Flash memory chip testing device

Abstract

The utility model relates to the technical field of chip testing devices, and particularly discloses a flash memory chip testing device which comprises a bottom plate, guide rails are fixedly connected to the two sides of the upper end face of the bottom plate, sliding seats are slidably connected to the upper sides of the two guide rails, and a supporting frame is fixedly connected to the upper ends of the sliding seats. A transverse moving assembly is fixedly connected between the two supporting frames, one side of the upper end face of the bottom plate is connected with a longitudinal moving assembly, the longitudinal moving assembly is connected with a sliding base, the transverse moving assembly comprises a sliding table, the outer end of the sliding table is fixedly connected with a lifting air cylinder, and the lower end of the lifting air cylinder is fixedly connected with a negative pressure suction head. The front side of the upper end face of the bottom plate is fixedly connected with a plurality of test bases, and one side of each test base is connected with a rotary lifting assembly. According to the utility model, the automation degree is high, the working efficiency is high, and the large-scale production test requirements of chips can be met.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing devices, and particularly relates to a flash memory chip testing device. Background Technique

[0002] Flash memory chips can reliably store various types of data for a long time and enable fast reading and writing of data. Flash memory chips are widely used in various electronic devices, such as smartphones, tablet computers, laptop computers, digital cameras, solid-state drives, etc., and play an important role in modern information technology.

[0003] When flash memory chips are produced, a series of tests need to be carried out on the chips to ensure quality, such as functional tests, performance tests, durability tests, etc. At present, when testing flash memory chips, manual operation is mostly required, and the testing efficiency is not high enough, making it difficult to meet the testing requirements of large-scale chip production. Therefore, those skilled in the art have provided a flash memory chip testing device to solve the problems raised in the above background technique. Content of the Utility Model

[0004] The purpose of the utility model is to provide a flash memory chip testing device to solve the following technical problems:

[0005] How to improve the testing efficiency of flash memory chips and meet the testing requirements of large-scale chip production.

[0006] The purpose of the utility model can be achieved by the following technical solutions:

[0007] A flash memory chip testing device includes a bottom plate. Both sides of the upper end surface of the bottom plate are fixedly connected with guide rails. Sliding seats are slidably connected to the upper sides of the two guide rails. A support frame is fixedly connected to the upper end of the sliding seat. A transverse moving component is fixedly connected between the two support frames. One side of the upper end surface of the bottom plate is connected with a longitudinal moving component, and the longitudinal moving component is connected to the sliding seat;

[0008] The transverse moving component includes a slide table. A lifting cylinder is fixedly connected to the outer end of the slide table. A negative pressure suction head is fixedly connected to the lower end of the lifting cylinder;

[0009] A plurality of testing seats are fixedly connected to the front side of the upper end surface of the bottom plate. A rotating and lifting component is connected to one side of each of the plurality of testing seats, and a pressing cover is connected to one side of the rotating and lifting component.

[0010] Further, the rotation and lifting assembly includes a rotating seat. One side of the upper end surface of the rotating seat is fixedly connected with a connecting frame. An elevating lead screw is rotatably connected inside the connecting frame. The upper end of the connecting frame is fixedly connected with a third motor. The output end of the third motor is fixedly connected with the elevating lead screw. A slider is sleeved on the outer end of the elevating lead screw. The slider is fixedly connected with the gland. A slide rail is fixedly connected inside the connecting frame. The slider is slidably connected with the slide rail;

[0011] Further, the lifting assembly includes a drive box. The drive box is fixedly connected with the lower end surface of the bottom plate. Two mutually meshing gears are rotatably connected inside the drive box. A fourth motor is also fixedly connected inside the drive box. The two gears are respectively fixedly connected with the rotating seat and the rotating shaft of the fourth motor;

