Test fixture for inductance coil

Abstract

The utility model provides an inductance coil test fixture, relates to the inductance coil test field, and comprises a test fixture body and a bridge tester, the upper end face of the test fixture body is provided with the bridge tester, the groove wall of the test fixture body is connected with an adjusting frame through a screw rod elevating mechanism, and the adjusting frame is provided with a screw rod elevating mechanism. A limiting plate is connected to the inner side of the adjusting frame through a first electric push rod, an infrared emitter is embedded in the side end face of the limiting plate, a pin touch plate is clamped to the limiting plate through an adjusting groove, the side end of the pin touch plate is connected with the limiting plate through a second electric push rod, and a detection contact is embedded in the upper plate face of the pin touch plate. According to the utility model, the problem that the pin insertion position of the inductance coil is limited because the pin port in the adjusting plate is located at the fixed hole position in the prior art is solved.

Description

Technical Field

[0001] The utility model relates to the field of inductance coil testing, and particularly relates to a testing fixture for inductance coils. Background Art

[0002] An inductance coil is an electronic component mainly composed of a winding and a magnetic core. Usually, the inductance coil is a spiral structure formed by winding conductors around the magnetic core. When the voltage changes, it will generate a back electromotive force to offset the change in current, thereby playing a role in stabilizing the voltage. There are many types of inductance coils, and common ones include common-mode chokes, etc. Before leaving the factory, it is necessary to test whether the produced inductance coils meet the standards. After retrieval, in the prior art (publication number: CN202322438835.2) for an inductance coil testing fixture, it is recorded that "by setting an adjusting mechanism in the present utility model, when using the inductance coil testing fixture, first, it is necessary to adjust the adjusting mechanism according to the size of the inductance coil base. At this time, the lever can be toggled with both hands first, and then the lever will drive the adjusting rod inside the side groove to move. Subsequently, the adjusting rod can effectively drive the adjusting plate inside the adjusting groove to move forward or backward. Since the inductance coil base is provided with four pins, as long as the pin holes are adjusted to a suitable width according to the width of the pins, through the above settings, it can be ensured that pins with different widths can be effectively inserted directly into the inside of the pin holes", but in the prior art, the pin holes in the adjusting plate are at fixed positions, resulting in the problem that the insertion positions of the pins of the inductance coil are limited. Summary of the Utility Model

[0003] In order to overcome the defects existing in the prior art, a testing fixture for inductance coils is provided to solve the problem that in the prior art, the pin holes in the adjusting plate are at fixed positions, resulting in the limited insertion positions of the pins of the inductance coil.

[0004] To achieve the above object, a testing fixture for inductance coils is provided, including: a testing fixture body and a bridge tester. The bridge tester is placed on the upper end surface of the testing fixture body.

[0005] The inner wall of the groove of the testing fixture body is connected with an adjusting frame through a screw rod lifting mechanism. The inner side of the adjusting frame is connected with a limiting plate through a first electric push rod. An infrared emitter is embedded on the side end face of the limiting plate. The limiting plate is connected with a pin contact plate through an adjusting groove. The side end of the pin contact plate is connected with the limiting plate through a second electric push rod. A detection contact is embedded on the upper surface of the pin contact plate.

[0006] Further, a screw rod is installed in the upper support groove of the testing fixture body. The front end of the screw rod is connected with an upper pressing plate, and a rubber pad is adhered to the lower surface of the upper pressing plate.

[0007] Furthermore, an adjusting column is connected to the lower end of the screw lifting mechanism; and the adjusting column is located at the lower end surface of the test fixture body, and limit plates are symmetrically distributed on the left and right sides of the screw lifting mechanism.

[0008] Furthermore, an infrared transmitter is embedded and installed on one side of the limit plate, and a receiver is embedded and fixed on the side of the pin contact plate; and the receiver corresponds to the infrared transmitter.

[0009] Furthermore, two groups of adjustment grooves are opened on the surface of the limit plate; and pin contact plates are inserted into the adjustment grooves. The limit plate is an L-shaped metal plate body that is clamped on the inner side of the adjustment frame.

[0010] Furthermore, the lower end of the detection contact is connected to a bridge tester through an electric wire, and the second electric push rod is distributed throughout the front and rear side frame walls of the adjustment frame.

[0011] Furthermore, the limit plate, the adjustment frame, the infrared transmitter, the first electric push rod, the pin contact plate, the second electric push rod and the detection contact constitute an adjustable test mechanism of the test fixture body.

