Chip calibration device

By designing a chip calibration device with a conversion mechanism and a limit device, the problem of poor adaptability of chips of different shapes is solved, stable detection and automatic alignment of round and square chips are achieved, and detection accuracy is improved.

CN223320530UActive Publication Date: 2025-09-09SHENZHEN HUIYUAN ELECTRICAL TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202421993153.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-16
Publication Date
2025-09-09
Estimated Expiration
2034-08-16

AI Technical Summary

Technical Problem

Existing chip calibration devices cannot adapt to chips of different shapes, especially square and round chips, resulting in poor adaptability and affecting detection accuracy.

Method used

A chip calibration device was designed, which included a conversion mechanism and a limit device. The knob was used to control the flipping of the placement box and the movement of the slider to achieve stable placement and automatic alignment of chips of different shapes. The photoelectric switch and telescopic cylinder were combined to ensure effective contact between the probe and the pad.

Benefits of technology

The simultaneous detection of round and square chips is achieved, which improves the detection accuracy and the practicality of the device and ensures the stability and automatic alignment of the chips during the detection process.

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Abstract

The utility model discloses a chip calibration device, which relates to the technical field of chip testing and comprises a base, a switching mechanism is arranged at the upper end in the base, and the switching mechanism is used for placing chips in different shapes; the switching mechanism comprises a first sliding block slidably connected to the left side of the upper end in the base and a second sliding block slidably connected to the right side of the upper end in the base, a containing box is rotationally connected between the first sliding block and the second sliding block, a square groove is formed in the upper end of the containing box, and a circular groove is formed in the lower end of the containing box. And the right side of the placement box is fixedly connected with a first telescopic rod. According to the chip calibration device disclosed by the utility model, a knob is held by a hand and rotated to 180 degrees, a first telescopic rod synchronously drives a placement box to turn over, a square groove in the placement box faces downwards, a circular groove in the placement box faces upwards, and through conversion between the circular groove and the square groove in the placement box, the device can detect a circular chip and a square chip at the same time; the practicability and utilization rate of the device are improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a chip calibration device. Background Art

[0002] A chip, also known as an integrated circuit, abbreviated as IC, or also called a microcircuit, microchip, wafer, and chip in electronics is a way to miniaturize circuits and is often manufactured on the surface of a semiconductor wafer. With the widespread application of OLED display panels, the OLED chip market has also begun to take shape. During the chip manufacturing process, probes on a test device are usually used to perform continuity tests on multiple pads on the chip.

[0003] The calibration device can only be used to test and calibrate the chip. Due to the different shapes of chips, there are square and round chips, so it is impossible to calibrate chips of different shapes. At the same time, the calibration device has poor adaptability. To address the above problems, we have launched a chip calibration device. Utility Model Content

[0004] The utility model discloses a chip calibration device. Chips have different shapes, including square and round chips. Therefore, it is impossible to calibrate chips of different shapes, and the calibration device has a poor adaptability.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A chip calibration device includes a base, wherein a conversion mechanism is provided at the upper end of the interior of the base, and the conversion mechanism is used to place chips of different shapes; the conversion mechanism includes a first slider slidably connected to the left side of the upper end of the interior of the base and a second slider on the right side of the upper end of the interior; a placement box is rotatably connected between the first slider and the second slider, a square groove is provided at the upper end of the placement box, a circular groove is provided at the lower end of the placement box, a first telescopic rod is fixedly connected to the right side of the placement box, and a knob is connected to the right side of the first telescopic rod.

[0007] In a preferred solution, a driving motor is installed on the left side of the front side of the base, an output end of the driving motor is connected to a screw rod, and the screw rod is threadedly connected to the first sliding block.

[0008] The lead screw is driven by the driving motor to rotate, thereby causing the first sliding block to slide back and forth on the base.

[0009] In a preferred solution, a fixing plate is fixedly connected to the right side of the second slider, and limiting holes are provided at the upper and lower ends of the right side of the fixing plate. The upper left end of the knob is connected to a limiting rod, and the left side of the limiting rod is connected to a first spring, and the upper end of the first spring is connected to a limiting block, and the limiting block is semicircular.

