Diode conduction testing device

The integrated fixtures and protective cover in the diode testing device address the tangling and loss issues of data lines and probes, enhancing usability and efficiency by ensuring organized storage and protection.

CN223107968UActive Publication Date: 2025-07-15YANGXIN JINXIN ELECTRONICS
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Patent Information

Application Number
CN202421504255.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-06-28
Publication Date
2025-07-15
Estimated Expiration
2034-06-28

AI Technical Summary

Technical Problem

In the prior art, the data cable and the test pen are stored separately after use, which makes it take time to search for the next use, and the data cable is easily wound and knotted, affecting convenience.

Method used

A diode conduction testing device including a fixing device and a protection device is designed. The fixing device organizes data lines and test pens through components such as mounting plates, winding posts, fixing plates and bolts, and the protection device prevents dust from accumulating the jack through the rotary shaft and the protection plate.

Benefits of technology

It realizes convenient collection of data cables and test pens, avoids winding and knotting and loss, improves testing efficiency and usage effect, and protects the jacks and ensures normal use.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a diode conduction testing device, which relates to the technical field of diode conduction testing devices, and comprises a universal meter, the surface of the universal meter is fixedly connected with a display screen, the surface of the universal meter is fixedly connected with a plurality of buttons, the surface of the universal meter is rotatably connected with a knob, and the knob is fixedly connected with the display screen. The surface of the universal meter is provided with a plurality of jacks, the surface of the universal meter is plugged with two data lines at the positions of the jacks, and the other ends of the two data lines are respectively and fixedly connected with a test pen. The problems that a universal meter, a data line and a test pen are separately stored at the moment, time needs to be consumed for searching in the next time of use, and when the data line is wound, the data line can be staggered and knotted, normal use in the next time is influenced, and the use convenience of the universal meter is reduced are solved.
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Description

Technical Field

[0001] The utility model relates to the technical field of diode conduction testing devices, in particular to a diode conduction testing device. Background Art

[0002] During the use of a diode, in order to determine whether it is functioning properly, a multimeter is used to detect it, thereby testing whether the diode is conducting and can be used normally.

[0003] When conducting a conduction test on a traditional diode, first, the data lines on two test pens are inserted into the jacks of the multimeter, then the knob is rotated to the conduction test position, and then the two test pens are placed on both ends of the diode. Through the status display on the display screen, it is detected whether the diode is conducting. However, it is found in actual use that when the multimeter is used up, the data line is removed and then wound up. At this time, the multimeter, the data line, and the test pen are stored separately, resulting in the need to spend time searching for them during the next use. Moreover, when the data line is wound by itself, it will be intertwined and knotted, affecting the normal use during the next time and reducing the convenience of using the multimeter. Summary of the Utility Model

[0004] The purpose of the utility model is to solve the shortcomings in the prior art that when the multimeter is used up, the data line is removed and then wound up. At this time, the multimeter, the data line, and the test pen are stored separately, resulting in the need to spend time searching for them during the next use. Moreover, when the data line is wound by itself, it will be intertwined and knotted, affecting the normal use during the next time and reducing the convenience of using the multimeter, and to propose a diode conduction testing device.

[0005] To achieve the above purpose, the utility model adopts the following technical scheme: A diode conduction testing device includes a multimeter. A display screen is fixedly connected to the surface of the multimeter. A number of buttons are fixedly connected to the surface of the multimeter. A knob is rotatably connected to the surface of the multimeter. A number of jacks are opened on the surface of the multimeter. Two data lines are inserted at the positions of the jacks on the surface of the multimeter. The other ends of the two data lines are respectively fixedly connected with test pens. A fixing device is arranged on one side surface of the multimeter. The fixing device includes a mounting plate. The mounting plate is fixedly connected to one side surface of the multimeter. Two mounting blocks are fixedly connected to the surface of the mounting plate. Two mounting grooves are respectively opened on the surfaces of the two mounting blocks. Winding columns are respectively fixedly connected to one side of the two mounting blocks on the surface of the mounting plate. A fixing plate is rotatably connected to one side surface of the mounting plate. A bolt is threadedly connected through one side of the mounting plate. The bolt is threadedly connected to the surface of the fixing plate.

[0006] The effects achieved by the above components are as follows: When the multimeter is in use, it can better collect and organize, and it is not easy to entangle and knot the data cable, nor is it easy to cause the loss of the data cable and the test pen, which is convenient for the next use of the multimeter and improves the working efficiency and use effect of the diode conduction test.

[0007] Preferably, a rotary handle is fixedly connected to one side surface of the bolt, and a plurality of anti-slip protrusions are provided on the surface of the rotary handle.