[0012] The beneficial effect of the utility model is that the test fixture of the inductor coil of the utility model utilizes the limit plate in the adjustment frame to connect with the pins of the inductor coil, and the electric push rod pushes the pin contact plate in the adjustment limit plate groove to move to the bottom of the pin of the inductor coil, so that the detection contact on the surface of the pin contact plate is in contact and connected with the pin, which is convenient for more flexible adjustment of the test position of the inductor coil pin, convenient for the test fixture to test inductor coils of different sizes, enhances the adjustment performance of the test fixture, and improves the practicability of the test fixture of the inductor coil. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a front view structural schematic diagram of the inductor coil test fixture according to an embodiment of the utility model.

[0014] Figure 2 It is a front view cross-sectional structural schematic diagram of the inductor coil test fixture according to an embodiment of the utility model.

[0015] Figure 3 It is a schematic diagram of the front cross-sectional structure of the limiting plate according to an embodiment of the utility model.

[0016] Figure 4 The figure is a schematic diagram of the top structure of the limiting plate according to the embodiment of the utility model.

[0017] In the figure: 1. Test fixture body; 11. Adjusting column; 12. Screw rod lifting mechanism; 2. Bridge tester; 3. Upper pressing plate; 31. Screw rod; 32. Rubber pad; 4. Limiting plate; 41. Adjusting frame; 42. First electric push rod; 43. Infrared emitter; 44. Adjusting groove; 5. Pin contact plate; 51. Receiver; 52. Second electric push rod; 53. Detection contact. Detailed implementation mode

[0018] Refer to Figures 1 to 4 As shown, the present utility model provides a test fixture for an inductance coil, including: a test fixture body 1 and a bridge tester 2. The bridge tester 2 is placed on the upper end surface of the test fixture body 1.

[0019] The inner wall of the groove of the test fixture body 1 is connected with an adjusting frame 41 through a screw rod lifting mechanism 12. The inner side of the adjusting frame 41 is connected with a limiting plate 4 through a first electric push rod 42. An infrared emitter 43 is embedded in the side end face of the limiting plate 4. The limiting plate 4 is clamped with a pin contact plate 5 through an adjusting groove 44. The side end of the pin contact plate 5 is connected with the limiting plate 4 through a second electric push rod 52. A detection contact 53 is embedded on the upper plate surface of the pin contact plate 5.

[0020] First, place the inductance coil to be tested on the surface of the test fixture body 1, press the upper pressing plate 3 on the surface of the inductance coil, then rotate the adjusting column 11 to drive the adjusting frame 41 to move upward, so that the limiting plate 4 approaches the pins of the inductance coil. After controlling the first electric push rod 42 to push the limiting plate 4 to be attached to the side of the pins of the inductance coil, the pin contact plate 5 starts to move until it stops moving when the receiver 51 can no longer receive the infrared signal. At this time, the pin contact plate 5 is directly below the pins of the inductance coil. Then rotate the adjusting column 11 again to make the detection contact 53 of the pin contact plate 5 contact and connect with the pins, and then the test can be carried out.

[0021] In this embodiment, a screw rod 31 is installed in the upper support groove of the test fixture body 1. The front end of the screw rod 31 is connected with an upper pressing plate 3. A rubber pad 32 is adhered to the lower surface of the upper pressing plate 3.

[0022] As a preferred implementation mode, the rotation of the screw rod 31 drives the upper pressing plate 3 to move up and down, so that the upper pressing plate 3 presses on the surface of the inductance coil to be tested, ensuring the stability of the inductance coil tested on the test fixture body 1.

[0023] In this embodiment, the lower end of the screw rod lifting mechanism 12 is connected with an adjusting column 11; and the adjusting column 11 is located at the lower end surface of the test fixture body 1. The limiting plates 4 are symmetrically distributed on the left and right sides of the screw rod lifting mechanism 12.

[0024] As a preferred embodiment, the adjusting column 11 facilitates driving the screw rod lifting mechanism 12 to move up and down, which is convenient for adjusting the height of the limiting plate 4. The symmetrically distributed limiting plates 4 press the inductance coil pins towards the test fixture body 1, so that the limiting plates 4 can receive the inductance coil pins.

