Diode testing device

Abstract

The utility model discloses a diode testing device, which relates to the technical field of diode testing and comprises a bottom plate, a pair of first fixing frames and a pair of second fixing frames are fixedly mounted at the upper end of the bottom plate, rotating blocks are rotatably mounted in the two first fixing frames, a lower clamping plate is fixedly connected between the two rotating blocks, and the lower clamping plate is fixedly connected with the lower clamping plate. The upper end of the lower clamping plate is provided with an upper clamping plate, a plurality of groups of test workpieces are arranged between the lower clamping plate and the upper clamping plate, the left end of the first fixing frame on the left side is fixedly connected with a protection frame, the protection frame is internally provided with a rotating motor, and the second fixing frame is internally provided with a test mechanism. According to the device, the multimeter can be used for detecting a plurality of diodes in sequence through the testing mechanism, electrodes on the outer sides of the diodes cannot be damaged while automatic detection can be achieved, the problem of touch bending cannot occur, the protection effect is good, and the detection efficiency is high.

Description

Technical Field

[0001] The utility model relates to the technical field of diode testing, in particular to a diode testing device. Background Art

[0002] Diodes are commonly used components in circuits, especially control circuits. Diodes are mainly composed of electrode parts at both ends and a PN junction part in the middle. The measurement of diodes mainly verifies whether they have the unidirectional conduction characteristic.

[0003] Currently, when testing a diode, a multimeter needs to be connected to the two ends of the diode respectively, and the positions of the two test leads need to be swapped. By applying positive and reverse voltages, it is verified whether it is unidirectionally conductive. However, the electrodes on both sides of the diode can be easily damaged during measurement, affecting the subsequent use of the diode. Based on this, this solution provides a diode testing device to solve the above-mentioned problems. Utility Model Content

[0004] In order to solve the above technical problems, a diode testing device is provided. This technical solution solves the problems raised in the above background technology.

[0005] In order to achieve the above purpose, the technical solution adopted by the utility model is:

[0006] A diode testing device comprises a base plate, wherein a pair of first fixing frames and a pair of second fixing frames are fixedly mounted on the upper end of the base plate, a rotating block is rotatably mounted inside the two first fixing frames, a lower clamping plate is fixedly connected between the two rotating blocks, an upper clamping plate is provided at the upper end of the lower clamping plate, a plurality of groups of test workpieces are provided between the lower clamping plate and the upper clamping plate, a protective frame is fixedly connected to the left end of the left first fixing frame, a rotating motor is provided inside the protective frame, a testing mechanism is installed inside the second fixing frame, and a multimeter is provided at the lower end of the testing mechanism; wherein, the testing mechanism comprises A drive motor and a threaded rod, the drive motor is fixedly mounted on the right end of the second fixing frame on the right side, the threaded rod is rotatably mounted between the two second fixing frames, the output end of the drive motor passes through the second fixing frame on the right side and is fixedly connected to the right end of the threaded rod, a movable plate is threadedly connected to the surface of the threaded rod, a pair of fixed plates and a pair of electric telescopic rods are symmetrically mounted on the front end of the movable plate, the two electric telescopic rods are arranged between the two fixed plates, a conductive rod is movably mounted inside the front end of the fixed plate, the front end of the conductive rod is fixedly connected to a contact end, and the rear end of the conductive rod is fixedly connected to the output end of the electric telescopic rod.

[0007] Preferably, sliding rods are provided on both upper and lower sides of the threaded rod, and the two ends of the two sliding rods are fixedly connected to the inner walls of the two second fixing frames respectively, and the upper and lower ends of the movable plate are slidably connected to the two sliding rods respectively.

[0008] Preferably, the multimeter is provided with two external terminals, and the two external terminals are electrically connected to the two conductive rods respectively through wires.

[0009] Preferably, the upper end of the lower clamping plate is provided with several groups of first clamping grooves and a pair of first mounting grooves, the first mounting grooves are provided with magnets, the four corners of the top end of the lower clamping plate are fixedly connected to the limiting columns, the lower end of the upper clamping plate is provided with several groups of second clamping grooves and a pair of second mounting grooves, the first clamping grooves and the second clamping grooves cooperate with each other to clamp the test workpiece, the second mounting grooves are provided with magnetic suction parts, and the four corners of the lower end of the upper clamping plate are provided with limiting holes.

[0010] Preferably, the rotating motor is fixedly installed at the bottom of the protective frame, the output end of the rotating motor is fixedly connected to the first gear, the upper end of the first gear is meshed with the lower end of the second gear, and the right end of the second gear is connected to the rotating block through a transmission roller.

