Testing device of main-grid-free solar cell and solar cell testing system
By using the trapezoidal contact portion connected by the probe row bracket and the telescopic component in the main gateless solar cell test device, the problems of low test accuracy and high maintenance costs are solved, and high accuracy and low cost test results are achieved.
Patent Information
- Application Number
- CN202422218691.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2025-07-08
- Estimated Expiration
- 2034-09-10
AI Technical Summary
The existing I-V test devices with no main gate solar cells have low test accuracy and high maintenance costs.
The trapezoidal contact part connected to the probe row bracket and the telescopic component is used to connect the trapezoidal contact part through the telescopic component. When the trapezoidal contact part comes into contact with the thin gate on the main gateless battery cell, the telescopic component can elastically telescopic to avoid damage to the battery cell, and ensure that the trapezoidal contact part is completely pressed on the thin gate, improving the accuracy of the test.
It reduces the probability of inaccurate test results, improves test accuracy, simplifies the maintenance process, and controls maintenance costs.
Smart Images
Figure CN223080000U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of solar cell testing equipment, and particularly relates to a testing device for a main-grid-free solar cell and a solar cell testing system. Background Art
[0002] Solar cells can be divided into main-grid solar cells and main-grid-free solar cells. Among them, the electrodes of the main-grid solar cells are divided into main grid lines and sub-grid lines. The main grid lines are parallel to each other, and the sub-grid lines are also parallel to each other. The main grid lines and the sub-grid lines are perpendicular to each other. The sub-grid lines are used to collect the current generated by the cell, and the current on the sub-grid lines is further collected through the main grid lines. Then, the current is further led out through the solder tape connected to the main grid line for power generation of the photovoltaic module.
[0003] The main-grid-free solar cell has no main grid lines. This structure reduces the consumption of precious metals, thereby reducing the production cost of the cell. In addition, during the production process, the sub-grid lines perpendicular to the main grid lines are also prone to breakpoints, which may cause bad conditions such as broken grids or leakage. The main-grid-free solar cell can reduce the occurrence of such bad conditions.
[0004] Before leaving the factory, solar cells need to be tested for voltage and current. The existing I-V (current-voltage) test for main-grid-free solar cells mainly uses a copper wire pressing test device. A certain number of copper wire probes are used on the front of this device to contact the fine grids on the solar cell, and a copper bottom plate with a certain thickness and arc is used on the back of the device to collect the current and voltage parameters on the back; in addition, conductive bars such as copper bars, tinned welding rods, and silver bars can be welded under the copper wire probes to replace the main grid lines to collect the current on the fine grid lines.
[0005] However, during the use of the copper wire probes, the tension of the copper wire probes themselves is difficult to recover in time within the beat of cell sorting as the number of tests increases, resulting in low test accuracy and high device maintenance costs, making it difficult to promote and use. Summary of the Utility Model
[0006] The embodiment of the utility model provides a testing device for a main-grid-free solar cell, aiming to solve the problems of low test accuracy and high maintenance cost of the existing I-V testing device for main-grid-free solar cells.
[0007] The embodiment of the utility model is implemented as follows. A testing device for a main-grid-free solar cell includes:
[0008] A probe row bracket;
[0009] A number of telescopic components arranged on the probe row bracket; and
[0010] The probe contact component, the probe contact component includes a plurality of trapezoidal contact parts respectively connected to a plurality of telescopic parts, the plurality of trapezoidal contact parts are arranged alternately in sequence along a first direction, and the first direction is the direction in which the positive and negative fine grids on the main-gridless solar cell are arranged alternately.
[0011] Further, the trapezoidal contact part and the telescopic part are of an integral structure.
[0012] Further, both the trapezoidal contact part and the telescopic part are metal contact conductive materials.
[0013] Further, both the trapezoidal contact part and the telescopic part are provided with a gold plating layer or a silver plating layer.
[0014] Further, the testing device further includes a testing stage for carrying the main-gridless solar cell.
[0015] Further, the testing stage includes any one of a copper stage or a transparent glass stage.
