Chip general test bench
By designing an adjustable chip universal test bench, the problem of high cost of existing fixtures is solved, and cost-effective testing of multiple chips is achieved, with strong applicability.
Patent Information
- Application Number
- CN202421290549.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-06
- Publication Date
- 2025-07-29
- Estimated Expiration
- 2034-06-06
AI Technical Summary
Existing chip test fixtures are usually designed for a certain chip, which leads to the need to make a large number of special fixtures during testing of small batches of multiple types of chips, which is expensive and uneconomical.
A universal chip test bench is designed, including a test bench, a chip test circuit board and a chip limiting mechanism. Through an adjustable test fixing board and a circuit board limiting mechanism, the chip test circuit board and limiting frame are allowed to be replaced to meet the testing needs of different chips.
It realizes that there is no need to make a whole test bench for each type of chip, effectively saving costs, improving economic benefits, and being highly applicable, suitable for testing of multiple chip types.
Smart Images
Figure CN223166774U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of chip production testing, in particular to a universal chip testing platform. Background Art
[0002] Chip test jigs are widely used in semiconductor manufacturing, quality control, electronics industry, information technology, automotive industry and other fields. In the field of semiconductor manufacturing, chip test jigs are used for wafer-level testing and post-packaging testing to analyze chip performance and ensure chip quality. Existing test jigs are generally targeted at a certain type of chip. During chip production and manufacturing, a special jig is made to perform performance analysis or quality inspection on a certain type of chip. The test jig includes a test jig stand and a chip test circuit board and a chip limiting mechanism that are fixed and locked on the test jig stand. When performing performance analysis or quality inspection on small batches of multiple types of chips, a large number of chip test jigs need to be made for classified corresponding tests, which has a high cost of use. Utility Model Content
[0003] The utility model provides a universal chip test bench, which solves the problem that in the existing chip test fixture, one chip corresponds to one chip test fixture during testing, and the chip generation test or research test cost is high.
[0004] The technical solution adopted by the present invention to solve its technical problems is: a universal chip test bench, including a test bench, a chip test circuit board and a chip limiting mechanism, the upper end of the test bench is provided with an adjustable fixed test fixing plate, the test fixing plate is provided with a first test window running through from top to bottom, the chip limiting mechanism is fixed on the test fixing plate at a position corresponding to the first test window, the chip limiting mechanism is provided with a detachable chip limiting frame for limiting the chip, a circuit board limiting mechanism is provided below the test fixing plate on the test bench, the chip test circuit board is detachably fixed on the circuit board limiting mechanism and its position is adjusted in the horizontal and vertical directions by the circuit board limiting mechanism. To test different chips, different chip test circuit boards and chip limiting frames can be replaced, and there is no need to generate a corresponding entire test bench for each type of chip, which effectively saves costs and improves economic benefits.
[0005] Furthermore, the test bench includes two vertically parallel plates arranged in a corresponding manner. The upper ends of the vertical plates are evenly and juxtaposedly provided with a plurality of threaded fixing holes. A plurality of limiting slots are provided at both ends of the test fixing plate at positions corresponding to the threaded fixing holes on the upper ends of the two vertical plates. The test bench also includes fixing bolts that secure the test fixing plate to the upper ends of the vertical plates via the threaded fixing holes and the limiting slots. The threaded fixing holes and the limiting slots allow the fixing position of the test fixing plate to be adjusted, facilitating the alignment and installation of the chip test circuit board and the chip limiting mechanism.
[0006] Furthermore, the circuit board positioning mechanism includes a vertical adjustment mechanism and a horizontal adjustment mechanism. The vertical adjustment mechanism includes an adjustment rod and a lifting platform that cooperates with the adjustment rod. The horizontal adjustment mechanism includes a limit slot plate disposed on the lifting platform and horizontally adjustable test circuit board gripping fingers that are limited by the limit slot plate. By adjusting the fixed position of the chip test circuit board on the device, different chip test circuit boards can be replaced for positioning testing to accommodate different chips.
