Needle dial and composite jig

Abstract

The utility model relates to the technical field of PCB measuring jigs, in particular to a dial and a composite jig. The dial comprises a first plate, a second plate, a probe and a positioning column, the second plate is arranged on one side of the first plate in the first direction, and the side, away from the second plate, of the first plate is used for placing a to-be-detected plate; the probe is mounted on the first plate, and the probe is used for being electrically connected with a to-be-tested position of a to-be-detected plate; a first positioning hole is formed in the first plate in the first direction, the positioning column is installed on the second plate, the positioning column is inserted into the first positioning hole, and the positioning column is used for being connected with a to-be-detected plate; and a first gap is formed between the peripheral surface of the positioning column and the hole wall of the first positioning hole, so that the second plate can drive the to-be-detected plate to move along the radial direction of the first positioning hole. The fixture can be used on a machine without a fine tuning function, and the testing capability of the fixture can be improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of PCB measuring jigs, in particular to a needle disk and a composite jig. Background Art

[0002] Printed circuit boards (PCBs) are the substrates on which electronic components are mounted. To ensure PCB quality, they are tested using jigs after fabrication. There are two types of composite jigs: conventional jigs, which lack fine-tuning capabilities and are used on machines without them. Fine-tuning jigs, which do have fine-tuning capabilities, can only be used on machines with them. Because machines with fine-tuning capabilities are more expensive than those without, some customers choose machines without them.

[0003] Currently, when a PCB expands or contracts, causing the test position to shift, the corresponding fixture probes cannot maintain a stable electrical connection with the test position on the PCB during testing on machines without fine-tuning capabilities, affecting test accuracy. Different batches of PCBs expand or shrink to varying degrees, and the offset positions of the test positions on these batches of PCBs after expansion and contraction also vary. To accurately test expanded and contracted PCBs, the fixture panel must be replaced for each batch of PCBs with different expansion and contraction sizes. Holes must be re-drilled and probes installed in the panel to ensure that the fixture probes can maintain a stable electrical connection with the test position on the PCB after the panel is replaced, completing the test of the expanded and contracted PCBs. Replacing the panel to test PCBs with different expansion and contraction sizes increases testing time and cost, resulting in lower testing capabilities. Utility Model Content

[0004] The technical problem to be solved by the present invention is that in view of the problem that in the prior art, a machine without fine-tuning function needs to be re-drilled in the corresponding fixture during testing, resulting in low testing capability, a needle disk and a composite fixture are provided.

[0005] To solve the above technical problems, on the one hand, an embodiment of the present utility model provides a needle plate, comprising a first plate, a second plate, a probe and a positioning post, wherein the second plate is arranged on one side of the first plate along a first direction, and a side of the first plate facing away from the second plate is used for placing a plate to be detected;

[0006] The probe is mounted on the first plate, and the probe is used to be electrically connected to the position to be tested of the plate to be tested;

[0007] The first plate is provided with a first positioning hole along the first direction, the positioning post is installed on the second plate, the positioning post is inserted into the first positioning hole, and the positioning post is used to connect with the plate to be detected;

[0008] A first gap is defined between the outer circumferential surface of the positioning post and the wall of the first positioning hole, so that the second plate can drive the plate to be detected to move along the radial direction of the first positioning hole.

[0009] Optionally, a first pinhole matching the probe is provided on the first plate, and a second pinhole is provided on the second plate. The probe is installed in the first pinhole and the second pinhole, and the outer peripheral surface of the probe fits into the hole wall of the first pinhole. There is a second gap between the outer peripheral surface of the probe and the hole wall of the second pinhole.

[0010] Optionally, the needle disk also includes a third plate, which is arranged between the first plate and the second plate, and a third pinhole and a third positioning hole are provided on the third plate. The probe is inserted into the third pinhole, and the outer peripheral surface of the probe fits into the hole wall of the third pinhole; the positioning column is installed in the third positioning hole, and there is a third gap between the outer peripheral surface of the positioning column and the hole wall of the third positioning hole.

[0011] Optionally, the needle disk also includes a fourth plate, which is arranged between the first plate and the second plate. Along the second direction, the size of the first plate and the size of the second plate are both larger than the size of the fourth plate. A fourth pinhole matching the probe is provided on the fourth plate, and the probe is installed in the fourth pinhole. The outer peripheral surface of the probe fits into the hole wall of the fourth pinhole; the positioning column is located outside the fourth plate along the second direction, and the first direction is perpendicular to the second direction.

