Performance detection device for optical system of sequencer

Abstract

The utility model provides a performance detection device of a sequencer optical system. Comprising a supporting assembly which is arranged on a base to support a sequencer optical system, the supporting assembly is detachably connected with the sequencer optical system, and the supporting assembly is used for suspending the sequencer optical system in the Z-axis direction and enabling the optical axis direction of the sequencer optical system to be parallel to the Z-axis direction; the displacement adjusting assembly is arranged on the base, a target plate is carried on the displacement adjusting assembly, the target plate is located between the sequencer optical system and the base, the displacement adjusting assembly comprises an XY moving platform and a Z-axis moving block, and the Z-axis moving block is used for driving the target plate to move along the Z axis; the XY moving platform is used for driving the Z-axis moving block and the target plate to move in the X-axis direction and the Y-axis direction. According to the utility model, the problem that the performance detection device of the sequencer optical system in the prior art is complex in structure is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of optical detection equipment, and in particular to a performance detection device for an optical system of a sequencer. Background Art

[0002] In gene sequencing, the sequencer optical system is the core system and has a great impact on the overall performance indicators of the sequencer. The edge spread function (ESF) of the sequencer optical system is a relatively critical parameter, which represents the focusing ability of the sequencer optical system. Usually, the focal length of a general optical element is a fixed value, but in some cases, considering other factors of the coordination of various components in the sequencer optical system, it is necessary to determine the ESF parameters used in the sequencer optical system. The ESF in the optical system stands for "Effective Focal Length" and can be regarded as the "equivalent" or "comprehensive" focal length of a sequencer optical system, taking into account multiple factors such as refraction, reflection, and lens combination.

[0003] The current detection device for the ESF parameters of the sequencer optical system has many complex structural parts, and the process of determining the ESF parameters of the sequencer optical system is relatively complicated and inefficient, which is not conducive to high-efficiency detection of the ESF parameters of the sequencer optical system.

[0004] That is to say, the performance detection device of the optical system of the sequencer in the prior art has the problem of complex structure. Utility Model Content

[0005] The main purpose of the present utility model is to provide a performance detection device for a sequencer optical system, so as to solve the problem of complex structure of the performance detection device for the sequencer optical system in the prior art.

[0006] To achieve the above-mentioned objectives, the present invention provides a performance detection device for a sequencer optical system, comprising: a base; a support assembly, the support assembly being arranged on the base to support the sequencer optical system and being detachably connected to the sequencer optical system, the support assembly being used to suspend the sequencer optical system in the Z-axis direction and to make the optical axis direction of the sequencer optical system parallel to the Z-axis direction; a displacement adjustment assembly, the displacement adjustment assembly being arranged on the base, the displacement adjustment assembly being equipped with a target plate, and the target plate being located between the sequencer optical system and the base, the displacement adjustment assembly comprising an XY moving platform and a Z-axis moving block arranged on the XY moving platform, the Z-axis moving block being used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions, and the XY moving platform being used to drive the Z-axis moving block and the target plate to move along the X-axis and Y-axis directions so that the sequencer optical system can collect images of the target plate at different XY positions at the same Z-axis position.

[0007] Furthermore, the support assembly includes a support column and a connecting plate. The support column is arranged on the base and is located on the peripheral side of the displacement adjustment assembly. The support column extends along the Z-axis direction. The sequencer optical system is detachably arranged on the support column through the connecting plate.

[0008] Furthermore, the connecting plate has a first clamping portion and a second clamping portion, the connecting plate is connected to the support column via the first clamping portion, and the sequencer optical system is connected to the second clamping portion.

[0009] Furthermore, there are multiple connecting plates, including a first connecting plate and a second connecting plate, the first connecting plate is located between the second connecting plate and the base, the detection device also includes a mounting part, an adjustment barrel and an adapter, the sequencer optical system includes at least a light source, a tube lens, an objective lens and a camera, the light source and the objective lens are detachably connected to the adjustment barrel through the mounting part, the adjustment barrel is clamped on the first connecting plate, the tube lens is clamped on the second connecting plate and one side of the tube lens is detachably connected to the adjustment barrel, and the other side of the tube lens is detachably connected to the camera through the adapter, and the optical axis of the sequencer optical system is parallel to the Z axis.

[0010] Furthermore, an adjustment platform is provided on the Z-axis moving block, and a target plate is mounted on the adjustment platform.