[0016] Further, the testing device further includes a driving component connected to the probe row bracket for driving the probe row bracket to reciprocate between approaching and departing from the testing stage.
[0017] Further, the probe row bracket is provided with mounting holes, and the driving component is connected to the probe row bracket through the mounting holes.
[0018] Further, the driving component includes any one of a cylinder, a motor, and a lead screw assembly.
[0019] In a second aspect, the present application further provides a solar cell testing system including the testing device as described above.
[0020] The beneficial effect of the present application is that the testing device for the main-gridless solar cell of the present application includes a probe row bracket, a plurality of telescopic parts arranged on the probe row bracket; and a probe contact component, the probe contact component includes a plurality of trapezoidal contact parts respectively connected to the plurality of telescopic parts one by one, the plurality of trapezoidal contact parts are arranged alternately in sequence along a first direction, and the first direction is the direction in which the positive and negative fine grids on the main-gridless solar cell are arranged alternately. By connecting the trapezoidal contact parts through the telescopic parts, when the trapezoidal contact parts contact the fine grids on the main-gridless solar cell, the telescopic parts can elastically expand and contract, avoiding damage to the main-gridless solar cell, with simple maintenance and control of maintenance costs. At the same time, the trapezoidal contact parts can be completely pressed onto the fine grids, reducing the probability of inaccurate test results caused by the poor fit between the test probes and the fine grids, and improving the test accuracy. Description of the Drawings
[0021] Figure 1It is a front view schematic diagram of an embodiment of a test device for a main-gridless solar cell provided by the present application;
[0022] Figure 2 It is a side view schematic diagram of an embodiment of a test device for a main-gridless solar cell provided by the present application;
[0023] Figure 3 It is a front view schematic diagram of another embodiment of a test device for a main-gridless solar cell provided by the present application. Detailed implementation manners
[0024] In order to make the objectives, technical solutions and advantages of the present utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. The examples of the embodiments are shown in the accompanying drawings, in which the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions from beginning to end. The embodiments described below by referring to the accompanying drawings are exemplary and are only used to explain the present utility model, and cannot be construed as a limitation to the present utility model. In addition, it should be understood that the specific embodiments described herein are only used to explain the present utility model and are not used to limit the present utility model.
[0025] In the description of the present utility model, it should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "left", "right", "horizontal", "top", "bottom", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be construed as a limitation to the present utility model.
[0026] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more features. In the description of the present utility model, "a plurality of" means two or more unless otherwise specifically defined.
[0027] In the description of the present utility model, it should be noted that unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection or an integral connection; it may be a mechanical connection, an electrical connection or a communication with each other; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.
[0028] In the present utility model, unless otherwise clearly defined and limited, the first feature being "above" or "below" the second feature may include the direct contact between the first and second features, or may include the case where the first and second features are not in direct contact but in contact through other features therebetween. Moreover, the first feature being "above", "over" and "on top of" the second feature includes that the first feature is directly above and obliquely above the second feature, or merely indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature being "below", "under" and "beneath" the second feature includes that the first feature is directly below and obliquely below the second feature, or merely indicates that the horizontal height of the first feature is lower than that of the second feature.
[0029] The following disclosure provides many different embodiments or examples for implementing different structures of the present utility model. To simplify the disclosure of the present utility model, the components and settings of specific examples are described hereinafter. Of course, they are merely examples and are not intended to limit the present utility model. In addition, the present utility model may repeat reference numerals and / or reference letters in different examples. Such repetition is for the purpose of simplification and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the present utility model provides examples of various specific processes and materials, but those of ordinary skill in the art can be aware of the application of other processes and / or the use of other materials.
