Test circuit board

By designing a test circuit board including processing module and power on-off control module, and automatically adjusting the startup mode and status of the electronic equipment, the problem of high labor consumption in the existing technology is solved, and intelligent upgrade and testing of electronic equipment is realized.

CN223078384UActive Publication Date: 2025-07-08BEIJING SEMIDRIVE TECHNOLOGY LTD
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Patent Information

Application Number
CN202421203398.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-05-29
Publication Date
2025-07-08
Estimated Expiration
2034-05-29

AI Technical Summary

Technical Problem

In the prior art, the dial switch and plug-in and unplug the power supply need to be manually adjusted during the upgrade and testing of electronic equipment, resulting in large labor consumption and not intelligent.

Method used

Design a test circuit board, including processing module, information receiving module, power on-off control module and connection module, and automatically adjust the start mode, power on, power off and system reset of the electronic device by sending external instructions to achieve automated upgrades and testing.

Benefits of technology

It realizes automated upgrades and testing of electronic devices, reduces manpower consumption, and supports remote upgrades and testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a test circuit board, which comprises a processing module, an information receiving module, a power supply on-off control module and a connection module, the control end of the power supply on-off control module is connected with the processing module, the input end is connected with an external power supply module, and the output end is connected with the power supply input end of the to-be-tested electronic equipment; the input end of the connection module is connected with the processing module, and the output end is connected with a mode configuration module of the to-be-tested electronic equipment; the output end of the information receiving module is connected with the processing module, and the information receiving module is used for receiving an external instruction and transmitting the external instruction to the processing module; the processing module is used for adjusting the state of the mode configuration module of the to-be-tested electronic equipment through the connection module based on an external instruction so as to adjust the mode of the to-be-tested electronic equipment; and the processing module is also used for controlling the power supply on-off control module to be switched on or switched off based on an external instruction so as to control the to-be-tested electronic equipment to be powered on, powered off or reset.
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Description

Technical Field

[0001] This application relates to the field of electronic devices, and particularly to a test circuit board. Background Art

[0002] During the process of upgrading and testing electronic devices, the start mode of the electronic device is usually changed by manually adjusting the DIP switch, and the electronic device is powered on and off and system reset by manually plugging and unplugging the power supply to achieve the upgrade and testing of the electronic device. However, this manual method is not intelligent and requires a lot of manpower. Summary of the Utility Model

[0003] In view of this, embodiments of this application provide a test circuit board to at least solve the above technical problems existing in the prior art.

[0004] Embodiments of this application provide a test circuit board, including:

[0005] A processing module, an information receiving module, a power on / off control module, and a connection module;

[0006] The control end of the power on / off control module is connected to the processing module, the input end is used to be connected to an external power module, and the output end is used to be connected to the power input end of the electronic device to be tested;

[0007] The input end of the connection module is connected to the processing module, and the output end is used to be connected to the mode configuration module of the electronic device to be tested;

[0008] The output end of the information receiving module is connected to the processing module, and is used to receive an external instruction and transmit the external instruction to the processing module;

[0009] The processing module is used to, based on the external instruction, adjust the state of the mode configuration module of the electronic device to be tested through the connection module so as to adjust the mode of the electronic device to be tested;

[0010] The processing module is further used to, based on the external instruction, control the power on / off control module to be turned on or off so as to control the power on, power off, or reset of the electronic device to be tested.

[0011] Optionally, the test circuit board further includes:

[0012] A current detection module, one end of which is connected to the output end of the power on / off control module and the other end is connected to the processing module, and is used to obtain the current at the output end of the power on / off control module and send it to the processing module;

[0013] The processing module is used to monitor the current, and when an abnormal current is detected, control the power on / off control module to be turned off.

[0014] Optionally, the test circuit board further includes:

[0015] A voltage conversion module, connected to the processing module, is used to connect to an external power supply module, convert the first voltage input by the external power supply module into a second voltage, and then supply power to the processing module.

[0016] Optionally, the test circuit board further includes:

[0017] A power on / off button, connected to the power on / off control module, is used to control whether the voltage output by the power on / off control module is output to the power input terminal of the electronic device under test, so as to control the power on and power off of the electronic device under test.

[0018] Optionally, the test circuit board further includes:

[0019] A reset button, connected to the processing module, is used to trigger the processing module to generate a reset instruction. Based on the reset instruction, control the power on / off control module to disconnect first and then turn on, so as to control the reset of the electronic device under test.

[0020] Optionally, the test circuit board further includes:

[0021] An upgrade button, connected to the processing module, is used to trigger the processing module to generate an upgrade instruction. Based on the upgrade instruction, adjust the state of the mode configuration module of the electronic device under test through the connection module, so that the electronic device under test enters the upgrade mode.

