Layered test tool for radio frequency SIP

Abstract

The utility model discloses a layered test tool for a radio frequency SIP (Session Initiation Protocol). The layered test tool comprises a base, a horizontal positioning device and a vertical positioning device, wherein the horizontal positioning device and the vertical positioning device are arranged on the base; the horizontal positioning device is provided with a test position, and the vertical positioning device is provided with a radio frequency connection position. The testing position comprises a supporting platform which is installed on the horizontal positioning device; the test EVB board is arranged on the support platform; the SIP mounting groove is formed in the test EVB plate and used for placing a radio frequency SIP, fuzz button mounting holes are formed in the SIP mounting groove, and fuzz buttons for connecting the radio frequency SIP and the test EVB plate are arranged in the fuzz button mounting holes; the power supply PCB is arranged on the SIP mounting groove, and a semiconductor telescopic probe is arranged on the power supply PCB; the radio frequency connection position comprises a radio frequency cable, the radio frequency cable is sleeved with a cable sleeve, and the cable sleeve is connected with a vertical positioning device; and the radio frequency connectors are arranged at the two ends of the radio frequency cable.

Description

Technical Field

[0001] The utility model relates to the field of microwave measurement, in particular to a layered testing tool for radio frequency SIP. Background Art

[0002] RF SIP is a system integration component formed by stacking and interconnecting various active and passive RF chips in a two-dimensional or three-dimensional manner.

[0003] It generally uses microelectronics assembly technology, and has the characteristics of small size, high chip density, and high degree of integration, which can greatly reduce the volume and weight of the entire equipment.

[0004] However, unlike general large-size components, RF SIP components cannot be opened for repair after sealing. Currently, there is a lack of reliable means to conduct preliminary testing and troubleshooting of SIPs before sealing. Utility Model Content

[0005] The purpose of the utility model is to provide a layered test tool for radio frequency SIP to solve the above-mentioned problems existing in the prior art.

[0006] Technical solution: A layered test fixture for RF SIP, including:

[0007] a base, a horizontal positioning device and a vertical positioning device mounted on the base;

[0008] The horizontal positioning device is provided with a test position, and the vertical positioning device is provided with a radio frequency connection position;

[0009] The test bits include:

[0010] a supporting platform, mounted on the horizontal positioning device;

[0011] A test EVB board is arranged on the support platform;

[0012] The SIP mounting slot is arranged on the test EVB board and is used to place the RF SIP. A button mounting hole is provided in the SIP mounting slot, and a button is provided in the button mounting hole to connect the RF SIP and the test EVB board. The button is designed in the slot to complete the RF electrical performance connection between the RF SIP and the test EVB board.

[0013] The power supply PCB is installed in the SIP installation slot. The power supply PCB is provided with semiconductor telescopic probes, which are connected to the power supply ports on the RF SIP one by one through the semiconductor telescopic probes.

[0014] The radio frequency connection bit includes:

[0015] A radio frequency cable, wherein the radio frequency cable is provided with a cable sleeve on its outer cover, and the cable sleeve is connected to the vertical positioning device;

[0016] The radio frequency connectors are arranged at both ends of the radio frequency cable and are connected to the radio frequency port of the radio frequency SIP and the cable of the external test instrument respectively.

[0017] When testing the utility model, the RF SIP is placed in the SIP installation slot, the horizontal positioning device and the vertical positioning device are adjusted to connect the RF connector with the RF port of the RF SIP, and then the power supply PCB board is used for external power supply;

[0018] The layered test of RF SIP can be completed through the EVB board, and the fine adjustment of RF connector and external probe station can be completed through the microscope, which is convenient for touch;

[0019] This solution provides a way to access the RF port on the SIP surface for performance testing.

[0020] Using a microscope, you can use an external probe station to perform point detection and troubleshooting during the test process.

[0021] It is easy to use and easy to operate. By replacing the SIP installation slot, power supply PCB board and test EVB board, other types of RF SIP can be tested.

[0022] For RF SIPs with dual ports on the surface, another cable assembly can be installed on the vertical right rack to assist in testing.

[0023] In a further embodiment, the SIP mounting slot is adhered to the test EVB board by insulating adhesive, and the power supply PCB board is mounted on the SIP mounting slot by screws.

[0024] In a further embodiment, the horizontal positioning device comprises two sets of mutually cross-arranged straight slides;

[0025] Each set of straight slides includes:

[0026] A slide seat, wherein a slide rail is provided on the slide seat;

[0027] A slider is provided on the slide seat and adapted to the slide rail, a side of the slider is provided with a limit groove, a horizontal limit screw rod that is low in contact with the slide seat is adapted in the limit groove, and a limit handle is provided at the end of the horizontal limit screw rod;

[0028] The driving member includes a screw seat fixedly connected to the slide, an adjusting screw arranged in the screw seat, and a screw sleeve sleeved on the adjusting screw and connected to the slide;

[0029] The screw rod sleeve is adapted to the screw rod, and a rotating handle is provided at the end of the adjusting screw rod.