[0030] The test device for a main-grid-free solar cell of the present application includes a probe row bracket, a plurality of telescopic components arranged on the probe row bracket; and a probe contact component. The probe contact component includes a plurality of trapezoidal contact parts respectively connected to the plurality of telescopic components in one-to-one correspondence. The plurality of trapezoidal contact parts are alternately arranged and distributed in sequence along a first direction, and the first direction is the direction in which the positive fine grids and negative fine grids on the main-grid-free solar cell are alternately arranged and distributed. By connecting the trapezoidal contact parts through the telescopic components, when the trapezoidal contact parts are in contact with the fine grids on the main-grid-free solar cell, the telescopic components can elastically expand and contract, avoiding damage to the main-grid-free solar cell, with simple maintenance and control of maintenance costs. At the same time, the trapezoidal contact parts can be completely pressed onto the fine grids, reducing the probability of inaccurate test results caused by the imperfect fit between the test probes and the fine grids, and improving the test accuracy.
[0031] Embodiment 1
[0032] As Figures 1 to 3 shown, an embodiment of the present application provides a test device for a main-grid-free solar cell, including:
[0033] A probe row bracket 100;
[0034] A plurality of telescopic components 200 arranged on the probe row bracket 100; and
[0035] The probe contact component includes a plurality of trapezoidal contact parts 300 that are respectively connected to a plurality of telescopic parts 200 one by one. The plurality of trapezoidal contact parts 300 are arranged alternately in sequence along a first direction, and the first direction is the direction in which the positive and negative fine grids on the main-gridless solar cell 500 are arranged alternately.
[0036] A main-gridless solar cell refers to a solar cell that only has secondary grid lines. The secondary grid lines include positive fine grids and negative fine grids, and the positive fine grids and negative fine grids are arranged alternately in sequence. That is to say, there is a negative fine grid between two adjacent positive fine grids. Similarly, there is a positive fine grid between two adjacent negative fine grids.
[0037] The probe row bracket 100 can be regarded as the mounting base of the telescopic parts 200, that is, a plurality of telescopic parts 200 are fixedly installed on the probe row bracket 100.
[0038] Optionally, the telescopic parts 200 are integrally strip-shaped. A plurality of telescopic parts 200 are installed on the lower surface of the probe row bracket 100, and the main-gridless solar cell is located below the probe row bracket 100. By driving the probe row bracket 100 to move up and down, the telescopic parts 200 are driven to move up and down, so that the telescopic parts 200 drive the trapezoidal contact parts 300 to contact the positive and negative fine grids of the main-gridless solar cell, and then the subsequent voltage and current test processes can be carried out.
[0039] It should be noted that the installation of the telescopic parts 200 on the lower surface of the probe row bracket 100 is an example of an embodiment of the present application, rather than a specific limitation on the present application. In some other embodiments, the telescopic parts 200 can also be installed at other positions of the probe row bracket 100. For example, the telescopic parts 200 are installed on the right surface of the probe row bracket 100. During the test, the main-gridless solar cell can be placed on the right side of the probe row bracket 100. By driving the probe row bracket 100 to move left and right, the trapezoidal contact parts 300 are brought into contact with the positive and negative fine grids of the main-gridless solar cell, so as to carry out the subsequent voltage and current test processes.
[0040] The telescopic parts 200 can be telescopic sleeves or other parts with certain telescopic deformation ability, which is not limited.
[0041] When a telescopic sleeve is adopted, the telescopic component 200 includes a first sleeve 210 and a second sleeve 220. The first sleeve 210 is connected to the probe row bracket 100, and the second sleeve 220 is connected to the trapezoidal contact part 300. The first sleeve 210 is sleeved on the outer surface of the second sleeve 220, or the second sleeve 220 is sleeved on the outer surface of the first sleeve 210. An elastic component such as a spring is arranged between the first sleeve 210 and the second sleeve 220 so that the first sleeve 210 and the second sleeve 220 can perform a certain degree of telescopic movement.
[0042] The trapezoidal contact part 300 is integrally in the shape of a frustum of a pyramid. The cross-section of the trapezoidal contact part 300 is trapezoidal. The first side bottom surface of the trapezoidal contact part 300 is connected to the telescopic component 200, and the second side bottom surface of the trapezoidal contact part 300 is used for contact connection with the fine grid.
