Test probe installation assembly, electronic detonator control module test device and aging test system

Abstract

The utility model discloses a test probe installation assembly, an electronic detonator control module test device and an aging test system, and belongs to the technical field of electronic detonator test equipment. The test probe mounting assembly comprises a first mounting seat, a second mounting seat and a third mounting seat, wherein a plurality of first mounting through holes for mounting test probes are formed in the first mounting seat at intervals; the second mounting seat is connected with or abuts against the first mounting seat, a plurality of second mounting through holes used for mounting test probes are formed in the second mounting seat at intervals and directly face the first mounting through holes one to one, and the test probes can be mounted in the first mounting through holes and the second mounting through holes which are directly arranged. The two ends of the test probe installed in the first installation through hole and the second installation through hole which are arranged oppositely penetrate out of the first installation through hole and the second installation through hole respectively. The test probe installation assembly provided by the utility model is beneficial to improving the installation precision of the test probe and is convenient to process and form the installation through hole.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic detonator testing equipment, in particular to a test probe installation component, an electronic detonator control module testing device, and an aging testing system. Background Art

[0002] At present, electronic detonators are widely used in tunnel excavation, hazard removal blasting, demolition blasting, ore-rock separation, open-pit mine blasting and other occasions. The electronic detonator control module in the electronic detonator is the main detonation control part of the electronic detonator. The electronic detonator control module mainly includes a control circuit board and a control chip installed on the control circuit board, an ignition part, an energy storage capacitor, and multiple electronic components. The performance and reliability of the electronic detonator control module will directly affect the reliability of the electronic detonator.

[0003] Furthermore, in order to reduce the production cost of electronic detonator control modules, the existing technology uses batch production to produce them. During the batch production of electronic detonator control modules, a small number of defective products will be produced due to factors such as the production process and the operating conditions of the production equipment. Therefore, it is necessary to test the produced electronic detonator control modules and screen out defective products from multiple electronic detonator control modules so that the screened-out defective products can be eliminated to prevent defective products from leaving the factory.

[0004] Furthermore, in the prior art, in order to realize batch testing of electronic detonator control modules, testers are required to place multiple electronic detonator control modules on a test jig, and then fix the multiple electronic detonator control modules by the test jig before power-on testing. In order to realize testing of multiple electronic detonator control modules after power-on, a plurality of mounting holes for installing test probes are provided on the mounting seat, and multiple test probes are installed in the mounting holes, so that multiple test probes are installed on the mounting seat, and the installation positions of the test probes are limited in the circumferential direction by the mounting holes, so that the multiple test probes are respectively in contact with and conductive to the connection pins provided on the multiple electronic detonator control modules placed on the test jig, so as to facilitate power-on and testing of the electronic detonator control modules by the test probes.

[0005] Furthermore, in order to improve the stability and reliability of the test probes installed in the mounting through-holes, the depth of the mounting through-holes is usually appropriately increased to improve the stability and reliability of the abutting contact between the multiple test probes and the connecting pins provided on the electronic detonator control module, thereby preventing the test probes from becoming loose or offset due to the abutment between the test probes and the electronic detonator control module. However, as the depth of the mounting through-holes is increased, the difficulty of machining the mounting through-holes with a suitable depth increases, thereby increasing the cost of machining the mounting through-holes, especially when a large number of mounting through-holes need to be machined. In addition, machining deeper mounting through-holes is likely to reduce machining accuracy, resulting in reduced accuracy of the test probes installed in the mounting through-holes. Therefore, there is an urgent need for a mounting assembly that is conducive to improving the installation accuracy of the test probes and is convenient for machining the mounting through-holes. Summary of the Invention

[0006] The purpose of the present invention is to overcome at least one of the above-mentioned shortcomings of the prior art and to provide a test probe mounting assembly that is conducive to improving the installation accuracy of the test probe and is convenient for processing to form a mounting through hole. In addition, an electronic detonator control module aging test system is also provided.

[0007] The technical solution of the utility model to solve the above technical problems is as follows:

[0008] According to one aspect of the present application, a test probe mounting assembly is provided for mounting a plurality of test probes, comprising:

[0009] A mounting base 1, wherein a plurality of mounting through holes 1 for mounting test probes are provided on the mounting base 1 at intervals;

[0010] The mounting seat 2 is connected to or abutted against the mounting seat 1, and the mounting seat 2 is provided with a plurality of mounting through holes 2 for mounting the test probes, each of which is spaced apart from the plurality of mounting through holes 1. The test probes can be mounted in the mounting through hole 1 and the mounting through hole 2 that are arranged opposite each other, and the two ends of the test probes mounted in the mounting through hole 1 and the mounting through hole 2 that are arranged opposite each other pass through the mounting through hole 1 and the mounting through hole 2 respectively.

[0011] The beneficial effects of the present invention are as follows: in this embodiment, by providing a plurality of mounting through holes 1 on mounting seat 1, and providing a plurality of mounting through holes 2 on mounting seat 2, which are directly opposite to the plurality of mounting through holes 1, it is convenient to connect mounting seat 2 with mounting seat 1 or to set abutment, and then install the test probe in the directly opposite mounting through hole 1 and mounting through hole 2, so as to realize the installation of the test probe; further, the directly opposite mounting through hole 1 and mounting through hole 2 are equivalent to forming a mounting through hole, and the depth of the constituted mounting through hole is equal to the sum of the depth of mounting through hole 1 and the depth of mounting through hole 2, which is conducive to appropriately increasing the mounting through holes while ensuring the processing accuracy. The depth of mounting through hole one and the depth of mounting through hole two are improved, thereby improving the stability and reliability of the test probe installed in the mounting through hole one and the mounting through hole two that are arranged opposite each other; in addition, compared with opening mounting through holes of the same depth on one mounting seat, the depth can be distributed to mounting seat one and mounting seat two in this embodiment, which is beneficial to reducing the depth of mounting through hole one formed by processing on mounting seat one, facilitating reducing the processing difficulty of mounting through hole one and ensuring the processing accuracy of mounting through hole one, and is also beneficial to reducing the depth of mounting through hole two formed by processing on mounting seat two, facilitating reducing the processing difficulty of mounting through hole two and ensuring the processing accuracy of mounting through hole two.

[0012] In addition, based on the above technical solution, the present invention can also be improved as follows and can also have the following additional technical features.

[0013] According to one embodiment of the present application, the test probe mounting assembly further includes:

[0014] There are multiple locking pieces, and the multiple locking pieces are used to lock and connect the second mounting seat with the first mounting seat.

[0015] In this embodiment, the mounting seat 2 is locked and connected to the mounting seat 1 through multiple locking parts, which makes it easy to lock the mounting seat 2 and the mounting seat 1 into one, which is beneficial to improving the stability and reliability of the test probe installed in the mounting hole 1 and the mounting hole 2 set opposite each other.

[0016] According to one embodiment of the present application, a strip-shaped protrusion is provided on the mounting seat one, and a strip-shaped mounting groove is provided on the mounting seat two opposite to the strip-shaped protrusion, the strip-shaped protrusion is installed in the strip-shaped mounting groove, and a plurality of the mounting through holes one respectively pass through the strip-shaped protrusion in a straight line, and a plurality of the mounting through holes two respectively pass through the mounting seat two in a straight line and are connected with the strip-shaped mounting groove and the mounting through hole one arranged opposite thereto.

[0017] The strip protrusion in this embodiment is installed in the strip mounting groove, which is conducive to connecting the mounting seat 2 with the mounting seat 1; further, multiple mounting through holes 1 respectively pass through the strip protrusion in a straight line, and multiple mounting through holes 2 respectively pass through the mounting seat 2 in a straight line and are connected with the strip mounting groove and the mounting through hole 1 arranged opposite, which is conducive to improving the alignment accuracy of the mounting through hole 1 and the mounting through hole 2.

[0018] According to one embodiment of the present application, the test probe is provided with a protruding structure, the protruding structure protrudes toward the circumference, and a gap is formed between the strip-shaped protrusion and the inner side wall of the strip-shaped mounting groove facing the strip-shaped protrusion;

[0019] When the test probe is installed in the mounting through hole 1 and the mounting through hole 2 which are arranged opposite each other, the protruding structure is located in the gap 1 and protrudes outward from the mounting through hole 1 and the mounting through hole 2. The protruding structure is opposite to one side of the strip protrusion and stops at the strip protrusion. The protruding structure is opposite to one side of the mounting seat 2 and stops at the inner side wall of the strip protrusion of the strip mounting groove.

