Double-station test fixture

Abstract

The utility model provides a double-station test fixture, which comprises a base, a bottom plate is arranged on the base, two groups of mounting racks are vertically connected to one side of the bottom plate, a group of test fixtures are arranged at the lower end right in front of each group of mounting racks, and the two groups of test fixtures are arranged side by side and connected with the bottom plate. Pressing assemblies are arranged above the corresponding positions of the two sets of test clamps, one end of each pressing assembly is connected with the mounting frame, when the pressing assemblies press downwards, the other ends of the pressing assemblies abut against the outer edges of the to-be-tested chips in the test clamps, under the action of the pressing assemblies, the to-be-tested parts are more attached to the test clamps, and the test efficiency of the to-be-tested parts is improved. The two groups of test fixtures are used for testing products of different specifications and models, so that the products of different specifications and models can be detected at the same time, the detection efficiency is improved, and great convenience is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of test fixtures, and more specifically, to a double-station test fixture. Background Art

[0002] PCB circuit boards are the providers of electrical connections for electronic components. The main advantage of using circuit boards is that they greatly reduce wiring and assembly errors, improve automation levels and production efficiency. After the PCB circuit boards are manufactured, in order to ensure their processing quality, some tests are usually required to check the connection and electrical conductivity of each electrical circuit to ensure the production quality of the PCB circuit boards.

[0003] Existing patent publication number: CN 210037874 U, discloses a PCB test fixture comprising a base, to which is floatingly connected a floating positioning carrier for placing the PCB and a displacement drive mechanism for driving the floating positioning carrier up and down. A probe module for contacting and conducting the PCB is fixedly connected to the base, and the movable end of the displacement drive mechanism is connected to a top post for contacting and pressing down the PCB. The probe module is located below the floating positioning carrier, and the top post is located above the floating positioning carrier. This utility model is not only simple in structure and easy to use, but also effectively ensures accurate alignment and crimping of the PCB and probe, while preventing damage to the PCB or probe caused by overload during the crimping process.

[0004] However, the existing technology is not very intelligent. One inspection fixture can only inspect the same product, and there is only one inspection station. When the operator mistakenly takes a product to be inspected of other specifications, he needs to take the product to be inspected that meets the specifications again, which is very inconvenient and seriously affects efficiency. Utility Model Content

[0005] Therefore, in order to solve the above problems, the present invention proposes a dual-station test fixture, including a base 10, a bottom plate 20 is provided on the base 10, and a mounting frame 180 is vertically connected to one side of the bottom plate 20. There are two groups of mounting frames 180, and a group of test fixtures 50 is provided at the lower end in front of each group of mounting frames 180. The two groups of test fixtures 50 are arranged side by side and connected to the bottom plate 20. A pressing component 60 is provided above the corresponding positions of the two groups of test fixtures 50, one end of the pressing component 60 is connected to the mounting frame 180. When the pressing component 60 is pressed down, the other end of the pressing component 60 abuts against the outer edge of the chip to be tested in the test fixture 50. Under the action of the pressing component 60, the component to be tested is more closely fitted to the test fixture 50. The two groups of test fixtures 50 are used to test products of different specifications and models. Since two groups of test fixtures 50 are provided, products of different specifications and models can be tested at the same time, which improves the detection efficiency and is very convenient.

[0006] A double-station test fixture includes a base 10, a bottom plate 20 is provided on the base 10, and a mounting frame 180 is vertically connected to one side of the bottom plate 20. There are two groups of mounting frames 180, and each group of mounting frames 180 is provided with a group of test fixtures 50 at the lower end in front. The two groups of test fixtures 50 are arranged side by side and connected to the bottom plate 20. A pressing component 60 is provided above the corresponding positions of the two groups of test fixtures 50, and one end of the pressing component 60 is connected to the mounting frame 180. When the pressing component 60 is pressed down, the other end of the pressing component 60 abuts against the outer edge of the chip to be tested in the test fixture 50. Under the action of the pressing component 60, the component to be tested is more closely fitted to the test fixture 50. The two groups of test fixtures 50 are used to test products of different specifications and models.

