Power supply circuit for electrostatic probe system and electrostatic probe system
Through the DC/DC converter with parallel input and series output, the DC/DC converter and delay filter circuit provide a stable power supply for the electrostatic probe system, solving the problem of unstable power supply of the electrostatic probe and achieving efficient voltage conversion and power supply stability.
Patent Information
- Application Number
- CN202422340223.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-25
- Publication Date
- 2025-08-01
- Estimated Expiration
- 2034-09-25
AI Technical Summary
How to provide a stable and reliable power supply to electrostatic probes to ensure that they accurately diagnose plasma parameters in magnetically constrained fusion devices such as tokamak.
Multiple DC/DC converters with parallel input and series output are adopted, combined with delay circuit and filter circuit, to ensure stable start-up and voltage conversion of the power supply circuit, including RC delay circuit, input filter circuit and output filter circuit, to prevent large current impact and voltage fluctuations.
It realizes high current input and low voltage output, meets the high voltage requirements of the electrostatic probe system, ensures the stability and reliability of the power supply circuit, avoids current shock and voltage fluctuations, and provides stable power supply support.
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Figure CN223182008U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of power electronics, and particularly relates to a power supply circuit for an electrostatic probe system and an electrostatic probe system. Background Art
[0002] An electrostatic probe (also known as a Langmuir probe) is a diagnostic tool used to measure the characteristics of a plasma, and can be used to determine parameters such as plasma electron temperature, plasma electron density, and plasma potential. In magnetic confinement fusion devices such as tokamaks, one or more electrostatic probes are usually inserted into the plasma, and a constant or time-varying electric potential is applied between the electrodes or between the electrodes and the surrounding environment to drive the electrostatic probe to work. In order to ensure accurate diagnosis, a stable and reliable power supply needs to be provided for the electrostatic probe.
[0003] Therefore, how to provide a stable and reliable power supply for the electrostatic probe has become a technical problem to be solved urgently. Summary of the Utility Model
[0004] In view of this, the present application provides a power supply circuit for an electrostatic probe system and an electrostatic probe system to solve the technical problem of how to provide a stable and reliable power supply for the electrostatic probe.
[0005] Based on this, according to the first aspect, an embodiment of the present application provides a power supply circuit for an electrostatic probe system. The electrostatic probe system includes an electrostatic probe, an electrostatic probe driving device, and a power supply circuit. The power supply circuit includes: a plurality of DC / DC converters with parallel inputs and series outputs, connected between a power supply and the electrostatic probe driving device; a plurality of delay circuits, corresponding to the DC / DC converters one by one, with the input ends connected to the power supply and the output ends respectively connected to the delay enable ends of the DC / DC converters, for starting the plurality of DC / DC converters with staggered peaks.
[0006] In one embodiment, the delay circuit includes an RC delay circuit.
[0007] In one embodiment, the resistance values and / or capacitance values of the RC delay circuits corresponding to different DC / DC converters are different.
[0008] In one embodiment, the RC delay circuit includes: a first resistor, a first capacitor, and a second resistor. The first capacitor is connected in parallel with the second resistor and then connected in series with the first resistor between the power supply and the ground. The output end of the RC delay circuit is provided between the first resistor and the first capacitor.
[0009] In one embodiment, the delay enable terminal includes the start pin of a DC / DC converter, and the output terminal of the RC delay circuit is connected to the start pin.
[0010] In one embodiment, the power supply circuit for the electrostatic probe system further includes: an input filter circuit disposed at the input end of the DC / DC converter; an output filter circuit disposed at the output end of the DC / DC converter.
[0011] In one embodiment, the power supply circuit for the electrostatic probe system further includes: an overcurrent protection circuit disposed at the input ends of multiple DC / DC converters; an overvoltage protection circuit disposed at the output ends of multiple DC / DC converters.
[0012] In one embodiment, the power supply circuit for the electrostatic probe system further includes: a heat dissipation device disposed on multiple DC / DC converters.
