Scanning device and wireless test system

Abstract

The utility model provides a scanning device and a wireless test system, and relates to the technical field of wireless test equipment. The scanning device comprises a mounting bracket, a rotating mechanism and at least one test probe. The mounting bracket is provided with a mounting surface extending along an arc-shaped path; the plane where the arc-shaped path is located is vertically arranged. The mounting bracket is connected to the rotating mechanism, the rotating mechanism is used for driving the mounting bracket to rotate, and the rotating central axis of the mounting bracket is vertically arranged and passes through the circle center of the arc-shaped path. The test probe is arranged on the mounting surface and faces the circle center of the arc-shaped path. The wireless test system provided by the utility model adopts the scanning device. According to the scanning device and the wireless test system provided by the utility model, the technical problem that the size and the cost of a test device are increased due to the fact that the size of a tested piece is large and a relatively large rotary table and a relatively large rotation space are required in the prior art can be solved.

Description

Technical Field

[0001] The utility model relates to the technical field of wireless testing equipment, in particular to a scanning device and a wireless testing system. Background Art

[0002] Antenna near-field measurement uses a test probe to move across the scanning surface of the near-field radiation zone to continuously collect the amplitude and phase data of the antenna radiation field, and uses near-field to far-field transformation to obtain the far-field characteristics of the antenna.

[0003] There are many near-field measurement methods. If classified according to the shape of the surface formed by the motion trajectory of the test probe, when the probe moves on a plane, it is a planar near-field measurement. When the probe moves on a cylinder or a sphere, it corresponds to a cylindrical near-field measurement and a spherical near-field measurement, respectively.

[0004] In spherical near-field measurements, the DUT is usually placed on a turntable and rotated in the horizontal plane. A single movable test probe is used to sample at different pitch angles in the vertical plane, or multiple fixed test probes are used to sample at different pitch angles in the vertical plane.

[0005] In spherical near-field measurements, the antenna under test must be placed at the center of the scanning sphere. However, if the DUT is large and the antenna is far from its geometric center, placing the antenna at the center of the turntable requires a larger turntable and more rotation space, and the radius of the scanning sphere also increases accordingly, increasing the size and cost of the test setup. Utility Model Content

[0006] The technical problem solved by the utility model is how to improve the technical problem in the prior art that the large size of the tested piece requires a large turntable and rotation space, which increases the size and cost of the test device.

[0007] The embodiment of the present utility model can be implemented as follows:

[0008] The utility model provides a scanning device, comprising:

[0009] The mounting bracket has a mounting surface extending along an arc-shaped path; the plane where the arc-shaped path is located is vertically arranged;

[0010] a rotation mechanism, the mounting bracket being connected to the rotation mechanism, the rotation mechanism being used to drive the mounting bracket to rotate, the rotation axis of the mounting bracket being vertically arranged and passing through the center of the arc path; and

[0011] At least one test probe is disposed on the mounting surface and is disposed toward the center of the arc path.

[0012] Optionally, the rotating mechanism includes a power device and a supporting frame; the mounting bracket is connected to the supporting frame, and the power device is arranged at the bottom of the supporting frame; the power device is used to drive the supporting frame to rotate to drive the mounting bracket to rotate.

[0013] Optionally, the rotating mechanism further includes a rolling device, which is connected to the supporting frame and spaced apart from the power device, and is configured to rotate with the supporting frame and support the supporting frame.

[0014] Optionally, the rolling device is provided at the bottom of the supporting frame.

[0015] Optionally, the test probe is fixedly arranged on the mounting surface.

[0016] Optionally, the mounting bracket includes a bracket body, a slide rail structure and a slider; the bracket body is connected to the rotation mechanism, the slide rail structure is connected to the bracket body, the slide rail structure has a track extending along the arc path, and the mounting surface is formed on the track; the slider is slidably connected to the mounting surface, and the test probe is arranged on the slider.

[0017] Optionally, there is one slider, and at least one test probe is provided on the slider.

[0018] Optionally, there are multiple sliders and multiple test probes; each slider is provided with at least one test probe.

