Chip test switching device

Abstract

The utility model relates to the technical field of chip testing, and discloses a chip test switching device, which comprises a chip test switching plate, a chip test switching module, a chip test switching module and a chip test switching module, the chip test adapter plate is provided with a first connecting seat and a plurality of second connecting seats, the first connecting seat is used for connecting the host end, and the plurality of second connecting seats are used for connecting the test mainboard; the chip test adapter plate comprises an expansion part, the first connecting seat and the plurality of second connecting seats are electrically connected through the expansion part, the side edge of the expansion part is provided with an arc-shaped contour, and the plurality of second connecting seats are located on the side edge of the expansion part and are uniformly arranged along the arc-shaped contour. The chip testing efficiency is improved.

Description

Technical Field

[0001] This application relates to the technical field of chip testing, and particularly relates to a chip testing adapter device. Background Art

[0002] During the chip testing process, the host needs to be connected to the chip under test to provide software support, control and manage the chip under test, and at the same time perform data processing, analysis, communication and interaction on the chip under test. In the related art, a transfer board is set on the host to realize the connection between the chip under test and the test equipment or system, so as to build a test environment for the chip under test, and then simulate and verify. However, the structural design of the transfer board has defects, its sockets are inconvenient to connect to the outside, and the overall transfer board occupies a large space, resulting in the impact on the chip testing efficiency. Utility Model Content

[0003] In view of this, this application provides a chip testing adapter device to improve the chip testing efficiency.

[0004] To achieve the above object, the technical solution adopted is:

[0005] A chip testing adapter device includes:

[0006] A chip testing adapter board for connecting the host and the test main board;

[0007] The chip testing adapter board is provided with a first connection seat and a plurality of second connection seats. The first connection seat is used to connect the host, and the plurality of second connection seats are used to connect the test main board;

[0008] The chip testing adapter board includes an extension part. The first connection seat and the plurality of second connection seats are electrically connected through the extension part. The side of the extension part has an arc-shaped contour. The plurality of second connection seats are located on the side of the extension part and are evenly arranged along the arc-shaped contour.

[0009] This application is further configured as: a plurality of accommodation grooves are provided on the side of the extension part, and the plurality of accommodation grooves are evenly arranged along the arc-shaped contour. Each second connection seat is respectively arranged in the accommodation groove.

[0010] This application is further configured as: the seat body height of the second connection seat is less than the groove depth of the accommodation groove.

[0011] This application is further configured as: the chip testing adapter board includes a fixing part for detachably connecting to the outside, and the fixing part is integrally connected to the extension part.

[0012] This application is further configured such that: the fixing portion is provided with a first mounting notch and a plurality of second mounting notches, and the plurality of second mounting notches are arranged around the first mounting notch.

[0013] This application is further configured such that: the fixing portion is provided with a gripping area, the gripping area covers the first mounting notch and the second mounting notches, and a gripping protection pad is connected to the gripping area.

[0014] This application is further configured such that: it includes an instruction circuit board for sending test instructions of the host end, one end of the instruction circuit board is connected to the host end, and the other end of the instruction circuit board is connected to the first connection seat.

[0015] This application is further configured such that: the test main board is used to test the chip to be tested, and the test main board is connected to each of the second connection seats through a plurality of test lines.

[0016] This application is further configured such that: the cross-sectional shape of the extension portion is fan-shaped or semi-circular.

[0017] This application is further configured such that: a plurality of connection flexible cables are printed on the extension portion, connection pins are provided on a side of the first connection seat facing the second connection seat, one end of the connection flexible cable is connected to the connection pins, and the other end of the connection flexible cable is connected to at least one of the second connection seats.

[0018] In summary, compared with the prior art, this application discloses a chip test adapter device, including a chip test adapter board for connecting a host end and a test main board. The chip test adapter board is provided with a first connection seat for connecting the host end and a plurality of second connection seats for connecting the test main board. The first connection seat and the plurality of second connection seats are electrically connected through an extension portion. Among them, the side of the extension portion has an arc-shaped contour, and the plurality of second connection seats are located on the side of the extension portion and are evenly arranged along the arc-shaped contour. That is, through the above settings, it is convenient for the connection seats of the chip test adapter board to be connected to the outside, reduces the space occupied area of the chip test adapter board, and improves the chip test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of this application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of this application. For those skilled in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0020] Figure 1 is a framework schematic diagram of the chip test adapter device in this embodiment;

[0021] Figure 2 It is a schematic structural diagram of the chip test adapter device of this embodiment.