[0012] Optionally, the needle disk also includes a fastener, the first plate is provided with a first fine-tuning hole group, and the second plate is provided with a second fine-tuning hole group. When the probe is electrically connected to the test position of the plate to be tested, the second fine-tuning hole group is opposite to the first fine-tuning hole group, and the fastener is used to be inserted into the first fine-tuning hole group and the second fine-tuning hole group.

[0013] Optionally, the first plate and the second plate are both square, the first plate is provided with the first fine-tuning hole groups at the four corners, and the second plate is provided with the second fine-tuning hole groups at the four corners.

[0014] Optionally, the first fine-tuning hole group includes a plurality of first adjustment holes spaced apart in pairs, and the plurality of first adjustment holes are arranged in a square array;

[0015] The second fine-tuning hole group includes a plurality of second adjustment holes spaced apart in pairs, and the plurality of second adjustment holes are arranged in a square array.

[0016] Optionally, the needle disk further includes a plate group, the plate group is arranged on a side of the second plate facing away from the first plate, the plate group includes multiple layers of plates arranged along the first direction, each layer of the plates is provided with a first mounting hole matching the probe, the probe is installed in the first mounting hole of each layer of the plates, and the outer peripheral surface of the probe is in contact with the hole wall of the first mounting hole;

[0017] Each layer of the plate is provided with a second mounting hole, the positioning post is installed in the second mounting hole of each layer of the plate, and a fourth gap is formed between the outer peripheral surface of the positioning post and the hole wall of the second mounting hole;

[0018] Alternatively, along the second direction, the size of the first plate and the size of the second plate are both larger than the size of the plate group, the positioning column is located outside the plate group along the second direction, and the first direction is perpendicular to the second direction.

[0019] Optionally, the first gap is 0.008 mm to 0.03 mm; the second gap is 1.0 mm to 2.0 mm; the third gap is 0.008 mm to 0.03 mm; and the fourth gap is 0.008 mm to 0.03 mm.

[0020] According to the needle disk of this embodiment, the plate to be tested is placed on the first plate, and the positioning post passes through the first positioning hole to connect with the plate to be tested and position the plate to be tested. This embodiment leaves a gap between the positioning post and the first positioning hole so that the positioning post can move radially along the first positioning hole. When the position to be tested of the plate to be tested is offset due to thermal expansion or contraction, the tester moves the second plate along the direction of the aperture of the first positioning hole to move the plate to be tested connected to the positioning post along the direction of the aperture of the first positioning hole, thereby enabling the probe to better contact the position to be tested on the plate to be tested, and thus the electrical properties of the plate to be tested can be tested more accurately. The needle disk of this embodiment can be used on a machine without a fine-tuning function, and there is no need to drill holes on the wire disk, so that accurate testing of the offset plate to be tested can be achieved, thereby improving the testing capability and yield of the fixture. It also reduces the time and cost of handling offsets.

[0021] On the other hand, an embodiment of the present invention provides a composite fixture, including a wire drum, a base plate, a pillar and the above-mentioned needle disk, wherein the wire drum is detachably connected to the needle disk, and the wire drum is mounted on the base plate through the pillar. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a structural schematic diagram of an exploded view of a composite fixture provided by an embodiment of the present invention from a first perspective;

[0023] Figure 2 This is a structural schematic diagram of a second perspective of an exploded view of a composite fixture provided by an embodiment of the present invention;

[0024] Figure 3 This is a structural schematic diagram of an exploded view of a composite fixture provided by another embodiment of the present invention from a first perspective;

[0025] Figure 4 This is a structural schematic diagram of a second perspective of an exploded view of a composite fixture provided by another embodiment of the present invention;

[0026] Figure 5 This is a schematic diagram of the connection relationship between the probe and the second plate provided in one embodiment of the present utility model;

[0027] Figure 6 yes Figure 2 A magnified view of A;

[0028] Figure 7 yes Figure 2 An enlarged view of B;

[0029] Figure 8 yes Figure 2 Enlarged view of C;

[0030] Figure 9 yes Figure 2 The enlarged view of D;

[0031] Figure 10 yes Figure 3 Enlarged view of E;

[0032] Figure 11 yes Figure 3 The enlarged view of F;

[0033] Figure 12 This is a structural diagram of a composite fixture provided by an embodiment of the present utility model;

[0034] Figure 13 It is a structural schematic diagram of an exploded view of a composite fixture provided by another embodiment of the present invention.

