Production line

By designing a production line that includes conveying modules and testing modules, the space waste caused by the existing production line due to its large length is solved, and the compactness of the production line and the improvement of production efficiency is achieved.

CN223040497UActive Publication Date: 2025-06-27HAIMUXING LASER INTELLIGENT EQUIP (JIANGSU CO LTD
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Patent Information

Application Number
CN202422100917.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-28
Publication Date
2025-06-27
Estimated Expiration
2034-08-28

AI Technical Summary

Technical Problem

The existing production lines used for solar cell production have caused serious waste of space in the production workshop due to their large length.

Method used

A production line including a conveying module, a test module, a first transfer module and a second transfer module is designed. By biasing a part of the conveying module and setting the test module in the accommodation space formed by the conveying module, the length of the production line is shortened.

Benefits of technology

It effectively shortens the length of the production line, reduces space waste in the production workshop, and improves the production efficiency of the production line.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a production line, and relates to the technical field of solar cell production, the production line comprises a conveying module, a test module, a first transfer module and a second transfer module, the conveying module comprises a first conveyor belt, a second conveyor belt and a third conveyor belt, the first conveying belt and the second conveying belt are arranged at intervals in the first direction of the production line, the third conveying belt and the first conveying belt are arranged at intervals in the second direction of the production line, and the third conveying belt, the first conveying belt and the second conveying belt define a containing space. The test module is arranged in the accommodating space and is used for testing the electrical performance of the silicon wafer; the first transfer module can transfer the silicon wafers on the first conveyor belt to the test module and transfer the silicon wafers tested by the test module to the third conveyor belt; the second transfer module can transfer the silicon wafers on the third conveyor belt to the second conveyor belt. According to the scheme, the technical problem of serious space waste caused by large length of a production line can be solved.
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Description

Technical Field

[0001] The utility model relates to the technical field of solar cell production, and particularly relates to a production line. Background Art

[0002] A solar cell is the core component of a solar cell, which converts sunlight into electrical energy through the photovoltaic effect. Solar cells are usually made of semiconductor materials, and the most common one is silicon. However, the length of the existing production line for solar cell production is large, which will cause serious waste of the space in the production workshop.

[0003] Therefore, it is necessary to provide a new production line to solve the above technical problems. Summary of the Utility Model

[0004] The main purpose of the utility model is to provide a production line, aiming to solve the technical problem that the existing production line for solar cell production has a large length, resulting in serious waste of the space in the production workshop.

[0005] To achieve the above purpose, a production line proposed by the utility model includes:

[0006] A conveying module, the conveying module includes a first conveyor belt, a second conveyor belt and a third conveyor belt. The first conveyor belt and the second conveyor belt are arranged at intervals along the first direction of the production line. The third conveyor belt is arranged at intervals along the second direction of the production line with the first conveyor belt, and the third conveyor belt, the first conveyor belt and the second conveyor belt enclose a containing space;

[0007] A testing module, the testing module is arranged in the containing space and is used for testing the electrical properties of silicon wafers;

[0008] A first transfer module, the first transfer module can transfer the silicon wafers on the first conveyor belt to the testing module, and at the same time transfer the silicon wafers tested by the testing module to the third conveyor belt;

[0009] A second transfer module, the second transfer module can transfer the silicon wafers on the third conveyor belt to the second conveyor belt.

[0010] In an embodiment, the first transfer module includes a first driving member arranged between the first conveyor belt and the third conveyor belt, two first cantilevers cross-arranged on the first driving member, and two first suction members respectively arranged on the two first cantilevers. Both of the two first suction members are used for adsorbing silicon wafers;

[0011] The second transfer module includes a second driving member disposed between the second conveyor belt and the third conveyor belt, two second cantilevers oppositely disposed on the second driving member, and two second suction members respectively disposed on the two second cantilevers. Both of the two second suction members are used for sucking silicon wafers.

[0012] In one embodiment, both the first suction member and the second suction member include two suction blocks, and the two suction blocks are spaced apart.

[0013] In one embodiment, the two first cantilevers are perpendicular to each other.

[0014] In one embodiment, the testing module includes a turntable, a first testing component, a second testing component, and four carrier plates disposed in a rectangular shape on the turntable. The turntable is sequentially provided with a transfer station, a positioning station, a first testing station, and a second testing station along its circumferential direction. The four carrier plates are respectively disposed at the transfer station, the positioning station, the first testing station, and the second testing station, and each carrier plate can be switched between the transfer station, the positioning station, the first testing station, and the second testing station; the first testing component is disposed on one side of the first testing station, and the second testing component is disposed on one side of the second testing station.

