Carrier and conduction tester with same

By designing a combination of a vehicle and a conduction tester, a single loop test of a flexible electrocardiogram electrode circuit is realized, solving the problem of low testing efficiency in the existing technology and improving the testing efficiency.

CN223192989UActive Publication Date: 2025-08-05SOUTH SUZHOU MEDICAL TECH CO LTD
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Patent Information

Application Number
CN202422287004.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-19
Publication Date
2025-08-05
Estimated Expiration
2034-09-19

AI Technical Summary

Technical Problem

In the prior art, the conductivity performance testing of flexible electrocardiograms is low, and the electrode circuit needs to be measured repeatedly three times.

Method used

A vehicle is designed, including a support stage and a conductor, and a single circuit is formed through the connection between the first conductor and the second conductor, and combined with a probe of the conduction tester and a multimeter to complete the resistance measurement of the three electrode circuits in one test.

Benefits of technology

The test efficiency of electronic devices is improved, and the resistance measurement of the flexible patch electrode circuit is realized in one test, which improves the test efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of sensor detection, in particular to a carrier and a conduction tester with the same. According to the carrier provided by the utility model, the first part and the second part of the supporting table can be used for supporting the electronic device to be tested, at the moment, the electric connection point of the electronic device can be connected with the second conductor, the first conductor of the first part is connected with one second conductor of the second part, and the other two second conductors are electrically connected; the first conductor and the three second conductors form a single loop with the help of the electronic device to be tested and a tester, so that the measurement of the conduction performance such as resistance of three electrode circuits can be completed through one-time test, and the test efficiency of the electronic device is improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of sensor detection, and particularly relates to a vehicle and a conduction tester having the same. Background Art

[0002] A dynamic electrocardiogram recorder can continuously record electrocardiogram activities under the daily life state of a patient, and is a conventional means for monitoring arrhythmia. At present, a dynamic electrocardiogram recorder includes a disposable flexible patch attached to the human skin, and the flexible patch includes three electrodes and electrode circuits. During the preparation process of the flexible patch, it is necessary to measure the conduction performance such as the resistance of different electrode circuits. At present, for the electrode circuit composed of three electrodes, it needs to be measured three times repeatedly, resulting in low test efficiency. Content of the Utility Model

[0003] Therefore, the technical problem to be solved by the utility model is to solve the problem of low test efficiency of the conduction performance of the flexible electrocardiogram patch in the prior art, so as to provide a vehicle and a conduction tester having the same.

[0004] To solve the above technical problem, the technical scheme adopted by the utility model is as follows:

[0005] The utility model provides a vehicle for carrying an electronic device to be tested on a tester, including:

[0006] A support platform, the support platform includes a first part and a second part;

[0007] The first part includes a first conductor, and the top of the first conductor is exposed on the surface of the first part;

[0008] The second part includes at least three second conductors, and the top of the second conductor is exposed on the surface of the second part;

[0009] The first conductor is electrically connected to one of the second conductors, and the other two second conductors are electrically connected; the first conductor and the three second conductors form a single loop with the tester through the electronic device to be tested.

[0010] Specifically, the above vehicle further includes a base, and the first part and the second part are respectively arranged on the base.

[0011] Further, in the above vehicle, the first conductor and the second conductor are copper columns, and the copper columns are stepped copper columns with a larger upper part and a smaller lower part.

[0012] Further, in the above vehicle, the side wall of the second part has a horizontally arranged chute.

[0013] Further, for the above-mentioned vehicle, the position where the first conductor is electrically connected to the second conductor, and / or the position where the second conductors are electrically connected to each other, is located at the lower end of the stepped copper pillar.

[0014] The present utility model further provides a conduction tester, comprising:

[0015] A test bench, on which there are a first positioning block and a second positioning block; between the two positioning blocks, it is suitable for positioning the vehicle as described in any one of the above.

[0016] A test board, which is movably arranged above the test bench, and on the test board, there are a number of probes, and the probes are respectively suitable for abutting against the first conductor and the electrodes of the electronic device.

[0017] Specifically, the above-mentioned conduction tester further comprises: a vertical plate, which is vertically arranged on the test bench; and a pressing mechanism, which is movably arranged on the vertical plate, and the pressing mechanism drives the test board to move up and down.

[0018] Further, for the above-mentioned conduction tester, the pressing mechanism comprises: a driving wrench, which has a first part and a second part that are hinged to each other, wherein the first part is hinged to the vertical plate; a driving rod, the upper part of the driving rod is hinged to the second part, and the lower part of the driving rod is connected to the test board.

[0019] Further, for the above-mentioned conduction tester, the pressing mechanism further comprises: a first guiding structure, the first guiding structure is a guiding sleeve, and the driving rod movably passes through the guiding sleeve; a second guiding structure, the second guiding structure is two guiding rods, and the two guiding rods are respectively movably passed through the test board on both sides.

