HC-49S wafer coating frequency detection jig

Abstract

The utility model discloses an HC-49S wafer coating frequency detection jig which comprises a jig shell and a gasket assembly, the jig shell is a cuboid with the two ends and the top open, the gasket assembly is arranged at the bottom of the jig shell and comprises a first gasket and a second gasket, and the first gasket and the second gasket are arranged on the jig shell. The first gasket and the second gasket are arranged at the two ends of the bottom of the jig shell side by side in the first direction, the gasket assembly extends in the second direction, and gasket taking grooves are formed in the outer sides of the gaskets. The positioning pieces comprise the first positioning piece and the second positioning piece, and the first positioning piece and the second positioning piece are arranged at the two ends of the gasket assembly side by side in the second direction; the wafer needing to be detected is installed and fixed through the positioning pieces arranged on the gasket assembly, the wafer can be conveniently detected, the situation that the detection result is inaccurate due to the fact that the wafer shifts in the detection process is prevented, meanwhile, the wafer taking groove is formed in the jig shell, the wafer can be conveniently taken out of the jig shell after detection is completed, and the detection efficiency is improved. And the wafer is prevented from being damaged.

Description

Technical Field

[0001] The utility model relates to the technical field of frequency detection, in particular to a frequency detection fixture for HC-49S wafer coating. Background Art

[0002] HC-49S wafers are usually used to manufacture resonators. In the current detection methods for HC-49S wafers, resonators are usually detected, lacking individual detection of HC-49S wafers. Therefore, when problems occur in HC-49S wafers, the whole resonator needs to be discarded. Moreover, since the HC-49S wafers are not detected, problem HC-49S wafers are assembled, wasting resources. Content of the Utility Model

[0003] To overcome the above drawbacks, the purpose of the utility model is to provide a frequency detection fixture for HC-49S wafer coating. By using the concave positioning grooves provided on the gasket assembly to install and fix the wafer through the positioning grooves, it is convenient to detect the wafer, preventing the wafer from shifting during the detection process, resulting in inaccurate detection results. At the same time, a wafer taking groove is provided on the fixture housing, so as to facilitate taking out the wafer from the fixture housing after the detection is completed, preventing damage to the wafer.

[0004] To achieve the above purpose, the technical solution adopted by the utility model is: a frequency detection fixture for HC-49S wafer coating, comprising:

[0005] A fixture housing, the fixture housing is a cuboid with openings at both ends and the top;

[0006] A gasket assembly, the gasket assembly is arranged at the bottom of the fixture housing. The gasket assembly includes a first gasket and a second gasket. The first gasket and the second gasket are arranged side by side at both ends of the bottom of the fixture housing along a first direction. The gasket assembly extends along a second direction, and a wafer taking groove is arranged outside the gasket;

[0007] A positioning piece, the positioning piece extends along a first direction. The positioning piece includes a first positioning piece and a second positioning piece. The first positioning piece and the second positioning piece are arranged side by side at both ends of the gasket assembly along a second direction.

[0008] In this technical solution, the fixture housing is used to install and fix the gasket assembly. The wafer extraction groove on the fixture housing facilitates the extraction of the wafer from the fixture housing after the detection is completed. The gasket assembly is used to fix the wafer to facilitate the detection of the wafer. The gasket is fixed to the wafer through the positioning piece during the detection of the wafer; by using the positioning piece provided on the gasket assembly, the wafer to be detected is installed and fixed, which facilitates the detection of the wafer and prevents the wafer from shifting during the detection process, resulting in inaccurate detection results. At the same time, a wafer extraction groove is provided on the fixture housing, so as to facilitate the extraction of the wafer from the fixture housing after the detection is completed and prevent damage to the wafer.

[0009] In some embodiments, the HC-49S wafer coating frequency detection fixture further includes detection pins, and the detection pins include a first pin and a second pin. The first pin and the second pin extend along a third direction, and the first pin and the second pin are arranged side by side along a first direction.

[0010] In this technical solution, the detection pins are used to conduct the wafer, so as to facilitate the detection of the wafer frequency.