[0035] The reference numerals in the specification are as follows:

[0036] 1. First plate; 2. Second plate; 3. Probe; 4. Positioning post; 5. First gap; 6. Second gap; 7. Third plate; 8. Fourth plate; 10. Plate group; 11. First positioning hole; 12. First pinhole; 21. Second pinhole; 71. Third positioning hole; 72. Third pinhole; 91. Fastener; 92. First fine-tuning hole group; 93. Second fine-tuning hole group; 100. Needle disk; 200. Wire disk; 101. First mounting hole; 102. Second mounting hole; 300. Base plate; 400. Pillar; 921. First adjustment hole; 931. Second adjustment hole. DETAILED DESCRIPTION

[0037] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0038] like Figures 1 to 13 As shown, an embodiment of the present invention provides a needle disk 100, comprising a first plate 1, a second plate 2, a probe 3 and a positioning post 4, wherein the second plate 2 is arranged on one side of the first plate 1 along a first direction, and the side of the first plate 1 facing away from the second plate 2 is used to place a plate to be tested;

[0039] The probe 3 is mounted on the first plate 1 and is used to electrically connect to the position to be detected of the plate to be detected;

[0040] The first plate 1 is provided with a first positioning hole 11 along a first direction, and the positioning post 4 is installed on the second plate 2. The positioning post 4 is inserted into the first positioning hole 11, and the positioning post 4 is used to connect with the plate to be detected;

[0041] A first gap 5 is defined between the outer circumference of the positioning post 4 and the wall of the first positioning hole 11, enabling the second plate 2 to move the panel to be inspected radially along the first positioning hole 11. In this embodiment, the first direction is the thickness direction of the first plate 1. The second plate 2 is provided with a second positioning hole that matches the positioning post 4, and the positioning post 4 is installed in the second positioning hole. Preferably, there is no gap between the second positioning hole and the positioning post 4 in the radial direction of the second positioning hole. In this embodiment, the panel to be inspected may be a PCB.

[0042] In one embodiment, a first pinhole 12 matching the probe 3 is provided on the first plate 1, and a second pinhole 21 is provided on the second plate 2. The probe 3 is installed in the first pinhole 12 and the second pinhole 21. The outer peripheral surface of the probe 3 is in contact with the hole wall of the first pinhole 12, and a second gap 6 is defined between the outer peripheral surface of the probe 3 and the hole wall of the second pinhole 21. In this embodiment, by providing the second gap 6 between the probe 3 and the second pinhole 21, the probe 3 does not move when the second plate 2 moves the panel to be inspected. This allows the panel to be inspected to move relative to the probe 3, thereby enabling a deviated panel to be inspected to be moved to a desired position for inspection.

[0043] In one embodiment, the needle disk 100 further includes a third plate 7, which is disposed between the first plate 1 and the second plate 2. The third plate 7 is provided with a third pinhole 72 and a third positioning hole 71. The probe 3 is inserted into the third pinhole 72, with the outer circumference of the probe 3 conforming to the wall of the third pinhole 72. The positioning post 4 is installed in the third positioning hole 71, with a third gap between the outer circumference of the positioning post 4 and the wall of the third positioning hole 71. In this embodiment, the third plate 7 is preferably a fiberboard. The third plate 7 can support the probe 3. By providing the third gap between the positioning post 4 and the wall of the third positioning hole 71, the first plate 1 and the third plate 7 remain stationary when the tester moves the second plate 2.