[0020] Further, for the above-mentioned conduction tester, it further comprises a multimeter, which is suitable for being placed on the test bench; there are four probes on the test board, and one ends of two of the probes are respectively connected to the measuring circuits of the multimeter, and one ends of the other two probes are connected to each other; in the pressed state of the test board, the other ends of the four probes are respectively connected to the first conductor and three electrodes of the electronic device, and the electrical connection points of the electronic device are respectively connected to the second conductor, thereby forming a single loop.

[0021] The technical solution of the present utility model has the following advantages:

[0022] The vehicle provided by the present utility model has a first part and a second part of a support platform that can be used to support an electronic device to be tested. At this time, the electrical connection points of the electronic device can be connected to a second conductor, the first conductor of the first part is connected to one second conductor of the second part, and the other two second conductors are electrically connected. The first conductor and the three second conductors form a single loop with the tester through the electronic device to be tested, so that the conduction performance such as the resistance of three electrode circuits can be measured through one test, improving the test efficiency of the electronic device.

[0023] The conduction tester provided by the present utility model can measure the resistance of the electrode circuit in the flexible patch using a multimeter. The probes of the tester are respectively connected to the measurement circuit of the multimeter, the electrodes of the electronic device, and the first conductor, so as to form a single loop among the electronic device, the first conductor, the second conductor, and the measurement circuit. The resistance of the three electrode circuits can be measured through one test, improving the test efficiency of the electronic device. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the specific embodiments of the present utility model or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the following drawings are some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0025] Figure 1 One of the schematic structural diagrams of the vehicle provided in the embodiment of the present utility model;

[0026] Figure 2 Another schematic structural diagram of the vehicle provided in the embodiment of the present utility model;

[0027] Figure 3 Another schematic structural diagram of the vehicle provided in the embodiment of the present utility model;

[0028] Figure 4 One of the schematic structural diagrams of the conduction tester provided in the embodiment of the present utility model;

[0029] Figure 5 Another schematic structural diagram of the conduction tester provided in the embodiment of the present utility model;

[0030] Figure 6 Another schematic structural diagram of the conduction tester provided in the embodiment of the present utility model;

[0031] Figure 7 One of the schematic structural diagrams of the electronic device provided in the embodiment of the present utility model;

[0032] Figure 8 This is the second schematic diagram of the electronic device structure provided in the embodiment of the present utility model.

[0033] Explanation of reference numerals:

[0034] 1 - Electronic device; 11 - Electrode; 12 - Buckle; 13 - Electrode circuit; 14 - Electrical connection point; 2 - Support platform; 21 - First part; 211 - First conductor; 22 - Second part; 221 - Second conductor; 222 - Slide groove; 3 - Base; 4 - Test bench; 41 - First positioning block; 42 - Second positioning block; 5 - Test board; 51 - Probe; 6 - Vertical plate; 7 - Pressing mechanism; 71 - Driving wrench; 711 - First hinge part; 712 - Second hinge part; 72 - Driving rod; 73 - First guiding structure; 74 - Second guiding structure. Specific implementation manners

[0035] Next, the technical solutions of the present utility model will be clearly and completely described in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present utility model, rather than all of them. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0036] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present utility model. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0037] In addition, the technical features involved in different embodiments of the present utility model described below can be combined with each other as long as they do not conflict with each other.

[0038] Embodiment 1

[0039] As Figure 1-3As shown, the present utility model provides a carrier for carrying an electronic device 1 to be tested on a tester. In this embodiment, the electronic device 1 is a flexible patch of a dynamic electrocardiogram recorder. This flexible patch includes three electrodes 11 and an electrode circuit 13. Specifically, the above-mentioned carrier includes a support table 2, which includes a first part 21 and a second part 22. The first part 21 and the second part 22 are arranged at intervals, and the distance between them is set according to the test requirements of the electronic device 1 to be tested. Among them, a first conductor 211 is wrapped on the first part 21, and the top of the first conductor 211 is exposed on the surface of the first part 21; at least three second conductors 221 are wrapped on the second part 22, and the three second conductors are arranged in a row. The top of the second conductor 221 is exposed on the surface of the second part. One end of the first conductor 211 far from the exposed part is electrically connected to one end of the second conductor 221 far from the exposed part through a metal wire, and the other two second conductors are electrically connected through a metal wire. The first conductor, the three second conductors, the electronic device, and the tester are sequentially connected in series to form a single test loop. Through the loop formed by the conductors in series on the carrier in this application, it can be realized that when testing the electronic device, the conduction performance such as the resistance of the three electrode circuits can be measured through one test, greatly improving the test efficiency of the electronic device.

