Flower basket device

Abstract

The utility model discloses a flower basket device. The flower basket device comprises a supporting part, a limiting part and a positioning part, the limiting part is installed on the supporting part, the limiting part is provided with a containing area used for containing silicon wafers and measuring wafers, the positioning part comprises an inductor and a plurality of signal lamps, and the signal lamps are sequentially distributed on the limiting part in the silicon wafer containing direction. The sensor is electrically connected with the signal lamp, the sensor can record the position information of any signal lamp, and when the sensor performs signal interaction with external scanning equipment, the signal lamp can work to display the specific position of the measuring sheet in the accommodating area. According to the flower basket device, the position of the measuring piece on the flower basket can be rapidly and accurately positioned, the placing range of the measuring piece on the flower basket is increased, more comprehensive and accurate measuring data are obtained, and the monitoring capacity of a production line SPC is remarkably improved.

Description

Technical Field

[0001] The utility model relates to the technical field of photovoltaics, and particularly to a flower basket device. Background Art

[0002] When preparing HJT solar cells in the photovoltaic field, it is necessary to prepare a small and uniform "pyramid" textured structure on the silicon wafer, and then deposit an intrinsic amorphous silicon thin film and N-type and P-type amorphous silicon thin films on the front and back of the silicon wafer respectively. Therefore, in the production process of HJT solar cells, the cleaning and texturing of silicon wafers are particularly important for the monitoring of the production line SPC (Statistical Process Control). During the production and experimental processes, data is usually measured by placing measurement wafers, so as to monitor the production line SPC and obtain experimental data. The existing data measurement method places the measurement wafers at indefinite positions on the flower basket, and measures the measurement wafers after texturing is completed, so as to monitor the production line SPC. At present, in order to facilitate positioning the position of the measurement wafer, operators usually place the measurement wafer at the edge of the flower basket. However, different positions in the flower basket will cause a certain degree of difference in the reaction degree between the silicon wafer and the chemical solution. Therefore, placing the measurement wafer at the edge of the flower basket in the traditional technology will result in incomplete measurement data and cannot effectively control the process. Summary of the Utility Model

[0003] Based on this, it is necessary to provide a flower basket device. The flower basket device of the utility model can quickly and accurately locate the position of the measurement wafer on the flower basket, increase the placement range of the measurement wafer on the flower basket, obtain more comprehensive and accurate measurement data, and significantly improve the monitoring ability of the production line SPC.

[0004] An embodiment of the present application provides a flower basket device.

[0005] A flower basket device includes a support member, a limiting member, and a positioning member. The limiting member is installed on the support member, and a receiving area for placing silicon wafers and measurement wafers is provided on the limiting member. The positioning member includes a sensor and a plurality of signal lights. The plurality of signal lights are sequentially distributed on the limiting member along the silicon wafer placement direction. The sensor is electrically connected to the signal lights. The sensor can record the position information of any one of the signal lights. When the sensor interacts with a scanning device, the signal light corresponding to the position of the measurement wafer can work to indicate the specific position of the measurement wafer in the receiving area.

[0006] In some embodiments, the support member includes a first bracket and a second bracket that are opposite and spaced apart, and the limiting member is connected between the first bracket and the second bracket.

[0007] In some of these embodiments, the limiting member includes a plurality of limiting bars, and a plurality of limiting teeth are provided on the limiting bars. The plurality of limiting bars are connected between the first bracket and the second bracket, and the plurality of limiting bars enclose and extend into the accommodating area. The limiting teeth on each of the limiting bars face the accommodating area, and the plurality of limiting teeth on each of the limiting bars correspond one by one. A limiting groove for accommodating a single silicon wafer or a measuring piece is formed between two adjacent limiting teeth.

[0008] In some of these embodiments, at least one pair of the limiting bars are connected to the first bracket and the second bracket to limit the silicon wafer or the measuring piece from both sides of the silicon wafer or the measuring piece, and at least one of the limiting bars is connected to the bottom positions of the first bracket and the second bracket to limit the silicon wafer or the measuring piece from the bottom of the silicon wafer or the measuring piece.

[0009] In some of these embodiments, at least two pairs of the limiting bars are distributed along the height direction of the first bracket and the second bracket. A plurality of the signal lights are connected to one of the limiting bars, and the plurality of signal lights are sequentially distributed along the length direction of the limiting bar.

[0010] In some of these embodiments, the distance between each pair of the limiting bars is greater than or equal to the width of the silicon wafer.