[0020] The test probe in this embodiment is provided with a protruding structure. When the test probe is installed in the mounting through hole 1 and the mounting through hole 2 which are arranged opposite each other, the protruding structure is located in the gap 1 and protrudes out of the mounting through hole 1 and the mounting through hole 2 toward the outer periphery. The protruding structure can limit the test probe along the extension direction of the mounting through hole 1 and the mounting through hole 2, thereby helping to improve the installation accuracy of the test probe in the mounting through hole 1 and the mounting through hole 2, avoiding the displacement of the test probe caused by the abutment between the test probe and the connecting pin, and thus helping to improve the consistency and reliability of the abutment between multiple test probes and the connecting pin; in addition, it is helpful to improve the positioning and installation accuracy of the test probe along the extension direction of the mounting through hole 1 and the mounting through hole 2, helping to improve the flatness of the end faces at both ends of multiple test probes, helping to improve the consistency and reliability of the abutment between multiple test probes and multiple connecting pins respectively, and avoiding poor conductivity caused by some test probes and connecting pins being suspended.

[0021] According to one embodiment of the present application, the raised structure is a ring-shaped structure, and the raised structure forms a top-stop plane one on the side facing the strip protrusion, and the strip protrusion forms a top-stop plane two on the side facing the strip mounting groove, and the top-stop plane one and the top-stop plane two are stopped; the raised structure forms a top-stop plane three on the side facing the mounting seat two, and the strip mounting groove forms a top-stop plane four on the inner side wall facing the strip protrusion, and the top-stop plane three and the top-stop plane four are stopped.

[0022] The raised structure in this embodiment is a ring-shaped structure, and the raised structure is stopped by the top stop plane 1 and the top stop plane 2 formed on the side facing the strip-shaped protrusion, and the raised structure is stopped by the top stop plane 3 and the top stop plane 4 formed on the side facing the mounting seat 2. This improves the consistency of the extrusion of the raised structure by the mounting seat 1 and the mounting seat 2, which is beneficial to improving the positioning and installation accuracy of the test probe along the extension direction of the mounting through hole 1 and the mounting through hole 2, and is beneficial to further improving the flatness of the end faces at both ends of multiple test probes.

[0023] According to one embodiment of the present application, the materials of the first mounting base and the second mounting base are both electrically insulating materials.

[0024] The materials of mounting base 1 and mounting base 2 in this embodiment are both electrically insulating materials, which is conducive to ensuring that multiple test probes installed in mounting through hole 1 and mounting through hole 2 are electrically insulated from each other, thereby improving the reliability of powering on and testing multiple electronic detonator control modules through multiple pairs of test probes.

[0025] According to another aspect of the present application, a device for testing an electronic detonator control module is provided for testing a plurality of electronic detonator control modules, wherein each of the plurality of electronic detonator control modules is connected to a pair of connecting pins at one end in a length direction thereof, and the device comprises:

[0026] A base, wherein the upper side of the base is provided with a plurality of placement grooves for placing the electronic detonator control module;

[0027] a rotating pressure plate, one end of which is rotatably connected to one end of the base and can rotate relative to the base in a vertical direction, the other end of which is a free end, and the rotating pressure plate rotates relative to the base to have a pressing position and a pressing release position, wherein when the rotating pressure plate is in the pressing position, the rotating pressure plate can press and limit the electronic detonator control module placed in the placement groove; and when the rotating pressure plate is in the pressing release position, the rotating pressure plate releases the pressing of the electronic detonator control module placed in the placement groove;

[0028] The above-mentioned test probe mounting assembly, the mounting seat 1 and the mounting seat 2 are mounted on the rotating pressure plate;

[0029] A test probe, wherein a plurality of pairs of the connecting pins are provided in a one-to-one correspondence, and the plurality of pairs of the test probes are respectively installed in the mounting through-hole 1 and the mounting through-hole 2 arranged opposite to each other, one end of the test probe is away from the mounting seat 1 and passes through the mounting through-hole 2 to form a conductive connection end, and the other end of the test probe is away from the mounting seat 2 and passes through the mounting through-hole 1 to form a stop contact conductive end, the stop contact conductive end is used to stop contact with a pair of the connecting pins on the electronic detonator control module placed in the placement groove to achieve conductive connection, and when the rotating pressure plate is in the pressing position, the stop contact conductive end is stop contact with the pair of the connecting pins on the electronic detonator control module placed in the placement groove;

[0030] a test control circuit board, disposed on one side of the rotating pressure plate, the test control circuit board being provided with a test control circuit, the conductive connection ends of the plurality of test probes being respectively connected to the test control circuit board and conductively connected to the test control circuit, and the test control circuit board rotating synchronously with the rotating pressure plate;

[0031] A locking mechanism is installed on the other end of the base, and the locking mechanism is used to lock the rotating pressure plate located at the pressing position on the base.

[0032] The upper side surface of the base in this embodiment is provided with a plurality of placement grooves for placing electronic detonator control modules, which is convenient for placing multiple electronic detonator control modules in the plurality of placement grooves; further, mounting seat one and mounting seat two are installed on the rotating pressure plate, and multiple pairs of test probes are respectively installed in mounting through hole one and mounting through hole two arranged opposite each other, and the conductive connection ends of the multiple test probes are respectively connected to the test control circuit board and conductively connected, which is convenient for the test probes, the test control circuit board and the rotating pressure plate to move one circle. When the rotating pressure plate is rotated to the clamping position, the stop-contact conductive end is stop-contacted with a pair of connecting pins on the electronic detonator control module placed in the placement groove, which is convenient for quickly realizing the conductive connection of multiple pairs of test probes with multiple pairs of connecting pins, which is beneficial to improving the efficiency of testing the electronic detonator control module; further, the electronic detonator control module testing device in this embodiment includes the above-mentioned test probe mounting assembly, which is beneficial to reducing the production and manufacturing cost of the electronic detonator control module testing device.

[0033] According to one embodiment of the present application, a plurality of electronic detonator control modules respectively include a circuit substrate, a plurality of electronic components and a sealing body, one end of each circuit substrate in the longitudinal direction is respectively connected to a pair of connecting pins, a plurality of electronic components are arranged on the circuit substrate, the sealing body is wrapped around the periphery of the circuit substrate and the plurality of electronic components, the circuit substrate is connected to one end of a pair of connecting pins and a pair of connecting pins are exposed on the outside of the sealing body, and the end surface of the circuit substrate to which one end of the pair of connecting pins is connected is connected to the connecting substrate, The connecting substrate connects multiple circuit substrates into one to form an electronic detonator control module. The base is provided with an avoidance and storage groove for avoiding the connecting substrate. The avoidance and storage groove forms a top stop limit surface facing the side of the connecting substrate. The avoidance and storage groove is connected to the placement groove. When the electronic detonator control module is placed in the placement groove, the circumferential side wall of the sealing body fits and rests against the inner side wall of the placement groove. The connecting substrate is stored in the avoidance and storage groove and the side of the connecting substrate facing the top stop limit surface is stopped by the top stop limit surface.

[0034] In this embodiment, multiple circuit substrates are connected together through a connecting substrate to form an electronic detonator control module. A avoidance storage groove for avoiding the connecting substrate is provided on the base. The avoidance storage groove is connected to the placement groove. When the electronic detonator control module is placed in the placement groove, the circumferential side wall of the sealing body fits and abuts against the inner side wall of the placement groove. The connecting substrate is stored in the avoidance storage groove and the side surface of the connecting substrate facing the top limit surface is stopped by the top limit surface. Therefore, it is convenient to take and place multiple electronic detonator control modules together, and it is beneficial to improve the reliability of fixing and limiting multiple electronic detonator control modules.

