Multifunctional test equipment
By designing multifunctional testing equipment and integrating DC voltage and thermistor testing modules, the problem of inability to test simultaneously in the existing technology is solved, efficient parameter acquisition and system performance evaluation are achieved, and equipment investment costs are reduced.
Patent Information
- Application Number
- CN202422702030.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-06
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2034-11-06
AI Technical Summary
In the prior art, DC voltage testing and thermistor testing cannot be performed simultaneously, resulting in a prolonged test time and the correlation between parameters cannot be obtained, affecting system performance evaluation and optimization.
A multifunctional testing equipment is designed, integrating a DC voltage test module and a thermistor test module, and one-to-one tracking and traceability through a code scanning device, combining signal conditioning, measurement, data processing and display circuit board to achieve simultaneous testing.
It realizes the simultaneous DC voltage and thermistor test in the same equipment, saving testing time, improving production efficiency, and reducing equipment procurement costs.
Smart Images
Figure CN223259798U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of testing equipment, in particular to a multifunctional testing equipment. Background Art
[0002] VDC testing and NTC testing refer to DC voltage testing and thermistor temperature coefficient testing. Existing technologies require separate VDC and NTC testing, making it impossible to simultaneously obtain relevant data for both. This increases overall testing time. For example, when developing an electronic product that requires both DC voltage control and temperature monitoring, if integrated testing is not possible, VDC testing must be completed first, followed by NTC testing. This process may involve multiple device connections and parameter settings, significantly increasing testing cycles and delaying product development progress. Furthermore, the inability to integrate these tests means it's impossible to accurately obtain the corresponding relationship between VDC and NTC parameters at the same time. In some practical application scenarios, such as power management systems, where DC voltage and temperature interact to influence system performance, the lack of synchronized data hinders accurate assessment and optimization of overall system performance. For example, a change in DC voltage can cause changes in system temperature, which in turn affects the NTC resistance. Without the ability to simultaneously measure these changes, in-depth analysis of this interaction is difficult. Utility Model Content
[0003] In order to solve the above problems, the utility model provides a multifunctional testing device, including a code scanning device, a display device and a testing device electrically connected to each other, the code scanning device is used to continue scanning the barcode of the circuit board to be tested, so as to perform one-to-one tracking and tracing of the test results of the circuit board to be tested through the barcode, the testing device includes a DC voltage testing module and a thermistor testing module, the DC voltage testing module includes a signal conditioning circuit board, a measurement circuit board and a data processing and display circuit board electrically connected in sequence, a communication interface is integrated on the data processing and display circuit board, the data processing and display circuit board is connected to the display device via the communication interface, the thermistor testing module includes a temperature control module, a measurement module, a data processing module and a display and output module electrically connected in sequence, and the display and output module is connected to the display device.
[0004] Furthermore, a power interface is provided on the back of the test device, and the power interface is electrically connected to the DC voltage test module and the thermistor test module respectively.
[0005] Furthermore, a plurality of test point interfaces are provided at the front end of the test device, and the DC voltage test module and the thermistor test module inside the test point interfaces are electrically connected.
[0006] Furthermore, a temperature setting button is also provided at the front end of the testing device.
[0007] Furthermore, the signal conditioning circuit board is composed of a voltage divider circuit module and a filter circuit module.
[0008] Furthermore, the measurement circuit board includes an analog-to-digital conversion module, and the analog-to-digital conversion module is connected to an external DC power supply through a power interface.
[0009] Furthermore, the data processing and display circuit board includes a microcontroller, which is used to receive the digital signal output by the analog-to-digital conversion module and perform data processing.
[0010] Furthermore, the temperature control module includes a temperature setting submodule, a temperature regulation submodule and a temperature monitoring submodule. The temperature setting submodule is used to set the target test temperature, the temperature regulation submodule is used to receive the temperature setting value and actual temperature feedback, and the temperature monitoring submodule is used to measure the temperature around the target in real time.
[0011] Furthermore, the test module includes a voltage measurement submodule and a data acquisition submodule. The voltage measurement submodule is used to measure the voltage across the thermistor, and the data acquisition submodule is used to collect voltage and current data according to a set sampling frequency.
[0012] Furthermore, the data processing module includes a calculation submodule, a calibration submodule and a storage submodule. The calculation submodule is used to calculate the resistance value of the thermistor according to Ohm's law. The calibration submodule is used to calibrate the measurement data to compensate for deviations caused by circuit component errors, environmental factors, etc. The storage submodule is used to store the processed resistance-temperature data in a local storage device.
