Device flip testing seat

Abstract

The utility model discloses a device flip test seat comprising a test seat base, a positioning projection is arranged at one side of the middle part of the upper end of the test seat base, and two rows of test seat pins are symmetrically arranged at the upper end of the test seat base and at two sides of the positioning projection. The test seat pin comprises a straight rod part, an annular rod part mounted at the top end of the straight rod part and a jacking part mounted at the top end of the annular rod part, and a tested device is placed at the position, located at the test seat pin, of the upper end of the test seat base. The beneficial effects are that the test seat pin composed of the straight rod part, the ring rod part and the abutting part is installed in the test seat pedestal, and the positioning projection is installed in the test seat, so that the device test seat can realize rapid positioning and placement of 17145102 type DFN devices when the device test seat is used; and stable contact between the test socket pins and the pins of the 17145102 type DFN device is realized, so that the test efficiency of the 17145102 type DFN device is improved on the premise that the pins of the 17145102 type DFN device are not damaged.

Description

Technical Field

[0001] The utility model relates to the technical field of DFN device testing, and particularly to a device flip - test socket. Background Art

[0002] After the DFN device is produced, in order to control the performance of the DFN device, it is often necessary to use a device test socket to test the performance of the DNF device.

[0003] At present, since the 17145102 - type DFN device is a special - specification integrated - circuit package, the use of a standard test socket cannot achieve the normal test of the 17145102 - type DFN device. And using the method of a patch board for device testing will cause damage to the pins of the device, making the 17145102 - type DFN device after testing unable to be used for sales and subsequent production processes. At the same time, it also makes the testing process of the 17145102 - type DFN device more cumbersome and the testing efficiency relatively low. Content of the Utility Model

[0004] (1) Technical Problems to be Solved

[0005] The technical problem to be solved by the utility model is to provide a device flip - test socket that can be repeatedly tested and used, with high testing efficiency, aiming at the current situation of the prior art.

[0006] (2) Technical Solutions

[0007] The utility model is realized through the following technical solutions: The utility model provides a device flip - test socket, which includes a test - socket base. One side in the middle of the upper end of the test - socket base is provided with a positioning convex block. On both sides of the positioning convex block at the upper end of the test - socket base, two rows of test - socket pins are symmetrically installed. The test - socket pin includes a straight - rod part, a ring - rod part installed at the top of the straight - rod part, and a tightening part installed at the top of the ring - rod part. A device to be tested is placed at the position of the test - socket pins on the upper end of the test - socket base. One side of the upper end of the test - socket base is also connected with a test - socket upper cover through a rotating shaft.

[0008] Further, one side inside the upper end of the test - socket upper cover is connected with a clamping plate through a clamping - spring shaft, and a clamping platform cooperating with the clamping plate is reserved on the side of the test - socket base opposite to the rotating shaft.

[0009] By adopting the above - mentioned technical solution, after the clamping plate and the clamping platform are clamped, the stable closing of the test - socket upper cover can be realized.

[0010] Further, a cross - shaped groove is opened in the middle of the upper end of the test - socket base, and the positioning convex block is located at the central position of the wider groove close to the device to be tested.

[0011] By adopting the above technical solution, the positioning protrusion cooperates with the corresponding structure at the bottom of the device under test, thereby avoiding damage to the entire test socket during testing caused by the device under test being placed upside down.

[0012] Furthermore, the straight rod portion passes through the test seat base, and the ring rod portion is a semi-open structure.

[0013] By adopting the above technical solution, the ring rod portion enables the test socket pin to have a certain elastic recovery ability, thereby preventing the test socket pin from being crushed when the device under test is pressed.

[0014] Furthermore, the straight rod portion, the ring rod portion and the tightening portion are an integrated structure, and the tightening portion contacts with a pin on the device under test.

[0015] By adopting the above technical solution, the pressing portion can reliably contact the pins of the device under test, so as to realize convenient measurement of the performance of the device under test after the test socket is powered on as a whole and connected to an external detection instrument.