[0044] In one embodiment, the needle disk 100 further includes a fourth plate 8, which is disposed between the first plate 1 and the second plate 2. Along the second direction, the dimensions of the first plate 1 and the second plate 2 are both larger than those of the fourth plate 8. A fourth pinhole is provided on the fourth plate 8, which matches the probe 3. The probe 3 is mounted in the fourth pinhole, with the outer circumference of the probe 3 contacting the wall of the fourth pinhole. The positioning post 4 is located outside the fourth plate 8 along the second direction, with the first direction being perpendicular to the second direction. In this embodiment, the first plate 1, the second plate 2, and the fourth plate 8 are preferably square plates, and the second direction is preferably the length of the first plate 1. By designing the first plate 1 and the second plate 2 to be larger than the fourth plate 8, positioning holes for mounting the positioning post 4 are not required on the four plates 8. The locations where the first plate 1 and the second plate 2 extend beyond the third plate 7 can also provide mounting locations for the first fine-tuning hole group 92 and the second fine-tuning hole group 93, respectively. In addition, a supporting plate can be provided on the side of the first plate 1 facing away from the second plate 2, and the plate to be tested is placed on the supporting plate. A pinhole matching the probe 3 is provided on the supporting plate, and the probe 3 is installed in the pinhole of the supporting plate. The outer peripheral surface of the probe 3 fits with the hole wall of the pinhole of the supporting plate. A positioning hole is provided on the supporting plate, and the positioning column 4 is installed in the positioning hole of the supporting plate. There is a gap between the positioning column and the hole wall of the positioning hole of the supporting plate, or the size of the supporting plate in the second direction is smaller than the size of the first plate 1 and the size of the second plate 2, and the positioning column 3 is located outside the supporting plate along the second direction. When the positioning column 4 is moved in the first positioning hole 11 of the first plate, the supporting plate does not move. When no supporting plate is set on the first plate 1, the first plate 1 supports the plate to be detected. The first plate 1 of the present application can be the topmost plate (corresponding to the panel in the background technology). When a supporting plate is set on the first plate 1, the supporting plate supports the plate to be detected. The first plate 1 of the present application is a non-topmost plate, that is, the first plate 1 of the present application is not necessarily the topmost plate. The first plate 1 and the second plate 2 can be composed of any two layers of plates. The relative movement of the two can be achieved by making the dimensions of the first plate 1 and the second plate 2 in the second direction larger than those of other plates, or by setting corresponding through holes on other plates.

[0045] In one embodiment, the needle plate 100 includes a fastener 91, a first plate 1 is provided with a first fine-tuning hole group 92, and a second plate 2 is provided with a second fine-tuning hole group 93. When the probe 3 is electrically connected to the test position of the plate to be tested, the second fine-tuning hole group 93 is opposite to the first fine-tuning hole group 92, and the fastener 91 is used to be inserted into the first fine-tuning hole group 92 and the second fine-tuning hole group 93. In this embodiment, the position and number of the fine-tuning hole groups are not fixed and can be freely arranged according to the area size of the test fixture. That is, the position of the fine-tuning hole group can be as follows Figure 1The arrangement shown is at the four corners of the plate, and can also be arranged at other positions of the plate according to requirements. The number of the fine-tuning hole groups can be four as shown in the accompanying drawings, and can also be set to other numbers according to requirements.

[0046] In one embodiment, the first plate 1 and the second plate 2 are both square, the first plate 1 is provided with a first fine-tuning hole group 92 at each of its four corners, and the second plate 2 is provided with a second fine-tuning hole group 93 at each of its four corners.

[0047] In one embodiment, the first fine-tuning hole group 92 includes a plurality of first adjustment holes 921 , and the plurality of first adjustment holes 921 are arranged in a square array;

[0048] The second fine-tuning hole group 93 includes a plurality of second adjustment holes 931 spaced apart in pairs, and the plurality of second adjustment holes 931 are arranged in a square array. In this embodiment, the arrangement of the first adjustment holes 921 and the second adjustment holes 931 is not limited to that shown in the accompanying drawings and can be separated and arranged in other shapes.

[0049] In one embodiment, the needle disk 100 further includes a plate group 10, which is disposed on a side of the second plate 2 facing away from the first plate 1. The plate group 10 includes multiple layers of plates arranged along a first direction, each layer of the plates being provided with a first mounting hole 101 that matches the probe 3. The probe 3 is mounted in the first mounting hole 101 of each layer of the plates, with the outer peripheral surface of the probe 3 being in contact with the wall of the first mounting hole 101.