[0011] In some of these embodiments, the width of the limiting groove formed between two adjacent limiting teeth is greater than the thickness of a single silicon wafer and less than the sum of the thicknesses of two silicon wafers.

[0012] In some of these embodiments, the end of the limiting tooth away from the limiting bar has a pointed structure.

[0013] In some of these embodiments, the flower basket device further includes a pressing member, the pressing member is detachably connected to the supporting member, and the pressing member is used to limit the silicon wafer or the measuring piece from the top of the accommodating area.

[0014] In some of these embodiments, a clamping groove for placing the pressing member is provided on the supporting member;

[0015] And / or, a plurality of pressing teeth are provided on the pressing member and are sequentially distributed along its length direction.

[0016] The above flower basket device has a simple structure, is convenient to use, has high positioning accuracy and high efficiency, can meet the requirements of large-scale production of photovoltaic modules, has a tighter process control for silicon wafer production, strengthens the monitoring intensity of the production line SPC, and improves production efficiency and production quality. Description of the Drawings

[0017] To more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the accompanying drawings required for the description of the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those skilled in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0018] To more fully understand the present application and its beneficial effects, the following will be described in conjunction with the accompanying drawings. Among them, the same reference numerals in the following description represent the same parts.

[0019] Figure 1 Schematic diagram of a flower basket device according to an embodiment of the present utility model;

[0020] Figure 2 Partial structural schematic diagram of the flower basket device according to an embodiment of the present utility model after placing silicon wafers and measurement wafers.

[0021] Explanation of reference numerals

[0022] 10. Flower basket device; 100. Support member; 110. First bracket; 120. Second bracket; 130. Card slot; 200. Limit strip; 210. Limit teeth; 310. Inductor; 320. Signal lamp; 400. Pressing member; 410. Pressing teeth; 500. Accommodation area; 20. Silicon wafer; 30. Measurement wafer. Detailed implementation manners

[0023] To make the above objects, features and advantages of the present utility model more obvious and understandable, the following will give a detailed description of the specific implementation manners of the present utility model in conjunction with the accompanying drawings. Many specific details are set forth in the following description in order to fully understand the present utility model. However, the present utility model can be implemented in many other ways different from those described herein. Those skilled in the art can make similar improvements without departing from the connotation of the present utility model. Therefore, the present utility model is not limited by the specific embodiments disclosed below.

[0024] In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present utility model.

[0025] In the present utility model, unless otherwise clearly defined and limited, terms such as "installation", "connection", "attachment", "fixation", etc. shall be construed in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral one; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium, and it may be the communication inside two components or the interaction relationship between two components, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0026] In the present utility model, unless otherwise clearly defined and limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0027] In the description of the present utility model, the meaning of "several" is more than one, the meaning of "multiple" is more than two, and understandings such as "greater than", "less than", "exceeding", etc. do not include the number itself, while understandings such as "above", "below", "within", etc. include the number itself. If there is a description of "first" and "second", it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence relationship of the indicated technical features.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present utility model belongs. The terms used herein in the specification of the present utility model are only for the purpose of describing specific embodiments, and are not intended to limit the present utility model. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0029] The embodiment of the present application provides a flower basket device 10 to solve the problems in the prior art that in the process of texturing and cleaning, placing the measurement piece 30 at the edge of the flower basket to obtain measurement data results in incomplete measurement data and ineffective monitoring of the process. The flower basket device 10 will be described below with reference to the accompanying drawings.

[0030] The flower basket device 10 provided by the embodiment of the present application, for example, please refer to Figure 1 as shown Figure 1The figure is a schematic structural diagram of the flower basket device 10 provided by the embodiment of the present application. The flower basket device 10 of the present application can be used to measure data during the process of silicon wafer texturing and cleaning in production and experiments, so as to monitor the SPC of the production line and obtain accurate experimental data.

[0031] It should be noted that the size (length, width, and thickness) of the measurement wafer 30 in the present application is basically the same as that of the silicon wafer 20, the structure of the measurement wafer 30 is the same as that of the silicon wafer 20, and the measurement wafer 30 is used for measurement.

[0032] In order to more clearly illustrate the structure of the flower basket device 10, the flower basket device 10 will be introduced below in conjunction with the accompanying drawings. Exemplarily, please refer to Figure 1 As shown, a flower basket device 10 includes a support member 100, a limiting member, and a positioning member. The limiting member is installed on the support member 100. A receiving area 500 for placing the silicon wafer 20 and the measurement wafer 30 is provided on the limiting member. The positioning member includes a sensor 310 and a plurality of signal lights 320. The plurality of signal lights 320 are sequentially distributed along the placement direction of the silicon wafer 20 on the limiting member. The sensor 310 is electrically connected to the signal lights 320. The sensor 310 can record the position information of any signal light 320. When the sensor 310 interacts with the scanning device, the signal light 320 corresponding to the position of the measurement wafer 30 can work to indicate the specific position of the measurement wafer 30 in the receiving area 500. It should be noted that the placement direction of the silicon wafer 20 refers to the distribution direction when a plurality of silicon wafers are spaced apart.