[0013] Compared with the prior art, the beneficial effects of the present invention are:
[0014] Compared with the existing technology, the present application can simultaneously perform DC voltage testing and thermistor testing in the same test system or equipment, without the need to use different instruments to measure the two parameters separately, avoiding frequent replacement of test equipment and reconnection of test lines, thereby greatly saving testing time. For example, on an electronic equipment production line, integrated testing can quickly detect the DC voltage characteristics and thermistor-related performance of the product, improving production efficiency. In addition, integrated testing only requires a set of comprehensive test equipment or systems, rather than purchasing DC voltage testing and thermistor testing instruments separately, reducing the purchase cost of equipment. For enterprises, especially those engaged in large-scale production or R&D, this can significantly reduce investment in test equipment. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.
[0016] Figure 1 It is the overall structural diagram of the utility model;
[0017] Figure 2 It is a structural schematic diagram of the testing device of the utility model;
[0018] Figure 3 A schematic structural diagram of the testing device of the utility model from another angle;
[0019] Figure 4 This is a module diagram of the DC voltage test module of the present utility model;
[0020] Figure 5 This is a module diagram of the thermistor test module of the present utility model.
[0021] The reference numerals and names in the figures are as follows:
[0022] Scanning device 10, display device 20, testing device 30, DC voltage testing module 100, thermistor testing module 200, signal conditioning circuit board 110, measurement circuit board 120, data processing and display circuit board 130, temperature control module 210, measurement module 220, data processing module 230, display and output module 240, power supply interface 31, test point interface 32, temperature setting button 33, voltage divider circuit module 111, filter circuit module 112, analog-to-digital conversion module 121, microcontroller 131, temperature setting submodule 211, temperature adjustment submodule 212, temperature monitoring submodule 213, voltage measurement submodule 221, data acquisition submodule 222, calculation submodule 231, calibration submodule 232, storage submodule 233, center point brightness detector 40. DETAILED DESCRIPTION
[0023] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0024] The preferred embodiments of the present invention will now be further described with reference to the accompanying drawings. Figures 1 to 5As shown, a multifunctional testing device includes a code scanning device 10, a display device 20 and a testing device 30 electrically connected to each other, the code scanning device 10 is used to continue scanning the barcode of the circuit board to be tested, so as to track and trace the test results of the circuit board to be tested one-to-one through the barcode, the testing device 30 includes a DC voltage testing module 100 and a thermistor testing module 200, the DC voltage testing module 100 includes a signal conditioning circuit board 110, a measurement circuit board 120 and a data processing and display circuit board 130 electrically connected in sequence, a communication interface is integrated on the data processing and display circuit board 130, the data processing and display circuit board 130 is connected to the display device 20 via the communication interface, the thermistor testing module 200 includes a temperature control module 210, a measurement module 220, a data processing module 230 and a display and output module 240 electrically connected in sequence, and the display and output module 240 is connected to the display device 20.
[0025] In the working state of this embodiment, the barcode of the circuit board under test is first scanned to ensure that the test structure is tracked and recorded. Then, after the circuit board under test is connected to an external DC power supply, the test points on the circuit board are electrically connected to the DC voltage test module 100. The signal conditioning circuit board 110 pre-processes the DC voltage under test, including voltage division and filtering, to meet the input requirements of the measurement module 220. The measurement circuit board 120 then converts the conditioned DC voltage signal into a digital signal for subsequent processing and display. Finally, the data processing and display circuit board 130 processes the measured digital signal, such as calculation and calibration, and displays the result to the customer via the display device 20. At the same time, the test points at both ends of the thermistor on the circuit board under test are connected to the temperature control module 210. The temperature control module 210 controls the temperature of the thermistor. The measurement module 220 then performs stable voltage measurement. Finally, the data processing module 230 and the display and output module 240 feed back the calculated result to the customer via the display device 20.
[0026] Compared with the existing technology, the present application can simultaneously perform DC voltage testing and thermistor testing in the same test system or equipment, without the need to use different instruments to measure the two parameters separately, avoiding frequent replacement of test equipment and reconnection of test lines, thereby greatly saving testing time. For example, on an electronic equipment production line, integrated testing can quickly detect the DC voltage characteristics and thermistor-related performance of the product, improving production efficiency. In addition, integrated testing only requires a set of comprehensive test equipment or systems, rather than purchasing DC voltage testing and thermistor testing instruments separately, reducing the purchase cost of equipment. For enterprises, especially those engaged in large-scale production or R&D, this can significantly reduce investment in test equipment.