[0022] Optionally, the test circuit board further includes:

[0023] A DIP switch, connected to the processing module, is used to trigger the processing module to generate corresponding mode configuration instructions. Based on the mode configuration instructions, adjust the state of the mode configuration module of the electronic device under test through the connection module, so as to adjust the mode of the electronic device under test.

[0024] Optionally, the test circuit board further includes:

[0025] An indicator light, connected to the processing module, is used to prompt the working status information of the processing module.

[0026] Optionally, the test circuit board further includes:

[0027] A USB interface, connected to the processing module, is used to obtain program installation information and send the program installation information to the processing module.

[0028] Optionally, the test circuit board further includes:

[0029] An output module, connected to the processing module, is used to output the working log of the processing module.

[0030] The test circuit board provided by the embodiment of the present application can, after being connected to the electronic device to be tested, automatically change the startup mode of the electronic device and power on, power off, and perform system reset on the electronic device to be tested by sending an external instruction to the test circuit board. Thus, it can realize the automatic upgrade and test of the electronic device to be tested, solve the problem of non-intelligent upgrade and test of the electronic device to be tested, and since the upgrade and test of the electronic device to be tested are realized by sending an instruction to the test circuit board, it can realize the remote upgrade and test of the electronic device to be tested.

[0031] The above description is only an overview of the technical solution of the present application. In order to be able to understand the technical means of the present application more clearly, it can be implemented according to the content of the description. And in order to make the above and other purposes, features, and advantages of the present application more obvious and understandable, the specific embodiments of the present application are specifically exemplified below. Brief Description of the Drawings

[0032] Figure 1 It is a schematic structural diagram of a test circuit board in an embodiment of the present application;

[0033] Figure 2 It is a schematic structural diagram of another test circuit board in an embodiment of the present application. Detailed Embodiments

[0034] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those skilled in the art based on the embodiments of the present application without making creative efforts fall within the protection scope of the present application.

[0035] The embodiment of the present application provides a test circuit board, as Figure 1 shown, including:

[0036] A processing module 11, an information receiving module 12, a power on / off control module 13, and a connection module 14.

[0037] Among them, the control end of the power on / off control module 13 is connected to the processing module 11, the input end is used to be connected to an external power module, and the output end is used to be connected to the power input end of the electronic device to be tested.

[0038] The input end of the connection module 14 is connected to the processing module 11, and the output end is used to be connected to the mode configuration module of the electronic device to be tested.

[0039] The output end of the information receiving module 12 is connected to the processing module 11, and is used to receive an external instruction and transmit the external instruction to the processing module 11.

[0040] The processing module 11 is configured to, based on an external instruction, adjust the state of the mode configuration module of the electronic device under test through the connection module 14, so as to adjust the mode of the electronic device under test.

[0041] The processing module 11 is further configured to, based on an external instruction, control the power on / off control module 13 to turn on or off, so as to control power-on, power-off or reset of the electronic device under test.

[0042] In this embodiment, the processing module 11 may be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the processing module 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, micro-control unit (MCU), etc.

[0043] In this embodiment, the connection module 14 may be connected to the mode configuration module of the electronic device under test in a wired or wireless manner. The electronic device under test includes, but is not limited to, a processor, a circuit board, a computer, a mobile phone, and a wearable device.

[0044] In some embodiments, the connection module 14 may be connected to the mode configuration module of the electronic device under test through a Dupont wire. For example, the connection module 14 is connected to the mode configuration pin of the electronic device under test through a Dupont wire.

[0045] In this embodiment, the information receiving module 12 may communicate with an external device in a wired or wireless manner to receive an external instruction sent by the external device. The external device includes, but is not limited to, a laptop computer, a desktop computer, a workbench, a personal digital assistant, a server, a blade server, a mainframe computer, and other suitable computers. The external device may also represent various forms of mobile devices, such as a personal digital processor, a cellular phone, a smart phone, a wearable device, and other similar computing devices. Figure 1 Here, the external device is only illustrated by taking a personal computer (PC) as an example, but it does not limit the external device.

[0046] In some embodiments, the information receiving module 12 may be a Universal Asynchronous Receiver / Transmitter (UART).

[0047] In some embodiments, the power on / off control module 13 includes a MOS transistor, and the processing module 11 controls the turning on and off of the MOS transistor to implement power-on, power-off or reset of the electronic device under test.