[0043] During implementation, the trapezoidal contact part 300 can be electrically connected to the circuit board of the test system through a connecting wire. When the probe row bracket 100 moves towards the main-gridless solar cell, the trapezoidal contact part 300 contacts the positive fine grid and the negative fine grid on the main-gridless solar cell. The probe row bracket 100 further moves towards the main-gridless solar cell, and the first sleeve 210 and the second sleeve 220 are compressed under the action of the probe row bracket 100 and the trapezoidal contact part 300. At this time, the trapezoidal contact part 300 abuts against the positive fine grid and the negative fine grid on the main-gridless solar cell under the action of the telescopic component 200. The abutting pressure between the trapezoidal contact part 300 and the fine grid is appropriate, which will not damage the fine grid, and at the same time, the trapezoidal contact part 300 can be closely attached to the fine grid, so as to form a good contact with the fine grid and ensure the accuracy of the test results.
[0044] The test device for the main-gridless solar cell of the present application includes a probe row bracket 100, a plurality of telescopic components 200 arranged on the probe row bracket 100; and a probe contact component. The probe contact component includes a plurality of trapezoidal contact parts 300 connected to the plurality of telescopic components 200 one by one. The plurality of trapezoidal contact parts 300 are alternately arranged in sequence along the first direction. The first direction is the direction in which the positive fine grid and the negative fine grid on the main-gridless cell 500 are alternately arranged. By connecting the trapezoidal contact part 300 through the telescopic component 200, when the trapezoidal contact part 300 contacts the fine grid on the main-gridless cell 500, the telescopic component 200 can elastically expand and contract, avoiding damage to the main-gridless cell 500, with simple maintenance and control of the maintenance cost. At the same time, the trapezoidal contact part 300 can be completely pressed onto the fine grid, reducing the probability of inaccurate test results caused by the poor fit between the test probe and the fine grid and improving the test accuracy.
[0045] In some alternative embodiments, the trapezoidal contact portion 300 and the telescopic member 200 are of an integrated structure. By integrally designing the trapezoidal contact portion 300 and the telescopic member 200, the structural strength of the testing device can be effectively improved and the service life can be extended.
[0046] In some alternative embodiments, both the trapezoidal contact portion 300 and the telescopic member 200 are made of metal contact conductive materials. By making the trapezoidal contact portion 300 and the telescopic member 200 of metal contact conductive materials, an electrical transmission channel is formed by the trapezoidal contact portion 300 and the telescopic member 200, and no additional wires need to be provided, thus saving hardware costs.
[0047] In some alternative embodiments, both the trapezoidal contact portion 300 and the telescopic member 200 are provided with a gold plating layer or a silver plating layer. By plating gold or silver on the trapezoidal contact portion 300 and the telescopic member 200, the resistance of the trapezoidal contact portion 300 and the telescopic member 200 can be effectively reduced, the energy loss and voltage drop in the electrical signal transmission can be reduced, and the quality and stability of the signal transmission can be improved. In addition, the gold plating layer or the silver plating layer can provide protection for the trapezoidal contact portion 300 and the telescopic member 200, effectively preventing the trapezoidal contact portion 300 and the telescopic member 200 from oxidation and corrosion, and extending the service life of the trapezoidal contact portion 300 and the telescopic member 200.
[0048] In some alternative embodiments, the testing device for the main-gridless solar cell provided in the present application further includes a testing stage 400, and the testing stage 400 is used to carry the main-gridless cell 500. The main-gridless cell 500 is the main-gridless solar cell to be tested, and the above-mentioned positive grid line and negative grid line are provided on the main-gridless cell 500, which will not be elaborated here.
[0049] The main-gridless cell 500 is placed on the testing stage 400 to fix its position, so that the trapezoidal contact portion 300 can better abut against the fine grid on the main-gridless cell 500. Optionally, the testing stage 400 includes any one of a copper stage or a transparent glass stage, which is not limited.
[0050] In addition, the testing stage 400 can be provided with a limiting structure, and the limiting structure can be a clamping member or a limiting groove, etc., which is not limited. The position of the main-gridless cell 500 is fixed by the limiting structure, so that the trapezoidal contact portion 300 accurately contacts the fine grid on the main-gridless cell 500. For example, the trapezoidal contact portion 300 of the positive electrode abuts against and contacts the positive fine grid, and the trapezoidal contact portion 300 of the negative electrode abuts against and contacts the negative fine grid, ensuring the accuracy of the test results.
