Tweezers for sampling heavy sand scanning electron microscope detection sample

Abstract

The utility model provides a pair of tweezers for sampling a heavy sand scanning electron microscope detection sample, and relates to the field of tweezers for sampling a heavy sand scanning electron microscope detection sample, the tweezers comprise a tweezers mechanism, the tweezers mechanism comprises a tweezers body, a first fixing ring, a positioning groove, a second fixing ring and an inserting groove, the top of the tweezers mechanism is provided with a limiting assembly, and the tweezers body is provided with a clamping groove. The limiting assembly comprises a limiting ring, a limiting groove and a rubber convex block, a sampling assembly is arranged in the tweezers mechanism, and the sampling assembly comprises an insertion rod, a groove, a nail table and a conductive adhesive. According to the utility model, the tweezers body is close to a sample to be sampled, so that the sample is positioned in the positioning groove, the tweezers body is pressed, so that the nail table enters the positioning groove, the sample is adhered by the conductive adhesive, and then the nail table is pulled out, so that the insertion rod is pulled out from the interiors of the insertion groove and the limiting groove, so that the sample is obtained, and simple clamping of traditional tweezers is avoided; and through the arrangement of the nail table and the conductive adhesive, the sampling of a sample is facilitated.

Description

Technical Field

[0001] The utility model relates to the technical field of tweezers for sampling samples using a heavy sand scanning electron microscope, in particular to a pair of tweezers for sampling samples using a heavy sand scanning electron microscope. Background Art

[0002] Scanning electron microscope is abbreviated as SEM. With the continuous improvement of instrument structure, the analysis accuracy of SEM has been improved from micron level to nanometer level. In particular, it is an indispensable microstructure analysis instrument in the process characteristic analysis of fine-grained minerals. In routine experiments, fine-grained minerals with large specific gravity, such as gold minerals, need to be tested under a stereoscope with the help of artificial heavy sand when analyzing their color and composition. After finding the gold mineral, it is moved to the sample stage of the SEM for further testing. Tweezers are often used when taking samples.

[0003] In the prior art, the tweezers commonly used for sampling samples for heavy sand scanning electron microscopy are relatively simple in structure, and the samples are clamped by the two ends of the tweezers. Due to the irregular shape of the samples, it is inconvenient to use ordinary tweezers to clamp them. Utility Model Content

[0004] The purpose of the utility model is to provide a pair of tweezers for taking samples for heavy sand scanning electron microscope detection, so as to solve the problem in the above background technology that it is inconvenient to use ordinary tweezers to pick up samples due to irregular shapes.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A pair of tweezers for sampling samples for heavy sand scanning electron microscope detection comprises: a tweezers mechanism, wherein the tweezers mechanism comprises a tweezers body, a first fixing ring, a positioning groove, a second fixing ring and a slot; a limiting assembly is provided on the top of the tweezers mechanism, wherein the limiting assembly comprises a limiting ring, a limiting groove and a rubber bump; a sampling assembly is provided inside the tweezers mechanism, wherein the sampling assembly comprises an insertion rod, a groove, a nail base and conductive glue.

[0007] As a preferred embodiment, one end of the clamping portion of the tweezers body is fixedly connected to one side of the first fixing ring, and a positioning groove is provided inside the first fixing ring.

[0008] As a preferred embodiment, the other end of the clamping portion of the tweezers body is fixedly connected to one side of the second fixing ring, and a slot is provided inside the second fixing ring.

[0009] As a preferred embodiment, the top of the second fixing ring is fixedly connected to the bottom of the limiting ring, and a limiting groove is provided inside the limiting ring.

[0010] As a preferred embodiment, the inner wall of the limiting groove is fixedly connected to the outer wall of the rubber protrusion, and the inner diameter of the slot is the same as the inner diameter of the limiting groove.

[0011] As a preferred embodiment, the inner wall of the slot is movably connected to the outer wall of the insertion rod, and the inner wall of the limiting groove is movably connected to the outer wall of the insertion rod.

[0012] As a preferred embodiment, the inner diameters of the slot and the limiting groove are the same as the diameter of the insertion rod, the outer wall of the insertion rod is provided with a groove, and the inner wall of the groove is movably connected to the outer wall of the rubber protrusion.

[0013] As a preferred embodiment, the bottom of the insertion rod is fixedly connected to the top of the nail platform, the bottom of the nail platform is movably connected to the top of the conductive glue, the diameter of the nail platform is the same as the inner diameter of the positioning groove, and the outer wall of the nail platform is movably connected to the inner wall of the positioning groove.

