Millimeter wave radar chip detection clamp

Abstract

The utility model relates to the field of radar testing, and discloses a millimeter wave radar chip detection clamp, which is characterized by comprising a clamp socket, a detection probe and a probe fixing piece, a chip test hole is formed in the center of the clamp socket in a penetrating manner, and a raised top inner edge plate is arranged on the top surface of the clamp socket; the top surface of the top inner edge plate is provided with an installation positioning groove, the outer side of the probe body part of the detection probe is provided with a protruding positioning block, the bottom of the protruding positioning block is clamped in the installation positioning groove, and the wiring end of the detection probe is electrically connected with the circuit board of the clamp socket. The needle tip end of the detection probe is arranged on the inner side of the top inner edge plate and is horizontally suspended in the chip test hole; the probe fixing part comprises a top cover plate, an inner edge vertical plate and an outer edge vertical plate, the top cover plate is horizontally pressed at the top of the convex positioning hole, the top end of the inner edge vertical plate is fixedly and vertically connected with the inner edge bottom end of the top cover plate, and the top end of the outer edge vertical plate is fixedly and vertically connected with the outer edge bottom end of the top cover plate.

Description

Technical Field

[0001] The utility model relates to the field of radar testing, and more specifically, to a millimeter wave radar chip detection fixture. Background Art

[0002] The traditional radar chip testing method is to use test sockets and probes installed on metal wires or contact pads on the circuit board inside the test equipment to electrically connect them to the external connectors of the chip under test. Their signal connection method is generally vertical contact. This arrangement has certain problems in actual use. Since the test frequency of millimeter-wave radar chips generally exceeds 40GHz, the vertical signal transmission method cannot meet the testing requirements of radar chips. In addition, the traditional hard contact method results in a short lifespan of the contact points and is extremely easy to damage, which is not conducive to the actual non-destructive testing of millimeter-wave chips. Therefore, it is necessary to redesign the chip placement fixture during testing to address the defects of existing test equipment, so as to reduce damage to the chip under test. Utility Model Content

[0003] The purpose of this utility model is to provide a millimeter-wave radar chip detection fixture, which adopts a horizontally placed detection probe to enable high-frequency signals to be transmitted without loss, thereby efficiently and accurately completing the test of the radar chip. In addition, the contact force between the chip and the detection probe is achieved only by the weight of the chip, which can reduce damage to the contacts on the chip.

[0004] The above technical objectives of the present utility model are achieved through the following technical solutions: A millimeter wave radar chip detection fixture, including a fixture socket, a detection probe, and a probe fixing piece;

[0005] A chip test hole is provided through the center of the fixture socket, and a raised top inner edge plate is provided on the top surface of the fixture socket at a position corresponding to the edge of the chip test hole;

[0006] The top surface of the top inner edge plate is provided with an installation positioning groove, the outer side of the needle body of the detection probe is provided with a protruding positioning block matching the installation positioning groove, the bottom of the protruding positioning block is clamped in the installation positioning groove, the connection terminal of the detection probe is located on the outer side of the top inner edge plate and is electrically connected to the circuit board of the fixture socket, and the needle tip of the detection probe is provided on the inner side of the top inner edge plate and is horizontally suspended in the chip test hole;

[0007] The probe fixing part includes a top cover plate, four inner vertical plates and four outer vertical plates. The top cover plate is horizontally pressed on the top of the raised positioning hole, the bottom of the inner vertical plate is stuck on the top of the inner edge of the top inner plate, the top of the inner vertical plate is fixedly connected vertically to the inner bottom end of the top cover plate, the bottom end of the outer vertical plate is connected to the outer edge top surface of the fixture socket, and the top of the outer vertical plate is fixedly connected vertically to the outer bottom end of the top cover plate.

[0008] As a preferred technical solution of the present invention, the probe fixing member is further provided with a chip bracket, and the chip bracket includes a horizontal positioning bracket and a vertical positioning bracket respectively mounted on two parallel inner vertical plates, and the horizontal positioning bracket includes a first vertical plate, a first horizontal plate and two first side plates, one side of the first vertical plate is fixedly connected to the outer side of one of the inner vertical plates, the bottom end of the first vertical plate is fixedly connected to one side of the first horizontal plate, and the bottoms of the two first side plates are respectively fixedly connected to the two ends of the first horizontal plate;

[0009] and a second adjusting device for adjusting the position of the second support bracket, wherein the adjusting device is configured to adjust the position of the second support bracket and the second support bracket, wherein the adjusting device is configured to adjust the position of the second support bracket and the second support bracket.

