High-temperature temperature control device for liquid large-angle X-ray scattering

Abstract

The utility model provides a high-temperature temperature control device for liquid large-angle X-ray scattering, the high-temperature temperature control device comprises an air source support, a hot air source, a sample fixer and a temperature sensor, the hot air source is installed on the air source support, the sample fixer is installed on the air source support and located in the blowing direction of the hot air source, and the temperature sensor is installed on the sample fixer. The temperature sensor is installed on the air source support and located in the blowing direction of the hot air source. The device is simple in overall equipment structure, convenient to carry and accurate in temperature control.

Description

Technical Field

[0001] The present application belongs to the technical field of temperature control equipment, and in particular, relates to a high-temperature temperature control device for large-angle X-ray scattering of liquids. Background Art

[0002] After a century of research, the long-range ordered periodic structure of crystals has reached theoretical and experimental maturity. However, the structure of the mother solution that nurtures these crystals has long been overlooked, becoming a blind spot in modern science. The mother solution structure is often inherited by its descendant crystals, determining the purity, size, and morphology of the precipitated crystals, which in turn influences the purity and particle size of the product. Certain discoveries about the mother solution structure may directly lead to the invention of advanced chemical process technologies. Many developed countries have designated solution structure research as a key research area for the 21st century, a cutting-edge topic with immense intellectual innovation value and broad application prospects. X-ray scattering of liquid structures is an important experimental method for directly obtaining structural information. It not only measures structural information such as bond lengths, coordination numbers, bond angles, and spatial configurations of the first coordination sphere, but also provides structural information beyond the first coordination sphere. Currently, the main wide-angle X-ray scattering experimental methods include flat-plate cell reflection and capillary transmission. Among them, the correction of the reflection and scattering data of the flat sample cell is simple. In order to solve the problem of temperature control, technicians in this field have developed corresponding equipment to realize the structural testing of high-temperature molten salts. However, the experimental data of the flat sample cell reflection method is easily affected by the liquid surface and the height of the liquid surface, and the data reproducibility is poor. In recent years, more research work has been carried out around the scattering of flat sample cells. At present, most experimental studies on solutions are carried out at room temperature. Due to imperfect temperature control conditions, there are not many reports on experimental studies using this method to study high-temperature molten salts. There are some studies using gas suspension combined with carbon dioxide laser heating. However, this method can achieve heating up to 2000℃, which is an important method for studying the melting of high-temperature alloys. The temperature control equipment of this method is complex and the temperature control accuracy is not high. It is not very practical for studying molten salt systems at hundreds of degrees Celsius. Utility Model Content

[0003] The technical problem solved by the present application is: how to provide a high-temperature temperature control device for large-angle X-ray scattering of liquids with a simpler structure and easier portability.

[0004] The present application provides a high-temperature temperature control device for large-angle X-ray scattering of liquid, the high-temperature temperature control device comprising:

[0005] Wind source bracket;

[0006] A hot air source, the hot air source being installed on the air source bracket;

[0007] A sample holder, the sample holder being mounted on the air source bracket and located in the blowing direction of the hot air source;

[0008] A temperature sensor is installed on the air source bracket and is located in the blowing direction of the hot air source.

[0009] Optionally, the wind source support includes:

[0010] a base, the base being used for mounting on a fixed platform;

[0011] A vertical plate, the bottom of which is connected to the base, and the hot air source is installed on the vertical plate;

[0012] A top plate is connected to the top of the vertical plate, one of the sample holder and the temperature sensor is mounted on the top plate and the other one is mounted on the vertical plate.

[0013] Optionally, the vertical plate is provided with a mounting hole, the air outlet of the hot air source is mounted on the mounting hole, and the mounting hole is located between the sample holder and the temperature sensor.

[0014] Optionally, the high temperature control device further includes:

[0015] A sensor holder is provided, the temperature sensor is mounted on the sensor holder, one of the sample holder and the sensor holder is mounted on the top plate and the other of the sample holder and the sensor holder is mounted on the vertical plate.

[0016] Optionally, the base is provided with a strip-shaped hole, and the strip-shaped hole is used for being installed on a fixed platform via a pin.

[0017] Optionally, the vertical plate is provided with a positioning hole, which passes through the mounting hole and the top of the vertical plate. The high-temperature temperature control device further includes a positioning member, which passes through the positioning hole and abuts against the air outlet of the hot air source.