[0014] Compared with the prior art, the advantages and positive effects of the present invention are:

[0015] 1. Place the tweezers body close to the sample to be sampled so that the sample is located inside the positioning groove. Press the tweezers body so that the nail base enters the inside of the positioning groove. At the same time, the conductive glue sticks the sample. Then pull out the nail base to pull the insertion rod out of the slot and the inside of the limit groove to obtain the sample. This gets rid of the simple clamping of traditional tweezers. The setting of the nail base and conductive glue facilitates the sampling of samples.

[0016] 2. The utility model sticks the conductive glue on the bottom of the nail table, and then inserts the insertion rod into the slot and the limit groove. At the same time, the rubber protrusion enters the groove. Through the setting of the rubber protrusion and the groove, the stability of the insertion rod after being inserted into the slot and the limit groove is ensured, and the possibility of the insertion rod loosening is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A schematic diagram of the structure of the tweezers for sampling samples under a heavy sand scanning electron microscope provided by the present invention;

[0018] Figure 2 A schematic diagram of the structure of the tweezers mechanism in the tweezers for sampling samples under a heavy sand scanning electron microscope provided by the present invention;

[0019] Figure 3 A schematic diagram of the structure of the limiting component in the tweezers for sampling samples under heavy sand scanning electron microscope provided by the present invention;

[0020] Figure 4 This is a schematic diagram of the sampling component in the tweezers for sampling samples for heavy sand scanning electron microscope detection provided by the utility model after being flipped.

[0021] Legend:

[0022] 1. Tweezers mechanism; 101. Tweezers body; 102. First fixing ring; 103. Positioning groove; 104. Second fixing ring; 105. Slot; 2. Limiting assembly; 201. Limiting ring; 202. Limiting groove; 203. Rubber bump; 3. Sampling assembly; 301. Insertion rod; 302. Groove; 303. Nail stand; 304. Conductive adhesive. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0024] See also Figure 1-Figure 4 The utility model provides a pair of tweezers for sampling samples for heavy sand scanning electron microscope detection, which includes a tweezers mechanism 1, which includes a tweezers body 101, a first fixing ring 102, a positioning groove 103, a second fixing ring 104 and a slot 105. A limiting component 2 is provided on the top of the tweezers mechanism 1, and the limiting component 2 includes a limiting ring 201, a limiting groove 202 and a rubber bump 203. A sampling component 3 is provided inside the tweezers mechanism 1, and the sampling component 3 includes an insertion rod 301, a groove 302, a nail base 303 and a conductive glue 304.

[0025] In one embodiment, one end of the clamping portion of the tweezers body 101 is fixedly connected to one side of the first fixing ring 102 , and a positioning groove 103 is defined inside the first fixing ring 102 .

[0026] Specifically, the arrangement of the first fixing ring 102 and the positioning groove 103 facilitates the positioning of the sample and increases the convenience of sampling.

[0027] In one embodiment, the other end of the clamping portion of the tweezers body 101 is fixedly connected to one side of the second fixing ring 104 , and a slot 105 is defined inside the second fixing ring 104 .

[0028] Specifically, the second fixing ring 104 and the slot 105 are provided to facilitate the use of the insertion rod 301 .

[0029] In one embodiment, the top of the second fixing ring 104 is fixedly connected to the bottom of the limiting ring 201 , and a limiting groove 202 is defined inside the limiting ring 201 .

[0030] Specifically, the arrangement of the limiting ring 201 and the limiting groove 202 increases the stability of the insertion rod 301 during placement.

[0031] In one embodiment, the inner wall of the limiting groove 202 is fixedly connected to the outer wall of the rubber protrusion 203 , and the inner diameter of the slot 105 is the same as the inner diameter of the limiting groove 202 .

[0032] Specifically, by inserting the rubber protrusion 203 into the groove 302 , the possibility of the insertion rod 301 being loosened when the device is in use can be reduced.

[0033] In one embodiment, the inner wall of the slot 105 is movably connected to the outer wall of the insertion rod 301 , and the inner wall of the limiting groove 202 is movably connected to the outer wall of the insertion rod 301 .

[0034] Specifically, the insertion rod 301 is inserted into the slot 105 and the limiting groove 202 , which facilitates the removal and insertion of the insertion rod 301 .

[0035] In one embodiment, the inner diameters of the slot 105 and the limiting groove 202 are the same as the diameter of the insertion rod 301 . A groove 302 is formed on the outer wall of the insertion rod 301 , and the inner wall of the groove 302 is movably connected to the outer wall of the rubber protrusion 203 .

[0036] Specifically, the rubber protrusion 203 enters the interior of the groove 302 , and the arrangement of the rubber protrusion 203 and the groove 302 ensures the stability of the insertion rod 301 after it is inserted into the slot 105 and the limiting groove 202 .

