Eddy current flaw detection device
Through the design of the eddy current flaw detection device, the eddy current probe does not contact the rails, and combined with the settings of the guides and flip components, the flaw detection problem of the rails in the fish scale peeling area is solved, and the continuous and effective detection of the rails is achieved, and the problem of poor coupling of the ultrasonic flaw detection device is avoided.
Patent Information
- Application Number
- CN202422307834.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-20
- Publication Date
- 2025-07-29
- Estimated Expiration
- 2034-09-20
AI Technical Summary
The existing ultrasonic flaw detection device is difficult to form a stable coupling liquid film on the rails of the fish scale stripping area, resulting in poor coupling of the probe and affecting the flaw detection effect. Moreover, the probability of nuclear injury in the fish scale stripping area is high, and there are many complex reflections, which interferes with the determination of flaw detection results.
Using the eddy current flaw detection device, the eddy current probe does not need to be in direct contact with the rail. By setting up the first guide and the flip assembly, the sliding assembly and the flip assembly are hinged at a suitable height, so as to detect the flaw of the rails in the fish scale-like peeling area, and facilitate the push through the rollers on the main bracket to achieve continuous detection.
Effective flaw detection on the rails in the fish-scale peeling area is achieved, avoiding the impact of the flatness of the rail surface on the detection, and ensuring the stability and continuity of the detection effect.
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Figure CN223166673U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of railway track maintenance, and particularly to an eddy current flaw detection device. Background Art
[0002] In order to avoid serious accidents caused by damage such as breakage and cracks in the steel rail during use, it is necessary to regularly conduct flaw detection inspections on the steel rail.
[0003] Currently, ultrasonic flaw detection devices are usually used to detect steel rails. Since ultrasonic waves attenuate rapidly in air, coupling liquid is usually used to expel the air between the ultrasonic transducer and the steel rail surface, thereby reducing the ultrasonic energy loss when the ultrasonic waves enter the steel rail from the probe wheel. This process is called coupling. For example, Chinese Patent with publication number CN106645413A discloses an ultrasonic coupling device for a steel rail flaw detection vehicle, which can eliminate the air gap between the probe wheel and the steel rail surface and form a stable water film, enabling ultrasonic waves to effectively penetrate into the steel rail. However, for a steel rail with fish-scale peeling on the rail surface, its surface is uneven, making it difficult to form a stable water film, resulting in poor probe coupling. In addition, the probability of nuclear damage in the area with fish-scale peeling is high, and there are many complex reflections in the peeling layer, which easily generates non-nuclear damage echo displays and interferes with the determination of flaw detection results. Summary of the Utility Model
[0004] The utility model provides an eddy current flaw detection device, which has low requirements for the flatness of the steel rail surface and can continuously detect the steel rail in the area with fish-scale peeling.
[0005] The utility model provides an eddy current flaw detection device, which includes a main bracket, a probe adjustment mechanism and rollers. One roller is respectively arranged at the front and rear ends of the main bracket, and the probe adjustment mechanism is arranged on the main bracket and located between the two rollers. The probe adjustment mechanism includes a first guide member, a sliding assembly and a flipping assembly. The first guide member is fixed on the main bracket and is vertical. The sliding assembly is slidably arranged on the first guide member. One end of the flipping assembly is hinged to the side of the sliding assembly away from the first guide member. The flipping assembly includes a mounting seat provided with a probe, and a supporting wheel is arranged on the mounting seat, and the supporting wheel keeps the mounting seat spaced from the steel rail.
[0006] In one embodiment, the sliding assembly includes an outer frame, an adjustment seat and a screw rod. The outer frame is slidably connected to the first guide member. A second guide member is arranged on the outer frame and is arranged horizontally. The adjustment seat is slidably arranged on the second guide member. The screw rod is arranged horizontally on the outer frame and penetrates through the adjustment seat, and the screw rod is in threaded connection with the adjustment seat.
[0007] In one embodiment, the flipping assembly further includes a fixed seat and a flipping seat. One side of the fixed seat is connected to the adjusting seat, the flipping seat is hinged to the side of the fixed seat away from the adjusting seat, and the mounting seat is arranged at one end of the flipping seat away from the fixed seat.
[0008] In one embodiment, the flipping assembly further includes a first fixing rod, a second fixing rod and a spring. The first fixing rod is arranged on the outer frame, the second fixing rod is arranged on the flipping seat, two ends of the spring are respectively connected to the first fixing rod and the second fixing rod, and both the first fixing rod and the second fixing rod are parallel to the rotation axis of the flipping seat.
[0009] In one embodiment, the rotation axis of the flipping seat is located between the first fixing rod and the second fixing rod.