[0015] In one embodiment, both the first testing component and the second testing component include a base, a conductive block slidably disposed on the base along a third direction of the production line, and a driving unit. The driving unit can drive the conductive block to slide along the third direction of the production line.

[0016] In one embodiment, each of the conductive blocks is provided with a plurality of conductive probes. The plurality of conductive probes of the first testing component are spaced apart along a first direction of the production line, and the plurality of conductive probes of the second testing component are spaced apart along a second direction of the production line.

[0017] In one embodiment, the number of the first conveyor belt, the second conveyor belt, and the third conveyor belt is two, and the two first conveyor belts, the two second conveyor belts, and the two third conveyor belts are spaced apart along a second direction of the production line.

[0018] In one embodiment, the first conveyor belt, the second conveyor belt, and the third conveyor belt each include a conveying unit. The conveying unit includes a bracket, rollers rotatably disposed on the bracket, a conveyor belt connecting the two rollers, and a driving body disposed on the bracket. The driving body drives the rollers to rotate through a synchronous belt.

[0019] In one embodiment, the production line further includes a laser processing module, which includes a mounting rack and a laser head disposed on the mounting rack, and the third conveyor belt passes through the mounting rack.

[0020] The technical solution of the present utility model can shorten the length of the production line by offsetting a part of the conveying module and arranging the testing module in the accommodating space formed by the conveying module, thereby reducing the waste of space in the production workshop. In this embodiment, the first conveyor belt is used for loading silicon wafers, the second conveyor belt is used for unloading silicon wafers, the third conveyor belt is used for transferring silicon wafers, and the testing module is used for testing the performance of silicon wafers. The first transfer module can transfer the silicon wafers on the first conveyor belt to the testing module and at the same time transfer the silicon wafers tested by the testing module to the third conveyor belt, that is, the process of transferring the untested silicon wafers to the testing module and the process of transferring the tested silicon wafers to the third conveyor belt can be carried out simultaneously, which can improve the production efficiency of the production line. The first conveyor belt and the second conveyor belt are arranged at intervals along the first direction of the production line, and the third conveyor belt is arranged at intervals along the second direction of the production line on one side of the connection line between the first conveyor belt and the second conveyor belt, that is, a part of the conveying module is offset, and at the same time the testing module is arranged in the accommodating space formed by the offset of a part of the conveying module, which can effectively shorten the length of the production line and make the production line more compact. When installing this production line in the production workshop, since the length of the production line is reduced, the length of the production workshop accommodating this production line will inevitably be reduced, that is to say, by using this production line, the space of the production workshop can be utilized more effectively, reducing the waste of space in the production workshop. This production line is applied to the technical field of solar cell production. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on the structures shown in these drawings.

[0022] Figure 1 It is a schematic structural diagram of the production line in the embodiment provided by the present utility model;

[0023] Figure 2 It is Figure 1 an enlarged view of part A;

[0024] Figure 3 It is Figure 1 an enlarged view of part B;

[0025] Figure 4The top view of the production line in the embodiment provided by the present utility model;

[0026] Figure 5 is Figure 4 an enlarged view of part C of

[0027] Figure 6 the structural schematic diagram of the conveying unit in the embodiment provided by the present utility model.

[0028] Explanation of the reference numerals in the drawings:

[0029] 100, conveying module; 110, first conveyor belt; 111, conveying unit; 1111, bracket; 1112, roller; 1113, conveyor belt; 1114, driving body; 120, second conveyor belt; 130, third conveyor belt; 140, accommodating space; 200, testing module; 210, turntable; 211, transfer station; 212, positioning station; 213, first testing station; 214, second testing station; 220, bearing plate; 230, first testing component; 231, base; 232, conductive block; 2321, conductive probe; 233, driving unit; 240, second testing component; 300, first transfer module; 310, first cantilever; 320, first adsorbing component; 321, adsorbing block; 322, mounting plate; 400, second transfer module; 410, second cantilever; 420, second adsorbing component; 500, laser processing module; 510, mounting frame; 520, laser head.