[0030] In a further embodiment, the slides of one set of straight slides are mounted on the sliders of another set of straight slides;

[0031] Another set of straight slides has its slides installed on the base;

[0032] The supporting platform is installed on a set of sliders of a straight slide.

[0033] In a further embodiment, the base is further provided with a microscope, and the microscope is mounted on the base via a rigid sleeve.

[0034] In a further embodiment, the vertical positioning device comprises:

[0035] A vertical sliding column is installed on the base, a vertical sliding rail is provided on the vertical sliding column, and a rack is fixedly installed on the vertical sliding column;

[0036] A vertical slide, wherein a vertical slider adapted to the vertical slide rail is mounted on the vertical slide, a rotating rod is provided inside the vertical slide, a gear adapted to the rack is sleeved on the rotating rod, an extension portion of the rotating rod extends outside the vertical slide, and an adjustment knob is provided on the portion extending outside the vertical slide; a vertical left frame and a vertical right frame are connected to the left and right ends of the vertical slide respectively;

[0037] The cable bushing is connected to the vertical left frame or the vertical right frame;

[0038] A vertical limit screw rod, a limit screw groove adapted to the vertical limit screw rod is opened in the vertical slide, the vertical limit screw rod passes through the limit screw groove and abuts against the vertical slide column, and a limit knob is installed at the end of the vertical limit screw rod.

[0039] Beneficial effects: The utility model discloses a layered test fixture for radio frequency SIP. During the test, the radio frequency SIP is placed in the SIP installation slot, the horizontal positioning device and the vertical positioning device are adjusted to connect the radio frequency connector with the radio frequency port of the radio frequency SIP, and then the power supply PCB board is used for external power supply;

[0040] The layered test of RF SIP can be completed through the EVB board, and the fine adjustment of RF connector and external probe station can be completed through the microscope, which is convenient for touch;

[0041] This solution provides a way to access the RF port on the SIP surface for performance testing.

[0042] Using a microscope, you can use an external probe station to perform point detection and troubleshooting during the test process.

[0043] It is easy to use and easy to operate. By replacing the SIP installation slot, power supply PCB board and test EVB board, other types of RF SIP can be tested.

[0044] For RF SIPs with dual ports on the surface, another cable assembly can be installed on the vertical right rack to assist in testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 It is a structural diagram of the present utility model.

[0046] Figure 2 This is a schematic diagram of the SIP installation slot and power supply PCB board structure of the utility model.

[0047] Figure 3 It is a structural schematic diagram of the horizontal positioning device of the utility model.

[0048] Figure 4 It is a structural schematic diagram of the vertical positioning device of the present utility model.

[0049] The accompanying drawings are:

[0050] 1. Base;

[0051] 2. Horizontal positioning device; 21. Slide seat; 22. Slider; 23. Screw sleeve; 24. Screw seat; 25. Adjusting screw; 26. Rotating handle; 27. Limit handle;

[0052] 3. Support platform; 4. Test EVB board; 5. SIP mounting slot; 51. Button mounting hole; 6. Power supply PCB board; 61. Semiconductor telescopic probe; 7. RF connector; 8. Cable sleeve; 9. Vertical left frame; 10. Vertical right frame;

[0053] 11. Vertical positioning device; 111. Vertical carriage; 112. Rack; 113. Rotating rod; 114. Gear;

[0054] 12. Microscope; 13. Rigid cannula. DETAILED DESCRIPTION

[0055] The present application relates to a layered test tool for radio frequency SIP, which is explained in detail below through specific implementation methods.

[0056] A layered test fixture for radio frequency SIP, comprising:

[0057] A base 1, a horizontal positioning device 2 and a vertical positioning device 11 installed on the base 1;

[0058] The horizontal positioning device 2 is provided with a test position, and the vertical positioning device is provided with a radio frequency connection position;

[0059] The test bits include:

[0060] A supporting platform 3 is installed on the horizontal positioning device 2;

[0061] A test EVB board 4 is arranged on the support platform;

[0062] The SIP mounting slot 5 is arranged on the test EVB board 4 and is used to place the RF SIP. A fur button mounting hole 51 is opened in the SIP mounting slot 5. A fur button connecting the RF SIP and the test EVB board 4 is provided in the fur button mounting hole 51. The fur button is designed in the slot to complete the RF electrical performance connection between the RF SIP and the test EVB board 4 through the fur button.

