Flash memory chip test board

Abstract

The utility model provides a flash memory chip test board, and relates to the technical field of chip test. The flash memory chip test board comprises a test substrate, a socket is arranged on the front side of the test substrate, and a test seat is arranged in the middle of the test substrate; a groove is formed in the middle of the testing seat, a plurality of mounting groove contacts are arranged on two sides of the testing seat, a fixing frame is fixed on the rear side of the testing substrate, a connecting structure is arranged on the fixing frame, and an adjusting plate and a pressing frame are arranged on the connecting structure; the connecting structure can drive the adjusting plate and the pressing frame to slide in the depth direction of the groove so as to adjust different pressures for clamping. According to the flash memory chip test board, the lead screw is rotated manually to perform rotation operation, the adjustable clamping effect is achieved, the effect of improving the practicability of the chip test board is achieved, the movable frame is pulled manually to perform movement operation, the effect of conveniently taking materials is achieved, and the effect of improving the use convenience of the chip test board is achieved.

Description

Technical Field

[0001] The utility model relates to a flash memory chip testing board, belonging to the technical field of chip testing. Background Art

[0002] Flash memory chips are long-life, non-volatile memory chips. Since they can still save data when power is off, flash memory is often used to save setting information, such as in computer BIOS, PDAs, digital cameras, etc., and are widely used. In the production of flash memory chips, after the flash memory chips are manufactured, they need to be quality tested using chip test boards to ensure the yield rate before leaving the factory.

[0003] The comparison patent document announcement number is: "CN220439250U is a high-efficiency test board for flash memory chips, including a circuit board; a test socket is installed on the top of the circuit board, and two groups of movable conductive contacts are installed inside the test socket, and the number of movable conductive contacts is equal to the number of pins of the flash memory chip; two groups of elastic conductive parts are installed inside the test socket, and the number of elastic conductive parts is equal to the number of movable conductive contacts, and the elastic conductive parts are connected to the movable conductive contacts, one end of the elastic conductive part extends to the outside of the test socket, and the elastic conductive part is connected to the circuit board; a support frame is installed on the top of the circuit board."

[0004] The above patent still has the following problems in actual use: although the patent can be used for daily chip testing operations, in actual use, since the height of the support frame is relatively fixed, the spring connected to it has inconsistent pressing strength for chips of different thicknesses. When encountering thicker chips, the spring drives the clamping frame to press the chip with greater strength, which can easily damage the chip. It is inconvenient to adjust the pressing strength of the spring accordingly, which limits the use of the chip test board. After the test is completed, since the pins are inserted into the conductive contacts, there is a certain resistance when removing them, which brings inconvenience to the staff and makes the chip test board less convenient to use. Utility Model Content

[0005] (1) Technical problems solved

[0006] The utility model provides a flash memory chip test board to solve the problems in the prior art of limitations in the use of chip test boards and the lack of convenience in use of the chip test boards.

[0007] (2) Technical solution

[0008] The utility model is realized by the following technical solutions: a flash memory chip test board comprises a test substrate, a socket is provided on the front side of the test substrate, and a test seat is provided in the middle of the test substrate;

[0009] A groove is provided in the middle of the test seat, and a number of mounting slot contacts are provided on both sides of the test seat. A fixing frame is fixed to the rear side of the test substrate, and a connecting structure is provided on the fixing frame, and an adjustment plate and a pressing frame are provided on the connecting structure; the connecting structure can slide with the adjustment plate and the pressing frame in the direction of the groove depth to adjust different pressures for clamping.

[0010] Preferably, the connecting structure includes a screw rod, the outer surface of the screw rod is threadedly connected to an adjustment plate, the other end of the adjustment plate is slidably connected to a limit rod, the middle part of the adjustment plate is slidably connected to a movable frame, the lower end of the movable frame is fixed with a pressing frame, and the upper end of the pressing frame is fixed with a spring.

