Temperature resistance test equipment

Abstract

The temperature resistance test equipment comprises a test mechanism, the test mechanism comprises a test board, a bearing seat, conductive silica gel, a pressure head, a refrigeration sheet, a first connecting block, a power supply and a second connecting block, the test board is provided with a plurality of test pins, the bearing seat is used for bearing a chip, the conductive silica gel is connected with the test board and the bearing seat, the test pins are in one-to-one correspondence with test points on the chip, and the pressure head is used for pressing the chip. The pressure head is arranged above the bearing seat, the refrigerating sheet comprises a refrigerating surface and a heating surface, the refrigerating surface is connected with the pressure head, the first connecting block is provided with a cavity, a water inlet and a water outlet, the water inlet and the water outlet are communicated with the cavity, the first connecting block is connected with the heating surface, the power source is connected with the refrigerating surface and the heating surface, and the second connecting block is connected with the first connecting block. The second connecting block is driven to push the pressure head to be in contact with the chip, the chip rapidly reaches and maintains a low-temperature state, the low-temperature test of the chip can be realized by continuously pressing down and enabling the test point to abut against the test needle, the test mechanism is arranged in the shielding box, and the shielding box isolates interference of external electromagnetic signals to ensure the accuracy of the test.

Description

Technical Field

[0001] The utility model relates to the technical field of low - temperature testing of semiconductor chips, and particularly relates to a temperature - resistant testing device. Background Art

[0002] With the rapid development of technology, chips, as the core components of modern electronic devices, their performance and stability are crucial for the operation of the entire system. In many application scenarios, chips often need to work in extreme environments, including extremely low temperature conditions. Therefore,

[0003] conducting low - temperature performance tests on chips to evaluate their working ability and reliability under extreme conditions has become an important research direction in the semiconductor industry.

[0004] In the low - temperature performance test of chips, external electromagnetic signal interference is a problem that cannot be ignored. They will interfere with the normal working state of the chips and affect the accuracy of test results. Therefore, it is necessary to improve the existing technology.

[0005] The above information is given as background information only to assist in understanding the present disclosure, and it is not determined or admitted whether any of the above content can be used as the prior art relative to the present disclosure. Summary of the Utility Model

[0006] The utility model provides a temperature - resistant testing device to solve the problem that the existing low - temperature and temperature - resistant testing device cannot shield external electromagnetic signals and the accuracy rate of test results is low.

[0007] To achieve the above object, the utility model provides the following technical solutions:

[0008] A temperature - resistant testing device, which includes a shielding box and a testing mechanism arranged in the shielding box. The testing mechanism includes:

[0009] A test board provided with a plurality of test pins;

[0010] A supporting seat for supporting the chip;

[0011] Conductive silicone connecting the test board and the supporting seat, and the test pins correspond to the test points on the chip one by one;

[0012] A pressing head arranged above the supporting seat;

[0013] A Peltier cooler including a cooling surface, and the cooling surface is connected to the pressing head;

[0014] A first connecting block provided with a cavity, a water inlet and a water outlet. Both the water inlet and the water outlet communicate with the cavity. The Peltier cooler includes a heating surface, and the first connecting block is connected to the heating surface;

[0015] A power supply, the positive pole of the power supply is connected to the refrigerating surface, and the negative pole of the power supply is connected to the heating surface;

[0016] A second connecting block, connecting the first connecting block;

[0017] A first adjusting mechanism, connecting the second connecting block, for driving the indenter to lift and lower, so that the chip abuts against the test needle.

[0018] Preferably, the first adjusting mechanism includes a first motor, the rotating end of the first motor is connected with a driving gear, a belt meshing with the driving gear is meshed with a driven gear, the driven gear is connected with a threaded rod, and a third connecting block threadedly connected to the threaded rod is connected to the second connecting block.

[0019] Preferably, the temperature resistance testing device further includes a second adjusting mechanism, a guide rail and a moving seat, the moving seat is used for supporting the test board, the telescopic end of the second adjusting mechanism and the guide rail are connected to the moving seat, and the second adjusting mechanism is used for driving the moving seat to move along the direction of the guide rail.

[0020] Preferably, the temperature resistance testing device further includes a baffle and a limiting block, the limiting block is arranged at one end of the guide rail close to the outlet of the shielding box, the baffle is connected to the bottom of the moving seat, the second adjusting mechanism is a telescopic rod, and the telescopic end of the telescopic rod is connected to the baffle.

[0021] Preferably, the shielding box includes a box body, an outlet, a hinge, a handle and a cover plate, the cover plate is arranged at the outlet, the hinge connects the bottom end of the cover plate and the box body, and the handle is connected to the cover plate.

