachable design, and multiple power output interfaces thereon pass through the corresponding connection holes to be electrically connected to the detection component, thereby supporting the rapid docking of multiple solid-state drives and interfaces, facilitating the disassembly and replacement of the PCIE interface board according to different test requirements, and enhancing the versatility and adaptability of the test cabinet. Connection holes are provided on the installation backplane to match the positions and quantities of the power output interfaces, ensuring the accuracy and safety of power distribution, reducing wiring errors and energy waste, and enhancing the stability and reliability during the test process. Description of the Drawings

[0015] Figure 1 It is a perspective view of the present embodiment from the left viewing angle;

[0016] Figure 2 It is a perspective view of the present embodiment from the right viewing angle;

[0017] Figure 3 It is a schematic diagram of the internal structure of the present embodiment;

[0018] Figure 4 It is a schematic diagram of the structure of the installation backplane in the present embodiment;

[0019] Figure 5 It is an exploded view of the present embodiment;

[0020] Figure 6 is Figure 5 a partial enlarged schematic diagram of A in;

[0021] The reference numerals in the drawings are respectively: 1 - cabinet, 2 - controller, 3 - accommodation cavity, 4 - support frame, 5 - installation hole, 6 - support plate, 7 - detection component, 71 - computer motherboard, 72 - cooling fan, 73 - PCIE connection port, 74 - CPU, 75 - power supply, 76 - PCIE card, 8 - installation backplane, 9 - PCIE interface board, 10 - connection hole, 11 - through hole, 12 - air inlet, 13 - air outlet, 14 - first cabinet door, 15 - second cabinet door, 16 - transparent window, 17 - support foot, 18 - universal wheel. Specific Embodiments

[0022] The present utility model will be further described in detail below in conjunction with the drawings and specific embodiments.

[0023] In this embodiment, with reference to Figures 1-6, A test cabinet for solid-state drive testing in its specific implementation includes a cabinet 1 and a controller 2 disposed on the cabinet 1. An accommodation cavity 3 is provided inside the cabinet 1, and a support frame 4 is arranged in the accommodation cavity 3. A support plate 6 is connected to the support frame 4 through mounting holes 5. Twelve detection components 7 for detecting solid-state drives are arranged on the support plate 6. Refer to Figure 6 , The detection component 7 includes a computer motherboard 71, a cooling fan 72, a PCIE connection port 73, a CPU 74, and a computer power supply 75. Both the computer motherboard 71 and the computer power supply 75 are mounted on the support plate 6. The CPU 74 is mounted on the computer motherboard 71. The cooling fan 72 is mounted on the computer motherboard 71 through a PCIE card 76. The cooling fan 72 is mounted on the side of the PCIE card 76. The PCIE connection port 73 is arranged on the side of the PCIE card 76. An installation backplane 8 is provided in the accommodation cavity 3. Twelve PCIE interface boards 9 are detachably connected to the side of the installation backplane 8. Eight power output interfaces 19 electrically connected to the detection component 7 are arranged on each PCIE interface board 9. Connection holes 10 paired with the positions and quantities of the power output interfaces 19 are formed on the installation backplane 8.

[0024] The support frame 4 is connected to the inner wall of the accommodation cavity 3. The mounting holes 5 are arranged in an array along the length direction of the support frame 4, so that the support plate 6 can be adjustably connected to the mounting holes 5. By setting the mounting holes 5 arranged in an array, the support plate 6 can be connected to the corresponding mounting holes 5 according to requirements, thereby facilitating the adjustment of the quantity of the support plate 6 and the pairing of the detection components 7 according to requirements, and further improving the applicability and reliability of use.

[0025] In this embodiment, refer to Figure 5 and Figure 6 , A protection seat for protecting the power output interface 19 is arranged on the PCIE interface board 9, and through holes 11 for connecting to the installation backplane 8 are formed on the PCIE interface board 9. The PCIE interface board 9 is connected to the installation backplane 8 through bolts passing through the through holes 11. One end of the installation backplane 8 extends towards the top of the cabinet 1 to form a connection end 20 connected to the inner wall of the accommodation cavity 3. The cross-section of the installation backplane 8 is in an inverted "L" shape.