[0011] In some embodiments, the first pin conducts the first gasket, and the second pin conducts the second gasket.

[0012] In this technical solution, the first pin conducts the wafer through the first gasket, and the second pin conducts the wafer through the second gasket, so as to detect the wafer.

[0013] In some embodiments, pin through-holes are provided at the bottom of the fixture housing, and the detection pins are arranged through the pin through-holes.

[0014] In this technical solution, the pin through-holes are used to lead out the detection pins, which is convenient for connecting other devices and is also used to fix the detection pins.

[0015] In some embodiments, the HC-49S wafer coating frequency detection fixture further includes a cover body, and the cover body is rotatably connected to the fixture housing.

[0016] In this technical solution, the cover body is used to cover the fixture housing, which is beneficial to reducing interference to a certain extent during the detection of the wafer.

[0017] In some embodiments, the HC-49S wafer coating frequency detection fixture further includes a fixing spring, and the fixing spring is fixed on the cover body. When the cover body covers the fixture housing, the fixing spring is arranged on the upper side of the gasket assembly.

[0018] In this technical solution, the positioning spring is used to apply a certain amount of force to the wafer to ensure that the wafer is always in contact with the detection pins during the detection process, so as to ensure the accuracy of the detection results.

[0019] In some embodiments, the fixing spring includes a first spring and a second spring. When the cover is covered on the fixture housing, the first spring is arranged on the upper side of the first gasket, and the second spring is arranged on the upper side of the second gasket.

[0020] In this technical solution, the first spring is used to apply force to the first gasket end of the chip, and the second spring is used to apply force to the second gasket end of the chip, so that the chip is evenly stressed.

[0021] In some embodiments, the HC-49S chip coating frequency detection fixture also includes a limit plate, which is arranged at an end of the positioning plate away from the first gasket, and the limit plate includes a first limit plate and a second limit plate, the first limit plate is arranged at an end of the first positioning plate away from the first gasket, and the second limit plate is arranged at an end of the second positioning plate away from the first gasket.

[0022] In this technical solution, the limiter is used to prevent the wafer from exceeding the range of the fixture housing, thereby facilitating the loading and removal of the wafer when the wafer is tested.

[0023] The beneficial effect of the utility model is that by utilizing the positioning piece provided on the gasket assembly, the chip to be tested is installed and fixed, which facilitates the testing of the chip and prevents the chip from being displaced during the testing process, resulting in inaccurate test results. At the same time, a chip removal groove is provided on the fixture shell, so that after the test is completed, the chip can be taken out of the fixture shell to prevent damage to the chip; the pin groove is matched with the chip removal groove to facilitate the removal of the chip from the gasket assembly; and a certain amount of force is applied to the chip by utilizing the positioning spring to ensure that the chip is always in contact with the test pin during the testing process, thereby ensuring the accuracy of the test result. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is an overall schematic diagram of a HC-49S wafer coating frequency detection fixture according to an embodiment of the present utility model;

[0025] Figure 2 A schematic top view of a HC-49S wafer coating frequency detection fixture according to an embodiment of the present invention;

[0026] Figure 3 A cross-sectional view of a HC-49S wafer coating frequency detection fixture according to an embodiment of the present invention Figure 1 ;

[0027] Figure 4 A cross-sectional view of a HC-49S wafer coating frequency detection fixture according to an embodiment of the present invention Figure 2 ;

[0028] In the figure: 1. Fixture housing;

[0029] 21. First gasket; 22. Second gasket; 23. Chip-taking groove;

[0030] 31. First pin; 32. Second pin;

[0031] 41. First positioning piece; 42. Second positioning piece;

[0032] 5. Cover body;

[0033] 61. First spring; 62. Second spring;

[0034] 7. Limiting piece; 71. First limiting piece; 72. Second limiting piece;

[0035] x. First direction; y. Second direction; z. Third direction. Detailed implementation mode

[0036] The following combines the attached drawings to elaborate on the preferred embodiments of the present utility model, so that the advantages and features of the present utility model can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present utility model.