[0007] Furthermore, the limiting slot plate is fixed on the lifting platform, and a plurality of first limiting slots are arranged in parallel on the limiting slot plate. First sliding recesses are arranged on both sides of the bottom of the first limiting slots. The test circuit board clamping fingers include a clamping portion, a sliding limiting body, and a sliding limiting base arranged in sequence from top to bottom. The sliding limiting body and the sliding limiting base are respectively slidingly limited in the first limiting slot and the first sliding recess. The clamping portion protrudes above the limiting slot plate, and each of the first limiting slots is provided with at least one set of test circuit board clamping fingers with opposing clamping portions. Multiple sets of corresponding test circuit board clamping fingers can clamp and position the chip test circuit board at multiple different positions, with stable clamping. The multiple sets of corresponding test circuit board clamping fingers arranged separately can clamp irregular circuit boards, with strong applicability.
[0008] Furthermore, the limiting slot plate is fixed on the lifting platform, and a plurality of second limiting slots are arranged in parallel on the limiting slot plate. A third limiting slot is arranged perpendicular to the second limiting slots at one end, and a second sliding concave is arranged on both sides of the bottom of the second limiting slot. A third sliding concave is arranged on both sides of the bottom of the third limiting slot. The test circuit board clamping finger includes a first finger and a second finger, and the first finger and the second finger each include a clamping portion, a sliding limiting body, and a sliding limiting base arranged in sequence from top to bottom. The sliding limiting body and the sliding limiting base are respectively slidingly limited in the first limiting slot and the first sliding concave. The clamping portion protrudes above the limiting slot plate, and the first finger and the second finger are respectively arranged in the second limiting slot and the third limiting slot, and the clamping portions on the first finger and the second finger are located on the side close to each other. Fixed limiting chip test circuit board is more flexible, more stable for fixing and limiting special-shaped chip test circuit boards, and has strong applicability.
[0009] Furthermore, the upper end of the test circuit board clamping finger is provided with a fixing recess, the bottom of which is provided with a through-threaded clamping hole. A positioning bolt is installed in the clamping threaded hole. A metal wear-resistant plate is installed between the limit slot plate and the lifting platform. When the positioning bolt is tightened in the clamping threaded hole, the lower end of the positioning bolt contacts the metal wear-resistant plate. This has a long service life and is easy to fix.
[0010] Furthermore, a limiting recess is provided at the upper end of one side of the clamping portion, and the side wall of the limiting recess, which clamps the side edge of the chip test circuit board, is tilted toward the chip test circuit board. This prevents the chip test circuit board from tilting or shifting during the clamping process, improves the accuracy of the alignment and fixing operation, and reduces the difficulty of the alignment and fixing operation.
[0011] Furthermore, the width of the retaining slot is smaller than the diameter of the fixing bolt column, and a plurality of partially overlapping retaining holes are arranged in parallel within the retaining slot, which mate with the fixing bolt. The retaining holes provide more stable positioning, preventing displacement of the test fixture plate when operating the chip retaining mechanism to replace the test chip during testing.
[0012] Furthermore, the test bench is provided with a plurality of buttons which are connected to and control the chip test circuit board, and the test bench can be directly controlled by the direct buttons.
[0013] Furthermore, the test bench has a test stop recess on its upper surface, a cushion positioned within the recess, and multiple heat dissipation holes extending through the bottom of the cushion. Vertical through-holes, larger in area than the heat dissipation holes, are located at positions corresponding to the heat dissipation holes. The test stop recess provides a cushion for various products connected to the chip, preventing accidental contact with the product during operation from affecting test results. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 This is a schematic diagram of the main view of the utility model;
[0015] Figure 2 It is a top view schematic diagram of the utility model;
[0016] Figure 3 Schematic diagram of the top view of the first limiting chute structure;
[0017] Figure 4 It is a top view schematic diagram of the second limiting chute and the third limiting chute structure;
[0018] Figure 5 A schematic diagram of the front view of the gripping fingers for testing a circuit board;
[0019] Figure 6 It is a top view schematic diagram of the limiting groove and limiting hole structure;
[0020] Figure 7 It is a schematic diagram of the main view of the test limit recess and buffer pad structure.