[0022] Preferably, the temperature resistance testing device further includes a first magnetic attracting member and a second magnetic attracting member, the first magnetic attracting member is connected to the top end of the cover plate, the box body is connected with a second magnetic attracting member corresponding to the first magnetic attracting member, and the magnetic poles of the first magnetic attracting member and the second magnetic attracting member are opposite.

[0023] Preferably, the temperature resistance testing device further includes a water tank, a water pump, a first water pipe and a second water pipe, the water tank stores water, the water pump is immersed in the water tank, two ends of the first water pipe are respectively connected to the water pump and the water inlet, and the first end of the second water pipe is connected to the water outlet.

[0024] Preferably, the temperature resistance testing device further includes a chiller, the chiller includes a water inlet end and a water outlet end, the water inlet end is connected to the water pump, the water outlet end is connected to the first water pipe, and the second end of the second water pipe is connected to the water tank.

[0025] Preferably, the indenter is made of brass.

[0026] Preferably, the temperature-resistant testing device further includes a water inlet pipe, which connects tap water and the water tank, and the water tank is provided with an observation window.

[0027] Compared with the prior art, the present utility model has the following beneficial effects:

[0028] The temperature-resistant testing device of the present utility model includes a testing mechanism, which includes a testing board, a supporting seat, conductive silicone, a pressing head, a refrigeration chip, a first connecting block, a power supply, a second connecting block, and a first adjusting mechanism. The testing board is provided with a plurality of testing needles. The supporting seat is used to support the chip. The conductive silicone connects the testing board and the supporting seat. The testing needles and the testing points on the chip correspond one by one. The pressing head is arranged above the supporting seat. The refrigeration chip includes a refrigerating surface and a heating surface. The refrigerating surface is connected to the pressing head. The first connecting block is provided with a cavity, a water inlet and a water outlet, and both the water inlet and the water outlet are communicated with the cavity. The first connecting block is connected to the heating surface. The positive pole of the power supply is connected to the refrigerating surface, and the negative pole of the power supply is connected to the heating surface. The second connecting block is connected to the first connecting block, and the first adjusting mechanism is connected to the second connecting block. The first adjusting mechanism pushes the pressing head to contact the chip, and the chip quickly reaches and maintains the required low temperature state. Continuing to press down, the testing points are in contact with the testing needles, and the low-temperature testing of the chip can be realized. The testing mechanism is arranged in a shielding box, and the shielding box isolates the interference of external electromagnetic signals to ensure the accuracy of the testing.

[0029] The present utility model has other characteristics and advantages, which will be obvious from the accompanying drawings incorporated herein and the subsequent detailed description, or will be described in detail in the accompanying drawings incorporated herein and the subsequent detailed description. These accompanying drawings and the detailed description are used together to explain the specific principles of the present utility model. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0031] Figure 1 is a schematic structural diagram of the temperature-resistant testing device of the present utility model;

[0032] Figure 2 is a schematic structural diagram of the testing mechanism of the present utility model;

[0033] Figure 3 is a schematic structural diagram of the first adjusting mechanism of the present utility model.

[0034] Reference numerals:

[0035] 10. Box body; 11. Cover plate; 12. Handle;

[0036] 20. Moving seat; 21. Test board; 22. Supporting seat;

[0037] 30. First motor; 31. Driven gear; 32. Threaded rod; 33. Third connecting block; 34. Second connecting block; 35. First connecting block; 36. Water outlet; 37. Refrigeration sheet; 38. Pressing head; 39. Driving gear;

[0038] 40. Guide rail; 41. Baffle; 42. Limit block; 43. Telescopic rod;

[0039] 50. Water tank; 51. Chiller; 52. Observation window. Specific implementation manners

[0040] To make the objectives, features, and advantages of the present utility model more obvious and understandable, the technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the embodiments described below are only a part of the embodiments of the present utility model, rather than all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0041] In the description of the present utility model, it should be understood that when a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be an intermediate component. When a component is considered to be "disposed on" another component, it can be directly disposed on the other component or there may be an intermediate component.

[0042] In addition, terms such as "long", "short", "inner", "outer", etc. indicating the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present utility model, rather than indicating or implying that the device or component referred to must have this specific orientation or be constructed and operated in this specific orientation, and thus should not be construed as a limitation of the present utility model.

[0043] The technical solutions of the present utility model will be further described below with reference to the accompanying drawings and through specific implementation manners.