[0011] Preferably, the outer surface of the screw rod is rotatably connected to one side of the upper end of the fixing frame, the upper end of the limit rod is fixed to the other side of the upper end of the fixing frame, the vertical section of the limit rod is T-shaped, the outer surface of the screw rod is threadedly connected to one side of the adjustment plate, and the outer surface of the limit rod is slidably connected to the other side of the adjustment plate.

[0012] Preferably, the outer surface of the movable frame is slidably connected to the middle part of the adjustment plate, the outer surface of the movable frame is slidably connected to the middle part of the upper end of the fixed frame, the middle part of the upper end of the pressing frame is fixed to the lower end of the movable frame, the outer surface of the pressing frame is in contact with the inner wall of the groove, one end of the spring is fixed to the upper end of the pressing frame, and the other end of the spring is fixed to the lower end of the adjustment plate.

[0013] Preferably, a sliding groove is provided in the middle of the test seat, and a sliding frame is slidably connected to the inner wall of the sliding groove.

[0014] Preferably, the slide groove runs through the middle of the test seat, the outer surface of the sliding frame is slidably connected to the inner wall of the slide groove, the inner wall of the sliding frame is slidably connected to the outer surface of the test seat, and the outer surface of the sliding frame is in contact with the outer surface of the pressing frame.

[0015] Preferably, four corners of the test substrate are provided with reserved holes, and each of the reserved holes passes through a corner of the test substrate.

[0016] The utility model provides a flash memory chip test board, which has the following beneficial effects:

[0017] (1) The flash memory chip test board is rotated by manually turning the screw, so that the fixed frame, screw, adjustment plate, limit rod, movable frame, pressing frame and spring work together to achieve an adjustable clamping effect. The corresponding adjustment operation can be performed according to the chips of different thicknesses to ensure that the chips are clamped and protected at the same time, thereby achieving the effect of improving the practicality of the chip test board.

[0018] (2) The flash memory chip test board is moved by manually pulling the mobile frame, so that the mobile frame, adjustment plate, spring, sliding frame, and slide groove work together to achieve the effect of convenient material retrieval, providing convenient prerequisites for the staff's material retrieval operation, thereby achieving the effect of improving the convenience of using the chip test board. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a three-dimensional diagram of the utility model;

[0020] Figure 2 This is a cross-sectional view of the pressing frame of the present utility model;

[0021] Figure 3 This is a schematic diagram of the fixing frame structure of the utility model;

[0022] Figure 4 This is a structural diagram of the test socket of the present utility model.

[0023]

Main component symbol description

[0024] 1. Test substrate; 2. Socket; 3. Test seat; 4. Groove; 5. Mounting slot contact; 6. Fixing bracket; 7. Screw; 8. Adjustment plate; 9. Limit rod; 10. Moving bracket; 11. Pressing bracket; 12. Spring; 13. Slide groove; 14. Sliding bracket; 15. Reserved hole. DETAILED DESCRIPTION

[0025] An embodiment of the utility model provides a flash memory chip testing board.

[0026] See also Figure 1 、 Figure 2 、 Figure 3 and Figure 4, including a test substrate 1, the test substrate 1 is a test circuit board, the front side of the test substrate 1 is provided with a socket 2, the socket 2 is used to connect the test instrument, the middle of the test substrate 1 is provided with a test seat 3, the test seat 3 is used to place the chip; the middle of the test seat 3 is provided with a groove 4, and a number of mounting slot contacts 5 are provided on both sides of the test seat 3, the mounting slot contacts 5 are connected to the power supply for testing, the rear side of the test substrate 1 is fixed with a fixing frame 6, and a connecting structure is provided on the fixing frame 6, and the connecting structure includes a screw rod 7, the outer surface of the screw rod 7 is threadedly connected to an adjustment plate 8, and the other end of the adjustment plate 8 is slidably connected The limiting rod 9 is connected, and the middle part of the adjusting plate 8 is slidably connected to a moving frame 10. A pressing frame 11 is fixed to the lower end of the moving frame 10, and a spring 12 is fixed to the upper end of the pressing frame 11. The screw rod 7 is rotated by manpower to rotate, and the rotating screw rod 7 drives the adjusting plate 8 to move its position under the limit of the limiting rod 9. The moving adjusting plate 8 changes the pressing height of the spring 12, thereby changing the pressing strength of the spring 12. The corresponding adjustment operation can be performed according to the actual thickness of the chip, so that the chip test board can be suitable for chips of different thicknesses, thereby achieving the effect of improving the practicality and versatility of the chip test board.