[0021] The labels in the figure are: test bench 100, test fixing plate 110, limit groove 111, limit hole 112, vertical plate frame 120, threaded hole 121, fixing bolt 130, power button 141, switch button 142, reset button 143, volume up button 144, volume down button 145, buffer pad 150, heat dissipation hole 151, chip limit mechanism 300, circuit board limit mechanism 400, position adjustment rod 411, lifting platform 412, limit groove plate 420, first limit sliding groove 421, second limit sliding groove 422, third limit sliding groove 423, test circuit board clamping fingers 430, clamping part 431, sliding limit main body 432, sliding limit base 433, first finger 434, second finger 435, fixed concave platform 436, limit concave platform 437, metal wear-resistant plate 440. Detailed implementation manners
[0022] The present utility model will be further described below in conjunction with the accompanying drawings and detailed implementation manners.
[0023] As Figure 1 A general chip test bench as shown includes a test bench 100, a chip test circuit board, and a chip limit mechanism 300. An adjustable and fixed test fixing plate 110 is provided at the upper end of the test bench 100. A first test window penetrating up and down is provided on the test fixing plate 110. The chip limit mechanism 300 is fixed on the test fixing plate 110 at a position corresponding to the first test window. A chip limit frame for limiting the chip removably is provided inside the chip limit mechanism 300. A circuit board limit mechanism 400 is provided below the test fixing plate 110 on the test bench 100. The chip test circuit board is removably fixed on the circuit board limit mechanism 400 and its position in the horizontal and vertical directions is adjusted by the circuit board limit mechanism 400.
[0024] In this specific embodiment, the chip limit mechanism 300 includes a fixed base fixed on the test fixing plate 110. A fixed concave platform is provided inside the fixed base. The bottom of the fixed concave platform penetrates up and down and corresponds to the position of the first test window. The chip limit frame is limited and fixed in the fixed concave platform by screws. A flip limit component for elastically limiting the upper surface of the chip in the chip limit frame is provided on the fixed base. The chip limit frame fixed by screws can be disassembled and replaced when testing different types of chips;
[0025] The test part on the chip test circuit board corresponds to the first test window. During the test, when the chip is loaded into the chip limit frame and the flip limit component is covered, the flip limit component elastically presses the chip in the chip limit frame to be docked with the chip test circuit board, and then the test can be carried out;
[0026] When different types of chips need to be tested after the test is completed, remove the original test fixing plate 110 on the test bench 100, remove the original chip test circuit board from the circuit board limiting mechanism 400, then install the chip test circuit board matching the test chip onto the circuit board limiting mechanism 400, then remove the chip limiting frame on the test fixing plate 110 and replace it with a chip limiting frame matching the test chip, and then fix the test fixing plate 110 on the test bench 100. During the installation of the chip test circuit board and the test fixing plate 110, adjust their positions relative to each other so that the test parts on the chip test circuit board correspond to the first test windows on the test fixing plate 110 for subsequent testing. This can achieve the testing of chips in consumer electronic terminals such as mobile phones and tablets;
[0027] To test different chips, simply replace the chip test circuit board and the chip limiting frame. There is no need to generate a corresponding entire test bench for each type of chip, effectively saving costs and improving economic benefits.