[0033] The above flower basket device 10 has a simple structure and is convenient to use. The measurement wafer 30 can be placed at any position in the receiving area 500 of the flower basket device 10. The placement efficiency of the measurement wafer 30 is high, and the position can be quickly located with high positioning accuracy, which can meet the needs of large-scale production, control the process of silicon wafer 20 cleaning and texturing more tightly, strengthen the monitoring of the production line SPC, and improve production efficiency and production quality.

[0034] In some of the embodiments, the support member 100 includes a first bracket 110 and a second bracket 120. The first bracket 110 and the second bracket 120 are opposite and spaced apart. The limiting member is connected between the first bracket 110 and the second bracket 120.

[0035] In some of these embodiments, the limiting member includes a plurality of limiting bars 200. A plurality of limiting teeth 210 are provided on the limiting bars 200. The plurality of limiting bars 200 are connected between the first bracket 110 and the second bracket 120. An accommodating area 500 is defined between the plurality of limiting bars 200. The limiting teeth 210 on each of the limiting bars 200 extend towards the accommodating area 500. The plurality of limiting teeth 210 on each of the limiting bars 200 correspond one by one. A limiting groove for accommodating a single silicon wafer 20 or a measurement wafer 30 is formed between two adjacent limiting teeth 210. Correspondingly, signal lights 320 are respectively provided on the limiting bars 200 corresponding to the limiting grooves. Such an arrangement can accurately indicate the placement position of the measurement wafer 30 through the working signal lights 320.

[0036] The distance between the first bracket 110 and the second bracket 120 can be set as needed. Correspondingly, since the limiting bars 200 are connected between the first bracket 110 and the second bracket 120, the number of limiting teeth 210 on the limiting bars 200 is set according to the distance between the first bracket 110 and the second bracket 120. Or, conversely, the distance between the first bracket 110 and the second bracket 120 can be set according to the number of limiting teeth 210 on the limiting bars 200.

[0037] In some of these embodiments, at least a pair of limiting bars 200 are connected to the middle positions of the first bracket 110 and the second bracket 120 in the height direction to limit the silicon wafer 20 or the measurement wafer 30 from both sides of the silicon wafer 20 or the measurement wafer 30. At least one limiting bar 200 is connected to the bottom positions of the first bracket 110 and the second bracket 120 in the height direction to limit the silicon wafer 20 or the measurement wafer 30 from the bottom of the silicon wafer 20 or the measurement wafer 30. It should be noted that the "both sides" in limiting the silicon wafer 20 or the measurement wafer 30 from both sides refers to the two side positions of the silicon wafer 20 or the measurement wafer 30 after being vertically placed perpendicular to the horizontal along the Figure 1 shown angle, that is, limiting the silicon wafer 20 and the measurement wafer 30 in the horizontal direction. The "bottom" in limiting the silicon wafer 20 or the measurement wafer 30 from the bottom of the silicon wafer 20 or the measurement wafer 30 refers to the bottom position of the silicon wafer 20 or the measurement wafer 30 after being vertically placed perpendicular to the horizontal along the Figure 1 shown angle, that is, limiting the silicon wafer 20 and the measurement wafer 30 in the vertical direction.

[0038] In some of these embodiments, as shown in Figure 1 at least two pairs of limiting bars 200 are distributed along the height direction of the first bracket 110 and the second bracket 120. A plurality of signal lights 320 are connected to one of the limiting bars 200, and the plurality of signal lights 320 are sequentially distributed along the length direction of the limiting bar 200.

[0039] In some of these embodiments, the distance between each pair of limiting bars 200 is greater than or equal to the width of the silicon wafer 20. With such a setting, it can be ensured that the silicon wafer 20 or the measurement wafer 30 is placed into the accommodating area 500.

[0040] In some of these embodiments, the width of the limiting groove formed between two adjacent limiting teeth 210 is greater than the thickness of a single silicon wafer 20 and less than the sum of the thicknesses of two silicon wafers 20. With such a setting, it is ensured that a single silicon wafer 20 or a single measurement wafer 30 is placed in each limiting groove.