[0011] Furthermore, the displacement adjustment component also includes a stator base and an adapter plate, the XY moving platform is connected to the base through the stator base, and the Z-axis moving block is connected to the XY moving platform through the adapter plate.

[0012] Furthermore, the displacement adjustment assembly also includes a support plate, which is supported between the Z-axis moving block and the adapter plate.

[0013] Furthermore, the Z-axis moving block has a slide rail extending along the Z-axis direction, and the adjustment platform is slidably arranged on the slide rail.

[0014] Furthermore, the adjustment platform includes a pneumatic adsorption structure for adsorbing the target plate.

[0015] Furthermore, the target plate is a resolution plate.

[0016] Applying the technical solution of the present utility model, a performance detection device for a sequencer optical system includes a base, a support assembly, and a displacement adjustment assembly. The support assembly is arranged on the base to support the sequencer optical system and is detachably connected to the sequencer optical system. The support assembly is used to suspend the sequencer optical system in the Z-axis direction and make the optical axis direction of the sequencer optical system parallel to the Z-axis direction; the displacement adjustment assembly is arranged on the base, and a target plate is carried on the displacement adjustment assembly, and the target plate is located between the sequencer optical system and the base. The displacement adjustment assembly includes an XY moving platform and a Z-axis moving block arranged on the XY moving platform. The Z-axis moving block is used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions. The XY moving platform is used to drive the Z-axis moving block and the target plate to move along the X-axis and Y-axis directions so that the sequencer optical system can collect images of the target plate at different XY positions at the same Z-axis position.

[0017] By providing a base, the base provides an installation location for the displacement adjustment assembly and the support assembly, which helps ensure the installation stability of the displacement adjustment assembly and the support assembly, and thus ensures the reliability of the displacement adjustment assembly and the support assembly. The support assembly is used to suspend the sequencer optical system on the Z axis and make the optical axis of the sequencer optical system parallel to the Z axis. The support assembly supports the sequencer optical system, which helps ensure that the optical axis of the sequencer optical system is parallel to the Z axis. The displacement adjustment assembly includes an XY moving platform and a Z axis moving block, and the Z axis moving block is used to drive the target plate to move along the Z axis so that the sequencer optical system can collect images of the target plate at different Z axis positions. The XY moving platform is used to drive the Z axis moving block and the target plate to move along the X axis and the Y axis so that the sequencer optical system can collect images of the target plate at different XY positions under the coordinates enclosed by the X axis and the Y axis at the same Z axis position, thereby determining the ESF of the sequencer optical system based on the collected images. The performance detection device of the sequencer optical system of the present application has the advantages of simple structure, easy assembly, low cost, and can be adapted to a variety of different sequencer optical systems, with strong versatility. The main purpose of the present invention is to provide a method for solving the problems in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The drawings constituting part of this application are provided to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are provided to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0019] Figure 1A A schematic structural diagram of a performance detection device for a sequencer optical system according to an optional embodiment of the present invention is shown;

[0020] Figure 1B Shown Figure 1A A schematic diagram of a performance detection device for the optical system of a sequencer shown in another perspective;

[0021] Figure 2 A flow chart showing an ESF detection method of a sequencer optical system according to an optional embodiment of the present invention is shown;

[0022] Figure 3 A schematic diagram showing a target plate of an ESF detection method of a sequencer optical system according to an optional embodiment of the present invention is shown;

[0023] Figure 4 A schematic diagram showing a blurred image captured during an ESF detection method of a sequencer optical system according to an optional embodiment of the present utility model;

[0024] Figure 5 A schematic diagram showing a clear image captured during an ESF detection method of a sequencer optical system according to an optional embodiment of the present utility model;

[0025] Figure 6 Shown Figure 1B The cross-sectional view of the performance detection device of the sequencer optical system along the AA direction is shown.

[0026] The above drawings include the following reference numerals:

[0027] 10. Base; 20. XY moving platform; 21. X-axis moving plate; 22. Z-axis moving block; 23. Adjustment platform; 24. Stator base; 25. Adapter plate; 26. Support plate; 27. Pneumatic adsorption structure; 28. Y-axis moving plate; 31. Support column; 32. First connecting plate; 33. Second connecting plate; 341. Snap-fit ​​groove; 342. Matching block; 35. Through groove; 36. Mounting part; 361. Dichroic mirror; 37. Adjustment barrel; 38. Adapter; 41. Light source interface; 42. Tube lens; 43. Objective lens; 44. Camera. DETAILED DESCRIPTION

[0028] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in this application can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0029] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meaning as commonly understood by ordinary technicians in the technical field to which this application belongs.

