Isolation amplifier test equipment
By designing automated isolation amplifier testing equipment, using a monolithic microprocessor and electromagnetic relay to realize automated testing of isolation amplifiers, solving the problem of inefficient manual testing and improving testing efficiency and accuracy.
Patent Information
- Application Number
- CN202421949920.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-13
- Publication Date
- 2025-08-15
- Estimated Expiration
- 2034-08-13
AI Technical Summary
The existing isolation amplifier test methods rely on manual manual operation, resulting in inefficient testing and excessive labor costs, and it is difficult to meet the production needs of a large number of isolation amplifiers.
Design an isolation amplifier test equipment, use a monolithic microprocessor and electromagnetic relay to achieve automated testing, connect it to a digital multimeter through a pin test interface, automatically control the pin measurement of the isolation amplifier, and integrate a reference signal generator and upper computer for data reading and storage.
It realizes automated testing of isolated amplifiers, improves testing efficiency, reduces labor costs, and can test multiple isolated amplifiers at the same time, improving test accuracy and consistency.
Smart Images
Figure CN223229676U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic component testing, in particular to an isolation amplifier testing device. Background Art
[0002] Precision isolation amplifiers are widely used in multi-channel data acquisition systems, short-circuit current measurement, motor control, signal processing and isolation, and low-drift input amplifiers. Currently, isolation amplifier circuits face challenges such as numerous test parameters, long test cycles, high test equipment and personnel requirements, and error-prone data recording during the test process. Currently, mainstream isolation amplifier testing methods rely on manual testing, such as manually operating input devices and manually collecting and recording test results. This results in significant labor and time costs. Furthermore, as the demand for isolation amplifiers continues to grow, the testing efficiency of existing isolation amplifiers is too low, significantly limiting their production efficiency and test accuracy.
[0003] To address the above issues, the industry has not yet proposed a better solution. Utility Model Content
[0004] The utility model provides an isolation amplifier test equipment system, which is used to at least solve the problems of low efficiency and excessive labor cost caused by manual testing of the isolation amplifier in the prior art.
[0005] In a first aspect, an embodiment of the present invention provides an isolation amplifier testing device, which includes: a single-chip microprocessor, including multiple pin test interfaces; each of the pin test interfaces is used to connect to the corresponding pin of the isolation amplifier to be tested; a digital multimeter; and multiple electromagnetic relays; one end of each of the electromagnetic relays is connected to the corresponding pin test interface, and the other end is connected to the digital multimeter.
[0006] Optionally, the single-chip microprocessor is used to connect multiple isolation amplifiers to be tested; the multiple pin test interfaces include a first pin test interface group and a second pin interface group, the first pin test interface group is used to connect the corresponding first isolation amplifier, and the second pin interface group is used to connect the corresponding second isolation amplifier.
[0007] Optionally, the isolation amplifier test device further includes: a reference signal generator connected to each of the pin test interfaces and configured to generate a test reference signal for each of the pin test interfaces.
[0008] Optionally, the isolation amplifier testing device further includes: a host computer connected to the digital multimeter and configured to read data measured by the digital multimeter.
[0009] Optionally, the host computer is further configured to send a trigger signal to the reference signal generator to trigger the reference signal generator to generate a test reference signal for each of the pin test interfaces.
[0010] Optionally, each of the pin test interfaces provides a pluggable connection for the isolation amplifier.
[0011] Optionally, the single-chip microprocessor is used to control the closing of each of the electromagnetic relays in sequence.
[0012] Optionally, the isolation amplifier testing device further includes a buzzer.
[0013] Optionally, the isolation amplifier testing device further includes a power indicator light.
[0014] Optionally, the isolation amplifier testing device further includes a power supply.
[0015] The beneficial effects of the embodiments of the present utility model are:
[0016] The plurality of pin test interfaces of the single-chip microprocessor are connected to the pins of the isolation amplifier to be tested, and the electromagnetic relays corresponding to the pin test interfaces are used to control the conduction connection between the pin to be tested and the digital multimeter used to achieve parameter measurement, thereby realizing automated testing of each pin of the isolation amplifier and improving the testing efficiency of the isolation amplifier. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0018] Figure 1 A schematic structural diagram of an example of an isolation amplifier test device according to an embodiment of the present utility model is shown;
[0019] Figure 2 A schematic structural diagram of an example of a "three-in-one" isolation amplifier test device according to an embodiment of the present utility model is shown;
[0020] Figure 3 A structural schematic diagram of another example of an isolation amplifier testing device according to an embodiment of the present utility model is shown;
[0021] Figure 4 A flow chart illustrating an example of an operating method of an isolation amplifier testing device according to an embodiment of the present invention is shown. DETAILED DESCRIPTION
[0022] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the described embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0023] Unless otherwise defined, the technical or scientific terms used in this utility model shall have the usual meanings understood by persons of ordinary skill in the field to which this utility model belongs. The words "first", "second" and similar terms used in this utility model do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one", "an" or "the" do not indicate a quantity limitation, but rather indicate the existence of at least one. Words such as "include" or "comprise" mean that the elements or objects preceding the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connect" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect.