[0050] Each layer of the plate is provided with a second mounting hole 102, and the positioning column 4 is installed in the second mounting hole 102 of each layer of the plate. A fourth gap is formed between the outer peripheral surface of the positioning column 4 and the hole wall of the second mounting hole 102;

[0051] Alternatively, along the second direction, the dimensions of the first plate 1 and the second plate 2 are both larger than the dimensions of the plate assembly 10, and the positioning posts 4 are located outside the plate assembly 10 along the second direction, with the first direction being perpendicular to the second direction. In this embodiment, when the first plate 1, the second plate 2, and the plate assembly 10 are connected, each layer of plate can be provided with a second mounting hole 102 for the positioning posts 4 to pass through, so that the positioning posts 4 are installed in the second mounting hole 102. Alternatively, the dimensions of each layer of plate in the second direction can be smaller than the dimensions of the first plate 1 and the second plate 2, and no second mounting hole 102 is provided on each layer of plate, so that the positioning posts 4 are located outside each layer of plate. The plate group 10 of this embodiment includes 6 layers of fiberboard, and the plate groups 10 of other embodiments include 2 layers, 3 layers, 4 layers of fiberboard or other number of layers of fiberboard. The number of layers of fiberboard in the plate group 10 is related to the length of the probe 3 extending out of the second plate 2. The longer the length of the probe 3 extending out of the second plate 2, the more layers of fiberboard in the plate group 10, and vice versa. In this way, the length of the fiberboard exposed by the probe 3 from the fiberboard is prevented from being too long, so that the needle disk 100 and the wire disk 200 cause unnecessary damage to the probe 3.

[0052] In one embodiment, the first gap 5 is 0.008mm to 0.03mm; the second gap 6 is 1.0mm to 2.0mm; the third gap is 0.008mm to 0.03mm; and the fourth gap is 0.008mm to 0.03mm. For example, the first gap 5 can be 0.008mm, 0.010mm, 0.012mm, 0.014mm, 0.016mm, 0.018mm, 0.020mm, 0.022mm, 0.024mm, 0.026mm, 0.028mm or 0.03mm; the second gap 6 can be 1.0mm, 1.1mm, 1.2mm, 1.3mm, 1.4mm, 1.5mm, 1.6mm, 1.7mm, 1.8mm, 1.9mm or 2.0mm; the third gap can be 0.008mm, 0.010mm, 0.012mm, 0.014mm, 0.016mm, 0.018mm, 0.020mm, 0.022mm, 0.024mm, 0.026mm, 0.028mm or 0.03mm; The first gap 5, the second gap 6, the third gap 6 and the fourth gap 6 can also be other values. According to the needle disk 100 of this embodiment, the plate to be tested is placed on the first plate 1, and the positioning post 4 passes through the first positioning hole 11 to connect with the plate to be tested and position the plate to be tested. In this embodiment, a gap is left between the positioning post 4 and the first positioning hole 11, so that the positioning post 4 can move radially along the first positioning hole 11. When the position of the panel to be tested is offset due to thermal expansion or contraction, the tester moves the second plate 2 along the direction of the aperture of the first positioning hole 11, driving the panel to be tested connected to the positioning column 4 to move along the direction of the aperture of the first positioning hole 11, thereby enabling the probe 3 to better contact the position of the panel to be tested, thereby more accurately testing the electrical properties of the panel to be tested. The needle disk 100 of this embodiment can be used on a machine without a fine-tuning function, and there is no need to drill holes on the wire disk 200, so that accurate testing of the offset panel to be tested can be achieved, thereby improving the test capability and yield of the fixture. It also reduces the time and cost of handling offsets.

[0053] In addition, an embodiment of the present invention provides a composite fixture, comprising a wire drum 200, a base plate 300, a support 400, and the needle drum 100 of the above embodiment. The wire drum 200 is detachably connected to the needle drum 100, and the wire drum 200 is mounted on the base plate 300 via the support 400. In this embodiment, a spring connection is provided in the wire drum 200, wherein the spring connection includes a connected spring and a connection line. The spring is connected between the probe 3 and the connection line. The data information tested by the probe 3 is transmitted to the control board through the spring connection line for analysis to complete the test of the panel to be tested. The setting of the spring can buffer the probe 3, preventing the probe from being damaged when contacting the panel to be tested. The wire drum 200 can accommodate and protect the spring and the connection line. At the same time, the setting of the base plate 300 and the support 400 can well support the needle drum 100 and the wire drum 200, thereby increasing the stability of the connection between the needle drum 100 and the wire drum 200.