[0011] Compared with the prior art, the present invention provides a diode testing device with the following beneficial effects:

[0012] 1. The utility model is provided with an upper clamping plate and a lower clamping plate, and multiple test workpiece diodes are clamped between the two clamping plates, and the electrodes on both sides of the diodes extend out through the clamping grooves, and the extended electrodes contact the two external terminals of the multimeter through the testing mechanism, so that the multimeter can detect the diodes, and the testing mechanism drives the threaded rod to rotate by the driving motor, and the rotation of the threaded rod drives the movable plate to move, and the movement of the movable plate drives the fixed plate to move, and then drives the conductive rod and the contact terminal to move. When it moves to the position of the diode, the conductive rod is driven to move by the electric telescopic rod so that the contact terminal contacts the electrode of the diode. After the detection is completed, the electric telescopic rod is reset and the driving motor is started, so that the conductive rod and the contact terminal move to the next diode, so that the multimeter can sequentially contact the electrodes on the outside of the multiple diodes. Automatic detection can be achieved without damaging the electrodes on the outside of the diode, and the electrodes will not be touched and bent. In addition, the detection method is sequential detection, which is efficient and has a good protection effect on the diode electrodes.

[0013] 2. The utility model is provided with a rotating motor, which is driven by the first gear and the second gear, thereby driving the rotating block to rotate, and the rotating block then drives the lower clamping plate to rotate, so that the diode can be flipped 180 degrees, so that there is no need to replace the two test leads during the test process, and positive voltage and reverse voltage can be applied to verify whether the diode is unidirectionally conductive, making the entire test process simpler and more efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model;

[0015] Figure 2 This is a schematic structural diagram of the lower clamping plate of the utility model;

[0016] Figure 3 This is an exploded view of the upper and lower splints of the present invention;

[0017] Figure 4 This is a schematic structural diagram of the upper splint in the utility model;

[0018] Figure 5 It is a structural diagram of the testing mechanism in the utility model.

[0019] The numbers in the figure are:

[0020] 1. Base plate; 2. First fixed frame; 201. Rotating block; 3. Lower clamping plate; 301. First clamping slot; 302. First mounting slot; 303. Limiting column; 304. Magnet; 4. Upper clamping plate; 401. Second clamping slot; 402. Second mounting slot; 403. Limiting hole; 404. Magnetic element; 5. Test workpiece; 6. Protective frame; 7. Rotating motor; 701. First gear; 702. Second gear; 8. Second fixed frame; 9. Test mechanism; 901. Drive motor; 902. Threaded rod; 903. Sliding rod; 904. Moving plate; 905. Fixed plate; 906. Conductive rod; 907. Electric telescopic rod; 908. Contact terminal; 10. Multimeter. DETAILED DESCRIPTION

[0021] The following description is intended to disclose the present invention so that those skilled in the art can implement the present invention. The preferred embodiments described below are merely examples, and those skilled in the art may conceive of other obvious variations.

[0022] Reference Figure 1As shown, a diode testing device includes a base plate 1, a pair of first fixing frames 2 and a pair of second fixing frames 8 are fixedly installed on the upper end of the base plate 1, a rotating block 201 is rotatably installed inside the two first fixing frames 2, a lower clamping plate 3 is fixedly connected between the two rotating blocks 201, an upper clamping plate 4 is provided on the upper end of the lower clamping plate 3, and several groups of test workpieces 5 are provided between the lower clamping plate 3 and the upper clamping plate 4, a protective frame 6 is fixedly connected to the left end of the left first fixing frame 2, a rotating motor 7 is provided inside the protective frame 6, a testing mechanism 9 is installed inside the second fixing frame 8, and a Wan is provided at the lower end of the testing mechanism 9. Use multimeter 10; multiple test workpieces 5 diodes are clamped between the two clamping plates, and the electrodes on both sides of the diodes extend through the clamping grooves, and the extended electrodes are in contact with the two external terminals of the multimeter 10 through the testing mechanism 9, so that the multimeter 10 can detect the diodes. The testing mechanism 9 can drive the multimeter 10 to contact the electrodes on the outside of the multiple diodes in turn, and can achieve automatic detection without damaging the electrodes on the outside of the diodes. The electrodes will not be touched and then bend, and the detection method is sequential detection, which is efficient and has a good protection effect on the diode electrodes.