[0018] Optionally, the high-temperature temperature control device also includes a hot air protective cover, which is detachably connected to the air source bracket, and the shell of the hot air protective cover is provided with a circulating water pipe, and the sample holder, the temperature sensor and the air outlet of the hot air source are located inside the hot air protective cover.

[0019] Optionally, the sample holder is provided with a plurality of fixed holes at intervals along the blowing direction, and the high-temperature temperature control device further comprises a sample carrier, which is arranged in the fixed holes and is used to carry the sample to be tested.

[0020] Optionally, the sensor holder is mounted on the vertical plate, the sensor holder is provided with a plurality of sensor holes, and the temperature sensors are provided in the sensor holes.

[0021] Optionally, the high-temperature temperature control device further includes a thermocouple relay, which is arranged at the sensor hole and connected to the switch of the hot air source.

[0022] The present application provides a high-temperature temperature control device for large-angle X-ray scattering of liquids, which has the following technical effects:

[0023] The overall equipment has a simple structure, is easy to carry, and has precise temperature control. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a schematic diagram of a high-temperature temperature control device for large-angle X-ray scattering of liquid according to one or more embodiments;

[0025] Figure 2 is a schematic diagram of a wind source bracket according to one or more embodiments;

[0026] Figure 3 is a schematic diagram of a sample holder according to one or more embodiments;

[0027] Figure 4 is a schematic diagram of a sensor holder according to one or more embodiments;

[0028] Figure 5 2 is another schematic diagram of a high-temperature temperature control device for large-angle X-ray scattering of liquid according to one or more embodiments.

[0029] The correspondence between the reference numerals and component names is as follows:

[0030] Air source bracket-10, base-11, vertical plate-12, top plate-13, mounting hole-14, positioning hole-15, strip hole-16, hot air protective cover-17, hot air source-20, sample holder-30, fixing hole-31, temperature sensor-40, positioning piece-50, sample carrier-60, sensor holder-70, sensor hole-71. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical solutions and advantages of this application more clearly understood, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0032] Before describing the various embodiments of the present application in detail, the technical concept of the present application will first be briefly described: Currently, the temperature control equipment used in large-angle X-ray scattering experiments has problems such as complex equipment, inconvenient portability, and low temperature control accuracy. To this end, the present application provides a high-temperature temperature control device for large-angle X-ray scattering of liquids. A hot air source, a sample holder, and a temperature sensor are installed on an air source bracket. The hot air source blows hot air in a specific direction to form a hot air range. The sample to be tested is fixed on the sample holder and placed within the hot air range. The temperature sensor is used to detect the temperature of the hot air in real time, ensuring accurate temperature control. The overall device structure is simple and easy to carry. The specific principles of the high-temperature temperature control device for large-angle X-ray scattering of liquids of the present application will be described below in conjunction with more embodiments.

[0033] Specifically, if Figure 1 As shown, the high-temperature temperature control device for large-angle X-ray scattering of liquids in this embodiment includes an air source bracket 10, a hot air source 20, a sample holder 30, and a temperature sensor 40. The hot air source 20 is mounted on the air source bracket 10, the sample holder 30 is mounted on the air source bracket 10 and is located in the blowing direction of the hot air source 20, and the temperature sensor 40 is mounted on the air source bracket 10 and is located in the blowing direction of the hot air source 20. For example, the hot air source 20 can be a heat gun with coarsely adjustable air volume and temperature, or a hot air blower with a preset temperature. The hot air source 20 can generate a stable hot air flow, which can be used to heat and maintain a constant temperature of the sample.

[0034] In one or more embodiments, Figure 2 As shown, the air source support 10 includes a base 11, a vertical plate 12, and a top plate 13. The base 11 is used to be mounted on the fixed platform 100. The bottom of the vertical plate 12 is connected to the base 11. The hot air source 20 is mounted on the vertical plate 12. The top plate 13 is connected to the top of the vertical plate 12. One of the sample holder 30 and the temperature sensor 40 is mounted on the top plate 13, and the other is mounted on the vertical plate 12. Exemplarily, the sample holder 30 and the temperature sensor 40 are both located on the side of the air source support 10 facing away from the hot air source 20, and are both located within the hot air range generated by the hot air source 20.

