Testing device for improving coaxial ripple noise

Abstract

The utility model discloses a testing device for improving coaxial ripple noise, which comprises a first probe and a second probe, a first end of the first probe is connected with a central conductor of a coaxial line, a first end of the second probe is connected with an outer conductor of the coaxial line, and a second end of the second probe is connected with an inner conductor of the coaxial line. The first end of the first probe and the first end of the second probe are connected with the two ends of the spring respectively, the first probe and the second probe intersect to form a fulcrum, and the fulcrum is used for adjusting the distance between the second end of the first probe and the second end of the second probe when the spring is pressed. According to the utility model, by pressing the spring, the opening angle of the test end of the probe can be flexibly adjusted, so as to adapt to the measurement of electronic devices with different packaging modes. The problems that in the prior art, when a coaxial probe is used for testing ripple noise of different packaging capacitors, the probe needs to be manually bent frequently, and a pin header is prone to being broken are solved.

Description

Technical Field

[0001] The utility model relates to the technical field of testing devices, in particular to a testing device for improving coaxial ripple noise. Background Art

[0002] DC power supply is generally formed by AC power supply through rectification and voltage stabilization. The AC component in the process cannot be completely filtered out and thus attached to the stable DC power supply to form power ripple. Excessive ripple will reduce the efficiency of the power supply, interfere with the logical relationship of the digital circuit and affect its normal operation, generate surge voltage or current and burn electrical appliances, etc. Noise, as a kind of electromagnetic interference, is equally important to the circuit. As important parameters for measuring circuits, their measurement plays an extremely important role in the debugging of electronic products. Among the existing test probes, passive probes and coaxial probes are more common. Passive probes are easy to pick up passing interference signals because they have a long ground wire and are not shielded. At the same time, their own frequency is high and the ripple noise frequency is low, so the data measured by the passive probe has a large error. After comprehensive comparison, the coaxial probe has become the most reliable and economical test probe. The probes of existing coaxial probes are generally welded with pin headers. Since the tested capacitors have various packages and different test spacings, they need to be frequently bent manually during testing to adapt to capacitors with different packages such as 0201, 0402, and 0603. The pin headers have high hardness and low toughness, making them difficult to bend and easy to break, which brings great inconvenience to the testing work, resulting in low testing efficiency and a high frequency of probe necrosis. In addition, the pin headers have a large diameter and are very easy to accidentally touch when the devices in the tested area are compactly laid out, causing short circuits and damaging the board. Utility Model Content

[0003] The utility model aims to provide a testing device for improving coaxial ripple noise, which is used to solve the problem that the pins of the coaxial probe in the prior art are difficult to bend and easy to break, and cannot meet the test requirements of devices with different packaging methods.

[0004] The utility model solves the above problems through the following technical solutions:

[0005] A testing device for improving coaxial ripple noise comprises a first probe and a second probe, wherein the first end of the first probe is connected to the central conductor of the coaxial line, the first end of the second probe is connected to the outer conductor of the coaxial line, the first end of the first probe and the first end of the second probe are respectively connected to two ends of a spring, the first probe and the second probe are crossed to form a fulcrum, and the fulcrum is used to adjust the distance between the second end of the first probe and the second end of the second probe when the spring is pressed.

[0006] The utility model can flexibly adjust the opening angle of the test end of the probe by pressing the spring, so as to adapt to the measurement of electronic devices with different packaging methods. It solves the problem that in the prior art, the coaxial probe needs to manually bend the probe frequently when testing the ripple noise of capacitors with different packages, and it is easy to cause the pin to break.

[0007] Further, the second ends of the first probe and the second probe extend out of the outer jacket of the coaxial cable, and the fulcrum, the first end of the first probe and the first end of the second probe are placed inside the outer jacket of the coaxial cable.

[0008] Further, both ends of the spring are fixed to the first end of the first probe and the first end of the second probe by hot melt adhesive respectively.

[0009] Further, the first probe and the second probe are cross-connected by a knob to form a fulcrum.

[0010] Further, an isolation capacitor is arranged near the fulcrum, and both ends of the isolation capacitor are connected to the first probe and the second probe respectively.

[0011] Compared with the prior art, the utility model has the following advantages and beneficial effects:

[0012] (1) The utility model can flexibly adjust the opening angle of the test end of the probe by pressing the spring, so as to adapt to the measurement of electronic devices with different packaging methods.

[0013] (2) The utility model solves the problem that the coaxial probe needs to manually bend the probe frequently when testing the ripple noise of capacitors with different packages, improves the test efficiency, ensures the stability of the test probe, and thus improves the accuracy of the test data.

[0014] (3) The utility model can make the opening angle of the test end meet the tests of different packaged devices by selecting different springs and the installation positions of the springs.

[0015] (4) The utility model solves the problem of single-board failure caused by accidental touch during the test when the 0201 packaged device has a compact layout.