[0024] It should be noted that the terms "up", "down", "left", "right", "front" and "back" used in the present invention are only used to indicate relative position relationships. When the absolute position of the object being described changes, the relative position relationship may also change accordingly.
[0025] Figure 1 A structural schematic diagram of an example of an isolation amplifier testing device according to an embodiment of the present utility model is shown.
[0026] like Figure 1 As shown, the isolation amplifier test device 100 includes a single-chip microprocessor 110 including a plurality of pin test interfaces (ie, 111 , 113 . . . 11 n ), a digital multimeter 120 and a plurality of electromagnetic relays (ie, 131 , 133 . . . 13 n ).
[0027] Specifically, each pin test interface is used to connect to a corresponding pin of the isolation amplifier to be tested, and the connection methods can be diverse. In some preferred embodiments, each pin test interface provides a pluggable connection to the isolation amplifier. For example, the pin test interface can be designed to match the shape and structure of the isolation amplifier's pins. This allows for rapid replacement of one isolation amplifier after testing, further improving isolation amplifier testing efficiency.
[0028] In some embodiments, one end of each electromagnetic relay is connected to a corresponding pin test interface, and the other end is connected to a digital multimeter. Figure 1 As shown, electromagnetic relay 131 is connected between pin test interface 111 and digital multimeter 120, electromagnetic relay 133 is connected between pin test interface 113 and digital multimeter 120, and so on. Digital multimeter 120 is used to measure the functional parameters of the pins of the isolation amplifier connected via the pin test interface. Thus, by controlling the conduction of different electromagnetic relays, the functional parameters of different pins of the connected isolation amplifier can be measured separately, achieving automated testing of different pins of the isolation amplifier and improving the testing efficiency of the single-chip microprocessor.
[0029] In some examples of the present invention, a single-chip microprocessor is used to connect to multiple isolation amplifiers to be tested. Here, the multiple pin test interfaces include a first pin test interface group and a second pin interface group. The first pin test interface group is used to connect to a corresponding first isolation amplifier, and the second pin interface group is used to connect to a corresponding second isolation amplifier. Thus, the isolation amplifier test equipment can connect to multiple isolation amplifiers, enabling simultaneous parameter testing of the pin functions of multiple isolation amplifiers, further improving testing efficiency.
[0030] Figure 2 A structural schematic diagram of an example of a "three-in-one" isolation amplifier testing device according to an embodiment of the present utility model is shown.
[0031] like Figure 2 As shown, the pins of the three isolation amplifiers are rearranged and controlled uniformly so that they are logically regarded as one product. A fourteen-way input and output control circuit is composed of 14 electromagnetic relays, which enables simultaneous testing and data collection of the pins of the three isolation amplifiers, greatly improving test efficiency.
[0032] Figure 3 A structural schematic diagram of another example of an isolation amplifier testing device according to an embodiment of the present utility model is shown.
[0033] like Figure 3As shown, the isolation amplifier test equipment includes a power supply 310, a single-chip microprocessor 320, a reference signal generator 330, an isolation amplifier 340, a digital multimeter 350, and a host computer 360. In some embodiments, the single-chip microprocessor 320 can control the closing of each electromagnetic relay in sequence to automatically switch the pins of the isolation amplifier 340 to be tested. For example, the electromagnetic relay is controlled by encoding control information to switch the isolation amplifier or output pins with different numbers to be tested. The reference signal generator 330 is connected to each pin test interface of the single-chip microprocessor 320 to generate a test reference signal for each pin test interface, thereby implementing functional parameter testing of multiple pins of the connected isolation amplifier 340. In some embodiments, the reference signal generator 330 can use a FLUKE multifunctional calibration source (hereinafter referred to as FLUKE). The host computer 360 is connected to the digital multimeter 350 and can read the data measured by the digital multimeter to achieve real-time visual monitoring of the isolation amplifier test process.