[0019] A wireless testing system comprises a carrying device and the above-mentioned scanning device; the carrying device is used for carrying a piece to be tested, and enables at least a portion of the piece to be tested to be located at the center of the arc path.

[0020] Optionally, the carrying device includes a carrying body and a moving part, the carrying body is used to carry the test piece, and the moving part is connected to the carrying body to drive the carrying body to move.

[0021] The scanning device provided by the utility model has the following advantages over the prior art:

[0022] When performing a spherical near-field test on a device under test, the device under test is first placed at the center of an arc-shaped path. The mounting bracket can then be rotated by a rotation mechanism, causing the test probe on the mounting bracket to rotate synchronously, thereby enabling spherical near-field testing of the device under test. In cases where the device under test is large and difficult to rotate, the spherical near-field test of the device under test can be performed by rotating a smaller mounting bracket. This eliminates the need for a large turntable to accommodate the device under test, thereby overcoming the technical problem in the prior art where a large device under test requires a larger turntable and rotation space, which increases the size and cost of the test device.

[0023] Furthermore, the wireless test system using the above scanning device can also solve the technical problem in the prior art that the large size of the tested object requires a large turntable and rotation space, which increases the size and cost of the test device.

[0024] In addition, in the wireless test system, the use of a movable carrying device can more conveniently place the DUT at the center of the arc path, more accurately position the DUT, and help improve test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0026] Figure 1 This is a schematic structural diagram of a scanning device provided in an embodiment of the present application;

[0027] Figure 2 This is a simplified schematic diagram of a scanning device provided in an embodiment of the present application;

[0028] Figure 3 for Figure 2 Schematic diagram of the enlarged structure at A in the middle;

[0029] Figure 4 This is a schematic diagram of the structure of the wireless test system provided in an embodiment of the present application;

[0030] Figure 5 This is a schematic diagram showing that the geometric center of the measured portion of the measured object is located at the center of the scanning device provided in an embodiment of the present application.

[0031] Icons: 10-wireless test system; 11-scanning device; 12-carrying device; 13-test piece; 100-mounting bracket; 101-mounting surface; 110-bracket body; 120-slide rail structure; 130-slider; 200-rotation mechanism; 210-power device; 220-carrying frame; 221-main beam; 222-reinforcement beam; 230-rolling device; 300-test probe; 410-carrying body; 420-moving part. DETAILED DESCRIPTION

[0032] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.

[0033] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort are also within the scope of protection of the present invention.

[0034] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.

[0035] In the description of the present invention, it should be noted that if the terms "upper", "lower", "inside", "outside", etc. appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the accompanying drawings, or is the orientation or position relationship in which the utility model product is usually placed when in use. It is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the present invention.

[0036] In addition, the terms "first", "second", etc., if used, are merely used to distinguish and describe, and should not be understood as indicating or implying relative importance.

[0037] It should be noted that, in the absence of conflict, the features in the embodiments of the present invention can be combined with each other.

[0038] See also Figure 1 and Figure 4In one embodiment of the present application, a scanning device 11 and a wireless test system 10 employing the scanning device 11 are provided. The wireless test system 10 is used to perform wireless performance testing on a device under test 13, wherein the scanning device 11 is used to scan the device under test 13 for wireless performance testing. In this embodiment, the scanning device 11 and wireless test system 10 can overcome the prior art technical problem of large device under test 13 requiring a larger turntable and rotation space, which increases the size and cost of the test device.

[0039] In this embodiment, please refer to Figure 1 and Figure 2 The scanning device 11 includes a mounting bracket 100, a rotating mechanism 200, and at least one test probe 300. The mounting bracket 100 has a mounting surface 101 extending along an arc path; the plane where the arc path is located is vertically arranged. The mounting bracket 100 is connected to the rotating mechanism 200, and the rotating mechanism 200 is used to drive the mounting bracket 100 to rotate. The rotation axis of the mounting bracket 100 is vertically arranged and passes through the center of the arc path. The test probe 300 is arranged on the mounting surface 101, and the test probe 300 is arranged toward the center of the arc path. Generally, a plurality of test probes 300 are arranged on the mounting surface 101, so that the multiple test probes 300 can scan and measure the device under test 13 from multiple directions; and when rotating with the mounting bracket 100, the area covered by the multiple test probes 300 can form a spherical area, thereby realizing spherical near-field testing of the device under test 13.