[0025] In this embodiment, an infrared emitter 43 is embedded on one side of the limiting plate 4, and a receiver 51 is fixedly embedded on the side surface of the pin contact plate 5; and the receiver 51 corresponds to the infrared emitter 43. Two sets of adjusting grooves 44 are formed on the surface of the limiting plate 4; and the pin contact plate 5 is inserted into the adjusting grooves 44, and the limiting plate 4 is an L-shaped metal plate body clamped inside the adjusting frame 41. The lower end of the detection contact 53 is electrically connected to a bridge tester 2 through a wire, and the second electric push rod 52 is distributed through the front and rear side walls of the adjusting frame 41.

[0026] As a preferred embodiment, the infrared emitter 43 emits an infrared beam. When the receiver 51 receives the infrared signal, the pin contact plate 5 is in a moving state. When the infrared beam is blocked by the inductance coil pins and the receiver 51 cannot receive it, the pin contact plate 5 stops moving. At this time, the detection contact 53 on the surface of the pin contact plate 5 is located at the lower end of the inductance coil pins. Slightly lifting the limiting plate 4 can make the detection contact 53 contact the inductance coil pins, and the bridge tester 2 is electrically connected to the inductance coil to test the inductance coil.

[0027] In this embodiment, the limiting plate 4, the adjusting frame 41, the infrared emitter 43, the first electric push rod 42, the pin contact plate 5, the second electric push rod 52, and the detection contact 53 constitute an adjustable test mechanism of the test fixture body 1.

[0028] As a preferred embodiment, the adjustable test mechanism of the test fixture body 1 facilitates more flexible adjustment of the test position of the inductance coil pins, which is convenient for the test fixture to test inductance coils of different sizes and enhances the adjustment performance of the test fixture.

[0029] The test fixture for the inductance coil of the present utility model can effectively solve the problem in the prior art that the pin holes in the adjusting plate are in fixed positions, resulting in limited insertion positions of the inductance coil pins. It is convenient to more flexibly adjust the test position of the inductance coil pins, which is convenient for the test fixture to test inductance coils of different sizes, enhances the adjustment performance of the test fixture, improves the practicability of the test fixture for the inductance coil, and is applicable to the test fixture for the inductance coil.

Claims

1. A test fixture for an inductance coil, comprising: A test fixture body (1) and a bridge tester (2), the bridge tester (2) is placed on the upper end surface of the test fixture body (1), and it is characterized in that: The groove wall of the test fixture body (1) is connected with an adjustment frame (41) through a screw rod lifting mechanism (12). The inner side of the adjustment frame (41) is connected with a limiting plate (4) through a first electric push rod (42). An infrared emitter (43) is embedded in the side end surface of the limiting plate (4). The limiting plate (4) is clamped with a pin contact plate (5) through an adjustment groove (44). The side end of the pin contact plate (5) is connected with the limiting plate (4) through a second electric push rod (52). A detection contact (53) is inlaid on the upper plate surface of the pin contact plate (5).

2. The test fixture for an inductance coil according to claim 1, wherein A screw rod (31) is installed in the upper support groove of the test fixture body (1). The front end of the screw rod (31) is connected with an upper pressing plate (3). A rubber pad (32) is adhered to the lower surface of the upper pressing plate (3).

3. The test fixture for an inductance coil according to claim 1, wherein The lower end of the screw rod lifting mechanism (12) is connected with an adjustment column (11); and the adjustment column (11) is located at the lower end surface of the test fixture body (1). The limiting plates (4) are symmetrically distributed on the left and right sides of the screw rod lifting mechanism (12).

4. The test fixture for an inductance coil according to claim 1, characterized in that, An infrared emitter (43) is embedded in one side of the limiting plate (4). A receiver (51) is fixedly embedded on the side surface of the pin contact plate (5); and the receiver (51) corresponds to the infrared emitter (43).

5. The test fixture for an inductance coil according to claim 1, characterized in that, Two groups of adjustment grooves (44) are formed on the surface of the limiting plate (4); and the pin contact plate (5) is inserted into the adjustment grooves (44). The limiting plate (4) is an L-shaped metal plate body clamped inside the adjustment frame (41).

6. The test fixture for an inductance coil according to claim 1, characterized in that The lower end of the detection contact (53) is connected with the bridge tester (2) through an electric wire. The second electric push rod (52) is distributed through the front and rear side frame walls of the adjustment frame (41).

7. The test fixture for an inductance coil according to claim 1, characterized in that The limiting plate (4), the adjustment frame (41), the infrared emitter (43), the first electric push rod (42), the pin contact plate (5), the second electric push rod (52) and the detection contact (53) constitute an adjustable test mechanism of the test fixture body (1).

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