[0008] The effects achieved by the above components are as follows: Through the setting of the rotary handle, when the bolt rotates to fix the fixing plate, it is more convenient and fast, which improves the convenience of winding the data cable and the test pen.

[0009] Preferably, a reinforcing plate is fixedly connected to one side surface of the fixing plate, and the reinforcing plate is a rubber plate.

[0010] The effects achieved by the above components are as follows: Through the setting of the reinforcing plate, the contact friction between the fixing plate and the data cable and the test pen is increased, and further the use effect of the fixing plate is improved.

[0011] Preferably, a limiting plate is fixedly connected to one side of the wire winding column on the surface of the mounting plate, and a plurality of uniformly distributed anti-slip stripes are provided on one side surface of the limiting plate.

[0012] The effects achieved by the above components are as follows: Through the setting of the limiting plate, when the data cable is wound around the wire winding column, it is more firmly wound and not easy to loosen, which improves the use effect of the fixing device.

[0013] Preferably, clamping grooves are respectively formed on both side surfaces of the fixing plate, and clamping blocks are clamped on the inner walls of the clamping grooves, and the clamping blocks are fixedly connected to the surface of the mounting plate.

[0014] The effects achieved by the above components are as follows: Through the clamping setting of the clamping block and the clamping groove, the position of the fixing plate is more stable and not easy to shake, and further the data cable and the test pen are better limited and fixed.

[0015] Preferably, a protection device is provided at the position of the jack on the surface of the multimeter. The protection device includes a rotating shaft frame fixedly connected to the surface of the multimeter. A protection plate is fixedly connected to the arc surface of the rotating shaft frame, and an operation block is fixedly connected to the surface of the protection plate.

[0016] The effects achieved by the above components are as follows: When the multimeter is stored idle, it is not easy for dust and impurities to enter the jack, which ensures the stable insertion of the data cable, so that the multimeter can be used normally and efficiently and stably conduct the diode conduction test.

[0017] Preferably, a padding is fixedly connected to one side surface of the protection plate, and the padding is a sponge pad.

[0018] The effect achieved by the above components is that through the setting of the padding, when the reinforcement plate contacts and presses on the surface of the multimeter, it is not easy to generate gaps, so as to better protect the jacks and make it more difficult for dust and impurities to enter the jacks.

[0019] Preferably, a fixing groove is formed on one side surface of the protection plate, and a screw is threadedly connected to the surface of the multimeter, and the screw is engaged with the inner wall of the fixing groove.

[0020] The effect achieved by the above components is that through the setting of the screw, the fixing plate can cover the surface of the jack more stably and is not easy to shake, improving the use effect of the protection plate.

[0021] Compared with the prior art, the advantages and positive effects of the present utility model are as follows:

[0022] In the present utility model, through the setting of the fixing device, when the multimeter is in use, it can be better collected and organized, the data cable is not easy to be entangled and knotted, and the loss of the data cable and the test pen is not likely to occur, which is convenient for the next use of the multimeter and improves the working efficiency and use effect of the diode conduction test. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a three-dimensional structure diagram of the present application;

[0024] Figure 2 is a three-dimensional structure diagram of the fixing device of the present application;

[0025] Figure 3 is of the present application Figure 2 side three-dimensional structure diagram;

[0026] Figure 4 is a three-dimensional structure diagram of the protection device of the present application.

[0027] Legend: 1. Multimeter; 2. Display screen; 3. Button; 4. Knob; 5. Jack; 6. Data cable; 7. Test pen; 8. Fixing device; 81. Mounting plate; 82. Mounting block; 83. Mounting groove; 84. Winding post; 85. Fixing plate; 86. Screw; 87. Rotating handle; 88. Reinforcement plate; 89. Block; 810. Slot; 811. Limiting plate; 9. Protection device; 91. Rotating shaft bracket; 92. Protection plate; 93. Operating block; 94. Bolt; 95. Fixing groove; 96. Padding. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0028] Example 1, as Figure 1As shown in the figure, a diode conduction test device includes a multimeter 1. A display screen 2 is fixedly connected to the surface of the multimeter 1. A number of buttons 3 are fixedly connected to the surface of the multimeter 1. A knob 4 is rotatably connected to the surface of the multimeter 1. A number of jacks 5 are provided on the surface of the multimeter 1. Two data lines 6 are inserted at the positions of the jacks 5 on the surface of the multimeter 1. The other ends of the two data lines 6 are respectively fixedly connected to test pens 7. A fixing device 8 is provided on one side surface of the multimeter 1. A protection device 9 is provided at the positions of the jacks 5 on the surface of the multimeter 1.