[0012] Further, the longitudinal movement assembly includes a longitudinal lead screw rotatably connected to one side of the upper end surface of the bottom plate. A moving sleeve is sleeved on the outer end of the longitudinal lead screw. The moving sleeve is fixedly connected with the adjacent slide seat. The longitudinal movement assembly further includes a first motor. The output end of the first motor is fixedly connected with the longitudinal lead screw;

[0013] Further, the transverse movement assembly further includes a chute. The two ends of the chute are fixedly connected with the support frame. A transverse lead screw is rotatably connected inside the chute. The rear end of the slide table is sleeved on the outer end of the transverse lead screw. A second motor is fixedly connected to the outer end of the chute. The output end of the second motor is fixedly connected with the transverse lead screw;

[0014] Further, a guide rod is fixedly connected inside the chute. The rear end of the slide table is slidably sleeved on the guide rod;

[0015] Further, two placing seats are arranged at the rear side of the upper end surface of the bottom plate. A plurality of chip placing grooves are evenly formed at intervals on the upper end surface of the placing seat;

[0016] Advantages of the present utility model:

[0017] The flash memory storage chip testing device proposed by the present utility model, when in use, through the arrangement of the transverse movement assembly, the longitudinal movement assembly and the lifting cylinder, the negative pressure suction head can move flexibly, so as to quickly and accurately suck the flash memory storage chip into the test seat. Then, the gland is driven to move by the rotation and lifting assembly, so that the gland rotates to the upper part of the test seat and presses on the test seat, ensuring that the chip pins are in close contact with the probes of the test seat and ensuring the test effect. The automation degree of this device is high, the working efficiency is fast, and it can meet the large-scale production test requirements of chips. Description of the drawings

[0018] The following further describes the present utility model with reference to the drawings.

[0019] Figure 1 It is the overall structure diagram of the flash memory storage chip testing device proposed by the present utility model;

[0020] Figure 2 It is the front view of the flash memory storage chip testing device proposed by the present utility model;

[0021] Figure 3 It is the structure diagram of the lifting assembly of the flash memory storage chip testing device proposed by the present utility model;

[0022] Figure 4 It is the internal structure diagram of the drive box of the flash memory storage chip testing device proposed by the present utility model.

[0023] Reference numerals:

[0024] 1. Bottom plate; 2. Guide rail; 3. Slide seat; 4. Support frame; 5. Longitudinal movement assembly; 51. Longitudinal lead screw; 52. Moving sleeve; 53. First motor; 6. Transverse movement assembly; 61. Chute; 62. Transverse lead screw; 63. Slide table; 64. Guide rod; 65. Second motor; 7. Test seat; 8. Pressing cover; 9. Rotating lifting assembly; 91. Rotating seat; 92. Connecting frame; 93. Slide rail; 94. Lifting lead screw; 95. Slide block; 96. Third motor; 97. Drive box; 98. Fourth motor; 99. Gear; 10. Lifting cylinder; 11. Negative pressure suction head; 12. Placing seat; 13. Chip placing groove. Specific embodiments

[0025] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without making creative efforts belong to the protection scope of the present utility model.

[0026] Please refer to the attached Figures 1 to 4 As shown in the figure, the flash memory storage chip testing device in the embodiments of the present utility model includes a bottom plate 1. Both sides of the upper end surface of the bottom plate 1 are fixedly connected with guide rails 2. Both upper sides of the two guide rails 2 are slidably connected with slide seats 3. The upper end of the slide seat 3 is fixedly connected with a support frame 4. A transverse movement assembly 6 is fixedly connected between the two support frames 4. One side of the upper end surface of the bottom plate 1 is connected with a longitudinal movement assembly 5, and the longitudinal movement assembly 5 is connected with the slide seat 3.

[0027] The lateral movement component 6 includes a sliding table 63. The outer end of the sliding table 63 is fixedly connected with a lifting cylinder 10. The lower end of the lifting cylinder 10 is fixedly connected with a negative pressure suction head 11. During use, the lateral movement component 6 drives the negative pressure suction head 11 to move laterally, the longitudinal movement component 5 drives the negative pressure suction head 11 to move longitudinally, and the provided lifting cylinder 10 is used to drive the negative pressure suction head 11 to lift, so that the negative pressure suction head 11 can move flexibly to facilitate the suction of chips.