[0010] As a preferred technical solution of the present invention, the top surfaces of the first transverse plate and the second transverse plate are both provided with elastic buffer support pads, and the top surface height of the elastic buffer support pads corresponds to the needle tip height of the detection probe.

[0011] As a preferred technical solution of the present invention, the outer top end of the first vertical plate and the opposite side top ends of the two first side plates are surfaces inclined outward and downward.

[0012] As a preferred technical solution of the present invention, the inner vertical plate is provided with an installation notch matching the shape of the raised positioning block at a position corresponding to the raised positioning block.

[0013] As an optimal technical solution of the present invention, the installation positioning groove is a rectangular groove, the raised positioning block is a positioning block with a square outer edge, the sizes of the positioning block and the rectangular groove match, and when the positioning block is stuck in the rectangular groove, the detection probe can only move upward.

[0014] As a preferred technical solution of the present invention, an expansion limiting pad is provided on the inner wall of the rectangular groove.

[0015] As an optimal technical solution of the present invention, a mounting ear is vertically connected to the outer bottom end of the outer vertical plate, and a cover plate mounting nail is provided through the mounting ear. The cover plate mounting nail passes through the mounting ear and is fixedly connected to the top surface of the fixture socket.

[0016] As an optimal technical solution of the present invention, a plurality of socket mounting holes are provided through the corners of the fixture socket, and socket mounting nails are arranged in the socket mounting holes. The socket mounting nails are used to pass through the socket mounting holes and be fixedly connected to the detection table surface.

[0017] In summary, the present invention has the following beneficial effects: in actual use, the protruding positioning block of the detection probe is first installed in the installation positioning groove of the top inner edge plate, and then the probe fixing part is installed, and the protruding positioning block is stably pressed by the top cover plate so that the position of the detection probe can be fixed. At the same time, since the protruding positioning block and the detection probe are fixedly installed, the position of the detection probe can be ensured to be correct after the installation is completed, and it can be aligned with the contacts on the millimeter-wave radar chip to be detected. At this time, the millimeter-wave radar chip to be tested can be placed in the chip test hole. At this time, the detection probe can receive the column of the chip to be tested and complete the contact connection, that is, the electrical circuit of the chip to be tested can be powered on and installed, and the actual power-on detection work can be carried out subsequently. The horizontally placed detection probe in the entire fixture allows high-frequency signals to be transmitted without loss, thereby efficiently and accurately completing the test of the radar chip. The contact force between the chip and the detection probe is only achieved by the weight of the chip, and the pressure between the chip and the detection probe is very small, which can reduce damage to the contacts on the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural diagram of the utility model;

[0019] Figure 2 This is a schematic diagram of the top inner edge plate of the utility model;

[0020] Figure 3 This is a schematic diagram of the detection probe of the utility model being installed on the top inner edge plate;

[0021] Figure 4 It is a schematic diagram of the probe fixing member of the present utility model;

[0022] Figure 5 It is a schematic side cross-sectional view of the complete assembly of the utility model;

[0023] Figure 6 It is a schematic cross-sectional view of the side portion of the detection probe on the top inner edge plate of the utility model.

[0024] In the figure: 1. Fixture socket; 2. Detection probe; 3. Probe fixing part; 4. Chip test hole; 5. Top inner edge plate; 6. Mounting positioning groove; 7. Raised positioning block; 8. Top cover plate; 9. Inner vertical plate; 10. Outer vertical plate; 11. Horizontal positioning bracket; 12. Longitudinal positioning bracket; 13. First vertical plate; 14. First horizontal plate; 15. First side plate; 16. Second vertical plate; 17. Second horizontal plate; 18. Telescopic positioning rod; 19. Rotation adjustment rod; 20. Expansion limit pad; 21. Mounting ear; 22. Socket mounting hole. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the utility model for protection, but merely represents the selected embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0026] like Figure 1-6 As shown, the utility model provides a millimeter wave radar chip detection fixture, including a fixture socket 1, a detection probe 2, and a probe fixing part 3;

[0027] like Figure 2 As shown, a chip test hole 4 is provided through the center of the fixture socket 1, and a raised top inner edge plate 5 is provided on the top surface of the fixture socket 1 at a position corresponding to the edge of the chip test hole 4;

