Testing mechanism of chip testing equipment

Abstract

The utility model relates to the technical field of chip testing, in particular to a testing mechanism of chip testing equipment, which comprises a bottom plate. A test plate is arranged at the top of the bottom plate; the test board is provided with a plurality of test seats; the test seat is provided with a mounting seat; a movable seat is movably arranged at the top of the mounting seat in a lifting manner; a test groove is formed in the middle of the mounting seat; the movable seat is provided with a test opening; the mounting seat is provided with pressing blocks on two sides of the test groove in an overturning manner; a pressing plate is movably arranged at the top of the movable seat in a lifting manner; a plurality of through holes are formed in the pressing plate in a penetrating manner; and the through hole corresponds to the test opening. According to the utility model, the plurality of test seats are arranged, each test seat can test a chip, and all the pressing blocks can be controlled to turn over simultaneously by controlling the lifting of the pressing plate, so that the chip can be conveniently placed in the test groove and pressed in the test groove, and a plurality of chips can be tested simultaneously; and the working efficiency is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, and particularly relates to a testing mechanism of a chip testing device. Background Art

[0002] In the semiconductor industry, chip testing is one of the key steps to ensure product quality. During the chip testing process, it is usually necessary to take the chip out of the tray and place it into the testing mechanism for detection. However, most of the current chip testing devices can only test a small number of chips at a time.

[0003] Since the testing mode of a small number of chips results in a slow testing speed, especially when a large number of chips need to be processed, the overall testing time is significantly prolonged. Summary of the Utility Model

[0004] The purpose of the utility model is to provide a testing mechanism of a chip testing device for the above deficiencies in the prior art.

[0005] The purpose of the utility model is achieved through the following technical solutions: a testing mechanism of a chip testing device, including a bottom plate; a testing plate is provided on the top of the bottom plate; the testing plate is provided with a plurality of testing seats;

[0006] The testing seat is provided with a mounting seat; a movable seat is arranged on the top of the mounting seat in a lifting and movable manner; a testing slot is arranged in the middle of the mounting seat; the movable seat is provided with a testing opening; the testing slot is exposed at the testing opening; pressing blocks are arranged on both sides of the testing slot of the mounting seat in a flipping manner; the movable seat is used for driving the pressing blocks to flip;

[0007] A pressing plate is arranged on the top of the movable seat in a lifting and movable manner; a plurality of through holes are arranged through the pressing plate; the through holes are arranged corresponding to the testing opening.

[0008] The utility model is further arranged such that the testing plate is detachably connected to the bottom plate.

[0009] The utility model is further arranged such that a connecting seat is provided at the bottom of the bottom plate; a linkage seat is arranged on the connecting seat in a lifting and movable manner; a linkage rod is connected between the linkage seat and the pressing plate; a guiding sleeve is provided on the bottom plate; the linkage rod is slidably arranged in the guiding sleeve.

[0010] The utility model is further arranged such that the connecting seat is provided with a linkage motor; a linkage lead screw is provided at the output end of the linkage motor; a linkage nut is sleeved on the linkage lead screw; the linkage nut is connected to the linkage seat.

[0011] The utility model is further arranged such that a reset spring is provided between the mounting seat and the movable seat.

[0012] The present utility model is further configured such that the mounting base is provided with a guiding groove; the movable base is provided with a guiding block that cooperates with the guiding groove.

[0013] The present utility model is further configured such that one end of the pressing block is provided with a control portion; the other end of the pressing block is provided with a pressing portion; the middle of the pressing block is provided with a positioning portion;

[0014] The positioning portion is hinged to the mounting base; the pressing portion protrudes into the testing groove; the control portion is provided with a strip-shaped groove; the movable base is provided with a hinge block; the hinge block is movably hinged to the strip-shaped groove.

[0015] The present utility model is further configured such that the testing groove is provided with a plurality of probes electrically connected to the testing base.

[0016] Advantages of the present utility model: By providing a plurality of testing bases, each testing base can test the chip, and by controlling the lifting of the pressing plate, all the pressing blocks can be controlled to flip simultaneously, facilitating placing the chip in the testing groove and pressing the chip tightly in the testing groove, so that multiple chips can be tested simultaneously, greatly improving the working efficiency. Description of the Drawings

[0017] The utility model will be further described with reference to the accompanying drawings. However, the embodiments in the drawings do not constitute any limitation to the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained according to the following drawings.