[0023] Specifically, in this embodiment, the testing mechanism 9 includes a driving motor 901 and a threaded rod 902. The driving motor 901 is fixedly installed on the right end of the second fixing frame 8 on the right side, and the threaded rod 902 is rotatably installed between the two second fixing frames 8. The output end of the driving motor 901 passes through the second fixing frame 8 on the right side and is fixedly connected to the right end of the threaded rod 902. The surface of the threaded rod 902 is threadedly connected with a movable plate 904. A pair of fixed plates 905 and a pair of electric telescopic rods 907 are symmetrically installed at the front end of the movable plate 904. The two electric telescopic rods 907 are arranged between the two fixed plates 905. A conductive rod 906 is movably installed inside the front end of the fixed plate 905. The front end of the conductive rod 906 is fixedly connected to the contact end 908, and the rear end of the conductive rod 906 is fixedly connected to the output end of the electric telescopic rod 907. The testing mechanism 9 drives the threaded rod 902 to rotate through the driving motor 901, and the rotation of the threaded rod 902 drives the movable plate 904 to move, and the movement of the movable plate 904 drives the fixed plate 905 to move, and then drives the conductive rod 906 and the contact terminal 908 to move. When it moves to the position of the diode, the conductive rod 906 is driven to move by the electric telescopic rod 907, so that the contact terminal 908 contacts the electrode of the diode. After the test is completed, the electric telescopic rod 907 is reset, and the driving motor 901 is started again, so that the conductive rod 906 and the contact terminal 908 move to the next diode, so that the multimeter 10 can sequentially contact the electrodes on the outside of multiple diodes.

[0024] Specifically, in this embodiment, slide bars 903 are provided on both the upper and lower sides of the threaded rod 902. The two ends of the slide bars 903 are fixedly connected to the inner walls of the two second fixed frames 8, and the upper and lower ends of the movable plate 904 are slidably connected to the two slide bars 903. The slide bars 903 are responsible for limiting the position of the movable plate 904, so that the movable plate 904 moves along a predetermined path without deviation, thereby ensuring the accuracy and stability of the entire testing mechanism 9.

[0025] Specifically, in this embodiment, the multimeter 10 is provided with two external terminals, which are electrically connected to two conductive rods 906 via wires. The two external terminals serve as the positive and negative connectors of the multimeter 10. The two external terminals are electrically connected to the two conductive rods 906 via wires, thereby electrically connecting the multimeter 10 to the contact terminal 908. When the contact terminal 908 contacts the electrode of the diode, the diode is tested.

[0026] Specifically, in this embodiment, the upper end of the lower clamping plate 3 is provided with several groups of first clamping grooves 301 and a pair of first mounting grooves 302, and the first mounting grooves 302 are provided with magnets 304. The four corners of the top end of the lower clamping plate 3 are fixedly connected to the limiting columns 303, and the lower end of the upper clamping plate 4 is provided with several groups of second clamping grooves 401 and a pair of second mounting grooves 402. The first clamping grooves 301 and the second clamping grooves 401 cooperate with each other to clamp the test workpiece 5, and the second mounting grooves 402 are provided with magnetic suction parts 404. The four corners of the lower end of the upper clamping plate 4 are all provided with limiting holes 403. The lower clamping plate 3 and the upper clamping plate 4 are connected by sliding cooperation of the limiting column 303 and the limiting hole 403, and are fixed by magnetic attraction cooperation of the magnet 304 and the magnetic attraction part 404, wherein the height of the limiting column 303 is greater than the electrode height of the upper diode, so that when the upper clamping plate 4 is separated from the lower clamping plate 3, the limiting effect of the limiting column 303 prevents the upper clamping plate 4 from colliding with the electrode of the diode, thereby ensuring that the electrode will not bend.

[0027] Specifically, in this embodiment, the rotating motor 7 is fixedly mounted at the bottom of the protective frame 6. The output end of the rotating motor 7 is fixedly connected to the first gear 701. The upper end of the first gear 701 is meshedly connected to the lower end of the second gear 702. The right end of the second gear 702 is transmission-connected to the rotating block 201 via a transmission roller. The rotating motor 7 is driven by the first gear 701 and the second gear 702, thereby driving the rotating block 201 to rotate. The rotating block 201 in turn drives the lower clamping plate 3 to rotate, thereby allowing the diode to flip 180 degrees. This eliminates the need to swap two test leads during the test process to apply positive and reverse voltages to verify whether the diode is unidirectionally conductive, making the entire test process simpler and more efficient.

[0028] The working principle of the present invention is as follows: several groups of test workpieces 5 diodes are placed in the first clamping groove 301, and then the lower clamping plate 3 and the upper clamping plate 4 are slidably connected by the cooperation of the limiting column 303 and the limiting hole 403, and are magnetically fixed by the cooperation of the magnet 304 and the magnetic attraction member 404. At this time, the upper and lower electrodes of the diode extend through the two clamping grooves, and then the test mechanism 9 is started. The test mechanism 9 drives the threaded rod 902 to rotate through the driving motor 901, and the threaded rod 902 rotates to drive the moving plate 904 to move, and the moving plate 904 moves to drive the fixed plate 905 to move, and then drives the conductive rod 906 and the contact end 908 to move. When it moves to the position of the diode, the conductive rod 906 is driven to move by the electric telescopic rod 907, so that the contact end 908 contacts the electrode of the diode. After the detection is completed, the electric telescopic rod 907 is reset, and the drive motor 901 is started again, so that the conductive rod 906 and the contact end 908 move to the next diode, so that the multimeter 10 can sequentially contact the electrodes outside the multiple diodes. The device can achieve automatic detection without damaging the electrodes outside the diode, and the electrodes will not be touched and bent. In addition, the detection method is sequential detection, which is efficient and has a good protection effect on the diode electrodes.