[0044] Please refer to Figures 1 - 3 As shown, the present utility model designs a temperature resistance test device, which includes a shielding box and a test mechanism disposed in the shielding box. The test mechanism includes:

[0045] A test board 21, provided with a plurality of test needles;

[0046] A supporting base 22 for supporting a chip;

[0047] Conductive silicone gel connecting the test board 21 and the supporting base 22, with the test pins corresponding one by one to the test points on the chip;

[0048] A pressing head 38 disposed above the supporting base 22;

[0049] A Peltier cooler 37 including a cooling surface, and the cooling surface is connected to the pressing head 38;

[0050] A first connecting block 35 having a cavity, a water inlet, and a water outlet 36. Both the water inlet and the water outlet 36 communicate with the cavity. The Peltier cooler 37 includes a heating surface, and the first connecting block 35 is connected to the heating surface;

[0051] A power supply, with the positive pole of the power supply connected to the cooling surface and the negative pole of the power supply connected to the heating surface;

[0052] A second connecting block 34 connecting the first connecting block 35;

[0053] A first adjusting mechanism connecting the second connecting block 34 and used to drive the pressing head 38 to move up and down so that the chip abuts against the test pins.

[0054] It should be noted that the first adjusting mechanism of the present utility model pushes the pressing head 38 to contact the chip, and the chip quickly reaches and maintains the required low temperature state. Continuing to press down, the conductive silicone gel is compressed, and the test points abut against the test pins, then the low temperature test of the chip can be realized. The test mechanism is disposed inside a shielding box, and the shielding box isolates the interference of external electromagnetic signals to ensure the accuracy of the test.

[0055] Specifically, the first adjusting mechanism includes a first motor 30. The rotating end of the first motor 30 is connected with a driving gear 39. A belt meshing with the driving gear 39 is meshed with a driven gear 31. The driven gear 31 is connected with a threaded rod 32. A third connecting block 33 threadedly connected to the threaded rod 32 is connected to the second connecting block 34.

[0056] When the first motor 30 is started, it drives the driving gear 39 to rotate, and then drives the belt, the driven gear 31, and the threaded rod 32. The third connecting block 33 can move up and down along the threaded rod 32.

[0057] Specifically, the temperature resistance test equipment further includes a second adjusting mechanism, a guide rail 40, and a moving seat 20. The moving seat 20 is used to support the test board 21. The telescopic end of the second adjusting mechanism and the guide rail 40 are connected to the moving seat 20, and the second adjusting mechanism is used to drive the moving seat 20 to move along the direction of the guide rail 40.

[0058] Specifically, the temperature resistance testing device further includes a baffle 41 and a limit block 42. The limit block 42 is provided at one end of the guide rail 40 close to the outlet of the shielding box. The baffle 41 is connected to the bottom of the moving seat 20. The second adjustment mechanism is a telescopic rod 43, and the telescopic end of the telescopic rod 43 is connected to the baffle 41.

[0059] The second adjustment mechanism is combined with the guide rail 40 and the moving seat 20 to provide the test board 21 with the ability to move along the direction of the guide rail 40. In the initial state, the chip is located directly below the indenter 38. After the test is completed, the telescopic rod 43 is activated. The telescopic rod 43 extends to drive the chip to move along the direction close to the outlet, facilitating the staff to take out the tested chip and place the untested chip on the support seat 22.

[0060] Specifically, the shielding box includes a box body 10, an outlet, a hinge, a handle 12, and a cover plate 11. The cover plate 11 is provided at the outlet. The hinge connects the bottom end of the cover plate 11 to the box body 10, and the handle 12 is connected to the cover plate 11.

[0061] Specifically, the temperature resistance testing device further includes a first magnetic component and a second magnetic component. The first magnetic component is connected to the top end of the cover plate 11, and the box body 10 is connected with a second magnetic component corresponding to the first magnetic component. The magnetic properties of the first magnetic component and the second magnetic component are opposite.

[0062] The cover plate 11 and the box body 10 are connected by a hinge, and the handle 12 is provided, enabling the operator to conveniently open or close the cover plate 11, thereby facilitating the insertion or removal of the chip. The first magnetic component is provided at the top end of the cover plate 11, and the second magnetic component with opposite magnetic properties is provided at the position of the box body 10 corresponding to the first magnetic component. When the cover plate 11 is closed, the two magnetic components will attract each other, making the cover plate 11 fit more firmly on the box body 10, closing the opening, and further enhancing the shielding effect.

[0063] Specifically, the temperature resistance testing device further includes a water tank 50, a water pump, a first water pipe, and a second water pipe. The water tank 50 stores water. The water pump is immersed in the water tank 50. The two ends of the first water pipe are respectively connected to the water pump and the water inlet, and the first end of the second water pipe is connected to the water outlet 36.