[0035] In one or more embodiments, the vertical plate 12 is provided with a mounting hole 14, and the air outlet 21 of the hot air source 20 is installed in the mounting hole 14. The mounting hole 14 is located between the sample holder 30 and the temperature sensor 40. Through the fixing effect of the mounting hole 14, the air outlet 21 of the hot air source 20 can be blown out along a specific direction to form a high temperature or constant temperature environment. Exemplarily, the vertical plate 12 is provided with a positioning hole 15, and the positioning hole 15 passes through the mounting hole 14 and the top of the vertical plate 12 in the vertical direction. The high-temperature temperature control device also includes a positioning member 50, which is passed through the positioning hole 15 and abuts against the air outlet 21 of the hot air source 20. After the air outlet 21 is passed through the mounting hole 14, the positioning member 50 is inserted into the positioning hole 15 to fix the air outlet 21. The positioning member 50 can be a screw, and the positioning hole 15 can be a threaded hole.

[0036] In one or more embodiments, the base 11 is provided with a strip-shaped hole 16 , which is used to be mounted on the fixed platform 100 via a pin. The strip-shaped hole 16 facilitates the movement of the base 11 to adjust the position of the base 11 .

[0037] In one or more embodiments, Figure 3 As shown, the sample holder 30 is provided with a number of fixed holes 31 spaced apart along the blowing direction, and the high-temperature temperature control device further comprises a sample carrier 60, which is arranged in the fixed hole 31. The sample carrier 60 is used to carry the sample to be tested. The distance of the fixed hole 31 is set according to the layout of the X-ray scattering light path. In order to meet the requirements of most usage scenarios, it is necessary to ensure that when the scattering angle is greater than 80°, there is no obstruction to the X-rays, and the sample to be tested is fixed within the hot air range. By providing a plurality of fixed holes 31 at different positions of the sample holder 30, it is convenient to fix the sample to be tested at different positions according to the constant temperature requirements while meeting the diffraction light path. The sample carrier 60 can be a thin-walled capillary, and the liquid or powder sample can be sealed in the thin-walled capillary and fixed in the sample holder 30 using the high-temperature glue sample carrier 60.

[0038] In one or more embodiments, the high-temperature temperature control device further includes a sensor holder 70, the temperature sensor 40 is mounted on the sensor holder 70, one of the sample holder 30 and the sensor holder 70 is mounted on the top plate 13, and the other is mounted on the vertical plate 12. Exemplarily, the sensor holder 70 is located below the sample holder 30, that is, the sensor holder 70 is mounted on the vertical plate 12, and the sample holder 30 is mounted on the top plate 13.

[0039] For example, Figure 4As shown, the sensor holder 70 is provided with a plurality of sensor holes 71, and the temperature sensor 40 is disposed in the sensor hole 71. The high temperature control device also includes a thermocouple relay, which is disposed in the sensor hole and is connected to the switch of the hot air source 20, and is used to control the switch of the hot air source 20.

[0040] In one or more embodiments, the high-temperature temperature control device further includes a hot air hood, which is detachably connected to the air source bracket 10. A circulating water pipe is provided within the housing of the hot air hood, and the sample holder 30, temperature sensor 40, and air outlet 21 of the hot air source 20 are located within the hot air hood. To prevent the hot air from affecting other equipment in the vicinity of the usage scenario, the hot air hood confines the hot air within the protective cover. The hot air hood is cooled by the input of circulating water, effectively reducing the impact of the hot air. The opening of the hot air hood must ensure that there is no obstruction to X-rays while ensuring a scattering angle greater than 80°.

[0041] In another embodiment, Figure 5 As shown, the air source bracket 10 includes a base 11 and a hot air protective cover 17. The hot air protective cover 17 is connected to the base 11. The air outlet 21 of the hot air source 20 is passed through and fixed to the hot air protective cover 17. The sample holder 30 is installed on the top wall of the hot air protective cover 17. The temperature sensor 40 is installed on the top wall of the hot air protective cover 17. The hot air protective cover 17 can confine the hot air generated by the hot air source 20 within the cover to avoid affecting the surrounding environment and equipment.

