DIP test device and equipment

Abstract

The utility model relates to the technical field of testing devices, and discloses a DIP testing device, which comprises a testing base used for fixing a testing circuit; the testing circuit comprises a testing circuit board and a testing elastic piece, the testing elastic piece is conductive, the testing circuit board is connected with the bottom side of the testing base, the testing elastic piece comprises a first blade and a second blade, the first blade and the second blade are oppositely arranged, an included angle is formed between the first blade and the second blade, one end of the testing elastic piece is connected with the testing circuit board, and the other end of the testing elastic piece is connected with the testing circuit board. The other end of the testing elastic sheet is a vertex end of an included angle formed by the first blade and the second blade; the fixing plate is connected with the testing base, the fixing plate is located on the top side of the testing base, and a first through hole is formed in the fixing plate; the movable plate is located on the top side of the fixed plate, the movable plate is movably connected with the test base, the movable plate is provided with a second through hole, and the vertex end of the test elastic piece penetrates through the first through hole and the second through hole; and the driving device is used for driving the movable plate.

Description

Technical Field

[0001] The utility model relates to the technical field of testing devices, in particular to a DIP testing device and equipment. Background Art

[0002] DIP (Dual In-line Package) means dual in-line package, and its pins are led out from both sides of the package, which is the most popular packaging method. A DIP testing device (Dual In-line Package Testing Equipment) is a device used to test the integrated circuits (ICs) of DIP products. This device can test various functions of the integrated circuits and confirm whether the integrated circuits work as expected.

[0003] Currently, in the process of testing DIP products, it is usually through the staff manually inserting the pins of the DIP products into the DIP testing device adapted to the product to be tested for testing. Due to the different specifications and the number of pins of the products to be tested, different DIP testing devices are often required for DIP testing, which not only reduces the efficiency of DIP testing but also increases the cost. In addition, manual testing has problems such as low efficiency and high error reporting rate, and is not suitable for large-scale testing requirements. Summary of the Invention

[0004] The technical problem to be solved by the utility model is to solve the problems that the existing DIP testing device has low adaptability and relies on manual labor during testing.

[0005] To solve the above technical problem, the utility model provides a DIP testing device, which is characterized in that the DIP testing device includes:

[0006] A test base for fixing a test circuit;

[0007] A test circuit, which includes a test circuit board and test spring pieces. The test spring pieces are electrically conductive. The test circuit board is connected to the bottom side of the test base. The test spring pieces include a first blade and a second blade. The first blade and the second blade are arranged oppositely, and an included angle is formed between the first blade and the second blade. One end of the test spring piece is connected to the test circuit board, and the other end of the test spring piece is the vertex end where the first blade and the second blade form the included angle. There are two or more test spring pieces;

[0008] A fixing plate connected to the test base. The fixing plate is located on the top side of the test base and is provided with a first through hole;

[0009] The movable plate is located on the top side of the fixed plate. The movable plate is movably connected to the test base. The movable plate is provided with a second through hole, and the vertex end of the test spring piece passes through the first through hole and the second through hole.

[0010] The driving device is used to drive the movable plate so that the first blade and the second blade are clamped or loosened.

[0011] Furthermore, the length of the movable plate is a, and the length of the fixed plate is b, where a > b.

[0012] Furthermore, the movable connection between the movable plate and the test base is a sliding connection.

[0013] Furthermore, the area of the second through hole is larger than the area of the first through hole.

[0014] Furthermore, the length of the test spring piece can be adjusted.

[0015] Furthermore, there are multiple test spring pieces, first through holes, and second through holes.

[0016] Furthermore, the shapes of the first through hole and the second through hole are long grooves.

[0017] In another aspect of the present utility model, a DIP test device is also provided. The test device includes a test platform and a DIP test device. The test platform is connected to the DIP test device. The test platform includes a driving device support part and a test base support part. The driving device support part is used to support the driving device, and the test base support part is used to support the test base.

[0018] Furthermore, the test platform further includes a support bottom plate and support feet. The driving device support part and the test base support part are connected to the support bottom plate. The driving device support part and the test base support part are located on the top side of the support bottom plate. One end of the support feet is connected to the support bottom plate.

[0019] Furthermore, the height of the support feet is adjustable.

