Chip testing device

Abstract

The utility model discloses a chip testing device which comprises a conveying belt and a supporting frame, the supporting frame is installed on one side of the conveying belt, an electric push rod is installed at the bottom end of the supporting frame, a sliding frame is movably installed at the output end of the electric push rod, and the sliding frame is in sliding connection with the supporting frame. A lower pressing block is slidably mounted in the sliding frame, a spring is mounted at the top end of the lower pressing block and connected with the sliding frame, a rotating seat is mounted at the bottom end of the lower pressing block, a movable shaft is movably mounted in the rotating seat, and a rotating plate is mounted at the bottom end of the movable shaft. A plurality of sets of detection guide pins are installed at the bottom end of the rotating plate, and a connecting frame is installed at the bottom end of the conveying belt. According to the utility model, convenient linkage centering and straightening of the chip and convenient circumferential rotation adjustment of the position of the adaptive contact are realized, the elastic contact detection of the chip contact is facilitated, and the test flexibility is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of testing devices, in particular to a chip testing device. Background Art

[0002] Chip is a general term for semiconductor component products. It is a way to miniaturize circuits (mainly including semiconductor devices, but also passive components, etc.) and is often manufactured on the surface of semiconductor wafers. The circuit on the chip surface is also called an integrated circuit. There are many ways to classify integrated circuits. According to whether the circuit is analog or digital, it can be divided into: analog integrated circuits, digital integrated circuits and mixed-signal integrated circuits. Chips need to be tested after production. In order to better test the chip, a chip testing device is proposed.

[0003] For example, a chip testing device disclosed in the authorization announcement number CN219512364U includes a PCB substrate, a universal card holder is fixedly installed on the upper surface of the PCB substrate, a chip storage structure is arranged inside the universal card holder, a device test head is arranged above the universal card holder, and fixing devices are arranged on the outer walls of both sides of the device test head;

[0004] Although it realizes that a chip storage structure consisting of a clamping plate, a slide rail, a chip placement plate and a chip placement slot is designed on a chip testing device, the chip to be tested is placed in the chip placement slot, the device test head is aligned with the universal card holder and pressed downward, the clamping plate moves downward along the slide bar through the connecting ring, driving the bottom of the chip to contact the PCB substrate for testing, and when the chip test is completed and the device test head is separated from the universal card holder, the clamping plate moves up along the slide bar under the elastic force of the reset spring to eject the chip placement plate, thereby facilitating the chip placement process and reducing the chip damage caused by tilting during the detection process;

[0005] However, the existing test device is not conducive to convenient linkage centering and alignment of the chip and convenient circular rotation adjustment of the contact position when in use, which is not conducive to elastic contact detection of chip contacts, affecting the flexibility of the test. Utility Model Content

[0006] The purpose of the utility model is to provide a chip testing device to solve the problem in the above-mentioned background technology that the testing device is not convenient for convenient linkage centering and alignment of the chip and convenient circular rotation adjustment of the adaption contact position, which is not conducive to elastic contact detection of the chip contacts and affects the flexibility of the test.

[0007] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a chip testing device, comprising a conveyor belt and a support frame, a support frame is installed on one side of the conveyor belt, an electric push rod is installed on the bottom end of the support frame, a sliding frame is movably installed on the output end of the electric push rod, and the sliding frame is slidably connected to the support frame, a lower pressure block is slidably installed inside the sliding frame, a spring is installed on the top of the lower pressure block, and the spring is connected to the sliding frame, a rotating seat is installed at the bottom end of the lower pressure block, a movable shaft is movably installed inside the rotating seat, a rotating plate is installed at the bottom end of the movable shaft, and multiple groups of detection guide pins are installed at the bottom end of the rotating plate, a connecting frame is installed at the bottom end of the conveyor belt, and shaft sleeves are symmetrically installed on the side walls of the conveyor belt, sleeves are movably installed inside the sleeves, and hinge shafts are movably installed inside the sleeves.

[0008] Preferably, a worm gear is mounted on the surface of the movable shaft, and a servo motor is installed inside a rotating seat on one side of the worm gear.

[0009] Preferably, a worm is installed at the output end of the servo motor, and the worm and the worm wheel are meshed with each other.

[0010] Preferably, a first cylinder is movably mounted on the bottom end of the connecting frame, and a second cylinder is movably mounted on the bottom end of the connecting frame on one side of the first cylinder.

[0011] Preferably, a left connecting arm is installed at the output end of the second cylinder, and the left connecting arm is connected to a set of sleeves.

[0012] Preferably, first connecting arms are installed on the surfaces of the sleeves, and a first connecting rod is provided between the two groups of first connecting arms, and the first connecting rod is movably connected to the first connecting arms.