[0030] In the present invention, unless otherwise specified, directional words such as "up, down, top, bottom" are usually used with reference to the directions shown in the drawings, or with reference to the components themselves in the vertical, perpendicular or gravity direction; similarly, for ease of understanding and description, "inside and outside" refer to the inside and outside relative to the outline of each component itself, but the above directional words are not used to limit the present invention.

[0031] In order to solve the problem of complex structure of the performance detection device of the optical system of the sequencer in the prior art, the utility model provides a performance detection device of the optical system of the sequencer.

[0032] like Figures 1A to 6 As shown, the performance detection device for the sequencer optical system includes a base 10, a support assembly, and a displacement adjustment assembly. The support assembly is arranged on the base 10 to support the sequencer optical system and is detachably connected to the sequencer optical system. The support assembly is used to suspend the sequencer optical system in the Z-axis direction and make the optical axis direction of the sequencer optical system parallel to the Z-axis direction; the displacement adjustment assembly is arranged on the base 10, and the displacement adjustment assembly carries a target plate, and the target plate is located between the sequencer optical system and the base 10. The displacement adjustment assembly includes an XY movable platform 20 and a Z-axis movable block 22 arranged on the XY movable platform 20. The Z-axis movable block 22 is used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions. The XY movable platform 20 is used to drive the Z-axis movable block 22 and the target plate to move along the X-axis and Y-axis directions so that the sequencer optical system can collect images of the target plate at different XY positions at the same Z-axis position.

[0033] The base 10 provides a mounting location for the displacement adjustment assembly and the support assembly, which helps ensure the installation stability of the displacement adjustment assembly and the support assembly, thereby ensuring the reliability of the displacement adjustment assembly and the support assembly. The support assembly is used to suspend the sequencer optical system in the Z-axis direction and make the optical axis of the sequencer optical system parallel to the Z-axis direction. The support assembly helps ensure that the optical axis of the sequencer optical system is parallel to the Z-axis direction. The displacement adjustment assembly includes an XY moving platform 20 and a Z-axis moving block 22. The Z-axis moving block 22 is used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions. The XY moving platform 20 is used to drive the Z-axis moving block 22 and the target plate to move along the X-axis and Y-axis directions so that the sequencer optical system can collect images of the target plate at different XY positions under the coordinates enclosed by the X-axis and Y-axis directions at the same Z-axis position, thereby determining the effective focal length of the sequencer optical system based on the collected images. The performance detection device of the sequencer optical system of the present application has the advantages of simple structure, easy assembly, and low cost, and can be adapted to a variety of different sequencer optical systems and has strong versatility.

[0034] like Figure 1A As shown, the support assembly includes a support column 31 and a connecting plate. The support column 31 is arranged on the base 10 and is fixedly connected to the base 10. The support column 31 is located on the peripheral side of the displacement adjustment assembly. The support column 31 extends in the direction of the Z axis. The optical axis direction of the sequencer optical system is parallel to the Z axis direction. The sequencer optical system is detachably arranged on the support column 31 through the connecting plate. Specifically, the connecting plate is detachably arranged on the support column 31, and the sequencer optical system is detachably arranged on the connecting plate. Such an arrangement is conducive to ensuring the installation stability of the sequencer optical system, and at the same time enables the detection device of the present application to be adapted to various types of sequencer optical systems. During the test process, the sequencer optical system can be installed on the connecting plate. By adjusting the connecting plate or adjusting the position of the sequencer optical system on the connecting plate, the preliminary adjustment of the sequencer optical system is achieved, so that the target plate is located on the optical axis of the sequencer optical system, so that the sequencer optical system can capture an image of the target plate.