[0030] The realization, functional features and advantages of the object of the present utility model will be further described with reference to the embodiments and the accompanying drawings. Specific embodiments

[0031] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described with reference to the drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0032] It should be noted that all the directional indications (such as up, down, left, right, front, back,...) in the embodiments of the present utility model are only used to explain the relative positional relationship and movement conditions between components in a specific posture (as shown in the drawings). If the specific posture changes, the directional indications will also change accordingly.

[0033] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present utility model, such descriptions of "first", "second", etc. are only for descriptive purposes and should not be construed as indicating or implying their relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first", "second" may explicitly or implicitly include at least one such feature. In addition, if "and / or" or "and / or" appears throughout the text, its meaning includes three parallel scenarios. Taking "A and / or B" as an example, it includes scenario A, or scenario B, or the scenario where both A and B are satisfied simultaneously.

[0034] In addition, the technical solutions between the various embodiments of the present utility model can be combined with each other, but it must be based on the ability of those of ordinary skill in the art to implement. When the combination of technical solutions results in contradictions or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present utility model.

[0035] In the existing production line for manufacturing solar cells, its loading station, testing station, laser processing station, and unloading station are arranged on the same straight line. This will increase the length of the production line, thereby causing waste of space in the production workshop. Specifically, in order to accommodate a production line with a greater length, it is inevitable to require a production workshop with a greater length. However, merely choosing a production workshop with a greater length to adapt to the length of the production line will inevitably lead to the ineffective utilization of the component space in the production workshop, thereby causing waste of space in the production workshop. Moreover, arranging the loading station, testing station, laser processing station, and unloading station on the same straight line will also cause the processes of wafer loading, testing, laser processing, and unloading to all require waiting, which will prolong the production time of the wafers and affect production efficiency.

[0036] The present utility model provides a production line, aiming to solve the technical problem that the existing production line for manufacturing solar cells causes serious waste of space in the production workshop due to its large length.

[0037] Please refer to Figure 1 、 Figure 4, in an embodiment of the present utility model, the production line includes a conveying module 100, a testing module 200, a first transfer module 300 and a second transfer module 400. The conveying module 100 includes a first conveyor belt 110, a second conveyor belt 120 and a third conveyor belt 130. The first conveyor belt 110 and the second conveyor belt 120 are arranged at intervals along the first direction of the production line. The third conveyor belt 130 is arranged at intervals with the first conveyor belt 110 along the second direction of the production line, and the third conveyor belt 130, the first conveyor belt 110 and the second conveyor belt 120 enclose a receiving space 140. The testing module 200 is arranged in the receiving space 140 and is used to test the electrical properties of the silicon wafers. The first transfer module 300 can transfer the silicon wafers on the first conveyor belt 110 to the testing module 200, and at the same time transfer the silicon wafers tested by the testing module 200 to the third conveyor belt 130. The second transfer module 400 can transfer the silicon wafers on the third conveyor belt 130 to the second conveyor belt 120. Wherein, the first direction is the direction indicated by X in Figure 1 , and the second direction is the direction indicated by Y in Figure 1 . In a specific embodiment, the first direction is the length direction of the production line, and the second direction is the width direction of the production line.

[0038] The technical solution of the present utility model can shorten the length of the production line and thus reduce the waste of space in the production workshop by offsetting a part of the conveying module 100 and arranging the testing module 200 in the accommodation space 140 formed by the conveying module 100. In this embodiment, the first conveyor belt 110 is used for loading silicon wafers, the second conveyor belt 120 is used for unloading silicon wafers, the third conveyor belt 130 is used for transferring silicon wafers, and the testing module 200 is used for testing the performance of silicon wafers. The first transfer module 300 can transfer the silicon wafers on the first conveyor belt 110 to the testing module 200 and at the same time transfer the silicon wafers tested by the testing module 200 to the third conveyor belt 130, that is, the process of transferring untested silicon wafers to the testing module 200 and the process of transferring the tested silicon wafers to the third conveyor belt 130 can be carried out simultaneously, which can improve the production efficiency of the production line. The first conveyor belt 110 and the second conveyor belt 120 are arranged at intervals along the first direction of the production line, and the third conveyor belt 130 is arranged at intervals along the second direction of the production line on one side of the connection line between the first conveyor belt 110 and the second conveyor belt 120, that is, a part of the conveying module 100 is offset, and at the same time the testing module 200 is arranged in the accommodation space 140 formed by the offset of a part of the conveying module 100, which can effectively shorten the length of the production line and make the production line more compact. When installing this production line in the production workshop, since the length of the production line is reduced, the length of the production workshop accommodating this production line will inevitably also be reduced. That is to say, by using this production line, the space of the production workshop can be utilized more effectively, and the waste of space in the production workshop can be reduced. This production line is applied to the technical field of solar cell production.