[0022] Reference numerals: 1, chip test adapter board; 11, first connection seat; 111, connection pin; 12, second connection seat; 2, extension part; 21, accommodation groove; 22, connection cable; 3, fixing part; 31, first installation notch; 32, second installation notch; 33, holding area; 34, holding protection pad; 4, instruction circuit board; 5, test main board; 6, host end. Detailed implementation manners

[0023] Here, the exemplary embodiments will be described in detail, and the examples are shown in the drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The implementation manners described in the following exemplary embodiments do not represent all implementation manners consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0024] It should be noted that in this article, the term "including", "comprising" or any other variant thereof is intended to cover non-exclusively, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including one..." does not exclude the existence of another identical element in the process, method, article or device including that element. In addition, components, features, and elements with the same name in different embodiments of the present application may have the same meaning or different meanings, and their specific meanings need to be determined by their explanations in the specific embodiments or further in combination with the context of the specific embodiments.

[0025] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0026] In the subsequent description, the use of suffixes such as "module", "component" or "unit" to represent elements is only for the convenience of the description of the present application, and it has no specific meaning in itself. Therefore, "module", "component" or "unit" can be used interchangeably.

[0027] In the description of the present application, it should be noted that the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. These are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present application. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0028] The technical solution shown in the present application will be described in detail below through specific embodiments. It should be noted that the description order of the following embodiments does not limit the priority order of the embodiments.

[0029] As described in the background art, the structural design of the existing adapter board has defects. For example, when the socket of the rectangular-structured adapter board is connected to the outside, it is inconvenient to plug and unplug, and the overall adapter board occupies a large space, resulting in an impact on the chip test efficiency. Based on this, the present embodiment discloses a chip test adapter device.

[0030] Please refer to Figure 1 and Figure 2 , the chip test adapter device of the present embodiment includes a chip test adapter board 1, and the chip test adapter board 1 is used to connect the host end 6 and the test main board 5. That is, during the process of testing the chip using the host end 6, the chip test adapter board 1 plays the role of a bridge, enabling the test signal and data to be effectively transmitted between the two.

[0031] In the specific implementation process, the chip test adapter board 1 is provided with a first connection seat 11 and a plurality of second connection seats 12. Among them, the first connection seat 11 is used to connect the host end 6, and the plurality of second connection seats 12 are used to connect the test main board 5. This connection relationship can be realized through test lines. The test main board 5 is used to test the chip to be tested. Specifically, the first connection seat 11 can serve as the interface between the chip test adapter board 1 and the host end 6. It can be understood that the host end 6 provides software support, and the test instructions and data are transmitted from the host end 6 to the chip test adapter board 1 through the first connection seat 11, and the test results are returned from the chip test adapter board 1 to the host end 6.

[0032] Furthermore, the plurality of second connection seats 12 serve as the interface between the test main board 5 and the chip test adapter board 1. Among them, the specific number of the second connection seats 12 can be determined by the number of pins of the test main board 5 and the test requirements. The test instructions and data can be transmitted from the chip test adapter board 1 to the test main board 5, and the output signal of the test main board 5 can be returned to the chip test adapter board 1.

[0033] The chip test adapter board 1 of this embodiment includes an extension part 2. Among them, the first connector 11 and several second connectors 12 are electrically connected through the extension part 2, thereby playing the role of the chip test adapter board 1 for connection.

[0034] Furthermore, the side of the extension part 2 has an arc-shaped contour G. Several second connectors 12 are located on the side of the extension part 2 and are evenly arranged along the arc-shaped contour G. That is, the flexibility and compactness of the chip test adapter board 1 are ensured through the extension part 2. The extension part 2 can have an internal circuit layout and signal path to ensure that test signals and data can be transmitted efficiently and accurately between the host end and the test main board 5. And based on the side with an arc-shaped contour, the extension part 2 allows the second connectors 12 to be evenly arranged along the arc-shaped contour G. This layout method can maximize the use of the space of the chip test adapter board 1, that is, reduce the space occupied area of the chip test adapter board 1.