[0035] Specifically, the connecting plate has a first clamping portion and a second clamping portion. The connecting plate is connected to the support column 31 via the first clamping portion, and the sequencer optical system is connected to the second clamping portion. In a specific embodiment of the present application, the first clamping portion includes a clamping groove 341, a matching block 342 and a locking member. The clamping groove 341 is used to clamp and cooperate with the connecting column. The matching block 342 is set at the notch of the clamping groove 341. The matching block 342 and the clamping groove 341 are provided with relatively arranged threaded holes on the portion where the matching block 342 and the clamping groove 341 are located. The locking member can be a bolt. The bolt passes through the threaded hole. By screwing the bolt, the connecting plate is locked to the support column 31, thereby realizing a stable connection between the connecting plate and the support column 31. Figure 1A As shown, the second clamping portion is a through slot 35 .

[0036] like Figure 1A As shown, there are multiple connecting plates, including a first connecting plate 32 and a second connecting plate 33. The first connecting plate 32 is identical to the second connecting plate 33. The first connecting plate 32 is located between the second connecting plate 33 and the base 10. The detection device also includes a mounting member 36, an adjustment barrel 37, and an adapter 38. The sequencer optical system includes at least a light source, a tube lens 42, an objective lens 43, and a camera 44. The light source and the objective lens 43 are detachably connected to the adjustment barrel 37 through the mounting member 36. Specifically, the light source and the objective lens 43 are both detachably mounted on the mounting member 36. The mounting member 36 is in the shape of a cube. The objective lens 43 is mounted on a side surface of the mounting member 36 facing the base 10, and the light source is mounted on a surface perpendicular to the surface of the mounting member 36 where the objective lens 43 is located. Figure 6A dichroic mirror 361 is provided in the mounting part 36. The light source is connected through the light source interface 41 and the emitted light is reflected by the dichroic mirror 361 to the objective lens 43. The light of the target plate collected by the objective lens 43 is transmitted by the dichroic mirror 361 and further propagated along the optical path of the optical system, thereby realizing the test of the optical system of the confocal sequencer.

[0037] Specifically, the adjustment barrel 37 is mounted on the first connecting plate 32, and the end of the adjustment barrel 37 facing the base 10 is connected to the mounting member 36. The cylindrical lens 42 is mounted on the second connecting plate 33, and one side of the cylindrical lens 42 is detachably connected to the other end of the adjustment barrel 37. The other side of the cylindrical lens 42 is detachably connected to the camera 44 via an adapter 38. The optical axis of the sequencer optical system is parallel to the Z axis. This arrangement, through the mounting member 36, the adjustment barrel 37, and the adapter 38, allows the multiple components of the sequencer optical system to be assembled together, achieving mutual coordination between the components and facilitating subsequent detection work.

[0038] In the present application, the number of connecting plates is two, and of course one or more connecting plates can be provided according to actual needs.

[0039] like Figure 1A As shown, an adjustment platform 23 is provided on the Z-axis moving block 22, and the Z-axis moving block 22 is provided on the side surface of the XY moving platform 20 away from the base 10. The adjustment platform 23 is movably provided on the Z-axis moving block 22 along the Z-axis direction. The adjustment platform 23 is equipped with a target plate. Specifically, the adjustment platform 23 has a pneumatic adsorption structure 27, and the pneumatic adsorption structure 27 is used to adsorb the target plate. The XY moving platform 20 cooperates with the Z-axis moving block to realize the movement of the target plate on the X-axis, Y-axis and Z-axis, and realizes the movement of the target plate relative to the sequencer optical system, thereby realizing the focusing of the sequencer optical system.

[0040] Specifically, the XY platform 20 includes a stator base 24, a Y-axis moving plate 28, and an X-axis moving plate 21 stacked from bottom to top, as well as a Y-guide rail disposed between the stator base 24 and the Y-axis moving plate 28, and an X-guide rail disposed between the Y-axis moving plate 28 and the X-axis moving plate 21. An adapter plate 25 and a support plate 26 are provided between the Z-axis moving block 22 and the XY platform. The XY platform 20 is connected to the base 10 via the stator base 24, and the Z-axis moving block 22 is connected to the XY platform 20 via the adapter plate 25. The support plate 26 is supported between the Z-axis moving block 22 and the adapter plate 25. The Z-axis moving block 22 extends along the Z-axis direction, and the support plate 26 is composed of two vertically connected plates and a triangular prism. The two vertically connected plates are respectively fitted with the Z-axis moving block 22 and the adapter plate 25. The two surfaces of the edge formed by the triangular prism are respectively overlapped with the two vertically connected plates to form a support for the Z-axis moving block 22, thereby ensuring the reliability of the use of the Z-axis moving block 22.