[0042] In order to verify the performance of the high-temperature temperature control device for large-angle X-ray scattering of liquids in this embodiment, a static temperature control performance test was performed: the sample to be tested was fixed on the sample carrier 60, and the temperature was set to about 56°C on the hot air gun. After about 2 minutes of constant temperature, the temperature of the sample to be tested was stabilized at 50±0.2°C; the temperature on the hot air gun was continued to be set to 112°C, and the temperature of the sample to be tested was stabilized at 100±0.5°C after about 3 minutes; the sample to be tested and the temperature sensor 40 were placed in a hole close to the air outlet 21, and the temperature on the hot air gun was set to 324°C, and the temperature was stabilized at 300±1.0°C; finally, the temperature on the hot air gun was set to 543°C, and after the sample passed through for about 4 minutes, the temperature was stabilized at 500±1.5°C.

[0043] The high-temperature temperature control device for large-angle X-ray scattering of liquid provided in this embodiment has the following technical effects:

[0044] 1. The high temperature control device has a fast heating speed. In the range of room temperature + 5℃ to 500℃, it can control the temperature within the preset temperature range within 3 to 5 minutes.

[0045] 2. Compared with the flat sample cell reflection method, the sample of this embodiment is encapsulated in a sample carrier, which effectively avoids the influence of the external environment and the test results are very reproducible.

[0046] 3. The high temperature control device has accurate temperature control and can achieve accurate temperature control of about ±1°C in the full temperature range of room temperature + 5°C to 500°C (selecting a higher quality hot air gun air source can achieve better temperature control effect).

[0047] 4. The high temperature control device is light in weight and small in size. The whole device (including the hot air gun) weighs about 2 kilograms. It is very easy to carry and easy to install and debug.

[0048] The above describes in detail the specific implementation methods of the present application. Although some embodiments have been shown and described, those skilled in the art should understand that these embodiments can be modified and improved without departing from the principles and spirit of the present application, the scope of which is defined by the claims and their equivalents. These modifications and improvements should also be within the scope of protection of the present application.

Claims

1. A high temperature control device for liquid large angle X-ray scattering, characterized in that: The high temperature control device comprises: Wind source bracket; A hot air source, the hot air source being installed on the air source bracket; A sample holder, the sample holder being mounted on the air source bracket and located in the blowing direction of the hot air source; A temperature sensor is installed on the air source bracket and is located in the blowing direction of the hot air source.

2. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 1, wherein the wind source support comprises: a base, the base being used for mounting on a fixed platform; A vertical plate, the bottom of which is connected to the base, and the hot air source is installed on the vertical plate; A top plate is connected to the top of the vertical plate, one of the sample holder and the temperature sensor is mounted on the top plate and the other one is mounted on the vertical plate.

3. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 2, characterized in that: The vertical plate is provided with a mounting hole, the air outlet of the hot air source is mounted on the mounting hole, and the mounting hole is located between the sample holder and the temperature sensor.

4. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 2, characterized in that: The high temperature control device further comprises: A sensor holder is provided, the temperature sensor is mounted on the sensor holder, one of the sample holder and the sensor holder is mounted on the top plate and the other of the sample holder and the sensor holder is mounted on the vertical plate.

5. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 2, characterized in that: The base is provided with a strip-shaped hole, and the strip-shaped hole is used for being installed on a fixed platform through a pin.

6. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 3, characterized in that: The vertical plate is provided with a positioning hole, which passes through the mounting hole and the top of the vertical plate. The high-temperature temperature control device also includes a positioning member, which passes through the positioning hole and abuts against the air outlet of the hot air source.

7. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 3, characterized in that: The high-temperature temperature control device also includes a hot air protective cover, which is detachably connected to the air source bracket, and the shell of the hot air protective cover is provided with a circulating water pipe, and the sample holder, the temperature sensor and the air outlet of the hot air source are located inside the hot air protective cover.

8. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 3, characterized in that: The sample holder is provided with a plurality of fixed holes at intervals along the blowing direction. The high temperature control device further comprises a sample carrier, which is arranged at the fixed holes and is used to carry the sample to be tested.

9. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 4, characterized in that: The sensor holder is installed on the vertical plate. The sensor holder is provided with a plurality of sensor holes, and the temperature sensors are arranged in the sensor holes.

10. The high-temperature temperature control device for liquid large-angle X-ray scattering according to claim 9, characterized in that: The high-temperature temperature control device further includes a thermocouple relay, which is arranged at the sensor hole and connected to the switch of the hot air source.

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