[0028] like Figure 6As shown, the top surface of the top inner edge plate 5 is provided with an installation positioning groove 6, and the outer side of the needle body of the detection probe 2 is provided with a protruding positioning block 7 that matches the installation positioning groove 6. The bottom of the protruding positioning block 7 is clamped in the installation positioning groove 6. The connection terminal of the detection probe 2 is located on the outer side of the top inner edge plate 5 and is electrically connected to the circuit board of the fixture socket 1, as shown in FIG. Figure 3 As shown, the tip of the detection probe 2 is located inside the top inner edge plate 5 and is horizontally suspended in the chip test hole 4;

[0029] like Figure 1 and 4 As shown, the probe fixing part 3 includes a top cover plate 8, four inner vertical plates 9 and four outer vertical plates 10. The top cover plate 8 is horizontally pressed on the top of the raised positioning hole, and the bottom of the inner vertical plate 9 is stuck on the top of the inner edge of the top inner plate 5. The top of the inner vertical plate 9 is fixedly connected vertically to the inner bottom end of the top cover plate 8, and the bottom end of the outer vertical plate 10 is connected to the outer edge top surface of the fixture socket 1. The top of the outer vertical plate 10 is fixedly connected vertically to the outer bottom end of the top cover plate 8. The inner vertical plate 9 is provided with a mounting notch corresponding to the shape of the raised positioning block 7 at a position corresponding to the raised positioning block 7.

[0030] The working principle, usage process and technical advantages of the detection fixture of the present invention are as follows: in actual use, the raised positioning block 7 of the detection probe 2 is first installed in the installation positioning groove 6 of the top inner edge plate 5, and then the probe fixing part 3 is installed, and the raised positioning block 7 is stably pressed by the top cover plate 8, so that the position of the detection probe 2 can be fixed. At the same time, since the raised positioning block 7 and the detection probe 2 are fixedly installed, the position of the detection probe 2 can be ensured to be correct after the installation is completed, and it can be aligned with the contacts on the millimeter-wave radar chip to be tested. At this time, the millimeter-wave radar chip to be tested can be placed in the chip test hole 4. At this time, the detection probe 2 can receive the chip to be tested and complete the contact connection, that is, the electrical circuit of the chip to be tested can be energized and installed, and the actual power-on detection work can be carried out subsequently. The horizontally placed detection probe 2 in the entire fixture allows high-frequency signals to be transmitted without loss, thereby efficiently and accurately completing the test of the radar chip. The contact force between the chip and the detection probe 2 is achieved only by the chip's own weight, and the pressure between the chip and the detection probe 2 is very small, which can reduce damage to the contacts on the chip.

[0031] As an embodiment of the present invention, Figure 1 and 4As shown, a chip holder is also provided on the probe fixture 3, and the chip holder includes a transverse positioning bracket 11 and a longitudinal positioning bracket 12 respectively mounted on two parallel inner vertical plates 9, and the transverse positioning bracket 11 includes a first vertical plate 13, a first transverse plate 14 and two first side plates 15, one side of the first vertical plate 13 is fixedly connected to the outer side of an inner vertical plate 9, the bottom end of the first vertical plate 13 is fixedly connected to one side of the first transverse plate 14 vertically, and the bottoms of the two first side plates 15 are respectively fixedly connected to the two ends of the first transverse plate 14 vertically;

[0032] The longitudinal positioning bracket 12 includes a second vertical plate 16 and a second horizontal plate 17. One end of the second horizontal plate 17 is fixedly connected to the bottom end of the second vertical plate 16. The second vertical plate 16 is parallel to the inner vertical plate 9 of the installation position, and a telescopic positioning hole and a first adjustment positioning hole are provided on the inner vertical plate 9 at the position of the second vertical plate 16. A telescopic positioning rod 18 is provided in the telescopic positioning hole. One end of the telescopic positioning rod 18 passes through the telescopic positioning hole and is fixedly connected to the second vertical plate 16. The other end of the telescopic positioning rod 18 is fixedly connected to the second vertical plate 16 at the corresponding position. The inner side of the outer vertical plate 10 is fixedly connected, and a second adjustment positioning hole is also provided on the outer vertical plate 10 at the position where the second vertical plate 16 is located, corresponding to the first adjustment positioning hole. A rotation adjustment rod 19 is passed through the first adjustment positioning hole and the second positioning hole. One end of the rotation adjustment rod 19 is rotatably connected to one side of the second vertical plate 16, and the other end of the rotation adjustment rod 19 is arranged on the outside of the outer vertical plate 10. The rod body of the rotation adjustment rod 19 is provided with a first thread, and the hole wall of the first adjustment positioning hole is provided with a second thread matching the first thread.