[0028] On the basis of the above, as Figure 1 and Figure 2 shown, the test bench 100 includes two vertically parallel and correspondingly arranged vertical plate frames 120. At the upper ends of the vertical plate frames 120, a plurality of fixed threaded holes 121 are evenly arranged in parallel. At the corresponding positions of the two ends of the test fixing plate 110 and the fixed threaded holes 121 at the upper ends of the two vertical plate frames 120, a plurality of limiting slots 111 are provided. The test bench 100 further includes fixing bolts 130 for fixing the test fixing plate 110 to the upper ends of the vertical plate frames 120 through the fixed threaded holes 121 and the limiting slots 111. In this specific embodiment, 12 fixed threaded holes 121 are evenly arranged in parallel at the upper ends of the vertical plate frames 120. One end of the test fixing plate 110 is provided with two limiting slots 111 on both sides, and the two limiting slots 111 respectively correspond to one fixed threaded hole 121. During specific implementation, the number and corresponding spacing of the fixed threaded holes 121 can be determined according to specific requirements. Through the fixed threaded holes 121 and the limiting slots 111, the fixed position of the test fixing plate 110 can be adjusted to facilitate the alignment and installation of the chip test circuit board and the chip limiting mechanism 300.
[0029] On the basis of the above, as Figures 1 to 3 shown, the circuit board limiting mechanism 400 includes a vertical position adjustment mechanism and a horizontal position adjustment mechanism. The vertical position adjustment mechanism includes an adjustment rod 411 and a lifting platform 412 that cooperates with the adjustment rod 411. The horizontal position adjustment mechanism includes a limiting slot plate 420 provided on the lifting platform 412 and test circuit board clamping fingers 430 that can be horizontally adjusted and are limited by the limiting slot plate.
[0030] In this specific embodiment, the lifting platform 412 includes a lifting plate and a lead screw nut fixedly connected to the lower side of the lifting plate. A lead screw is arranged inside the lead screw nut and is matched with the lead screw nut. A bevel gear is arranged on the upper part of the lead screw and is arranged corresponding to and matched with the position adjusting rod 411. In specific operation, horizontally rotating the position adjusting rod 411 can drive the lead screw to rotate in the vertical direction through the bevel gears on the position adjusting rod 411 and the lead screw. The rotation of the lead screw in the vertical direction can drive the lead screw nut to move up and down on the lead screw, and further drive the lifting plate fixedly connected to the lead screw nut to move up and down. In specific implementation, the cooperation between the lifting platform 412 and the position adjusting rod 411 can also be other position adjusting driving mechanisms with horizontal-vertical direction conversion. While the test circuit board clamping fingers 430 that can be horizontally adjusted relative to each other can fixedly clamp the chip test circuit board, the fixed position of the chip test circuit board on the device can also be adjusted by adjusting the test circuit board clamping fingers 430, so as to facilitate positioning tests for different chips by replacing different chip test circuit boards.
[0031] On the basis of the above, as Figures 1 to 3 shown, the limit groove plate 420 is fixed on the lifting platform 412. A plurality of first limit sliding grooves 421 are arranged in parallel on the limit groove plate 420. First sliding concave platforms are arranged on both sides of the bottom of the first limit sliding grooves 421. The test circuit board clamping fingers 430 include a clamping part 431, a sliding limit main body 432, and a sliding limit base 433 arranged in sequence from top to bottom. The sliding limit main body 432 and the sliding limit base 433 are respectively arranged in the first limit sliding grooves 421 and the first sliding concave platforms in a sliding limit manner. The clamping part 431 protrudes above the limit groove plate 420. At least one group of test circuit board clamping fingers 430 with opposite clamping parts 431 is arranged in each first limit sliding groove 421.
[0032] In this specific embodiment, the limit groove plate 420 is fixed on the lifting platform 412 through bolts and the end fixing plates. Five first limit sliding grooves 421 are arranged in parallel on the limit groove plate 420 at equal intervals. Two test circuit board clamping fingers 430 are correspondingly arranged in each first limit sliding groove 421. The clamping parts 431 at the upper ends of the two test circuit board clamping fingers 430 correspond to each other. Moving the two corresponding test circuit board clamping fingers 430 can clamp and fix the two ends of the chip test circuit board through the clamping parts 431. Five groups of corresponding test circuit board clamping fingers 430 can clamp and position the chip test circuit board at multiple different positions. The clamping is stable. The five groups of corresponding test circuit board clamping fingers 430 arranged separately can clamp irregular circuit boards, and have strong applicability.