[0020] Compared with the prior art, the beneficial effects of a DIP test device according to an embodiment of the present utility model are as follows:

[0021] In the embodiment of the present utility model, by changing the traditional insertion - type test method to a design of clamping with test spring pieces, the DIP pins can be tested without alignment for the product to be tested. The staff only needs to place the product to be tested on the movable plate and start the driving device to apply pressure to the movable plate. After the pressure is applied, the interaction between the movable plate and the fixed plate makes the test spring pieces clamp the DIP pins to form a circuit, so as to test whether the various parameters of the product to be tested work normally. The present utility model realizes the automatic docking of DIP pins, simplifies the test process, and the automation of the test process reduces the potential errors in the operation of the staff, improving the accuracy of the test results of the DIP test device. Since the opening and closing distance of the test spring pieces is adaptable under the adjustment of the movable plate, the DIP test device can adapt to various specifications of products to be tested. For example, the DIP test device can be compatible with testing products to be tested with inconsistent widths of two - row pins and different pin spacings in the same row, improving the adaptability of the DIP test device to the products to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 FIG. is a schematic structural diagram of the DIP test device provided by the embodiment of the present utility model;

[0023] Figure 2 FIG. is a schematic structural diagram of the movable plate and the test circuit in the DIP test device provided by the embodiment of the present utility model;

[0024] Figure 3 FIG. is a schematic structural diagram of the movable plate, the test circuit and the fixed plate in the DIP test device provided by the embodiment of the present utility model;

[0025] Figure 4 FIG. is a schematic structural diagram of the movable plate and the fixed plate in the DIP test device provided by another embodiment of the present utility model;

[0026] Figure 5 FIG. is a schematic structural diagram of the DIP test device provided by still another embodiment of the present utility model;

[0027] Figure 6 FIG. is a schematic structural diagram of the test platform in the DIP test device provided by still another embodiment of the present utility model

[0028] In the figure, 100, test base; 101, the first side of the test base; 200, test circuit; 210, test circuit board; 220, test spring piece; 221, first blade; 222, second blade; 300, fixed plate; 310, first through - hole; 400, movable plate; 410, second through - hole; 500, driving device; 600, test platform; 610, driving device support part; 620, test base support part; 630, support bottom plate; 640, support feet. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0029] The following will further describe in detail the specific implementation manners of the present utility model in conjunction with the accompanying drawings and embodiments. The following embodiments are used to illustrate the present utility model, but not to limit the scope of the present utility model. It should be noted that: unless otherwise specifically stated, the relative arrangements and numerical values of the components and steps described in these embodiments do not limit the scope of the present utility model.

[0030] The description of at least one exemplary embodiment below is actually only illustrative and in no way restricts the present utility model and its application or use.

[0031] Techniques, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the said techniques, methods, and devices should be regarded as part of the specification.

[0032] In all the examples shown and discussed here, any specific value should be construed as merely exemplary and not as a limitation. Therefore, other examples of the exemplary embodiments may have different values.

[0033] It should be noted that: similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0034] As Figure 1 、 Figure 2 and Figure 3 shown, the embodiment of the present utility model provides a DIP test device, and the DIP test device includes:

[0035] A test base 100 for fixing a test circuit 200;

[0036] A test circuit 200, the test circuit 200 includes a test circuit board 210 and test spring pieces 220. The test spring pieces 220 are electrically conductive. The test circuit board 210 is connected to the bottom side of the test base 100. The test spring pieces 220 include a first blade 221 and a second blade 222. The first blade 221 and the second blade 222 are arranged opposite to each other. The first blade 221 and the second blade 222 form an included angle. One end of the test spring piece 220 is connected to the test circuit board 210. The other end of the test spring piece 220 is the vertex end where the first blade 221 and the second blade 222 form an included angle. There are two or more test spring pieces 220;

[0037] A fixing plate 300, the fixing plate 300 is connected to the test base 100. The fixing plate 300 is located on the top side of the test base 100. The fixing plate 300 is provided with a first through hole 310;

[0038] The movable plate 400 is located on the top side of the fixed plate 300. The movable plate 400 is movably connected to the test base 100. The movable plate 400 is provided with a second through hole 410, and the apex end of the test spring piece 220 passes through the first through hole 310 and the second through hole 410.

[0039] The driving device 500 is used to drive the movable plate 400 to clamp or loosen the first blade 221 and the second blade 222.