[0010] By setting a limit rod to fit into the limit hole, the knob is prevented from rotating the placement box, ensuring that the chip in the placement box can be stable during the detection process. At the same time, the limit block is set to a semicircular arc shape so that the limit block can be retracted into the limit rod under the action of external force.

[0011] In a preferred solution, a gantry bracket is connected to the rear side of the upper end of the base, a telescopic cylinder is installed in the middle of the upper end of the gantry bracket, the lower end of the telescopic cylinder is connected to a mounting plate, a plurality of groups of second telescopic rods are equidistantly connected to the lower end of the mounting plate, a second spring is wound around the outer surface of the second telescopic rod, and a probe is connected to the lower end of the second telescopic rod.

[0012] The transmission mounting plate is extended by a telescopic cylinder to drive multiple sets of probes to descend to perform continuity tests on multiple pads. At the same time, a second telescopic rod and a second spring are set at the upper end of the probe to facilitate the probe to adapt to the detection of chips of different shapes.

[0013] In a preferred solution, photoelectric switches are installed on the left and right ends above the gantry bracket, and reflective plates are installed on the upper and lower ends of the first slider and the second slider.

[0014] By setting up photoelectric switches and reflectors, it is ensured that the placement box carrying the chips stops automatically after it moves to the lower end of the probe, realizing non-manpower automatic position alignment and calibration, and improving detection accuracy.

[0015] The present invention provides a chip calibration device through improvement, which has the following improvements and advantages compared with the prior art:

[0016] One: A chip calibration device. By holding the knob and rotating it to 180 degrees, the first telescopic rod synchronously drives the placement box to flip, turning the square slot on the placement box downward and the circular slot upward. By switching the circular slot and the square slot on the placement box, the device can simultaneously detect circular chips and square chips, improving the practicality and utilization rate of the device.

[0017] Second: A chip calibration device, which prevents the placement box from rotating due to the rotation of the knob by setting a limit rod to be stuck in the limit hole, ensuring that the chip in the placement box can remain stable during the detection process. At the same time, after the limit rod is stuck in the limit hole, it is restricted by the limit block and cannot be pulled out of the limit hole without external force, further ensuring that the knob cannot rotate. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the overall structure of a chip calibration device proposed by the present invention;

[0019] Figure 2This is a bottom view of the placement box structure of a chip calibration device proposed by the present invention;

[0020] Figure 3 This is a schematic structural diagram of a second slider of a chip calibration device proposed in the present invention;

[0021] Figure 4 This is a schematic diagram of the gantry support structure of a chip calibration device proposed in the present invention;

[0022] Figure 5 This is a schematic diagram of the probe structure of a chip calibration device proposed by the present invention;

[0023] Figure 6 A chip calibration device proposed by the utility model Figure 3 Schematic diagram of the enlarged structure of part A.

[0024] In the accompanying drawings: 1. Base; 2. Conversion mechanism; 201. First slider; 202. Second slider; 203. Placement box; 204. Square slot; 205. Round slot; 206. First telescopic rod; 207. Knob; 3. Drive motor; 4. Screw; 5. Fixing plate; 6. Limit hole; 7. Limit rod; 8. First spring; 9. Limit block; 10. Gantry bracket; 11. Telescopic cylinder; 12. Mounting plate; 13. Second telescopic rod; 14. Second spring; 15. Probe; 16. Photoelectric switch; 17. Reflector. DETAILED DESCRIPTION

[0025] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0026] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, they cannot be understood as limitations on the present invention.

[0027] The chip calibration device disclosed in the utility model is mainly used in chip detection scenarios.