[0039] Please refer to Figure 2 , Figure 5, in an embodiment of the present utility model, the first transfer module 300 includes a first driving member disposed between the first conveyor belt 110 and the third conveyor belt 130, two first cantilevers 310 cross - arranged on the first driving member, and two first suction members 320 respectively arranged on the two first cantilevers 310. Both of the two first suction members 320 are used for adsorbing silicon wafers. Specifically, the first driving member can drive the two first cantilevers 310 to rotate simultaneously, so as to transfer the untested silicon wafers on the first conveyor belt 110 to the test module 200, and at the same time transfer the silicon wafers tested by the test module 200 to the third conveyor belt 130. The second transfer module 400 includes a second driving member disposed between the second conveyor belt 120 and the third conveyor belt 130, two second cantilevers 410 oppositely arranged on the second driving member, and two second suction members 420 respectively arranged on the two second cantilevers 410. Both of the two second suction members 420 are used for adsorbing silicon wafers. Specifically, the second driving member can drive the two second cantilevers 410 to rotate simultaneously, so as to transfer the silicon wafers on the third conveyor belt 130 to the second conveyor belt 120. In another specific embodiment, the number of the first cantilevers 310 of the first transfer module 300 can also be four, and the four first cantilevers 310 are evenly spaced along the circumferential direction of the first driving member. Further, to simplify the structure of the second transfer module 400, the two second cantilevers 410 can be combined into one, and its middle part is connected to the second driving member.

[0040] Correspondingly, to meet the requirement of simultaneously transporting two silicon wafers, the number of the first conveyor belt 110, the second conveyor belt 120, and the third conveyor belt 130 is two each, and the two first conveyor belts 110, the two second conveyor belts 120, and the two third conveyor belts 130 are spaced along the second direction of the production line.

[0041] Please refer to Figure 2 , Figure 5 , in an embodiment of the present utility model, both the first suction member 320 and the second suction member 420 include two adsorption blocks 321, and the two adsorption blocks 321 are arranged at intervals. In this embodiment, both of the two adsorption blocks 321 are mounted on the corresponding cantilever through a mounting plate 322. The number of the adsorption blocks 321 is set to two, that is to say, each cantilever can simultaneously transfer two silicon wafers each time the transfer module transfers silicon wafers, which can improve the production efficiency of this production line.

[0042] Please refer to Figure 5, in an embodiment of the present utility model, the two first cantilevers 310 are perpendicular to each other. In this embodiment, the first transfer module 300 is disposed at the intersection of the first conveyor belt 110, the third conveyor belt 130, and the test module 200, that is, the distances from the first transfer module 300 to the first conveyor belt 110, the third conveyor belt 130, and the test module 200 are equal. By setting the two first cantilevers 310 to be perpendicular to each other, when one of the first cantilevers 310 transfers the silicon wafer on the first conveyor belt 110 to the test module 200, the other first cantilever 310 can just transfer the silicon wafer at the test module 200 to the third conveyor belt 130. That is, setting the two first cantilevers 310 to be perpendicular to each other can ensure the synchronization of transferring the silicon wafer on the first conveyor belt 110 to the test module 200 and transferring the silicon wafer at the test module 200 to the third conveyor belt 130.