[0040] Among them, the DIP pins refer to the metal contacts on the DIP product to be tested for connecting and transmitting electrical signals. The driving device 500 refers to a mechanical device for applying pressure, usually driven by a pneumatic side pressure cylinder, a hydraulic cylinder or an electric pressure cylinder, etc. It is used to generate the necessary pressing or pulling force in various devices and systems to complete specific operations or functions. In this embodiment, a side pressure cylinder can be used to drive the movable plate 400. Among them, the test base 100 here refers to a device that can be used to support the test circuit 200, and it can also be a support plate, a support column, etc. Among them, the top end of the test spring piece 220 should be at least located in the second through hole 410 to ensure that the movable plate 400 pushes the test spring piece 220 when subjected to pressure. Preferably, the top end of the test spring piece 220 should be flush with the top side of the movable plate 400. This way can avoid the problem that the DIP pins cannot be clamped due to the too short test spring piece 220. Among them, having two or more of the test spring pieces 220 means that in order to clamp the DIP pins to form a circuit, there must be two or more test spring pieces 220, because the pins of the DIP are in two rows. When all the pins of the DIP are clamped, the test circuit 200 can form a circuit and then test the product to be tested. For example, when the number of pins of the product to be tested is 2, 2 test spring pieces 220 are needed to clamp the two rows of pins, and each test spring piece 220 clamps 1 pin; when the number of pins of the product to be tested is 4, 2 test spring pieces 220 can also be used to clamp the pins, and each test spring piece 220 clamps 2 pins. Preferably, the materials of the movable plate 400, the fixed plate 300 and the test circuit board 210 are insulating materials, and the insulating materials can effectively prevent short circuits from occurring between the movable plate 400, the fixed plate 300 and the test circuit board 210, ensuring the electrical safety during the DIP test.

[0041] Specifically, the working process of the DIP test device is as follows: First, the staff places the product to be tested on the movable plate 400; then, the driving device 500 is started to apply pressure to the movable plate 400; next, after the pressure is applied, the movable plate 400 interacts with the fixed plate 300 to make the test spring piece 220 clamp the DIP pin to form a circuit; finally, the test circuit board 210 tests whether the various parameters of the product to be tested are working properly. Here, the various parameters refer to the signal transmission performance, electrical characteristics, current and resistance parameters of the product to be tested, etc.

[0042] In the embodiment of the present invention, the embodiment of the present invention changes the traditional plug-in test method to the design of clamping with the test spring piece 220, so that the DIP pins can be tested without alignment. The staff only needs to place the product to be tested on the movable plate 400, start the driving device 500 to apply pressure to the movable plate 400, and after the pressure is applied, the movable plate 400 interacts with the fixed plate 300 to make the test spring piece 220 clamp the DIP pin to form a circuit, so as to test whether the various parameters of the product to be tested are working properly. The present invention realizes the automatic docking of the DIP pins, simplifies the test process, and the automation of the test process reduces the potential errors of the staff's operation and improves the accuracy of the test results of the DIP test device; since the opening and closing distance of the test spring piece 220 is adaptable under the adjustment of the movable plate 400, the DIP test device can adapt to various specifications of products to be tested, improving the adaptability of the DIP test device to the products to be tested.

[0043] As Figure 4 shown, in an alternative embodiment of the present invention, the length of the movable plate 400 is a, and the length of the fixed plate 300 is b, where a > b.

[0044] Among them, during the process of the driving device 500 applying pressure to the movable plate 400, if the length of the movable plate 400 is too small, it is very likely that the driving device 500 cannot push the movable plate 400 out enough distance after applying pressure, and the movable plate 400 is under the action of pressure to make the first blade 221 and the second blade 222 clamp, so as to realize the automatic DIP test.

[0045] In the embodiment of the present invention, a > b ensures that during the process of the driving device 500 pushing the movable plate 400, it will not touch the fixed plate 300 first and cannot drive the movable plate 400 to move, reducing the possibility of test failure of the DIP automatic test device.

[0046] In an alternative embodiment of the present invention, the movable connection between the movable plate 400 and the test base 100 is a sliding connection.

[0047] Among them, a sliding connection generally refers to a connection method in which relative movement is achieved between two parts through a sliding mechanism. For example, in the present utility model, a slide rail can be provided at the connection between the movable plate 400 and the test base 100, and the movable plate 400 moves along the slide rail.

[0048] In the embodiment of the present utility model, the sliding connection reduces the friction between the movable plate 400 and the test base 100, ensuring the stability of the DIP automatic test device during DIP testing.

[0049] In an alternative embodiment of the present utility model, the area of the second through hole 410 is larger than the area of the first through hole 310.

[0050] Among them, the second through hole 410 is a through hole on the movable plate 400, and the first through hole 310 is a through hole on the fixed plate 300. In order to ensure that the test spring piece 220 can pass through the first through hole 310 without being stuck by the second through hole 410, the area of the second through hole 410 can be set larger, preferably larger than the area of the first through hole 310.