[0041] In some of these embodiments, the end of the limiting tooth 210 away from the limiting bar 200 is in a pointed structure. The setting of the end of the limiting bar 200 in a pointed structure facilitates the placement of the silicon wafer 20 or the measurement wafer 30 into each limiting groove.

[0042] In some of these embodiments, the flower basket device 10 further includes a pressing member 400. The pressing member 400 is detachably connected to the supporting member 100. The pressing member 400 is used to limit the silicon wafer 20 and the measurement wafer 30 from the top of the accommodating area 500, and the pressing member 400 limits the silicon wafer 20 and / or the measurement wafer 30 in the vertical direction.

[0043] In some of these embodiments, a clamping groove 130 for placing the pressing member 400 is provided on the supporting member 100.

[0044] In some of these embodiments, referring to Figure 1 As shown, a plurality of pressing teeth 410 are provided on the pressing member 400 and are sequentially distributed along its length direction.

[0045] Referring to Figure 1 As shown, there are two pairs of limiting bars 200 distributed vertically. A limiting bar 200 is provided at the bottom of these two pairs of limiting bars 200. In Figure 1 this case, the limiting bar 200 at the bottom is used to limit the silicon wafer 20 and the measurement wafer 30 from the bottom, and the pressing member 400 is arranged on the tops of the first bracket 110 and the second bracket 120. The number of limiting teeth 210 on each limiting bar 200 is the same as the number of pressing teeth 410 on the pressing member 400, and the multiple limiting teeth 210 on each limiting bar 200 and the multiple pressing teeth 410 on the pressing member 400 correspond one by one. With such a setting, it is ensured that each silicon wafer 20 or measurement wafer 30 is arranged in a limiting groove.

[0046] In some of these embodiments, the flower basket device 10 of the present application further includes a scanning device. The scanning device can be electrically connected to the sensor 310 of the flower basket device 10 to achieve communication. The sensor 310 has functions such as signal transmission and information recording.

[0047] In some of these embodiments, the flower basket device 10 of the present application further includes a control mechanism, which is electrically connected to the sensor 310, the signal lamp 320, and the scanning device. The control mechanism can be a PLC programmable logic controller. The control mechanism can enable communication between the sensor 310, the signal lamp 320, and the scanning device. The control mechanism can control the sensor 310, the signal lamp 320, and the scanning device to work.

[0048] See Figure 2 as shown Figure 2 is a partial structural schematic diagram of the flower basket device 10 of an embodiment of the present utility model after placing the silicon wafer 20 and the measurement wafer 30. After placing the silicon wafer 20 and the measurement wafer 30, there is a signal lamp 320 corresponding to the position of the measurement wafer 30. The position of the measurement wafer 30 can be located according to the signal lamp 320, avoiding confusion between the measurement wafer 30 and the silicon wafer 20, which is easy for the operator to locate. The measurement wafer 30 can be arranged at various positions such as the edge position and the middle position of the accommodating area 500, expanding the placement range of the measurement wafer 30, improving the positioning speed of the measurement wafer 30, and also improving the measurement accuracy.

[0049] When the above-mentioned flower basket device 10 is in use, first, the accommodating area 500 of the flower basket device 10 is fully loaded with silicon wafers 20, and then the silicon wafer 20 at the position where the measurement wafer 30 is to be placed is taken out, making the position vacant. The flower basket device 10 is placed in the scanning and sensing area of the loading table, and the flower basket device 10 is scanned by the scanning device. After the sensor 310 senses the scanning device, the sensor 310 records the position information of the signal lamp 320 at the above-mentioned vacant position, and the sensor 310 transmits the position information of the signal lamp 320 at the vacant position to the scanning device. Then, the measurement wafer 30 is placed at the above-mentioned vacant position for texturing. After the texturing is completed, the flower basket device 10 is placed in the scanning and sensing area of the unloading table, and the flower basket device 10 is scanned by the scanning device. After the sensor 310 senses the scanning device, the control mechanism controls the signal lamp 320 corresponding to the position of the measurement wafer 30 to work. For example, the signal lamp 320 turns red to indicate the specific position of the measurement wafer 30.