[0033] On the basis of the above, as Figure 1 、 Figure 2 and Figure 4As shown, the limit groove plate 420 is fixed on the lifting table 412. A plurality of second limit sliding grooves 422 are arranged in parallel on the limit groove plate 420. One end of the plurality of second limit sliding grooves 422 is provided with a third limit sliding groove 423 perpendicular thereto. Second sliding concave platforms are arranged on both sides of the bottom of the second limit sliding groove 422, and third sliding concave platforms are arranged on both sides of the bottom of the third limit sliding groove 423. The test circuit board clamping fingers 430 include a first finger 434 and a second finger 435. Both the first finger 434 and the second finger 435 include a clamping portion 431, a sliding limit main body 432, and a sliding limit base 433 arranged in sequence from top to bottom. The sliding limit main body 432 and the sliding limit base 433 are respectively arranged in the first limit sliding groove 421 and the first sliding concave platform in a sliding limit manner. The clamping portion 431 protrudes above the limit groove plate 420. The first finger 434 and the second finger 435 are respectively arranged in the second limit sliding groove 422 and the third limit sliding groove 423, and the clamping portions 431 on the first finger 434 and the second finger 435 are located on the side close to each other.
[0034] In this specific embodiment, the limit groove plate 420 is fixed on the lifting table 412 by bolts and the end fixing plate. Five second limit sliding grooves 422 are evenly spaced and arranged in parallel on one side of the limit groove plate 420. A first finger 434 is arranged in each second limit sliding groove 422. A third limit sliding groove 423 perpendicular to one of the second limit sliding grooves 422 is arranged on one side of the five second limit sliding grooves 422 on the limit groove plate 420. Four second fingers 435 are arranged in the third limit sliding groove 423. The clamping portion 431 on the first finger 434 is arranged on the side facing the second finger 435, and the clamping portion 431 on the second finger 435 is arranged on the side facing the first finger 434. Moving the five first fingers 434 in the five second limit sliding grooves can perform corresponding limiting on multiple points at one end of the chip test circuit board. Moving the four second fingers 435 in the third limit sliding groove can perform corresponding limiting on multiple points at the other end of the chip test circuit board. The five first fingers 434 in the five second limit sliding grooves and the four second fingers 435 in the third limit sliding groove can cooperate to perform limiting on multiple points on both sides of the chip test circuit board. The first finger 434 and the second finger 435 can correspond or not correspond, and the fixed limit of the chip test circuit board is more flexible, the fixed limit of the special-shaped chip test circuit board is more stable, and the applicability is strong.
[0035] On the basis of the above, such as Figures 1 to 5 and Figure 7As shown, the upper end of the test circuit board clamping finger 430 is provided with a fixing recess 436, and the bottom of the fixing recess 436 is provided with a through-threaded clamping hole. A positioning bolt is installed in the clamping threaded hole. A metal wear-resistant plate 440 is provided between the limit slot plate 420 and the lifting platform 412. When the positioning bolt is tightened in the clamping threaded hole, the lower end of the positioning bolt contacts the metal wear-resistant plate 440. In this specific embodiment, the metal wear-resistant plate 440 and the positioning bolt are both commercially available aluminum alloy components. In actual implementation, the metal wear-resistant plate 440 and the positioning bolt can also be other materials that have both good hardness and wear resistance. During the specific operation, after moving the test circuit board clamping finger 430 to the fixed position, tighten the positioning bolt. When the positioning bolt contacts the metal wear-resistant plate 440, the test circuit board clamping finger 430 will move upward relatively, and the upper surface of the sliding limit base 433 of the test circuit board clamping finger 430 will contact and position on the upper end wall of the first sliding recess (the second sliding recess and / or the second sliding recess), which has a long service life and is easy to fix.
[0036] On the basis of the above, if Figure 3 and Figure 4 As shown, a limiting recess 437 is provided on the upper end of the opposing side of the clamping portion 431. The limiting recess 437 is tilted toward the side of the chip test circuit board, clamping the side wall of the chip test circuit board. When clamping the side of the chip test circuit board, the opposing clamping portion 431 limits the lower end and upper side of the circuit board, preventing the chip test circuit board from tilting or shifting during the clamping process. This improves the accuracy of the alignment and fixation operation and reduces the difficulty of the alignment and fixation operation.