[0051] In the embodiment of the present utility model, setting the area of the second through hole 410 to be larger than the area of the first through hole 310 can ensure that the test spring piece 220 can smoothly pass through the second through hole 410 after passing through the first through hole 310, avoiding being stuck, thereby improving the stability and reliability of the DIP test device.

[0052] In an alternative embodiment of the present utility model, the length of the test spring piece 220 can be adjusted.

[0053] Among them, when designing the test spring piece 220, in order to ensure that its length can be adjusted. It can be achieved by designing a telescopic spring piece or adopting a structure with an adjustment mechanism, such as a threaded adjustment or a plug-and-play design.

[0054] The test spring piece 220 with an adjustable length enables the DIP test device to adapt to the test requirements of different specifications and types of products; the test spring piece 220 with an adjustable length can reduce the need for test spring pieces 220 of different lengths, reducing the cost of the DIP test device.

[0055] In an alternative embodiment of the present utility model, a plurality of the test spring pieces 220, the first through holes 310, and the second through holes 410 are provided.

[0056] A plurality of test spring pieces 220 and through holes allow multiple products to be tested simultaneously, improving the overall test efficiency of the DIP test device and reducing the time required for a single test.

[0057] In an alternative embodiment of the present utility model, the shapes of the first through-hole 310 and the second through-hole 410 are elongated slots.

[0058] Among them, the elongated slot is a notch with a relatively long oval or rectangular shape. The hole of the elongated slot has a larger position adjustment range, so as to adapt to test spring pieces 220 of different sizes and positions. The elongated slot can also ensure that the test spring piece 220 is more easily aligned when passing through the hole, thereby improving the accuracy and reliability of the DIP test results.

[0059] In the present utility model, the first through-hole 310 and the second through-hole 410 in the form of such elongated slots increase the flexibility and adaptability of the DIP test device, enabling it to better serve the test requirements of various products to be tested.

[0060] As Figure 5 and Figure 6 shown, on the other hand, the present utility model further provides a DIP test device. The test device includes a test platform 600 and a DIP test device. The test platform 600 is connected to the DIP test device. The test platform 600 includes a driving device support portion 610 and a test base support portion 620. The driving device support portion 610 is used to support the driving device 500, and the test base support portion 620 is used to support the test base 100.

[0061] Among them, the DIP test device includes: a test base 100 for fixing a test circuit 200; the test circuit 200 including a test circuit board 210 and test spring pieces 220, the test spring pieces 220 being electrically conductive, the test circuit board 210 being connected to the bottom side of the test base 100, the test spring pieces 220 including a first blade 221 and a second blade 222, the first blade 221 and the second blade 222 being arranged oppositely, the first blade 221 and the second blade 222 forming an included angle, one end of the test spring piece 220 being connected to the test circuit board 210, the other end of the test spring piece 220 being the vertex end where the first blade 221 and the second blade 222 form the included angle, and there being two or more test spring pieces 220; a fixing plate 300 connected to the test base 100, the fixing plate 300 being located on the top side of the test base 100, the fixing plate 300 being provided with a first through hole 310; a movable plate 400 located on the top side of the fixing plate 300, the movable plate 400 being movably connected to the test base 100, the movable plate 400 being provided with a second through hole 410, and the vertex end of the test spring piece 220 passing through the first through hole 310 and the second through hole 410; a driving device 500 for driving the movable plate 400 to clamp or loosen the first blade 221 and the second blade 222.

[0062] Among them, DIP pins refer to the metal contacts on the DIP products to be tested for connecting and transmitting electrical signals. The driving device 500 refers to a mechanical device for applying pressure, usually driven by a pneumatic side pressure cylinder, a hydraulic cylinder or an electric cylinder, etc., and it is used to generate the necessary pressing or pulling force in various devices and systems to complete specific operations or functions. In this embodiment, a side pressure cylinder can be used to drive the movable plate 400. Among them, the test base 100 here refers to a device that can be used to support the test circuit 200, and it can also be a support plate, a support column, etc. Among them, the top end of the test spring piece 220 should be at least located in the second through hole 410 to ensure that the movable plate 400 pushes the test spring piece 220 when under pressure. Preferably, the top end of the test spring piece 220 should be flush with the top side of the movable plate 400, and this way can avoid the problem that the DIP pins cannot be clamped due to the test spring piece 220 being too short.

[0063] Specifically, the working process of the DIP test device is as follows: First, the staff places the product to be tested on the movable plate 400; then, the driving device 500 is started to apply pressure to the movable plate 400; next, after the pressure is applied, the movable plate 400 interacts with the fixed plate 300 to make the test elastic piece 220 clamp the DIP pin to form a circuit; finally, the test circuit board 210 tests whether the various parameters of the product to be tested are working properly. Here, the various parameters refer to the signal transmission performance, electrical characteristics, current, and resistance parameters of the product to be tested, etc.