[0041] Specifically, the Z-axis moving block 22 has a slide rail extending along the Z-axis direction, and the adjustment platform 23 is slidably arranged on the slide rail. Optionally, a slider that slides with the slide rail is provided on the slide rail, and the adjustment platform 23 is connected to the slider, and the adjustment platform 23 is always parallel to the base 10.

[0042] In the present application, the target plate is a resolution plate.

[0043] In addition, if Figures 2 to 5 As shown, the present application also provides an ESF detection method for a sequencer optical system, comprising using the above-mentioned detection device having a displacement adjustment component and a support component to perform the following steps:

[0044] The target plate is mounted on the displacement adjustment assembly, and the components of the sequencer optical system are mounted on the support assembly along the optical axis, so that the sequencer optical system is suspended above the target plate. The sequencer optical system includes a light source, an objective lens 43, and a camera 44.

[0045] The displacement adjustment component is driven to move the target plate along a plane perpendicular to the optical axis of the sequencer optical system, so that the target plate and the sequencer optical system are aligned along the optical axis.

[0046] Control the light source to emit excitation light of a predetermined wavelength toward the target plate, where the wavelength of the excitation light corresponds to the excitation wavelength of the fluorescent substance of the sample to be detected by the sequencer;

[0047] A displacement adjustment component is used to adjust the position of the target plate along the optical axis, and different images of the target plate captured by the camera 44 when the target plate is at different positions along the optical axis are obtained. According to the changes in the clarity of the different images, the image corresponding to the ESF of the sequencer optical system is determined; the detection method also includes: determining the ROI based on the image corresponding to the ESF parameter, calculating the average value of the pixel values ​​in the predetermined direction of the ROI, and obtaining the ESF curve based on the average value of the pixel values.

[0048] It should be noted that the detection device is preferably the above Figures 1A-1B as well as Figure 6The performance testing device for the sequencer optical system is shown. The support assembly is used to suspend the sequencer optical system in the Z-axis direction and make the optical axis direction of the sequencer optical system parallel to the Z-axis direction. The displacement adjustment assembly includes an XY moving platform 20 and a Z-axis moving block 22. The Z-axis moving block 22 is used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions. The XY moving platform 20 is used to drive the Z-axis moving block 22 and the target plate to move along the X-axis and Y-axis directions so that the sequencer optical system can collect images of the target plate at different XY positions in the coordinates defined by the X-axis and Y-axis directions at the same Z-axis position. Based on the changes in the clarity of the different images, images corresponding to the ESF parameters of the sequencer optical system are determined; a ROI is determined based on the image corresponding to the ESF parameters, and the average pixel values ​​in the predetermined direction of the ROI are calculated. The ESF curve is obtained based on the average pixel values.

[0049] Specifically, the light source of the optical system to be tested is connected via the light source interface 41 and may include at least a first laser emitting excitation light of a first wavelength and a second laser emitting excitation light of a second wavelength. The first and second wavelength excitation lights are used to correspond to different fluorescent substances in the sample to be tested in the sequencer, respectively. Controlling the light source to emit excitation light of a predetermined wavelength toward the target plate includes: during time period t1, turning on the first laser to emit excitation light of the first wavelength toward the target plate; during time period t2, turning on the second laser to emit excitation light of the second wavelength toward the target plate. In a specific embodiment of the present application, the first laser is a green laser that emits green light. The second laser is a red laser that emits red light. The light source can emit laser light of a specified wavelength according to actual needs. In the embodiment of the present application, the red and green lasers can be turned on alternately to detect the ESF of the sequencer optical system under laser light of different wavelengths. For different sequencers, the light source may be different, and only one wavelength of laser light may be measured, or more laser light may be measured. The laser wavelength is related to the type of dye in the nucleic acid library detected by the sequencer.

[0050] Specifically, the process of “adjusting the position of the target plate along the optical axis using a displacement adjustment component, obtaining different images of the target plate captured by the camera 44 when the target plate is at different positions along the optical axis, and determining the image corresponding to the ESF of the sequencer optical system based on the changes in clarity of the different images” includes:

[0051] During time period t1, the incident direction of the light source through the light source interface 41 is first adjusted, and the position of the tube lens 42 is adjusted so that the target plate falls into the imaging plane of the camera 44. Then, the position of the target plate is adjusted along the optical axis using the displacement adjustment component. Different images of the target plate are captured by the camera 44 when the target plate is at different positions along the optical axis. Based on the changes in the clarity of the different images, the ESF parameters of the sequencer optical system corresponding to the first wavelength of excitation light are determined.