[0027] Please refer again Figure 1 、 Figure 2 、 Figure 3 and Figure 4 It is worth mentioning that the outer surface of the screw rod 7 is rotatably connected to one side of the upper end of the fixed frame 6, the upper end of the limit rod 9 is fixed to the other side of the upper end of the fixed frame 6, the vertical section of the limit rod 9 is T-shaped, the outer surface of the screw rod 7 is threadedly connected to one side of the adjusting plate 8, the outer surface of the limit rod 9 is slidingly connected to the other side of the adjusting plate 8, the outer surface of the movable frame 10 is slidingly connected to the middle part of the adjusting plate 8, the outer surface of the movable frame 10 is slidingly connected to the middle part of the upper end of the fixed frame 6, the middle part of the upper end of the pressing frame 11 is fixed to the lower end of the movable frame 10, the outer surface of the pressing frame 11 is in contact with the inner wall of the groove 4, one end of the spring 12 is fixed to the upper end of the pressing frame 11, and the other end of the spring 12 is fixed to the lower end of the adjusting plate 8.

[0028] Please refer again Figure 1 、 Figure 2 、 Figure 3 and Figure 4 It is worth mentioning that a slide groove 13 is provided in the middle of the test seat 3, and a sliding frame 14 is slidably connected to the inner wall of the slide groove 13. The slide groove 13 runs through the middle of the test seat 3, and the outer surface of the sliding frame 14 is slidably connected to the inner wall of the slide groove 13. The inner wall of the sliding frame 14 is slidably connected to the outer surface of the test seat 3. The outer surface of the sliding frame 14 is in contact with the outer surface of the pressing frame 11. The moving pressing frame 11 can drive the sliding frame 14 to move. The moving sliding frame 14 can drive the chip to rise, which is convenient for the staff to take the tested chip and provides convenience for the staff to use.

[0029] When the utility model is in use: first, the screw rod 7 is rotated by manpower to perform a rotating operation, so that the adjusting plate 8 threadedly connected to the outer surface of the screw rod 7 can slide under the limit of the limit rod 9. The sliding adjusting plate 8 can pressurize or depressurize the spring 12 fixed at the lower end. When the adjusting plate 8 is at the lowest point, the pressing force on the spring 12 is the largest. At this time, the staff pulling the movable frame 10 to move the operation is also the largest. At this time, some thinner chips can be placed on the test seat 3 for pressing and stabilizing operations. When the adjusting plate 8 is at the highest point, the pressing force on the spring 12 is the smallest. At this time, the staff pulling the movable frame 10 to move the operation is also the smallest. At this time, some thicker chips can be placed on the test seat 3 for pressing and stabilizing operations, completing the adjustable clamping effect, which can be adjusted according to the different thicknesses. The chip is adjusted accordingly to ensure that the chip is clamped and protected at the same time, thereby achieving the effect of improving the practicality of the chip test board. Subsequently, the mobile frame 10 is pulled by manpower to move, so that the pressing frame 11 fixed to the mobile frame 10 can move. The mobile pressing frame 11 can compress the connected spring 12, so that the pressing frame 11 obtains compression space. In the process of the pressing frame 11 with the compression space moving upward, it will drive the sliding frame 14 in contact with it to move upward under the limit of the slide groove 13. The upward sliding frame 14 lifts the chip placed on the test seat 3. The lifted chip is convenient for the staff to pick up, completing the effect of convenient material retrieval, providing convenient prerequisites for the staff's material retrieval operation, thereby achieving the effect of improving the convenience of using the chip test board.