[0040] Among them, Figure 2 In the figure, the dotted line B represents the vertical line passing through the center of the arc path; C represents the center of the arc path.

[0041] As described above, when performing a spherical near-field test on the device under test 13, the device under test 13 is first placed at the center of the arc path. The mounting bracket 100 can then be rotated by the rotation mechanism 200, and the test probe 300 on the mounting bracket 100 can then be rotated synchronously, thereby achieving a spherical near-field test on the device under test 13. In the event that the device under test 13 is large or inconvenient to rotate, the spherical near-field test of the device under test 13 can be achieved by rotating the smaller mounting bracket 100. This eliminates the need for a large turntable to accommodate the device under test 13. This overcomes the prior art problem of increased size and cost of the testing apparatus due to the large size of the device under test 13 requiring a larger turntable and rotation space.

[0042] It is worth noting that the curved surface referred to by the "spherical surface" in the spherical near-field test can be an incomplete sphere. In other words, the angle of rotation of the mounting bracket 100 driven by the rotation mechanism 200 is less than 360°, or the vertical / elevation angle range covered by the test probe 300 is less than 180°. Of course, in some embodiments, the "spherical surface" can also be a complete sphere.

[0043] Optionally, in this embodiment, the rotation mechanism 200 includes a power unit 210 and a supporting frame 220. The mounting bracket 100 is connected to the supporting frame 220, and the power unit 210 is disposed at the bottom of the supporting frame 220. The power unit 210 is used to drive the supporting frame 220 to rotate, thereby driving the mounting bracket 100 to rotate. The supporting frame 220 is used to support the mounting bracket 100, and the power unit 210 provides rotational power to the supporting frame 220. When the supporting frame 220 rotates, it drives the mounting bracket 100 to rotate synchronously, thereby enabling the test probe 300 to rotate around the device under test 13 to scan the device under test 13 and perform spherical near-field testing on the device under test 13.

[0044] It is worth noting that in this embodiment, when the power device 210 drives the supporting frame 220 to rotate, the rotation plane of the supporting frame 220 is horizontal, and the rotation center axis of the supporting frame 220 is also a vertical straight line passing through the center of the arc path.

[0045] It should be noted that the angular range within which the power unit 210 drives the supporting frame 220 to rotate can be determined based on actual circumstances. For example, in some embodiments, the power unit 210 can drive the supporting frame 220 to rotate 360°. Of course, in other embodiments, the power unit 210 can drive the supporting frame 220 to rotate 270°.

[0046] Furthermore, in order to ensure that the supporting frame 220 rotates stably, in this embodiment, the rotating mechanism 200 further includes a rolling device 230. The rolling device 230 is connected to the supporting frame 220 and is spaced apart from the power device 210. The rolling device 230 is used to rotate with the supporting frame 220 and support the supporting frame 220. In order to facilitate the test probe 300 on the mounting bracket 100 to rotate around the test piece 13, the test probe 300 is connected to the supporting frame 220 and is spaced apart from the power device 210. Figure 1 The power unit 210 is mounted on one side of the supporting frame 220, and the other side of the supporting frame 220 rotates around the side connected to the power unit 210, thereby facilitating the rotation of the mounting bracket 100 around the test piece 13. To ensure the overall stability of the supporting frame 220, a rolling device 230 is provided on the supporting frame 220. This not only provides support for the supporting frame 220 and improves its stability, but also reduces the difficulty of driving the supporting frame 220 and reduces the load on the power unit 210.

[0047] Optionally, the rolling device 230 is disposed at the bottom of the supporting frame 220. Of course, in other embodiments of the present application, the rolling device 230 may also be disposed at other positions of the supporting frame 220, such as the top or side.

[0048] Optionally, the rolling device 230 may be a roller, a ball, an arc guide rail or other rolling or sliding support structure.