[0007] Furthermore, the mounting frame 180 includes a mounting plate 30 and a fixing plate 40 . The fixing plate 40 is connected to the pressing assembly 60 to fix the pressing assembly 60 .

[0008] Furthermore, the pressing assembly 60 includes a connecting seat 601, the connecting seat 601 is connected to the fixed plate 40, a pressing handle 602 rotatably installed on the connecting seat 601, and a push rod 603 vertically installed on the connecting seat 601, the pressing handle 602 and the push rod 603 are connected through a connecting member 604, one end of the connecting member 604 is connected to the rotating point of the pressing handle 602, and the other end of the connecting member 604 is connected to the top of the push rod 603, when the pressing handle 602 is rotated and pressed down, the connecting member 604 drives the push rod 603 to be pressed downward.

[0009] Furthermore, the pressing assembly 60 also includes a pressing plate 70, which is fixedly connected to the bottom end of the push rod 603. The lower surface of the pressing plate 70 is connected to a plurality of pressing rods 80. When the pressing handle 602 is pressed down, the pressing plate 70 is driven to be pressed down, and the pressing rods 80 come into contact with the product to be detected, thereby performing detection.

[0010] Furthermore, a micro switch 90 is provided on the inner side of the mounting plate 30 for detecting whether the lower pressure plate 70 is pressed down to a set position. A connecting block 100 is provided on the side of the lower pressure plate 70 close to the micro switch 90. When the lower pressure plate 70 is pressed down and the connecting block 100 contacts the micro switch 90, the lower pressure plate 70 is stopped from being pressed down.

[0011] Furthermore, a first linear bearing 110 is provided on the side of the lower pressure plate 70 close to the mounting plate 30, and the first linear bearing 110 is sleeved with a first sliding guide rod 120. The first linear bearing 110 is slidably connected to the first sliding guide rod 120, and is used to keep the lower pressure plate 70 pressed down in parallel and subjected to the same force when the lower pressure assembly 60 drives the lower pressure plate 70 to press down.

[0012] Furthermore, a connecting plate 130 is connected to the top end of the first sliding guide rod 120 and is connected to the fixing plate 40 , and the other end of the first sliding guide rod 120 is connected to the bottom plate 20 . The connecting plate 130 is used to fix the first sliding guide rod 120 .

[0013] Furthermore, a reinforcing plate 140 is provided in the mounting frame 180 to ensure that the mounting plate 30 is subjected to a more stable force when the pressing assembly 60 is pressed downward.

[0014] Furthermore, a second sliding guide rod 150 is connected to the corners of the lower surface of the test fixture 50, and a second linear bearing 160 is provided on the base plate 20 to match the position of the second sliding guide rod 150. The second linear bearing 160 is sleeved with the second sliding guide rod 150, and the second sliding guide rod 150 is slidably connected to the second linear bearing 160. When the lower pressing plate 70 is pressed down, the test fixture 50 moves downward under the pressure of the lower pressing plate 70. Under the action of the second linear bearing 160, the test fixture 50 keeps moving downward in parallel. A spring 170 is provided at the bottom end of the test fixture 50. One end of the spring 170 is connected to the test fixture 50, and the other end of the spring 170 is connected to the base plate 20. When the lower pressing plate 70 is pressed down, under the elastic action of the spring 170, the distance between the test fixture 50 and the lower pressing plate 70 becomes smaller, and the pressing rod 80 contacts the product to be tested more completely, and can also buffer the downward pressure. After the lower pressing stroke is completed, under the elastic action of the spring 170, the test fixture 50 is reset upward.