[0050] In this application, the silicon wafer 20 and the measurement wafer 30 are placed in the accommodation area 500 inside the flower basket. The measurement wafer 30 can be placed at any position. After the flower basket device 10 and the silicon wafer 20 undergo the texturing process, upon completion of the texturing, the inductor 310 on the flower basket device 10 is scanned by a scanning device. The inductor 310 forms an electrical signal path with the scanning device, and the inductor 310 interacts with the signal lamp 320. The signal lamp 320 corresponding to the placement position of the measurement wafer 30 operates. For example, the signal lamp 320 turns red, thus accurately positioning the position of the measurement wafer 30, facilitating the operator to quickly take out the measurement wafer 30. Then, by measuring the differences before and after texturing of the measurement wafers 30 at different positions, measurement data is summarized to control the texturing process and effectively monitor the SPC of the production line, improving the production quality.

[0051] In summary, the above flower basket device 10 can quickly and accurately locate the position of the measurement wafer 30, increase the placement range of the measurement wafer 30 on the flower basket device 10, obtain more comprehensive and accurate data, and significantly improve the monitoring ability of the SPC of the production line.

[0052] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0053] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as within the scope described in this specification.

[0054] The above embodiments only represent several implementation manners of the present invention. The descriptions are relatively specific and detailed, but should not be construed as limiting the scope of the patent of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention should be subject to the appended claims.

Claims

1. A flower basket device (10), characterized in that, It includes a support member (100), a limiting member, and a positioning member. The limiting member is installed on the support member (100). A receiving area (500) for placing a silicon wafer (20) and a measuring wafer (30) is provided on the limiting member. The positioning member includes an inductor (310) and a plurality of signal lights (320). The plurality of signal lights (320) are sequentially distributed along the placement direction of the silicon wafer (20) on the limiting member. The inductor (310) is electrically connected to the signal lights (320). The inductor (310) can record the position information of any one of the signal lights (320). When the inductor (310) conducts signal interaction with a scanning device, the signal light (320) corresponding to the position of the measuring wafer (30) can work to indicate the specific position of the measuring wafer (30) in the receiving area (500).

2. The flower basket device (10) according to claim 1, characterized in that, The support member (100) includes a first bracket (110) and a second bracket (120) that are opposite and spaced apart. The limiting member is connected between the first bracket (110) and the second bracket (120).

3. The flower basket device (10) according to claim 2, characterized in that, The limiting member includes a plurality of limiting bars (200). A plurality of limiting teeth (210) are provided on the limiting bars (200). The plurality of limiting bars (200) are connected between the first bracket (110) and the second bracket (120). The plurality of limiting bars (200) enclose the receiving area (500). The limiting teeth (210) on each of the limiting bars (200) extend towards the receiving area (500). The plurality of limiting teeth (210) on each of the limiting bars (200) correspond one by one. A limiting groove for receiving a single silicon wafer (20) or a measuring wafer (30) is formed between two adjacent limiting teeth (210).

4. The flower basket device (10) according to claim 3, characterized in that, At least one pair of the limiting bars (200) are connected to the first bracket (110) and the second bracket (120) to limit the silicon wafer (20) or the measuring wafer (30) from both sides of the silicon wafer (20) or the measuring wafer (30). At least one of the limiting bars (200) is connected to the bottom positions of the first bracket (110) and the second bracket (120) to limit the silicon wafer (20) or the measuring wafer (30) from the bottom of the silicon wafer (20) or the measuring wafer (30).

5. The flower basket device (10) according to claim 4, characterized in that, At least two pairs of the limiting bars (200) are distributed along the height direction of the first bracket (110) and the second bracket (120). A plurality of the signal lights (320) are connected to one of the limiting bars (200). The plurality of signal lights (320) are sequentially distributed along the length direction of the limiting bar (200).

6. The flower basket device (10) according to any one of claims 4 to 5, characterized in that, The distance between each pair of the limiting bars (200) is greater than or equal to the width of the silicon wafer (20).

7. The flower basket device (10) according to any one of claims 3 to 5, characterized in that, The width of the limiting groove formed between two adjacent limiting teeth (210) is greater than the thickness of a single silicon wafer (20) and less than the sum of the thicknesses of two silicon wafers (20).

8. The flower basket device (10) according to any one of claims 3 to 5, characterized in that, One end of the limiting tooth (210) away from the limiting strip (200) is in a pointed structure.

9. The flower basket device (10) according to any one of claims 1 to 5, characterized in that The flower basket device (10) further includes a pressing member (400). The pressing member (400) is detachably connected to the supporting member (100). The pressing member (400) is used to limit the silicon wafer (20) or the measuring piece (30) from the top of the accommodating area (500).

10. The flower basket device (10) according to claim 9, characterized in that, A clamping groove (130) for placing the pressing member (400) is provided on the supporting member (100); And / or, a plurality of pressing teeth (410) are arranged on the pressing member (400) in sequence along its length direction.

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