[0026] Specifically, each power output interface 19 is equipped with a protection seat, and replacing damaged components does not require interrupting the test. And it is equipped with a 12V to 3.3V 5A intelligent power supply system, which not only ensures a stable working current but also has built-in overcurrent and overheat protection to ensure the safe operation of the device.

[0027] In addition, a press-down female seat is arranged on the PCIE interface board 9 to ensure good contact even after long-term use. Silicone positioning columns are also provided to facilitate the easy loading and unloading of solid-state drives, so that even during long-term operation, there is no need to worry about hand fatigue.

[0028] In this embodiment, three support plates 6 are provided, and four groups of detection components 7 are connected to each support plate 6. The number of PCIE interface boards 9 is paired with the number of detection components 7, and eight power output interfaces 19 are distributed on each PCIE interface board 9.

[0029] Specifically, in this embodiment, 12 computers are supported to work in parallel at the same time, and each computer can test 8 PCIE NVME SSDs, realizing large-scale concurrent testing.

[0030] In this embodiment, air inlets 12 and air outlets 13 are respectively provided on both sides of the cabinet 1 and are distributed oppositely. Both the air inlets 12 and the air outlets 13 are communicated with the accommodation cavity 3 to form a heat dissipation channel.

[0031] Specifically, the provided air inlets 12 and air outlets 13 can ventilate the accommodation cavity 3. An intake fan (not shown) and an exhaust fan (not shown) are connected to the corresponding air inlets 12 and air outlets 13, so that the air circulation in the accommodation cavity 3 is accelerated under the drive of the intake fan and the exhaust fan, and then the components in the accommodation cavity 3 are cooled by air.

[0032] In this embodiment, a first cabinet door 14 and a second cabinet door 15 that can be opened and closed are respectively connected to the front and rear sides of the cabinet 1. A transparent window 16 for observing the accommodation cavity 3 is connected to the first cabinet door 14. The mounting backplane 8 extends towards the first cabinet door 14, so that the PCIE interface board 9 and the corresponding power output interface 19 on the mounting backplane 8 can be observed through the transparent window 16, which is convenient for use. Four support feet 17 are connected to the bottom of the cabinet 1, and four rotatable universal wheels 18 are connected to the bottom of the cabinet 1.

[0033] Specifically, the test cabinet in this embodiment is used for BIT: (burn-in test), a software for aging test of randomly reading and writing data, for testing;

[0034] PCIE: PCI-Express (peripheral component interconnect express) is a high-speed serial computer expansion bus standard. PCIE belongs to high-speed serial point-to-point dual-channel high-bandwidth transmission. The devices connected are allocated exclusive channel bandwidth and do not share bus bandwidth. It mainly supports functions such as active computer power 75 management, error reporting, end-to-end reliable transmission, hot plugging, and quality of service (QOS).

[0035] In this embodiment, the test cabinet is used for testing as follows: The controller 2 is used for operation control. By simulating a real usage scenario, the solid-state drive is tested under high temperature and continuous read and write operations. Through the built-in software, the device can perform efficient tests at a maximum speed of 4000MB / S per port. At the same time, it supports 12 computers to work in parallel, and each computer can test 8 PCIE NVME SSDs, realizing large-scale concurrent testing, so as to detect whether the solid-state drive can operate normally under normal working load and maintain stable performance.

[0036] Specifically, this test method belongs to the conventional technical means of those skilled in the art. Therefore, the detailed description is omitted.