[0013] Preferably, a right connecting arm is installed at the output end of the first cylinder, and the right connecting arm is connected to a set of hinged shafts.

[0014] Preferably, the surface of the articulated shaft is installed with a second connecting arm, and a second connecting rod is provided between the two groups of second connecting arms, and the second connecting rod is movably connected to the second connecting arm, and the top end of the sleeve and the articulated shaft is installed with a straightening arm.

[0015] Compared with the prior art, the utility model has the following beneficial effects: the test device not only realizes convenient linkage centering and alignment of the chip and convenient circular rotation adjustment of the adaption contact position, facilitates elastic contact detection of the chip contact, but also improves the flexibility of the test;

[0016] (1) Drive the chip to move through the conveyor belt. When the chip moves to the position of the alignment arm, the second cylinder drives a set of sleeves to rotate inside the bushing through the left connecting arm. The set of sleeves drives the first connecting rod to rotate through a set of first connecting arms. The first connecting rod drives another set of sleeves to rotate through another set of first connecting arms. The sleeves drive the corresponding two sets of alignment arms to rotate towards each other. The first cylinder drives a set of articulated shafts to rotate inside the sleeves through the right connecting arm. The set of articulated shafts drives the second connecting rod to rotate through a set of second connecting arms. The second connecting rod drives another set of articulated shafts to rotate through another set of second connecting arms. The articulated shafts drive the corresponding two sets of alignment arms to rotate towards each other. With the mutual cooperation of the four sets of alignment arms, the alignment arms contact the outer wall of the chip and align it in the middle on the surface of the conveyor belt. After the chip is aligned, the conveyor belt drives the chip to continue moving. When it moves to the position of the detection probe, the electric push rod drives the sliding frame to move on the side wall of the support frame. The sliding frame drives the rotating seat and the detection probe to move downward, so that the detection probe contacts the contacts on the chip. The pressing block squeezes the spring to make the detection probe contact the contacts flexibly. Then, the external controller completes the test work of the chip, realizing convenient linkage for centering and aligning the chip and facilitating elastic contact detection of the chip contacts;

[0017] (2) Drive the worm to rotate through the servo motor. The worm wheel drives the movable shaft to rotate. The movable shaft drives the detection probe to rotate through the rotating plate to rotate and adjust the position of the detection probe, so as to adjust and adapt the position of the contacts, and better test the chip, realizing convenient circumferential rotation for adjusting and adapting the contact position and improving the flexibility of the test. Description of the Drawings

[0018] Figure 1 It is a three-dimensional structure schematic diagram of the present utility model;

[0019] Figure 2 It is a three-dimensional structure schematic diagram of the connecting frame of the present utility model;

[0020] Figure 3 It is a side view sectional structure schematic diagram of the support frame of the present utility model;

[0021] Figure 4 It is a three-dimensional structure schematic diagram of the alignment arm of the present utility model;

[0022] Figure 5 It is a side view sectional structure schematic diagram of the rotating seat of the present utility model.

[0023] In the figure: 1, conveyor belt; 2, support frame; 3, bushing; 4, sleeve; 5, connecting frame; 6, first cylinder; 7, second cylinder; 8, electric push rod; 9, alignment arm; 10, rotating plate; 11, sliding frame; 12, spring; 13, pressing block; 14, rotating seat; 15, detection guide pin; 16, first connecting rod; 17, first connecting arm; 18, right connecting arm; 19, hinge shaft; 20, left connecting arm; 21, second connecting rod; 22, second connecting arm; 23, worm; 24, servo motor; 25, worm gear; 26, movable shaft. Specific implementation manner

[0024] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0025] Please refer to Figures 1-5 , an embodiment provided by the present invention: A chip testing device includes a conveyor belt 1 and a support frame 2. A support frame 2 is installed on one side of the conveyor belt 1. An electric push rod 8 is installed at the bottom end of the support frame 2, and the electric push rod 8 plays a role in power driving. The output end of the electric push rod 8 is movably installed with a sliding frame 11, and the sliding frame 11 is slidably connected to the support frame 2. A pressing block 13 is slidably installed inside the sliding frame 11. A spring 12 is installed at the top end of the pressing block 13, and the spring 12 is connected to the sliding frame 11. A rotating seat 14 is installed at the bottom end of the pressing block 13. A movable shaft 26 is movably installed inside the rotating seat 14. A rotating plate 10 is installed at the bottom end of the movable shaft 26. Multiple detection guide pins 15 are installed at the bottom end of the rotating plate 10. A connecting frame 5 is installed at the bottom end of the conveyor belt 1. Bushing 3s are symmetrically installed on the side wall of the conveyor belt 1. Sleeves 4 are movably installed inside the bushings 3. Hinge shafts 19 are movably installed inside the sleeves 4;