[0029] Refer to Figure 1 、 Figure 2 and Figure 3 As shown in the figure, in this embodiment: The fixing device 8 includes a mounting plate 81. The mounting plate 81 is fixedly connected to one side surface of the multimeter 1. Two mounting blocks 82 are fixedly connected to the surface of the mounting plate 81. Two mounting grooves 83 are respectively provided on the surfaces of the two mounting blocks 82. Winding posts 84 are respectively fixedly connected to one side of the two mounting blocks 82 on the surface of the mounting plate 81. A fixing plate 85 is rotatably connected to one side surface of the mounting plate 81. A bolt 94 is threadedly connected through one side of the mounting plate 81. The bolt 94 is threadedly connected to the surface of the fixing plate 85. When the multimeter 1 is used up and needs to be collected and sorted, first, the two data lines 6 are pulled out from the jacks 5, then the two test pens 7 are respectively clamped in the mounting grooves 83 on the two mounting blocks 82, and then the data lines 6 at one ends of the two test pens 7 are wound around the winding posts 84. After the winding is completed, the fixing plate 85 is rotated so that the fixing plate 85 contacts and presses on the test pens 7 and the data lines 6. Then the bolt 94 is threadedly connected to the mounting plate 81 until the bolt 94 is threadedly connected to the fixing plate 85. At this time, when the multimeter 1 is in use, it can be better collected and sorted, and the data lines 6 are not easily entangled and knotted, nor are the data lines 6 and the test pens 7 easily lost, which is convenient for the next use of the multimeter 1 and improves the working efficiency and use effect of the diode conduction test.

[0030] Refer to Figure 1 、 Figure 2 and Figure 3 As shown in the figure, in this embodiment: A rotating handle 87 is fixedly connected to one side surface of the bolt 94. A number of anti-slip protrusions are provided on the surface of the rotating handle 87. Through the setting of the rotating handle 87, when the bolt 94 rotates to fix the fixing plate 85, it is more convenient and fast, improving the convenience of winding the data lines 6 and the test pens 7. A reinforcing plate 88 is fixedly connected to one side surface of the fixing plate 85. The reinforcing plate 88 is a rubber plate. Through the setting of the reinforcing plate 88, the contact friction between the fixing plate 85 and the data lines 6 and the test pens 7 is increased, and further improves the use effect of the fixing plate 85.

[0031] Refer to Figure 1 、 Figure 2 andFigure 3 As shown in the figure, in this embodiment: on one side of the winding post 84 on the surface of the mounting plate 81, a limiting plate 811 is fixedly connected. A number of uniformly distributed anti-slip stripes are provided on one side surface of the limiting plate 811. Through the arrangement of the limiting plate 811, when the data cable 6 is wound around the winding post 84, it is more firmly wound and not prone to loosening, improving the use effect of the fixing device 8. On both side surfaces of the fixing plate 85, clamping grooves 810 are respectively provided. The inner wall of the clamping groove 810 is clamped with a clamping block 89, and the clamping block 89 is fixedly connected to the surface of the mounting plate 81. Through the clamping connection of the clamping block 89 and the clamping groove 810, the position of the fixing plate 85 is more stable and not prone to shaking, and thus better limits and fixes the data cable 6 and the test pen 7.

[0032] Refer to Figure 1 and Figure 4 As shown in the figure, in this embodiment: the protection device 9 includes a rotating shaft frame 91, and the rotating shaft frame 91 is fixedly connected to the surface of the multimeter 1. A protection plate 92 is fixedly connected to the arc surface of the rotating shaft frame 91, and an operation block 93 is fixedly connected to the surface of the protection plate 92. When the multimeter 1 is stored idle, pull the operation block 93 to make the protection plate 92 rotate, and then make the protection plate 92 rotate on the rotating shaft frame 91 until the protection plate 92 covers the surface of the jack 5. At this time, when the multimeter 1 is stored idle, it is not easy for dust and impurities to enter the jack 5, thus ensuring the stable insertion of the data cable 6, so that the multimeter 1 can be used normally and conduct the conduction test on the diode efficiently and stably.

[0033] Refer to Figure 1 and Figure 4 As shown in the figure, in this embodiment: a padding 96 is fixedly connected to one side surface of the protection plate 92, and the padding 96 is a sponge pad. Through the arrangement of the padding 96, when the reinforcement plate 88 contacts and presses on the surface of the multimeter 1, it is not easy to generate gaps, thus better protecting the jack 5 and making it more difficult for dust and impurities to enter the jack 5. A fixing groove 95 is provided on one side surface of the protection plate 92, and a screw 86 is threadedly connected to the surface of the multimeter 1. The screw 86 is engaged with the inner wall of the fixing groove 95. Through the arrangement of the screw 86, the fixing plate 85 covers the surface of the jack 5 more stably and is not prone to shaking, improving the use effect of the protection plate 92.