[0010] In one embodiment, a secondary bracket for installing a flaw detector is further arranged on the main bracket, and the secondary bracket is arranged above the probe adjusting mechanism.
[0011] In one embodiment, the secondary bracket includes a bottom plate, a connecting plate and two oppositely arranged side plates. The connecting plate is connected to the main bracket, the two side plates are respectively connected to two sides of the connecting plate, two sides of the bottom plate are respectively connected to one side plate, the bottom plate is inclined, and one side of the bottom plate away from the connecting plate is higher than the side of the bottom plate connected to the connecting plate.
[0012] In one embodiment, the secondary bracket further includes a limiting rod, and two ends of the limiting rod are connected to the side of the side plate away from the connecting plate.
[0013] In one embodiment, a first heat dissipation hole is formed in the side plate, and a second heat dissipation hole is formed in the bottom plate.
[0014] In one embodiment, the secondary bracket further includes a handle arranged on the bottom plate, and the handle is located on the side of the bottom plate away from the connecting plate.
[0015] Compared with the prior art, the advantages of the present utility model are as follows: The probe for flaw detection using eddy current does not need to be in direct contact with the rail, thus being not affected by the flatness of the rail surface, and can achieve flaw detection of the rail in the area with fish-scale peeling. By setting the first guiding member, the sliding assembly and the flipping assembly can be set at an appropriate height. Since the flipping assembly is hinged to the sliding assembly instead of being rigidly connected, the flipping assembly can rotate to a certain extent during the flaw detection process, enabling the support wheels on the mounting seat to still maintain contact with the rail under the condition of rail surface undulation, so that a proper distance is always maintained between the mounting seat provided with the probe and the rail surface, achieving a better detection effect. The rollers provided on the main bracket enable the operator to conveniently push the eddy current flaw detection device on the rail, realizing continuous flaw detection of the rail over a relatively long distance. Description of the Drawings
[0016] In the following, the present utility model will be described in more detail based on the embodiments with reference to the drawings.
[0017] Figure 1 is one of the perspective views of the eddy current flaw detection device in the embodiment of the present utility model;
[0018] Figure 2 is the second perspective view of the eddy current flaw detection device in the embodiment of the present utility model;
[0019] Figure 3 is one of the perspective views of the probe adjustment mechanism in the embodiment of the present utility model;
[0020] Figure 4 is Figure 3 the exploded view of;
[0021] Figure 5 is the second perspective view of the probe adjustment mechanism in the embodiment of the present utility model;
[0022] Figure 6 is the third perspective view of the probe adjustment mechanism in the embodiment of the present utility model.
[0023] Reference Signs:
[0024] 1, main bracket; 2, probe adjustment mechanism; 21, first guiding member; 22, sliding assembly; 221, outer frame; 222, adjustment seat; 223, screw rod; 224, second guiding member; 23, flipping assembly; 231, mounting seat; 232, support wheel; 233, fixed seat; 234, flipping seat; 235, first fixing rod; 236, second fixing rod; 237, spring; 3, roller; 4, sub-bracket; 41, bottom plate; 42, connecting plate; 43, side plate; 44, limiting rod; 45, handle; 100, first heat dissipation hole; 200, second heat dissipation hole. Detailed Embodiments
[0025] The present utility model will be further described below in conjunction with the accompanying drawings.
[0026] As Figure 1 and Figure 2 shown, an eddy current flaw detection device according to an embodiment of the present utility model includes a main bracket 1, a probe adjustment mechanism 2 and rollers 3. A roller 3 is provided at each of the front and rear ends of the main bracket 1. The probe adjustment mechanism 2 is disposed on the main bracket 1 and located between the two rollers 3. The probe adjustment mechanism 2 includes a first guide member 21, a sliding assembly 22 and a flipping assembly 23. The first guide member 21 is fixed to the main bracket 1 and is vertical. The sliding assembly 22 is slidably disposed on the first guide member 21. One end of the flipping assembly 23 is hinged to the side of the sliding assembly 22 away from the first guide member 21. As Figure 3 and Figure 4 shown, the flipping assembly 23 includes a mounting seat 231 provided with a probe (not shown in the figure). A support wheel 232 is provided on the mounting seat 231. The support wheel 232 keeps the mounting seat 231 spaced from the rail.
[0027] The eddy current flaw detection device of this embodiment does not require the probe for flaw detection using eddy current to be in direct contact with the rail, so it is not affected by the flatness of the rail surface and can realize flaw detection of the rail in the fish-scale peeling section. By providing the first guide member 21, the sliding assembly 22 and the flipping assembly 23 can be set at an appropriate height. Since the flipping assembly 23 is hinged to the sliding assembly 22 instead of being rigidly connected, the flipping assembly 23 during the flaw detection process can rotate to a certain extent, so that the support wheel 232 on the mounting seat 231 can still keep in contact with the rail under the condition of rail surface undulation, and an appropriate distance is always maintained between the mounting seat 231 provided with the probe and the rail surface, achieving a better detection effect. The rollers 3 provided on the main bracket 1 enable the operator to conveniently push the eddy current flaw detection device on the rail and realize continuous flaw detection of the rail over a long distance.