[0063] The power supply PCB board 6 is arranged on the SIP installation slot 5. The power supply PCB board 6 is provided with a semiconductor telescopic probe 61, which is connected to the power supply port on the RF SIP one by one through the semiconductor telescopic probe 61;

[0064] The radio frequency connection bit includes:

[0065] A radio frequency cable, wherein the radio frequency cable is covered with a cable sleeve 8, and the cable sleeve 8 is connected to the vertical positioning device 11;

[0066] The RF connectors 7 are provided at both ends of the RF cable and are connected to the RF port of the RF SIP and the cable of the external test instrument respectively.

[0067] When testing the present invention, the RF SIP is placed in the SIP mounting slot 5, the horizontal positioning device 2 and the vertical positioning device 11 are adjusted to dock the RF connector 7 with the RF port of the RF SIP, and then external power is supplied using the power supply PCB board 6;

[0068] The layered test of RF SIP can be completed through the EVB board. The fine adjustment of RF connector and external probe station can be completed through the microscope 12, which is convenient for touch.

[0069] This solution provides a way to access the RF port on the SIP surface for performance testing.

[0070] By using the microscope 12 , an external probe station can be used to perform point detection and troubleshooting during the test process.

[0071] It is easy to use and has good operability. By replacing the SIP installation slot 5, the power supply PCB board 6 and the test EVB board 4, other types of radio frequency SIPs can be tested.

[0072] For a radio frequency SIP with dual ports on the surface, another cable component can be installed on the vertical right frame 10 to assist in testing.

[0073] The SIP mounting slot 5 is adhered to the test EVB board 4 by insulating glue, and the power supply PCB board 6 is installed on the SIP mounting slot 5 by screws.

[0074] The horizontal positioning device 2 has two sets of cross-arranged straight slides;

[0075] Each set of straight slides includes:

[0076] A slide 21, wherein the slide 21 is provided with a slide rail;

[0077] The slider 22 is provided on the slide 21 and adapted to the slide rail. A limit groove is provided on the side of the slider 22. A horizontal limit screw rod that is lowered to the slide 21 is adapted in the limit groove. A limit handle 27 is provided at the end of the horizontal limit screw rod.

[0078] The driving member includes a screw seat 24 fixedly connected to the slide 21, an adjusting screw 25 disposed in the screw seat 24, and a screw sleeve 23 sleeved on the adjusting screw 25 and connected to the slider 22;

[0079] The screw rod sleeve 23 is adapted to the screw rod, and a rotating handle 26 is provided at the end of the adjusting screw rod 25 .

[0080] The slide 21 of one set of straight slides is installed on the slider 22 of another set of straight slides;

[0081] Another set of straight slides 21 are installed on the base 1;

[0082] The supporting platform 3 is mounted on a set of sliders 22 of a straight slide.

[0083] The base 1 is further provided with a microscope 12 , which is mounted on the base 1 via a rigid sleeve 13 .

[0084] The vertical positioning device 11 includes:

[0085] A vertical sliding column is installed on the base 1, a vertical sliding rail is provided on the vertical sliding column, and a rack 112 is fixedly installed on the vertical sliding column;

[0086] A vertical slide 111 is mounted on the vertical slide 111, and a vertical slider 22 adapted to the vertical slide rail is mounted on the vertical slide 111. A rotating rod 113 is provided within the vertical slide 111, and a gear 114 adapted to the rack 112 is sleeved on the rotating rod 113. The rotating rod 113 extends outside the vertical slide 111 and is provided with an adjustment knob on the portion extending outside the vertical slide 111. The left and right ends of the vertical slide 111 are respectively connected to the vertical left frame 9 and the vertical right frame 10;

[0087] The cable sleeve 8 is connected to the vertical left frame 9 or the vertical right frame 10;

[0088] A vertical limiting screw rod is provided in the vertical slide 111 with a limiting screw groove adapted to the vertical limiting screw rod. The vertical limiting screw rod passes through the limiting screw groove and abuts against the vertical slide column. A limiting knob is installed at the end of the vertical limiting screw rod.

[0089] Working principle: Place the RF SIP in the SIP mounting slot 5, adjust the horizontal positioning device 2 and the vertical positioning device 11 to mate the RF connector 7 with the RF port of the RF SIP, and then use the power supply PCB board 6 for external power supply.

[0090] The layered test of RF SIP can be completed through the EVB board, and the fine adjustment of RF connector and external probe station can be completed through the microscope 12, which is convenient for touch.

[0091] When adjusting the horizontal positioning device 2, the adjusting screw 25 is rotated by rotating the rotating handle 26, which in turn drives the screw sleeve 23 to move, and then drives the slider 22 to move along the slide 21. After adjusting to the appropriate position, the horizontal limit screw is rotated by rotating the limit handle 27, and then it is pressed against the slide 21 to complete the limit.

