Probe support for testing electrical characteristic parameters

Abstract

The utility model discloses a probe support for electrical characteristic parameter testing, which comprises a supporting rod and a rotating motor, one end of the supporting rod is provided with a rotating shaft and is connected with an output shaft of the rotating motor through a coupler, and the outer wall of the supporting rod is fixedly connected with a first supporting block. A first electric push rod is movably connected to the interior of the first supporting block, a first sliding block is fixedly connected to the movable end of the first electric push rod, a first movable rod is connected to the other end of the supporting rod through a shaft, and a first sliding rail is fixedly connected to one side of the first movable rod; the other side of the first movable rod is fixedly connected with a second supporting block, and the device facilitates the rapid positioning and installation of the probe body, thereby improving the installation convenience, facilitating the driving of the probe body to carry out the testing work at different positions, improving the testing work convenience, and solving the tedious operation caused by manual testing.

Description

Technical Field

[0001] The utility model belongs to the technical direction of integrated circuits, and particularly relates to a probe bracket for testing electrical characteristic parameters. Background Art

[0002] An integrated circuit is a miniature electronic device or component. Using a specific process, the transistors, resistors, capacitors, inductors, and other components required for a circuit are interconnected with wiring. This is then fabricated on one or several small semiconductor wafers or dielectric substrates, then packaged in a housing to create a miniature structure that performs the required circuit functions. During production, integrated circuits require testing of their electrical characteristics.

[0003] Conventional integrated circuit electrical characteristic parameter testing mainly relies on manual testing with probes, which results in cumbersome testing operations. This phenomenon has become a problem that needs to be solved urgently by those skilled in the art. Therefore, a probe holder for electrical characteristic parameter testing is urgently needed to solve the above-mentioned problem. Utility Model Content

[0004] The purpose of the present invention is to provide a probe holder for electrical characteristic parameter testing in accordance with the existing device, so as to solve the problems raised in the above background technology.

[0005] In order to solve the above technical problems, the utility model provides the following technical solutions: A probe bracket for electrical characteristic parameter testing comprises a support rod and a rotating motor, one end of the support rod is provided with a rotating shaft and is connected to the output shaft of the rotating motor through a coupling, the outer wall of the support rod is fixedly connected to a first support block, the first support block is movably connected to a first electric push rod inside, the movable end of the first electric push rod is fixedly connected to a first slider, the other end of the support rod is connected to a first movable rod through a shaft, one side of the first movable rod is fixedly connected to a first slide rail, the other side of the first movable rod is fixedly connected to a second support block, the second support block is movably connected to a second electric push rod inside, the movable end of the second electric push rod is fixedly connected to a second slider, one end of the first movable rod is connected to the second movable rod through a shaft, one side of the second movable rod is fixedly connected to the second slide rail, the other side of the second movable rod is fixedly connected to a positioning block, the outer wall of the positioning block is fixedly connected to a protrusion, a fastening assembly is provided inside the protrusion, and the inner wall of the positioning block is movably connected to a probe body.

[0006] Furthermore, the supporting end of the first electric push rod is rotatably connected to the first supporting block via a shaft, and the movable end of the first supporting block is rotatably connected to the first sliding block via a shaft.

[0007] Furthermore, the top of the first slider is in a "concave" shape, and the bottom of the first slider is in a "T" shape. The first slider is slidably connected to the first slide rail, and the first slide rail is in a "concave" shape.

[0008] Furthermore, the supporting end of the second electric push rod is rotatably connected to the second supporting block via a shaft, and the movable end of the second electric push rod is rotatably connected to the second sliding block via a shaft.

[0009] Furthermore, the top of the second slider is in a concave shape, and the bottom of the second slider is in a T-shaped structure. The second slider is slidably connected to the second slide rail, and the second slide rail is in a concave shape.

[0010] Furthermore, two protrusions are provided, and the two protrusions are connected by a fastening assembly.