[0028] As Figures 3 to 6 shown, the sliding assembly 22 includes an outer frame 221, an adjustment seat 222 and a screw 223. The outer frame 221 is slidably connected to the first guide member 21. A second guide member 224 is provided on the outer frame 221. The second guide member 224 is arranged in the horizontal direction. The adjustment seat 222 is slidably disposed on the second guide member 224. The screw 223 is horizontally arranged on the outer frame 221 and penetrates through the adjustment seat 222. The screw 223 is threadedly connected to the adjustment seat 222. When the screw 223 is rotated, the screw 223 rotates on the outer frame 221, and the adjustment seat 222 connected to the screw 223 can thus reciprocate along the second guide member 224, thereby adjusting the position of the flipping assembly 23 in the horizontal direction, so that the position of the probe mounted on the mounting seat 231 can be adjusted not only in the vertical direction but also in the horizontal direction, enabling the probe to be in a better detection position and achieving a better detection effect.
[0029] Furthermore, the flip assembly 23 includes a fixed seat 233 and a flip seat 234. One side of the fixed seat 233 is connected to the adjustment seat 222, and the flip seat 234 is hinged to the side of the fixed seat 233 facing away from the adjustment seat 222. The mounting seat 231 is disposed on the end of the flip seat 234 away from the fixed seat 233. When the surface of the rail has potholes and undulations, the flip seat 234, which is hinged to the fixed seat 233, will vibrate, and the support wheel 232 will always maintain contact with the surface of the rail.
[0030] Furthermore, the flip assembly 23 further includes a first fixing rod 235, a second fixing rod 236 and a spring 237. The first fixing rod 235 is provided on the outer frame 221, and the second fixing rod 236 is provided on the flip seat 234. Both ends of the spring 237 are connected to the first fixing rod 235 and the second fixing rod 236 respectively. The first fixing rod 235 and the second fixing rod 236 are parallel to the rotation axis of the flip seat 234. Figure 3 As shown, when performing flaw detection operations, the tension of the spring 237 causes the flip seat 234 to rotate toward one side of the rail, so that the support wheel 232 can exert a certain pressure on the surface of the rail, allowing the support wheel 232 to better fit the surface of the rail, thereby preventing the mounting seat 231 from jumping on uneven sections of the rail and affecting the detection of the probe.
[0031] like Figure 5 As shown, when not performing flaw detection, the flip seat 234 can be flipped upward, retracting the mounting base 231 and the probe to prevent damage to the probe. At this time, due to the tension of spring 237, the flip seat 234 will not fall due to gravity, but will remain stable. When flaw detection is required, the flip seat 234 can be manually rotated to overcome the tension of spring 237 and then flipped to the working position, making it very easy to use.
[0032] In this embodiment, the rotation axis of the flip seat 234 is located between the first fixing rod 235 and the second fixing rod 236. When the flip seat 234 is in the working state, the spring 237 is located below the rotation axis of the flip seat 234. When the flip seat 234 is in the storage state, the spring 237 is located above the rotation axis of the flip seat 234. In either state, the spring 237 can tighten the flip seat 234, keeping the flip seat 234 in a stable state.
[0033] like Figure 1 and Figure 2 As shown, the main bracket 1 is also provided with a sub-bracket 4 for mounting a flaw detector (not shown). The sub-bracket 4 is arranged above the probe adjustment mechanism 2. The sub-bracket 4 provides a placement for the flaw detector, which is connected to the probe on the mounting base 231 via a cable. The operator does not need to hold the flaw detector, but only needs to push the eddy current flaw detection device and record the detection data.
[0034] Furthermore, the secondary support 4 includes a base plate 41, a connecting plate 42, and two oppositely positioned side plates 43. The connecting plate 42 is connected to the main support 1, and the two side plates 43 are connected to either side of the connecting plate 42. Each side of the base plate 41 is connected to a side plate 43. The base plate 41 is tilted, with the side of the base plate 41 away from the connecting plate 42 being higher than the side where the base plate 41 connects to the connecting plate 42. The flaw detector can be placed on the secondary support 4 at an angle, and even if bumps occur during operation, the flaw detector is unlikely to fall off the secondary support 4, thereby preventing damage to the flaw detector.