[0013] In one embodiment, the multiple DC / DC converters include a first group of DC / DC converters and a second group of DC / DC converters with the same quantity, wherein the first group of DC / DC converters outputs a positive voltage, and the second group of DC / DC converters outputs a negative voltage; the output powers of the first group of DC / DC converters and the second group of DC / DC converters are different.
[0014] According to a first aspect, an embodiment of the present application provides an electrostatic probe system, including: an electrostatic probe, an electrostatic probe driving device, and the power supply circuit for the electrostatic probe system according to any one of the above first aspects; the power supply circuit is connected to the electrostatic probe driving device.
[0015] The present application has at least the following beneficial effects:
[0016] The power supply circuit for the electrostatic probe system provided by the present application includes multiple DC / DC converters with parallel inputs and series outputs, which are connected between the power supply and the electrostatic probe driving device to convert the input voltage into the supply voltage of the electrostatic probe driving device. The parallel inputs meet the higher input current requirements, and the series output method is used to achieve low voltage input and high voltage output to meet the high voltage requirements for the electrostatic probe system. Multiple delay circuits correspond to the multiple DC / DC converters one by one, with the input ends connected to the power supply and the output ends respectively connected to the delay enable terminals of the DC / DC converters, for staggering the startup of the multiple DC / DC converters, ensuring the stable startup of the power supply circuit, and preventing large current impacts caused by parallel inputs. Description of the Drawings
[0017] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0018] Figure 1 It is a modular schematic diagram of a power supply circuit for an electrostatic probe system according to an embodiment of the present application;
[0019] Figure 2 It is a schematic diagram of a power supply circuit for an electrostatic probe system according to an embodiment of the present application. Specific Embodiments
[0020] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0021] The present invention provides a power supply circuit for an electrostatic probe system. Among them, the electrostatic probe system includes an electrostatic probe, an electrostatic probe driving device, and a power supply circuit. The power supply circuit is connected to the electrostatic probe driving device and is used to supply power to the electrostatic probe driving device. As Figure 1 and Figure 2 shown, the power supply circuit includes a plurality of DC / DC converters 10 with parallel inputs and serial outputs, which are connected between the power supply and the electrostatic probe driving device to convert the input voltage into the supply voltage of the electrostatic probe driving device. By means of parallel inputs, higher input current requirements can be met, and by means of serial outputs, low-voltage input and high-voltage output can be achieved to meet the high-voltage requirements for the electrostatic probe system.
[0022] In one embodiment, the plurality of DC / DC converters 10 can be divided into two groups of DC / DC converters 10 to output positive voltage and negative voltage respectively. In this embodiment, the first group of DC / DC converters can output positive voltage, and the second group of DC / DC converters can output negative voltage to meet the positive and negative high-voltage power supplies required by the electrostatic probe driving device. Among them, Figure 1 and Figure 2 show one group of DC / DC converters, and the selection of the DC / DC converters in each group can be determined based on actual requirements.
[0023] To facilitate the measurement of the electrostatic probe, in one embodiment, the output powers of the first group of DC / DC converters and the second group of DC / DC converters are different. Exemplarily, the first group of DC / DC converters outputs a positive voltage, the second group of DC / DC converters outputs a negative voltage, and the output power of the first group of DC / DC converters is greater than that of the second DC / DC converter. For example, the output power of the first group of DC / DC converters is 200W, and the output power of the second group of DC / DC converters is 40W. The above output powers are only exemplary, and the actual output power can be adjusted according to actual applications.
[0024] In one embodiment, the number of each group of DC / DC converters can be determined based on the power supply voltage and the output voltage. In this embodiment, taking the power supply voltage of 48V and the voltage required by the electrostatic probe driving device of 192V as an example, therefore, each group can include 4 DC / DC converters 10. In this embodiment, a DC / DC isolation converter with an input of 48V and an output of 48V is taken as an example for illustration:
[0025] The input ends of the 4 DC / DC converters 10 in each group are connected in parallel, and the output ends are connected in series to achieve an output voltage of 192V. To ensure the stable startup of the power supply circuit and avoid the large current impact during parallel input startup, in this embodiment, a delay circuit 20 is respectively set for each of the four power modules in each group for staggered startup.