[0035] According to one embodiment of the present application, a plurality of adjustable stop screws are threadedly connected to the base at intervals, and the plurality of adjustable stop screws are located on one side of the avoidance and receiving groove and are perpendicular to the stop limit surface. The screwed-in ends of the plurality of adjustable stop screws can extend into the avoidance and receiving groove to form a stop top surface. By screwing the plurality of adjustable stop screws, the distance between the stop top surface and the stop limit surface can be adjusted, and when the screwed-in ends of the plurality of adjustable stop screws protrude from the stop limit surface toward the avoidance and receiving groove and are screwed in by the same distance, the side surface of the connecting substrate located in the avoidance and receiving groove facing the stop top surface stops with the stop top surface of the plurality of adjustable stop screws.

[0036] In this embodiment, multiple adjustable stop screws are threadedly connected at intervals on the base, and the distance between the stop top end surface and the stop limit surface can be adjusted by turning the multiple adjustable stop screws. This is beneficial for adjusting the position of the connecting substrate located in the avoidance storage groove, and is beneficial for the test probe to stop at the appropriate position of a pair of connecting pins connected to the circuit substrate, and is beneficial for the electronic detonator control module test device to adapt to electronic detonator control modules of various specifications.

[0037] According to one embodiment of the present application, an upwardly protruding connecting protrusion is connected to one end of the base, one end of the rotating pressure plate is rotatably connected to the connecting protrusion, and the other end of the base is provided with a rotating top-stop surface facing the connecting protrusion, and when the rotating pressure plate is in the pressing position, the free end of the rotating pressure plate stops at the rotating top-stop surface;

[0038] A placement limit rib is formed between two adjacent placement grooves, and a top stop protrusion is connected to the upper side of several of the placement limit ribs. The top surface of the top stop protrusion is flush with the rotation top stop surface. When the free end of the rotating pressure plate stops with the rotating top stop surface, the rotating pressure plate stops with the top surface of the top stop protrusion.

[0039] In this embodiment, a top-stop protrusion is connected to the upper side of several placement limit retaining edges, and the top surface of the top-stop protrusion is flush with the rotating top-stop surface. When the free end of the rotating pressure plate stops at the rotating top-stop surface, the rotating pressure plate stops at the top surface of the top-stop protrusion, so that the top-stop protrusion can limit the degree of squeezing of the electronic detonator control module placed in the placement groove by the rotating pressure plate, avoiding excessive squeezing of the electronic detonator control module placed in the placement groove by the rotating pressure plate to damage the electronic detonator control module, and is conducive to improving the consistency of the tightness of the rotating pressure plate on multiple electronic detonator control modules.

[0040] According to another aspect of the present application, an electronic detonator control module aging test system is provided, comprising:

[0041] Support frame;

[0042] The above-mentioned electronic detonator control module testing device is provided in plurality, and the plurality of electronic detonator control module testing devices are installed on the support frame at intervals;

[0043] a main control circuit board, wherein the main control circuit board is provided with a main control circuit, and the test control circuit provided on the test control circuit board is electrically connected to the main control circuit provided on the main control circuit board;

[0044] The aging test box has an aging test cavity formed inside the aging test box, and the support frame is arranged in the aging test cavity.

[0045] The electronic detonator control module aging test system in this embodiment includes the above-mentioned multiple electronic detonator control module test devices, which is conducive to installing multiple electronic detonator control module test devices on a support frame and electrically connecting them with the test control circuits provided on multiple test control circuit boards through a master control circuit. This is conducive to controlling multiple electronic detonator control module test devices through the master control circuit to perform aging tests, thereby improving the efficiency of aging tests on electronic detonator control modules. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the technical solutions in the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0047] Figure 1 This is a schematic structural diagram of a test probe mounting assembly according to an embodiment of the present invention;

[0048] Figure 2 for Figure 1 Front view after straightening;

[0049] Figure 3 for Figure 2 a sectional view taken along a vertical plane passing through the test probe mounting assembly in a front-to-rear direction;

[0050] Figure 4 for Figure 1 Schematic diagram of the structure after the second mounting base is hidden;

[0051] Figure 5 Schematic diagram of the structure of the electronic detonator control module testing device in an embodiment of the present utility model;

[0052] Figure 6 This is a schematic structural diagram of the locking mechanism in an embodiment of the present utility model installed on the base;

[0053] Figure 7 This is a schematic structural diagram of a rotating pressing plate in an embodiment of the present invention pressing multiple electronic detonator control modules into multiple placement grooves;

[0054] Figure 8 This is a structural diagram of an electronic detonator control module formed by connecting multiple circuit substrates into one by a connecting substrate in an embodiment of the present invention. DETAILED DESCRIPTION

[0055] In order to make the objectives, technical solutions and advantages of this application clearer, the implementation methods of this application will be further described in detail below with reference to the accompanying drawings.

[0056] In order to more clearly understand the above-mentioned objectives, features and advantages of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that the embodiments of the present application and the features therein can be combined with each other without conflict.

[0057] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Therefore, the scope of protection of the present invention is not limited to the specific embodiments disclosed below.

[0058] In one aspect of the present application, a test probe installation assembly is provided for installing multiple test probes 3, such as Figures 1 to 4 As shown, the test probe mounting assembly includes:

[0059] A mounting base 1, on which a plurality of mounting through holes 1 for mounting the test probes 3 are provided at intervals;

[0060] Mounting base 2 2 is connected to mounting base 1 1 , and mounting base 2 2 is provided with multiple mounting through holes 1 at intervals opposite to multiple mounting through holes 1 for installing test probes 3 , and the test probes 3 can be installed in the mounting through holes 1 and 2 arranged opposite to each other, and the two ends of the test probes 3 installed in the mounting through holes 1 and 2 arranged opposite to each other pass through the mounting through holes 1 and 2 respectively.

[0061] Furthermore, in this embodiment, the mounting seat 2 2 can also be set to abut against the mounting seat 1 1, and multiple mounting through holes 1 can be set opposite to multiple mounting through holes 2 respectively, and it is convenient to install the test probe 3 in the mounting through holes 1 and 2 that are set opposite to each other; there can be many ways to set the mounting seat 2 2 to abut against the mounting seat 1 1, and the mounting seat 2 2 and the mounting seat 1 1 can also be clamped and fixed by other clamping mechanisms so that the mounting seat 2 2 and the mounting seat 1 1 are set to abut against each other.

[0062] In this embodiment, if Figures 1 to 4As shown, in this embodiment, a plurality of mounting through holes 1 are provided on the mounting seat 1, and a plurality of mounting through holes 2 are provided on the mounting seat 2 2, one by one, opposite to the plurality of mounting through holes 1, so that the mounting seat 2 2 is connected to the mounting seat 1 or abutted against each other, and then the test probe 3 is installed in the mounting through hole 1 and the mounting through hole 2 arranged opposite to each other, so as to install the test probe 3; further, the mounting through hole 1 and the mounting through hole 2 arranged opposite to each other are equivalent to forming a mounting through hole, and the depth of the constituted mounting through hole is equal to the sum of the depth of the mounting through hole 1 and the depth of the mounting through hole 2, which is conducive to appropriately increasing the depth of the mounting through hole 1 while ensuring the processing accuracy. and the depth of the mounting through hole 2, thereby improving the stability and reliability of the test probe 3 installed in the mounting through hole 1 and the mounting through hole 2 arranged opposite each other; in addition, compared with opening mounting through holes of the same depth on one mounting seat, the depth can be distributed to the mounting seat 1 1 and the mounting seat 2 2 in this embodiment, which is beneficial to reducing the depth of the mounting through hole 1 formed by processing on the mounting seat 1, facilitating reducing the processing difficulty of the mounting through hole 1 and ensuring the processing accuracy of the mounting through hole 1, and is also beneficial to reducing the depth of the mounting through hole 2 formed by processing on the mounting seat 2 2, facilitating reducing the processing difficulty of the mounting through hole 2 and ensuring the processing accuracy of the mounting through hole 2.

[0063] In this embodiment, if Figures 1 to 4 As shown, the mounting base 1 in this embodiment includes a supporting base plate 10, which has a rectangular structure. The upper side of the supporting base plate 10 is connected to a strip protrusion 11, which protrudes upward from the supporting base plate 10. The mounting through hole 1 in this embodiment vertically passes through the strip protrusion 11; further, the front and rear sides of the supporting base plate 10 are respectively provided with a plurality of bolt holes 101, and the left and right ends of the supporting base plate 10 are respectively provided with a bolt hole 2 102.