[0037] Combined with the attached Figure 1 to the attached Figure 4 As shown, a HC-49S wafer coating frequency detection fixture includes:

[0038] Fixture housing 1, and the fixture housing 1 is a cuboid with openings at both ends and the top;

[0039] Gasket assembly, the gasket assembly is arranged at the bottom of the fixture housing 1, the gasket assembly includes a first gasket 21 and a second gasket 22, the first gasket 21 and the second gasket 22 are arranged side by side at both ends of the bottom of the fixture housing 1 along the first direction x, the gasket assembly extends along the second direction y, and a chip-taking groove is arranged outside the gasket;

[0040] Positioning piece, the positioning piece extends along the first direction x, the positioning piece includes a first positioning piece 41 and a second positioning piece 42, the first positioning piece 41 and the second positioning piece 42 are arranged side by side at both ends of the gasket assembly along the second direction y.

[0041] The fixture housing 1 is used to install and fix the gasket assembly. The wafer extraction slot 23 on the fixture housing 1 facilitates the extraction of the wafer from the fixture housing 1 after the detection is completed. The gasket assembly is used to fix the wafer, facilitating the detection of the wafer. The gasket is fixed to the wafer through the positioning piece during the detection of the wafer; by utilizing the positioning piece provided on the gasket assembly, the wafer to be detected is installed and fixed, facilitating the detection of the wafer, preventing the wafer from shifting during the detection process, resulting in inaccurate detection results. At the same time, the wafer extraction slot 23 is provided on the fixture housing 1, thereby facilitating the extraction of the wafer from the fixture housing 1 after the detection is completed, preventing damage to the wafer.

[0042] Continue to combine with the attached Figure 1 、attached Figure 3 and attached Figure 4 As shown, in some embodiments, the HC-49S wafer coating frequency detection fixture further includes detection pins. The detection pins include a first pin 31 and a second pin 32. The first pin 31 and the second pin 32 extend along the third direction z, and the first pin 31 and the second pin 32 are arranged side by side along the first direction x. The detection pins are used to conduct the wafer, thereby facilitating the detection of the frequency of the wafer.

[0043] Continue to combine with the attached Figure 1 、attached Figure 3 and attached Figure 4 As shown, in some embodiments, the first pin 31 conducts the first gasket 21, and the second pin 32 conducts the second gasket 22. The first pin 31 conducts the wafer through the first gasket 21, and the second pin 32 conducts the wafer through the second gasket 22, thereby detecting the wafer.

[0044] In some embodiments, pin through-holes are provided at the bottom of the fixture housing 1. The detection pins are arranged through the pin through-holes. The pin through-holes are used to lead out the detection pins, facilitating the connection to other devices and fixing the detection pins.

[0045] Continue to combine with the attached Figure 1 、attached Figure 3 and attached Figure 4 As shown, in some embodiments, the HC-49S wafer coating frequency detection fixture further includes a cover 5. The cover 5 is rotatably connected to the fixture housing 1. The cover 5 is used to cover the fixture housing 1, which helps to reduce interference to a certain extent during the detection of the wafer.

[0046] Continue to combine with the attached Figure 1 、attached Figure 3 and attached Figure 4As shown, in some embodiments, the HC-49S chip coating frequency detection fixture also includes a fixing spring, which is fixed on the cover body 5. When the cover body 5 is covered on the fixture shell 1, the fixing spring is arranged on the upper side of the gasket assembly. The positioning spring is used to apply a certain amount of force to the chip to ensure that the chip is always in contact with the detection pin during the detection process, thereby ensuring the accuracy of the detection result.

[0047] Continue to combine Figure 1 , Attachment Figure 3 and attached Figure 4 As shown, in some embodiments, the fixed spring includes a first spring and a second spring. When the cover body 5 is covered on the fixture housing 1, the first spring is arranged on the upper side of the first gasket 21, and the second spring is arranged on the upper side of the second gasket 22. The first spring is used to apply force to the first gasket 21 end of the chip, and the second spring is used to apply force to the second gasket 22 end of the chip, so that the chip is evenly stressed.