[0040] In some embodiments, in the above-mentioned carrier, there is also a base 3, and the first part 21 and the second part 22 are respectively arranged on the base 3. Through countersunk screws at the bottom of the base, they are respectively fixed to the bottoms of the first part and the second part.

[0041] In some embodiments, in the above-mentioned carrier, the first conductor 211 and the second conductor 221 are copper columns, and the copper columns are stepped copper columns with a larger top and a smaller bottom. The stepped copper column-shaped conductor has good electrical conductivity.

[0042] In some embodiments, in the above-mentioned carrier, the side wall of the second part 22 has a horizontally arranged chute 222. Through the cooperation connection between the chute and the buckle 12 of the flexible patch, the positioning of the flexible patch is realized, and it can avoid the poor contact caused by the movement of the flexible patch during the test, thus avoiding affecting the test effect. And when the flexible patch is positioned, the electrical connection points 14 of the flexible patch can be respectively connected to the three second conductors 221, so as to form a single loop as described above between the first conductor 211, the three second conductors 221, and the tester respectively.

[0043] In some embodiments, in the above-mentioned vehicle, the position where the first conductor 211 and the second conductor 221 are electrically connected, and / or the position where the second conductors 221 are electrically connected to each other is located at the lower end of the stepped copper pillar. The position of the electrical connection is set at one end of the first conductor and the second conductor close to the base, and the other ends of the first conductor and the second conductor are respectively exposed on the surfaces of the first part and the second part.

[0044] Embodiment 2

[0045] As Figure 4-8 shown, the present utility model further provides a conduction tester, including: a test bench 4 and a test board 5. Among them, the test bench 4 has a first positioning block 41 and a second positioning block 42; between the two positioning blocks is suitable for positioning the vehicle as described in Embodiment 1, and the base 3 of the vehicle is arranged between the two positioning blocks; the test board 5 is movably arranged above the test bench 4, and a plurality of probes 51 are provided on the test board 5. In this embodiment, there are four probes 51, and the probes 51 penetrate through the test board 5. The probes 51 have two ends, and the probes 51 are respectively suitable for abutting against the first conductor 211 and the electrodes of the flexible patch.

[0046] When it is necessary to test the flexible patch, first, the buckle 12 of the flexible patch is horizontally inserted into the chute 222 to complete the positioning of the flexible patch on the vehicle; then the vehicle with the flexible patch is pushed between the first positioning block 41 and the second positioning block 42 to complete the positioning of the vehicle, and the specific positioning is as Figure 4 shown; at this time, the test board 5 with the probes 51 is pressed down, and the probes respectively abut against the first conductor 211 on the first part 21 of the vehicle and abut against the electrodes of the flexible patch above the second positioning block 42, so as to connect the three-way electrode circuit in series into a single loop through the above-mentioned connection structure inside the vehicle. The positioning method of the vehicle provided in this embodiment does not affect the horizontal insertion positioning of the flexible patch while positioning the vehicle.

[0047] In some embodiments, the above-mentioned conduction tester further includes: a vertical plate 6 and a pressing mechanism 7. The vertical plate 6 is vertically and fixedly connected to the test bench 4; the pressing mechanism 7 is movably arranged on the vertical plate 6, and the pressing mechanism 7 drives the test board 5 to move up and down, so as to move towards the electronic device to be tested on the vehicle. The vehicle is arranged between the pressing mechanism and the test bench.

[0048] In some embodiments, in the above-mentioned continuity tester, the pressing mechanism 7 includes: a driving wrench 71, a driving rod 72, a first guiding structure 73 and a second guiding structure 74. Among them, the driving wrench 71 has a first hinge portion 711 and a second hinge portion 712 that are hinged to each other. Among them, the first hinge portion 711 is hinged to a fixing plate on the vertical plate 7; the upper part of the driving rod 72 is hinged to the second hinge portion 712, and the lower part of the driving rod 72 is connected to the test plate 5. The second hinge portion of the driving wrench is arranged in two symmetrical parts. One end of the symmetrically arranged second hinge portion is hinged to one end of the first part, and the other end of the symmetrically arranged second hinge portion is hinged to one end of the first guiding structure.

[0049] In some embodiments, in the above-mentioned continuity tester, the first guiding structure 73 is a guiding sleeve, and the guiding sleeve can be set as a part of the fixing plate or can be set separately; the driving rod 72 is movably inserted through the guiding sleeve and then fixedly connected to the test plate 5. The second guiding structure 74 is two guiding rods, and the two guiding rods 74 are respectively movably inserted through the test plate 5 on both sides; the two guiding rods 74 are arranged in parallel, and one end of the two guiding rods 74 is fixedly connected to a protruding fixing platform on the vertical plate 7, and the other end of the two guiding rods 74 is fixedly connected to the test bench 4 through countersunk head screws. Through the above-mentioned pressing mechanism, during the test, pressure is applied to the driving wrench, and the driving wrench moves downward along the first guiding structure, and the downward movement is transmitted to the test plate. Further, the test plate continues to move downward under the guiding action of the second guiding structure sleeved on it, so as to achieve the purpose that the probe on the test plate abuts against the first conductor and the electrode of the electronic device to be tested. The above-mentioned pressing mechanism has a simple structure, and only a small amount of external force needs to be applied to form a single loop between the electrodes of the electronic device to be tested.