[0016] Furthermore, the device under test is a 17145102 type DFN device, and the bottom of the device under test is an H-shaped structure.

[0017] By adopting the above technical solution, it is possible to ensure that the device under test can be quickly placed during testing.

[0018] Furthermore, the retaining spring shaft is rotatably connected to the upper cover of the test seat, and the retaining spring shaft is plugged into the clamping plate.

[0019] By adopting the above technical solution, the retaining spring shaft can realize automatic resetting of the shifting plate after being shifted.

[0020] (III) Beneficial effects

[0021] Compared with the prior art, the utility model has the following beneficial effects:

[0022] To solve the problem that since the 17145102 type DFN device is a special - specification integrated - circuit package, the use of a standard test socket cannot achieve the normal testing of the 17145102 type DFN device, and the use of the patch - board method for device testing will cause damage to the pins of the device, making the 17145102 type DFN device after testing unable to be used for sales and subsequent production processes. At the same time, the testing process of the 17145102 type DFN device is relatively cumbersome and the testing efficiency is relatively low. The utility model installs a test - socket pin composed of a straight - rod part, a ring - rod part, and a tightening part in the base of the test socket, and installs a positioning convex block in the test socket, so that when the device test socket is used, it can achieve the rapid positioning and placement of the 17145102 type DFN device, and achieve stable contact between the test - socket pin and the pins of the 17145102 type DFN device, improving the testing efficiency of the 17145102 type DFN device without damaging the pins of the 17145102 type DFN device. Brief Description of the Drawings

[0023] Figure 1 is the main cross - sectional view of the device flip - cover test socket of the utility model after the test - socket upper cover is closed;

[0024] Figure 2 is the main cross - sectional view of the device flip - cover test socket of the utility model after the test - socket upper cover is opened;

[0025] Figure 3 is the top - view of the device flip - cover test socket of the utility model when the test - socket upper cover is opened;

[0026] Figure 4 is the bottom - view of the device flip - cover test socket of the utility model when the test - socket upper cover is opened.

[0027] The description of the reference numerals in the drawings is as follows:

[0028] 1. Device under test; 2. Test - socket upper cover; 3. Rotating shaft; 4. Test - socket base; 5. Test - socket pin; 501. Straight - rod part; 502. Ring - rod part; 503. Tightening part; 6. Positioning convex block; 7. Clamping plate; 8. Clamping - spring shaft; 9. Clamping platform. Detailed Embodiment

[0029] In order to make the purpose, technical solution and advantages of the utility model more clear and understandable, the following further details the utility model in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the utility model and are not used to limit the utility model.

[0030] As Figures 1 - 4As shown, the device flip cover test socket in this embodiment includes a test socket base 4, a positioning protrusion 6 is installed on one side of the middle part of the upper end of the test socket base 4, and two rows of test socket pins 5 are symmetrically installed on both sides of the positioning protrusion 6 on the upper end of the test socket base 4. The test socket pins 5 include a straight rod portion 501, a ring rod portion 502 installed on the top of the straight rod portion 501, and a tightening portion 503 installed on the top of the ring rod portion 502. A device under test 1 is placed on the upper end of the test socket base 4 at the test socket pin 5, and a cross-shaped groove is opened in the middle part of the upper end of the test socket base 4, wherein the positioning protrusion 6 is located in a wider groove near the center position of the device under test 1, the device under test 1 is a 17145102 type DFN device, and the bottom of the device under test 1 is an H-shaped structure. The positioning protrusion 6 cooperates with the corresponding structure of the bottom of the device under test 1, which can avoid damage to the entire test socket during testing due to the device under test 1 being placed upside down. One side of the upper end of the test socket base 4 is also connected to the test socket cover 2 through the rotating shaft 3.