[0048] The test circuit board provided by the embodiment of the present application can automatically change the startup mode of the electronic device and power on, power off, and perform system reset on the electronic device to be tested by sending an external instruction to the test circuit board after the test circuit board is connected to the electronic device to be tested. Therefore, it can automatically upgrade and test the electronic device to be tested, solve the problem of non-intelligent upgrade and test of the electronic device to be tested, and since the upgrade and test of the electronic device to be tested are realized by sending an instruction to the test circuit board, remote upgrade and test of the electronic device to be tested can be achieved.

[0049] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0050] A power on / off button 15, connected to the power on / off control module 13, is used to control whether the voltage output by the power on / off control module 13 is output to the power input terminal of the electronic device to be tested, so as to control the power on and power off of the electronic device to be tested.

[0051] In this embodiment, the power on / off button 15 can be a power switch.

[0052] In this embodiment, by manually pressing the power on / off button, the power on and power off of the electronic device to be tested can be controlled manually.

[0053] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0054] A current detection module 16, one end of which is connected to the output end of the power on / off control module 13 and the other end is connected to the processing module 11, is used to obtain the current at the output end of the power on / off control module 13 and send it to the processing module 11; the processing module 11 is used to monitor the current and control the power on / off control module 13 to disconnect when an abnormal current is detected.

[0055] In this embodiment, as Figure 2 shown, when one end of the current detection module 16 is connected to the output end of the power on / off control module 13, it can be connected to the output end of the power on / off button 15.

[0056] In some embodiments, the current detection module 16 includes a sampling resistor.

[0057] In some embodiments, the processing module 11 can collect the current at the output end of the power on / off control module 13 through the current detection module 16 based on an external instruction, monitor the current, and control the power on / off control module 13 to disconnect when an abnormal current is detected.

[0058] In some embodiments, the current detection module 16 can automatically collect the current at the output end of the power on / off control module 13 and send it to the processing module 11.

[0059] In this embodiment, by setting the current detection module 16 to detect the current at the output end of the power on / off control module 13, and by monitoring the current through the processing module 11, and controlling the power on / off control module 13 to disconnect when an abnormal current is detected, it is possible to cut off the power supply of the electronic device under test in a timely manner when the current received by the electronic device under test is abnormal, so as to protect the electronic device under test.

[0060] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0061] A voltage conversion module 17, connected to the processing module 11, for connecting to an external power module, converting the first voltage input by the external power module into a second voltage, and supplying power to the processing module 11.

[0062] In some embodiments, the voltage conversion module 17 can be a Low Dropout Regulator (LDO). The voltage conversion module 17 can convert the first voltage into the second voltage required by the processing module. For example, it can convert a 12V voltage into a 3.3V voltage.

[0063] In some embodiments, as Figure 2 shown, the test circuit board further includes a power input module 18 and a power output module 19. The power input module 18 is used to connect to an external power module and obtain the first voltage input by the external power module. The power input module is respectively connected to the voltage conversion module 17 and the power on / off control module 13 to transmit the first voltage input by the external power module to the voltage conversion module 17 and the power on / off control module 13 respectively. The power output module 19 is used to output the first voltage output by the power on / off control module 13 to the electronic device under test.

[0064] In this embodiment, by setting the voltage conversion module 17, the external power module can be used as the power supply of the processing module.

[0065] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0066] A reset button 20, connected to the processing module 11, for triggering the processing module 11 to generate a reset instruction. Based on the reset instruction, the power on / off control module 13 is controlled to disconnect first and then turn on, so as to control the reset of the electronic device under test.

[0067] In this embodiment, it is possible to perform a system reset on the electronic device under test by means of a manual button.

[0068] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0069] An upgrade button 21, connected to the processing module 11, for triggering the processing module 11 to generate an upgrade instruction. Based on the upgrade instruction, the state of the mode configuration module of the electronic device under test is adjusted through the connection module 14, so that the electronic device under test enters the upgrade mode.

[0070] In this embodiment, it is possible to perform an upgrade on the electronic device under test by means of a manual button.

[0071] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0072] A DIP switch 22, connected to the processing module 11, for triggering the processing module 11 to generate corresponding mode configuration instructions. Based on the mode configuration instructions, the state of the mode configuration module of the electronic device under test is adjusted through the connection module 14 to adjust the mode of the electronic device under test.

[0073] In this embodiment, it is possible to change the startup mode of the electronic device under test by manually adjusting the DIP switch.

[0074] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0075] An indicator light 23, connected to the processing module 11, for prompting the working status information of the processing module 11.

[0076] In some embodiments, it can be set that when the indicator light 23 flashes green, it indicates that the processing module 11 is in the working mode; when the indicator light 23 is constantly red, it indicates that the processing module 11 is in the non-working mode; when the indicator light 23 is constantly blue, it indicates that the processing module 11 is in the process of upgrading.