[0064] Among them, the driving device support part 610 can use high-strength aluminum alloy or steel. These materials have excellent mechanical strength and durability, and can effectively bear the load of the driving device 500 and ensure stability.

[0065] With the stable support structure of the present utility model, the DIP test equipment can maintain an accurate position, improving the reliability and consistency of the test results. The stable support structure reduces the wear and potential damage of mechanical components, increasing the service life of the overall equipment; the present utility model also realizes the automatic docking of DIP pins, simplifying the test process. The automation of the test process reduces potential manual operation errors and improves the accuracy of the test results.

[0066] As Figure 5 and Figure 6 shown, in an alternative embodiment of the present utility model, the test platform 600 further includes a support bottom plate 630 and support feet 640. Among them, the driving device 500 support part and the test base 100 support part are connected to the support bottom plate 630. The driving device support part 610 and the test base support part 620 are located on the top side of the support bottom plate 630, and one end of the support feet 640 is connected to the support bottom plate 630.

[0067] Specifically, during the process of using the DIP test equipment, the driving device support part 610 often shifts due to the movement of the driving device 500. Although this shift is very small, it will seriously affect the test results of the entire DIP test equipment. The support bottom plate 630 can connect the driving device support part 610 and the test base support part 620 on the test platform 600 in series, and thus can ensure that the test platform 600 will not shake due to the shaking of one of the support parts during operation.

[0068] In the embodiment of the present utility model, the support bottom plate 630 can improve the stability of the equipment during the DIP test, and thus improve the accuracy of the test results of the DIP test equipment.

[0069] In an alternative embodiment of the present utility model, the height of the support feet is adjustable.

[0070] Among them, the support feet 640 with adjustable height can adjust the height of the test base 100 according to actual needs. For example, the support feet 640 with adjustable height can be adjusted by screws. Rotating the screws can increase or decrease the height of the support feet 640, so as to ensure the same height of the DIP test equipment.

[0071] In this utility model, the stability of the DIP test equipment during the test process is ensured.

[0072] The above are only the preferred embodiments of this utility model. It should be pointed out that for those of ordinary skill in the art of this technology, without departing from the technical principle of this utility model, several improvements and substitutions can also be made, and these improvements and substitutions should also be regarded as the protection scope of this utility model.

Claims

1. A DIP test device, characterized in that, The DIP test device includes: A test base for fixing a test circuit; A test circuit including a test circuit board and test elastic pieces. The test elastic pieces are electrically conductive. The test circuit board is connected to the bottom side of the test base. The test elastic pieces include a first blade and a second blade. The first blade and the second blade are arranged oppositely and form an included angle. One end of the test elastic piece is connected to the test circuit board, and the other end of the test elastic piece is the vertex end where the first blade and the second blade form the included angle. There are two or more test elastic pieces; A fixing plate connected to the test base and located on the top side of the test base. The fixing plate is provided with a first through hole; A movable plate located on the top side of the fixing plate. The movable plate is movably connected to the test base. The movable plate is provided with a second through hole. The vertex end of the test elastic piece passes through the first through hole and the second through hole; A driving device for driving the movable plate to clamp or loosen the first blade and the second blade.

2. The DIP testing device according to claim 1, wherein The length of the movable plate is a, and the length of the fixing plate is b, where a > b.

3. The DIP testing device according to claim 1, characterized in that, The movable connection between the movable plate and the test base is a sliding connection.

4. The DIP testing device according to claim 1, wherein The area of the second through hole is larger than the area of the first through hole.

5. The DIP testing device according to claim 1, characterized in that, The length of the test elastic piece can be adjusted.

6. The DIP testing device according to claim 1, wherein There are multiple test elastic pieces, first through holes, and second through holes.

7. The DIP test device according to claim 1, wherein The shapes of the first through hole and the second through hole are long slots.

8. A DIP test device, characterized in that, The test equipment includes a test platform and the DIP test device according to any one of claims 1 - 7. The test platform is connected to the DIP test device. The test platform includes a driving device support part and a test base support part. The driving device support part is used to support the driving device, and the test base support part is used to support the test base.

9. The testing device according to claim 8, characterized in that The test platform further includes a support bottom plate and support feet. The driving device support part and the test base support part are connected to the support bottom plate. The driving device support part and the test base support part are located on the top side of the support bottom plate. One end of the support feet is connected to the support bottom plate.

10. The test device according to claim 9, wherein The height of the support feet is adjustable.

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