[0026] First, connect the device to an external controller and external circuit. Place the chip to be tested on the conveyor belt 1. The chip is circular. Turn on the conveyor belt 1, and the conveyor belt 1 drives the chip to move. When the chip moves to the position of the alignment arm 9, turn on the second cylinder 7 and the first cylinder 6. Supported by the bushing 3, the second cylinder 7 drives a set of sleeves 4 to rotate inside the bushing 3 through the left connecting arm 20. The set of sleeves 4 drives the first connecting rod 16 to rotate through a set of first connecting arms 17. The first connecting rod 16 drives another set of sleeves 4 to rotate through another set of first connecting arms 17. The sleeves 4 drive the corresponding two sets of alignment arms 9 to rotate towards each other. The first cylinder 6 drives a set of hinge shafts 19 to rotate inside the sleeve 4 through the right connecting arm 18. The set of hinge shafts 19 drives the second connecting rod 21 to rotate through a set of second connecting arms 22. The second connecting rod 21 drives another set of hinge shafts 19 to rotate through another set of second connecting arms 22. The hinge shafts 19 drive the corresponding two sets of alignment arms 9 to rotate towards each other. With the mutual cooperation of the four sets of alignment arms 9, the alignment arms 9 contact the outer wall of the chip and align it in the center on the surface of the conveyor belt 1. After the chip is aligned, the conveyor belt 1 drives the chip to continue moving. When it moves to the position of the detection probe 15, turn on the electric push rod 8. The electric push rod 8 drives the sliding frame 11 to move on the side wall of the support frame 2. The sliding frame 11 drives the rotating seat 14 and the detection probe 15 to move downward, so that the detection probe 15 contacts the contacts on the chip. When the detection probe 15 contacts the contacts, the detection probe 15 drives the rotating seat 14 and the pressing block 13 to move upward. The pressing block 13 slides inside the sliding frame 11, and the pressing block 13 squeezes the spring 12. Under the elastic support of the spring 12, the detection probe 15 contacts the contacts flexibly, preventing damage to the contacts caused by rigid contact. Then, the external controller is used to complete the testing work of the chip, realizing convenient linkage for centering and aligning the chip and facilitating elastic contact detection of the chip contacts;

[0027] A worm gear 25 is sleeved on the surface of the movable shaft 26. A servo motor 24 is installed inside the rotating seat 14 on one side of the worm gear 25. The servo motor 24 plays a role in power driving;

[0028] The output end of the servo motor 24 is installed with a worm 23, and the worm 23 meshes with the worm gear 25;

[0029] The bottom end of the connecting frame 5 is movably installed with a first cylinder 6. The first cylinder 6 plays a role in power driving. The bottom end of the connecting frame 5 on one side of the first cylinder 6 is movably installed with a second cylinder 7. The second cylinder 7 plays a role in power driving. The output end of the second cylinder 7 is installed with a left connecting arm 20, and the left connecting arm 20 is connected to a set of sleeves 4;

[0030] The surfaces of the sleeves 4 are all provided with first connecting arms 17, and a first connecting rod 16 is arranged between the two groups of first connecting arms 17. The first connecting rod 16 is movably connected to the first connecting arms 17. The output end of the first air cylinder 6 is provided with a right connecting arm 18, and the right connecting arm 18 is connected to a group of hinge shafts 19;

[0031] The surfaces of the hinge shafts 19 are all provided with second connecting arms 22, and a second connecting rod 21 is arranged between the two groups of second connecting arms 22. The second connecting rod 21 is movably connected to the second connecting arms 22. The top ends of the sleeves 4 and the hinge shafts 19 are both provided with alignment arms 9;

[0032] When it is necessary to adjust and adapt the position of the contact for testing, the servo motor 24 is turned on. The servo motor 24 drives the worm 23 to rotate. Under the mutual meshing of the worm 23 and the worm gear 25, the worm 23 drives the worm gear 25 to rotate. The worm gear 25 drives the movable shaft 26 to rotate. The movable shaft 26 drives the detection guide pin 15 to rotate through the rotating plate 10, so as to rotate and adjust the position of the detection guide pin 15, thereby adjusting the position of the contact for adaptation, and better testing the chip. It realizes convenient circumferential rotation to adjust and adapt the position of the contact, and improves the flexibility of testing.

