Chip test probe assembly

Abstract

The utility model relates to the technical field of test probes, and discloses a chip test probe assembly, which comprises a probe tube, a probe shaft is in clearance fit in the probe tube, a dismounting assembly is arranged in the probe tube, the dismounting assembly comprises sliding grooves formed in the left side and the right side of the outer wall of the probe tube, and unlocking grooves are formed in the front side and the rear side of the outer wall of the probe tube. The unlocking groove is communicated with the sliding groove, and linkage blocks are fixed to the left side and the right side of the outer wall of the probe shaft. According to the utility model, the probe shaft can be limited in the direction of the opening of the probe tube through the first spring, and the locking frame is matched with the linkage block, so that only when the locking frame and the linkage block overcome the elastic force of the first spring and move to the unlocking groove, the probe tube can be unlocked. And then the probe shaft is rotated to enable the linkage block to enter the unlocking groove so as to complete the disassembly of the probe shaft, and meanwhile, the contact between the probe shaft and the probe tube is ensured, the passing of current is ensured, and the reliability of the device is ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of test probes, in particular to a chip test probe assembly. Background Art

[0002] Test needles, also known as probes in the industry, are divided into spring needles (special needles) and universal needles when used for PCB board testing. When using spring needles, a test mold needs to be made according to the wiring situation of the PCB board being tested, and generally, one mold can only test one type of PCB board; when using universal needles, it is only necessary to have enough points, so many manufacturers now use universal needles; spring needles are divided into PCB board probes, ICT probes, and BGA probes according to their usage. PCB board probes are mainly used for PCB board testing, ICT probes are mainly used for online testing after plug-in, and BGA probes are mainly used for BGA packaging testing and chip testing, and usually for testing already packaged chips.

[0003] A semiconductor chip test probe (publication number: CN219799562U) has at least the following disadvantages: the above-mentioned device fixes the probe shaft and the probe tube by using two semicircular rubber blocks to connect with the probe shaft through interference fit. However, the reliability of the connection method using the rubber block and the probe shaft through interference fit is difficult to guarantee. It is easy for the end of the probe shaft to not be pushed to fit with the moving rod during installation, resulting in poor contact between the probe shaft and the probe tube, affecting the flow of current and affecting detection. In addition, the fatigue resistance of the rubber block is limited. After repeated compression and use, the elasticity of the rubber block is easily reduced, resulting in poor contact between the probe shaft and the probe tube or even the falling off of the probe shaft. For this reason, the present utility model is proposed. Utility Model Content

[0004] The purpose of the utility model is to solve the shortcomings of the prior art and to propose a chip testing probe assembly.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A chip test probe assembly includes a probe tube, the internal clearance of which is fitted with a probe shaft, a disassembly assembly provided inside the probe tube, the disassembly assembly including sliding grooves provided on the left and right sides of the outer wall of the probe tube, unlocking grooves provided on the front and back sides of the outer wall of the probe tube, the unlocking grooves being connected to the sliding grooves, and linkage blocks fixed on the left and right sides of the outer wall of the probe shaft.

[0007] As a further solution of the present invention, the bottom end of the probe tube is sleeved with a locking frame, the bottom end of the probe shaft is in conflict with the inner bottom surface of the locking frame, the left and right ends of the locking frame are respectively slidably arranged inside the two sliding grooves, the linkage block is located inside the locking frame, and a first spring is arranged between the top surface of the locking frame and the inner top surface of the probe tube. The first spring is movably sleeved on the outer wall of the probe shaft, the maximum distance between the two linkage blocks is less than the diameter of the first spring, and a second spring is arranged between the bottom surface of the locking frame and the inner bottom surface of the probe tube.

[0008] As a further solution of the present invention, a top block is fixed on the top surface of the second spring. The top block has a semicircular structure. The bottom surface of the locking frame has an inclined structure. The top block conflicts with the inclined bottom surface of the locking frame.

[0009] As a further solution of the present invention, a pulling groove is provided on the outer wall of the probe shaft.

[0010] As a further solution of the present invention, the linkage block is arranged to slide inside the sliding groove.

[0011] As a further solution of the present invention, the length and elastic force of the first spring and the second spring are equal.