[0043] Please refer to Figure 3, in an embodiment of the present utility model, the test module 200 includes a turntable 210, a first test component 230, a second test component 240, and four carrier plates 220 arranged in a rectangle on the turntable 210. The turntable 210 is sequentially provided with a transfer station 211, a positioning station 212, a first test station 213, and a second test station 214 around its circumference. The four carrier plates 220 are correspondingly arranged at the transfer station 211, the positioning station 212, the first test station 213, and the second test station 214, and each carrier plate 220 can be switched between the transfer station 211, the positioning station 212, the first test station 213, and the second test station 214; the first test component 230 is arranged on one side of the first test station 213, and the second test component 240 is arranged on one side of the second test station 214. In this embodiment, the first test component 230 is used to test the electrical properties of the silicon wafer at the first test station 213, and the second test component 240 is used to test the electrical properties of the silicon wafer at the second test station 214. The test module 200 further includes a driving motor for driving the turntable 210 to rotate. By driving the turntable 210 to rotate, the four carrier plates 220 can be respectively located at the transfer station 211, the positioning station 212, the first test station 213, and the second test station 214. At the same time, by cooperating the test module 200 with the first transfer module 300, the transfer process and the test process of the silicon wafer can be carried out simultaneously, improving the production efficiency of the production line. Specifically, the cooperation between the test module 200 and the first transfer module 300 is that when the first test component 230 tests the electrical properties of the silicon wafer at the first test station 213 and the second test component 240 tests the electrical properties of the silicon wafer at the second test station 214, the first transfer module 300 transfers the tested silicon wafer at the transfer station 211 to the third conveyor belt 130, and at the same time transfers the silicon wafer on the first conveyor belt 110 to the transfer station 211. In a specific embodiment, a positioning module is arranged above the positioning station 212. The positioning module includes two first clamping blocks that can move in the direction of approaching or separating from each other and two second clamping blocks that can move in the direction of approaching or separating from each other. By clamping the silicon wafer in the first direction and the second direction with the two first clamping blocks and the two second clamping blocks, the silicon wafer can be positioned, thereby ensuring the accurate position of the silicon wafer during testing.

[0044] Please refer to Figure 3 , in an embodiment of the present utility model, both the first test component 230 and the second test component 240 include a base 231, a conductive block 232 slidably arranged on the base 231 along the third direction of the production line, and a driving unit 233. The driving unit 233 can drive the conductive block 232 to slide along the third direction of the production line. Among them, the third direction refers to Figure 3The direction indicated by Z herein. In a specific embodiment, the third direction is the vertical direction. Specifically, controlling the driving unit 233 to drive the conductive block 232 to move downward can make the conductive block 232 contact the silicon wafer, thereby realizing the connection between the conductive block 232 and the silicon wafer; controlling the driving unit 233 to drive the conductive block 232 to move upward can separate the conductive block 232 from the silicon wafer, thereby disconnecting the conductive block 232 and the silicon wafer.

[0045] Please refer to Figure 3 In an embodiment of the present invention, each conductive block 232 is provided with a plurality of conductive probes 2321. The plurality of conductive probes 2321 of the first test component 230 are arranged at intervals along the first direction of the production line, and the plurality of conductive probes 2321 of the second test component 240 are arranged at intervals along the second direction of the production line. Specifically, the first test component 230 is connected to a part of the conductive heads on the silicon wafer through the conductive probes 2321 on its conductive block 232, thereby testing the electrical properties of a part of the conductive heads on the silicon wafer; the second test component 240 is connected to another part of the conductive heads on the silicon wafer through the conductive probes 2321 on its conductive block 232, thereby testing the electrical properties of another part of the conductive heads on the silicon wafer.

[0046] Please refer to Figure 6 In an embodiment of the present invention, the first conveyor belt 110, the second conveyor belt 120, and the third conveyor belt 130 all include a conveying unit 111. The conveying unit 111 includes a bracket 1111, rollers 1112 rotatably arranged on the bracket 1111, a conveyor belt 1113 connecting the two rollers 1112, and a driving body 1114 arranged on the bracket 1111. The driving body 1114 drives the rollers 1112 to rotate through a timing belt. Specifically, by driving the rollers 1112 to rotate through the driving body 1114, the conveyor belt 1113 can be driven to move, so as to realize the conveying of the silicon wafers on the conveyor belt 1113. In a specific embodiment, the number of conveyor belts 1113 is two. The two conveyor belts 1113 are respectively used to support both sides of the silicon wafer, and each conveyor belt 1113 is correspondingly provided with two rollers 1112. A connecting rod is connected between the two rollers 1112 arranged at intervals along the second direction. A driven wheel is sleeved on the connecting rod, and a driving wheel is arranged at the output end of the driving body 1114. The driving wheel is connected to the driven wheel through a timing belt.