[0028] Reference Figure 1 、 Figure 2 、 Figure 3 and Figure 6, a chip calibration device includes a base 1, a conversion mechanism 2 is provided at the upper end of the base 1, and the conversion mechanism 2 is used to place chips of different shapes; the conversion mechanism 2 includes a first slider 201 slidably connected to the left side of the upper end of the base 1 and a second slider 202 on the right side of the upper end of the base 1, a placement box 203 is rotatably connected between the first slider 201 and the second slider 202, a square groove 204 is provided at the upper end of the placement box 203, a circular groove 205 is provided at the lower end of the placement box 203, a first telescopic rod 206 is fixedly connected to the right side of the placement box 203, and a knob 207 is connected to the right side of the first telescopic rod 206, a driving motor 3 is installed on the left side of the front side of the base 1, the output end of the driving motor 3 is connected to the screw rod 4, and the screw rod 4 is threadedly connected to the first slider 201, photoelectric switches 16 are installed on the left and right ends above the gantry bracket 10, reflectors 17 are installed on the upper and lower ends of the first slider 201 and the second slider 202, and the lower end of the telescopic cylinder 11 is connected to the mounting plate 12;

[0029] In this embodiment, when the device is needed to detect batches of round chips, the upper end of the placement box 203 is a square groove 204, which can be used to place square chips. When the round chips are to be detected, the knob 207 is rotated to 180 degrees by hand, and the first telescopic rod 206 synchronously drives the placement box 203 to flip 180 degrees, so that the square groove 204 on the placement box 203 faces downward and the round groove 205 faces upward. At this time, the round chips can be placed therein, thereby realizing that the device can detect both round chips and square chips at the same time, improving the practicality and utilization rate of the device. At this time, the drive motor 3 is started to drive the screw rod 4 to rotate, causing the first slider 201 and the second slider 202 to move backward in the base 1 with the square groove 204. When they move to the bottom of the gantry bracket 10, the reflector 17 is illuminated by the photoelectric switch 16, forming a signal transmitted to the drive motor 3 to stop. At this time, the mounting plate 12 and the placement box 203 are aligned, thereby realizing non-manpower automatic position alignment and calibration, thereby improving the accuracy of chip detection.

[0030] Reference Figure 2 、 Figure 3 and Figure 6 In a preferred embodiment, a fixing plate 5 is fixedly connected to the right side of the second slider 202. Limiting holes 6 are provided at the upper and lower ends of the right side of the fixing plate 5. The upper left end of the knob 207 is connected to a limiting rod 7. A first spring 8 is connected to the left side of the limiting rod 7. The upper end of the first spring 8 is connected to a limiting block 9. The limiting block 9 is semicircular.

[0031] In this embodiment, when the knob 207 is rotated, the knob 207 is first pulled to the right to extend the first telescopic rod 206. The limit block 9 is squeezed by the fixing plate 5 and retracted to the inside of the limit rod 7. Then the limit rod 7 is pulled out from the upper limit hole 6 of the fixing plate 5. At this time, the knob 207 can be rotated. After the placement box 203 is rotated, in order to ensure that the chip in the placement box 203 remains balanced and stable during the detection process, the limit rod 7 is pushed to the left to ensure that the chip in the placement box 203 remains balanced and stable during the detection process. It is inserted into the limiting hole 6 at the lower end of the fixed plate 5. The limiting block 9 is semicircular. After the limiting block 9 contacts the inner wall of the limiting hole 6, it retracts to the inside of the limiting rod 7. After the limiting rod 7 is completely inserted into the limiting hole 6, the limiting block 9 pops out under the action of the first spring 8, so that the limiting rod 7 cannot be pulled out from the limiting hole 6 without being pulled by external force. At this time, the limiting rod 7 limits the rotation of the knob 207. By limiting the rotation of the knob 207, the smoothness of the chip detection process in the placement box 203 is guaranteed.

[0032] Reference Figure 1 、 Figure 4 and Figure 5 In a preferred embodiment, a gantry bracket 10 is connected to the rear side of the upper end of the base 1, a telescopic cylinder 11 is installed in the middle of the upper end of the gantry bracket 10, and a plurality of groups of second telescopic rods 13 are equidistantly connected to the lower end of the mounting plate 12. A second spring 14 is wound around the outer surface of the second telescopic rod 13, and a probe 15 is connected to the lower end of the second telescopic rod 13;

[0033] In this embodiment, by starting the telescopic cylinder 11 to extend, the mounting plate 12 is driven to move downward, and the multiple sets of probes 15 in the middle of the lower end of the mounting plate 12 contact the multiple pads on the circular chip in the circular groove 205 to perform a continuity test. The multiple probes 15 can prevent the pads from being missed. The probes 15 that are not in contact with the chip in the circular groove 205 contact the upper surface of the placement box 203, prompting the second telescopic rod 13 and the second spring 14 to contract, ensuring that the middle probe 15 is in normal contact with the pad. When testing the square chip in the square groove 204, the multiple sets of probes 15 at the lower end of the mounting plate 12 all contact the upper surface of the square chip, and a comprehensive test is performed on the multiple pads on the square chip. Therefore, by arranging the second telescopic rod 13 and the second spring 14 above the probes 15, the multiple sets of probes 15 at the lower end of the mounting plate 12 can simultaneously test the square chip and the circular chip.