[0016] (5) By applying a small force at the installation position of the micro spring through the lever principle, a large displacement of the test end is achieved. It avoids the trouble of repeatedly bending the probe during the test, can be easily switched among different packaged capacitors, and achieves the effect of saving time and effort and improving the test efficiency.

[0017] (6) A micro spring is installed above the fulcrum to make it automatically open after the current test is completed. It avoids manually bending to adapt to capacitors with larger or smaller packages, omits this link in the current probe use process, and improves the test efficiency. Description of the Drawings

[0018] Figure 1 Schematic diagram of the overall structure of the present utility model;

[0019] Figure 2 Enlarged schematic diagram of the present utility model;

[0020] Wherein, 1 - coaxial line; 2 - first probe; 3 - second probe; 4 - fulcrum; 5 - spring. Specific embodiments

[0021] The present utility model will be further described in detail below in conjunction with embodiments, but the embodiments of the present utility model are not limited thereto.

[0022] Embodiment:

[0023] Combined with the attached Figure 1 and Figure 2 As shown, a test device for improving coaxial ripple noise includes a first probe 2 and a second probe 3. The first end of the first probe 2 is connected to the center conductor of the coaxial line 1, and the first end of the second probe 3 is connected to the outer conductor of the coaxial line 1. The first ends of the first probe 2 and the second probe 3 are respectively connected to both ends of the spring 5. The first probe 2 and the second probe 3 cross to form a fulcrum 4, and the fulcrum 4 is used to adjust the distance between the second end of the first probe 2 and the second end of the second probe 3 when pressing the spring 5.

[0024] By pressing the spring 5, the present utility model can flexibly adjust the opening angle of the test end of the probe to adapt to the measurement of electronic devices with different packaging methods. It solves the problem that in the prior art, coaxial probes need to frequently manually bend the probes when testing the ripple noise of different packaged capacitors, and it is easy to cause the breakage of the pin array.

[0025] Furthermore, the second ends of the first probe 2 and the second probe 3 extend out of the jacket of the coaxial line 1, and the fulcrum 4, the first end of the first probe 2, and the first end of the second probe 3 are placed inside the jacket of the coaxial line 1.

[0026] Furthermore, both ends of the spring 5 are respectively fixed to the first end of the first probe 2 and the first end of the second probe 3 by hot melt adhesive.

[0027] Furthermore, the first probe 2 and the second probe 3 cross and are connected by a knob to form a fulcrum 4.

[0028] Furthermore, an isolation capacitor is arranged near the fulcrum 4, and both ends of the isolation capacitor are respectively connected to the first probe 2 and the second probe 3.

[0029] The structure of the coaxial cable from the inside out is: central conductor - insulating layer - outer conductor - outer sheath. The central conductor of the coaxial cable is led out through the first probe 2 as the signal pin of the probe head, and the outer conductor is led out through the second probe 3 as the grounding pin of the probe head. The two probes are crossed and connected through a knob to form a fulcrum 4. Above the fulcrum 4, the micro spring 5 is fixed on the two probes of the probe head with hot melt adhesive. Under the tension of the spring 5, the probes are in an open state when not in use. During the test, the opening distance of the probes can be adjusted arbitrarily by gently pressing both ends of the spring according to the actual capacitance to be measured. (The size of the spring 5 determines the opening distance of the probes, and the size of the spring 5 is selected according to the maximum package capacitance to be covered in the test.) After the test is completed, releasing the probes can restore them, so as to easily switch back and forth between capacitors with different packages.

[0030] Although the present invention has been described herein with reference to its illustrative embodiments, the above embodiments are only the preferred embodiments of the present invention. The embodiments of the present invention are not limited by the above embodiments. It should be understood that those skilled in the art can design many other modifications and embodiments, which will fall within the scope and spirit of the principles disclosed in this application.

Claims

1. A test device for improving coaxial ripple noise, characterized in that: The invention comprises a first probe and a second probe, wherein the first end of the first probe is connected to the central conductor of the coaxial line, the first end of the second probe is connected to the outer conductor of the coaxial line, the first end of the first probe and the first end of the second probe are respectively connected to two ends of a spring, the first probe and the second probe are crossed to form a fulcrum, and the fulcrum is used to adjust the distance between the second end of the first probe and the second end of the second probe when the spring is pressed.

2. A test device for improving coaxial ripple noise according to claim 1, characterized in that: The second end of the first probe and the second end of the second probe extend out of the outer sheath of the coaxial line, and the fulcrum, the first end of the first probe and the first end of the second probe are placed in the outer sheath of the coaxial line.

3. A testing device for improving coaxial ripple noise according to claim 1, characterized in that: Two ends of the spring are respectively fixed to the first end of the first probe and the first end of the second probe by hot melt adhesive.

4. The testing device for improving coaxial ripple noise according to claim 1, characterized in that: The first probe and the second probe are crossed and connected by a knob to form a fulcrum.

5. The testing device for improving coaxial ripple noise according to claim 1, characterized in that: An isolation capacitor is arranged near the supporting point, and two ends of the isolation capacitor are connected to the first probe and the second probe respectively.

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