[0012] Compared with the prior art, the present invention has the following beneficial effects:

[0013] By arranging the first spring and the second spring inside the probe tube, the second spring can make the probe shaft flexibly contact the chip during the contact test between the probe shaft and the chip, and the first spring can limit the direction of the probe shaft toward the opening of the probe tube, and utilize the cooperation of the locking frame and the linkage block. Only when the locking frame and the linkage block overcome the elastic force of the first spring and move to the unlocking slot, and then rotate the probe shaft so that the linkage block enters the unlocking slot, can the disassembly of the probe shaft be completed, while ensuring the contact between the probe shaft and the probe tube, ensuring the passage of current, and ensuring the reliability of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the three-dimensional structure of the chip test probe assembly proposed by the present invention;

[0015] Figure 2 This is a schematic diagram of the three-dimensional split structure of the chip test probe assembly proposed by the present invention;

[0016] Figure 3 This is a schematic diagram of the structure of the probe shaft of the chip test probe assembly proposed by the present invention;

[0017] Figure 4 This is a schematic diagram of the three-dimensional structure of the probe tube of the chip test probe assembly proposed by the present invention.

[0018] In the figure: 1. probe tube; 101. probe shaft; 2. sliding slot; 201. unlocking slot; 202. linkage block; 203. locking frame; 204. first spring; 205. second spring; 3. top block; 4. pulling slot. DETAILED DESCRIPTION

[0019] In order to make the technical means, creative features, objectives and effects achieved by the present invention easier to understand, the present invention is further described below in conjunction with specific implementation methods.

[0020] In the description of this utility model, it should be noted that the terms "upper," "lower," "inner," "outer," "front end," "rear end," "both ends," "one end," "the other end," and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They are not intended to indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0021] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "provided with," "connected," etc. should be understood in a broad sense. For example, "connected" can mean a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be internal communication between two components. Those skilled in the art will be able to understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0022] Reference Figure 1 - Figure, a chip test probe assembly, including a probe tube 1, the internal clearance of the probe tube 1 is matched with a probe shaft 101, a disassembly assembly is provided inside the probe tube 1, the disassembly assembly includes a sliding groove 2 opened on the left and right sides of the outer wall of the probe tube 1, an unlocking groove 201 is opened on the front and back sides of the outer wall of the probe tube 1, the unlocking groove 201 is connected to the sliding groove 2, and linkage blocks 202 are fixed on the left and right sides of the outer wall of the probe shaft 101.

[0023] In this embodiment, a locking frame 203 is provided at the bottom end of the probe tube 1, and the bottom end of the probe shaft 101 is in conflict with the inner bottom surface of the locking frame 203. The left and right ends of the locking frame 203 are respectively slidably arranged with the two sliding grooves 2. The linkage block 202 is located inside the locking frame 203. A first spring 204 is provided between the top surface of the locking frame 203 and the inner top surface of the probe tube 1. The first spring 204 is movably sleeved with the outer wall of the probe shaft 101. The maximum distance between the two linkage blocks 202 is less than the diameter of the first spring 204. A second spring 205 is provided between the bottom surface of the locking frame 203 and the inner bottom surface of the probe tube 1. By arranging the first spring 20 4 and the second spring 205. The second spring 205 can make the probe shaft 101 flexibly contact with the chip during the contact test between the probe shaft 101 and the chip. The first spring 204 can limit the direction of the probe shaft 101 toward the opening of the probe tube 1, and utilize the cooperation of the locking frame 203 and the linkage block 202. Only when the locking frame 203 and the linkage block 202 overcome the elastic force of the first spring 204 and move to the unlocking groove 201, and then rotate the probe shaft 101 so that the linkage block 202 enters the unlocking groove 201, can the disassembly of the probe shaft 101 be completed, while ensuring the contact between the probe shaft 101 and the probe tube 1, ensuring the passage of current, and ensuring the reliability of the device.

[0024] In this embodiment, a top block 3 is fixed to the top surface of the second spring 205. The top block 3 is a semicircular structure, and the bottom surface of the locking frame 203 is a sloped structure. The top block 3 conflicts with the bottom slope of the locking frame 203. By setting the top block 3 to conflict with the bottom slope of the locking frame 203, when the second spring 205 drives the top block 3 to push the locking frame 203, the locking frame 203 drives the probe shaft 101 to tilt to one side, so that the locking frame 203 drives the probe shaft 101 to always fit with the inner wall of the probe tube 1, ensuring the normal flow of current during testing.