[0035] On the other hand, several second connectors 12 are evenly arranged along the arc-shaped contour G of the extension part 2. This layout method enables the chip test adapter board 1 to be connected to the test main board 5 with multiple test lines simultaneously. Then, based on the side with an arc-shaped contour, there is no requirement for the lengths of multiple test lines. That is, multiple test lines can be of equal length, or of different lengths, and can all be adapted to the second connectors 12 and the test main board 5, thereby improving the connection efficiency of the chip test connection device and facilitating the connection of the connectors of the chip test adapter board 1 to the outside.

[0036] In the specific implementation process, several accommodation grooves 21 are provided on the side of the extension part 2. The several accommodation grooves 21 are evenly arranged along the arc-shaped contour G. Each second connector 12 is respectively arranged in the accommodation groove 21. That is, in this embodiment, the layout and connection of the second connectors 12 are further optimized by adding several accommodation grooves 21. Among them, the design of the accommodation groove 21 can effectively protect the second connector 12 from the influence of the external environment, extend the service life of the second connector 12, and can also ensure the signal transmission quality during the test process. At the same time, due to the structural limitation of the accommodation groove 21, it can ensure the quick connection between the second connector 12 and the test main board 5, improve the connection efficiency between the connector and the outside, and the design of the accommodation groove 21 makes the second connector 12 more stably fixed on the adapter board, reducing the risk of connection looseness or damage caused by vibration or impact. This protection effect can reduce the influence of the external environment on the connector, thereby ensuring the reliability and accuracy of the test results. Furthermore, the height of the seat body of the second connector 12 is less than the depth of the groove body of the accommodation groove 21, then the accommodation groove 21 can provide path guidance for the connection of the second connector 12 through the side wall of the groove body, improving the connection efficiency between the connector and the outside.

[0037] It should be noted that the cross-sectional shape of the extension part 2 can be a sector or a semi-circle to adapt to the arc-shaped contour G structure design on the side of the extension part 2.

[0038] Furthermore, a number of connecting cables 22 are printed on the extension part 2. On the side of the first connecting seat 11 facing the second connecting seat 12, there are connecting pins 111. One end of the connecting cable 22 is connected to the connecting pin 111, and the other end of the connecting cable 22 is connected to at least one second connecting seat 12. In this way, it is ensured that the first connecting seat 11 and a number of second connecting seats 12 are electrically connected through the extension part 2, ensuring the smooth transmission and accurate exchange of test signals, and providing a reliable test environment for the chip to be tested.

[0039] Then, the chip test adapter device of this embodiment includes a chip test adapter board 1 for connecting the host end 6 and the test main board 5. The chip test adapter board 1 is provided with a first connecting seat 11 for connecting the host end 6 and a number of second connecting seats 12 for connecting the test main board 5. The first connecting seat 11 and the number of second connecting seats 12 are electrically connected through the extension part 2. Among them, the side of the extension part 2 has an arc-shaped contour G, and a number of second connecting seats 12 are located on the side of the extension part 2 and are evenly arranged along the arc-shaped contour G. Thus, it is convenient for the connecting seats of the chip test adapter board 1 to be connected to the outside, reducing the space occupied area of the chip test adapter board 1 and improving the chip test efficiency.

[0040] The chip test adapter board 1 of this embodiment includes a fixing part 3. The fixing part 3 is integrally connected to the extension part 2 to improve the structural stability. Among them, the first connecting seat 11 can be located on the fixing part 3 to ensure a reasonable structural space layout.

[0041] Furthermore, the fixing part 3 can be used for detachable connection with the outside. Specifically, the fixing part 3 is provided with a first installation slot 31 and a number of second installation slots 32. The number of second installation slots 32 are arranged around the first installation slot 31. That is, the detachable connection between the fixing part 3 and the outside is realized through the first installation slot 31 and the number of second installation slots 32, thereby fixing the chip test adapter device, and in terms of connection selection, the structural flexibility of the fixing part 3 is highlighted through the arrangement of the second installation slots 32.

[0042] In one embodiment, the chip test adapter device can also choose not to be fixedly connected to the outside during the chip test process. Then, the fixing part 3 can be provided with a holding area 33. The holding area 33 covers the first installation slot 31 and the second installation slots 32. Among them, a holding protection pad 34 is connected to the holding area 33, which is used to protect the outer surface of the adapter board and the electronic devices on the adapter board during the process of grasping the chip test adapter board 1.