[0037] In one embodiment, the bottom of the insertion rod 301 is fixedly connected to the top of the nail platform 303, the bottom of the nail platform 303 is movably connected to the top of the conductive glue 304, and the diameter of the nail platform 303 is the same as the inner diameter of the positioning groove 103, and the outer wall of the nail platform 303 is movably connected to the inner wall of the positioning groove 103.

[0038] It is understandable that, through the above solution, the simple clamping of traditional tweezers can be eliminated, and the provision of the nail stand 303 and the conductive glue 304 facilitates the sampling of samples.

[0039] Working principle: First, stick the conductive glue 304 on the bottom of the nail base 303, then insert the insertion rod 301 into the slot 105 and the limiting groove 202, and at the same time, the rubber protrusion 203 enters the inside of the groove 302, and move the tweezers body 101 close to the sample to be sampled so that the sample is located inside the positioning groove 103. Press the tweezers body 101 so that the nail base 303 enters the inside of the positioning groove 103, and at the same time, the conductive glue 304 sticks the sample, and then pull out the nail base 303, so that the insertion rod 301 is pulled out from the slot 105 and the limiting groove 202, and then the sample is obtained.

[0040] It should also be noted that in other feasible methods, the two tweezers bodies 101 in the tweezers mechanism 1 can be set to a rotatable structure, that is, the two tweezers bodies 101 are connected by a rotating shaft, so that the two tweezers bodies 101 can be rotated relative to each other, which can facilitate the operation of the tweezers. That is, when placing the sampling sample, the two tweezers bodies 101 are rotated to a distance state, and when preparing the sample, the two tweezers bodies 101 are rotated to an aligned state, and then the tweezers body 101 is pressed so that the nail base 303 enters the interior of the positioning groove 103, and at the same time the conductive glue 304 sticks the sample, and then the nail base 303 is pulled out, so that the insertion rod 301 is pulled out from the slot 105 and the limit groove 202, and the sample is obtained.

[0041] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any other form. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes for application in other fields. However, any simple modification, equivalent change and modification of the above embodiment made according to the technical essence of the present invention without departing from the content of the technical solution of the present invention shall still fall within the scope of protection of the technical solution of the present invention.

Claims

1. A pair of tweezers for sampling samples under a heavy sand scanning electron microscope, characterized in that: include: A tweezers mechanism (1) comprises a tweezers body (101), a first fixing ring (102), a positioning groove (103), a second fixing ring (104) and a slot (105); a limiting assembly (2) is provided on the top of the tweezers mechanism (1); the limiting assembly (2) comprises a limiting ring (201), a limiting groove (202) and a rubber bump (203); a sampling assembly (3) is provided inside the tweezers mechanism (1); the sampling assembly (3) comprises an insertion rod (301), a groove (302), a nail base (303) and a conductive adhesive (304).

2. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 1, characterized in that: One end of the clamping portion of the tweezers body (101) is fixedly connected to one side of the first fixing ring (102), and a positioning groove (103) is provided inside the first fixing ring (102).

3. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 2, characterized in that: The other end of the clamping portion of the tweezers body (101) is fixedly connected to one side of the second fixing ring (104), and a slot (105) is provided inside the second fixing ring (104).

4. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 1, characterized in that: The top of the second fixing ring (104) is fixedly connected to the bottom of the limiting ring (201), and a limiting groove (202) is provided inside the limiting ring (201).

5. The tweezers for sampling samples under heavy sand scanning electron microscope according to claim 4, characterized in that: The inner wall of the limiting groove (202) is fixedly connected to the outer wall of the rubber protrusion (203), and the inner diameter of the slot (105) is the same as the inner diameter of the limiting groove (202).

6. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 1, characterized in that: The inner wall of the slot (105) is movably connected to the outer wall of the insertion rod (301), and the inner wall of the limiting groove (202) is movably connected to the outer wall of the insertion rod (301).

7. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 6, characterized in that: The inner diameters of the slot (105) and the limiting groove (202) are the same as the diameter of the insertion rod (301). The outer wall of the insertion rod (301) is provided with a groove (302), and the inner wall of the groove (302) is movably connected to the outer wall of the rubber protrusion (203).

8. The tweezers for sampling samples under a heavy sand scanning electron microscope according to claim 7, characterized in that: The bottom of the insertion rod (301) is fixedly connected to the top of the nail platform (303), the bottom of the nail platform (303) is movably connected to the top of the conductive glue (304), the diameter of the nail platform (303) is the same as the inner diameter of the positioning groove (103), and the outer wall of the nail platform (303) is movably connected to the inner wall of the positioning groove (103).

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