[0028] On the front side of the upper end surface of the bottom plate 1, a plurality of test seats 7 are fixedly connected. One side of each of the plurality of test seats 7 is connected with a rotating and lifting component 9. One side of the rotating and lifting component 9 is connected with a pressing cover 8. The provided rotating and lifting component 9 facilitates driving the pressing cover 8 to move above the test seat 7 and press on the test seat 7.

[0029] The rotating and lifting component 9 includes a rotating seat 91. On one side of the upper end surface of the rotating seat 91, a connecting frame 92 is fixedly connected. Inside the connecting frame 92, a lifting lead screw 94 is rotatably connected. The upper end of the connecting frame 92 is fixedly connected with a third motor 96. The output end of the third motor 96 is fixedly connected with the lifting lead screw 94. An outer end of the lifting lead screw 94 is sleeved with a slider 95. The slider 95 is fixedly connected with the pressing cover 8. Inside the connecting frame 92, a slide rail 93 is fixedly connected. The slider 95 is slidably connected with the slide rail 93. During use of the rotating and lifting component 9, the rotation of the rotating seat 91 drives the pressing cover 8 to rotate 90° and move above the test seat 7. Then, the third motor 96 drives the lifting lead screw 94 to rotate, thereby driving the slider 95 to move downward, so that the pressing cover 8 is tightly pressed against the test seat 7, thus ensuring that the chip pins are in close contact with the probes of the test seat 7 and ensuring the test effect.

[0030] The lifting component 9 includes a driving box 97. The driving box 97 is fixedly connected with the lower end surface of the bottom plate 1. Inside the driving box 97, two meshing gears 99 are rotatably connected. Inside the driving box 97, a fourth motor 98 is also fixedly connected. The two gears 99 are respectively fixedly connected with the rotating seat 91 and the rotating shaft of the fourth motor 98. Driven by the provided fourth motor 98 and transmitted through the two gears 99, the rotating seat 91 is driven to rotate.

[0031] The longitudinal movement component 5 includes a longitudinal lead screw 51 rotatably connected to one side of the upper end surface of the bottom plate 1. An outer end of the longitudinal lead screw 51 is sleeved with a moving sleeve 52. The moving sleeve 52 is fixedly connected with the adjacent sliding seat 3. The longitudinal movement component 5 further includes a first motor 53. The output end of the first motor 53 is fixedly connected with the longitudinal lead screw 51. During use of the longitudinal movement component 5, driven by the provided first motor 53, the longitudinal lead screw 51 is driven to rotate, thereby driving the sliding seat 3 to slide along the guide rail 2 through the moving sleeve 52.

[0032] The lateral movement component 6 further includes a sliding groove 61. The two ends of the sliding groove 61 are fixedly connected to the support frame 4. A lateral lead screw 62 is rotatably connected inside the sliding groove 61. The rear end of the sliding table 63 is sleeved on the outer end of the lateral lead screw 62. A second motor 65 is fixedly connected to the outer end of the sliding groove 61. The output end of the second motor 65 is fixedly connected to the lateral lead screw 62. A guide rod 64 is also fixedly connected inside the sliding groove 61. The rear end of the sliding table 63 is slidably sleeved on the guide rod 64. When the lateral movement component 6 is in use, it is driven by the provided second motor 65 to drive the lateral lead screw 62 to rotate, thereby driving the sliding table 63 to move.

[0033] Two placement seats 12 are arranged on the rear side of the upper end surface of the bottom plate 1. A plurality of chip placement grooves 13 are evenly spaced on the upper end surface of the placement seats 12. The two placement seats 12 are respectively used to place the chips to be tested and the chips that have been tested.