[0037] Compared with the prior art, in this embodiment, through the mounting holes 5 provided on the support frame 4, the support plate 6 is adjusted and installed along the height of the support frame 4, enhancing the flexibility and scalability of the installation of the support plate 6, facilitating the rapid adjustment of the test environment according to different specifications and test requirements of the solid-state drive, and improving the test efficiency in use. The PCIE interface board 9 on the mounting backplane 8 is designed to be detachably connected by bolts. With multiple power output interfaces 19 thereon passing through the corresponding connection holes 10 on the mounting backplane 8 and being electrically connected to the detection component 7, it can support the rapid docking of multiple solid-state drives and interfaces, facilitating the disassembly and replacement of the PCIE interface board 9 according to different test requirements, and enhancing the versatility and adaptability of the test cabinet. The connection holes 10 are opened on the mounting backplane 8 to match the positions and quantities of the power output interfaces 19, ensuring the accuracy and safety of the computer power supply 75 distribution, reducing wiring errors and energy waste, and enhancing the stability and reliability during the test process.

[0038] The above is only a preferred embodiment of the present invention, and it is not intended to limit the present invention in any form. Although the present invention is disclosed above in a preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art, without departing from the scope of the technical solution of the present invention, when making some changes or modifications using the above-disclosed technical content as equivalent change equivalent embodiments, but as long as it does not depart from the content of the technical solution of the present invention, any simple modification, equivalent change and modification made to the above embodiments according to the technical means of the present invention shall fall within the scope of the technical solution of the present invention.

Claims

1. A test cabinet for solid state hard disk testing, comprising a cabinet and a controller arranged on the cabinet, characterized in that: The cabinet is provided with a accommodating cavity inside, a supporting frame is provided in the accommodating cavity, a supporting plate is connected to the supporting frame through a mounting hole, a detection component for detecting a solid-state hard disk is provided on the supporting plate, the detection component comprises a computer motherboard, a cooling fan, a PCIE connector, a CPU and a power supply, the computer motherboard and the power supply are both installed on the supporting plate, the CPU is installed on the computer motherboard, the cooling fan is installed on the computer motherboard through a PCIE card, the cooling fan is installed on the side of the PCIE card, the PCIE connector is provided on the PCIE card, an installation backplane is provided in the accommodating cavity, a plurality of PCIE interface boards are detachably connected to the side of the installation backplane, a plurality of power output interfaces electrically connected to the detection component are provided on the PCIE interface board, and a plurality of connection holes matching the positions and quantities of the power output interfaces are provided on the installation backplane.

2. A test cabinet for solid state hard disk testing according to claim 1, characterized in that: The support frame is connected to the inner wall of the accommodating cavity, and the mounting holes are distributed in an array along the length direction of the support frame, so that the support plate can be adjusted to be connected to the mounting holes.

3. A test cabinet for solid state hard disk testing according to claim 1, characterized in that: The PCIE interface board is provided with a protection seat for protecting the power output interface, and a through hole is opened on the PCIE interface board to connect with the installation backplane. The PCIE interface board is connected to the installation backplane by bolts passing through the through hole. One end of the installation backplane extends toward the top of the cabinet to form a connection end, and the installation backplane is in an inverted "L" shape.

4. A test cabinet for solid state hard disk testing according to claim 3, characterized in that: There are three support plates, and each support plate is connected to four groups of detection components. The PCIE interface board is matched with the number of detection components, and each PCIE interface board is distributed with eight power output interfaces.

5. A test cabinet for solid state hard disk testing according to claim 1, characterized in that: The cabinet is provided with relatively distributed air inlets and air outlets on both sides, and both the air inlets and air outlets are connected to the accommodating cavity to form a heat dissipation channel.

6. A test cabinet for solid state hard disk testing according to any one of claims 1 to 5, characterized in that: The cabinet is connected to two sides thereof with a first cabinet door and a second cabinet door which can be opened and closed, respectively. The first cabinet door is connected with a transparent window through which the accommodating cavity can be observed.

7. A test cabinet for solid state hard disk testing according to any one of claims 1 to 5, characterized in that: The bottom of the cabinet is connected with a plurality of supporting feet, and the bottom of the cabinet is connected with rotatable universal wheels.

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