[0011] Compared with the prior art, the beneficial effects achieved by the present invention are:

[0012] (1) By providing a support rod, a rotating motor, a first support block, a first electric push rod, a first slider, a first movable rod, a first slide rail, a second support block, a second electric push rod, a second slider, a second movable rod, a second slide rail, a positioning block, a protrusion, a fastening assembly and a probe body, it is convenient to quickly position and install the probe body, thereby improving the convenience of installation, and further facilitating the probe body to perform testing work at different positions, improving the convenience of testing work, solving the cumbersome operation caused by manual testing, meeting people's work needs, and worthy of promotion and use. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0014] Figure 1 This is a schematic diagram of the overall right side structure of the utility model;

[0015] Figure 2 This is a partial left-side structural schematic diagram of the present invention;

[0016] Figure 3 This utility model Figure 2 Enlarged schematic diagram of point A in the middle.

[0017] In the figure: 1. Support rod; 2. Rotating motor; 3. First support block; 4. First electric push rod; 5. First slider; 6. First movable rod; 7. First slide rail; 8. Second support block; 9. Second electric push rod; 10. Second slider; 11. Second movable rod; 12. Second slide rail; 13. Positioning block; 14. Bump; 15. Fastening assembly; 16. Probe body. DETAILED DESCRIPTION

[0018] The following is a non-limiting detailed description of the technical solution of the present invention in conjunction with preferred embodiments and their accompanying drawings. Obviously, the described embodiments are only a portion of the embodiments of the present invention, and not all of them. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without inventive effort are also within the scope of protection of the present invention.

[0019] See also Figure 1-3 The utility model provides a technical solution: a probe bracket for electrical characteristic parameter testing, comprising a support rod 1 and a rotating motor 2, one end of the support rod 1 is provided with a rotating shaft and is connected to the output shaft of the rotating motor 2 through a coupling, the outer wall of the support rod 1 is fixedly connected to a first support block 3, the interior of the first support block 3 is movably connected to a first electric push rod 4, the movable end of the first electric push rod 4 is fixedly connected to a first slider 5, the other end of the support rod 1 is connected to a first movable rod 6 through a shaft, one side of the first movable rod 6 is fixedly connected to a first slide rail 7, the other side of the first movable rod 6 is fixedly connected to a second support block 8, the interior of the second support block 8 is movably connected to a second electric push rod 9, the second electric push rod 9 is fixedly connected to the second slide rail 7, and the second electric push rod 9 is fixedly connected to the second slide rail 7. The movable end of the movable push rod 9 is fixedly connected to the second sliding block 10, one end of the first movable rod 6 is connected to the second movable rod 11 through an axis, one side of the second movable rod 11 is fixedly connected to the second slide rail 12, and the other side of the second movable rod 11 is fixedly connected to the positioning block 13, the outer wall of the positioning block 13 is fixedly connected to the protrusion 14, the interior of the protrusion 14 is provided with a fastening assembly 15, and the inner wall of the positioning block 13 is movably connected to the probe body 16, which facilitates the rapid positioning and installation of the probe body 16, thereby improving the convenience of installation, and is conducive to driving the probe body 16 to perform testing work at different positions, improving the convenience of testing work, and solving the cumbersome operation caused by manual testing.

[0020] Furthermore, the supporting end of the first electric push rod 4 is rotatably connected to the first support block 3 through an axis, and the movable end of the first support block 3 is rotatably connected to the first slider 5 through an axis, the top of the first slider 5 is a "concave" shaped structure, and the bottom of the first slider 5 is a "T" shaped structure, and the first slider 5 is slidably connected to the first slide rail 7, and the first slide rail 7 is a "concave" shaped structure, which facilitates driving the first movable rod 6 to adjust the angle.

[0021] Furthermore, the supporting end of the second electric push rod 9 is rotatably connected to the second support block 8 through an axis, and the movable end of the second electric push rod 9 is rotatably connected to the second slider 10 through an axis, the top of the second slider 10 is a "concave" shaped structure, and the bottom of the second slider 10 is a "T" shaped structure, and the second slider 10 is slidably connected to the second slide rail 12, and the second slide rail 12 is a "concave" shaped structure, which facilitates driving the second movable rod 11 to adjust the angle.