[0037] On the basis of the above, if Figure 2 and Figure 6 As shown, the width of the limiting groove 111 is smaller than the diameter of the column of the fixing bolt 130, and a plurality of partially overlapping limiting holes 112 are arranged in parallel in the limiting groove 111, and the limiting holes 112 match the fixing bolt 130. In this specific embodiment, there are nine limiting holes 112, which are specifically set according to the data of multiple types of circuit boards being tested. In conjunction with the circuit board limiting mechanism 400, a variety of circuit board replacement and positioning can be realized. During specific implementation, the number of limiting holes 112 can also be increased or decreased according to actual conditions. The limiting by the limiting holes 112 is more stable, avoiding the displacement of the test fixing plate 110 caused by operating the chip limiting mechanism 300 to replace the test chip during the test process.
[0038] On the basis of the above, if Figure 1 and Figure 2As shown, a plurality of buttons are provided on the test bench 100 that are connected to and control the chip test circuit board. In this specific embodiment, the buttons include a power button 141 for controlling the power switch, a switch button 142 for controlling the start and stop of the chip test circuit board, a reset button 143 for controlling the restart of the test, a volume up button 144 for increasing the prompt volume, and a volume down button 145 for decreasing the prompt volume. The direct manipulation of the test bench is achieved through the direct buttons.
[0039] On the basis of the above, as Figure 7 shown, a test limit concave platform is provided on the upper surface of the test bench 100. A buffer pad 150 is provided in the test limit concave platform. A plurality of through heat dissipation holes 151 are provided at the bottom of the buffer pad 150. A through hole that is vertically through and has an area larger than the heat dissipation holes 151 is provided at a position corresponding to the heat dissipation holes 151 in the test limit concave platform. In this specific embodiment, the buffer pad 150 is a high-temperature resistant and fireproof foam purchased on the market. In specific implementation, the buffer pad 150 can also be made of other materials with heat resistance and buffer protection performance. The provided test limit concave platform can buffer and place various products connected to the chip, avoiding the accidental touch of the products during operation and affecting the test results.
[0040] In the above specific embodiments, the purpose, technical solution, and beneficial effects of the present invention have been further described in detail. It should be understood that the above are only specific embodiments of the present invention and are not used to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.
Claims
1. A general chip test bench, comprising a test bench frame (100), a chip test circuit board and a chip limiting mechanism (300), characterized in that: At the upper end of the test bench (100), a test fixing plate (110) with adjustable position is provided. A first test window penetrating up and down is provided on the test fixing plate (110). The chip limiting mechanism (300) is fixed on the test fixing plate (110) at a position corresponding to the first test window. A chip limiting frame for limiting the chip removably is provided inside the chip limiting mechanism (300). Below the test fixing plate (110) on the test bench (100), a circuit board limiting mechanism (400) is provided. The chip test circuit board is removably fixed on the circuit board limiting mechanism (400) and its position in the horizontal and vertical directions is adjusted by the circuit board limiting mechanism (400).
2. The general chip test bench according to claim 1, characterized in that: The test bench (100) includes two vertically parallel and correspondingly arranged vertical plate frames (120). At the upper ends of the vertical plate frames (120), a plurality of fixing threaded holes (121) are evenly arranged in parallel. At positions corresponding to the fixing threaded holes (121) at the upper ends of the two vertical plate frames (120) at both ends of the test fixing plate (110), a plurality of limiting grooves (111) are provided. The test bench (100) further includes fixing bolts (130) for fixing the test fixing plate (110) to the upper ends of the vertical plate frames (120) through the fixing threaded holes (121) and the limiting grooves (111).