[0018] Figure 1 is a schematic structural diagram of the present utility model;

[0019] Figure 2 is a schematic structural diagram of another perspective of the present utility model;

[0020] Figure 3 is a schematic structural diagram of the test board of the present utility model;

[0021] Figure 4 is a schematic structural diagram of the test base of the present utility model;

[0022] Figure 5 is a schematic structural diagram of another perspective of the test base of the present utility model;

[0023] Figure 6 is a schematic structural diagram of the pressing block of the present utility model;

[0024] Wherein: 1. Base plate; 11. Guide sleeve; 2. Test plate; 21. Test seat; 3. Mounting seat; 31. Test slot; 32. Probe; 33. Guide slot; 4. Movable seat; 41. Test opening; 42. Guide block; 43. Hinge block; 5. Pressing block; 51. Control part; 52. Pressing part; 53. Positioning part; 54. Strip groove; 6. Pressing plate; 61. Perforation; 7. Connecting seat; 71. Linking seat; 72. Linking rod; 73. Linking motor; 74. Linking lead screw; 75. Linking nut; 8. Return spring. Specific embodiments

[0025] The present utility model will be further described in conjunction with the following embodiments.

[0026] It can be seen from Figures 1 to 6 that the test mechanism of a chip testing device described in this embodiment includes a base plate 1; a test plate 2 is provided on the top of the base plate 1; a plurality of test seats 21 are provided on the test plate 2;

[0027] The test seat 21 is provided with a mounting seat 3; a movable seat 4 is provided on the top of the mounting seat 3 in a lifting and movable manner; a test slot 31 is provided in the middle of the mounting seat 3; the movable seat 4 is provided with a test opening 41; the test slot 31 is exposed in the test opening 41; pressing blocks 5 are provided on both sides of the test slot 31 of the mounting seat 3 in a flipping manner; the movable seat 4 is used to drive the pressing blocks 5 to flip;

[0028] A pressing plate 6 is provided on the top of the movable seat 4 in a lifting and movable manner; a plurality of perforations 61 are provided through the pressing plate 6; the perforations 61 are arranged corresponding to the test openings 41.

[0029] Specifically, when the test mechanism of the chip testing device described in this embodiment is in use, first drive the pressing plate 6 to descend, the pressing plate 6 presses all the movable seats 4, so that all the movable seats 4 descend. During the descending process of the movable seats 4, the pressing blocks 5 are flipped upwards, so that the perforations 61, the test openings 41 and the test slots 31 are communicated. At this time, the test chips are sequentially placed in each test slot 31 through the perforations 61 and the test openings 41 by an external manipulator; then drive the pressing plate 6 to ascend, so that the movable seats 4 are reset, and thus the pressing blocks 5 are flipped downwards, so that the pressing blocks 5 press the test chips tightly in the test slots 31, and then all the chips are tested simultaneously.

[0030] In this embodiment, by providing a plurality of test seats 21, each test seat 21 can test the chips, and by controlling the lifting of the pressing plate 6, it is possible to control all the pressing blocks 5 to flip simultaneously, which is convenient for placing the chips in the test slots 31 and pressing the chips tightly in the test slots 31, so that multiple chips can be tested simultaneously, greatly improving the working efficiency.

[0031] The testing mechanism of a chip testing device according to this embodiment, the testing board 2 is detachably connected to the bottom board 1. Through the above setting, it is convenient to replace different testing boards 2.

[0032] The testing mechanism of a chip testing device according to this embodiment, a connecting seat 7 is provided at the bottom of the bottom board 1; a linkage seat 71 is arranged on the connecting seat 7 in a lifting and moving manner; a linkage rod 72 is connected between the linkage seat 71 and the pressing plate 6; a guide sleeve 11 is provided on the bottom board 1; the linkage rod 72 is slidably arranged in the guide sleeve 11. The testing mechanism of a chip testing device according to this embodiment, the connecting seat 7 is provided with a linkage motor 73; a linkage lead screw 74 is provided at the output end of the linkage motor 73; a linkage nut 75 is sleeved on the linkage lead screw 74; the linkage nut 75 is connected to the linkage seat 71.

[0033] Specifically, by starting the linkage motor 73; the linkage motor 73 drives the linkage lead screw 74 to rotate, under the action of the linkage nut 75, the linkage seat 71 and the pressing plate 6 can be lifted and lowered under the guidance of the guide sleeve 11 and the linkage rod 72.