[0092] When the vertical positioning device is adjusted, the adjusting knob is used to drive the rotating rod 113 to rotate, thereby driving the gear 114 to move on the rack 112, and then driving the vertical slide 111 and the vertical slide rail to slide along the vertical slide column to complete the position adjustment. After adjusting to the appropriate position, the limit knob is rotated to drive the limit screw to lower the vertical slide column to complete the limit.

[0093] The preferred embodiments of the present invention are described in detail above in conjunction with the accompanying drawings. However, the present invention is not limited to the specific details in the above embodiments. Within the technical concept of the present invention, various equivalent transformations can be made to the technical solutions of the present invention, and these equivalent transformations all fall within the scope of protection of the present invention.

Claims

1. A layered test fixture for radio frequency SIP, comprising: A base (1), a horizontal positioning device (2) and a vertical positioning device (11) mounted on the base (1); It is characterized in that the horizontal positioning device (2) is provided with a test position, and the vertical positioning device is provided with a radio frequency connection position; The test bits include: A supporting platform (3) is mounted on the horizontal positioning device (2); A test EVB board (4) is arranged on the support platform; A SIP installation slot (5) is provided on the test EVB board (4) and is used to place a radio frequency SIP. A button installation hole (51) is provided in the SIP installation slot (5), and a button for connecting the radio frequency SIP and the test EVB board (4) is provided in the button installation hole (51). A power supply PCB board (6) is arranged on the SIP installation slot (5), and a semiconductor telescopic probe (61) is provided on the power supply PCB board (6); The radio frequency connection bit includes: A radio frequency cable, wherein the radio frequency cable is provided with a cable sleeve (8) on its outer shell, and the cable sleeve (8) is connected to a vertical positioning device (11); Radio frequency connectors (7) are arranged at both ends of the radio frequency cable and are respectively connected to the radio frequency port of the radio frequency SIP and the cable of the external test instrument.

2. The RF SIP layered test fixture according to claim 1, characterized in that: The SIP installation slot (5) is adhered to the test EVB board (4) by means of insulating adhesive, and the power supply PCB board (6) is installed on the SIP installation slot (5) by means of screws.

3. The RF SIP layered test fixture according to claim 1, characterized in that: The horizontal positioning device (2) comprises two sets of mutually cross-arranged straight slides; Each set of straight slides includes: A slide seat (21), wherein a slide rail is provided on the slide seat (21); A slider (22) is arranged on the slide seat (21) and adapted to the slide rail. A side portion of the slider (22) is provided with a limit groove. A horizontal limit screw rod that is lower than the slide seat (21) is adapted in the limit groove. A limit handle (27) is provided at the end of the horizontal limit screw rod. The driving member comprises a screw seat (24) fixedly connected to the slide seat (21), an adjusting screw (25) arranged in the screw seat (24), and a screw sleeve (23) sleeved on the adjusting screw (25) and connected to the slide block (22); The screw rod sleeve (23) is adapted to the screw rod, and a rotating handle (26) is provided at the end of the adjusting screw rod (25).

4. The RF SIP layered test fixture according to claim 3, characterized in that: The slide seats (21) of one set of straight slides are mounted on the sliders (22) of another set of straight slides; Another set of straight slides (21) is mounted on the base (1); The supporting platform (3) is mounted on a set of sliders (22) of a straight slide.

5. The RF SIP layered test tool according to claim 1, characterized in that: The base (1) is further provided with a microscope (12), and the microscope (12) is mounted on the base (1) via a rigid sleeve (13).

6. The RF SIP layered test tool according to claim 1, characterized in that: The vertical positioning device (11) comprises: A vertical sliding column is installed on the base (1), a vertical sliding rail is provided on the vertical sliding column, and a rack (112) is fixedly installed on the vertical sliding column; A vertical slide (111), wherein a vertical slider (22) adapted to the vertical slide rail is installed on the vertical slide (111), a rotating rod (113) is provided inside the vertical slide (111), a gear (114) adapted to the rack (112) is sleeved on the rotating rod (113), an extension portion of the rotating rod (113) extends outside the vertical slide (111), and an adjustment knob is provided on the portion extending outside the vertical slide (111); the left and right ends of the vertical slide (111) are respectively connected to a vertical left frame (9) and a vertical right frame (10); The cable sleeve (8) is connected to the vertical left frame (9) or the vertical right frame (10); A vertical limiting screw rod is provided in the vertical slide (111) with a limiting screw groove adapted to the vertical limiting screw rod, the vertical limiting screw rod passes through the limiting screw groove and abuts against the vertical slide column, and a limiting knob is installed at the end of the vertical limiting screw rod.

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