[0064] Specifically, the temperature resistance testing device further includes a chiller 51. The chiller 51 includes a water inlet end and a water outlet end. The water inlet end is connected to the water pump, the water outlet end is connected to the first water pipe, and the second end of the second water pipe is connected to the water tank 50.

[0065] The water tank 50 is used to store water. The water pump is responsible for pumping water out of the water tank 50 and delivering it to the chiller 51. After the chiller 51 cools the water, it is delivered to the first connection block 35 through the first water pipe. The heating surface connected to the first connection block 35 starts heat exchange, achieving effective cooling of the heating surface and ensuring that the cooling chip 37 can work continuously and stably. The heated cooling water flows back to the water tank 50 through the second water pipe for recycling, saving water resources.

[0066] Specifically, the pressure head 38 is made of brass. Brass has good thermal conductivity and can quickly transfer the low temperature of the cooling chip 37 to the chip to achieve low-temperature testing of the chip.

[0067] Specifically, the temperature resistance testing device further includes a water inlet pipe that communicates tap water and the water tank 50. The water tank 50 is provided with an observation window 52. The water inlet pipe enables tap water to directly enter the water tank 50 to provide a water source for the water tank 50. The observation window 52 allows the staff to directly observe the water storage and water quality inside the water tank 50 without opening the water tank 50, and then judge whether water needs to be replenished or replaced.

[0068] So far, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A temperature resistance test device, characterized in that, Comprising a shielding box and a testing mechanism disposed within the shielding box, the testing mechanism includes: A test board provided with a plurality of test pins; A supporting seat for supporting a chip; Conductive silicone connecting the test board and the supporting seat, with the test pins corresponding one-to-one to the test points on the chip; A pressing head disposed above the supporting seat; A Peltier device including a cooling surface, the cooling surface connecting to the pressing head; A first connecting block provided with a cavity, a water inlet and a water outlet, both the water inlet and the water outlet communicating with the cavity, the Peltier device including a heating surface, the first connecting block connecting to the heating surface; A power supply, the positive pole of the power supply connecting to the cooling surface and the negative pole of the power supply connecting to the heating surface; A second connecting block connecting to the first connecting block; A first adjusting mechanism connecting to the second connecting block for driving the pressing head to move up and down so that the chip abuts against the test pins.

2. The temperature resistance test device according to claim 1, characterized in that: The first adjusting mechanism includes a first motor, a rotating end of the first motor connecting to a driving gear, a belt meshing with the driving gear meshing with a driven gear, the driven gear connecting to a threaded rod, and a third connecting block threadedly connected to the threaded rod connecting to the second connecting block.

3. The temperature-resistant testing device according to claim 1, characterized in that: Further including a second adjusting mechanism, a guide rail and a moving seat, the moving seat for supporting the test board, the telescopic end of the second adjusting mechanism and the guide rail connecting to the moving seat, the second adjusting mechanism for driving the moving seat to move along the direction of the guide rail.

4. The temperature-resistant test equipment according to claim 3, characterized in that: Further including a baffle and a limiting block, the limiting block disposed at one end of the guide rail close to the outlet of the shielding box, the baffle connecting to the bottom of the moving seat, the second adjusting mechanism being a telescopic rod, the telescopic end of the telescopic rod connecting to the baffle.

5. The temperature-resistant testing device according to claim 1, characterized in that: The shielding box includes a box body, an outlet, a hinge, a handle and a cover plate, the cover plate disposed at the outlet, the hinge connecting the bottom end of the cover plate to the box body, the handle connecting to the cover plate.

6. The temperature-resistant testing device according to claim 5, wherein: Further including a first magnetic component and a second magnetic component, the first magnetic component connecting to the top end of the cover plate, the box body connecting to a second magnetic component corresponding to the first magnetic component, the first magnetic component and the second magnetic component having opposite magnetic polarities.

7. The temperature-resistant test equipment according to claim 1, characterized in that: Further including a water tank, a water pump, a first water pipe and a second water pipe, the water tank storing water, the water pump being immersed in the water tank, two ends of the first water pipe respectively connecting to the water pump and the water inlet, a first end of the second water pipe connecting to the water outlet.

8. The temperature-resistant testing device according to claim 7, wherein: Further including a chiller, the chiller including a water inlet end and a water outlet end, the water inlet end connecting to the water pump, the water outlet end connecting to the first water pipe, a second end of the second water pipe connecting to the water tank.

9. The temperature-resistant testing device according to claim 1, characterized in that: The pressing head is made of brass.

10. The temperature-resistant test device according to claim 7, characterized in that: Further including a water inlet pipe communicating tap water and the water tank, the water tank being provided with an observation window.

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