[0064] In this embodiment, if Figures 1 to 3 As shown, the mounting seat 2 in this embodiment includes a supporting base plate 20, which is a rectangular structure. The upper side of the supporting base plate 20 is connected with a supporting protrusion 21, which protrudes upward from the supporting base plate 20. The mounting through hole 2 in this embodiment vertically passes through the supporting protrusion 21; in addition, the mounting seat 1 and the mounting seat 2 2 in this embodiment can also be set to other structures.

[0065] One embodiment of the present application, such as Figure 1 and Figure 5 As shown, the test probe mounting assembly also includes:

[0066] There are multiple locking pieces, and the multiple locking pieces are used to lock and connect the mounting seat 2 2 with the mounting seat 1 1.

[0067] In this embodiment, if Figure 1 and Figure 5As shown, in this embodiment, the mounting base 2 2 is locked and connected with the mounting base 1 1 through multiple locking parts, which facilitates the locking connection of the mounting base 2 2 and the mounting base 1 1 as a whole, and is beneficial to improving the stability and reliability of the test probe 3 installed in the mounting through hole 1 and the mounting through hole 2 arranged opposite each other.

[0068] In this embodiment, if Figure 5 As shown, the locking member in this embodiment includes a plurality of bolts 1 611 and bolts 2. In addition, in this embodiment, in order to lock the mounting base 2 2 and the mounting base 1 1 together while simultaneously securing the mounting base 1 and the mounting base 2 2 to the rotating pressure plate 6, the bolts 1 611 and bolts 2 for locking the mounting base 2 2 and the mounting base 1 1 pass through the rotating pressure plate 6. Alternatively, the locking member may be other locking parts to facilitate the locking connection of the mounting base 2 2 and the mounting base 1 1 as a whole.

[0069] One embodiment of the present application, such as Figures 1 to 4 As shown, a strip-shaped protrusion 11 is provided on the mounting seat 1, and a strip-shaped mounting groove is provided on the mounting seat 2 opposite to the strip-shaped protrusion 11. The strip-shaped protrusion 11 is installed in the strip-shaped mounting groove. A plurality of mounting through holes 1 respectively pass through the strip-shaped protrusion 11 in a straight line, and a plurality of mounting through holes 2 respectively pass through the mounting seat 2 2 in a straight line and are connected with the strip-shaped mounting groove and the mounting through hole 1 arranged opposite thereto.

[0070] In this embodiment, if Figure 3 As shown, the strip protrusion 11 in this embodiment is installed in the strip mounting groove, which is conducive to connecting the mounting seat 2 2 with the mounting seat 1 1; further, multiple mounting through holes 1 respectively pass through the strip protrusion 11 in a straight line, and multiple mounting through holes 2 respectively pass through the mounting seat 2 2 in a straight line and are connected with the strip mounting groove and the mounting through hole 1 arranged opposite, which is conducive to improving the alignment accuracy of the mounting through hole 1 and the mounting through hole 2.

[0071] In this embodiment, if Figures 1 to 4 As shown, the mounting seat 1 in this embodiment includes a supporting base plate 10, which has a rectangular structure, and the strip protrusion 11 is connected to the upper side of the supporting base plate 10, and the strip protrusion 11 protrudes upward from the supporting base plate 10; the mounting seat 1 in this embodiment includes a supporting base plate 20, and the upper side of the supporting base plate 20 is connected with a supporting protrusion 21. The strip mounting groove in this embodiment is opened on the lower side of the supporting base plate 20 and extends toward the supporting protrusion 21. The depth of the strip mounting groove in the vertical direction is greater than the height of the strip protrusion 11. The contour of the strip mounting groove matches the contour of the strip protrusion 11. After the strip protrusion 11 is installed in the strip mounting groove, the outer wall of the strip protrusion 11 is close to the inner wall of the strip mounting groove, and the strip mounting groove can position the strip protrusion 11.

[0072] One embodiment of the present application, such as Figure 3 As shown, the test probe 3 is provided with a protruding structure 32, which protrudes toward the circumference. There is a gap 22 between the strip-shaped protrusion 11 and the inner side wall of the strip-shaped mounting groove facing the strip-shaped protrusion 11.

[0073] When the test probe 3 is installed in the mounting through hole 1 and the mounting through hole 2 which are arranged opposite each other, the protruding structure 32 is located in the gap 1 22 and protrudes outward from the mounting through hole 1 and the mounting through hole 2. The protruding structure 32 is facing one side of the strip protrusion 11 and stops at the strip protrusion 11. The protruding structure 32 is facing one side of the mounting seat 2 2 and stops at the inner side wall of the strip protrusion 11 with the strip mounting groove.

[0074] In this embodiment, if Figure 3 As shown, the test probe 3 in this embodiment is provided with a protruding structure 32. When the test probe 3 is installed in the mounting through hole 1 and the mounting through hole 2 which are arranged opposite each other, the protruding structure 32 is located in the gap 1 22 and protrudes out of the mounting through hole 1 and the mounting through hole 2 toward the periphery. The protruding structure 32 can limit the test probe 3 along the extension direction of the mounting through hole 1 and the mounting through hole 2, thereby facilitating the installation accuracy of the test probe 3 in the mounting through hole 1 and the mounting through hole 2, avoiding the test probe 3 from abutting against the connecting pin 82 and causing the test probe 3 to be displaced, thereby facilitating the improvement of the consistency and reliability of the abutment between the multiple test probes 3 and the connecting pin 82; in addition, it is beneficial to improve the positioning and installation accuracy of the test probe 3 along the extension direction of the mounting through hole 1 and the mounting through hole 2, improving the flatness of the end faces at both ends of the multiple test probes 3, improving the consistency and reliability of the abutment between the multiple test probes 3 and the multiple connecting pins 82 respectively, and avoiding the poor conductivity caused by the partial test probes 3 and the connecting pin 82 being suspended.

[0075] One embodiment of the present application, such as Figure 3 As shown, the raised structure 32 is a ring-shaped structure. The raised structure 32 forms a top-stopping plane one on the side facing the strip protrusion 11, and forms a top-stopping plane two on the side facing the strip mounting groove. The top-stopping plane one and the top-stopping plane two are stopped; the raised structure 32 forms a top-stopping plane three on the side facing the mounting seat 2 2, and forms a top-stopping plane four on the inner side wall of the strip mounting groove facing the strip protrusion 11. The top-stopping plane three and the top-stopping plane four are stopped.

[0076] In this embodiment, if Figure 3As shown, the raised structure 32 in this embodiment is annular. The raised structure 32 is abutted against the top stop planes 1 and 2 formed on one side of the strip-shaped protrusion 11. The raised structure 32 is also abutted against the top stop planes 3 and 4 formed on the other side of the mounting seat 2. This improves the consistency of the pressing of the raised structure 32 by the mounting seats 1 and 2, thereby improving the positioning and installation accuracy of the test probes 3 along the extension direction of the mounting holes 1 and 2, and further improving the flatness of the end faces of the multiple test probes 3. Furthermore, the raised structure 32 in this embodiment can also be configured in other structures.

[0077] In one embodiment of the present application, the materials of the mounting base 1 and the mounting base 2 2 are both electrically insulating materials.

[0078] In this embodiment, the materials of the mounting base 1 and the mounting base 2 2 in this embodiment are both electrically insulating materials, which is conducive to ensuring that the multiple test probes 3 installed in the mounting through hole 1 and the mounting through hole 2 are electrically insulated from each other, thereby improving the reliability of powering on and testing multiple electronic detonator control modules 8 through multiple pairs of test probes 3.