[0029] After the first test is completed, the rotating motor 7 is started, and the rotating motor 7 is driven by the first gear 701 and the second gear 702, so as to drive the rotating block 201 to rotate, and the rotating block 201 then drives the lower clamping plate 3 to rotate, so that the diode can be flipped 180°, so that there is no need to replace the two test leads during the test process, and positive voltage and reverse voltage can be applied to verify whether the diode is unidirectionally conductive, making the entire test process simpler and more efficient.

[0030] At the same time, in this device, the height of the limiting column 303 is greater than the electrode height of the upper diode, so that when the upper clamping plate 4 is separated from the lower clamping plate 3, the limiting effect of the limiting column 303 prevents the upper clamping plate 4 from colliding with the electrode of the diode, thereby ensuring that the electrode will not bend.

[0031] The above shows and describes the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions merely illustrate the principles of the present invention. Various changes and improvements are possible without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed for the present invention is defined by the appended claims and their equivalents.

Claims

1. A diode testing device, characterized in that: The invention comprises a base plate (1), wherein a pair of first fixing frames (2) and a pair of second fixing frames (8) are fixedly installed on the upper end of the base plate (1), a rotating block (201) is rotatably installed inside the two first fixing frames (2), a lower clamping plate (3) is fixedly connected between the two rotating blocks (201), an upper clamping plate (4) is provided at the upper end of the lower clamping plate (3), and a plurality of groups of test workpieces (5) are provided between the lower clamping plate (3) and the upper clamping plate (4), a protective frame (6) is fixedly connected to the left end of the left first fixing frame (2), a rotating motor (7) is provided inside the protective frame (6), a testing mechanism (9) is installed inside the second fixing frame (8), and a multimeter (10) is provided at the lower end of the testing mechanism (9); The testing mechanism (9) comprises a driving motor (901) and a threaded rod (902), wherein the driving motor (901) is fixedly mounted on the right end of the second fixing frame (8) on the right side, and the threaded rod (902) is rotatably mounted between the two second fixing frames (8). The output end of the driving motor (901) passes through the second fixing frame (8) on the right side and is fixedly connected to the right end of the threaded rod (902). A movable plate (904) is threadedly connected to the surface of the threaded rod (902). A pair of fixed plates (905) and a pair of electric telescopic rods (907) are symmetrically mounted at the front end of the movable plate (904). The two electric telescopic rods (907) are arranged between the two fixed plates (905). A conductive rod (906) is movably mounted inside the front end of the fixed plate (905). The front end of the conductive rod (906) is fixedly connected to a contact terminal (908), and the rear end of the conductive rod (906) is fixedly connected to the output end of the electric telescopic rod (907).

2. A diode testing device according to claim 1, characterized in that: Sliding rods (903) are provided on both upper and lower sides of the threaded rod (902), and the two ends of the two sliding rods (903) are fixedly connected to the inner walls of the two second fixed frames (8) respectively, and the upper and lower ends of the movable plate (904) are slidably connected to the two sliding rods (903) respectively.

3. The diode testing device according to claim 1, wherein: The multimeter (10) is provided with two external terminals, and the two external terminals are electrically connected to the two conductive rods (906) respectively through wires.

4. The diode testing device according to claim 1, wherein: The upper end of the lower clamping plate (3) is provided with a plurality of groups of first clamping grooves (301) and a pair of first mounting grooves (302), the interior of the first mounting grooves (302) is provided with a magnet (304), and the four corners of the top end of the lower clamping plate (3) are fixedly connected to the limiting columns (303), and the lower end of the upper clamping plate (4) is provided with a plurality of groups of second clamping grooves (401) and a pair of second mounting grooves (402), the first clamping grooves (301) and the second clamping grooves (401) cooperate with each other to clamp the test workpiece (5), and the interior of the second mounting grooves (402) is provided with a magnetic attraction member (404), and the four corners of the lower end of the upper clamping plate (4) are provided with limiting holes (403).

5. The diode testing device according to claim 1, wherein: The rotating motor (7) is fixedly mounted on the bottom of the protective frame (6); the output end of the rotating motor (7) is fixedly connected to a first gear (701); the upper end of the first gear (701) is meshedly connected to the lower end of the second gear (702); and the right end of the second gear (702) is transmission-connected to the rotating block (201) via a transmission roller.

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