Novel module VCM service life test hardware device

Abstract

The utility model discloses a novel module VCM service life test hardware device, which comprises a test box and a control box, a plurality of groups of mounting hole sites are arranged in the side surface of the test box, VCM modules are mounted in the mounting hole sites, and a memory is arranged in the center of the test box; according to the novel module VCM service life testing hardware device, testing can be automated, all items are compatible, the storage can store the current testing frequency when power failure occurs abnormally and testing fails, the follow-up multiple testing risks are reduced, in addition, when a VCM is installed, the backboard is fixed by clamping an elastic block into a clamping groove, and the testing efficiency is improved. The test box is in an open state to facilitate rapid installation, and the overall test efficiency is improved.

Description

Technical Field

[0001] The utility model belongs to the field of camera technology, and in particular relates to a novel module VCM life test hardware device. Background Art

[0002] VCM is a highly applicable structural electronic component in the camera industry. It is mainly used to change the lens position to obtain clear images at both near and far distances. The driver chip controls the stretching position of the spring by changing the DC current in the coil of the motor, thereby driving the up and down movement of the voice coil. The VCM life test system uses a single-chip microcontroller to repeatedly send commands to the camera module, simulating the camera's long and short range photography. It can verify the mechanical and electrical properties of the VCM and realize synchronous VCM life testing of multiple cameras through a mature minimum single-chip microcomputer system.

[0003] Currently, VCM life testing is performed on a single module using a dedicated test box, which takes too long and consumes too many resources. Constant current sources are also used to test the life of multiple VCMs simultaneously.

[0004] 1. The advantage of using a constant current source test is that it can use the current source to drive multiple VCMs to test simultaneously. The disadvantage is that it can only test VCM single units, and cannot test the VCM life of the finished module. It also cannot monitor when the VCM fails the test multiple times.

[0005] 2. Use a dedicated test box for testing. The function can control the number of tests and monitor the number of tests when the test is NG. The biggest disadvantage is that it cannot drive multiple modules at the same time, because the IIC address of the driver that drives the VCM monomer is the same under the same project model. The same address on an IIC address bus cannot be recognized. Another disadvantage is that when multiple projects are tested at the same time, the resources of the computer and the dedicated test box are occupied.

[0006] The existing test system version V0 can only test 4 modules at the same time to perform VCM life test;

[0007] The problem is:

[0008] 1. After a sudden power outage, the current test count cannot be confirmed. After restarting, the test needs to start from 0, which may cause the module to be tested more times than actually required.

[0009] 2. When a module fails a test, the module is out of control and may affect the normal testing of other modules, bringing extremely high risks to the test.

[0010] In view of this, the present utility model is proposed. Utility Model Content

[0011] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a new module VCM life test hardware device, which solves the problems raised in the above background technology.

[0012] In order to solve the above technical problems, the basic concept of the technical solution adopted by the present invention is:

[0013] A novel module VCM life test hardware device includes: a test box and a control box. The test box has multiple groups of mounting holes on the side, and VCM modules are installed in the mounting holes. A backplate is provided on the front of the test box, and the control box and the back of the mounting holes are connected by connecting lines.

[0014] Optionally, side columns are fixedly connected on both sides of the test box, and the side columns are provided with sliding grooves toward the center of the test box. The back plate is installed between the two sliding grooves, and block cavities are provided on both sides of the back plate near the bottom. A block is installed inside the block cavity, and a spring column is inserted in the center of the block. The end of the spring column is fixedly connected to the inner wall of the block cavity, a spring is sleeved on the surface of the spring column, and a card slot is provided near the top of the sliding groove.

[0015] Optionally, the top and bottom of the slot are provided with oblique chamfers, and the top and bottom of the elastic block are provided with round chamfers.

[0016] Optionally, a pull plate is fixedly connected to the top of the back plate.

[0017] Optionally, notches are provided on both sides of the mounting hole.

[0018] Optionally, a display panel and buttons are provided on the front of the control box; and a memory is provided at the center of the test box.