[0043] Among them, the holding protection pad 34 has soft, wear-resistant and anti-slip characteristics and can be bonded to the holding area 33. The material selection of the holding protection pad 34 can include silicone materials, rubber materials, EVA materials, artificial leather, etc.

[0044] In one embodiment, the chip test adapter device further includes an instruction circuit board 4. The instruction circuit board 4 is used to send test instructions from the host 6. One end of the instruction circuit board 4 is connected to the host 6, and the other end of the instruction circuit board 4 is connected to the first connector 11. That is, test instructions are received from the host 6 through the instruction circuit board 4 and sent to the chip test adapter board 1.

[0045] It should be noted that the test main board 5 is used to test the chip to be tested. The test main board 5 is connected to each second connector 12 through a plurality of test lines. It can be understood that the test lines are usually used to transmit test signals, data, power, etc. to ensure stable communication between the test main board 5 and the chip to be tested. That is, test instructions are received from the chip test adapter board 1 through the test main board 5 and sent to the chip to be tested.

[0046] Then the chip test adapter device can include a chip test adapter board 1, an instruction circuit board 4, and a test main board 5. The chip test adapter board 1 is respectively connected to the instruction circuit board 4 and the test main board 5. The instruction circuit board 4 is connected to the host 6. The test main board 5 tests the chip to be tested. The chip test adapter board 1 can be provided with a first connector 11 connected to the instruction circuit board 4 and a plurality of second connectors 12 connected to the test main board 5. The first connector 11 and the plurality of second connectors 12 are electrically connected through the extension part 2. Among them, the side of the extension part 2 has an arc-shaped contour G. The plurality of second connectors 12 are located on the side of the extension part 2 and are evenly arranged along the arc-shaped contour G. Thus, it is convenient for the connectors of the chip test adapter board 1 to be connected to the outside, reducing the space occupied area of the chip test adapter board 1 and improving the chip test efficiency.

[0047] The above has introduced the present application in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present application. The description of the above embodiments is only used to help understand the core idea of the present application; at the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A chip test adapter device, characterized in that, Comprising: A chip test adapter board for connecting the host side and the test main board; The chip test adapter board is provided with a first connector and a plurality of second connectors. The first connector is used to connect the host side, and the plurality of second connectors are used to connect the test main board, so that the test main board is connected to each of the second connectors through a plurality of test lines respectively; The chip test adapter board includes an extension part. The first connector and the plurality of second connectors are electrically connected through the extension part. The side of the extension part has an arc-shaped contour. The plurality of second connectors are located on the side of the extension part and are evenly arranged along the arc-shaped contour.

2. The chip test adapter device according to claim 1, wherein A plurality of accommodating grooves are provided on the side of the extension part, and the plurality of accommodating grooves are evenly arranged along the arc-shaped contour. Each of the second connectors is respectively arranged in the accommodating groove.

3. The chip test adapter device according to claim 2, wherein The height of the seat body of the second connector is less than the depth of the groove body of the accommodating groove.

4. The chip test adapter device according to claim 1, wherein The chip test adapter board includes a fixing part for detachably connecting with the outside, and the fixing part is integrally connected with the extension part.

5. The chip test adapter device according to claim 4, wherein The fixing part is provided with a first installation notch and a plurality of second installation notches, and the plurality of second installation notches are arranged around the first installation notch.

6. The chip test adapter device according to claim 5, characterized in that The fixing part is provided with a holding area, the holding area covers the first installation notch and the second installation notches, and a holding protection pad is connected to the holding area.

7. The chip test adapter device according to claim 1, wherein Comprising an instruction circuit board for sending test instructions of the host side. One end of the instruction circuit board is connected to the host side, and the other end of the instruction circuit board is connected to the first connector.

8. The chip test adapter device according to claim 1, wherein, The cross-sectional shape of the extension part is fan-shaped or semi-circular.

9. The chip test adapter device according to claim 1, characterized in that A plurality of connection cables are printed on the extension part. Connecting pins are provided on the side of the first connector facing the second connector. One end of the connection cable is connected to the connecting pin, and the other end of the connection cable is connected to at least one of the second connectors.

Images