[0026] Specifically, a plurality of delay circuits 20 correspond to the plurality of DC / DC converters 10 one by one. The input ends are connected to the power supply, and the output ends are respectively connected to the delay enable ends of the DC / DC converters 10, which are used to stagger the startup of the plurality of DC / DC converters 10, ensure the stable startup of the power supply circuit, and prevent large current impact caused by parallel input.
[0027] In one embodiment, the delay circuit 20 can adopt an RC delay circuit, or a delay circuit based on a timer. For example, a delay circuit based on a 555 timer can also be used. A controller can also be used as the delay circuit to control the startup time of each DC / DC converter 10 through a program.
[0028] As Figure 2 shown, taking the RC delay circuit as an example for illustration: The RC delay circuit includes a first resistor R1, a first capacitor C1, and a second resistor R2. Among them, the first capacitor C1 is connected in parallel with the second resistor R2 and then connected in series with the first resistor R1 between the power supply and the ground. The output end of the RC delay circuit is set between the first resistor R1 and the first capacitor C1.
[0029] The delay duration of the RC delay circuit can be expressed by the following formula:
[0030]
[0031] Wherein, T is the delay duration, R is the resistance value of the first resistor F1, C is the capacitance value of the first capacitor C1, U is the power supply voltage, and U i is the startup voltage of the DC / DC converter 10.
[0032] Based on the above formula, the delay duration can be controlled by adjusting the resistance value of the first resistor and / or the capacitance value of the first capacitor, ensuring that each DC / DC converter can be started at different time points.
[0033] In one embodiment, the output end of the delay circuit 10 is respectively connected to the delay enable end of the DC / DC converter. As Figure 2 shown, the delay enable end of the DC / DC converter 10 can be the startup pin Ctrl of the DC / DC converter. When the DC / DC converter 10 has no startup pin, a control switch can be connected in series at the input end of the DC / DC converter as the delay enable end. Exemplarily, a triode, a MOS transistor, etc. can be connected in series at the input end of the DC / DC converter 10 as the control switch, and the control end of the control switch is connected to the output end of the delay circuit. Further, in order to increase the startup delay duration, a voltage stabilizing diode can also be connected in series between the control end of the control switch and the output end of the delay circuit to indirectly increase the turn-on voltage of the control switch, thereby extending the startup delay duration.
[0034] In one embodiment, in order to improve the stability of the power supply circuit, an input filter circuit 30 is respectively arranged at the input end of the DC / DC converter 10 to filter the input voltage of the power supply and reduce the fluctuation of the input current. In this embodiment, the input filter circuit 30 can adopt a passive filter circuit, such as any one of a capacitor filter circuit, an inductor filter circuit, and an LC filter circuit. In this embodiment, a capacitor filter circuit can be adopted. Wherein, as Figure 2 shown, the capacitor filter circuit includes a first filter capacitor C2 connected in series between the positive electrode and the negative electrode at the input end; the first filter capacitor C2 can be an electrolytic capacitor with a capacitance value of 100 μF and a voltage of 63V.
[0035] Further, an output filter circuit 40 can also be respectively arranged at the output end of the DC / DC converter 10 to reduce the fluctuation of the output voltage. The output filter circuit 30 can adopt a passive filter circuit, such as any one of a capacitor filter circuit, an inductor filter circuit, and an LC filter circuit. In this embodiment, a capacitor filter circuit can be adopted. Wherein, as Figure 2 shown, the capacitor filter circuit includes at least one second filter capacitor C3 connected in series between the positive electrode and the negative electrode at the input end; the second filter capacitor C3 can be an electrolytic capacitor with a capacitance value of 100 μF and a voltage of 250V.
[0036] In one embodiment, an overcurrent protection circuit may also be provided at the input ends of the plurality of DC / DC converters 10. Exemplarily, a positive temperature coefficient thermistor, a circuit breaker, a fuse, etc. may be used as the overcurrent protection circuit, or an integrated overcurrent protector may be used, or an electronic circuit protector may be used, such as a thyristor, an overcurrent protection relay, etc.