[0035] like Figure 1 and Figure 2 As shown, the auxiliary bracket 4 further includes a limiting rod 44, the ends of which are connected to the side of the side plate 43 away from the connecting plate 42. The limiting rod 44 can limit the position of the flaw detector on the auxiliary bracket 4, preventing the flaw detector from falling off from the side away from the connecting plate 42, thereby preventing the flaw detector from falling.
[0036] like Figure 2 As shown, a first heat dissipation hole 100 is formed on the side panel 43, and a second heat dissipation hole 200 is formed on the bottom panel 41. The first heat dissipation hole 100 and the second heat dissipation hole 200 effectively transfer the heat dissipated by the flaw detector during operation to the surrounding air. Combined with the air flow generated by the movement of the eddy current flaw detection device, the flaw detector can effectively dissipate heat.
[0037] like Figure 1 and Figure 2 As shown, the secondary bracket 4 also includes a handle 45 provided on the base plate 41. The handle 45 is located on the side of the base plate 41 away from the connecting plate 42. The secondary bracket 4 and the main bracket 1 are detachably connected using screws, and the flaw detector and secondary bracket 4 are integrally mounted to the main bracket 1. The provision of the handle 45 makes it easier for operators to carry and install the flaw detector and secondary bracket 4.
[0038] While the present invention has been described with reference to preferred embodiments, various modifications may be made and equivalent components may be substituted without departing from the scope of the present invention. In particular, the various technical features described in the various embodiments may be combined in any manner, provided no structural conflicts exist. The present invention is not limited to the specific embodiments disclosed herein, but encompasses all technical solutions within the scope of the claims.
Claims
1. An eddy current flaw detection device, characterized in that, It includes a main bracket, a probe adjusting mechanism and rollers. One roller is provided at each of the front and rear ends of the main bracket. The probe adjusting mechanism is arranged on the main bracket and located between the two rollers. The probe adjusting mechanism includes a first guide member, a sliding assembly and a flipping assembly. The first guide member is fixed on the main bracket and is vertical. The sliding assembly is slidably arranged on the first guide member. One end of the flipping assembly is hinged to the side of the sliding assembly away from the first guide member. The flipping assembly includes a mounting seat provided with a probe. A supporting wheel is provided on the mounting seat, and the supporting wheel keeps the mounting seat spaced from the rail.
2. The eddy current flaw detection device according to claim 1, characterized in that, The sliding assembly includes an outer frame, an adjusting seat and a screw rod. The outer frame is slidably connected to the first guide member. A second guide member is provided on the outer frame and is arranged in the horizontal direction. The adjusting seat is slidably arranged on the second guide member. The screw rod is horizontally arranged on the outer frame and penetrates through the adjusting seat. The screw rod is threadedly connected to the adjusting seat.
3. The eddy current flaw detection device according to claim 2, characterized in that, The flipping assembly further includes a fixed seat and a flipping seat. One side of the fixed seat is connected to the adjusting seat. The flipping seat is hinged to the side of the fixed seat away from the adjusting seat. The mounting seat is arranged at one end of the flipping seat away from the fixed seat.
4. The eddy current flaw detection device according to claim 3, characterized in that, The flipping assembly further includes a first fixing rod, a second fixing rod and a spring. The first fixing rod is arranged on the outer frame. The second fixing rod is arranged on the flipping seat. Two ends of the spring are respectively connected to the first fixing rod and the second fixing rod. Both the first fixing rod and the second fixing rod are parallel to the rotation axis of the flipping seat.
5. The eddy current flaw detection device according to claim 4, characterized in that, The rotation axis of the flipping seat is located between the first fixing rod and the second fixing rod.
6. The eddy current flaw detection device according to claim 1, characterized in that, A sub-bracket for installing a flaw detector is further provided on the main bracket. The sub-bracket is arranged above the probe adjusting mechanism.
7. The eddy current flaw detection device according to claim 6, characterized in that, The sub-bracket includes a bottom plate, a connecting plate and two oppositely arranged side plates. The connecting plate is connected to the main bracket. The two side plates are respectively connected to both sides of the connecting plate. Two sides of the bottom plate are respectively connected to one side plate. The bottom plate is inclined. The side of the bottom plate away from the connecting plate is higher than the side where the bottom plate is connected to the connecting plate.
8. The eddy current flaw detection device according to claim 7, characterized in that, The sub-bracket further includes a limiting rod. Two ends of the limiting rod are connected to the side of the side plate away from the connecting plate.
9. The eddy current flaw detection device according to claim 7, characterized in that, First heat dissipation holes are formed in the side plates, and second heat dissipation holes are formed in the bottom plate.
10. The eddy current flaw detection device according to claim 7, characterized in that, The sub-bracket further includes a handle arranged on the bottom plate. The handle is located on the side of the bottom plate away from the connecting plate.
Citation Information
Patent Citations
Ultrasonic coupling device for rail flaw detecting car
CN106645413A