[0049] In this embodiment, the supporting frame 220 includes a main beam 221 and a reinforcement beam 222. The main beam 221 is L-shaped, while the reinforcement beam 222 connects between the mounting bracket 100 and the main beam 221. Multiple reinforcement beams 222 are arranged at multiple angles, forming a triangular structure to enhance the overall stability of the mounting bracket 100. Optionally, the main beam 221 can be made of metal components such as H-steel or square tubes. Furthermore, the main beam 221 and reinforcement beam 222 can be secured together using screws or welding.

[0050] In one implementation of this embodiment, preferably, when there are multiple test probes 300, each test probe 300 is fixedly mounted on the mounting surface 101. Since the positions of the test probes 300 are fixed, multiple test probes 300 can be positioned at different locations to perform scanning tests on the device under test 13 in different orientations. Of course, in other embodiments, when there is only one test probe 300, the test probe 300 can also be fixed to the mounting surface 101.

[0051] In another implementation of this embodiment, please refer to Figure 2 and Figure 3 The mounting bracket 100 includes a bracket body 110, a slide rail structure 120, and a slider 130. The bracket body 110 is connected to the rotation mechanism 200, and the slide rail structure 120 is connected to the bracket body 110. The slide rail structure 120 has a track extending along an arc path, and the track forms a mounting surface 101. The slider 130 is slidably connected to the mounting surface 101, and the test probe 300 is disposed on the slider 130. The position and angle of the test probe 300 relative to the device under test 13 can be changed by sliding the slider 130 on the mounting surface 101, thereby adapting to different test scenarios and flexibly responding to different test requirements.

[0052] Optionally, there are multiple sliders 130 and multiple test probes 300; each slider 130 is provided with at least one test probe 300. Preferably, each slider 130 is provided with a test probe 300 to facilitate independent position adjustment of each test probe 300.

[0053] It is worth noting that in another embodiment of the present application, some test probes 300 may be fixed, while others may be slidable. For example, there may be only one slider 130 , with at least one test probe 300 disposed on the slider 130 . In this case, the position of the slider 130 may be adjusted to adjust the test probe 300 on the slider 130 , thereby scanning the device under test 13 from different azimuth angles.

[0054] In this embodiment, the distribution area of the test probes 300 on the mounting surface 101 is semicircular, and the line connecting the test probes 300 at the two ends is a vertical line. Alternatively, the arc of the distribution area of the test probes 300 on the mounting surface 101 is less than 180 degrees, and the line connecting the test probes 300 at one end and the center of the arc forms a vertical line.

[0055] A spherical coordinate system is established with the center of the arc path as the origin, and the vertical plane on which the arc path lies is used as the reference. The fact that the distribution area of the test probes 300 on the mounting surface 101 is semicircular indicates that the distribution area of the test probes 300 can occupy a range of -90° to 90°. The fact that the arc of the distribution area of the test probes 300 on the mounting surface 101 is less than 180° indicates that the distribution area of the test probes 300 can occupy a range of 0° to 90°, or other ranges less than 180°. Of course, the distribution area of the test probes 300 can be adjusted based on actual conditions.

[0056] Based on the scanning device 11 provided above, please refer to Figure 1 and Figure 4 The wireless test system 10 provided in this embodiment further includes a carrying device 12. The carrying device 12 is used to carry the device under test and to place at least a portion of the device under test at the center of the arc path.

[0057] Furthermore, the carrying device 12 includes a carrying body 410 and a moving portion 420. The carrying body 410 is used to carry the device under test 13, and the moving portion 420 is connected to the carrying body 410 to drive the carrying body 410 to move. In other words, the carrying device 12 can be configured as a movable device, such as an automated guided vehicle (AGV). This allows the device under test 13 to be more conveniently placed at the center of the arc path, more accurately positioning the device under test 13, and improving test accuracy.