[0034] Working principle: When in use, when the device needs to be used to batch detect circular chips, the upper end of the placement box 203 is a square groove 204, which can be used to place square chips. When it is possible to detect circular chips, the knob 207 is rotated to 180 degrees by hand, and the first telescopic rod 206 synchronously drives the placement box 203 to flip 180 degrees, so that the square groove 204 on the placement box 203 faces downward and the circular groove 205 faces upward. At this time, the circular chip can be placed therein, thereby realizing that the device can detect circular chips and square chips at the same time, improving the practicality and utilization rate of the device. At that time, the drive motor 3 is started to drive the screw rod 4 to rotate, causing the first slider 201 and the second slider 202 to carry the square groove 204 to move backward in the base 1. When they move to the bottom of the gantry bracket 10, the reflector 17 is illuminated by the photoelectric switch 16, forming a signal transmitted to the drive motor 3 to stop. At this time, the mounting plate 12 and the placement box 203 are aligned, thereby realizing non-manpower automatic position alignment and calibration, thereby improving the accuracy of chip detection.

[0035] The above are merely preferred embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Replacements may include partial structures, devices, or method steps, or they may be complete technical solutions. Equivalent replacements or modifications based on the technical solution and its concept of the present invention are also encompassed within the scope of protection of the present invention.

Claims

1. A chip calibration device, comprising a base (1), characterized in that: A conversion mechanism (2) is provided at the upper end of the interior of the base (1), and the conversion mechanism (2) is used for placing chips of different shapes; The conversion mechanism (2) comprises a first slider (201) and a second slider (202) respectively connected to the left side of the upper end of the base (1) and the right side of the upper end of the base (1). A placement box (203) is rotatably connected between the first slider (201) and the second slider (202). A square groove (204) is provided at the upper end of the placement box (203), and a circular groove (205) is provided at the lower end of the placement box (203). A first telescopic rod (206) is fixedly connected to the right side of the placement box (203), and a knob (207) is connected to the right side of the first telescopic rod (206).

2. A chip calibration device according to claim 1, characterized in that: A driving motor (3) is installed on the left side of the front side of the base (1); the output end of the driving motor (3) is connected to a screw rod (4); and the screw rod (4) is threadedly connected to the first sliding block (201).

3. The chip calibration device according to claim 1, characterized in that: A fixing plate (5) is fixedly connected to the right side of the second sliding block (202), and limiting holes (6) are provided at the upper and lower ends of the right side of the fixing plate (5).

4. The chip calibration device according to claim 1, characterized in that: The upper left end of the knob (207) is connected to a limit rod (7), the left side of the limit rod (7) is connected to a first spring (8), the upper end of the first spring (8) is connected to a limit block (9), and the limit block (9) is semicircular.

5. The chip calibration device according to claim 1, characterized in that: The rear side of the upper end of the base (1) is connected to a gantry bracket (10), a telescopic cylinder (11) is installed in the middle of the upper end of the gantry bracket (10), and the lower end of the telescopic cylinder (11) is connected to a mounting plate (12).

6. The chip calibration device according to claim 5, characterized in that: The lower end of the mounting plate (12) is connected to a plurality of groups of second telescopic rods (13) arranged at equal intervals, the outer surface of the second telescopic rod (13) is wound with a second spring (14), and the lower end of the second telescopic rod (13) is connected to a probe (15).

7. The chip calibration device according to claim 5, characterized in that: Photoelectric switches (16) are installed at the left and right ends above the gantry bracket (10), and reflective plates (17) are installed at the upper and lower ends of the first slider (201) and the second slider (202).