[0015] The beneficial effects of the present invention are as follows: the present invention proposes a double-station test fixture, including a base 10, a bottom plate 20 is provided on the base 10, and a mounting frame 180 is vertically connected to one side of the bottom plate 20, and the mounting frame 180 has two groups, and a group of test fixtures 50 is provided at the lower end in front of each group of the mounting frames 180. The two groups of test fixtures 50 are arranged side by side and connected to the bottom plate 20, and a pressing component 60 is provided above the corresponding positions of the two groups of test fixtures 50, one end of the pressing component 60 is connected to the mounting frame 180, when the pressing component 60 is pressed down, the other end of the pressing component 60 abuts against the outer edge of the chip to be tested in the test fixture 50, under the action of the pressing component 60, the component to be tested is more closely fitted to the test fixture 50, and the two groups of test fixtures 50 are used to test products of different specifications and models. Since two groups of test fixtures 50 are provided, products of different specifications and models can be tested at the same time, which improves the detection efficiency and is very convenient. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 The figure is a schematic diagram of the overall structure of a double-station test fixture of the present invention.

[0017] Figure 2 This is a structural diagram of a double-station test fixture of the present utility model.

[0018] Figure 3 This is a partial structural diagram of a dual-station test fixture of the present invention.

[0019] Figure 4 This is a partial enlarged view of the structure of a dual-station test fixture of the present invention.

[0020] Description of main component symbols:

[0021] Base 10, bottom plate 20, mounting plate 30, fixing plate 40, test fixture 50, pressing assembly 60, connecting seat 601, pressing handle 602, push rod 603, connecting piece 604, pressing plate 70, pressing rod 80, micro switch 90, connecting block 100, first linear bearing 110, first sliding guide rod 120, connecting plate 130, reinforcing plate 140, second sliding guide rod 150, second linear bearing 160, spring 170, mounting bracket 180.

[0022] The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0023] The following examples are described to assist in understanding the present application, and the examples are not and should not be interpreted in any way as limiting the scope of protection of the present application.

[0024] In the following description, those skilled in the art will recognize that throughout this discussion, components may be described as separate functional units (which may include sub-units), but those skilled in the art will recognize that various components or portions thereof may be divided into separate components or may be integrated together (including within a single system or component).

[0025] At the same time, the connections between components or systems are not intended to be limited to direct connections. Instead, data between these components may be modified, reformatted, or otherwise changed by intermediate components. In addition, additional or fewer connections may be used. It should also be noted that the terms "coupled," "connected," or "input" should be understood to include direct connections, indirect connections through one or more intermediate devices, and wireless connections. Example 1:

[0026] like Figure 1 As shown in FIG, it is a schematic diagram of the overall structure of a double-station test fixture of the present invention; Figure 2 As shown in FIG, it is a structural diagram of a double-station test fixture of the present invention; Figure 3 As shown, it is a partial structural diagram of a double-station test fixture of the present invention; Figure 4 The figure shows a partial enlarged view of the structure of a dual-station test fixture of the present invention.

[0027] A double-station test fixture includes a base 10, a bottom plate 20 is provided on the base 10, and a mounting frame 180 is vertically connected to one side of the bottom plate 20. There are two groups of mounting frames 180, and each group of mounting frames 180 is provided with a group of test fixtures 50 at the lower end in front. The two groups of test fixtures 50 are arranged side by side and connected to the bottom plate 20. A pressing component 60 is provided above the corresponding positions of the two groups of test fixtures 50, and one end of the pressing component 60 is connected to the mounting frame 180. When the pressing component 60 is pressed down, the other end of the pressing component 60 abuts against the outer edge of the chip to be tested in the test fixture 50. Under the action of the pressing component 60, the component to be tested is more closely fitted to the test fixture 50. The two groups of test fixtures 50 are used to test products of different specifications and models.

[0028] The mounting frame 180 includes a mounting plate 30 and a fixing plate 40 . The fixing plate 40 is connected to the pressing assembly 60 to fix the pressing assembly 60 .

[0029] The pressing assembly 60 includes a connecting seat 601, the connecting seat 601 is connected to the fixed plate 40, a pressing handle 602 rotatably installed on the connecting seat 601, and a push rod 603 vertically installed on the connecting seat 601, the pressing handle 602 is connected to the push rod 603 through a connecting member 604, one end of the connecting member 604 is connected to the rotating part of the pressing handle 602, and the other end of the connecting member 604 is connected to the top of the push rod 603, when the pressing handle 602 is rotated and pressed down, the connecting member 604 drives the push rod 603 to be pressed downward.