[0058] When performing wireless testing, the geometric center of the tested portion of the device under test 13 is usually placed at the center of the wireless testing system 10, that is, Figure 2The position indicated by point C in the figure is considered to be the geometric center of the tested part of the device under test 13, that is, the location of the antenna under test (AUT) of the device under test 13. However, when the AUT of the device under test 13 is far away from the geometric center of the device under test 13 (e.g. Figure 5 As shown, the AUT is located at one end of a long DUT. In this case, if the AUT is placed at the center of the wireless test system 10 and the DUT 13 is rotated around this center, a large amount of rotation space would be required. Therefore, using the scanning device 11 and wireless test system 10 provided in this embodiment eliminates the need to rotate the DUT 13, thereby achieving spherical near-field testing in a more compact space, without being limited by the size of the DUT.

[0059] Optionally, the wireless testing system 10 may further include an anechoic chamber (not shown), and the scanning device 11 and the carrying device 12 may be placed in the anechoic chamber to perform wireless performance testing.

[0060] In summary, when performing a spherical near-field test on the device under test 13, the device under test 13 is first placed at the center of the arc path. The mounting bracket 100 can then be rotated by the rotation mechanism 200, causing the test probe 300 on the mounting bracket 100 to rotate synchronously, thereby achieving spherical near-field testing of the device under test 13. In cases where the device under test 13 is large and inconvenient to rotate, the spherical near-field test of the device under test 13 can be performed by rotating the smaller mounting bracket 100. This eliminates the need for a large turntable to accommodate the device under test 13. This can alleviate the technical problem in the prior art where the large size of the device under test 13 requires a large turntable and rotation space, which increases the size and cost of the test device. Furthermore, the wireless test system 10 using the above-described scanning device 11 can also alleviate the technical problem in the prior art where the large size of the device under test 13 requires a large turntable and rotation space, which increases the size and cost of the test device. In addition, in the wireless test system 10 , the movable carrying device 12 is used to more conveniently place the device under test 13 at the center of the arc path, and more accurately position the device under test 13 , which is conducive to improving test accuracy.

[0061] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present invention should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.

Claims

1. A scanning device, characterized in that: include: The mounting bracket has a mounting surface extending along an arc-shaped path; the plane where the arc-shaped path is located is vertically arranged; a rotation mechanism, the mounting bracket being connected to the rotation mechanism, the rotation mechanism being used to drive the mounting bracket to rotate, the rotation axis of the mounting bracket being vertically arranged and passing through the center of the arc path; and At least one test probe is disposed on the mounting surface and is disposed toward the center of the arc path.

2. The scanning device according to claim 1, wherein: The rotating mechanism includes a power device and a carrying frame; the mounting bracket is connected to the carrying frame, and the power device is arranged at the bottom of the carrying frame; the power device is used to drive the carrying frame to rotate to drive the mounting bracket to rotate.

3. The scanning device according to claim 2, wherein: The rotating mechanism further includes a rolling device, which is connected to the supporting frame and spaced apart from the power device. The rolling device is used to rotate with the supporting frame and support the supporting frame.

4. The scanning device according to claim 3, characterized in that The rolling device is arranged at the bottom of the supporting frame.

5. The scanning device according to claim 1, wherein: When there are multiple test probes, the test probes are fixedly arranged on the installation surface.

6. The scanning device according to claim 1, wherein: The mounting bracket includes a bracket body, a slide rail structure and a slider; the bracket body is connected to the rotating mechanism, the slide rail structure is connected to the bracket body, the slide rail structure has a track extending along the arc path, and the mounting surface is formed on the track; The slider is slidably connected to the mounting surface, and the test probe is arranged on the slider.

7. The scanning device according to claim 6, characterized in that There is one slider, and at least one test probe is arranged on the slider.

8. The scanning device according to claim 6, wherein: There are multiple sliders and multiple test probes; each slider is provided with at least one test probe.

9. A wireless testing system, characterized in that: It comprises a carrying device and a scanning device as claimed in any one of claims 1 to 8; the carrying device is used to carry a piece to be tested, and to make the piece to be tested at least partially located at the center of the arc path.

10. The wireless testing system according to claim 9, wherein: The carrying device includes a carrying body and a moving part. The carrying body is used to carry the tested object. The moving part is connected to the carrying body to drive the carrying body to move.

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