[0047] Please refer to Figure 1, in an embodiment of the present utility model, the production line further includes a laser processing module 500. The laser processing module 500 includes a mounting frame 510 and a laser head 520 disposed on the mounting frame 510. The third conveyor belt 130 passes through the mounting frame 510. Specifically, the laser head 520 is used to emit a laser beam, and the laser beam emitted by the laser head 520 can irradiate the silicon wafer on the third conveyor belt 130 to perform laser processing on the silicon wafer on the third conveyor belt 130. The laser processing module 500 is disposed on the third conveyor belt 130, and the testing module 200 is disposed in the accommodating space 140 formed by the conveying module 100, which can enable the testing and laser processing of the silicon wafer to be carried out simultaneously, thereby improving the production efficiency of the production line.

[0048] The above are only exemplary embodiments of the present utility model, and do not limit the patent scope of the present utility model. Any equivalent structural transformation made under the technical concept of the present utility model by using the content of the specification and drawings of the present utility model, or any direct / indirect application in other related technical fields is included in the patent protection scope of the present utility model.

Claims

1. A production line, characterized in that: include: A conveying module, the conveying module comprising a first conveyor belt, a second conveyor belt and a third conveyor belt, the first conveyor belt and the second conveyor belt are arranged at intervals along a first direction of the production line, the third conveyor belt is arranged at intervals from the first conveyor belt along a second direction of the production line, and the third conveyor belt, the first conveyor belt and the second conveyor belt are arranged to form an accommodation space; A test module, which is disposed in the accommodation space and is used to test the electrical properties of the silicon wafer; A first transfer module, which can transfer the silicon wafers on the first conveyor belt to the test module, and at the same time transfer the silicon wafers tested by the test module to the third conveyor belt; The second transfer module can transfer the silicon wafers on the third conveyor belt to the second conveyor belt.

2. The production line according to claim 1, characterized in that: The first transfer module includes a first driving member disposed between the first conveyor belt and the third conveyor belt, two first cantilevers cross-disposed on the first driving member, and two first adsorbing members disposed on the two first cantilevers in a one-to-one correspondence, and the two first adsorbing members are used to adsorb silicon wafers; The second transfer module includes a second driving member arranged between the second conveyor belt and the third conveyor belt, two second cantilevers arranged relatively to the second driving member, and two second adsorption members arranged one by one on the two second cantilevers, and the two second adsorption members are both used for adsorbing silicon wafers.

3. The production line according to claim 2, characterized in that: The first adsorption member and the second adsorption member each include two adsorption blocks, and the two adsorption blocks are arranged at intervals.

4. The production line according to claim 2, characterized in that: The two first cantilevers are perpendicular to each other.

5. The production line according to claim 1, characterized in that: The test module includes a turntable, a first test component, a second test component and four rectangular supporting plates arranged on the turntable. The turntable is provided with a transfer station, a positioning station, a first test station and a second test station in sequence around its circumference. The four supporting plates are arranged at the transfer station, the positioning station, the first test station and the second test station in a one-to-one correspondence, and each of the supporting plates can be switched between the transfer station, the positioning station, the first test station and the second test station; the first test component is arranged at one side of the first test station, and the second test component is arranged at one side of the second test station.

6. The production line according to claim 1, characterized in that: The first test assembly and the second test assembly each include a base, a conductive block slidably disposed on the base along a third direction of the production line, and a driving unit, wherein the driving unit can drive the conductive block to slide along the third direction of the production line.

7. The production line according to claim 6, characterized in that: Each of the conductive blocks is provided with a plurality of conductive probes. The plurality of conductive probes of the first test assembly are arranged at intervals along a first direction of the production line, and the plurality of conductive probes of the second test assembly are arranged at intervals along a second direction of the production line.

8. The production line according to claim 2, characterized in that: The number of the first conveyor belt, the second conveyor belt and the third conveyor belt are all two, and the two first conveyor belts, the two second conveyor belts and the two third conveyor belts are arranged at intervals along the second direction of the production line.

9. The production line according to any one of claims 1 to 8, characterized in that The first conveyor belt, the second conveyor belt and the third conveyor belt all include a conveying unit, and the conveying unit includes a bracket, a roller rotatably arranged on the bracket, a conveyor belt connecting two rollers, and a driving body arranged on the bracket, and the driving body drives the rollers to rotate through a synchronous belt.

10. The production line according to any one of claims 1 to 8, characterized in that The production line also includes a laser processing module, which includes a mounting frame and a laser head arranged on the mounting frame, and the third conveyor belt is passed through the mounting frame.