[0034] Here, host computer 360 can be a terminal device such as a computer, enabling interconnected communication between the DMM and the computer. Furthermore, host computer 360 can send a trigger signal to reference signal generator 330 to trigger it to generate test reference signals for each pin test interface. For example, the host computer issues an output voltage command to FLUKE, which stores the DMM's measured data in a corresponding Excel spreadsheet, thus enabling automated testing of all isolation amplifier parameters and automated data reading and storage.
[0035] In some embodiments, the test equipment may also integrate a power supply and power protection module, a logic control module, and a voice prompt module, such as a buzzer and power indicator light, to provide prompts and broadcasts of the device power status or pin function test results. The power supply 310 is powered by a 220V to 24V power supply module, which supplies power to two power modules, thereby providing power to various components in the test equipment.
[0036] Figure 4 The flowchart shows an example of an operating method of the isolation amplifier automatic test equipment according to an embodiment of the present invention.
[0037] like Figure 4 As shown, in step S410, a data table is created and measurement indicators are input.
[0038] Specifically, users can create data acquisition tasks through the host computer and specify the indicator dimensions that need to be functionally tested, such as specifying to test the pins of a specific function or type of isolation amplifier.
[0039] In step S420 , the state is switched to measure the isolation voltage.
[0040] In step S430 , the state is switched to measure the normal output voltage.
[0041] In step S440 , functional test parameters are collected and the data table is automatically updated.
[0042] In some embodiments, devices such as a single-chip microprocessor and a reference signal generator are initialized and enter a parameter testing phase. Different types of functional parameters of the isolation amplifier are collected through state task switching, such as isolation voltage and normal output voltage, and stored and updated in a test data summary table.
[0043] Through the embodiments of the present invention, multiple independent devices are rearranged and combined into different pins of a "large" device to achieve an "all-in-one" effect. According to the test conditions and parameter characteristics of the isolation amplifier circuit, precise control and operation processes are designed to achieve the effects of simultaneous automated testing of multiple isolation amplifiers, automated collection and storage of test data, and real-time visual monitoring of the test process. This greatly improves the test efficiency, test accuracy, and consistency of the isolation amplifier circuit, and achieves a test efficiency increase of more than 5 times compared to before.
[0044] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.
Claims
1. An isolation amplifier test device, characterized in that: The isolation amplifier test equipment comprises: A single-chip microprocessor comprises a plurality of pin test interfaces; each of the pin test interfaces is used to connect to a corresponding pin of an isolation amplifier to be tested; Digital multimeter; Multiple electromagnetic relays; one end of each electromagnetic relay is connected to the corresponding pin test interface, and the other end is connected to the digital multimeter.
2. The isolation amplifier test device according to claim 1, characterized in that: The single-chip microprocessor is used to connect multiple isolation amplifiers to be tested; the multiple pin test interfaces include a first pin test interface group and a second pin interface group, the first pin test interface group is used to connect the corresponding first isolation amplifier, and the second pin interface group is used to connect the corresponding second isolation amplifier.
3. The isolation amplifier test device according to claim 1, wherein: The isolation amplifier test equipment further includes: The reference signal generator is connected to each of the pin test interfaces and is used to generate a test reference signal for each of the pin test interfaces.
4. The isolation amplifier test device according to claim 3, characterized in that: The isolation amplifier test equipment further includes: The host computer is connected to the digital multimeter and is used to read the data measured by the digital multimeter.
5. The isolation amplifier test device according to claim 4, characterized in that: The host computer is further configured to send a trigger signal to the reference signal generator to trigger the reference signal generator to generate a test reference signal for each of the pin test interfaces.
6. The isolation amplifier test device according to claim 1, wherein: Each of the pin test interfaces provides a pluggable connection for the isolation amplifier.
7. The isolation amplifier test device according to claim 1, wherein: The single-chip microprocessor is used to control the closing of each of the electromagnetic relays in sequence.
8. The isolation amplifier testing device according to any one of claims 1 to 7, characterized in that: The isolation amplifier testing device further includes a buzzer.
9. The isolation amplifier testing device according to any one of claims 1 to 7, characterized in that: The isolation amplifier testing device further includes a power indicator light.
10. The isolation amplifier testing device according to any one of claims 1 to 7, characterized in that: The isolation amplifier testing device further includes a power supply.