[0079] In another aspect of the present application, an electronic detonator control module testing device is provided for testing a plurality of electronic detonator control modules 8, wherein one end of each of the plurality of electronic detonator control modules 8 is connected to a pair of connecting pins 82, such as Figures 5 to 8 As shown, the electronic detonator control module test device includes:

[0080] The base 5 has a plurality of placement grooves 50 on its upper side for placing the electronic detonator control module 8;

[0081] A rotating pressure plate 6, one end of which is rotatably connected to one end of the base 5 and can rotate relative to the base 5 in the vertical direction, and the other end of the rotating pressure plate is a free end. The rotating pressure plate 6 rotates relative to the base 5 and has a pressing position and a pressing release position. When the rotating pressure plate 6 is in the pressing position, the rotating pressure plate 6 can press and limit the electronic detonator control module 8 placed in the placement groove 50; when the rotating pressure plate 6 is in the pressing release position, the rotating pressure plate 6 releases the pressure on the electronic detonator control module 8 placed in the placement groove 50;

[0082] The above-mentioned test probe mounting assembly, mounting base 1 and mounting base 2 2 are mounted on the rotating pressure plate 6;

[0083] The test probes 3 are provided with multiple pairs of connecting pins 82 corresponding to each other. The multiple pairs of test probes 3 are respectively installed in the mounting through hole 1 and the mounting through hole 2 arranged opposite to each other. One end of the test probe 3 is away from the mounting seat 1 and passes through the mounting through hole 2 to form a conductive connecting end 31. The other end of the test probe 3 is away from the mounting seat 2 and passes through the mounting through hole 1 to form a stop contact conductive end 30. The stop contact conductive end 30 is used to stop contact with a pair of connecting pins 82 on the electronic detonator control module 8 placed in the placement groove 50 to achieve conductive connection. When the rotating pressure plate 6 is in the pressing position, the stop contact conductive end 30 stops contact with the pair of connecting pins 82 on the electronic detonator control module 8 placed in the placement groove 50.

[0084] A test control circuit board 4 is provided on one side of the rotating pressure plate 6. A test control circuit is provided on the test control circuit board 4. Conductive connection ends 31 of the plurality of test probes 3 are respectively connected to the test control circuit board 4 and are conductively connected to the test control circuit board. The test control circuit board 4 rotates synchronously with the rotating pressure plate 6.

[0085] The locking mechanism 7 is mounted on the other end of the base 5 . The locking mechanism 7 is used to lock the rotating pressing plate 6 at the pressing position onto the base 5 .

[0086] In this embodiment, if Figures 5 to 8 As shown, the upper side of the base 5 in this embodiment is provided with a plurality of placement grooves 50 for placing the electronic detonator control modules 8, which is convenient for placing the plurality of electronic detonator control modules 8 in the plurality of placement grooves 50; further, the mounting seat 1 and the mounting seat 2 are installed on the rotating pressure plate 6, and the plurality of pairs of test probes 3 are respectively installed in the mounting through hole 1 and the mounting through hole 2 arranged opposite each other, and the conductive connection ends 31 of the plurality of test probes 3 are respectively connected and conductively connected to the test control circuit board 4, which is convenient for the test probes 3, the test control circuit board 4 and the rotating pressure plate 6 to move one circle. When the rotating pressure plate 6 is rotated to the clamping position, the stop-contact conductive ends 30 are stop-contacted with a pair of connecting pins 82 on the electronic detonator control module 8 placed in the placement grooves 50, which is convenient for quickly realizing the conductive connection of the plurality of pairs of test probes 3 with the plurality of pairs of connecting pins 82, which is beneficial to improving the efficiency of testing the electronic detonator control module 8; further, the electronic detonator control module testing device in this embodiment includes the above-mentioned test probe mounting assembly, which is beneficial to reducing the production and manufacturing cost of the electronic detonator control module testing device.

[0087] In this embodiment, if Figures 5 to 7As shown, a plurality of placement grooves 50 are provided in the middle of the base 5 in the left-right direction at intervals. The placement grooves 50 extend along the front-back direction of the base 5, and the bottom walls of the placement grooves 50 are arc-shaped. The outer side of the electronic detonator control module 8 in this embodiment is covered with a sealing body 83, and the lower side wall of the sealing body 83 is arc-shaped. The electronic detonator control module 8 is placed in the placement groove 50, and the lower side wall of the sealing body 83 is in abutment with the bottom wall of the placement groove 50. The bottom wall of the placement groove 50 provides support for the lower side wall of the sealing body 83 and limits the electronic detonator control module 8 in the left-right direction. Furthermore, the structure of the placement limit groove in this embodiment can be adaptively adjusted and designed into other structures according to the shape of the electronic detonator control module 8, so as to facilitate the placement of the electronic detonator control module 8.

[0088] In this embodiment, if Figures 5 to 7 As shown, the right end of the rotary pressure plate 6 in this embodiment is rotatably connected to the right end of the base 5, and the locking mechanism 7 is installed on the left end of the base 5. The locking mechanism 7 in this embodiment includes a mounting support seat 70, a rotating connecting arm 71, a bolt rod 72 and a rotating pressing arm 73. The mounting support seat 70 is provided with two pieces. The mounting support seat 70 is approximately L-shaped. The mounting support seat 70 includes a horizontal support plate and a vertical support plate. The horizontal support plate is fixed to the left side of the base 5 by a plurality of bolts 701 respectively. The bolts 701 and the upper side of the base 5 are arranged between each other. The elastic washer 702 is installed, and the left end of the rotating connecting arm 71 is rotatably installed between the two mounting support seats 70 through a rotating pin, and the rotating connecting arm 71 is rotatably installed on the top of the two mounting support seats 70. The right end of the rotating connecting arm 71 is connected to a support ring 711, and a mounting opening is formed in the support ring 711. The bolt rod 72 is vertically installed in the mounting opening of the support ring 711 through two support limit plates 722 and two fixing nuts 723. The lower end of the bolt rod 72 is connected to a clamping head 721, and the clamping head 721 is used to clamp the rotating pressure plate 6.

[0089] Further, such as Figures 5 to 7When the locking mechanism 7 needs to be released on the rotating pressure plate 6, the operating handle is driven to rotate left, so that the rotating connection block 712 pulls the rotating connection arm 71, thereby lifting the clamping head 721.

[0090] Furthermore, the material of the clamping head 721 in this embodiment is elastic material, which is beneficial for preventing loosening when the clamping head 721 clamps the rotating pressure plate 6, thereby improving the reliability and stability of the clamping head 721 clamping the rotating pressure plate 6; further, the locking mechanism 7 in this embodiment can also adopt other locking devices to facilitate the clamping of the rotating pressure plate 6 and the release of the clamping.

[0091] In this embodiment, if Figure 5 As shown, the rotating pressure plate 6 in this embodiment includes a clamping plate 60 and a mounting support plate 61. The clamping plate 60 is approximately a rectangular plate structure. The clamping plate 60 is provided with a strip opening 601 along its length direction. The strip opening 601 is provided on the clamping plate 60, which is beneficial to reducing the contact area between the clamping plate 60 and the front end of the electronic detonator control module 8 placed in the placement groove 50.

[0092] Further, such as Figure 5 and Figure 7 As shown, the mounting base 1 and the mounting base 2 2 in this embodiment are installed on the rotating pressure plate 6 by means of bolt 1 611 and bolt 2, and are specifically installed on the mounting support plate 61 of the rotating pressure plate 6; specifically, the mounting support plate 61 is provided with a mounting groove for passing the support protrusion 21, and the support protrusion 21 is installed in the mounting groove and protrudes upward; the mounting support plate 61 is respectively provided with a plurality of bolt holes 101 and a plurality of bolt holes four on the front and rear sides facing the supporting base plate 10, and the mounting base 1 is installed on the mounting support plate 61 by means of a plurality of bolts 1 611 passing through the bolt hole 101 and the bolt hole four, and the upper end of the bolt 1 611 is threadedly connected to the locking nut 1 612 and is locked by the locking nut 1 612.

[0093] Further, such as Figure 5 and Figure 7As shown, a bolt hole 2 102 is provided on the left and right ends of the mounting base 2 facing the supporting base plate 10, and a bolt hole 3 201 is provided. A bolt hole 5 is provided on the left and right ends of the mounting support plate 61 facing the bolt hole 3 201, respectively. The mounting base 2 2 is mounted on the mounting support plate 61 by bolt 2, and the bolt 2 passes through the bolt hole 2 102, the bolt hole 2 102 and the bolt hole 5 in sequence. The upper end of the bolt 2 is threadedly connected with a locking nut 2 613, which is locked by the locking nut 2 613.