[0027] On the basis of the above embodiment, Figure 3 As shown, a power interface 31 is provided on the back of the test device 30, and the power interface 31 is electrically connected to the DC voltage test module 100 and the thermistor test module 200 respectively. The power interface 31 is connected to an external DC voltage to provide the signal conditioning circuit board 110 with pre-processing of the DC voltage to be tested, including voltage division, filtering and other operations, and to provide the measurement module 220 with a stable current or voltage. In addition, a stable reference voltage is provided to the measurement circuit board 120.
[0028] On the basis of the above embodiment, Figure 2 As shown, a plurality of test point interfaces 32 are provided at the front end of the test device 30. The DC voltage test module 100 and the thermistor test module 200 are electrically connected inside the test point interface 32, and the outside is used to be electrically connected to each test point on the circuit board to be tested through a wire (not shown in the figure).
[0029] On the basis of the above embodiment, Figure 2 As shown, a temperature setting button 33 is further provided at the front end of the testing device 30 , and the temperature setting button 33 sets the target test temperature at both ends of the thermistor through the temperature control module 210 .
[0030] In some embodiments, as Figure 4 As shown, the signal conditioning circuit board 110 is composed of a voltage divider circuit module 111 and a filter circuit module 112. The voltage divider circuit module 111 is composed of two or more resistors, which proportionally reduce the high-amplitude DC voltage to a suitable measurement range. For example, if the voltage range to be measured is 0-100V, the output voltage can be divided by resistors of appropriate resistance values so that the output voltage is within a range suitable for measurement, such as 0-5V or 0-10V. The filter circuit module 112 uses capacitors and resistors to form a low-pass filter circuit to filter out high-frequency noise and interference signals. The choice of capacitance value is determined by the noise frequency to be filtered out. For example, for high-frequency noise (kHz-MHz range), a capacitor of several hundred picofarads to several microfarads can be selected.
[0031] In some embodiments, as Figure 4 As shown, the measurement circuit board 120 includes an analog-to-digital conversion module 121, which is connected to an external DC power supply via a power interface 31. The chip used in this module is selected based on the required measurement accuracy and speed. For example, for general accuracy requirements, an ADC with a 10-12-bit resolution can be used; for high-precision measurements, a chip with a 16-bit or higher resolution can be selected. The chip converts the analog voltage signal into a digital code and outputs it via the data bus.
[0032] In some embodiments, as Figure 4 As shown, the data processing and display circuit board 130 includes a microcontroller 131. The microcontroller 131 is used to receive the digital signal output by the analog-to-digital conversion module 121 and perform data processing, including calculating the actual DC voltage value based on the voltage division ratio and the reference voltage of the analog-to-digital conversion module 121, performing calibration operations to improve measurement accuracy, and storing and analyzing measurement data. Common microcontrollers 131 can be selected, such as Arduino, STM32, etc., and the results are then displayed on the display device 20.
[0033] In some embodiments, as Figure 5 As shown, the temperature control module 210 includes a temperature setting submodule 211, a temperature adjustment submodule 212 and a temperature monitoring submodule 213. The temperature setting submodule 211 is used to set the target test temperature. The set value range is determined according to the test requirements, such as -40°C to 125°C. The setting method can be set through the temperature setting button 33. The temperature adjustment submodule 212 is used to receive the temperature setting value and the actual temperature feedback, and adjust the temperature of the test environment by controlling the heating or cooling elements. The PID control algorithm can be used to achieve accurate and stable temperature regulation. The temperature monitoring submodule 213 is used to use a temperature sensor (such as a platinum resistance temperature sensor) to measure the temperature around the thermistor in real time, and convert the temperature signal into an electrical signal (such as a voltage signal).
[0034] In some embodiments, as Figure 5 As shown, the test module includes a voltage measurement submodule 221 and a data acquisition submodule 222. The voltage measurement submodule 221 is used to measure the voltage across the thermistor. A high-precision voltmeter or analog-to-digital converter can be used. The voltmeter accuracy can reach microvolts, and the ADC resolution can be selected according to the measurement accuracy requirements (such as 12-16 bits). If a constant voltage excitation mode is used, the current passing through the thermistor must also be measured. The current can be indirectly measured by measuring the voltage across a precision resistor connected in series with the thermistor. The data acquisition submodule 222 is used to collect voltage (and current) data according to a set sampling frequency. The sampling frequency can be adjusted according to the temperature change rate and measurement accuracy requirements, such as 10 to 1000 times per second. The collected data is transmitted to the data processing module 230.