[0050] In some embodiments, in the above-mentioned continuity tester, the lower end of the driving rod 72 and the test plate 5 are connected through a transition plate. The middle part of the transition plate is fixedly connected to the driving rod, and annular grooves are respectively arranged at both ends of the transition plate. The purpose of fixing the transition plate and the test plate is achieved by adjusting the front and rear positions of the screws in the annular grooves.

[0051] In some embodiments, the above-mentioned conduction tester further includes a multimeter, which is suitable for being placed on the above-mentioned test bench 4; four probes are provided on the above-mentioned test board 5, and the positions of the four probes are correspondingly set according to the positions of the electrodes on the first conductor and the electronic device to be tested; one ends of two of the probes are respectively connected to the measurement circuit of the above-mentioned multimeter, and one ends of the other two probes are connected to each other. In the pressed state of the above-mentioned test board, the other ends of the four above-mentioned probes are respectively connected to the above-mentioned first conductor and three electrodes of the above-mentioned electronic device, and the electrical connection points of the above-mentioned electronic device are respectively connected to the above-mentioned second conductor, thereby forming a single loop.

[0052] Obviously, the above embodiments are merely examples given for clear illustration and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or variations can be made based on the above description. It is not necessary and impossible to list all the implementation manners here. And the obvious changes or variations derived therefrom are still within the protection scope of the creation of the present utility model.

Claims

1. A carrier for carrying an electronic device to be tested on a tester, characterized in that: include: a support platform, the support platform comprising a first portion and a second portion; The first portion includes a first conductor, and a top portion of the first conductor is exposed on a surface of the first portion; The second portion includes at least three second conductors, and the tops of the second conductors are exposed on the surface of the second portion; The first conductor is electrically connected to one of the second conductors, and the other two second conductors are electrically connected to each other; the first conductor and the three second conductors form a single loop with the aid of the electronic device to be tested and the tester.

2. The carrier according to claim 1, characterized in that It also includes a base, and the first part and the second part are respectively arranged on the base.

3. The carrier according to claim 2, characterized in that: The first conductor and the second conductor are copper pillars, and the copper pillars are stepped copper pillars that are larger at the top and smaller at the bottom.

4. The carrier according to claim 2, characterized in that The side wall of the second portion has a sliding groove arranged transversely.

5. The carrier according to claim 3, characterized in that: The electrical connection position between the first conductor and the second conductor, and / or the electrical connection position between the second conductors, is located at the lower end of the stepped copper column.

6. A continuity tester, characterized in that: include: A test bench, the test bench having a first positioning block and a second positioning block; the two positioning blocks are suitable for positioning the carrier according to any one of claims 1 to 5; A test board is movably arranged above the test table. A plurality of probes are provided on the test board. The probes are respectively suitable for contacting the first conductor and the electrodes of the electronic device.

7. The continuity tester according to claim 6, characterized in that: Also includes: A vertical plate, the vertical plate is vertically arranged on the test table; and a pressing mechanism, the pressing mechanism is movably arranged on the vertical plate, and the pressing mechanism drives the test plate to move up and down.

8. The continuity tester according to claim 7, characterized in that: The pressing mechanism comprises: a driving wrench, the driving wrench comprising a first portion and a second portion hinged to each other, wherein the first portion is hinged to the vertical plate; A driving rod, wherein the upper portion of the driving rod is hinged to the second portion, and the lower portion of the driving rod is connected to the test plate.

9. The continuity tester according to claim 8, characterized in that: The pressing mechanism further comprises: a first guide structure, wherein the first guide structure is a guide sleeve, and the driving rod is movably provided in the guide sleeve; The second guide structure is two guide rods, and the two guide rods are movably provided on both sides of the test plate.

10. The continuity tester according to claim 9, characterized in that: Also included is a multimeter, the multimeter being suitable for being placed on the test bench; The test board has four probes, one end of two of which is connected to the measurement circuit of the multimeter respectively, and one end of the other two probes is connected to each other; When the test board is pressed down, the other ends of the four probes are respectively connected to the first conductor and the three electrodes of the electronic device, and the electrical connection points of the electronic device are respectively connected to the second conductor, thereby forming a single loop.