[0033] Working principle: First, the conveyor belt 1 drives the chip to move. When the chip moves to the position of the alignment arm 9, the second cylinder 7 drives a set of sleeves 4 to rotate inside the bushing 3 through the left connecting arm 20. The set of sleeves 4 drives the first connecting rod 16 to rotate through a set of first connecting arms 17. The first connecting rod 16 drives another set of sleeves 4 to rotate through another set of first connecting arms 17. The sleeves 4 drive the corresponding two sets of alignment arms 9 to rotate towards each other. The first cylinder 6 drives a set of hinge shafts 19 to rotate inside the sleeves 4 through the right connecting arm 18. The set of hinge shafts 19 drives the second connecting rod 21 to rotate through a set of second connecting arms 22. The second connecting rod 21 drives another set of hinge shafts 19 to rotate through another set of second connecting arms 22. The hinge shafts 19 drive the corresponding two sets of alignment arms 9 to rotate towards each other. With the mutual cooperation of the four sets of alignment arms 9, the alignment arms 9 contact the outer wall of the chip and align it in the center on the surface of the conveyor belt 1. After the chip is aligned, the conveyor belt 1 drives the chip to continue moving. When it moves to the position of the detection probe 15, the electric push rod 8 drives the sliding frame 11 to move on the side wall of the support frame 2. The sliding frame 11 drives the rotating seat 14 and the detection probe 15 to move downward, so that the detection probe 15 contacts the contacts on the chip. When the detection probe 15 contacts the contacts, the detection probe 15 drives the rotating seat 14 and the pressing block 13 to move upward. The pressing block 13 slides inside the sliding frame 11, and the pressing block 13 squeezes the spring 12, so that the detection probe 15 contacts the contacts flexibly, preventing damage to the contacts caused by rigid contact. Then, the external controller is used to complete the testing work of the chip. If it is necessary to adjust and adapt the position of the contacts for testing, the servo motor 24 drives the worm 23 to rotate. The worm 23 drives the worm gear 25 to rotate. The worm gear 25 drives the movable shaft 26 to rotate. The movable shaft 26 drives the detection probe 15 to rotate through the rotating plate 10, so as to rotate and adjust the position of the detection probe 15, thereby adjusting and adapting the position of the contacts to better test the chip and complete the use of the chip testing device.

Claims

1. A chip testing device, comprising a conveyor belt (1) and a support frame (2), characterized in that: On one side of the conveyor belt (1), a support frame (2) is installed. At the bottom end of the support frame (2), an electric push rod (8) is installed. The output end of the electric push rod (8) is movably installed with a sliding frame (11), and the sliding frame (11) is slidably connected to the support frame (2). Inside the sliding frame (11), a pressing block (13) is slidably installed. At the top end of the pressing block (13), a spring (12) is installed, and the spring (12) is connected to the sliding frame (11). At the bottom end of the pressing block (13), a rotating seat (14) is installed. Inside the rotating seat (14), a movable shaft (26) is movably installed. At the bottom end of the movable shaft (26), a rotating plate (10) is installed. At the bottom end of the rotating plate (10), multiple detection guide pins (15) are installed. At the bottom end of the conveyor belt (1), a connecting frame (5) is installed. On the side wall of the conveyor belt (1), bushings (3) are symmetrically installed. Inside each bushing (3), a sleeve (4) is movably installed. Inside each sleeve (4), a hinge shaft (19) is movably installed.

2. The chip testing device according to claim 1, characterized in that: A worm gear (25) is sleeved on the surface of the movable shaft (26). Inside the rotating seat (14) on one side of the worm gear (25), a servo motor (24) is installed.

3. The chip testing device according to claim 2, characterized in that: The output end of the servo motor (24) is installed with a worm (23), and the worm (23) meshes with the worm gear (25).

4. A chip testing device according to claim 1, characterized in that: At the bottom end of the connecting frame (5), a first cylinder (6) is movably installed. On one side of the first cylinder (6) at the bottom end of the connecting frame (5), a second cylinder (7) is movably installed.

5. A chip testing device according to claim 4, characterized in that: The output end of the second cylinder (7) is installed with a left connecting arm (20), and the left connecting arm (20) is connected to a group of sleeves (4).

6. The chip testing device according to claim 1, characterized in that: On the surface of each sleeve (4), a first connecting arm (17) is installed. Between the two groups of first connecting arms (17), a first connecting rod (16) is provided, and the first connecting rod (16) is movably connected to the first connecting arm (17).

7. A chip testing device according to claim 4, wherein: The output end of the first cylinder (6) is installed with a right connecting arm (18), and the right connecting arm (18) is connected to a group of hinge shafts (19).

8. The chip testing device according to claim 1, wherein: On the surface of each hinge shaft (19), a second connecting arm (22) is installed. Between the two groups of second connecting arms (22), a second connecting rod (21) is provided, and the second connecting rod (21) is movably connected to the second connecting arm (22). At the top ends of the sleeves (4) and the hinge shafts (19), alignment arms (9) are installed.

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