[0034] Working principle: When the multimeter 1 is being collected and sorted after use, first pull out the two data lines 6 from the jack 5, then respectively snap the two test pens 7 into the mounting grooves 83 on the two mounting blocks 82, then wind the data lines 6 at one end of the two test pens 7 around the winding posts 84. After the winding is completed, rotate the fixing plate 85 so that the reinforcing plate 88 on one side of the fixing plate 85 contacts and presses on the test pen 7 and the data line 6. Then rotate the handle 87 on the bolt 94 to thread-connect the bolt 94 to the mounting plate 81 until the bolt 94 is thread-connected to the fixing plate 85. At this time, when the multimeter 1 is in use, it can be better collected and sorted, the data line 6 is not easily wound and knotted, and the data line 6 and the test pen 7 are not easily lost, facilitating the next use of the multimeter 1 and improving the working efficiency and use effect of the diode conduction test.

[0035] When the multimeter 1 is stored idle, pull the operation block 93 to rotate the protection plate 92, so that the protection plate 92 rotates on the rotating shaft frame 91 until the protection plate 92 shields the surface of the jack 5. Then thread-connect the screw 86 to the multimeter 1 so that the screw 86 is engaged with the inner wall of the fixing groove 95 on the surface of the protection plate 92. At this time, when the multimeter 1 is stored idle, dust and impurities are not easily introduced into the jack 5, thus ensuring the stable insertion of the data line 6, so that the multimeter 1 can be used normally and conduct the diode conduction test efficiently and stably.

Claims

1. A diode conduction test device, comprising a multimeter (1), characterized in that: A display screen (2) is fixedly connected to the surface of the multimeter (1), several buttons (3) are fixedly connected to the surface of the multimeter (1), a knob (4) is rotatably connected to the surface of the multimeter (1), several jacks (5) are provided on the surface of the multimeter (1), two data lines (6) are plugged into the positions of the jacks (5) on the surface of the multimeter (1), the other ends of the two data lines (6) are respectively fixedly connected to test pens (7), a fixing device (8) is arranged on one side surface of the multimeter (1), the fixing device (8) includes a mounting plate (81), the mounting plate (81) is fixedly connected to one side surface of the multimeter (1), two mounting blocks (82) are fixedly connected to the surface of the mounting plate (81), two mounting grooves (83) are respectively provided on the surfaces of the two mounting blocks (82), winding posts (84) are fixedly connected to one side of the two mounting blocks (82) on the surface of the mounting plate (81), a fixing plate (85) is rotatably connected to one side surface of the mounting plate (81), a bolt (94) is threadedly connected through one side of the mounting plate (81), and the bolt (94) is threadedly connected to the surface of the fixing plate (85).

2. The diode conduction test device according to claim 1, wherein: A rotating handle (87) is fixedly connected to one side surface of the bolt (94), and several anti-slip protrusions are provided on the surface of the rotating handle (87).

3. The diode conduction test device according to claim 1, wherein: A reinforcing plate (88) is fixedly connected to one side surface of the fixing plate (85), and the reinforcing plate (88) is a rubber plate.

4. The diode conduction test device according to claim 1, wherein: A limiting plate (811) is fixedly connected to one side of the winding post (84) on the surface of the mounting plate (81), and several uniformly distributed anti-slip stripes are provided on one side surface of the limiting plate (811).

5. A diode conduction test device according to claim 1, characterized in that: Card slots (810) are respectively provided on both side surfaces of the fixing plate (85), and a card block (89) is clamped on the inner wall of the card slot (810), and the card block (89) is fixedly connected to the surface of the mounting plate (81).

6. The diode conduction test device according to claim 1, characterized in that: A protection device (9) is arranged at the position of the jack (5) on the surface of the multimeter (1), the protection device (9) includes a rotating shaft frame (91), the rotating shaft frame (91) is fixedly connected to the surface of the multimeter (1), a protection plate (92) is fixedly connected to the arc surface of the rotating shaft frame (91), and an operation block (93) is fixedly connected to the surface of the protection plate (92).

7. The diode conduction test device according to claim 6, wherein: A protective pad (96) is fixedly connected to one side surface of the protection plate (92), and the protective pad (96) is a sponge pad.

8. The diode conduction test device according to claim 6, characterized in that: A fixing groove (95) is provided on one side surface of the protection plate (92), a screw (86) is threadedly connected to the surface of the multimeter (1), and the screw (86) is clamped with the inner wall of the fixing groove (95).