[0052] During the t2 period, the position of the target plate is adjusted along the optical axis using a displacement adjustment component to obtain different images of the target plate captured by the camera 44 when the target plate is at different positions along the optical axis. The ESF parameters of the sequencer optical system corresponding to the second wavelength excitation light are determined based on the clarity changes of the different images.

[0053] Specifically, the process of "obtaining different images of the target plate captured by the camera 44 when the target plate is at different positions along the optical axis, and determining the image corresponding to the ESF of the sequencer optical system based on the changes in the clarity of the different images" includes:

[0054] At at least a first position in the optical axis direction, the target plate is translated in a direction perpendicular to the optical axis, and images are taken of at least three positions on different axes of the target plate. The image clarity at the first position is determined based on the imaging quality of the at least three positions.

[0055] Specifically, the process of "imaging at least three positions on different axes of the target plate and determining the image clarity at the first position based on the imaging quality of the at least three positions" includes:

[0056] When the imaging quality difference at at least three positions exceeds a threshold, the target plate is translated in a direction perpendicular to the optical axis and images at multiple positions are acquired until the imaging quality difference between more than half of all images acquired at the first position of the optical axis is less than the threshold.

[0057] refer to Figure 3 As shown in FIG, in the process of determining the ESF of the sequencer optical system corresponding to the first wavelength excitation light according to the clarity of different images, Figure 3 Center the image indicated by the arrows and move the image to the upper right, upper left, center, lower left, and lower right of the field of view. Adjust the image to its sharpest setting and capture and save five images. Then, switch to the second excitation light source and save five images using the same pattern. Determine the ESF of the sequencer's optical system based on the saved images.

[0058] Specifically, in the above-mentioned process of adjusting the image to the clearest state, by adjusting the moving position of the target plate on the Z axis, images of different clarity can be formed on the camera 44, but when three consecutive images show changes from blurry, clear, and blurry, it can be considered that the image at the middle clear position is the image of the ESF corresponding to the sequencer optical system. Figure 4 A blurred and unclear image is shown. It can be seen from the figure that the shadow area in the rectangular frame is large. Figure 5The image shows a clear image, as can be seen by the small shaded area within the rectangular box. Each image is tested for ESF. If the difference in imaging quality in two different directions is less than the threshold, the image is considered to have passed the ESF test. If the image quality difference exceeds the tolerance during actual testing, the box is opened several times. A pass is considered when the difference in imaging quality between more than half of all images captured at the first optical axis position is less than the threshold.

[0059] In addition, the above-mentioned process of "the displacement adjustment assembly includes an XY moving platform 20 and a Z-axis moving block 22 and a pneumatic adsorption structure 27 provided on the XY moving platform 20, wherein the Z-axis moving block 22 drives the pneumatic adsorption structure 27 to move along the Z-axis, which is parallel to the optical axis; and the target plate is mounted on the displacement adjustment assembly" includes:

[0060] The target plate is placed on the pneumatic adsorption structure 27 , and the pneumatic adsorption structure 27 adsorbs and fixes the target plate.

[0061] In addition, the process of “mounting the components of the sequencer optical system on the support assembly along the optical axis so that the sequencer optical system is suspended above the target plate” includes:

[0062] The objective lens 43 is suspended above the target plate, and the light source is detachably connected to the support assembly via the light source interface 41, so that the light source emits excitation light toward the target plate through the objective lens 43, and the camera 44 is located on the side of the objective lens 43 away from the target plate.

[0063] Specifically, the sequencer optical system further includes a tube lens 42 detachably disposed between a camera 44 and an objective lens 43. The sequencer optical system is detachably connected to the support assembly. The method further includes adjusting the relative position of the light source and the objective lens 43 so that the light source and the objective lens 43 are coaxially disposed.

[0064] It should also be noted that the aforementioned sequencer optical system is a gene sequencer optical system, and the sequencer optical system performance detection device of this application is primarily used for ESF detection and performance testing and verification of gene sequencer optical systems. Of course, ESF detection of other sequencer optical systems can also be implemented based on actual needs. The detection device of this application has the characteristics of simple structure, low cost, small footprint, and portability. It can adapt to the needs of a variety of different sequencer optical systems and is very suitable for conducting performance verification of sequencer optical systems of multiple models and solutions.