[0025] In this embodiment, a pulling groove 4 is provided on the outer wall of the probe shaft 101 . The provision and use of the pulling groove 4 facilitates the staff to better pull and rotate the probe shaft 101 , thereby disassembling the probe shaft 101 .

[0026] In this embodiment, the internal sliding arrangement of the linkage block 202 and the sliding groove 2 can limit the linkage block 202 and prevent the linkage block 202 from rotating to the notch of the locking frame 203 and causing the probe shaft 101 to fall off.

[0027] In this embodiment, the length and elastic force of the first spring 204 and the second spring 205 are equal. By setting the length and elastic force of the first spring 204 and the second spring 205 to be equal, the compression force on the first spring 204 and the second spring 205 is maintained at a minimum when the probe is not in use, thereby increasing the service life of the first spring 204 and the second spring 205.

[0028] From the above description, it can be seen that the above embodiment of the present invention achieves the following technical effects: in use, the test product is tested by driving the probe. At this time, when the probe shaft 101 contacts the chip for testing, the probe shaft 101 drives the locking frame 203 to compress the second spring 205, so that the probe shaft 101 is in flexible contact with the chip. At this time, the top block 3 conflicts with the bottom inclined surface of the locking frame 203 during the process, so that when the second spring 205 drives the top block 3 to push the locking frame 203, the locking frame 203 drives the probe shaft 101 to tilt to one side, so that the locking frame 203 is The movable probe shaft 101 always fits with the inner wall of the probe tube 1 to ensure the normal flow of current during testing. When the probe shaft 101 needs to be disassembled and cleaned, the fingers or tools are buckled into the pulling groove 4, and then the probe shaft 101 is pulled. At this time, the linkage block 202 and the locking frame 203 slide inside the sliding groove 2. When the linkage block 202 and the locking frame 203 move to the unlocking groove 201, the probe shaft 101 is rotated to make the linkage block 202 enter the unlocking groove 201. At this time, the linkage block 202 is disengaged from the locking frame 203. At this time, the probe shaft 101 can be disassembled by pulling the probe shaft 101 again.

[0029] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. A chip test probe assembly, comprising a probe tube (1), characterized in that: The internal clearance of the probe tube (1) is matched with the probe shaft (101), and a disassembly assembly is provided inside the probe tube (1). The disassembly assembly comprises sliding grooves (2) provided on the left and right sides of the outer wall of the probe tube (1), unlocking grooves (201) are provided on the front and rear sides of the outer wall of the probe tube (1), and the unlocking grooves (201) are connected to the sliding grooves (2), and linkage blocks (202) are fixed on the left and right sides of the outer wall of the probe shaft (101).

2. The chip test probe assembly according to claim 1, characterized in that: The bottom end of the probe tube (1) is sleeved with a locking frame (203), the bottom end of the probe shaft (101) is in conflict with the inner bottom surface of the locking frame (203), the left and right ends of the locking frame (203) are respectively slidably arranged inside the two sliding grooves (2), the linkage block (202) is located inside the locking frame (203), a first spring (204) is arranged between the top surface of the locking frame (203) and the inner top surface of the probe tube (1), the first spring (204) is movably sleeved with the outer wall of the probe shaft (101), the maximum distance between the two linkage blocks (202) is less than the diameter of the first spring (204), and a second spring (205) is arranged between the bottom surface of the locking frame (203) and the inner bottom surface of the probe tube (1).

3. The chip test probe assembly according to claim 2, characterized in that: A top block (3) is fixed on the top surface of the second spring (205), and the top block (3) is a semicircular structure. The bottom surface of the locking frame (203) is an inclined surface structure, and the top block (3) and the bottom inclined surface of the locking frame (203) are in conflict.

4. The chip test probe assembly according to claim 1, characterized in that: The outer wall of the probe shaft (101) is provided with a pulling groove (4).

5. The chip testing probe assembly according to claim 1, characterized in that: The linkage block (202) is arranged to slide inside the sliding groove (2).

6. The chip testing probe assembly according to claim 2, characterized in that: The length and elastic force of the first spring (204) and the second spring (205) are equal.

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