[0035] In some embodiments, as Figure 5As shown, the data processing module 230 includes a calculation submodule 231, a calibration submodule 232, and a storage submodule 233. The calculation submodule 231 is used to calculate the resistance value of the thermistor according to Ohm's law and, combined with the temperature value obtained by the temperature monitoring module, generate a resistance-temperature data pair. The calibration submodule 232 is used to calibrate the measurement data to compensate for deviations caused by circuit component errors, environmental factors, etc. The calibration data can be pre-stored in the system, and the measurement results can be corrected using an algorithm. The storage submodule 233 stores the processed resistance-temperature data in a local storage device (such as memory, hard drive, SD card, etc.). The storage format can be tabular to facilitate subsequent viewing and analysis.
[0036] On the basis of the above embodiment, Figure 1 As shown, the center point brightness detector 40 is also included, and the center point brightness detector 40 is electrically connected to the display device 20. If the circuit board to be tested contains a display part, the center point brightness detector 40 is used to test the brightness of the display part and display the result on the display device 20.
[0037] The above exemplary embodiments are detailed, and the present invention may be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims rather than the foregoing description, and it is intended that all changes that come within the meaning and range of equivalents of the claims be included within the present invention.
Claims
1. A multifunctional testing device, characterized in that: The invention comprises a code scanning device (10), a display device (20) and a testing device (30) which are electrically connected to each other. The code scanning device (10) is used to continuously scan the barcode of the circuit board to be tested so as to track and trace the test result of the circuit board to be tested one-to-one through the barcode. The testing device (30) comprises a DC voltage testing module (100) and a thermistor testing module (200). The DC voltage testing module (100) comprises a signal conditioning circuit board (110), a measuring circuit board (120) and a data processing and display circuit board (130) which are electrically connected in sequence. A communication interface is integrated on the data processing and display circuit board (130). The data processing and display circuit board (130) is connected to the display device (20) via the communication interface. The thermistor testing module (200) comprises a temperature control module (210), a measuring module (220), a data processing module (230) and a display and output module (240) which are electrically connected in sequence. The display and output module (240) is connected to the display device (20).
2. The multifunctional testing device according to claim 1, characterized in that: A power interface (31) is provided on the back of the test device (30), and the power interface (31) is electrically connected to the DC voltage test module (100) and the thermistor test module (200) respectively.
3. The multifunctional testing device according to claim 2, characterized in that: A plurality of test point interfaces (32) are provided at the front end of the test device (30), and the inner sides of the test point interfaces (32) are electrically connected to a DC voltage test module (100) and a thermistor test module (200).
4. The multifunctional testing device according to claim 3, characterized in that: A temperature setting button (33) is also provided at the front end of the testing device (30).
5. The multifunctional testing device according to claim 4, characterized in that: The signal conditioning circuit board (110) is composed of a voltage divider circuit module (111) and a filter circuit module (112).
6. The multifunctional testing device according to claim 5, characterized in that: The measurement circuit board (120) comprises an analog-to-digital conversion module (121), and the analog-to-digital conversion module (121) is connected to an external DC power supply via a power interface (31).
7. The multifunctional testing device according to claim 6, characterized in that: The data processing and display circuit board (130) comprises a microcontroller (131), and the microcontroller (131) is used to perform data processing on the digital signal output by the analog-to-digital conversion module (121).
8. The multifunctional testing device according to claim 4, characterized in that: The temperature control module (210) comprises a temperature setting submodule (211), a temperature regulating submodule (212) and a temperature monitoring submodule (213); the temperature setting submodule (211) is used to set a target test temperature; the temperature regulating submodule (212) is used to receive a temperature setting value and actual temperature feedback; and the temperature monitoring submodule (213) is used to measure the temperature around the target in real time.
9. The multifunctional testing device according to claim 8, characterized in that: The test module comprises a voltage measurement submodule (221) and a data acquisition submodule (222), wherein the voltage measurement submodule (221) is used to measure the voltage across the thermistor, and the data acquisition submodule (222) is used to acquire voltage and current data according to a set sampling frequency.
10. The multifunctional testing device according to claim 9, characterized in that: The data processing module (230) comprises a calculation submodule (231), a calibration submodule (232) and a storage submodule (233); the calculation submodule (231) is used to calculate the resistance value of the thermistor according to Ohm's law; the calibration submodule (232) is used to calibrate the measurement data to compensate for deviations caused by circuit component errors or environmental factors; and the storage submodule (233) is used to store the processed resistance-temperature data in a local storage device.