[0030] Working principle: The screw rod 7 is rotated by manpower, so that the screw rod 7 drives the adjustment plate 8 to move, realizing the effect of adjustable clamping. The corresponding adjustment operation can be performed according to the chips of different thicknesses to ensure that the chip is clamped while protecting the chip, thereby achieving the effect of improving the practicality of the chip test board. Subsequently, the mobile frame 10 is pulled by manpower to move, so that the pressing frame 11 fixed to the mobile frame 10 drives the sliding frame 14 to move, realizing the effect of convenient material collection, providing convenient prerequisites for the staff's material collection operation, thereby achieving the effect of improving the convenience of using the chip test board.

[0031] Please refer again Figure 1 、 Figure 2 、 Figure 3 and Figure 4 It is worth mentioning that there are reserved holes 15 at the four corners of the test substrate 1. Each reserved hole 15 runs through a corner of the test substrate 1. The reserved holes 15 make it convenient for the staff to use fasteners such as bolts to install the test substrate 1 on the test platform, thereby effectively improving the stability of the chip test board.

[0032] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. A flash memory chip test board, comprising a test substrate (1), characterized in that: A socket (2) is provided on the front side of the test substrate (1), and a test seat (3) is provided in the middle of the test substrate (1); A groove (4) is provided in the middle of the test seat (3), and a plurality of mounting groove contacts (5) are provided on both sides of the test seat (3). A fixing frame (6) is fixed to the rear side of the test substrate (1), and a connecting structure is provided on the fixing frame (6), and an adjusting plate (8) and a pressing frame (11) are provided on the connecting structure; the connecting structure can slide with the adjusting plate (8) and the pressing frame (11) in the depth direction of the groove (4) to adjust different pressures for clamping.

2. The flash memory chip testing board according to claim 1, wherein: The connection structure comprises a screw rod (7), the outer surface of the screw rod (7) is threadedly connected to an adjustment plate (8), the other end of the adjustment plate (8) is slidably connected to a limit rod (9), the middle part of the adjustment plate (8) is slidably connected to a moving frame (10), the lower end of the moving frame (10) is fixed with a pressing frame (11), and the upper end of the pressing frame (11) is fixed with a spring (12).

3. The flash memory chip testing board according to claim 2, wherein: The outer surface of the screw rod (7) is rotatably connected to one side of the upper end of the fixing frame (6), the upper end of the limiting rod (9) is fixed to the other side of the upper end of the fixing frame (6), the vertical section of the limiting rod (9) is T-shaped, the outer surface of the screw rod (7) is threadedly connected to one side of the adjustment plate (8), and the outer surface of the limiting rod (9) is slidably connected to the other side of the adjustment plate (8).

4. The flash memory chip testing board according to claim 2, wherein: The outer surface of the movable frame (10) is slidably connected to the middle of the adjustment plate (8), the outer surface of the movable frame (10) is slidably connected to the middle of the upper end of the fixed frame (6), the middle of the upper end of the pressing frame (11) is fixed to the lower end of the movable frame (10), the outer surface of the pressing frame (11) is in contact with the inner wall of the groove (4), one end of the spring (12) is fixed to the upper end of the pressing frame (11), and the other end of the spring (12) is fixed to the lower end of the adjustment plate (8).

5. The flash memory chip testing board according to claim 1, wherein: A sliding groove (13) is provided in the middle of the test seat (3), and a sliding frame (14) is slidably connected to the inner wall of the sliding groove (13).

6. The flash memory chip testing board according to claim 5, wherein: The slide groove (13) passes through the middle of the test seat (3), the outer surface of the sliding frame (14) is slidably connected to the inner wall of the slide groove (13), the inner wall of the sliding frame (14) is slidably connected to the outer surface of the test seat (3), and the outer surface of the sliding frame (14) is in contact with the outer surface of the pressing frame (11).

7. The flash memory chip testing board according to claim 1, wherein: The four corners of the test substrate (1) are each provided with a reserved hole (15), and each of the reserved holes (15) passes through a corner of the test substrate (1).

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