[0019] After adopting the above technical solution, the present invention has the following beneficial effects compared with the prior art. Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described below at the same time:

[0020] 1. This new module VCM life test hardware device can realize automated testing and is compatible with all projects. The memory can store the current test times in the event of abnormal power failure and test failure, reducing the risk of subsequent multiple tests.

[0021] 2. This new module VCM life test hardware device is a minimum hardware system that is matched with the developed software VCM life test system. Its working principle is simple and easy to match, thereby reducing the cost of hardware devices and keeping the overall cost low.

[0022] 3. This new module VCM life test hardware device fixes the backplane by snapping the spring block into the slot during VCM module installation. The test box is in the open state for easy and quick installation, improving overall test efficiency.

[0023] The specific implementation of the present invention will be described in further detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The drawings described below are only some embodiments. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0025] In the picture:

[0026] Figure 1 This is a front view of the structure of the utility model;

[0027] Figure 2 This is a schematic diagram of the back side of the structure of the utility model;

[0028] Figure 3 This is a planar cross-sectional view of the structure of the utility model;

[0029] Figure 4 This is a cross-sectional view of the slideway of the utility model structure;

[0030] Figure 5 for Figure 4 An enlarged view of point A is shown;

[0031] Figure 6 This is the structural work flow diagram of the utility model;

[0032] Figure 7 This is a schematic diagram of the hardware structure system of the utility model.

[0033] In the accompanying drawings, the components represented by the reference numerals are as follows:

[0034] 1. Test box; 2. Mounting holes; 3. VCM module; 4. Back panel; 5. Side column; 6. Slide groove; 7. Spring block cavity; 8. Spring block; 9. Spring column; 10. Spring; 11. Slot; 12. Notch; 13. Pull plate; 14. Control box; 15. Connecting wires; 16. Memory.

[0035] It should be noted that these drawings and textual descriptions are not intended to limit the conceptual scope of the present invention in any way, but rather to illustrate the concept of the present invention for those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0036] The present invention will now be described in further detail with reference to the accompanying drawings.

[0037] See also Figure 1-7 As shown, in this embodiment, a new module VCM life test hardware device is provided, including a test box 1 and a control box 14, wherein multiple groups of mounting holes 2 are opened inside the side of the test box 1, and VCM modules 3 are installed inside the mounting holes 2. A back panel 4 is provided on the front of the test box 1, and the control box 14 and the back of the mounting holes 2 are connected by a connecting line 15.

[0038] In this embodiment, the single chip microcomputer in the test box 1 sends instructions to the VCM module 3 driver inside the test box 1, and the instructions are used to complete an action of pushing the lens to the far or near position in 1S, that is, the VCM is energized with a current of 100mA and a current of 0mA for testing.

[0039] Among them, side columns 5 are fixedly connected on both sides of the side of the test box 1, and a slide groove 6 is opened on the side column 5 toward the center of the test box 1. The back plate 4 is installed between the two slide grooves 6. Block cavities 7 are opened on both sides of the back plate 4 near the bottom. Block 8 is installed inside the block cavity 7. A spring column 9 is inserted in the center of the block 8. The end of the spring column 9 is fixedly connected to the inner side wall of the block cavity 7. A spring 10 is sleeved on the surface of the spring column 9. A card slot 11 is opened near the top of the slide groove 6.

[0040] In this embodiment, when installing or removing the VCM module 3, the back panel 4 is lifted upward until the spring block 8 is aligned with the slot 11. The spring block 8 is pushed toward the slot 11 by the spring 10, and the spring block 8 is snapped into the slot 11. The spring blocks 8 on both sides are fixed to support the back panel 4, which makes it convenient for the operator to remove the VCM module 3 for replacement and testing. After the installation is completed, the back panel 4 is pushed downward, the spring block 8 is squeezed and the compression spring 10 is retracted into the spring block cavity 7, and the back panel 4 slides along the slide groove 6 to the bottom to close the back of the installation hole 2, and is tested through the control box 14.