[0054] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A needle plate, characterized in that: The apparatus comprises a first plate, a second plate, a probe and a positioning column, wherein the second plate is arranged on one side of the first plate along a first direction, and a side of the first plate facing away from the second plate is used for placing a plate to be detected; The probe is mounted on the first plate, and the probe is used to be electrically connected to the position to be tested of the plate to be tested; The first plate is provided with a first positioning hole along the first direction, the positioning post is installed on the second plate, the positioning post is inserted into the first positioning hole, and the positioning post is used to connect with the plate to be detected; A first gap is defined between the outer circumferential surface of the positioning post and the wall of the first positioning hole, so that the second plate can drive the plate to be detected to move along the radial direction of the first positioning hole.

2. The needle plate according to claim 1, characterized in that A first pinhole matching the probe is provided on the first plate, and a second pinhole is provided on the second plate. The probe is installed in the first pinhole and the second pinhole. The outer peripheral surface of the probe fits the hole wall of the first pinhole, and a second gap is provided between the outer peripheral surface of the probe and the hole wall of the second pinhole.

3. The needle plate according to claim 2, characterized in that The needle disk also includes a third plate, which is arranged between the first plate and the second plate. The third plate is provided with a third pinhole and a third positioning hole. The probe is installed in the third pinhole, and the outer peripheral surface of the probe fits into the hole wall of the third pinhole; the positioning column is inserted into the third positioning hole, and there is a third gap between the outer peripheral surface of the positioning column and the hole wall of the third positioning hole.

4. The needle plate according to claim 2, characterized in that The needle disk also includes a fourth plate, which is arranged between the first plate and the second plate. Along the second direction, the size of the first plate and the size of the second plate are both larger than the size of the fourth plate. A fourth pinhole matching the probe is provided on the fourth plate. The probe is installed in the fourth pinhole, and the outer peripheral surface of the probe fits into the hole wall of the fourth pinhole; the positioning column is located outside the fourth plate along the second direction, and the first direction is perpendicular to the second direction.

5. The needle plate according to claim 1, characterized in that The needle disk also includes a fastener, the first plate is provided with a first fine-tuning hole group, and the second plate is provided with a second fine-tuning hole group. When the probe is electrically connected to the test position of the plate to be tested, the second fine-tuning hole group is opposite to the first fine-tuning hole group, and the fastener is used to be inserted into the first fine-tuning hole group and the second fine-tuning hole group.

6. The needle dial according to claim 5, characterized in that The first plate and the second plate are both square in shape. The first fine-tuning hole groups are arranged at the four corners of the first plate, and the second fine-tuning hole groups are arranged at the four corners of the second plate.

7. The needle dial according to claim 6, characterized in that The first fine-tuning hole group includes a plurality of first adjustment holes spaced apart in pairs, and the plurality of first adjustment holes are arranged in a square array; The second fine-tuning hole group includes a plurality of second adjustment holes spaced apart in pairs, and the plurality of second adjustment holes are arranged in a square array.

8. The needle dial according to claim 3, characterized in that The needle disk further includes a plate group, the plate group being arranged on a side of the second plate facing away from the first plate, the plate group including multiple layers of plates arranged along the first direction, each layer of the plates being provided with a first mounting hole matching the probe, the probe being mounted in the first mounting hole of each layer of the plates, with the outer circumference of the probe being in contact with the hole wall of the first mounting hole; Each layer of the plate is provided with a second mounting hole, the positioning post is installed in the second mounting hole of each layer of the plate, and a fourth gap is formed between the outer peripheral surface of the positioning post and the hole wall of the second mounting hole; Alternatively, along the second direction, the size of the first plate and the size of the second plate are both larger than the size of the plate group, the positioning column is located outside the plate group along the second direction, and the first direction is perpendicular to the second direction.

9. The needle dial according to claim 8, characterized in that The first gap is 0.008 mm to 0.03 mm; the second gap is 1.0 mm to 2.0 mm; the third gap is 0.008 mm to 0.03 mm; and the fourth gap is 0.008 mm to 0.03 mm.

10. A composite fixture, characterized in that: It comprises a wire drum, a base plate, a support and the needle disk according to any one of claims 1 to 9, wherein the wire drum is detachably connected to the needle disk, and the wire drum is mounted on the base plate through the support.

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