[0022] Furthermore, two protrusions 14 are provided, and the two protrusions 14 are connected by a fastening assembly 15 , which facilitates the fastening of the probe body 16 .

[0023] During use, first fix the rotating motor 2 to the appropriate position through the mounting plate, then insert the probe body 16 into the interior of the positioning block 13, and fasten the protrusion 14 through the fastening assembly 15, and then complete the installation of the probe body 16. Then, the support rod 1 is driven to rotate by the rotating motor 2, and testing work at different angles can be performed. When the first electric push rod 4 is extended or retracted, it will drive the first slider 5 to slide, so that the first slider 5 squeezes the second support block 8 to rotate through the first slide rail 7. When the second electric push rod 9 is extended or retracted, it will drive the second slider 10 to slide, so that the second slider 10 squeezes the second movable rod 11 to rotate through the second slide rail 12, which is conducive to adjusting the position of the probe body 16, thereby facilitating testing work at different positions, and thus solving the cumbersome operation caused by the staff manually holding the probe for testing.

[0024] In the description of the present invention, it should be understood that the terms "up", "down", "front", "back", "left", "right", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, they should not be understood as limitations on the present invention.

[0025] Finally, it should be pointed out that the above embodiments are intended only to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art will appreciate that modifications may be made to the technical solutions described in the above embodiments, or that some of the technical features may be replaced with equivalents. Such modifications or replacements do not deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A probe holder for electrical characteristic parameter testing, comprising a support rod (1) and a rotating motor (2), characterized in that: One end of the support rod (1) is provided with a rotating shaft and is connected to the output shaft of the rotating motor (2) through a coupling; the outer wall of the support rod (1) is fixedly connected to a first support block (3); the interior of the first support block (3) is movably connected to a first electric push rod (4); the movable end of the first electric push rod (4) is fixedly connected to a first slider (5); the other end of the support rod (1) is connected to a first movable rod (6) through a shaft; one side of the first movable rod (6) is fixedly connected to a first slide rail (7); the other side of the first movable rod (6) is fixedly connected to a second support block (8); the second support block The interior of (8) is movably connected to a second electric push rod (9), the movable end of the second electric push rod (9) is fixedly connected to a second slider (10), one end of the first movable rod (6) is connected to a second movable rod (11) through an axis, one side of the second movable rod (11) is fixedly connected to a second slide rail (12), the other side of the second movable rod (11) is fixedly connected to a positioning block (13), the outer wall of the positioning block (13) is fixedly connected to a protrusion (14), the interior of the protrusion (14) is provided with a fastening component (15), and the inner wall of the positioning block (13) is movably connected to a probe body (16).

2. The probe holder for electrical characteristic parameter testing according to claim 1, characterized in that: The supporting end of the first electric push rod (4) is rotatably connected to the first supporting block (3) via a shaft, and the movable end of the first supporting block (3) is rotatably connected to the first sliding block (5) via a shaft.

3. The probe holder for electrical characteristic parameter testing according to claim 1, characterized in that: The top of the first slider (5) is in a "concave" shape, and the bottom of the first slider (5) is in a "T" shape. The first slider (5) is slidably connected to the first slide rail (7), and the first slide rail (7) is in a "concave" shape.

4. The probe holder for electrical characteristic parameter testing according to claim 1, characterized in that: The supporting end of the second electric push rod (9) is rotatably connected to the second supporting block (8) via a shaft, and the movable end of the second electric push rod (9) is rotatably connected to the second sliding block (10) via a shaft.

5. The probe holder for electrical characteristic parameter testing according to claim 1, characterized in that: The top of the second slider (10) is in a "concave" shape, and the bottom of the second slider (10) is in a "T" shape. The second slider (10) is slidably connected to the second slide rail (12), and the second slide rail (12) is in a "concave" shape.

6. The probe holder for electrical characteristic parameter testing according to claim 1, characterized in that: Two protrusions (14) are provided, and the two protrusions (14) are connected via a fastening assembly (15).

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