[0077] In an alternative embodiment, as Figure 2 shown, the test circuit board further includes:

[0078] A USB interface 24, connected to the processing module 11, for obtaining program installation information and sending the program installation information to the processing module 11.

[0079] In this embodiment, it is possible to download the application programs required by the processing module through the USB interface.

[0080] In an alternative embodiment, as Figure 2As shown, the test circuit board further includes:

[0081] An output module 25, connected to the processing module 11, for outputting the working log of the processing module 11.

[0082] In this embodiment, the output of the working log of the processing module can be realized.

[0083] Those skilled in the art of this technology can understand that the various operations, methods, steps, measures, and solutions in the processes discussed in this application can be alternated, changed, combined, or deleted. Further, the other steps, measures, and solutions in the various operations, methods, and processes discussed in this application can also be alternated, changed, rearranged, decomposed, combined, or deleted. Further, the steps, measures, and solutions in the prior art that are the same as those disclosed in this application can also be alternated, changed, rearranged, decomposed, combined, or deleted.

[0084] The orientation or positional relationship indicated by the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present utility model. When an element such as a layer, film, region, or substrate is referred to as being "on" or "under" another element, the element can be "directly" on or under the other element, or there can be intermediate elements.

[0085] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" can explicitly or implicitly include at least one such feature. In the description of this application, "a plurality" means two or more, unless otherwise specifically defined.

[0086] The above is only the specific implementation manner of this application, but the protection scope of this application is not limited thereto. Any person skilled in the art of this technology can easily think of changes or substitutions within the technical scope disclosed in this application, and all should be covered by the protection scope of this application. Therefore, the protection scope of this application should be subject to the protection scope of the claimed rights.

Claims

1. A test circuit board, characterized in that, Including: A processing module, an information receiving module, a power on / off control module, and a connection module; The control end of the power on / off control module is connected to the processing module, the input end is used to be connected to an external power module, and the output end is used to be connected to the power input end of the electronic device under test; The input end of the connection module is connected to the processing module, and the output end is used to be connected to the mode configuration module of the electronic device under test; The output end of the information receiving module is connected to the processing module, and is used to receive an external instruction and transmit the external instruction to the processing module; The processing module is used to, based on the external instruction, adjust the state of the mode configuration module of the electronic device under test through the connection module so as to adjust the mode of the electronic device under test; The processing module is further used to, based on the external instruction, control the power on / off control module to turn on or off so as to control power on, power off, or reset of the electronic device under test.

2. The test circuit board according to claim 1, wherein, Further including: A current detection module, one end of which is connected to the output end of the power on / off control module and the other end is connected to the processing module, and is used to obtain the current at the output end of the power on / off control module and send it to the processing module; The processing module is used to monitor the current, and when an abnormal current is detected, control the power on / off control module to disconnect.

3. The test circuit board according to claim 1, wherein Further including: A voltage conversion module, which is connected to the processing module, is used to be connected to an external power module, and after converting the first voltage input by the external power module into a second voltage, supplies power to the processing module.

4. The test circuit board according to claim 1, wherein Further including: A power on / off button, which is connected to the power on / off control module, and is used to control whether the voltage output by the power on / off control module is output to the power input end of the electronic device under test so as to control power on and power off of the electronic device under test.

5. The test circuit board according to claim 1, wherein Further including: A reset button, which is connected to the processing module, and is used to trigger the processing module to generate a reset instruction. Based on the reset instruction, control the power on / off control module to first disconnect and then turn on so as to control reset of the electronic device under test.

6. The test circuit board according to claim 1, characterized in that Further including: An upgrade button, which is connected to the processing module, and is used to trigger the processing module to generate an upgrade instruction. Based on the upgrade instruction, adjust the state of the mode configuration module of the electronic device under test through the connection module so that the electronic device under test enters the upgrade mode.

7. The test circuit board according to claim 1, characterized in that, Further including: A DIP switch, which is connected to the processing module, and is used to trigger the processing module to generate corresponding mode configuration instructions. Based on the mode configuration instructions, adjust the state of the mode configuration module of the electronic device under test through the connection module so as to adjust the mode of the electronic device under test.

8. The test circuit board according to claim 1, characterized in that, Further including: An indicator light, which is connected to the processing module, and is used to prompt the working state information of the processing module.

9. The test circuit board according to claim 1, wherein Further including: A USB interface, which is connected to the processing module, and is used to obtain program installation information and send the program installation information to the processing module.

10. The test circuit board according to claim 1, wherein Further including: An output module, which is connected to the processing module, and is used to output the working log of the processing module.