[0094] In this embodiment, if Figure 5 and Figure 6 As shown, in order to improve the accuracy of the rotation of the rotating pressure plate 6 to the clamping position, a positioning protrusion 56 is provided on the rotation stop top surface 54 of the base 5, and a limiting groove is provided on the rotating pressure plate 6 opposite the positioning protrusion 56. The left and lower sides of the limiting groove are open. When the rotating pressure plate 6 rotates close to the clamping position, the positioning protrusion 56 can extend into the limiting groove and limit the rotating pressure plate 6, thereby improving the accuracy of the rotation of the rotating pressure plate 6 to the clamping position; further, in order to facilitate the fixation of the base 5 in this embodiment, a plurality of mounting holes 57 are provided on the base 5.

[0095] In this embodiment, if Figure 8 As shown, each pair of connecting pins 82 includes an anode pin and a cathode pin, each soldered to the rear end of the circuit substrate 80 and arranged in parallel. During testing of multiple electronic detonator control modules 8, the test control circuit board 4 is connected to the output of the test system to power on the electronic detonator control modules 8 and transmit test data via the test control circuit board 4. Furthermore, the test control circuitry provided on the test control circuit board 4 is not illustrated in this embodiment; its specific structure can be designed as needed and will not be described in detail here.

[0096] One embodiment of the present application, such as Figure 5 and Figure 8As shown, multiple electronic detonator control modules 8 respectively include a circuit substrate 80, multiple electronic components and a sealing body 83. One end of each circuit substrate 80 in the longitudinal direction is connected to a pair of connecting pins 82. Multiple electronic components are arranged on the circuit substrate 80. The sealing body 83 is wrapped around the periphery of the circuit substrate 80 and the multiple electronic components. One end of the circuit substrate 80 is connected to the pair of connecting pins 82 and the pair of connecting pins 82 are exposed on the outside of the sealing body 83. The end surface of the circuit substrate 80 to which the pair of connecting pins 82 are connected is connected to the connecting substrate 81. The connecting substrate 81 is connected to the end of the circuit substrate 80 to which the pair of connecting pins 82 are connected. A plurality of circuit substrates 80 are connected as one to form an electronic detonator control module. An avoidance storage groove 51 for avoiding the connection substrate 81 is provided on the base 5. The avoidance storage groove 51 is opposite to the side of the connection substrate 81 to form a top stop limit surface 531. The avoidance storage groove 51 is connected to the placement groove 50. When the electronic detonator control module 8 is placed in the placement groove 50, the circumferential side wall of the sealing body 83 fits and abuts against the inner side wall of the placement groove 50. The connection substrate 81 is stored in the avoidance storage groove 51 and the side of the connection substrate 81 facing the top stop limit surface 531 is stopped by the top stop limit surface 531.

[0097] In this embodiment, if Figure 5 、 Figure 7 and Figure 8 As shown, in this embodiment, multiple circuit substrates 80 are connected into one by a connecting substrate 81. An avoidance and storage groove 51 is provided on the base 5 for avoiding the connecting substrate 81. The avoidance and storage groove 51 is connected to the placement groove 50. When the electronic detonator control module 8 is placed in the placement groove 50, the circumferential side wall of the sealing body 83 fits and abuts against the inner side wall of the placement groove 50. The connecting substrate 81 is accommodated in the avoidance and storage groove 51 and the side of the connecting substrate 81 is opposite to the top limit surface 531 and is stopped by the top limit surface 531. Therefore, it is convenient to take and place multiple electronic detonator control modules 8 together, and it is beneficial to improve the reliability of fixing and limiting the multiple electronic detonator control modules 8.

[0098] One embodiment of the present application, such as Figure 5 、 Figure 7 and Figure 8 As shown, a plurality of adjustable stop screws 9 are threadedly connected at intervals on the base 5, and the plurality of adjustable stop screws 9 are located on one side of the avoidance and receiving groove 51 and are perpendicular to the stop limit surface 531. The screwed-in ends of the plurality of adjustable stop screws 9 can extend into the avoidance and receiving groove 51 to form a stop top surface. By screwing the plurality of adjustable stop screws 9, the distance between the stop top surface and the stop limit surface 531 can be adjusted. When the screwed-in ends of the plurality of adjustable stop screws 9 protrude from the stop limit surface 531 toward the avoidance and receiving groove 51 and are screwed in by the same distance, the side surface of the connection substrate 81 located in the avoidance and receiving groove 51 facing the stop top surface stops with the stop top surfaces of the plurality of adjustable stop screws 9.

[0099] In this embodiment, if Figure 5 、 Figure 7 and Figure 8 As shown, in this embodiment, multiple distance-adjusting stop screws 9 are threadedly connected to the base 5 at intervals, and the distance between the stop top surface and the stop limit surface 531 can be adjusted by screwing the multiple distance-adjusting stop screws 9. This is beneficial for adjusting the position of the connecting substrate 81 located in the avoidance storage groove 51, and is beneficial for the test probe 3 to stop at the appropriate position of a pair of connecting pins 82 connected to the circuit substrate 80, and is beneficial for the electronic detonator control module test device to be able to adapt to electronic detonator control modules of various specifications.

[0100] In this embodiment, if Figure 6 As shown, in this embodiment, a limiting protrusion 53 is provided at the rear end of the base 5, and the avoidance receiving groove 51 is provided in front of the limiting protrusion 53, and the front side surface of the limiting protrusion 53 forms a top stop limiting surface 531 that avoids the receiving groove 51.

[0101] Further, such as Figure 6 and Figure 7 As shown, in order to facilitate the arrangement of multiple adjustable top screws 9, in this embodiment, multiple mounting protrusions 532 are connected to the upper side of the limiting protrusion 53, and screw holes are respectively opened on the mounting protrusions 532. The screw holes pass through the mounting protrusions 532 horizontally in the front-to-back direction and are connected to the avoidance and receiving grooves 51, and the adjustable top screws 9 are threadedly connected in the screw holes; further, the front side of the mounting protrusion 532 in this embodiment is flush with the top limit surface 531; in addition, in this embodiment, there are two mounting protrusions 532 and two adjustable top screws 9, and the mounting protrusions 532 and the adjustable top screws 9 can also be adjusted as needed.

[0102] Further, such as Figure 6 As shown, in this embodiment, in order to lower the setting height position of the distance-adjusting top-stop screw 9, screw-in avoidance grooves 511 are opened on the lower bottom surface of the avoidance receiving groove 51 respectively opposite to the screw holes. When the screw-in end of the distance-adjusting top-stop screw 9 is screwed toward the avoidance receiving groove 51 and protrudes from the top-stop limit surface 531, the screw-in end of the distance-adjusting top-stop screw 9 can extend into the screw-in avoidance groove 511.

[0103] Further, such as Figure 6 As shown, in order to further fix the adjustable top screw 9 in this embodiment, a threaded through hole 5321 is vertically opened on the mounting protrusion 532, and the threaded through hole 5321 opened on the same mounting protrusion 532 is connected to the screw hole. A locking screw is threadedly connected to the threaded through hole 5321, and the adjustable top screw 9 can be further locked and fixed by the locking screw. The locking screw in this embodiment is not shown in the figure.

[0104] In this embodiment, a pre-breaking line is provided at the connection between the connecting substrate 81 and the circuit substrate 80, so that in a subsequent process, multiple electronic detonator control modules 8 can be broken and separated from the connecting substrate 81 along the pre-breaking line to obtain multiple independent electronic detonator control modules 8; in this embodiment, the connecting substrate 81 is connected to ten electronic detonator control modules 8 to form a group of electronic detonator control modules, and correspondingly, ten placement grooves 50 are provided on the base 5 in this embodiment.

[0105] In this embodiment, if Figure 8 As shown, each circuit substrate 80 in this embodiment serves as a control circuit board of an electronic detonator control module 8. The circuit substrate 80 is provided with a control circuit, an energy storage capacitor and a plurality of electronic components. The specific structure of the circuit substrate 80, the plurality of electronic components arranged on the circuit substrate 80 and the manner in which the plurality of components are connected to the circuit substrate 80 can all refer to the electronic detonator control module in the prior art and will not be described in detail here.