3. The general chip test bench according to claim 1, characterized in that: The circuit board limiting mechanism (400) includes a vertical position adjusting mechanism and a horizontal position adjusting mechanism. The vertical position adjusting mechanism includes an adjusting rod (411) and a lifting table (412) cooperating with the adjusting rod (411). The horizontal position adjusting mechanism includes a limiting groove plate (420) provided on the lifting table (412) and test circuit board clamping fingers (430) that can be horizontally adjusted and are limited by the limiting groove plate.
4. The general chip test bench according to claim 3, characterized in that: The limiting groove plate (420) is fixed on the lifting table (412). A plurality of first limiting sliding grooves (421) are arranged in parallel on the limiting groove plate (420). At both sides of the bottom of the first limiting sliding groove (421), first sliding concave platforms are provided. The test circuit board clamping fingers (430) include a clamping part (431), a sliding limiting main body (432), and a sliding limiting base (433) arranged in sequence from top to bottom. The sliding limiting main body (432) and the sliding limiting base (433) are respectively slidably limited in the first limiting sliding groove (421) and the first sliding concave platform. The clamping part (431) protrudes above the limiting groove plate (420). At least one group of test circuit board clamping fingers (430) with opposite clamping parts (431) is provided in each first limiting sliding groove (421).
5. A general chip test bench according to claim 3, characterized in that: The limiting groove plate (420) is fixed on the lifting table (412). A plurality of second limiting sliding grooves (422) are arranged in parallel on the limiting groove plate (420). One end of the plurality of second limiting sliding grooves (422) is provided with a third limiting sliding groove (423) perpendicular thereto. Second sliding concave platforms are arranged on both sides of the bottom of the second limiting sliding groove (422). Third sliding concave platforms are arranged on both sides of the bottom of the third limiting sliding groove (423). The test circuit board clamping fingers (430) include a first finger (434) and a second finger (435). The first finger (434) and the second finger (435) both include a clamping part (431), a sliding limiting main body (432), and a sliding limiting base (433) arranged in sequence from top to bottom. The sliding limiting main body (432) and the sliding limiting base (433) are respectively arranged in the first limiting sliding groove (421) and the first sliding concave platform in a sliding limiting manner. The clamping part (431) protrudes above the limiting groove plate (420). The first finger (434) and the second finger (435) are respectively arranged in the second limiting sliding groove (422) and the third limiting sliding groove (423), and the clamping parts (431) on the first finger (434) and the second finger (435) are located on the side close to each other.
6. A general chip test bench according to claim 4 or claim 5, characterized in that: A fixed concave platform (436) is arranged at the upper end of the test circuit board clamping fingers (430). A through clamping threaded hole is arranged at the bottom of the fixed concave platform (436). A positioning bolt is arranged in the clamping threaded hole. A metal wear-resistant plate (440) is arranged between the limiting groove plate (420) and the lifting table (412). When the positioning bolt is tightened in the clamping threaded hole, the lower end of the positioning bolt abuts against the metal wear-resistant plate (440).
7. A general chip test bench according to claim 4 or claim 5, characterized in that: A limiting concave platform (437) is arranged at the upper end of the side opposite to the clamping part (431). The side wall of the limiting concave platform (437) clamping the side of the chip test circuit board is inclined towards the side of the chip test circuit board.
8. A general chip test bench according to claim 2, characterized in that: The width of the limiting groove (111) is smaller than the diameter of the column of the fixing bolt (130). A plurality of partially overlapping limiting holes (112) are arranged in parallel in the limiting groove (111). The limiting holes (112) are matched with the fixing bolt (130).
9. The general chip test bench according to claim 1, characterized in that: A plurality of buttons for communicating with and controlling the chip test circuit board are arranged on the test bench (100).
10. A general chip test bench according to claim 1, characterized in that: A test limiting concave platform is arranged on the upper surface of the test bench (100). A buffer pad (150) is arranged in the test limiting concave platform. A plurality of through heat dissipation holes (151) are arranged at the bottom of the buffer pad (150). A through hole in the vertical direction and with an area larger than the heat dissipation hole (151) is arranged at the position corresponding to the test limiting concave platform and the heat dissipation hole (151).