[0033] When the transverse positioning bracket 11 is actually used, when the chip to be tested is placed, the transverse position of the chip can be determined by the two first side plates 15, and one end of the chip can be supported by the first transverse plate 14. Then the other end of the chip is put down, and the other end of the chip can be supported by the second transverse plate 17. However, at this time, in order to place the chip, the longitudinal position of the chip is not necessarily accurately aligned with the tip of the probe. Therefore, by rotating the adjusting rod 19, the entire longitudinal positioning bracket 12 is moved toward the direction of the transverse positioning bracket 11, thereby driving the chip to move to a position close to the first vertical plate 13. At this time, the chip moves to the preset standard detection position, ensuring that the detection probe 2 can accurately correspond to the contacts of the chip to be tested.

[0034] The above scheme is an optimization scheme. Generally, the chip contacts have a certain area, and the detection purpose can be achieved by roughly aligning the probe tip and the contact. However, in order to achieve higher standards of accurate detection, the chip can be accurately positioned through the chip holder. At the same time, it can also support the chip, reduce the pressure between the chip contacts and the detection probe 2, and thus reduce the possibility of damage to the chip contacts.

[0035] Furthermore, the top surface of the first horizontal plate 14 and the top surface of the second horizontal plate 17 are both provided with elastic buffer support pads. The top surface height of the elastic buffer support pads corresponds to the needle tip height of the detection probe 2, which can play a buffering role when the chip is placed, reducing damage to the chip and also reducing damage to the detection probe 2.

[0036] Furthermore, the outer top of the first vertical plate 13 and the opposite side tops of the two first side plates 15 are surfaces inclined outward and downward, so as to facilitate accurate placement of the chip.

[0037] As an embodiment of the present invention, Figure 5 As shown, the installation positioning groove 6 is a rectangular groove, and the raised positioning block 7 is a positioning block with a square outer edge. The sizes of the positioning block and the rectangular groove match. When the positioning block is stuck in the rectangular groove, the detection probe 2 can only move upward, which can enhance the stability of the position of the detection probe 2.

[0038] Furthermore, an expansion limiting pad 20 is provided on the inner wall of the rectangular groove, so that the raised positioning block 7 can be more stably stuck in the installation positioning groove 6.

[0039] As an embodiment of the present invention, Figure 4 As shown, a mounting ear 21 is vertically connected to the outer bottom end of the outer vertical plate 10, and a cover plate mounting nail is provided through the mounting ear 21. The cover plate mounting nail passes through the mounting ear 21 and is fixedly connected to the top surface of the fixture socket 1, which is used to achieve a stable connection between the fixture socket 1 and the probe fixture 3. A plurality of socket mounting holes 22 are provided through the corners of the fixture socket 1, and socket mounting nails are configured in the socket mounting holes 22, such as Figure 5 As shown, the socket mounting nail is used to pass through the socket mounting hole 22 and be fixedly connected to the detection table surface, thereby fixing the position of the entire socket fixture.

[0040] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various changes and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A millimeter wave radar chip detection fixture, characterized by: It comprises a fixture socket (1), a detection probe (2), and a probe fixing part (3); A chip test hole (4) is provided through the center of the fixture socket (1), and a raised top inner edge plate (5) is provided on the top surface of the fixture socket (1) at a position corresponding to the edge of the chip test hole (4); The top surface of the top inner edge plate (5) is provided with an installation positioning groove (6), the outer side of the needle body of the detection probe (2) is provided with a protruding positioning block (7) matching the installation positioning groove (6), the bottom of the protruding positioning block (7) is clamped in the installation positioning groove (6), the connection terminal of the detection probe (2) is located on the outer side of the top inner edge plate (5) and is electrically connected to the circuit board of the fixture socket (1), and the needle tip of the detection probe (2) is provided on the inner side of the top inner edge plate (5) and is horizontally suspended in the chip test hole (4); The probe fixing member (3) includes a top cover plate (8), four inner vertical plates (9) and four outer vertical plates (10), the top cover plate (8) is horizontally pressed on the top of the raised positioning hole, the bottom of the inner vertical plate (9) is stuck on the top of the inner edge of the top inner plate (5), the top of the inner vertical plate (9) is fixedly connected vertically to the inner bottom end of the top cover plate (8), the bottom end of the outer vertical plate (10) is connected to the outer edge top surface of the fixture socket (1), and the top of the outer vertical plate (10) is fixedly connected vertically to the outer bottom end of the top cover plate (8).