[0106] In this embodiment, if Figure 8 As shown, the front end of each circuit substrate 80 in the length direction is connected to an ignition assembly 84, and the rear end of each circuit substrate 80 in the length direction is connected to a pair of connecting pins 82. The outer periphery of each circuit substrate 80 is respectively wrapped with a sealing body 83, and the ignition assembly 84 and the pair of connecting pins 82 are respectively exposed on the outside of the sealing body 83. The circuit substrate 80, the multiple electronic components arranged on the circuit substrate 80, the ignition assembly 84 and the pair of connecting pins 82 together constitute an electronic detonator control module 8.

[0107] Further, such as Figure 8 As shown, the ignition component 84 in this embodiment is connected to the front end of the circuit substrate 80. The ignition component 84 includes a pair of conductive pins and an ignition resistor. The pair of conductive pins are welded to the welding pad provided at the front end of the circuit substrate 80. The ignition resistor is connected between the front ends of the pair of conductive pins. The ignition component 84 can also refer to the existing technology in this field; further, the sealing body 83 in this embodiment is formed by an injection molding process. The molding of the sealing body 83 can refer to the existing technology in this field and will not be described in detail here; in addition, the structure of the sealing body 83 can also be reasonably designed according to needs.

[0108] In this embodiment, the electronic detonator control module testing device of this embodiment is specifically used to perform an aging test on the electronic detonator control module 8, and can also be used to perform other functional tests on the electronic detonator control module 8. It should be noted that during the aging test of the electronic detonator control module 8 using the electronic detonator control module testing device of this embodiment, the related operations such as test control, screening out defective products, test data collection, test data transmission, and recording of defective products can be referenced to related aging test devices currently available in the art. The test control and related operations of the aging test are not the focus of this application and will not be described in detail here.

[0109] One embodiment of the present application, such as Figures 5 to 7 As shown, one end of the base 5 is connected to an upwardly protruding connection protrusion 55, one end of the rotating pressure plate is rotatably connected to the connection protrusion 55, and the other end of the base 5 is provided with a rotation stop surface 54 facing the connection protrusion 55. When the rotating pressure plate is in the pressing position, the free end of the rotating pressure plate is stopped by the rotation stop surface 54;

[0110] Placement limit ribs are formed between two adjacent placement grooves 50, and the upper sides of several placement limit ribs are connected with stop protrusions 52. The top surface of the stop protrusion 52 is flush with the rotating stop surface 54. When the free end of the rotating pressure plate stops with the rotating stop surface 54, the rotating pressure plate stops with the top surface of the stop protrusion 52.

[0111] In this embodiment, if Figures 5 to 7 As shown, in this embodiment, a stop protrusion 52 is connected to the upper side of several placement limit ribs, and the top surface of the stop protrusion 52 is flush with the rotating stop top surface 54. When the free end of the rotating pressure plate stops against the rotating stop top surface 54, the rotating pressure plate stops against the top surface of the stop protrusion 52, so that the stop protrusion 52 can limit the degree of squeezing of the electronic detonator control module 8 placed in the placement groove 50 by the rotating pressure plate 6, avoiding excessive squeezing of the electronic detonator control module 8 placed in the placement groove 50 by the rotating pressure plate 6 and causing damage to the electronic detonator control module 8, and is conducive to improving the consistency of the tightness of the rotating pressure plate 6 on multiple electronic detonator control modules 8.

[0112] In this embodiment, if Figure 5 and Figure 6As shown, in this embodiment, there are two connecting protrusions 55, which are connected to the right end of the base 5. The two connecting protrusions 55 are arranged opposite each other, and a rotation mounting groove is formed between the two connecting protrusions 55. The two connecting protrusions 55 are arranged opposite each other with an axis hole 1 551. The rotating pressure plate 6 in this embodiment includes a connected pressing plate 60 and a mounting support plate 61. The right end of the pressing plate 60 is connected to a connecting support protrusion 602. The middle part of the connecting support protrusion 602 is provided with an axis hole 2. The pressing plate 60 is rotatably connected between the two connecting protrusions 55 through a rotating connecting shaft 58, and the connecting support protrusion 602 is installed in the rotation mounting groove formed between the two connecting protrusions 55. The rotating connecting shaft 58 is provided with an axis hole 2 through the axis hole 1 551 and the middle part of the connecting support protrusion 602. Furthermore, the base 5 in this embodiment can also be set to other structures, and there can be multiple ways for the rotating pressure plate 6 to be rotatably mounted on the base 5.

[0113] In another aspect of the present application, an electronic detonator control module aging test system is provided, comprising:

[0114] Support frame;

[0115] The above-mentioned electronic detonator control module test device is provided with multiple electronic detonator control module test devices, and the multiple electronic detonator control module test devices are installed on the support frame at intervals;

[0116] A master control circuit board is provided on the master control circuit board, and the test control circuit provided on the test control circuit board 4 is electrically connected to the master control circuit provided on the master control circuit board;

[0117] The aging test box has an aging test cavity formed inside the aging test box, and the support frame is arranged in the aging test cavity.

[0118] In this embodiment, the electronic detonator control module aging test system in this embodiment includes the above-mentioned multiple electronic detonator control module test devices, which is conducive to installing multiple electronic detonator control module test devices on a support frame, and electrically connecting them with the test control circuits provided on multiple test control circuit boards 4 through a master control circuit, which is conducive to controlling multiple electronic detonator control module test devices through the master control circuit to perform aging tests, thereby improving the aging test efficiency of the electronic detonator control module 8.

[0119] In this embodiment, the burn-in test chamber is not shown. The structure of the burn-in test chamber can refer to or be improved upon existing burn-in test chambers, and will not be described in detail here. Furthermore, the other components of the burn-in test system can also refer to the burn-in test system of the electronic detonator control module in the prior art, and will not be described in detail here.

[0120] It should be noted that during the aging test of the electronic detonator control module 8 using the electronic detonator control module aging test system of this embodiment, the related operations such as test control, screening out defective products, test data collection, test data transmission, and recording of defective products can refer to the existing related aging test systems in the field. The test control and related operations of the aging test are not the focus of this application and will not be described in detail here. Furthermore, during the aging test of the electronic detonator control module 8 using the electronic detonator control module aging test system of this embodiment, the aging conditions such as aging voltage, aging temperature, and aging time can also refer to the existing technology in the field and will not be described in detail here.

[0121] Furthermore, the master control circuit provided on the master control circuit board is not illustrated in this embodiment, and the specific structure of the master control circuit can be designed as needed; in addition, the master control circuit is connected to the control unit in the aging test system through a control cable. It should be noted that the control unit in the aging test system can refer to the existing technology and will not be described in detail here.

[0122] It should be noted that during the aging test of the electronic detonator control module 8 using the electronic detonator control module aging test system of this embodiment, the related operations such as test control, screening out defective products, test data collection, test data transmission, and recording of defective products can refer to the existing related aging test systems in the field. The test control and related operations of the aging test are not the focus of this application and will not be described in detail here. Furthermore, during the aging test of the electronic detonator control module 8 using the electronic detonator control module aging test system of this embodiment, the aging conditions such as aging voltage, aging temperature, and aging time can also refer to the existing technology in the field and will not be described in detail here.

[0123] In this embodiment, the burn-in test box, support frame, and master control circuit board of the electronic detonator control module burn-in test system are not shown. The burn-in test box, support frame, and master control circuit board can have various structures. Furthermore, other components of the burn-in test system can also refer to the electronic detonator control module burn-in test system in the prior art and will not be described in detail here.

[0124] In addition, in addition to the technical solutions disclosed in this embodiment, for the multiple electronic components, energy storage capacitors, ignition components 84, electronic detonator control module 8, other parts of the electronic detonator control module aging test system and their working principles in the present invention, reference can be made to conventional technical solutions in this technical field. However, these conventional technical solutions are not the focus of the present invention and will not be described in detail herein.

[0125] In this utility model, the term "plurality" refers to two or more, unless otherwise specified. Terms such as "installed," "connected," "connected," and "fixed" should be interpreted broadly. For example, "connected" can mean fixed, removable, or integral; "connected" can mean directly or indirectly through an intermediary. Those skilled in the art will understand the specific meanings of these terms in this utility model based on specific circumstances.

[0126] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or unit referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, they cannot be understood as limitations on the present application.