[0031] like Figures 1 - 4 As shown, in this embodiment, a clamping plate 7 is connected to one side of the upper end of the test seat cover 2 through a clamping spring shaft 8, and a clamping platform 9 cooperating with the clamping plate 7 is reserved on the side of the test seat base 4 facing away from the rotating shaft 3. After the clamping plate 7 and the clamping platform 9 are engaged, the stable closure of the test seat cover 2 can be achieved. The straight rod portion 501 passes through the test seat base 4, and the ring rod portion 502 is a semi-open structure. The ring rod portion 502 enables the test seat pin 5 to have a certain elastic recovery ability to prevent the test seat pin 5 from being damaged when the device under test 1 is pressed.

[0032] like Figures 1 - 4 As shown, in this embodiment, the straight rod portion 501, the ring rod portion 502 and the tightening portion 503 are an integrated structure, and the tightening portion 503 contacts the pins on the device under test 1. The tightening portion 503 can reliably contact the pins of the device under test 1, so that after the test socket is powered on as a whole and connected to an external detection instrument, a convenient measurement of the performance of the device under test 1 can be achieved, and the device under test 1 can be ensured to be quickly placed during the test. The retaining spring shaft 8 is rotatably connected to the test socket cover 2, and the retaining spring shaft 8 is plugged into the clamping plate 7. The retaining spring shaft 8 can realize automatic resetting of the dial after being toggled.

[0033] The specific implementation process of this embodiment is as follows: During testing, first place the device under test 1 on the test socket base 4 in a specified direction under the action of the positioning bump 6, then close the test socket upper cover 2 on the test socket base 4 and limit it under the action of the clamping plate 7 and the clamping table 9. Next, simply connect the test socket pins 5 of this test socket to an external measuring instrument and a power supply to enable the testing of the device under test 1. During the testing process, by installing the test socket pins 5 composed of a straight rod portion 501, a ring rod portion 502, and a tightening portion 503 in the test socket base 4 and installing positioning bumps 6 in the test socket, the device test socket can achieve the rapid positioning and placement of 17145102 type DFN devices during use, and achieve stable contact between the test socket pins 5 and the pins of 17145102 type DFN devices. Without damaging the pins of 17145102 type DFN devices, the testing efficiency of 17145102 type DFN devices is improved.

[0034] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. Device flip test socket, characterized in that: It includes a test socket base (4), a positioning convex block (6) is installed on one side of the middle part of the upper end of the test socket base (4), two rows of test socket pins (5) are symmetrically installed on both sides of the positioning convex block (6) at the upper end of the test socket base (4), the test socket pin (5) includes a straight rod part (501), a ring rod part (502) installed at the top end of the straight rod part (501), and a tightening part (503) installed at the top end of the ring rod part (502), a device under test (1) is placed at the upper end of the test socket base (4) at the position of the test socket pin (5), and a test socket upper cover (2) is also connected to one side of the upper end of the test socket base (4) through a rotating shaft (3).

2. The device flip test socket according to claim 1, characterized in that: A clamping plate (7) is connected to one side inside the upper end of the test socket upper cover (2) through a clamping spring shaft (8), and a clamping platform (9) matched with the clamping plate (7) is reserved on the side of the test socket base (4) opposite to the rotating shaft (3).

3. The device flip test socket according to claim 1, wherein: A cross-shaped groove is opened in the middle of the upper end of the test socket base (4), and the positioning convex block (6) is located at the center position of the wider groove close to the device under test (1).

4. The device flip test socket according to claim 1, characterized in that: The straight rod part (501) penetrates through the test socket base (4), and the ring rod part (502) is of a semi-open structure.

5. The device flip test socket according to claim 1, characterized in that: The straight rod part (501), the ring rod part (502) and the tightening part (503) are of an integral structure, and the tightening part (503) contacts the pins on the device under test (1).

6. The device flip test socket according to claim 1, characterized in that: The device under test (1) is a DFN device of the 17145102 type, and the bottom of the device under test (1) is of an H-shaped structure.

7. The device flip test socket according to claim 2, characterized in that: The clamping spring shaft (8) is rotatably connected to the test socket upper cover (2), and the clamping spring shaft (8) is inserted into the clamping plate (7).

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