2. The millimeter wave radar chip detection fixture according to claim 1, characterized in that: A chip bracket is also provided on the probe fixing member (3), and the chip bracket includes a transverse positioning bracket (11) and a longitudinal positioning bracket (12) respectively mounted on two parallel inner vertical plates (9), and the transverse positioning bracket (11) includes a first vertical plate (13), a first transverse plate (14) and two first side plates (15), one side of the first vertical plate (13) is fixedly connected to the outer side of one of the inner vertical plates (9), the bottom end of the first vertical plate (13) is fixedly connected to one side of the first transverse plate (14), and the bottoms of the two first side plates (15) are respectively fixedly connected to the two ends of the first transverse plate (14); The longitudinal positioning bracket (12) includes a second vertical plate (16) and a second horizontal plate (17), one end of the second horizontal plate (17) is fixedly connected to the bottom end of the second vertical plate (16), the second vertical plate (16) is parallel to the inner vertical plate (9) of the installation position, and a telescopic positioning hole and a first adjustment positioning hole are provided through the inner vertical plate (9) where the second vertical plate (16) is located, a telescopic positioning rod (18) is provided in the telescopic positioning hole, one end of the telescopic positioning rod (18) passes through the telescopic positioning hole and is fixedly connected to the second vertical plate (16), and the other end of the telescopic positioning rod (18) is connected to the corresponding side. The outer vertical plate (10) is fixedly connected to the inner side of the outer vertical plate (10) at the position where the second vertical plate (16) is located, and a second adjustment positioning hole is also provided on the outer vertical plate (10) corresponding to the first adjustment positioning hole. A rotation adjustment rod (19) is passed through the first adjustment positioning hole and the second adjustment positioning hole. One end of the rotation adjustment rod (19) is rotationally connected to one side of the second vertical plate (16), and the other end of the rotation adjustment rod (19) is arranged on the outside of the outer vertical plate (10). The rod body of the rotation adjustment rod (19) is provided with a first thread, and the hole wall of the first adjustment positioning hole is provided with a second thread matching the first thread.

3. The millimeter wave radar chip detection fixture according to claim 2, characterized in that: The top surface of the first transverse plate (14) and the top surface of the second transverse plate (17) are both provided with elastic buffer support pads, and the top surface height of the elastic buffer support pads corresponds to the needle tip height of the detection probe (2).

4. The millimeter wave radar chip detection fixture according to claim 3, characterized in that: The outer top end of the first vertical plate (13) and the opposite side top ends of the two first side plates (15) are surfaces inclined outward and downward.

5. The millimeter wave radar chip detection fixture according to claim 4, characterized in that: The inner vertical plate (9) is provided with a mounting notch that matches the shape of the raised positioning block (7) at a position corresponding to the raised positioning block (7).

6. The millimeter wave radar chip detection fixture according to claim 5, characterized in that: The installation positioning groove (6) is a rectangular groove, the raised positioning block (7) is a positioning block with a square outer edge, the positioning block and the rectangular groove have matching sizes, and when the positioning block is stuck in the rectangular groove, the detection probe (2) can only move upward.

7. The millimeter wave radar chip detection fixture according to claim 6, characterized in that: An expansion limiting pad (20) is provided on the inner wall of the rectangular groove.

8. The millimeter wave radar chip detection fixture according to claim 7, characterized in that: The outer bottom end of the outer vertical plate (10) is vertically connected to a mounting ear (21), and a cover plate mounting nail is provided through the mounting ear (21). The cover plate mounting nail passes through the mounting ear (21) and is fixedly connected to the top surface of the clamp socket (1).

9. The millimeter wave radar chip detection fixture according to claim 8, characterized in that: A plurality of socket mounting holes (22) are provided through the corners of the fixture socket (1), and socket mounting nails are arranged in the socket mounting holes (22). The socket mounting nails are used to pass through the socket mounting holes (22) and be fixedly connected to the detection table top.

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