[0048] Continue to combine Figure 1 To Attachment Figure 3 As shown, in some embodiments, the HC-49S chip coating frequency detection fixture also includes a limit plate 7, and the limit plate 7 is arranged at the end of the positioning plate away from the first gasket 21. The limit plate 7 includes a first limit plate 71 and a second limit plate 72. The first limit plate 71 is arranged at the end of the first positioning plate 41 away from the first gasket, and the second limit plate 72 is arranged at the end of the second positioning plate 42 away from the first gasket 21. The limit plate 7 is used to prevent the chip from exceeding the range of the fixture housing 1, so as to facilitate the loading and removal of the chip when the chip is detected.

[0049] In summary, the utility model provides an HC-49S chip coating frequency detection jig, which uses the positioning piece arranged on the gasket assembly to install and fix the chip to be detected, so as to facilitate the detection of the chip and prevent the chip from being displaced during the detection process, resulting in inaccurate detection results. At the same time, a chip removal groove is arranged on the jig shell, so that after the detection is completed, the chip can be removed from the jig shell to prevent damage to the chip; the pin groove is matched with the chip removal groove to facilitate the removal of the chip from the gasket assembly; and a positioning spring is used to apply a certain amount of force to the chip to ensure that the chip is always in contact with the detection pin during the detection process, thereby ensuring the accuracy of the detection result.

[0050] The above embodiments are only for illustrating the technical concept and features of the present utility model. The purpose is to enable those who are familiar with this technology to understand the content of the present utility model and implement it, and it should not be used to limit the protection scope of the present utility model. Any equivalent changes or modifications made according to the spirit and essence of the present utility model should be covered within the protection scope of the present utility model.

Claims

1. An HC-49S wafer coating frequency detection jig, characterized in that, Including: A jig housing, the jig housing being a cuboid with openings at both ends and the top; A gasket assembly, the gasket assembly being disposed at the bottom of the jig housing, the gasket assembly including a first gasket and a second gasket, the first gasket and the second gasket being arranged side by side at both ends of the bottom of the jig housing along a first direction, the gasket assembly extending along a second direction, and a chip-taking groove being provided on the outer side of the gasket; A positioning piece, the positioning piece extending along the first direction, the positioning piece including a first positioning piece and a second positioning piece, the first positioning piece and the second positioning piece being arranged side by side at both ends of the gasket assembly along the second direction.

2. The HC-49S wafer coating frequency detection fixture according to claim 1, wherein It further includes detection pins, the detection pins including a first pin and a second pin, the first pin and the second pin extending along a third direction, and the first pin and the second pin being arranged side by side along the first direction.

3. The HC-49S wafer coating frequency detection fixture according to claim 2, wherein The first pin conducts the first gasket, and the second pin conducts the second gasket.

4. The HC-49S wafer coating frequency detection fixture according to claim 2, wherein Pin through-holes are provided at the bottom of the jig housing, and the detection pins are arranged through the pin through-holes.

5. The HC-49S wafer coating frequency detection fixture according to claim 1, wherein It further includes a cover body, and the cover body is rotatably connected to the jig housing.

6. The HC-49S wafer coating frequency detection fixture according to claim 5, wherein It further includes a fixing spring, the fixing spring being fixed on the cover body, and when the cover body covers the jig housing, the fixing spring is disposed on the upper side of the gasket assembly.

7. The HC-49S wafer coating frequency detection fixture according to claim 6, wherein The fixing spring includes a first spring and a second spring, and when the cover body covers the jig housing, the first spring is disposed on the upper side of the first gasket, and the second spring is disposed on the upper side of the second gasket.

8. The HC-49S wafer coating frequency detection fixture according to claim 1, wherein It further includes a limiting piece, the limiting piece being disposed at one end of the positioning piece away from the first gasket, the limiting piece including a first limiting piece and a second limiting piece, the first limiting piece being disposed at one end of the first positioning piece away from the first gasket, and the second limiting piece being disposed at one end of the second positioning piece away from the first gasket.

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