[0051] In some alternative embodiments, the test device for the main-gridless solar cell provided by the present application further includes a driving component (not shown in the figure), which is connected to the probe row bracket 100 and is used to drive the probe row bracket 100 to reciprocate between approaching and departing from the test stage 400.
[0052] The driving component refers to a device or component that can output power to drive the movement of the probe row bracket 100. For example, the driving component can be any one of a cylinder, a motor, and a lead screw assembly, without limitation.
[0053] In some embodiments, the probe row bracket 100 is provided with mounting holes 110, and the driving component is connected to the probe row bracket 100 through the mounting holes 110, with a simple and reliable structure and convenient for later maintenance.
[0054] Embodiment 2
[0055] In some alternative embodiments, the present application provides a solar cell test system, including the test device as described above.
[0056] Those skilled in the art can clearly understand that for the convenience and conciseness of description, the structure and implementation principle of the solar cell test system described above can refer to the corresponding structure and implementation principle in the first embodiment described above, and will not be elaborated here.
[0057] The test device for the main-gridless solar cell of the present application includes a probe row bracket 100, a plurality of telescopic components 200 arranged on the probe row bracket 100; and a probe contact component, where the probe contact component includes a plurality of trapezoidal contact parts 300 connected to the plurality of telescopic components 200 in one-to-one correspondence, and the plurality of trapezoidal contact parts 300 are alternately arranged in sequence along a first direction, and the first direction is the direction in which the positive fine grids and negative fine grids on the main-gridless cell 500 are alternately arranged. By connecting the trapezoidal contact parts 300 through the telescopic components 200, when the trapezoidal contact parts 300 contact the fine grids on the main-gridless cell 500, the telescopic components 200 can elastically expand and contract, avoiding damage to the main-gridless cell 500, with simple maintenance and control of maintenance costs. At the same time, the trapezoidal contact parts 300 can be completely pressed onto the fine grids, reducing the probability of inaccurate test results caused by the poor fit between the test probes and the fine grids, and improving the test accuracy.
[0058] The above are only the preferred embodiments of the present utility model, and are not intended to limit the present utility model. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present utility model shall be included within the protection scope of the present utility model.
Claims
1. A testing device for a main-gridless solar cell, characterized in that Comprising: A probe row bracket; A plurality of telescopic components arranged on the probe row bracket; And A probe contact component, the probe contact component includes a plurality of trapezoidal contact parts respectively connected to the plurality of telescopic components in one-to-one correspondence, and the plurality of trapezoidal contact parts are alternately arranged in sequence along a first direction, and the first direction is the direction in which the positive fine grids and the negative fine grids on the main-gridless solar cell are alternately arranged.
2. The testing device according to claim 1, wherein The trapezoidal contact part and the telescopic component are of an integrated structure.
3. The testing device according to claim 1 or 2, characterized in that, Both the trapezoidal contact part and the telescopic component are metal contact conductive materials.
4. The test device according to claim 3, wherein, Both the trapezoidal contact part and the telescopic component are provided with a gold plating layer or a silver plating layer.
5. The testing device according to claim 1, wherein The testing device further includes a testing stage for carrying the main-gridless solar cell.
6. The test device according to claim 5, characterized in that, The testing stage includes any one of a copper stage or a transparent glass stage.
7. The test device according to claim 5, characterized in that The testing device further includes a driving component connected to the probe row bracket for driving the probe row bracket to reciprocate between approaching and departing from the testing stage.
8. The test device according to claim 7, characterized in that, The probe row bracket is provided with a mounting hole, and the driving component is connected to the probe row bracket through the mounting hole.
9. The test device according to claim 7 or 8, characterized in that, The driving component includes any one of a cylinder, a motor, and a lead screw assembly.
10. A solar cell testing system, characterized in that, Comprising the testing device according to any one of claims 1 to 9.