[0041] The top and bottom of the slot 11 are provided with oblique chamfers, and the top and bottom of the elastic block 8 are provided with round chamfers.

[0042] In this embodiment, the oblique chamfers and the rounded chamfers allow the spring block 8 to be released from the slot 11 more smoothly, and will not break due to pressure from repeated opening and closing.

[0043] A pull plate 13 is fixedly connected to the top of the back plate 4 .

[0044] In this embodiment, the pull plate 13 is convenient for the operator to lift the back plate 4 upwards by hand, and the operation is more labor-saving and convenient.

[0045] Wherein, notches 12 are provided on both sides of the mounting hole 2 .

[0046] In this embodiment, the notch 12 fits the installation hole 2, and the bevel chamfers expand the two sides of the installation hole 2. This makes it convenient to hold and clamp the two sides of the VCM module 3 when taking out and putting it in, making the overall test installation more convenient and quick.

[0047] The control box 14 is provided with a display panel and buttons on its front, and a memory 16 is provided at the center of the test box 1 .

[0048] In this embodiment, the display screen is used to display that a test is in progress, and the current test times can be checked by pressing a button; the memory 16 is an EEPROM, which is used to store the test times.

[0049] Working principle: Use the MCU IO port to simulate 5 groups of IIC to give instructions to 4 groups of VCM modules 3 and the fifth group to EEPROM. The first four groups give instructions to VCM module 3 to make VCM act, and the fifth group of IIC is to store the current test times and the flag bit of whether the module is abnormal; when IIC does not respond, the flag bit is 0, and the power supply LDO of the module VCM driver is synchronously pulled down to prevent it from outputting voltage, thereby protecting the abnormal module from being damaged again; the MCU IO port is connected to the module IIC, and the data is transmitted to the display screen through the simulated parallel port transmission line, connected to the EEPROM through the MCU IO, and the MCU IO port is connected to the LDO enable pin, and powered by USB5V.

[0050] The present invention is not limited to the above-mentioned embodiments. Anyone should be aware that any structural changes made under the guidance of the present invention, and any technical solutions that are the same or similar to those of the present invention, fall within the scope of protection of the present invention. The technologies, shapes, and structures not described in detail in the present invention are all well-known technologies.

Claims

1. A new module VCM life test hardware device, characterized by: include: A test box (1) and a control box (14), wherein a plurality of mounting holes (2) are provided on the side of the test box (1), a VCM module (3) is installed inside the mounting holes (2), a back plate (4) is provided on the front of the test box (1), the control box (14) and the back of the mounting holes (2) are connected via a connecting line (15), and side columns (5) are fixedly connected to both sides of the side of the test box (1), and the side columns (5) are opened toward the center of the test box (1). A slide groove (6) is provided, and the back plate (4) is installed between the two slide grooves (6). A spring block cavity (7) is opened near the bottom on both sides of the back plate (4), and a spring block (8) is installed inside the spring block cavity (7). A spring column (9) is inserted at the center position of the spring block (8). The end of the spring column (9) is fixedly connected to the inner side wall of the spring block cavity (7). A spring (10) is sleeved on the surface of the spring column (9). A clamping groove (11) is opened near the top of the slide groove (6).

2. The novel module VCM life test hardware device according to claim 1 is characterized in that: The top and bottom of the slot (11) are provided with oblique chamfers, and the top and bottom of the elastic block (8) are provided with round chamfers.

3. The novel module VCM life test hardware device according to claim 1 is characterized in that: A pull plate (13) is fixedly connected to the top of the back plate (4).

4. The novel module VCM life test hardware device according to claim 1, characterized in that: Notches (12) are provided on both sides of the installation hole (2).

5. The novel module VCM life test hardware device according to claim 1 is characterized in that: The front of the control box (14) is provided with a display panel and buttons.

6. The novel module VCM life test hardware device according to claim 1 is characterized in that: A memory (16) is provided at the center of the test box (1).

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