[0034] The testing mechanism of a chip testing device according to this embodiment, the mounting seat 3 is provided with a guide groove 33; the movable seat 4 is provided with a guide block 42 that cooperates with the guide groove 33. Through the above setting, the lifting of the movable seat 4 can be guided.

[0035] The testing mechanism of a chip testing device according to this embodiment, a return spring 8 is provided between the mounting seat 3 and the movable seat 4. The testing mechanism of a chip testing device according to this embodiment, one end of the pressing block 5 is provided with a control part 51; the other end of the pressing block 5 is provided with a pressing part 52; a positioning part 53 is provided in the middle of the pressing block 5; the positioning part 53 is hinged to the mounting seat 3; the pressing part 52 protrudes into the testing groove 31; the control part 51 is provided with a strip-shaped groove 54; the movable seat 4 is provided with a hinge block 43; the hinge block 43 is movably hinged to the strip-shaped groove 54.

[0036] Specifically, when in use, first drive the pressing plate 6 to descend, the pressing plate 6 presses all the movable seats 4, so that all the movable seats 4 descend. Since the hinge block 43 is movably hinged to the strip-shaped groove 54, during the descending process of the movable seat 4, the pressing part 52 flips upward, so that the pressing part 52 withdraws from the testing groove 31, thereby making the through hole 61, the testing opening 41 and the testing groove 31 communicate. At this time, the testing chips are sequentially placed in each testing groove 31 through the through hole 61 and the testing opening 41 by an external manipulator; then drive the pressing plate 6 to rise, and the movable seat 4 resets and rises under the action of reset, so that the pressing part 52 flips downward, so that the pressing part 52 presses the testing chips tightly in the testing groove 31, and then all the chips are tested simultaneously.

[0037] The testing mechanism of a chip testing device according to this embodiment, wherein the testing slot 31 is provided with a plurality of probes 32 electrically connected to the testing base 21. Through the above arrangement, when the pressing part 52 presses the chip tightly against the testing slot 31, the chip comes into contact with the probes 32, thereby testing the chip.

[0038] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than limiting the protection scope of the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be modified or equivalently replaced without departing from the essence and scope of the technical solutions of the present invention.

Claims

1. A testing mechanism for a chip testing device, characterized in that: It comprises a bottom plate; a test plate is provided on the top of the bottom plate; the test plate is provided with a plurality of test seats; The test seat is provided with a mounting seat; a movable seat is provided on the top of the mounting seat for lifting and lowering; a test slot is provided in the middle of the mounting seat; a test opening is provided on the movable seat; the test slot is exposed in the test opening; the mounting seat is provided with pressure blocks on both sides of the test slot for flipping; the movable seat is used to drive the pressure blocks to flip; A pressing plate is provided on the top of the movable seat for lifting and lowering; a plurality of through holes are penetrated through the pressing plate; and the through holes are arranged corresponding to the test openings.

2. The test mechanism of a chip test device according to claim 1, characterized in that: The test plate is detachably connected to the bottom plate.

3. The test mechanism of a chip test device according to claim 1, characterized in that: The bottom of the base plate is provided with a connecting seat; the connecting seat is provided with a linkage seat for lifting and lowering movement; a linkage rod is connected between the linkage seat and the pressure plate; the base plate is provided with a guide sleeve; the linkage rod is slidably arranged on the guide sleeve.

4. The test mechanism of a chip test device according to claim 3, characterized in that: The connecting seat is provided with a linkage motor; the output end of the linkage motor is provided with a linkage screw; the linkage screw sleeve is provided with a linkage nut; and the linkage nut is connected to the linkage seat.

5. The testing mechanism of a chip testing device according to claim 1, characterized in that: A return spring is arranged between the mounting seat and the movable seat.

6. The test mechanism of a chip test device according to claim 1, characterized in that: The mounting seat is provided with a guide groove; the movable seat is provided with a guide block matched with the guide groove.

7. The testing mechanism of a chip testing device according to claim 1, characterized in that: A control part is provided at one end of the pressing block; a pressing part is provided at the other end of the pressing block; and a positioning part is provided in the middle of the pressing block; The positioning part is hinged to the mounting seat; the pressing part protrudes into the test slot; the control part is provided with a strip slot; the movable seat is provided with an articulated block; the articulated block is movably hinged to the strip slot.

8. The test mechanism of a chip test device according to claim 7, characterized in that: The test slot is provided with a plurality of probes electrically connected to the test seat.

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