[0034] The above has described in detail an embodiment of the present invention, but the content described is only the preferred embodiment of the present invention and cannot be considered as used to limit the scope of implementation of the present invention. All equivalent changes and improvements made according to the scope of the application of the present invention should still fall within the scope covered by the patent of the present invention.

Claims

1. Flash memory storage chip testing device, comprising a bottom plate (1), characterized in that: On both sides of the upper end surface of the bottom plate (1), guide rails (2) are fixedly connected. On the upper sides of the two guide rails (2), sliding seats (3) are slidably connected. On the upper end of the sliding seat (3), a support frame (4) is fixedly connected. Between the two support frames (4), a lateral moving assembly (6) is fixedly connected. On one side of the upper end surface of the bottom plate (1), a longitudinal moving assembly (5) is connected. The longitudinal moving assembly (5) is connected to the sliding seat (3). The lateral moving assembly (6) includes a sliding table (63). At the outer end of the sliding table (63), a lifting cylinder (10) is fixedly connected. At the lower end of the lifting cylinder (10), a negative pressure suction head (11) is fixedly connected. On the front side of the upper end surface of the bottom plate (1), a plurality of test seats (7) are fixedly connected. On one side of each of the plurality of test seats (7), a rotating and lifting assembly (9) is connected. On one side of the rotating and lifting assembly (9), a pressing cover (8) is connected.

2. The flash memory storage chip testing device according to claim 1, characterized in that: The rotating and lifting assembly (9) includes a rotating seat (91). On one side of the upper end surface of the rotating seat (91), a connecting frame (92) is fixedly connected. Inside the connecting frame (92), a lifting screw rod (94) is rotatably connected. At the upper end of the connecting frame (92), a third motor (96) is fixedly connected. The output end of the third motor (96) is fixedly connected to the lifting screw rod (94). A slider (95) is sleeved on the outer end of the lifting screw rod (94). The slider (95) is fixedly connected to the pressing cover (8). Inside the connecting frame (92), a sliding rail (93) is fixedly connected. The slider (95) is slidably connected to the sliding rail (93).

3. The flash memory storage chip testing device according to claim 2, characterized in that: The lifting assembly (9) includes a driving box (97). The driving box (97) is fixedly connected to the lower end surface of the bottom plate (1). Inside the driving box (97), two mutually meshing gears (99) are rotatably connected. Inside the driving box (97), a fourth motor (98) is also fixedly connected. The two gears (99) are respectively fixedly connected to the rotating shafts of the rotating seat (91) and the fourth motor (98).

4. The flash memory storage chip testing device according to claim 1, wherein: The longitudinal moving assembly (5) includes a longitudinal screw rod (51) rotatably connected to one side of the upper end surface of the bottom plate (1). A moving sleeve (52) is sleeved on the outer end of the longitudinal screw rod (51). The moving sleeve (52) is fixedly connected to the adjacent sliding seat (3). The longitudinal moving assembly (5) further includes a first motor (53). The output end of the first motor (53) is fixedly connected to the longitudinal screw rod (51).

5. The flash memory storage chip testing device according to claim 1, wherein: The lateral moving assembly (6) further includes a chute (61). The two ends of the chute (61) are fixedly connected to the support frame (4). Inside the chute (61), a lateral screw rod (62) is rotatably connected. The rear end of the sliding table (63) is sleeved on the outer end of the lateral screw rod (62). At the outer end of the chute (61), a second motor (65) is fixedly connected. The output end of the second motor (65) is fixedly connected to the lateral screw rod (62).

6. The flash memory storage chip testing device according to claim 5, characterized in that: Inside the chute (61), a guide rod (64) is also fixedly connected. The rear end of the sliding table (63) is slidably sleeved on the guide rod (64).

7. The flash memory storage chip testing device according to claim 1, characterized in that: On the rear side of the upper end surface of the bottom plate (1), there are two placement seats (12), and a plurality of chip placement grooves (13) are evenly spaced on the upper end surface of the placement seats (12).

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