[0030] The pressing assembly 60 also includes a pressing plate 70, which is fixedly connected to the bottom end of the push rod 603. The lower surface of the pressing plate 70 is connected to a plurality of pressing rods 80. When the pressing handle 602 is pressed down, the pressing plate 70 is driven to be pressed down, and the pressing rods 80 come into contact with the product to be tested, thereby conducting detection.

[0031] A micro switch 90 is provided on the inner side of the mounting plate 30 for detecting whether the lower pressing plate 70 is pressed down to the set position. A connecting block 100 is provided on the side of the lower pressing plate 70 close to the micro switch 90. When the lower pressing plate 70 is pressed down and the connecting block 100 contacts the micro switch 90, the lower pressing plate 70 is stopped.

[0032] A first linear bearing 110 is provided on the side of the lower pressure plate 70 close to the mounting plate 30. The first linear bearing 110 is sleeved with a first sliding guide rod 120. The first linear bearing 110 is slidably connected to the first sliding guide rod 120, and is used to keep the lower pressure plate 70 pressed down in parallel and subjected to the same force when the lower pressure assembly 60 drives the lower pressure plate 70 to press down.

[0033] The top end of the first sliding guide rod 120 is connected to a connecting plate 130 and is connected to the fixing plate 40 , and the other end of the first sliding guide rod 120 is connected to the bottom plate 20 . The connecting plate 130 is used to fix the first sliding guide rod 120 .

[0034] A reinforcing plate 140 is provided in the mounting frame 180 to ensure that the mounting plate 30 is more stably stressed when the pressing assembly 60 is pressed downward.

[0035] The lower surface of the test fixture 50 is connected to the corners of the four sides with a second sliding guide rod 150, and the base plate 20 is provided with a second linear bearing 160 that matches the position of the second sliding guide rod 150. The second linear bearing 160 is sleeved with the second sliding guide rod 150, and the second sliding guide rod 150 is slidably connected to the second linear bearing 160. When the lower pressing plate 70 is pressed down, the test fixture 50 moves downward under the pressure of the lower pressing plate 70. Under the action of the second linear bearing 160, the test fixture 50 keeps moving downward in parallel. A spring 170 is provided at the bottom end of the test fixture 50. One end of the spring 170 is connected to the test fixture 50, and the other end of the spring 170 is connected to the base plate 20. When the lower pressing plate 70 is pressed down, under the elastic action of the spring 170, the distance between the test fixture 50 and the lower pressing plate 70 becomes smaller, and the pressing rod 80 contacts the product to be tested more completely, and can also buffer the downward pressure. After the lower pressing stroke is completed, under the elastic action of the spring 170, the test fixture 50 is reset upward.

[0036] The beneficial effects of the present invention are as follows: the present invention proposes a double-station test fixture, including a base 10, a bottom plate 20 is provided on the base 10, and a mounting frame 180 is vertically connected to one side of the bottom plate 20, and the mounting frame 180 has two groups, and a group of test fixtures 50 is provided at the lower end in front of each group of the mounting frames 180. The two groups of test fixtures 50 are arranged side by side and connected to the bottom plate 20, and a pressing component 60 is provided above the corresponding positions of the two groups of test fixtures 50, one end of the pressing component 60 is connected to the mounting frame 180, when the pressing component 60 is pressed down, the other end of the pressing component 60 abuts against the outer edge of the chip to be tested in the test fixture 50, under the action of the pressing component 60, the component to be tested is more closely fitted to the test fixture 50, and the two groups of test fixtures 50 are used to test products of different specifications and models. Since two groups of test fixtures 50 are provided, products of different specifications and models can be tested at the same time, which improves the detection efficiency and is very convenient.