[0037] In one embodiment, an overvoltage protection circuit may also be provided at the output ends of the plurality of DC / DC converters 10 to prevent the output voltage from exceeding the voltage required by the electrostatic probe driving device, so as to protect the electrostatic probe driving device. In this embodiment, the overvoltage protection circuit may adopt a voltage stabilizing circuit based on a Zener diode or a voltage stabilizing circuit based on a thyristor.
[0038] In order to prevent the power supply circuit from overheating during operation and affect the working stability of the responder, in one embodiment, sufficient heat dissipation space or a heat sink may be configured for the DC / DC converter 10 to dissipate heat from the DC / DC converter 10.
[0039] The embodiment of the present application also provides an electrostatic probe system, including an electrostatic probe, an electrostatic probe driving device, and the power supply circuit for the electrostatic probe system described in the above embodiments; the power supply circuit is connected to the electrostatic probe driving device.
[0040] Specific examples in this embodiment may refer to the examples described in the above embodiments, and will not be elaborated herein.
[0041] The serial numbers of the above embodiments of the present application are only for description and do not represent the advantages or disadvantages of the embodiments.
[0042] In the above embodiments of the present application, the descriptions of each embodiment have their own emphases. For the parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.
[0043] The above is only the preferred embodiment of the present application. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present application, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of the present application.
Claims
1. A power supply circuit for an electrostatic probe system, characterized in that, The electrostatic probe system includes an electrostatic probe, an electrostatic probe driving device, and a power supply circuit. Among them, the power supply circuit includes: A plurality of DC / DC converters with parallel input and series output, connected between the power supply and the electrostatic probe driving device; A plurality of delay circuits, corresponding one-to-one to the plurality of DC / DC converters, with the input ends connected to the power supply and the output ends respectively connected to the delay enable ends of the DC / DC converters, for starting the plurality of DC / DC converters with staggered peaks.
2. The power supply circuit for an electrostatic probe system according to claim 1, wherein The delay circuit includes an RC delay circuit.
3. The power supply circuit for an electrostatic probe system according to claim 2, characterized in that, The resistance values and / or capacitance values of the RC delay circuits corresponding to different DC / DC converters are different.
4. The power supply circuit for an electrostatic probe system according to claim 2, characterized in that, The RC delay circuit includes: a first resistor, a first capacitor, and a second resistor. Among them, the first capacitor is in parallel with the second resistor and then in series with the first resistor between the power supply and the ground, and the output end of the RC delay circuit is set between the first resistor and the first capacitor.
5. The power supply circuit for an electrostatic probe system according to claim 4, characterized in that, The delay enable end includes the start pin of the DC / DC converter, and the output end of the RC delay circuit is connected to the start pin.
6. The power supply circuit for an electrostatic probe system according to claim 1, characterized in that, It further includes: An input filter circuit, arranged at the input end of the DC / DC converter; An output filter circuit, arranged at the output end of the DC / DC converter.
7. The power supply circuit for an electrostatic probe system according to claim 1, characterized in that, It further includes: An overcurrent protection circuit, arranged at the input ends of the plurality of DC / DC converters; An overvoltage protection circuit, arranged at the output ends of the plurality of DC / DC converters.
8. The power supply circuit for an electrostatic probe system according to claim 1, wherein It further includes: A heat dissipation device, arranged on the plurality of DC / DC converters.
9. The power supply circuit for an electrostatic probe system according to claim 1, characterized in that, The plurality of DC / DC converters are divided into a first group of DC / DC converters and a second group of DC / DC converters. The number of DC / DC converters in the first group is the same as that in the second group. The first group of DC / DC converters outputs a positive voltage, and the second group of DC / DC converters outputs a negative voltage; The output powers of the first group of DC / DC converters and the second group of DC / DC converters are different.
10. An electrostatic probe system, characterized in that, It includes: An electrostatic probe, an electrostatic probe driving device, and the power supply circuit for the electrostatic probe system according to any one of claims 1 to 9; The power supply circuit is connected to the electrostatic probe driving device.
Citation Information
Cited By
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