[0127] Throughout this specification, terms such as "one embodiment," "some embodiments," and "specific embodiments" mean that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0128] The above are merely preferred embodiments of the present application and are not intended to limit the present application. Those skilled in the art will readily appreciate that various modifications and variations are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present application shall be included within the scope of protection of the present application.

Claims

1. A test probe mounting assembly for mounting multiple test probes, characterized in that: It includes: A mounting base 1, wherein a plurality of mounting through holes 1 for mounting test probes are provided on the mounting base 1 at intervals; The mounting seat 2 is connected to or abutted against the mounting seat 1, and the mounting seat 2 is provided with a plurality of mounting through holes 2 for mounting the test probes, each of which is spaced apart from the plurality of mounting through holes 1. The test probes can be mounted in the mounting through hole 1 and the mounting through hole 2 that are arranged opposite each other, and the two ends of the test probes mounted in the mounting through hole 1 and the mounting through hole 2 that are arranged opposite each other pass through the mounting through hole 1 and the mounting through hole 2 respectively.

2. The test probe mounting assembly according to claim 1, wherein: Also includes: There are multiple locking pieces, and the multiple locking pieces are used to lock and connect the second mounting seat with the first mounting seat.

3. The test probe mounting assembly according to claim 1, wherein: The mounting seat 1 is provided with a strip protrusion, and the mounting seat 2 is provided with a strip mounting groove facing the strip protrusion. The strip protrusion is installed in the strip mounting groove. A plurality of the mounting through holes 1 respectively pass through the strip protrusion in a straight line, and a plurality of the mounting through holes 2 respectively pass through the mounting seat 2 in a straight line and are connected with the strip mounting groove and the mounting through hole 1 arranged opposite.

4. The test probe mounting assembly according to claim 3, wherein: The test probe is provided with a protruding structure, the protruding structure protrudes toward the circumference, and a gap is formed between the strip-shaped protrusion and the inner side wall of the strip-shaped mounting groove facing the strip-shaped protrusion; When the test probe is installed in the mounting through hole 1 and the mounting through hole 2 which are arranged opposite each other, the protruding structure is located in the gap 1 and protrudes outward from the mounting through hole 1 and the mounting through hole 2. The protruding structure is opposite to one side of the strip protrusion and stops at the strip protrusion. The protruding structure is opposite to one side of the mounting seat 2 and stops at the inner side wall of the strip protrusion of the strip mounting groove.

5. The test probe mounting assembly according to claim 4, wherein: The raised structure is a ring-shaped structure, and the raised structure forms a top-stop plane one on the side facing the strip protrusion, and forms a top-stop plane two on the side facing the strip protrusion facing the strip mounting groove, and the top-stop plane one and the top-stop plane two are stopped; the raised structure forms a top-stop plane three on the side facing the mounting seat two, and forms a top-stop plane four on the inner side wall of the strip mounting groove facing the strip protrusion, and the top-stop plane three and the top-stop plane four are stopped.

6. The test probe mounting assembly according to any one of claims 1 to 5, characterized in that: The materials of the first mounting base and the second mounting base are both electrically insulating materials.

7. An electronic detonator control module testing device for testing multiple electronic detonator control modules, wherein each of the multiple electronic detonator control modules is connected to a pair of connecting pins at one end in the longitudinal direction, characterized in that: It includes: A base, wherein the upper side of the base is provided with a plurality of placement grooves for placing the electronic detonator control module; a rotating pressure plate, one end of which is rotatably connected to one end of the base and can rotate relative to the base in a vertical direction, the other end of which is a free end, and the rotating pressure plate rotates relative to the base to have a pressing position and a pressing release position, wherein when the rotating pressure plate is in the pressing position, the rotating pressure plate can press and limit the electronic detonator control module placed in the placement groove; and when the rotating pressure plate is in the pressing release position, the rotating pressure plate releases the pressing of the electronic detonator control module placed in the placement groove; The test probe mounting assembly according to any one of claims 1 to 6, wherein the first mounting seat and the second mounting seat are mounted on the rotating pressure plate; A test probe, wherein a plurality of pairs of the connecting pins are provided in a one-to-one correspondence, and the plurality of pairs of the test probes are respectively installed in the mounting through-hole 1 and the mounting through-hole 2 arranged opposite to each other, one end of the test probe is away from the mounting seat 1 and passes through the mounting through-hole 2 to form a conductive connection end, and the other end of the test probe is away from the mounting seat 2 and passes through the mounting through-hole 1 to form a stop contact conductive end, the stop contact conductive end is used to stop contact with a pair of the connecting pins on the electronic detonator control module placed in the placement groove to achieve conductive connection, and when the rotating pressure plate is in the pressing position, the stop contact conductive end is stop contact with the pair of the connecting pins on the electronic detonator control module placed in the placement groove; a test control circuit board, disposed on one side of the rotating pressure plate, the test control circuit board being provided with a test control circuit, the conductive connection ends of the plurality of test probes being respectively connected to the test control circuit board and conductively connected to the test control circuit, and the test control circuit board rotating synchronously with the rotating pressure plate; A locking mechanism is installed on the other end of the base, and the locking mechanism is used to lock the rotating pressure plate located at the pressing position on the base.

8. The electronic detonator control module testing device according to claim 7, characterized in that: The plurality of electronic detonator control modules respectively include a circuit substrate, a plurality of electronic components and a sealing body, one end of each circuit substrate in the longitudinal direction is respectively connected to a pair of connecting pins, a plurality of electronic components are arranged on the circuit substrate, the sealing body is wrapped around the periphery of the circuit substrate and the plurality of electronic components, the circuit substrate is connected to one end of a pair of connecting pins and a pair of connecting pins are exposed on the outside of the sealing body, the end surface of the circuit substrate to which one end of the pair of connecting pins is connected is connected to the connecting substrate, and the connecting substrate A plurality of circuit substrates are connected together to form an electronic detonator control module. The base is provided with an avoidance and storage groove for avoiding the connection substrate. The avoidance and storage groove forms a top stop limit surface facing the side of the connection substrate. The avoidance and storage groove is connected to the placement groove. When the electronic detonator control module is placed in the placement groove, the circumferential side wall of the sealing body fits and rests against the inner side wall of the placement groove. The connection substrate is stored in the avoidance and storage groove, and the side of the connection substrate facing the top stop limit surface is stopped by the top stop limit surface.

9. The electronic detonator control module testing device according to claim 8, characterized in that: The base is threaded with multiple adjustable stop screws at intervals, and the multiple adjustable stop screws are located on one side of the avoidance and receiving groove and are perpendicular to the stop limit surface. The screwing ends of the multiple adjustable stop screws can extend into the avoidance and receiving groove to form a stop top surface. By screwing the multiple adjustable stop screws, the spacing between the stop top surface and the stop top limit surface can be adjusted, and when the screwing ends of the multiple adjustable stop screws protrude from the stop top limit surface toward the avoidance and receiving groove and are screwed in by the same distance, the side surface of the connecting substrate located in the avoidance and receiving groove facing the stop top surface stops with the stop top surfaces of the multiple adjustable stop screws.

10. The electronic detonator control module testing device according to claim 7, characterized in that: An upwardly protruding connection protrusion is connected to one end of the base, one end of the rotating pressure plate is rotatably connected to the connection protrusion, and the other end of the base is provided with a rotation stop surface facing the connection protrusion, and when the rotating pressure plate is in the pressing position, the free end of the rotating pressure plate stops against the rotation stop surface; A placement limit rib is formed between two adjacent placement grooves, and a top stop protrusion is connected to the upper side of several of the placement limit ribs. The top surface of the top stop protrusion is flush with the rotation top stop surface. When the free end of the rotating pressure plate stops with the rotating top stop surface, the rotating pressure plate stops with the top surface of the top stop protrusion.

11. An electronic detonator control module aging test system, characterized in that: include: Support frame; The electronic detonator control module testing device according to any one of claims 7 to 10, wherein a plurality of electronic detonator control module testing devices are provided, and the plurality of electronic detonator control module testing devices are installed on the support frame at intervals; a main control circuit board, wherein the main control circuit board is provided with a main control circuit, and the test control circuit provided on the test control circuit board is electrically connected to the main control circuit provided on the main control circuit board; The aging test box has an aging test cavity formed inside the aging test box, and the support frame is arranged in the aging test cavity.

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