[0065] Obviously, the embodiments described above are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0066] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, they indicate the presence of features, steps, tasks, devices, components and / or combinations thereof.

[0067] It should be noted that the terms "first," "second," and the like in the specification and claims of this application and the accompanying drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or precedence. It should be understood that the terms used in this manner are interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein.

[0068] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Those skilled in the art will readily appreciate that the present invention is susceptible to various modifications and variations. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A performance detection device for a sequencer optical system, characterized in that: include: Base (10); A support assembly, the support assembly being arranged on the base (10) to support the sequencer optical system, and the support assembly being detachably connected to the sequencer optical system, and the support assembly being used to suspend the sequencer optical system in the Z-axis direction and to make the optical axis direction of the sequencer optical system parallel to the Z-axis direction; A displacement adjustment component is provided on the base (10), a target plate is mounted on the displacement adjustment component, and the target plate is located between the sequencer optical system and the base (10), the displacement adjustment component comprises an XY moving platform (20) and a Z-axis moving block (22) provided on the XY moving platform (20), the Z-axis moving block (22) is used to drive the target plate to move along the Z-axis so that the sequencer optical system can collect images of the target plate at different Z-axis positions, and the XY moving platform (20) is used to drive the Z-axis moving block (22) and the target plate to move along the X-axis direction and the Y-axis direction so that the sequencer optical system can collect images of the target plate at different XY positions at the same Z-axis position.

2. The performance detection device of the sequencer optical system according to claim 1, characterized in that: The support assembly comprises a support column (31) and a connecting plate. The support column (31) is arranged on the base (10) and is located on the peripheral side of the displacement adjustment assembly. The support column (31) extends along the Z-axis direction. The sequencer optical system is detachably arranged on the support column (31) via the connecting plate.

3. The performance detection device of the sequencer optical system according to claim 2, characterized in that: The connecting plate has a first clamping portion and a second clamping portion. The connecting plate is connected to the supporting column (31) via the first clamping portion, and the sequencer optical system is connected to the second clamping portion.

4. The performance detection device for the sequencer optical system according to claim 2, characterized in that: There are multiple connecting plates, and the multiple connecting plates include a first connecting plate (32) and a second connecting plate (33). The first connecting plate (32) is located between the second connecting plate (33) and the base (10). The detection device also includes a mounting member (36), an adjusting lens barrel (37) and an adapter (38). The sequencer optical system at least includes a light source, a tube lens (42), an objective lens (43) and a camera (44). The light source and the objective lens (43) are detachably connected to the adjusting lens barrel (37) through the mounting member (36). The adjusting lens barrel (37) is clamped on the first connecting plate (32). The tube lens (42) is clamped on the second connecting plate (33) and one side of the tube lens (42) is detachably connected to the adjusting lens barrel (37). The other side of the tube lens (42) is detachably connected to the camera (44) through the adapter (38). The optical axis of the sequencer optical system is parallel to the Z axis.

5. The performance detection device for the sequencer optical system according to claim 1, characterized in that: An adjustment platform (23) is provided on the Z-axis moving block (22), and the target plate is mounted on the adjustment platform (23).

6. The performance detection device for the sequencer optical system according to claim 1, characterized in that: The displacement adjustment assembly further comprises a stator base (24) and an adapter plate (25); the XY movable platform (20) is connected to the base (10) via the stator base (24); and the Z-axis movable block (22) is connected to the XY movable platform (20) via the adapter plate (25).

7. The performance detection device for the sequencer optical system according to claim 6, characterized in that: The displacement adjustment assembly further includes a support plate (26), and the support plate (26) is supported between the Z-axis moving block (22) and the adapter plate (25).

8. The performance detection device for the sequencer optical system according to claim 5, characterized in that: The Z-axis moving block (22) has a slide rail extending along the Z-axis direction, and the adjustment platform (23) is slidably arranged on the slide rail.

9. The performance detection device for the sequencer optical system according to claim 5, characterized in that: The adjustment platform (23) includes a pneumatic adsorption structure (27) for adsorbing the target plate.

10. The performance detection device of the sequencer optical system according to claim 9, characterized in that: The target plate is a resolution plate.

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