[0037] The above-described embodiments merely represent several implementation methods of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A double-station test fixture, comprising a base (10), a bottom plate (20) provided on the base (10), a mounting frame (180) vertically connected to one side of the bottom plate (20), and two sets of the mounting frames (180), characterized in that: The mounting frame (180) includes a mounting plate (30) and a fixing plate (40). A group of test fixtures (50) is provided at the lower end in front of each group of the mounting frames (180). The two groups of test fixtures (50) are arranged side by side and connected to the base plate (20). A pressing assembly (60) is provided above the corresponding positions of the two groups of test fixtures (50). The fixing plate (40) is connected to the pressing assembly (60) and is used to fix the pressing assembly (60). One end of the pressing assembly (60) is connected to the mounting frame (180). When the pressing assembly (60) is pressed down, the other end of the pressing assembly (60) abuts against the outer edge of the chip to be tested in the test fixture (50). Under the action of the pressing assembly (60), the parts to be tested are more closely fitted to the test fixture (50). Two groups of the test fixtures (50) are used to test products of different specifications and models. The pressing assembly (60) includes a connecting seat (601), the connecting seat (601) is connected to the fixing plate (40), a pressing handle (602) rotatably mounted on the connecting seat (601), and a push rod (603) vertically mounted on the connecting seat (601). The pressing handle (602) and the push rod (603) are connected via a connecting piece (604). One end of the connecting piece (604) is connected to the rotating part of the pressing handle (602). The connecting piece (604) The other end is connected to the top end of the push rod (603). When the pressing handle (602) is rotated and pressed down, the connecting member (604) drives the push rod (603) to be pressed downward. The pressing assembly (60) also includes a pressing plate (70). The pressing plate (70) is fixedly connected to the bottom end of the push rod (603). The lower surface of the pressing plate (70) is connected to a plurality of pressing rods (80). When the pressing handle (602) is pressed down, the pressing plate (70) is driven to be pressed down. The pressing rods (80) come into contact with the product to be tested, and then the product is tested. A first linear bearing (110) is provided on the side of the pressing plate (70) close to the mounting plate (30). The first linear bearing (110) is sleeved. A first sliding guide rod (120) is provided, and the first linear bearing (110) is slidably connected to the first sliding guide rod (120), so that when the pressing assembly (60) drives the lower pressing plate (70) to press down, the lower pressing plate (70) is kept pressed down in parallel and subjected to the same force. A second sliding guide rod (150) is connected to the corners around the lower surface of the test fixture (50), and a second linear bearing (160) matching the position of the second sliding guide rod (150) is provided on the bottom plate (20). The second linear bearing (160) is sleeved with the second sliding guide rod (150), and the second sliding guide rod (150) is slidably connected to the second linear bearing (160). When the lower pressing plate (70) is pressed down, the test fixture (50) moves downward under the pressure of the lower pressing plate (70).Under the action of the second linear bearing (160), the test fixture (50) keeps moving downward in parallel. A spring (170) is provided at the bottom end of the test fixture (50). One end of the spring (170) is connected to the test fixture (50), and the other end of the spring (170) is connected to the bottom plate (20). When the lower pressing plate (70) is pressed downward, the distance between the test fixture (50) and the lower pressing plate (70) is reduced under the elastic action of the spring (170), and the pressing rod (80) is in more complete contact with the product to be tested, and can also buffer the downward pressure. After the pressing stroke ends, the test fixture (50) is reset upward under the elastic action of the spring (170).

2. The dual-station test fixture according to claim 1, characterized in that: A micro switch (90) is provided on the inner side of the mounting plate (30) for detecting whether the lower pressing plate (70) is pressed down to a set position. A connecting block (100) is provided on the side of the lower pressing plate (70) close to the micro switch (90). When the lower pressing plate (70) is pressed down and the connecting block (100) contacts the micro switch (90), the lower pressing plate (70) stops pressing down.

3. The dual-station test fixture according to claim 1, characterized in that: The top end of the first sliding guide rod (120) is connected to a connecting plate (130) and is connected to the fixing plate (40). The other end of the first sliding guide rod (120) is connected to the bottom plate (20). The connecting plate (130) is used to fix the first sliding guide rod (120).

4. The dual-station test fixture according to claim 1, characterized in that: A reinforcing plate (140) is provided in the mounting frame (180) to ensure that the mounting plate (30) is subjected to a more stable force when the pressing assembly (60) is pressed downward.

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